ATE386328T1 - Rauschreduktionstechnik für transistoren und kleine anordnungen benutzend episodische agitation - Google Patents
Rauschreduktionstechnik für transistoren und kleine anordnungen benutzend episodische agitationInfo
- Publication number
- ATE386328T1 ATE386328T1 AT02806618T AT02806618T ATE386328T1 AT E386328 T1 ATE386328 T1 AT E386328T1 AT 02806618 T AT02806618 T AT 02806618T AT 02806618 T AT02806618 T AT 02806618T AT E386328 T1 ATE386328 T1 AT E386328T1
- Authority
- AT
- Austria
- Prior art keywords
- cell
- present
- integration time
- noise reduction
- transistors
- Prior art date
Links
- 238000013019 agitation Methods 0.000 title abstract 3
- 230000001667 episodic effect Effects 0.000 title abstract 2
- 238000005516 engineering process Methods 0.000 title 1
- 238000000034 method Methods 0.000 abstract 4
- 230000010354 integration Effects 0.000 abstract 3
- 206010001497 Agitation Diseases 0.000 abstract 2
- 230000000694 effects Effects 0.000 abstract 2
- 230000015654 memory Effects 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
- G11C11/5642—Sensing or reading circuits; Data output circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/22—Safety or protection circuits preventing unauthorised or accidental access to memory cells
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
- G11C16/0441—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing multiple floating gate devices, e.g. separate read-and-write FAMOS transistors with connected floating gates
- G11C16/0458—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing multiple floating gate devices, e.g. separate read-and-write FAMOS transistors with connected floating gates comprising two or more independent floating gates which store independent data
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Computer Security & Cryptography (AREA)
- Non-Volatile Memory (AREA)
- Semiconductor Memories (AREA)
- Read Only Memory (AREA)
- Amplifiers (AREA)
- Bipolar Transistors (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/052,924 US6850441B2 (en) | 2002-01-18 | 2002-01-18 | Noise reduction technique for transistors and small devices utilizing an episodic agitation |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE386328T1 true ATE386328T1 (de) | 2008-03-15 |
Family
ID=21980791
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT02806618T ATE386328T1 (de) | 2002-01-18 | 2002-12-16 | Rauschreduktionstechnik für transistoren und kleine anordnungen benutzend episodische agitation |
Country Status (10)
| Country | Link |
|---|---|
| US (3) | US6850441B2 (de) |
| EP (1) | EP1466331B1 (de) |
| JP (1) | JP4326339B2 (de) |
| KR (1) | KR100953373B1 (de) |
| CN (1) | CN100520980C (de) |
| AT (1) | ATE386328T1 (de) |
| AU (1) | AU2002357265A1 (de) |
| DE (1) | DE60225068T2 (de) |
| TW (1) | TWI264016B (de) |
| WO (1) | WO2003063171A2 (de) |
Families Citing this family (87)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6805441B1 (en) * | 2003-08-11 | 2004-10-19 | Jorg Schuster | Rimless eyewear |
| US7046555B2 (en) | 2003-09-17 | 2006-05-16 | Sandisk Corporation | Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance |
| US7154779B2 (en) * | 2004-01-21 | 2006-12-26 | Sandisk Corporation | Non-volatile memory cell using high-k material inter-gate programming |
| DE102004029520B4 (de) * | 2004-06-18 | 2008-12-24 | Infineon Technologies Ag | Transistor-Anordnung mit Rauscherfassung |
| KR100602320B1 (ko) * | 2005-05-03 | 2006-07-18 | 주식회사 하이닉스반도체 | 프로그램 속도가 균일한 비휘발성 메모리 소자 |
| US20070059945A1 (en) * | 2005-09-12 | 2007-03-15 | Nima Mohklesi | Atomic layer deposition with nitridation and oxidation |
| KR100673020B1 (ko) * | 2005-12-20 | 2007-01-24 | 삼성전자주식회사 | 전계효과 소오스/드레인 영역을 가지는 반도체 장치 |
| US7412668B1 (en) * | 2006-01-30 | 2008-08-12 | Xilinx, Inc. | Integrated system noise management—decoupling capacitance |
| US7428717B1 (en) | 2006-01-30 | 2008-09-23 | Xilinx, Inc. | Integrated system noise management—system level |
| US7412673B1 (en) | 2006-01-30 | 2008-08-12 | Xilinx, Inc. | Integrated system noise management—bounce voltage |
| US7509608B1 (en) | 2006-01-30 | 2009-03-24 | Xilinx, Inc. | Integrated system noise management—clock jitter |
| US7499319B2 (en) * | 2006-03-03 | 2009-03-03 | Sandisk Corporation | Read operation for non-volatile storage with compensation for coupling |
| US7551486B2 (en) | 2006-05-15 | 2009-06-23 | Apple Inc. | Iterative memory cell charging based on reference cell value |
| US7852690B2 (en) * | 2006-05-15 | 2010-12-14 | Apple Inc. | Multi-chip package for a flash memory |
| US7911834B2 (en) * | 2006-05-15 | 2011-03-22 | Apple Inc. | Analog interface for a flash memory die |
| US7639542B2 (en) * | 2006-05-15 | 2009-12-29 | Apple Inc. | Maintenance operations for multi-level data storage cells |
| US7613043B2 (en) * | 2006-05-15 | 2009-11-03 | Apple Inc. | Shifting reference values to account for voltage sag |
| US7511646B2 (en) * | 2006-05-15 | 2009-03-31 | Apple Inc. | Use of 8-bit or higher A/D for NAND cell value |
| US8000134B2 (en) | 2006-05-15 | 2011-08-16 | Apple Inc. | Off-die charge pump that supplies multiple flash devices |
| US7568135B2 (en) | 2006-05-15 | 2009-07-28 | Apple Inc. | Use of alternative value in cell detection |
| US7701797B2 (en) * | 2006-05-15 | 2010-04-20 | Apple Inc. | Two levels of voltage regulation supplied for logic and data programming voltage of a memory device |
| US7639531B2 (en) * | 2006-05-15 | 2009-12-29 | Apple Inc. | Dynamic cell bit resolution |
| US7778072B2 (en) * | 2006-07-27 | 2010-08-17 | Macronix International Co., Ltd. | Method for fabricating charge-trapping memory |
| US7688366B2 (en) * | 2006-09-07 | 2010-03-30 | Aptina Imaging Corporation | Method and apparatus for suppressing noise in image sensor devices |
| US7646054B2 (en) | 2006-09-19 | 2010-01-12 | Sandisk Corporation | Array of non-volatile memory cells with floating gates formed of spacers in substrate trenches |
| US7696044B2 (en) | 2006-09-19 | 2010-04-13 | Sandisk Corporation | Method of making an array of non-volatile memory cells with floating gates formed of spacers in substrate trenches |
| US7800161B2 (en) * | 2006-12-21 | 2010-09-21 | Sandisk Corporation | Flash NAND memory cell array with charge storage elements positioned in trenches |
| US7642160B2 (en) * | 2006-12-21 | 2010-01-05 | Sandisk Corporation | Method of forming a flash NAND memory cell array with charge storage elements positioned in trenches |
| US7929349B2 (en) * | 2007-02-28 | 2011-04-19 | Samsung Electronics Co., Ltd. | Method of operating nonvolatile memory device |
| JP2008217971A (ja) * | 2007-02-28 | 2008-09-18 | Samsung Electronics Co Ltd | 不揮発性メモリ素子の作動方法 |
| US7904793B2 (en) * | 2007-03-29 | 2011-03-08 | Sandisk Corporation | Method for decoding data in non-volatile storage using reliability metrics based on multiple reads |
| US7797480B2 (en) * | 2007-03-29 | 2010-09-14 | Sandisk Corporation | Method for reading non-volatile storage using pre-conditioning waveforms and modified reliability metrics |
| US7966546B2 (en) * | 2007-03-31 | 2011-06-21 | Sandisk Technologies Inc. | Non-volatile memory with soft bit data transmission for error correction control |
| US7975209B2 (en) * | 2007-03-31 | 2011-07-05 | Sandisk Technologies Inc. | Non-volatile memory with guided simulated annealing error correction control |
| US7971127B2 (en) * | 2007-03-31 | 2011-06-28 | Sandisk Technologies Inc. | Guided simulated annealing in non-volatile memory error correction control |
| US7966550B2 (en) | 2007-03-31 | 2011-06-21 | Sandisk Technologies Inc. | Soft bit data transmission for error correction control in non-volatile memory |
| US7830729B2 (en) * | 2007-06-15 | 2010-11-09 | Micron Technology, Inc. | Digital filters with memory |
| US7733262B2 (en) | 2007-06-15 | 2010-06-08 | Micron Technology, Inc. | Quantizing circuits with variable reference signals |
| US7839703B2 (en) | 2007-06-15 | 2010-11-23 | Micron Technology, Inc. | Subtraction circuits and digital-to-analog converters for semiconductor devices |
| US7667632B2 (en) * | 2007-06-15 | 2010-02-23 | Micron Technology, Inc. | Quantizing circuits for semiconductor devices |
| US7818638B2 (en) * | 2007-06-15 | 2010-10-19 | Micron Technology, Inc. | Systems and devices including memory with built-in self test and methods of making and using the same |
| US7969783B2 (en) * | 2007-06-15 | 2011-06-28 | Micron Technology, Inc. | Memory with correlated resistance |
| US7538702B2 (en) * | 2007-06-15 | 2009-05-26 | Micron Technology, Inc. | Quantizing circuits with variable parameters |
| US8068367B2 (en) * | 2007-06-15 | 2011-11-29 | Micron Technology, Inc. | Reference current sources |
| US8117520B2 (en) * | 2007-06-15 | 2012-02-14 | Micron Technology, Inc. | Error detection for multi-bit memory |
| US7768868B2 (en) * | 2007-06-15 | 2010-08-03 | Micron Technology, Inc. | Digital filters for semiconductor devices |
| US7817073B2 (en) * | 2007-06-15 | 2010-10-19 | Micron Technology, Inc. | Integrators for delta-sigma modulators |
| US9135962B2 (en) | 2007-06-15 | 2015-09-15 | Micron Technology, Inc. | Comparators for delta-sigma modulators |
| KR101287447B1 (ko) * | 2007-08-28 | 2013-07-19 | 삼성전자주식회사 | 이이피롬 셀, 이이피롬 셀 제조 방법 및 이이피롬 셀에서의데이터 읽기 방법 |
| US8085596B2 (en) * | 2007-09-11 | 2011-12-27 | Micron Technology, Inc. | Reducing noise in semiconductor devices |
| US7952927B2 (en) * | 2007-12-05 | 2011-05-31 | Micron Technology, Inc. | Adjusting program and erase voltages in a memory device |
| US7864609B2 (en) * | 2008-06-30 | 2011-01-04 | Micron Technology, Inc. | Methods for determining resistance of phase change memory elements |
| JP5281455B2 (ja) | 2009-03-26 | 2013-09-04 | 株式会社東芝 | 不揮発性半導体記憶装置及びその駆動方法 |
| KR101586046B1 (ko) * | 2009-05-26 | 2016-01-18 | 삼성전자주식회사 | 저장 장치 및 그것의 읽기 방법 |
| JP5232729B2 (ja) * | 2009-06-30 | 2013-07-10 | 株式会社アドバンテスト | 出力装置および試験装置 |
| US8416624B2 (en) | 2010-05-21 | 2013-04-09 | SanDisk Technologies, Inc. | Erase and programming techniques to reduce the widening of state distributions in non-volatile memories |
| KR20120011642A (ko) | 2010-07-29 | 2012-02-08 | 삼성전자주식회사 | 기준 셀을 포함하는 불휘발성 메모리 장치 및 그것의 기준 전류 설정 방법 |
| US8432740B2 (en) | 2011-07-21 | 2013-04-30 | Sandisk Technologies Inc. | Program algorithm with staircase waveform decomposed into multiple passes |
| KR101874408B1 (ko) | 2011-11-09 | 2018-07-05 | 삼성전자주식회사 | 비휘발성 메모리 장치 및 이를 포함하는 메모리 시스템 |
| CN103177761A (zh) * | 2011-12-23 | 2013-06-26 | 北京大学 | 阻变存储设备及其操作方法 |
| US9190162B2 (en) * | 2012-03-13 | 2015-11-17 | Micron Technology, Inc. | Nonconsecutive sensing of multilevel memory cells |
| US8804430B2 (en) * | 2012-03-26 | 2014-08-12 | Sandisk Technologies Inc. | Selected word line dependent select gate diffusion region voltage during programming |
| US8638608B2 (en) | 2012-03-26 | 2014-01-28 | Sandisk Technologies Inc. | Selected word line dependent select gate voltage during program |
| US8750045B2 (en) | 2012-07-27 | 2014-06-10 | Sandisk Technologies Inc. | Experience count dependent program algorithm for flash memory |
| US8755228B2 (en) * | 2012-08-09 | 2014-06-17 | Kabushiki Kaisha Toshiba | Writing method of nonvolatile semiconductor memory device |
| US8780635B2 (en) * | 2012-11-09 | 2014-07-15 | Sandisk Technologies Inc. | Use of bloom filter and improved program algorithm for increased data protection in CAM NAND memory |
| US8773909B2 (en) * | 2012-11-09 | 2014-07-08 | Sandisk Technologies Inc. | CAM NAND with or function and full chip search capability |
| US8780634B2 (en) * | 2012-11-09 | 2014-07-15 | Sandisk Technologies Inc. | CAM NAND with OR function and full chip search capability |
| US8780633B2 (en) * | 2012-11-09 | 2014-07-15 | SanDisk Technologies, Inc. | De-duplication system using NAND flash based content addressable memory |
| US8811085B2 (en) * | 2012-11-09 | 2014-08-19 | Sandisk Technologies Inc. | On-device data analytics using NAND flash based intelligent memory |
| US8780632B2 (en) * | 2012-11-09 | 2014-07-15 | Sandisk Technologies Inc. | De-duplication techniques using NAND flash based content addressable memory |
| US9098403B2 (en) | 2012-11-09 | 2015-08-04 | Sandisk Technologies Inc. | NAND flash based content addressable memory |
| US8817541B2 (en) * | 2012-11-09 | 2014-08-26 | Sandisk Technologies Inc. | Data search using bloom filters and NAND based content addressable memory |
| US8634248B1 (en) * | 2012-11-09 | 2014-01-21 | Sandisk Technologies Inc. | On-device data analytics using NAND flash based intelligent memory |
| US8792279B2 (en) * | 2012-11-09 | 2014-07-29 | Sandisk Technologies Inc. | Architectures for data analytics using computational NAND memory |
| KR20140065244A (ko) * | 2012-11-21 | 2014-05-29 | 서울대학교산학협력단 | 랜덤텔레그래프 노이즈 영향을 억제하기 위한 반도체 소자에서의 읽기 방법 |
| KR102084461B1 (ko) | 2013-03-04 | 2020-04-14 | 삼성전자 주식회사 | 저항체를 이용한 비휘발성 메모리 장치 |
| US9075424B2 (en) | 2013-03-06 | 2015-07-07 | Sandisk Technologies Inc. | Compensation scheme to improve the stability of the operational amplifiers |
| US9380234B1 (en) * | 2015-05-01 | 2016-06-28 | Omnivision Technologies, Inc. | Reduced random telegraph signal noise CMOS image sensor and associated method |
| US9704588B1 (en) | 2016-03-14 | 2017-07-11 | Sandisk Technologies Llc | Apparatus and method for preconditioning currents to reduce errors in sensing for non-volatile memory |
| US9779832B1 (en) | 2016-12-07 | 2017-10-03 | Sandisk Technologies Llc | Pulsed control line biasing in memory |
| US10304550B1 (en) | 2017-11-29 | 2019-05-28 | Sandisk Technologies Llc | Sense amplifier with negative threshold sensing for non-volatile memory |
| US10643695B1 (en) | 2019-01-10 | 2020-05-05 | Sandisk Technologies Llc | Concurrent multi-state program verify for non-volatile memory |
| US10902920B2 (en) * | 2019-04-18 | 2021-01-26 | Micron Technology, Inc. | Driving conductors to target voltage levels |
| CN110610022B (zh) * | 2019-08-06 | 2021-11-19 | 华中科技大学 | 一种基于铁磁材料的电子模拟积分器 |
| US11024392B1 (en) | 2019-12-23 | 2021-06-01 | Sandisk Technologies Llc | Sense amplifier for bidirectional sensing of memory cells of a non-volatile memory |
| CN116720467B (zh) * | 2023-05-26 | 2026-07-21 | 上海交通大学 | 一种小尺寸半导体器件闪烁噪声的建模方法 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2828855C2 (de) * | 1978-06-30 | 1982-11-18 | Siemens AG, 1000 Berlin und 8000 München | Wortweise elektrisch umprogrammierbarer, nichtflüchtiger Speicher sowie Verfahren zum Löschen bzw. Einschreiben eines bzw. in einen solchen Speicher(s) |
| JPS5955071A (ja) | 1982-09-24 | 1984-03-29 | Hitachi Micro Comput Eng Ltd | 不揮発性半導体装置 |
| JP2645122B2 (ja) * | 1989-01-20 | 1997-08-25 | 株式会社東芝 | 不揮発性半導体メモリ |
| EP0935255A2 (de) | 1989-04-13 | 1999-08-11 | SanDisk Corporation | EEprom-System mit Blocklöschung |
| US5172338B1 (en) | 1989-04-13 | 1997-07-08 | Sandisk Corp | Multi-state eeprom read and write circuits and techniques |
| KR920010346B1 (ko) * | 1990-05-23 | 1992-11-27 | 삼성전자 주식회사 | 반도체 메모리의 센스앰프 구동회로 |
| DK0740854T3 (da) | 1991-08-29 | 2003-08-18 | Hyundai Electronics Ind | Automatisk justeret dual-bit split gate (DSG) flash EEPROM celle |
| US5712180A (en) | 1992-01-14 | 1998-01-27 | Sundisk Corporation | EEPROM with split gate source side injection |
| US6222762B1 (en) | 1992-01-14 | 2001-04-24 | Sandisk Corporation | Multi-state memory |
| US5798964A (en) | 1994-08-29 | 1998-08-25 | Toshiba Corporation | FRAM, FRAM card, and card system using the same |
| US5748533A (en) * | 1996-03-26 | 1998-05-05 | Invoice Technology, Inc. | Read circuit which uses a coarse-to-fine search when reading the threshold voltage of a memory cell |
| US5768192A (en) | 1996-07-23 | 1998-06-16 | Saifun Semiconductors, Ltd. | Non-volatile semiconductor memory cell utilizing asymmetrical charge trapping |
| JP3672384B2 (ja) * | 1996-07-24 | 2005-07-20 | 沖電気工業株式会社 | センス回路 |
| US5815438A (en) * | 1997-02-28 | 1998-09-29 | Advanced Micro Devices, Inc. | Optimized biasing scheme for NAND read and hot-carrier write operations |
| US5969986A (en) * | 1998-06-23 | 1999-10-19 | Invox Technology | High-bandwidth read and write architectures for non-volatile memories |
| US6044019A (en) | 1998-10-23 | 2000-03-28 | Sandisk Corporation | Non-volatile memory with improved sensing and method therefor |
| US6103573A (en) | 1999-06-30 | 2000-08-15 | Sandisk Corporation | Processing techniques for making a dual floating gate EEPROM cell array |
| US6275417B1 (en) * | 1999-10-08 | 2001-08-14 | Aplus Flash Technology, Inc. | Multiple level flash memory |
| US7111109B2 (en) * | 2002-03-13 | 2006-09-19 | Canon Kabushiki Kaisha | Control system, recording device and electronic apparatus |
-
2002
- 2002-01-18 US US10/052,924 patent/US6850441B2/en not_active Expired - Lifetime
- 2002-12-16 KR KR1020047011169A patent/KR100953373B1/ko not_active Expired - Fee Related
- 2002-12-16 EP EP02806618A patent/EP1466331B1/de not_active Expired - Lifetime
- 2002-12-16 AT AT02806618T patent/ATE386328T1/de not_active IP Right Cessation
- 2002-12-16 CN CNB028285190A patent/CN100520980C/zh not_active Expired - Fee Related
- 2002-12-16 AU AU2002357265A patent/AU2002357265A1/en not_active Abandoned
- 2002-12-16 WO PCT/US2002/040204 patent/WO2003063171A2/en not_active Ceased
- 2002-12-16 JP JP2003562940A patent/JP4326339B2/ja not_active Expired - Fee Related
- 2002-12-16 DE DE60225068T patent/DE60225068T2/de not_active Expired - Lifetime
- 2002-12-19 TW TW091136705A patent/TWI264016B/zh not_active IP Right Cessation
-
2004
- 2004-10-28 US US10/976,692 patent/US7092292B2/en not_active Expired - Lifetime
-
2006
- 2006-06-23 US US11/426,082 patent/US7403421B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US7092292B2 (en) | 2006-08-15 |
| WO2003063171A2 (en) | 2003-07-31 |
| CN100520980C (zh) | 2009-07-29 |
| JP2005520270A (ja) | 2005-07-07 |
| TWI264016B (en) | 2006-10-11 |
| DE60225068T2 (de) | 2009-02-19 |
| DE60225068D1 (de) | 2008-03-27 |
| CN1623206A (zh) | 2005-06-01 |
| EP1466331A2 (de) | 2004-10-13 |
| US20050057979A1 (en) | 2005-03-17 |
| US7403421B2 (en) | 2008-07-22 |
| TW200302489A (en) | 2003-08-01 |
| JP4326339B2 (ja) | 2009-09-02 |
| US20030137877A1 (en) | 2003-07-24 |
| EP1466331B1 (de) | 2008-02-13 |
| AU2002357265A1 (en) | 2003-09-02 |
| US6850441B2 (en) | 2005-02-01 |
| KR20040081462A (ko) | 2004-09-21 |
| KR100953373B1 (ko) | 2010-04-20 |
| US20060239079A1 (en) | 2006-10-26 |
| WO2003063171A3 (en) | 2003-12-31 |
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