ATE512442T1 - Speicherzelle zur verwendung in einer integrierten schaltung - Google Patents
Speicherzelle zur verwendung in einer integrierten schaltungInfo
- Publication number
- ATE512442T1 ATE512442T1 AT07002959T AT07002959T ATE512442T1 AT E512442 T1 ATE512442 T1 AT E512442T1 AT 07002959 T AT07002959 T AT 07002959T AT 07002959 T AT07002959 T AT 07002959T AT E512442 T1 ATE512442 T1 AT E512442T1
- Authority
- AT
- Austria
- Prior art keywords
- layer
- memory cell
- integrated circuit
- conductive material
- dielectric
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0009—RRAM elements whose operation depends upon chemical change
- G11C13/0011—RRAM elements whose operation depends upon chemical change comprising conductive bridging RAM [CBRAM] or programming metallization cells [PMCs]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/011—Manufacture or treatment of multistable switching devices
- H10N70/041—Modification of switching materials after formation, e.g. doping
- H10N70/046—Modification of switching materials after formation, e.g. doping by diffusion, e.g. photo-dissolution
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/011—Manufacture or treatment of multistable switching devices
- H10N70/061—Shaping switching materials
- H10N70/066—Shaping switching materials by filling of openings, e.g. damascene method
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/20—Multistable switching devices, e.g. memristors
- H10N70/24—Multistable switching devices, e.g. memristors based on migration or redistribution of ionic species, e.g. anions, vacancies
- H10N70/245—Multistable switching devices, e.g. memristors based on migration or redistribution of ionic species, e.g. anions, vacancies the species being metal cations, e.g. programmable metallization cells
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
- H10N70/821—Device geometry
- H10N70/826—Device geometry adapted for essentially vertical current flow, e.g. sandwich or pillar type devices
- H10N70/8265—Device geometry adapted for essentially vertical current flow, e.g. sandwich or pillar type devices on sidewalls of dielectric structures, e.g. mesa-shaped or cup-shaped devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
- H10N70/801—Constructional details of multistable switching devices
- H10N70/881—Switching materials
- H10N70/882—Compounds of sulfur, selenium or tellurium, e.g. chalcogenides
- H10N70/8825—Selenides, e.g. GeSe
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
- H10W20/031—Manufacture or treatment of conductive parts of the interconnections
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
- H10W20/031—Manufacture or treatment of conductive parts of the interconnections
- H10W20/032—Manufacture or treatment of conductive parts of the interconnections of conductive barrier, adhesion or liner layers
- H10W20/055—Manufacture or treatment of conductive parts of the interconnections of conductive barrier, adhesion or liner layers by formation methods other than physical vapour deposition [PVD], chemical vapour deposition [CVD] or liquid deposition
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
- H10W20/071—Manufacture or treatment of dielectric parts thereof
- H10W20/093—Manufacture or treatment of dielectric parts thereof by modifying materials of the dielectric parts
- H10W20/094—Manufacture or treatment of dielectric parts thereof by modifying materials of the dielectric parts by transforming insulators into conductors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/019—Manufacture or treatment of bond pads
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2213/00—Indexing scheme relating to G11C13/00 for features not covered by this group
- G11C2213/70—Resistive array aspects
- G11C2213/79—Array wherein the access device being a transistor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/921—Structures or relative sizes of bond pads
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/921—Structures or relative sizes of bond pads
- H10W72/923—Bond pads having multiple stacked layers
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/957—Making metal-insulator-metal device
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Semiconductor Memories (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Junction Field-Effect Transistors (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/988,984 US6815818B2 (en) | 2001-11-19 | 2001-11-19 | Electrode structure for use in an integrated circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE512442T1 true ATE512442T1 (de) | 2011-06-15 |
Family
ID=25534649
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT07002959T ATE512442T1 (de) | 2001-11-19 | 2002-11-19 | Speicherzelle zur verwendung in einer integrierten schaltung |
Country Status (8)
| Country | Link |
|---|---|
| US (4) | US6815818B2 (de) |
| EP (2) | EP1446832B1 (de) |
| JP (1) | JP4587670B2 (de) |
| KR (1) | KR100593283B1 (de) |
| CN (2) | CN101005056A (de) |
| AT (1) | ATE512442T1 (de) |
| AU (1) | AU2002362009A1 (de) |
| WO (1) | WO2003052815A2 (de) |
Families Citing this family (166)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8664030B2 (en) | 1999-03-30 | 2014-03-04 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
| JP4742429B2 (ja) * | 2001-02-19 | 2011-08-10 | 住友電気工業株式会社 | ガラス微粒子堆積体の製造方法 |
| US6734455B2 (en) * | 2001-03-15 | 2004-05-11 | Micron Technology, Inc. | Agglomeration elimination for metal sputter deposition of chalcogenides |
| US7102150B2 (en) * | 2001-05-11 | 2006-09-05 | Harshfield Steven T | PCRAM memory cell and method of making same |
| US6951805B2 (en) * | 2001-08-01 | 2005-10-04 | Micron Technology, Inc. | Method of forming integrated circuitry, method of forming memory circuitry, and method of forming random access memory circuitry |
| US6784018B2 (en) * | 2001-08-29 | 2004-08-31 | Micron Technology, Inc. | Method of forming chalcogenide comprising devices and method of forming a programmable memory cell of memory circuitry |
| US6881623B2 (en) | 2001-08-29 | 2005-04-19 | Micron Technology, Inc. | Method of forming chalcogenide comprising devices, method of forming a programmable memory cell of memory circuitry, and a chalcogenide comprising device |
| US6955940B2 (en) * | 2001-08-29 | 2005-10-18 | Micron Technology, Inc. | Method of forming chalcogenide comprising devices |
| US6709958B2 (en) * | 2001-08-30 | 2004-03-23 | Micron Technology, Inc. | Integrated circuit device and fabrication using metal-doped chalcogenide materials |
| US6646902B2 (en) | 2001-08-30 | 2003-11-11 | Micron Technology, Inc. | Method of retaining memory state in a programmable conductor RAM |
| US6956284B2 (en) | 2001-10-26 | 2005-10-18 | Staktek Group L.P. | Integrated circuit stacking system and method |
| US7202555B2 (en) | 2001-10-26 | 2007-04-10 | Staktek Group L.P. | Pitch change and chip scale stacking system and method |
| US7656678B2 (en) | 2001-10-26 | 2010-02-02 | Entorian Technologies, Lp | Stacked module systems |
| US6815818B2 (en) | 2001-11-19 | 2004-11-09 | Micron Technology, Inc. | Electrode structure for use in an integrated circuit |
| US6791859B2 (en) | 2001-11-20 | 2004-09-14 | Micron Technology, Inc. | Complementary bit PCRAM sense amplifier and method of operation |
| US7081373B2 (en) | 2001-12-14 | 2006-07-25 | Staktek Group, L.P. | CSP chip stack with flex circuit |
| US6909656B2 (en) * | 2002-01-04 | 2005-06-21 | Micron Technology, Inc. | PCRAM rewrite prevention |
| US6867064B2 (en) * | 2002-02-15 | 2005-03-15 | Micron Technology, Inc. | Method to alter chalcogenide glass for improved switching characteristics |
| US6791885B2 (en) * | 2002-02-19 | 2004-09-14 | Micron Technology, Inc. | Programmable conductor random access memory and method for sensing same |
| US7087919B2 (en) * | 2002-02-20 | 2006-08-08 | Micron Technology, Inc. | Layered resistance variable memory device and method of fabrication |
| US6809362B2 (en) * | 2002-02-20 | 2004-10-26 | Micron Technology, Inc. | Multiple data state memory cell |
| US6847535B2 (en) | 2002-02-20 | 2005-01-25 | Micron Technology, Inc. | Removable programmable conductor memory card and associated read/write device and method of operation |
| US7151273B2 (en) * | 2002-02-20 | 2006-12-19 | Micron Technology, Inc. | Silver-selenide/chalcogenide glass stack for resistance variable memory |
| US6937528B2 (en) * | 2002-03-05 | 2005-08-30 | Micron Technology, Inc. | Variable resistance memory and method for sensing same |
| US6849868B2 (en) | 2002-03-14 | 2005-02-01 | Micron Technology, Inc. | Methods and apparatus for resistance variable material cells |
| US6855975B2 (en) * | 2002-04-10 | 2005-02-15 | Micron Technology, Inc. | Thin film diode integrated with chalcogenide memory cell |
| US6864500B2 (en) | 2002-04-10 | 2005-03-08 | Micron Technology, Inc. | Programmable conductor memory cell structure |
| US6858482B2 (en) * | 2002-04-10 | 2005-02-22 | Micron Technology, Inc. | Method of manufacture of programmable switching circuits and memory cells employing a glass layer |
| US6731528B2 (en) * | 2002-05-03 | 2004-05-04 | Micron Technology, Inc. | Dual write cycle programmable conductor memory system and method of operation |
| US6890790B2 (en) * | 2002-06-06 | 2005-05-10 | Micron Technology, Inc. | Co-sputter deposition of metal-doped chalcogenides |
| US6825135B2 (en) * | 2002-06-06 | 2004-11-30 | Micron Technology, Inc. | Elimination of dendrite formation during metal/chalcogenide glass deposition |
| US7209378B2 (en) * | 2002-08-08 | 2007-04-24 | Micron Technology, Inc. | Columnar 1T-N memory cell structure |
| US7018863B2 (en) * | 2002-08-22 | 2006-03-28 | Micron Technology, Inc. | Method of manufacture of a resistance variable memory cell |
| DE10239845C1 (de) | 2002-08-29 | 2003-12-24 | Day4 Energy Inc | Elektrode für fotovoltaische Zellen, fotovoltaische Zelle und fotovoltaischer Modul |
| US7294527B2 (en) | 2002-08-29 | 2007-11-13 | Micron Technology Inc. | Method of forming a memory cell |
| US6831019B1 (en) * | 2002-08-29 | 2004-12-14 | Micron Technology, Inc. | Plasma etching methods and methods of forming memory devices comprising a chalcogenide comprising layer received operably proximate conductive electrodes |
| US6867114B2 (en) | 2002-08-29 | 2005-03-15 | Micron Technology Inc. | Methods to form a memory cell with metal-rich metal chalcogenide |
| US7010644B2 (en) * | 2002-08-29 | 2006-03-07 | Micron Technology, Inc. | Software refreshed memory device and method |
| US6864521B2 (en) * | 2002-08-29 | 2005-03-08 | Micron Technology, Inc. | Method to control silver concentration in a resistance variable memory element |
| US7364644B2 (en) * | 2002-08-29 | 2008-04-29 | Micron Technology, Inc. | Silver selenide film stoichiometry and morphology control in sputter deposition |
| US7163837B2 (en) | 2002-08-29 | 2007-01-16 | Micron Technology, Inc. | Method of forming a resistance variable memory element |
| US7314776B2 (en) * | 2002-12-13 | 2008-01-01 | Ovonyx, Inc. | Method to manufacture a phase change memory |
| CN100521277C (zh) * | 2002-12-19 | 2009-07-29 | Nxp股份有限公司 | 包含相变材料的电器件 |
| KR20050093782A (ko) * | 2002-12-19 | 2005-09-23 | 코닌클리즈케 필립스 일렉트로닉스 엔.브이. | 상변화 물질을 포함하는 전기 장치 및 그 제조 방법 |
| US7472170B2 (en) | 2003-02-13 | 2008-12-30 | Bruce Zak | System and method for managing content on a network interface |
| US6969867B2 (en) * | 2003-03-10 | 2005-11-29 | Energy Conversion Devices, Inc. | Field effect chalcogenide devices |
| US7022579B2 (en) | 2003-03-14 | 2006-04-04 | Micron Technology, Inc. | Method for filling via with metal |
| US6930909B2 (en) | 2003-06-25 | 2005-08-16 | Micron Technology, Inc. | Memory device and methods of controlling resistance variation and resistance profile drift |
| US6961277B2 (en) | 2003-07-08 | 2005-11-01 | Micron Technology, Inc. | Method of refreshing a PCRAM memory device |
| US7061004B2 (en) * | 2003-07-21 | 2006-06-13 | Micron Technology, Inc. | Resistance variable memory elements and methods of formation |
| US6903361B2 (en) * | 2003-09-17 | 2005-06-07 | Micron Technology, Inc. | Non-volatile memory structure |
| US20050128559A1 (en) * | 2003-12-15 | 2005-06-16 | Nishimura Ken A. | Spatial light modulator and method for performing dynamic photolithography |
| US7098068B2 (en) * | 2004-03-10 | 2006-08-29 | Micron Technology, Inc. | Method of forming a chalcogenide material containing device |
| US7583551B2 (en) * | 2004-03-10 | 2009-09-01 | Micron Technology, Inc. | Power management control and controlling memory refresh operations |
| US7112836B2 (en) * | 2004-03-17 | 2006-09-26 | Macronix International Co., Ltd. | Method of forming a chalcogenide memory cell having a horizontal electrode and a memory cell produced by the method |
| KR101029339B1 (ko) * | 2004-05-14 | 2011-04-13 | 르네사스 일렉트로닉스 가부시키가이샤 | 반도체 기억장치 |
| US7354793B2 (en) | 2004-08-12 | 2008-04-08 | Micron Technology, Inc. | Method of forming a PCRAM device incorporating a resistance-variable chalocogenide element |
| US7190048B2 (en) * | 2004-07-19 | 2007-03-13 | Micron Technology, Inc. | Resistance variable memory device and method of fabrication |
| US7326950B2 (en) * | 2004-07-19 | 2008-02-05 | Micron Technology, Inc. | Memory device with switching glass layer |
| US7226857B2 (en) | 2004-07-30 | 2007-06-05 | Micron Technology, Inc. | Front-end processing of nickel plated bond pads |
| US7365411B2 (en) | 2004-08-12 | 2008-04-29 | Micron Technology, Inc. | Resistance variable memory with temperature tolerant materials |
| US7151688B2 (en) * | 2004-09-01 | 2006-12-19 | Micron Technology, Inc. | Sensing of resistance variable memory devices |
| US20060050492A1 (en) | 2004-09-03 | 2006-03-09 | Staktek Group, L.P. | Thin module system and method |
| US7522421B2 (en) | 2004-09-03 | 2009-04-21 | Entorian Technologies, Lp | Split core circuit module |
| US7324352B2 (en) | 2004-09-03 | 2008-01-29 | Staktek Group L.P. | High capacity thin module system and method |
| US7606040B2 (en) | 2004-09-03 | 2009-10-20 | Entorian Technologies, Lp | Memory module system and method |
| US7606049B2 (en) | 2004-09-03 | 2009-10-20 | Entorian Technologies, Lp | Module thermal management system and method |
| US7446410B2 (en) | 2004-09-03 | 2008-11-04 | Entorian Technologies, Lp | Circuit module with thermal casing systems |
| US7468893B2 (en) | 2004-09-03 | 2008-12-23 | Entorian Technologies, Lp | Thin module system and method |
| US7616452B2 (en) | 2004-09-03 | 2009-11-10 | Entorian Technologies, Lp | Flex circuit constructions for high capacity circuit module systems and methods |
| US7423885B2 (en) | 2004-09-03 | 2008-09-09 | Entorian Technologies, Lp | Die module system |
| US7579687B2 (en) | 2004-09-03 | 2009-08-25 | Entorian Technologies, Lp | Circuit module turbulence enhancement systems and methods |
| US7606050B2 (en) | 2004-09-03 | 2009-10-20 | Entorian Technologies, Lp | Compact module system and method |
| US7760513B2 (en) | 2004-09-03 | 2010-07-20 | Entorian Technologies Lp | Modified core for circuit module system and method |
| US7289327B2 (en) | 2006-02-27 | 2007-10-30 | Stakick Group L.P. | Active cooling methods and apparatus for modules |
| US7443023B2 (en) | 2004-09-03 | 2008-10-28 | Entorian Technologies, Lp | High capacity thin module system |
| US7542297B2 (en) | 2004-09-03 | 2009-06-02 | Entorian Technologies, Lp | Optimized mounting area circuit module system and method |
| US7511968B2 (en) | 2004-09-03 | 2009-03-31 | Entorian Technologies, Lp | Buffered thin module system and method |
| DE102004046804B4 (de) * | 2004-09-27 | 2006-10-05 | Infineon Technologies Ag | Resistiv schaltender Halbleiterspeicher |
| US7109584B2 (en) * | 2004-11-23 | 2006-09-19 | International Business Machines Corporation | Dendrite growth control circuit |
| DE102004061548A1 (de) * | 2004-12-21 | 2006-06-29 | Infineon Technologies Ag | Integration von 1T1R-CBRAM-Speicherzellen |
| US20060131555A1 (en) * | 2004-12-22 | 2006-06-22 | Micron Technology, Inc. | Resistance variable devices with controllable channels |
| US7374174B2 (en) * | 2004-12-22 | 2008-05-20 | Micron Technology, Inc. | Small electrode for resistance variable devices |
| KR100707182B1 (ko) * | 2005-02-18 | 2007-04-13 | 삼성전자주식회사 | 상전이 메모리 소자 및 제조방법 |
| US7317200B2 (en) | 2005-02-23 | 2008-01-08 | Micron Technology, Inc. | SnSe-based limited reprogrammable cell |
| DE102005016244A1 (de) * | 2005-04-08 | 2006-10-19 | Infineon Technologies Ag | Speicherzelle, Speichereinrichtung und Verfahren zu deren Herstellung |
| US7709289B2 (en) * | 2005-04-22 | 2010-05-04 | Micron Technology, Inc. | Memory elements having patterned electrodes and method of forming the same |
| US7427770B2 (en) | 2005-04-22 | 2008-09-23 | Micron Technology, Inc. | Memory array for increased bit density |
| US7269044B2 (en) | 2005-04-22 | 2007-09-11 | Micron Technology, Inc. | Method and apparatus for accessing a memory array |
| US7449355B2 (en) * | 2005-04-27 | 2008-11-11 | Robert Bosch Gmbh | Anti-stiction technique for electromechanical systems and electromechanical device employing same |
| US7269079B2 (en) * | 2005-05-16 | 2007-09-11 | Micron Technology, Inc. | Power circuits for reducing a number of power supply voltage taps required for sensing a resistive memory |
| US7033861B1 (en) | 2005-05-18 | 2006-04-25 | Staktek Group L.P. | Stacked module systems and method |
| US7233520B2 (en) * | 2005-07-08 | 2007-06-19 | Micron Technology, Inc. | Process for erasing chalcogenide variable resistance memory bits |
| US7274034B2 (en) * | 2005-08-01 | 2007-09-25 | Micron Technology, Inc. | Resistance variable memory device with sputtered metal-chalcogenide region and method of fabrication |
| US7332735B2 (en) * | 2005-08-02 | 2008-02-19 | Micron Technology, Inc. | Phase change memory cell and method of formation |
| US7317567B2 (en) * | 2005-08-02 | 2008-01-08 | Micron Technology, Inc. | Method and apparatus for providing color changing thin film material |
| US20070037316A1 (en) * | 2005-08-09 | 2007-02-15 | Micron Technology, Inc. | Memory cell contact using spacers |
| US7579615B2 (en) | 2005-08-09 | 2009-08-25 | Micron Technology, Inc. | Access transistor for memory device |
| US7304368B2 (en) * | 2005-08-11 | 2007-12-04 | Micron Technology, Inc. | Chalcogenide-based electrokinetic memory element and method of forming the same |
| US7251154B2 (en) | 2005-08-15 | 2007-07-31 | Micron Technology, Inc. | Method and apparatus providing a cross-point memory array using a variable resistance memory cell and capacitance |
| US7277313B2 (en) * | 2005-08-31 | 2007-10-02 | Micron Technology, Inc. | Resistance variable memory element with threshold device and method of forming the same |
| US7541607B2 (en) * | 2005-11-02 | 2009-06-02 | Elpida Memory, Inc. | Electrically rewritable non-volatile memory element and method of manufacturing the same |
| US7576995B2 (en) | 2005-11-04 | 2009-08-18 | Entorian Technologies, Lp | Flex circuit apparatus and method for adding capacitance while conserving circuit board surface area |
| US20070144577A1 (en) * | 2005-12-23 | 2007-06-28 | Rubin George L | Solar cell with physically separated distributed electrical contacts |
| KR100744273B1 (ko) * | 2005-12-28 | 2007-07-30 | 동부일렉트로닉스 주식회사 | 상변화 메모리 소자 제조 방법 |
| US7508058B2 (en) | 2006-01-11 | 2009-03-24 | Entorian Technologies, Lp | Stacked integrated circuit module |
| US7304382B2 (en) | 2006-01-11 | 2007-12-04 | Staktek Group L.P. | Managed memory component |
| US7508069B2 (en) | 2006-01-11 | 2009-03-24 | Entorian Technologies, Lp | Managed memory component |
| US7608920B2 (en) | 2006-01-11 | 2009-10-27 | Entorian Technologies, Lp | Memory card and method for devising |
| US7605454B2 (en) | 2006-01-11 | 2009-10-20 | Entorian Technologies, Lp | Memory card and method for devising |
| US7511969B2 (en) | 2006-02-02 | 2009-03-31 | Entorian Technologies, Lp | Composite core circuit module system and method |
| US7498508B2 (en) | 2006-02-24 | 2009-03-03 | Day4 Energy, Inc. | High voltage solar cell and solar cell module |
| US8822810B2 (en) | 2006-04-13 | 2014-09-02 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
| US9006563B2 (en) | 2006-04-13 | 2015-04-14 | Solannex, Inc. | Collector grid and interconnect structures for photovoltaic arrays and modules |
| US8884155B2 (en) | 2006-04-13 | 2014-11-11 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
| US9865758B2 (en) | 2006-04-13 | 2018-01-09 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
| US9236512B2 (en) | 2006-04-13 | 2016-01-12 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
| US8729385B2 (en) | 2006-04-13 | 2014-05-20 | Daniel Luch | Collector grid and interconnect structures for photovoltaic arrays and modules |
| US7968967B2 (en) * | 2006-07-17 | 2011-06-28 | Taiwan Semiconductor Manufacturing Company, Ltd. | One-time-programmable anti-fuse formed using damascene process |
| US7560723B2 (en) * | 2006-08-29 | 2009-07-14 | Micron Technology, Inc. | Enhanced memory density resistance variable memory cells, arrays, devices and systems including the same, and methods of fabrication |
| WO2008029334A1 (en) * | 2006-09-04 | 2008-03-13 | Nxp B.V. | Fabrication of self-assembled nanowire-type interconnects on a semiconductor device |
| US8232175B2 (en) * | 2006-09-14 | 2012-07-31 | Spansion Llc | Damascene metal-insulator-metal (MIM) device with improved scaleability |
| US20080092944A1 (en) * | 2006-10-16 | 2008-04-24 | Leonid Rubin | Semiconductor structure and process for forming ohmic connections to a semiconductor structure |
| US7468553B2 (en) | 2006-10-20 | 2008-12-23 | Entorian Technologies, Lp | Stackable micropackages and stacked modules |
| US7767994B2 (en) * | 2006-12-05 | 2010-08-03 | Electronics And Telecommunications Research Institute | Phase-change random access memory device and method of manufacturing the same |
| US7888228B2 (en) * | 2007-04-05 | 2011-02-15 | Adesto Technology Corporation | Method of manufacturing an integrated circuit, an integrated circuit, and a memory module |
| US20080290368A1 (en) * | 2007-05-21 | 2008-11-27 | Day4 Energy, Inc. | Photovoltaic cell with shallow emitter |
| KR100911473B1 (ko) * | 2007-06-18 | 2009-08-11 | 삼성전자주식회사 | 상변화 메모리 유닛, 이의 제조 방법, 이를 포함하는상변화 메모리 장치 및 그 제조 방법 |
| US8237149B2 (en) * | 2007-06-18 | 2012-08-07 | Samsung Electronics Co., Ltd. | Non-volatile memory device having bottom electrode |
| KR100881055B1 (ko) * | 2007-06-20 | 2009-01-30 | 삼성전자주식회사 | 상변화 메모리 유닛, 이의 제조 방법, 이를 포함하는상변화 메모리 장치 및 그 제조 방법 |
| FR2922368A1 (fr) * | 2007-10-16 | 2009-04-17 | Commissariat Energie Atomique | Procede de fabrication d'une memoire cbram ayant une fiabilite amelioree |
| KR101168977B1 (ko) | 2007-11-19 | 2012-07-26 | 삼성전자주식회사 | 콘택홀에 인접한 층간절연막 상에 성장 방지막을 갖는집적회로 메모리 소자의 제조 방법 |
| US7994075B1 (en) * | 2008-02-26 | 2011-08-09 | Honeywell International, Inc. | Low weight and high durability soft body armor composite using topical wax coatings |
| US7855435B2 (en) * | 2008-03-12 | 2010-12-21 | Qimonda Ag | Integrated circuit, method of manufacturing an integrated circuit, and memory module |
| US7579210B1 (en) * | 2008-03-25 | 2009-08-25 | Ovonyx, Inc. | Planar segmented contact |
| BRPI0822954A2 (pt) | 2008-07-28 | 2015-06-23 | Day4 Energy Inc | Célula fotovoltaica de silício cristalino com emissor seletivo produzida com processo de retroataque de precisão em baixa temperatura e de passivação |
| US8467236B2 (en) * | 2008-08-01 | 2013-06-18 | Boise State University | Continuously variable resistor |
| US7825479B2 (en) * | 2008-08-06 | 2010-11-02 | International Business Machines Corporation | Electrical antifuse having a multi-thickness dielectric layer |
| EP2202816B1 (de) * | 2008-12-24 | 2012-06-20 | Imec | Verfahren zur Herstellung einer resistiv schaltenden Speichervorrichtung |
| TWI383950B (zh) | 2009-04-22 | 2013-02-01 | Ind Tech Res Inst | 奈米點狀材料的形成方法 |
| CN101615655B (zh) * | 2009-07-21 | 2012-09-05 | 中国科学院上海微系统与信息技术研究所 | 导电氧化物过渡层及含该过渡层的相变存储器单元 |
| TWI415139B (zh) * | 2009-11-02 | 2013-11-11 | Ind Tech Res Inst | 一種導電組成物及其形成方法 |
| JP5183708B2 (ja) * | 2010-09-21 | 2013-04-17 | 株式会社日立製作所 | 半導体装置およびその製造方法 |
| US8524599B2 (en) | 2011-03-17 | 2013-09-03 | Micron Technology, Inc. | Methods of forming at least one conductive element and methods of forming a semiconductor structure |
| US8486743B2 (en) | 2011-03-23 | 2013-07-16 | Micron Technology, Inc. | Methods of forming memory cells |
| CN102760832B (zh) * | 2011-04-29 | 2015-06-03 | 中芯国际集成电路制造(上海)有限公司 | 相变半导体器件的制造方法以及相变半导体器件 |
| US8994489B2 (en) | 2011-10-19 | 2015-03-31 | Micron Technology, Inc. | Fuses, and methods of forming and using fuses |
| US9252188B2 (en) | 2011-11-17 | 2016-02-02 | Micron Technology, Inc. | Methods of forming memory cells |
| US8723155B2 (en) | 2011-11-17 | 2014-05-13 | Micron Technology, Inc. | Memory cells and integrated devices |
| US8546231B2 (en) | 2011-11-17 | 2013-10-01 | Micron Technology, Inc. | Memory arrays and methods of forming memory cells |
| US9006075B2 (en) | 2011-11-17 | 2015-04-14 | Micron Technology, Inc. | Memory cells, semiconductor devices including such cells, and methods of fabrication |
| US9117515B2 (en) * | 2012-01-18 | 2015-08-25 | Macronix International Co., Ltd. | Programmable metallization cell with two dielectric layers |
| US8765555B2 (en) | 2012-04-30 | 2014-07-01 | Micron Technology, Inc. | Phase change memory cells and methods of forming phase change memory cells |
| US9136467B2 (en) | 2012-04-30 | 2015-09-15 | Micron Technology, Inc. | Phase change memory cells and methods of forming phase change memory cells |
| US9018613B2 (en) * | 2012-08-14 | 2015-04-28 | Kabushiki Kaisha Toshiba | Semiconductor memory device with a memory cell block including a block film |
| US9437266B2 (en) | 2012-11-13 | 2016-09-06 | Macronix International Co., Ltd. | Unipolar programmable metallization cell |
| US9553262B2 (en) | 2013-02-07 | 2017-01-24 | Micron Technology, Inc. | Arrays of memory cells and methods of forming an array of memory cells |
| KR101431656B1 (ko) * | 2013-04-05 | 2014-08-21 | 한국과학기술연구원 | 저머늄 및 셀레늄을 이용한 칼코지나이드 스위칭 소자 및 그 제조방법 |
| US20160141492A1 (en) * | 2013-07-31 | 2016-05-19 | Hewlett-Packard Development Company, L.P. | Memristor and methods for making the same |
| US9881971B2 (en) | 2014-04-01 | 2018-01-30 | Micron Technology, Inc. | Memory arrays |
| US9362494B2 (en) | 2014-06-02 | 2016-06-07 | Micron Technology, Inc. | Array of cross point memory cells and methods of forming an array of cross point memory cells |
| US9343506B2 (en) | 2014-06-04 | 2016-05-17 | Micron Technology, Inc. | Memory arrays with polygonal memory cells having specific sidewall orientations |
| US10163917B2 (en) * | 2016-11-01 | 2018-12-25 | Micron Technology, Inc. | Cell disturb prevention using a leaker device to reduce excess charge from an electronic device |
| US20190237629A1 (en) * | 2018-01-26 | 2019-08-01 | Lumileds Llc | Optically transparent adhesion layer to connect noble metals to oxides |
| CN111029417A (zh) * | 2019-12-02 | 2020-04-17 | 上海集成电路研发中心有限公司 | 一种光电探测器及其制备方法 |
| CN112382624B (zh) * | 2020-11-30 | 2026-01-27 | 海光信息技术股份有限公司 | 一种芯片及主板 |
Family Cites Families (206)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3271591A (en) * | 1963-09-20 | 1966-09-06 | Energy Conversion Devices Inc | Symmetrical current controlling device |
| US3622319A (en) | 1966-10-20 | 1971-11-23 | Western Electric Co | Nonreflecting photomasks and methods of making same |
| US3868651A (en) * | 1970-08-13 | 1975-02-25 | Energy Conversion Devices Inc | Method and apparatus for storing and reading data in a memory having catalytic material to initiate amorphous to crystalline change in memory structure |
| US3743847A (en) | 1971-06-01 | 1973-07-03 | Motorola Inc | Amorphous silicon film as a uv filter |
| US4267261A (en) * | 1971-07-15 | 1981-05-12 | Energy Conversion Devices, Inc. | Method for full format imaging |
| US3961314A (en) * | 1974-03-05 | 1976-06-01 | Energy Conversion Devices, Inc. | Structure and method for producing an image |
| US3966317A (en) * | 1974-04-08 | 1976-06-29 | Energy Conversion Devices, Inc. | Dry process production of archival microform records from hard copy |
| US4177474A (en) | 1977-05-18 | 1979-12-04 | Energy Conversion Devices, Inc. | High temperature amorphous semiconductor member and method of making the same |
| JPS5565365A (en) | 1978-11-07 | 1980-05-16 | Nippon Telegr & Teleph Corp <Ntt> | Pattern forming method |
| DE2901303C2 (de) | 1979-01-15 | 1984-04-19 | Max Planck Gesellschaft Zur Foerderung Der Wissenschaften E.V., 3400 Goettingen | Festes Ionenleitermaterial, seine Verwendung und Verfahren zu dessen Herstellung |
| US4312938A (en) | 1979-07-06 | 1982-01-26 | Drexler Technology Corporation | Method for making a broadband reflective laser recording and data storage medium with absorptive underlayer |
| US4269935A (en) | 1979-07-13 | 1981-05-26 | Ionomet Company, Inc. | Process of doping silver image in chalcogenide layer |
| US4316946A (en) | 1979-12-03 | 1982-02-23 | Ionomet Company, Inc. | Surface sensitized chalcogenide product and process for making and using the same |
| JPS56126916U (de) | 1980-02-29 | 1981-09-26 | ||
| JPS6024580B2 (ja) | 1980-03-10 | 1985-06-13 | 日本電信電話株式会社 | 半導体装置の製法 |
| US4499557A (en) | 1980-10-28 | 1985-02-12 | Energy Conversion Devices, Inc. | Programmable cell for use in programmable electronic arrays |
| US4405710A (en) | 1981-06-22 | 1983-09-20 | Cornell Research Foundation, Inc. | Ion beam exposure of (g-Gex -Se1-x) inorganic resists |
| US4737379A (en) * | 1982-09-24 | 1988-04-12 | Energy Conversion Devices, Inc. | Plasma deposited coatings, and low temperature plasma method of making same |
| US4545111A (en) * | 1983-01-18 | 1985-10-08 | Energy Conversion Devices, Inc. | Method for making, parallel preprogramming or field programming of electronic matrix arrays |
| US4608296A (en) * | 1983-12-06 | 1986-08-26 | Energy Conversion Devices, Inc. | Superconducting films and devices exhibiting AC to DC conversion |
| US4795657A (en) | 1984-04-13 | 1989-01-03 | Energy Conversion Devices, Inc. | Method of fabricating a programmable array |
| US4769338A (en) * | 1984-05-14 | 1988-09-06 | Energy Conversion Devices, Inc. | Thin film field effect transistor and method of making same |
| US4843443A (en) * | 1984-05-14 | 1989-06-27 | Energy Conversion Devices, Inc. | Thin film field effect transistor and method of making same |
| US4673957A (en) * | 1984-05-14 | 1987-06-16 | Energy Conversion Devices, Inc. | Integrated circuit compatible thin film field effect transistor and method of making same |
| US4670763A (en) * | 1984-05-14 | 1987-06-02 | Energy Conversion Devices, Inc. | Thin film field effect transistor |
| US4668968A (en) * | 1984-05-14 | 1987-05-26 | Energy Conversion Devices, Inc. | Integrated circuit compatible thin film field effect transistor and method of making same |
| US4678679A (en) * | 1984-06-25 | 1987-07-07 | Energy Conversion Devices, Inc. | Continuous deposition of activated process gases |
| US4646266A (en) * | 1984-09-28 | 1987-02-24 | Energy Conversion Devices, Inc. | Programmable semiconductor structures and methods for using the same |
| US4664939A (en) * | 1985-04-01 | 1987-05-12 | Energy Conversion Devices, Inc. | Vertical semiconductor processor |
| US4637895A (en) * | 1985-04-01 | 1987-01-20 | Energy Conversion Devices, Inc. | Gas mixtures for the vapor deposition of semiconductor material |
| US4710899A (en) | 1985-06-10 | 1987-12-01 | Energy Conversion Devices, Inc. | Data storage medium incorporating a transition metal for increased switching speed |
| US4671618A (en) | 1986-05-22 | 1987-06-09 | Wu Bao Gang | Liquid crystalline-plastic material having submillisecond switch times and extended memory |
| US4766471A (en) * | 1986-01-23 | 1988-08-23 | Energy Conversion Devices, Inc. | Thin film electro-optical devices |
| US4818717A (en) * | 1986-06-27 | 1989-04-04 | Energy Conversion Devices, Inc. | Method for making electronic matrix arrays |
| US4728406A (en) * | 1986-08-18 | 1988-03-01 | Energy Conversion Devices, Inc. | Method for plasma - coating a semiconductor body |
| US4809044A (en) * | 1986-08-22 | 1989-02-28 | Energy Conversion Devices, Inc. | Thin film overvoltage protection devices |
| US4845533A (en) * | 1986-08-22 | 1989-07-04 | Energy Conversion Devices, Inc. | Thin film electrical devices with amorphous carbon electrodes and method of making same |
| US4853785A (en) * | 1986-10-15 | 1989-08-01 | Energy Conversion Devices, Inc. | Electronic camera including electronic signal storage cartridge |
| US4788594A (en) * | 1986-10-15 | 1988-11-29 | Energy Conversion Devices, Inc. | Solid state electronic camera including thin film matrix of photosensors |
| US4847674A (en) | 1987-03-10 | 1989-07-11 | Advanced Micro Devices, Inc. | High speed interconnect system with refractory non-dogbone contacts and an active electromigration suppression mechanism |
| US4800526A (en) | 1987-05-08 | 1989-01-24 | Gaf Corporation | Memory element for information storage and retrieval system and associated process |
| US4891330A (en) * | 1987-07-27 | 1990-01-02 | Energy Conversion Devices, Inc. | Method of fabricating n-type and p-type microcrystalline semiconductor alloy material including band gap widening elements |
| US4775425A (en) * | 1987-07-27 | 1988-10-04 | Energy Conversion Devices, Inc. | P and n-type microcrystalline semiconductor alloy material including band gap widening elements, devices utilizing same |
| JPH0719841B2 (ja) | 1987-10-02 | 1995-03-06 | 株式会社東芝 | 半導体装置 |
| US5272359A (en) | 1988-04-07 | 1993-12-21 | California Institute Of Technology | Reversible non-volatile switch based on a TCNQ charge transfer complex |
| GB8910854D0 (en) | 1989-05-11 | 1989-06-28 | British Petroleum Co Plc | Semiconductor device |
| DE59009235D1 (de) * | 1989-11-30 | 1995-07-20 | Siemens Ag | Verfahren zur Verringerung der Reflektivität von Sputter-Schichten. |
| US5159661A (en) * | 1990-10-05 | 1992-10-27 | Energy Conversion Devices, Inc. | Vertically interconnected parallel distributed processor |
| US5314772A (en) | 1990-10-09 | 1994-05-24 | Arizona Board Of Regents | High resolution, multi-layer resist for microlithography and method therefor |
| JPH0770731B2 (ja) | 1990-11-22 | 1995-07-31 | 松下電器産業株式会社 | 電気可塑性素子 |
| US5534711A (en) * | 1991-01-18 | 1996-07-09 | Energy Conversion Devices, Inc. | Electrically erasable, directly overwritable, multibit single cell memory elements and arrays fabricated therefrom |
| US5596522A (en) * | 1991-01-18 | 1997-01-21 | Energy Conversion Devices, Inc. | Homogeneous compositions of microcrystalline semiconductor material, semiconductor devices and directly overwritable memory elements fabricated therefrom, and arrays fabricated from the memory elements |
| US5534712A (en) * | 1991-01-18 | 1996-07-09 | Energy Conversion Devices, Inc. | Electrically erasable memory elements characterized by reduced current and improved thermal stability |
| US5335219A (en) * | 1991-01-18 | 1994-08-02 | Ovshinsky Stanford R | Homogeneous composition of microcrystalline semiconductor material, semiconductor devices and directly overwritable memory elements fabricated therefrom, and arrays fabricated from the memory elements |
| US5414271A (en) * | 1991-01-18 | 1995-05-09 | Energy Conversion Devices, Inc. | Electrically erasable memory elements having improved set resistance stability |
| US5296716A (en) * | 1991-01-18 | 1994-03-22 | Energy Conversion Devices, Inc. | Electrically erasable, directly overwritable, multibit single cell memory elements and arrays fabricated therefrom |
| US5341328A (en) | 1991-01-18 | 1994-08-23 | Energy Conversion Devices, Inc. | Electrically erasable memory elements having reduced switching current requirements and increased write/erase cycle life |
| US5166758A (en) * | 1991-01-18 | 1992-11-24 | Energy Conversion Devices, Inc. | Electrically erasable phase change memory |
| US5536947A (en) * | 1991-01-18 | 1996-07-16 | Energy Conversion Devices, Inc. | Electrically erasable, directly overwritable, multibit single cell memory element and arrays fabricated therefrom |
| US5406509A (en) * | 1991-01-18 | 1995-04-11 | Energy Conversion Devices, Inc. | Electrically erasable, directly overwritable, multibit single cell memory elements and arrays fabricated therefrom |
| US5166556A (en) | 1991-01-22 | 1992-11-24 | Myson Technology, Inc. | Programmable antifuse structure, process, logic cell and architecture for programmable integrated circuits |
| US5128099A (en) | 1991-02-15 | 1992-07-07 | Energy Conversion Devices, Inc. | Congruent state changeable optical memory material and device |
| US5219788A (en) | 1991-02-25 | 1993-06-15 | Ibm Corporation | Bilayer metallization cap for photolithography |
| US5177567A (en) * | 1991-07-19 | 1993-01-05 | Energy Conversion Devices, Inc. | Thin-film structure for chalcogenide electrical switching devices and process therefor |
| US5359205A (en) * | 1991-11-07 | 1994-10-25 | Energy Conversion Devices, Inc. | Electrically erasable memory elements characterized by reduced current and improved thermal stability |
| DE4127189C2 (de) * | 1991-08-19 | 2001-08-16 | Gustav Schumacher | Steuereinrichtung für eine pendelnd gelagerte Baugruppe an einer landwirtschaftlichen Maschine |
| KR970009274B1 (ko) | 1991-11-11 | 1997-06-09 | 미쓰비시덴키 가부시키가이샤 | 반도체장치의 도전층접속구조 및 그 제조방법 |
| GB2261565B (en) | 1991-11-15 | 1995-05-03 | Sony Broadcast & Communication | Video image filtering |
| US5238862A (en) | 1992-03-18 | 1993-08-24 | Micron Technology, Inc. | Method of forming a stacked capacitor with striated electrode |
| JP2803940B2 (ja) * | 1992-06-23 | 1998-09-24 | シャープ株式会社 | 半導体装置 |
| KR940004732A (ko) | 1992-08-07 | 1994-03-15 | 가나이 쯔또무 | 패턴 형성 방법 및 패턴 형성에 사용하는 박막 형성 방법 |
| US5350484A (en) | 1992-09-08 | 1994-09-27 | Intel Corporation | Method for the anisotropic etching of metal films in the fabrication of interconnects |
| US5818749A (en) | 1993-08-20 | 1998-10-06 | Micron Technology, Inc. | Integrated circuit memory device |
| BE1007902A3 (nl) | 1993-12-23 | 1995-11-14 | Philips Electronics Nv | Schakelelement met geheugen voorzien van schottky tunnelbarriere. |
| US5415271A (en) * | 1994-09-12 | 1995-05-16 | Foster; Raymond K. | Reciprocating floor conveyor with overlay, protective plate |
| US5500532A (en) * | 1994-08-18 | 1996-03-19 | Arizona Board Of Regents | Personal electronic dosimeter |
| JP2643870B2 (ja) | 1994-11-29 | 1997-08-20 | 日本電気株式会社 | 半導体記憶装置の製造方法 |
| US5543737A (en) * | 1995-02-10 | 1996-08-06 | Energy Conversion Devices, Inc. | Logical operation circuit employing two-terminal chalcogenide switches |
| US5879955A (en) | 1995-06-07 | 1999-03-09 | Micron Technology, Inc. | Method for fabricating an array of ultra-small pores for chalcogenide memory cells |
| KR100253029B1 (ko) | 1995-06-07 | 2000-04-15 | 로데릭 더블류 루이스 | 불휘발성 메모리 셀내에서 다중 상태의 물질을 이용하는 스택·트랜치형 다이오드 |
| US5789758A (en) | 1995-06-07 | 1998-08-04 | Micron Technology, Inc. | Chalcogenide memory cell with a plurality of chalcogenide electrodes |
| US5869843A (en) * | 1995-06-07 | 1999-02-09 | Micron Technology, Inc. | Memory array having a multi-state element and method for forming such array or cells thereof |
| US5751012A (en) | 1995-06-07 | 1998-05-12 | Micron Technology, Inc. | Polysilicon pillar diode for use in a non-volatile memory cell |
| US6420725B1 (en) | 1995-06-07 | 2002-07-16 | Micron Technology, Inc. | Method and apparatus for forming an integrated circuit electrode having a reduced contact area |
| US5714768A (en) * | 1995-10-24 | 1998-02-03 | Energy Conversion Devices, Inc. | Second-layer phase change memory array on top of a logic device |
| US5837564A (en) | 1995-11-01 | 1998-11-17 | Micron Technology, Inc. | Method for optimal crystallization to obtain high electrical performance from chalcogenides |
| US5694054A (en) * | 1995-11-28 | 1997-12-02 | Energy Conversion Devices, Inc. | Integrated drivers for flat panel displays employing chalcogenide logic elements |
| US5591501A (en) * | 1995-12-20 | 1997-01-07 | Energy Conversion Devices, Inc. | Optical recording medium having a plurality of discrete phase change data recording points |
| US6653733B1 (en) | 1996-02-23 | 2003-11-25 | Micron Technology, Inc. | Conductors in semiconductor devices |
| US5687112A (en) * | 1996-04-19 | 1997-11-11 | Energy Conversion Devices, Inc. | Multibit single cell memory element having tapered contact |
| US5852870A (en) | 1996-04-24 | 1998-12-29 | Amkor Technology, Inc. | Method of making grid array assembly |
| US5851882A (en) | 1996-05-06 | 1998-12-22 | Micron Technology, Inc. | ZPROM manufacture and design and methods for forming thin structures using spacers as an etching mask |
| US5899724A (en) | 1996-05-09 | 1999-05-04 | International Business Machines Corporation | Method for fabricating a titanium resistor |
| US5761115A (en) | 1996-05-30 | 1998-06-02 | Axon Technologies Corporation | Programmable metallization cell structure and method of making same |
| US5789277A (en) | 1996-07-22 | 1998-08-04 | Micron Technology, Inc. | Method of making chalogenide memory device |
| US5814527A (en) | 1996-07-22 | 1998-09-29 | Micron Technology, Inc. | Method of making small pores defined by a disposable internal spacer for use in chalcogenide memories |
| JPH1050836A (ja) * | 1996-07-31 | 1998-02-20 | Sumitomo Metal Ind Ltd | 半導体装置の製造方法 |
| US5998244A (en) | 1996-08-22 | 1999-12-07 | Micron Technology, Inc. | Memory cell incorporating a chalcogenide element and method of making same |
| US6087674A (en) * | 1996-10-28 | 2000-07-11 | Energy Conversion Devices, Inc. | Memory element with memory material comprising phase-change material and dielectric material |
| US5825046A (en) * | 1996-10-28 | 1998-10-20 | Energy Conversion Devices, Inc. | Composite memory material comprising a mixture of phase-change memory material and dielectric material |
| US5846889A (en) | 1997-03-14 | 1998-12-08 | The United States Of America As Represented By The Secretary Of The Navy | Infrared transparent selenide glasses |
| GB2323704B (en) * | 1997-03-24 | 2001-10-24 | United Microelectronics Corp | Self-aligned unlanded via metallization |
| US5998066A (en) | 1997-05-16 | 1999-12-07 | Aerial Imaging Corporation | Gray scale mask and depth pattern transfer technique using inorganic chalcogenide glass |
| US5952671A (en) | 1997-05-09 | 1999-09-14 | Micron Technology, Inc. | Small electrode for a chalcogenide switching device and method for fabricating same |
| US6031287A (en) | 1997-06-18 | 2000-02-29 | Micron Technology, Inc. | Contact structure and memory element incorporating the same |
| US5933365A (en) * | 1997-06-19 | 1999-08-03 | Energy Conversion Devices, Inc. | Memory element with energy control mechanism |
| US6051511A (en) | 1997-07-31 | 2000-04-18 | Micron Technology, Inc. | Method and apparatus for reducing isolation stress in integrated circuits |
| JP3180740B2 (ja) * | 1997-11-11 | 2001-06-25 | 日本電気株式会社 | キャパシタの製造方法 |
| JP2001525606A (ja) | 1997-12-04 | 2001-12-11 | アクソン テクノロジーズ コーポレイション | プログラム可能なサブサーフェス集合メタライゼーション構造およびその作製方法 |
| US6011757A (en) * | 1998-01-27 | 2000-01-04 | Ovshinsky; Stanford R. | Optical recording media having increased erasability |
| US5993365A (en) * | 1998-03-26 | 1999-11-30 | Eastman Kodak Company | Tool attachment and release device for robotic arms |
| US6100194A (en) | 1998-06-22 | 2000-08-08 | Stmicroelectronics, Inc. | Silver metallization by damascene method |
| US5912839A (en) * | 1998-06-23 | 1999-06-15 | Energy Conversion Devices, Inc. | Universal memory element and method of programming same |
| US6297170B1 (en) | 1998-06-23 | 2001-10-02 | Vlsi Technology, Inc. | Sacrificial multilayer anti-reflective coating for mos gate formation |
| US6141241A (en) * | 1998-06-23 | 2000-10-31 | Energy Conversion Devices, Inc. | Universal memory element with systems employing same and apparatus and method for reading, writing and programming same |
| US6388324B2 (en) * | 1998-08-31 | 2002-05-14 | Arizona Board Of Regents | Self-repairing interconnections for electrical circuits |
| US6469364B1 (en) | 1998-08-31 | 2002-10-22 | Arizona Board Of Regents | Programmable interconnection system for electrical circuits |
| US6184477B1 (en) * | 1998-12-02 | 2001-02-06 | Kyocera Corporation | Multi-layer circuit substrate having orthogonal grid ground and power planes |
| US6487106B1 (en) | 1999-01-12 | 2002-11-26 | Arizona Board Of Regents | Programmable microelectronic devices and method of forming and programming same |
| US6825489B2 (en) | 2001-04-06 | 2004-11-30 | Axon Technologies Corporation | Microelectronic device, structure, and system, including a memory structure having a variable programmable property and method of forming the same |
| US6635914B2 (en) * | 2000-09-08 | 2003-10-21 | Axon Technologies Corp. | Microelectronic programmable device and methods of forming and programming the same |
| US6985378B2 (en) | 1998-12-04 | 2006-01-10 | Axon Technologies Corporation | Programmable microelectronic device, structure, and system and method of forming the same |
| US6177338B1 (en) | 1999-02-08 | 2001-01-23 | Taiwan Semiconductor Manufacturing Company | Two step barrier process |
| HK1039395B (en) * | 1999-02-11 | 2007-12-14 | Arizona Board Of Regents | Programmable microelectronic devices and methods of forming and programming same |
| JP3974284B2 (ja) * | 1999-03-18 | 2007-09-12 | 株式会社東芝 | 半導体装置の製造方法 |
| US6072716A (en) | 1999-04-14 | 2000-06-06 | Massachusetts Institute Of Technology | Memory structures and methods of making same |
| US6143604A (en) | 1999-06-04 | 2000-11-07 | Taiwan Semiconductor Manufacturing Company | Method for fabricating small-size two-step contacts for word-line strapping on dynamic random access memory (DRAM) |
| US6350679B1 (en) | 1999-08-03 | 2002-02-26 | Micron Technology, Inc. | Methods of providing an interlevel dielectric layer intermediate different elevation conductive metal layers in the fabrication of integrated circuitry |
| US20030107105A1 (en) | 1999-08-31 | 2003-06-12 | Kozicki Michael N. | Programmable chip-to-substrate interconnect structure and device and method of forming same |
| US6423628B1 (en) | 1999-10-22 | 2002-07-23 | Lsi Logic Corporation | Method of forming integrated circuit structure having low dielectric constant material and having silicon oxynitride caps over closely spaced apart metal lines |
| US6914802B2 (en) * | 2000-02-11 | 2005-07-05 | Axon Technologies Corporation | Microelectronic photonic structure and device and method of forming the same |
| US6865117B2 (en) | 2000-02-11 | 2005-03-08 | Axon Technologies Corporation | Programming circuit for a programmable microelectronic device, system including the circuit, and method of forming the same |
| US6501111B1 (en) * | 2000-06-30 | 2002-12-31 | Intel Corporation | Three-dimensional (3D) programmable device |
| US6440837B1 (en) | 2000-07-14 | 2002-08-27 | Micron Technology, Inc. | Method of forming a contact structure in a semiconductor device |
| US6563156B2 (en) | 2001-03-15 | 2003-05-13 | Micron Technology, Inc. | Memory elements and methods for making same |
| AU2001288971A1 (en) | 2000-09-08 | 2002-03-22 | Axon Technologies Corporation | Microelectronic programmable device and methods of forming and programming the same |
| US6555860B2 (en) * | 2000-09-29 | 2003-04-29 | Intel Corporation | Compositionally modified resistive electrode |
| US6429064B1 (en) * | 2000-09-29 | 2002-08-06 | Intel Corporation | Reduced contact area of sidewall conductor |
| US6404665B1 (en) * | 2000-09-29 | 2002-06-11 | Intel Corporation | Compositionally modified resistive electrode |
| US6567293B1 (en) * | 2000-09-29 | 2003-05-20 | Ovonyx, Inc. | Single level metal memory cell using chalcogenide cladding |
| US6563164B2 (en) * | 2000-09-29 | 2003-05-13 | Ovonyx, Inc. | Compositionally modified resistive electrode |
| US6339544B1 (en) * | 2000-09-29 | 2002-01-15 | Intel Corporation | Method to enhance performance of thermal resistor device |
| DE60131036T2 (de) | 2000-11-01 | 2008-02-14 | Japan Science And Technology Agency, Kawaguchi | Ein NOT-Schaltkreis |
| US6653193B2 (en) * | 2000-12-08 | 2003-11-25 | Micron Technology, Inc. | Resistance variable device |
| US6649928B2 (en) | 2000-12-13 | 2003-11-18 | Intel Corporation | Method to selectively remove one side of a conductive bottom electrode of a phase-change memory cell and structure obtained thereby |
| US6696355B2 (en) * | 2000-12-14 | 2004-02-24 | Ovonyx, Inc. | Method to selectively increase the top resistance of the lower programming electrode in a phase-change memory |
| US6437383B1 (en) * | 2000-12-21 | 2002-08-20 | Intel Corporation | Dual trench isolation for a phase-change memory cell and method of making same |
| US6569705B2 (en) * | 2000-12-21 | 2003-05-27 | Intel Corporation | Metal structure for a phase-change memory device |
| US6646297B2 (en) | 2000-12-26 | 2003-11-11 | Ovonyx, Inc. | Lower electrode isolation in a double-wide trench |
| US6534781B2 (en) * | 2000-12-26 | 2003-03-18 | Ovonyx, Inc. | Phase-change memory bipolar array utilizing a single shallow trench isolation for creating an individual active area region for two memory array elements and one bipolar base contact |
| US6531373B2 (en) * | 2000-12-27 | 2003-03-11 | Ovonyx, Inc. | Method of forming a phase-change memory cell using silicon on insulator low electrode in charcogenide elements |
| US6687427B2 (en) * | 2000-12-29 | 2004-02-03 | Intel Corporation | Optic switch |
| US6638820B2 (en) | 2001-02-08 | 2003-10-28 | Micron Technology, Inc. | Method of forming chalcogenide comprising devices, method of precluding diffusion of a metal into adjacent chalcogenide material, and chalcogenide comprising devices |
| US6727192B2 (en) | 2001-03-01 | 2004-04-27 | Micron Technology, Inc. | Methods of metal doping a chalcogenide material |
| US6348365B1 (en) | 2001-03-02 | 2002-02-19 | Micron Technology, Inc. | PCRAM cell manufacturing |
| US6818481B2 (en) | 2001-03-07 | 2004-11-16 | Micron Technology, Inc. | Method to manufacture a buried electrode PCRAM cell |
| US6734455B2 (en) * | 2001-03-15 | 2004-05-11 | Micron Technology, Inc. | Agglomeration elimination for metal sputter deposition of chalcogenides |
| US6473332B1 (en) | 2001-04-04 | 2002-10-29 | The University Of Houston System | Electrically variable multi-state resistance computing |
| US6724069B2 (en) * | 2001-04-05 | 2004-04-20 | International Business Machines Corporation | Spin-on cap layer, and semiconductor device containing same |
| EP1397809B1 (de) | 2001-05-07 | 2007-06-27 | Advanced Micro Devices, Inc. | Speichervorrichtung mit einem sich selbst einbauenden polymer und verfahren zur herstellung derselben |
| US7102150B2 (en) | 2001-05-11 | 2006-09-05 | Harshfield Steven T | PCRAM memory cell and method of making same |
| US6480438B1 (en) * | 2001-06-12 | 2002-11-12 | Ovonyx, Inc. | Providing equal cell programming conditions across a large and high density array of phase-change memory cells |
| US6613604B2 (en) * | 2001-08-02 | 2003-09-02 | Ovonyx, Inc. | Method for making small pore for use in programmable resistance memory element |
| US6589714B2 (en) * | 2001-06-26 | 2003-07-08 | Ovonyx, Inc. | Method for making programmable resistance memory element using silylated photoresist |
| US6487113B1 (en) * | 2001-06-29 | 2002-11-26 | Ovonyx, Inc. | Programming a phase-change memory with slow quench time |
| US6462984B1 (en) * | 2001-06-29 | 2002-10-08 | Intel Corporation | Biasing scheme of floating unselected wordlines and bitlines of a diode-based memory array |
| US6570784B2 (en) * | 2001-06-29 | 2003-05-27 | Ovonyx, Inc. | Programming a phase-change material memory |
| US6511867B2 (en) * | 2001-06-30 | 2003-01-28 | Ovonyx, Inc. | Utilizing atomic layer deposition for programmable device |
| US6511862B2 (en) * | 2001-06-30 | 2003-01-28 | Ovonyx, Inc. | Modified contact for programmable devices |
| US6514805B2 (en) * | 2001-06-30 | 2003-02-04 | Intel Corporation | Trench sidewall profile for device isolation |
| US6642102B2 (en) * | 2001-06-30 | 2003-11-04 | Intel Corporation | Barrier material encapsulation of programmable material |
| US6673700B2 (en) * | 2001-06-30 | 2004-01-06 | Ovonyx, Inc. | Reduced area intersection between electrode and programming element |
| US6605527B2 (en) * | 2001-06-30 | 2003-08-12 | Intel Corporation | Reduced area intersection between electrode and programming element |
| US6951805B2 (en) | 2001-08-01 | 2005-10-04 | Micron Technology, Inc. | Method of forming integrated circuitry, method of forming memory circuitry, and method of forming random access memory circuitry |
| US6590807B2 (en) * | 2001-08-02 | 2003-07-08 | Intel Corporation | Method for reading a structural phase-change memory |
| US6737312B2 (en) | 2001-08-27 | 2004-05-18 | Micron Technology, Inc. | Method of fabricating dual PCRAM cells sharing a common electrode |
| US6881623B2 (en) | 2001-08-29 | 2005-04-19 | Micron Technology, Inc. | Method of forming chalcogenide comprising devices, method of forming a programmable memory cell of memory circuitry, and a chalcogenide comprising device |
| US6955940B2 (en) | 2001-08-29 | 2005-10-18 | Micron Technology, Inc. | Method of forming chalcogenide comprising devices |
| US6784018B2 (en) * | 2001-08-29 | 2004-08-31 | Micron Technology, Inc. | Method of forming chalcogenide comprising devices and method of forming a programmable memory cell of memory circuitry |
| US6646902B2 (en) | 2001-08-30 | 2003-11-11 | Micron Technology, Inc. | Method of retaining memory state in a programmable conductor RAM |
| US6709958B2 (en) * | 2001-08-30 | 2004-03-23 | Micron Technology, Inc. | Integrated circuit device and fabrication using metal-doped chalcogenide materials |
| US20030047765A1 (en) * | 2001-08-30 | 2003-03-13 | Campbell Kristy A. | Stoichiometry for chalcogenide glasses useful for memory devices and method of formation |
| US6507061B1 (en) * | 2001-08-31 | 2003-01-14 | Intel Corporation | Multiple layer phase-change memory |
| WO2003021589A1 (en) * | 2001-09-01 | 2003-03-13 | Energy Conversion Devices, Inc. | Increased data storage in optical data storage and retrieval systems using blue lasers and/or plasmon lenses |
| US6586761B2 (en) * | 2001-09-07 | 2003-07-01 | Intel Corporation | Phase change material memory device |
| US6545287B2 (en) * | 2001-09-07 | 2003-04-08 | Intel Corporation | Using selective deposition to form phase-change memory cells |
| US6690026B2 (en) * | 2001-09-28 | 2004-02-10 | Intel Corporation | Method of fabricating a three-dimensional array of active media |
| US6566700B2 (en) * | 2001-10-11 | 2003-05-20 | Ovonyx, Inc. | Carbon-containing interfacial layer for phase-change memory |
| WO2003036735A2 (en) | 2001-10-26 | 2003-05-01 | Arizona Board Of Regents | Programmable surface control devices and method of making same |
| US6545907B1 (en) * | 2001-10-30 | 2003-04-08 | Ovonyx, Inc. | Technique and apparatus for performing write operations to a phase change material memory device |
| US6576921B2 (en) | 2001-11-08 | 2003-06-10 | Intel Corporation | Isolating phase change material memory cells |
| US6815818B2 (en) * | 2001-11-19 | 2004-11-09 | Micron Technology, Inc. | Electrode structure for use in an integrated circuit |
| US6791859B2 (en) * | 2001-11-20 | 2004-09-14 | Micron Technology, Inc. | Complementary bit PCRAM sense amplifier and method of operation |
| US6873538B2 (en) | 2001-12-20 | 2005-03-29 | Micron Technology, Inc. | Programmable conductor random access memory and a method for writing thereto |
| US6667900B2 (en) | 2001-12-28 | 2003-12-23 | Ovonyx, Inc. | Method and apparatus to operate a memory cell |
| US6625054B2 (en) * | 2001-12-28 | 2003-09-23 | Intel Corporation | Method and apparatus to program a phase change memory |
| US6512241B1 (en) * | 2001-12-31 | 2003-01-28 | Intel Corporation | Phase change material memory device |
| US6909656B2 (en) | 2002-01-04 | 2005-06-21 | Micron Technology, Inc. | PCRAM rewrite prevention |
| US20030143782A1 (en) | 2002-01-31 | 2003-07-31 | Gilton Terry L. | Methods of forming germanium selenide comprising devices and methods of forming silver selenide comprising structures |
| US6867064B2 (en) | 2002-02-15 | 2005-03-15 | Micron Technology, Inc. | Method to alter chalcogenide glass for improved switching characteristics |
| US6791885B2 (en) | 2002-02-19 | 2004-09-14 | Micron Technology, Inc. | Programmable conductor random access memory and method for sensing same |
| US7151273B2 (en) | 2002-02-20 | 2006-12-19 | Micron Technology, Inc. | Silver-selenide/chalcogenide glass stack for resistance variable memory |
| WO2003079463A2 (en) | 2002-03-15 | 2003-09-25 | Axon Technologies Corporation | Programmable structure, an array including the structure, and methods of forming the same |
| JP2003270264A (ja) | 2002-03-20 | 2003-09-25 | Denso Corp | 半導体式力学量センサ |
| US6671710B2 (en) * | 2002-05-10 | 2003-12-30 | Energy Conversion Devices, Inc. | Methods of computing with digital multistate phase change materials |
| US6918382B2 (en) * | 2002-08-26 | 2005-07-19 | Energy Conversion Devices, Inc. | Hydrogen powered scooter |
-
2001
- 2001-11-19 US US09/988,984 patent/US6815818B2/en not_active Expired - Lifetime
-
2002
- 2002-11-19 KR KR1020047007622A patent/KR100593283B1/ko not_active Expired - Fee Related
- 2002-11-19 CN CNA2007100061607A patent/CN101005056A/zh active Pending
- 2002-11-19 CN CNB028272862A patent/CN100521147C/zh not_active Expired - Fee Related
- 2002-11-19 JP JP2003553613A patent/JP4587670B2/ja not_active Expired - Fee Related
- 2002-11-19 EP EP02797134A patent/EP1446832B1/de not_active Expired - Lifetime
- 2002-11-19 AU AU2002362009A patent/AU2002362009A1/en not_active Abandoned
- 2002-11-19 WO PCT/US2002/037020 patent/WO2003052815A2/en not_active Ceased
- 2002-11-19 AT AT07002959T patent/ATE512442T1/de not_active IP Right Cessation
- 2002-11-19 EP EP07002959A patent/EP1780728B1/de not_active Expired - Lifetime
-
2004
- 2004-06-23 US US10/873,231 patent/US7115992B2/en not_active Expired - Lifetime
- 2004-06-23 US US10/873,230 patent/US7115504B2/en not_active Expired - Lifetime
- 2004-06-24 US US10/874,226 patent/US7332401B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| EP1446832B1 (de) | 2012-08-01 |
| US7115504B2 (en) | 2006-10-03 |
| JP4587670B2 (ja) | 2010-11-24 |
| EP1446832A2 (de) | 2004-08-18 |
| CN1615544A (zh) | 2005-05-11 |
| EP1780728B1 (de) | 2011-06-08 |
| US20040232551A1 (en) | 2004-11-25 |
| CN101005056A (zh) | 2007-07-25 |
| CN100521147C (zh) | 2009-07-29 |
| KR100593283B1 (ko) | 2006-06-28 |
| US20040229423A1 (en) | 2004-11-18 |
| EP1780728A3 (de) | 2010-03-03 |
| US20040238958A1 (en) | 2004-12-02 |
| US6815818B2 (en) | 2004-11-09 |
| US20030096497A1 (en) | 2003-05-22 |
| AU2002362009A1 (en) | 2003-06-30 |
| WO2003052815A2 (en) | 2003-06-26 |
| KR20040064280A (ko) | 2004-07-16 |
| EP1780728A2 (de) | 2007-05-02 |
| WO2003052815A3 (en) | 2003-11-20 |
| US7115992B2 (en) | 2006-10-03 |
| JP2005513780A (ja) | 2005-05-12 |
| US7332401B2 (en) | 2008-02-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| ATE512442T1 (de) | Speicherzelle zur verwendung in einer integrierten schaltung | |
| DE69904163D1 (de) | Aus papier gefertigtes substrat mit einem integrierten schaltkreis | |
| DE69923194D1 (de) | Leitfähiger kontakt | |
| GB2342213B (en) | Thin film transistor substrate with testing circuit | |
| DE69723252D1 (de) | Multibiteinzelzellenspeicher mit spitz zulaufendem kontakt | |
| DE69903305D1 (de) | Anisotrop leitender klebstoff für feinen kontaktabstand | |
| WO2002089178A3 (en) | Embedded metal nanocrystals | |
| ATE490555T1 (de) | Elektrisch programmierbare schmelzverbindung | |
| DE69814376D1 (de) | Elektronisches Endgerät | |
| DE10196069T1 (de) | Elektrisch leitende Harzzusammensetzung | |
| EP1113275A4 (de) | Leitfähiger kontakt | |
| DE69930439D1 (de) | Elektrische Vorrichtung mit integriertem Flashspeicher | |
| DE69904889D1 (de) | Elektrisch leitende Paste und Glassubstrat mit aufgetragenem elektrischen Schaltkreis | |
| DE69902957D1 (de) | Leitfähige Harzzusammensetzung | |
| DE69924568D1 (de) | Leitfähige Paste und Glasschaltungssubstrat | |
| DE59914917D1 (de) | Chipkarte mit integrierter Schaltung | |
| AU2003254588A1 (en) | Data support with transponder coil | |
| DE69827801D1 (de) | Feldemitterherstellung durch elektrochemischen lift off mit offenem schaltkreis | |
| DK26798A (da) | Elektrisk kredsløb | |
| WO2002071482A3 (de) | Hohlraumstruktur in einer integrierten schaltung und verfahren zum herstellen einer hohlraumstruktur in einer integrierten schaltung | |
| DE69319768D1 (de) | Elektrischer Kontakt mit Zunge gegen Lotkapillarwirkung | |
| DE69534542D1 (de) | Herstellungsverfahren für einen Kontakt in einer integrierten Schaltung | |
| DE69932493D1 (de) | Elektrisches Schaltgerät mit einem geschlitzten Kontakt | |
| DE59807185D1 (de) | Elektrisches Kontaktelement | |
| ATE277384T1 (de) | Magnetstreifen mit einer klebeschicht |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |