ATE386328T1 - Rauschreduktionstechnik für transistoren und kleine anordnungen benutzend episodische agitation - Google Patents

Rauschreduktionstechnik für transistoren und kleine anordnungen benutzend episodische agitation

Info

Publication number
ATE386328T1
ATE386328T1 AT02806618T AT02806618T ATE386328T1 AT E386328 T1 ATE386328 T1 AT E386328T1 AT 02806618 T AT02806618 T AT 02806618T AT 02806618 T AT02806618 T AT 02806618T AT E386328 T1 ATE386328 T1 AT E386328T1
Authority
AT
Austria
Prior art keywords
cell
present
integration time
noise reduction
transistors
Prior art date
Application number
AT02806618T
Other languages
English (en)
Inventor
Nima Mokhlesi
Daniel Guterman
Geoffrey Gongwer
Original Assignee
Sandisk Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sandisk Corp filed Critical Sandisk Corp
Application granted granted Critical
Publication of ATE386328T1 publication Critical patent/ATE386328T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/26—Sensing or reading circuits; Data output circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5642—Sensing or reading circuits; Data output circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/22—Safety or protection circuits preventing unauthorised or accidental access to memory cells
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
    • G11C16/0441—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing multiple floating gate devices, e.g. separate read-and-write FAMOS transistors with connected floating gates
    • G11C16/0458—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing multiple floating gate devices, e.g. separate read-and-write FAMOS transistors with connected floating gates comprising two or more independent floating gates which store independent data

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computer Security & Cryptography (AREA)
  • Non-Volatile Memory (AREA)
  • Semiconductor Memories (AREA)
  • Read Only Memory (AREA)
  • Amplifiers (AREA)
  • Bipolar Transistors (AREA)
AT02806618T 2002-01-18 2002-12-16 Rauschreduktionstechnik für transistoren und kleine anordnungen benutzend episodische agitation ATE386328T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/052,924 US6850441B2 (en) 2002-01-18 2002-01-18 Noise reduction technique for transistors and small devices utilizing an episodic agitation

Publications (1)

Publication Number Publication Date
ATE386328T1 true ATE386328T1 (de) 2008-03-15

Family

ID=21980791

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02806618T ATE386328T1 (de) 2002-01-18 2002-12-16 Rauschreduktionstechnik für transistoren und kleine anordnungen benutzend episodische agitation

Country Status (10)

Country Link
US (3) US6850441B2 (de)
EP (1) EP1466331B1 (de)
JP (1) JP4326339B2 (de)
KR (1) KR100953373B1 (de)
CN (1) CN100520980C (de)
AT (1) ATE386328T1 (de)
AU (1) AU2002357265A1 (de)
DE (1) DE60225068T2 (de)
TW (1) TWI264016B (de)
WO (1) WO2003063171A2 (de)

Families Citing this family (87)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6805441B1 (en) * 2003-08-11 2004-10-19 Jorg Schuster Rimless eyewear
US7046555B2 (en) 2003-09-17 2006-05-16 Sandisk Corporation Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance
US7154779B2 (en) * 2004-01-21 2006-12-26 Sandisk Corporation Non-volatile memory cell using high-k material inter-gate programming
DE102004029520B4 (de) * 2004-06-18 2008-12-24 Infineon Technologies Ag Transistor-Anordnung mit Rauscherfassung
KR100602320B1 (ko) * 2005-05-03 2006-07-18 주식회사 하이닉스반도체 프로그램 속도가 균일한 비휘발성 메모리 소자
US20070059945A1 (en) * 2005-09-12 2007-03-15 Nima Mohklesi Atomic layer deposition with nitridation and oxidation
KR100673020B1 (ko) * 2005-12-20 2007-01-24 삼성전자주식회사 전계효과 소오스/드레인 영역을 가지는 반도체 장치
US7412668B1 (en) * 2006-01-30 2008-08-12 Xilinx, Inc. Integrated system noise management—decoupling capacitance
US7428717B1 (en) 2006-01-30 2008-09-23 Xilinx, Inc. Integrated system noise management—system level
US7412673B1 (en) 2006-01-30 2008-08-12 Xilinx, Inc. Integrated system noise management—bounce voltage
US7509608B1 (en) 2006-01-30 2009-03-24 Xilinx, Inc. Integrated system noise management—clock jitter
US7499319B2 (en) * 2006-03-03 2009-03-03 Sandisk Corporation Read operation for non-volatile storage with compensation for coupling
US7551486B2 (en) 2006-05-15 2009-06-23 Apple Inc. Iterative memory cell charging based on reference cell value
US7852690B2 (en) * 2006-05-15 2010-12-14 Apple Inc. Multi-chip package for a flash memory
US7911834B2 (en) * 2006-05-15 2011-03-22 Apple Inc. Analog interface for a flash memory die
US7639542B2 (en) * 2006-05-15 2009-12-29 Apple Inc. Maintenance operations for multi-level data storage cells
US7613043B2 (en) * 2006-05-15 2009-11-03 Apple Inc. Shifting reference values to account for voltage sag
US7511646B2 (en) * 2006-05-15 2009-03-31 Apple Inc. Use of 8-bit or higher A/D for NAND cell value
US8000134B2 (en) 2006-05-15 2011-08-16 Apple Inc. Off-die charge pump that supplies multiple flash devices
US7568135B2 (en) 2006-05-15 2009-07-28 Apple Inc. Use of alternative value in cell detection
US7701797B2 (en) * 2006-05-15 2010-04-20 Apple Inc. Two levels of voltage regulation supplied for logic and data programming voltage of a memory device
US7639531B2 (en) * 2006-05-15 2009-12-29 Apple Inc. Dynamic cell bit resolution
US7778072B2 (en) * 2006-07-27 2010-08-17 Macronix International Co., Ltd. Method for fabricating charge-trapping memory
US7688366B2 (en) * 2006-09-07 2010-03-30 Aptina Imaging Corporation Method and apparatus for suppressing noise in image sensor devices
US7646054B2 (en) 2006-09-19 2010-01-12 Sandisk Corporation Array of non-volatile memory cells with floating gates formed of spacers in substrate trenches
US7696044B2 (en) 2006-09-19 2010-04-13 Sandisk Corporation Method of making an array of non-volatile memory cells with floating gates formed of spacers in substrate trenches
US7800161B2 (en) * 2006-12-21 2010-09-21 Sandisk Corporation Flash NAND memory cell array with charge storage elements positioned in trenches
US7642160B2 (en) * 2006-12-21 2010-01-05 Sandisk Corporation Method of forming a flash NAND memory cell array with charge storage elements positioned in trenches
US7929349B2 (en) * 2007-02-28 2011-04-19 Samsung Electronics Co., Ltd. Method of operating nonvolatile memory device
JP2008217971A (ja) * 2007-02-28 2008-09-18 Samsung Electronics Co Ltd 不揮発性メモリ素子の作動方法
US7904793B2 (en) * 2007-03-29 2011-03-08 Sandisk Corporation Method for decoding data in non-volatile storage using reliability metrics based on multiple reads
US7797480B2 (en) * 2007-03-29 2010-09-14 Sandisk Corporation Method for reading non-volatile storage using pre-conditioning waveforms and modified reliability metrics
US7966546B2 (en) * 2007-03-31 2011-06-21 Sandisk Technologies Inc. Non-volatile memory with soft bit data transmission for error correction control
US7975209B2 (en) * 2007-03-31 2011-07-05 Sandisk Technologies Inc. Non-volatile memory with guided simulated annealing error correction control
US7971127B2 (en) * 2007-03-31 2011-06-28 Sandisk Technologies Inc. Guided simulated annealing in non-volatile memory error correction control
US7966550B2 (en) 2007-03-31 2011-06-21 Sandisk Technologies Inc. Soft bit data transmission for error correction control in non-volatile memory
US7830729B2 (en) * 2007-06-15 2010-11-09 Micron Technology, Inc. Digital filters with memory
US7733262B2 (en) 2007-06-15 2010-06-08 Micron Technology, Inc. Quantizing circuits with variable reference signals
US7839703B2 (en) 2007-06-15 2010-11-23 Micron Technology, Inc. Subtraction circuits and digital-to-analog converters for semiconductor devices
US7667632B2 (en) * 2007-06-15 2010-02-23 Micron Technology, Inc. Quantizing circuits for semiconductor devices
US7818638B2 (en) * 2007-06-15 2010-10-19 Micron Technology, Inc. Systems and devices including memory with built-in self test and methods of making and using the same
US7969783B2 (en) * 2007-06-15 2011-06-28 Micron Technology, Inc. Memory with correlated resistance
US7538702B2 (en) * 2007-06-15 2009-05-26 Micron Technology, Inc. Quantizing circuits with variable parameters
US8068367B2 (en) * 2007-06-15 2011-11-29 Micron Technology, Inc. Reference current sources
US8117520B2 (en) * 2007-06-15 2012-02-14 Micron Technology, Inc. Error detection for multi-bit memory
US7768868B2 (en) * 2007-06-15 2010-08-03 Micron Technology, Inc. Digital filters for semiconductor devices
US7817073B2 (en) * 2007-06-15 2010-10-19 Micron Technology, Inc. Integrators for delta-sigma modulators
US9135962B2 (en) 2007-06-15 2015-09-15 Micron Technology, Inc. Comparators for delta-sigma modulators
KR101287447B1 (ko) * 2007-08-28 2013-07-19 삼성전자주식회사 이이피롬 셀, 이이피롬 셀 제조 방법 및 이이피롬 셀에서의데이터 읽기 방법
US8085596B2 (en) * 2007-09-11 2011-12-27 Micron Technology, Inc. Reducing noise in semiconductor devices
US7952927B2 (en) * 2007-12-05 2011-05-31 Micron Technology, Inc. Adjusting program and erase voltages in a memory device
US7864609B2 (en) * 2008-06-30 2011-01-04 Micron Technology, Inc. Methods for determining resistance of phase change memory elements
JP5281455B2 (ja) 2009-03-26 2013-09-04 株式会社東芝 不揮発性半導体記憶装置及びその駆動方法
KR101586046B1 (ko) * 2009-05-26 2016-01-18 삼성전자주식회사 저장 장치 및 그것의 읽기 방법
JP5232729B2 (ja) * 2009-06-30 2013-07-10 株式会社アドバンテスト 出力装置および試験装置
US8416624B2 (en) 2010-05-21 2013-04-09 SanDisk Technologies, Inc. Erase and programming techniques to reduce the widening of state distributions in non-volatile memories
KR20120011642A (ko) 2010-07-29 2012-02-08 삼성전자주식회사 기준 셀을 포함하는 불휘발성 메모리 장치 및 그것의 기준 전류 설정 방법
US8432740B2 (en) 2011-07-21 2013-04-30 Sandisk Technologies Inc. Program algorithm with staircase waveform decomposed into multiple passes
KR101874408B1 (ko) 2011-11-09 2018-07-05 삼성전자주식회사 비휘발성 메모리 장치 및 이를 포함하는 메모리 시스템
CN103177761A (zh) * 2011-12-23 2013-06-26 北京大学 阻变存储设备及其操作方法
US9190162B2 (en) * 2012-03-13 2015-11-17 Micron Technology, Inc. Nonconsecutive sensing of multilevel memory cells
US8804430B2 (en) * 2012-03-26 2014-08-12 Sandisk Technologies Inc. Selected word line dependent select gate diffusion region voltage during programming
US8638608B2 (en) 2012-03-26 2014-01-28 Sandisk Technologies Inc. Selected word line dependent select gate voltage during program
US8750045B2 (en) 2012-07-27 2014-06-10 Sandisk Technologies Inc. Experience count dependent program algorithm for flash memory
US8755228B2 (en) * 2012-08-09 2014-06-17 Kabushiki Kaisha Toshiba Writing method of nonvolatile semiconductor memory device
US8780635B2 (en) * 2012-11-09 2014-07-15 Sandisk Technologies Inc. Use of bloom filter and improved program algorithm for increased data protection in CAM NAND memory
US8773909B2 (en) * 2012-11-09 2014-07-08 Sandisk Technologies Inc. CAM NAND with or function and full chip search capability
US8780634B2 (en) * 2012-11-09 2014-07-15 Sandisk Technologies Inc. CAM NAND with OR function and full chip search capability
US8780633B2 (en) * 2012-11-09 2014-07-15 SanDisk Technologies, Inc. De-duplication system using NAND flash based content addressable memory
US8811085B2 (en) * 2012-11-09 2014-08-19 Sandisk Technologies Inc. On-device data analytics using NAND flash based intelligent memory
US8780632B2 (en) * 2012-11-09 2014-07-15 Sandisk Technologies Inc. De-duplication techniques using NAND flash based content addressable memory
US9098403B2 (en) 2012-11-09 2015-08-04 Sandisk Technologies Inc. NAND flash based content addressable memory
US8817541B2 (en) * 2012-11-09 2014-08-26 Sandisk Technologies Inc. Data search using bloom filters and NAND based content addressable memory
US8634248B1 (en) * 2012-11-09 2014-01-21 Sandisk Technologies Inc. On-device data analytics using NAND flash based intelligent memory
US8792279B2 (en) * 2012-11-09 2014-07-29 Sandisk Technologies Inc. Architectures for data analytics using computational NAND memory
KR20140065244A (ko) * 2012-11-21 2014-05-29 서울대학교산학협력단 랜덤텔레그래프 노이즈 영향을 억제하기 위한 반도체 소자에서의 읽기 방법
KR102084461B1 (ko) 2013-03-04 2020-04-14 삼성전자 주식회사 저항체를 이용한 비휘발성 메모리 장치
US9075424B2 (en) 2013-03-06 2015-07-07 Sandisk Technologies Inc. Compensation scheme to improve the stability of the operational amplifiers
US9380234B1 (en) * 2015-05-01 2016-06-28 Omnivision Technologies, Inc. Reduced random telegraph signal noise CMOS image sensor and associated method
US9704588B1 (en) 2016-03-14 2017-07-11 Sandisk Technologies Llc Apparatus and method for preconditioning currents to reduce errors in sensing for non-volatile memory
US9779832B1 (en) 2016-12-07 2017-10-03 Sandisk Technologies Llc Pulsed control line biasing in memory
US10304550B1 (en) 2017-11-29 2019-05-28 Sandisk Technologies Llc Sense amplifier with negative threshold sensing for non-volatile memory
US10643695B1 (en) 2019-01-10 2020-05-05 Sandisk Technologies Llc Concurrent multi-state program verify for non-volatile memory
US10902920B2 (en) * 2019-04-18 2021-01-26 Micron Technology, Inc. Driving conductors to target voltage levels
CN110610022B (zh) * 2019-08-06 2021-11-19 华中科技大学 一种基于铁磁材料的电子模拟积分器
US11024392B1 (en) 2019-12-23 2021-06-01 Sandisk Technologies Llc Sense amplifier for bidirectional sensing of memory cells of a non-volatile memory
CN116720467B (zh) * 2023-05-26 2026-07-21 上海交通大学 一种小尺寸半导体器件闪烁噪声的建模方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2828855C2 (de) * 1978-06-30 1982-11-18 Siemens AG, 1000 Berlin und 8000 München Wortweise elektrisch umprogrammierbarer, nichtflüchtiger Speicher sowie Verfahren zum Löschen bzw. Einschreiben eines bzw. in einen solchen Speicher(s)
JPS5955071A (ja) 1982-09-24 1984-03-29 Hitachi Micro Comput Eng Ltd 不揮発性半導体装置
JP2645122B2 (ja) * 1989-01-20 1997-08-25 株式会社東芝 不揮発性半導体メモリ
EP0935255A2 (de) 1989-04-13 1999-08-11 SanDisk Corporation EEprom-System mit Blocklöschung
US5172338B1 (en) 1989-04-13 1997-07-08 Sandisk Corp Multi-state eeprom read and write circuits and techniques
KR920010346B1 (ko) * 1990-05-23 1992-11-27 삼성전자 주식회사 반도체 메모리의 센스앰프 구동회로
DK0740854T3 (da) 1991-08-29 2003-08-18 Hyundai Electronics Ind Automatisk justeret dual-bit split gate (DSG) flash EEPROM celle
US5712180A (en) 1992-01-14 1998-01-27 Sundisk Corporation EEPROM with split gate source side injection
US6222762B1 (en) 1992-01-14 2001-04-24 Sandisk Corporation Multi-state memory
US5798964A (en) 1994-08-29 1998-08-25 Toshiba Corporation FRAM, FRAM card, and card system using the same
US5748533A (en) * 1996-03-26 1998-05-05 Invoice Technology, Inc. Read circuit which uses a coarse-to-fine search when reading the threshold voltage of a memory cell
US5768192A (en) 1996-07-23 1998-06-16 Saifun Semiconductors, Ltd. Non-volatile semiconductor memory cell utilizing asymmetrical charge trapping
JP3672384B2 (ja) * 1996-07-24 2005-07-20 沖電気工業株式会社 センス回路
US5815438A (en) * 1997-02-28 1998-09-29 Advanced Micro Devices, Inc. Optimized biasing scheme for NAND read and hot-carrier write operations
US5969986A (en) * 1998-06-23 1999-10-19 Invox Technology High-bandwidth read and write architectures for non-volatile memories
US6044019A (en) 1998-10-23 2000-03-28 Sandisk Corporation Non-volatile memory with improved sensing and method therefor
US6103573A (en) 1999-06-30 2000-08-15 Sandisk Corporation Processing techniques for making a dual floating gate EEPROM cell array
US6275417B1 (en) * 1999-10-08 2001-08-14 Aplus Flash Technology, Inc. Multiple level flash memory
US7111109B2 (en) * 2002-03-13 2006-09-19 Canon Kabushiki Kaisha Control system, recording device and electronic apparatus

Also Published As

Publication number Publication date
US7092292B2 (en) 2006-08-15
WO2003063171A2 (en) 2003-07-31
CN100520980C (zh) 2009-07-29
JP2005520270A (ja) 2005-07-07
TWI264016B (en) 2006-10-11
DE60225068T2 (de) 2009-02-19
DE60225068D1 (de) 2008-03-27
CN1623206A (zh) 2005-06-01
EP1466331A2 (de) 2004-10-13
US20050057979A1 (en) 2005-03-17
US7403421B2 (en) 2008-07-22
TW200302489A (en) 2003-08-01
JP4326339B2 (ja) 2009-09-02
US20030137877A1 (en) 2003-07-24
EP1466331B1 (de) 2008-02-13
AU2002357265A1 (en) 2003-09-02
US6850441B2 (en) 2005-02-01
KR20040081462A (ko) 2004-09-21
KR100953373B1 (ko) 2010-04-20
US20060239079A1 (en) 2006-10-26
WO2003063171A3 (en) 2003-12-31

Similar Documents

Publication Publication Date Title
DE60225068D1 (de) Rauschreduktionstechnik für transistoren und kleine anordnungen benutzend episodische agitation
US8953359B2 (en) Semiconductor memory device
US20070237016A1 (en) Memory
US8922236B2 (en) Semiconductor memory device and method for inspecting the same
KR900015159A (ko) 개량된 워드선 제어를 가지는 다이나믹 랜덤 억세스 메모리
JPS6177199A (ja) 半導体記憶装置
KR20100090456A (ko) 워드라인 구동회로 및 그의 구동방법
KR20100013960A (ko) 플래시 소자의 소거 동작 방법
JP2004319065A5 (de)
KR950025777A (ko) 반도체메모리장치
KR970076859A (ko) 불휘발성 반도체 기억 장치 및 그 기입 방법
KR910020731A (ko) 반도체장치 및 그 번인방법
KR100622358B1 (ko) 플래시 메모리 및 그 시험 방법
TW451467B (en) Semiconductor device
WO2018212056A1 (ja) 半導体回路、駆動方法、および電子機器
DE60212103D1 (de) Strukturierter speicherzellentest
TW374931B (en) Semiconductor memory device
KR100202671B1 (ko) 반도체 소자의 번인 검사장치
CN101689550B (zh) 浮体存储器阵列
JP4093827B2 (ja) タイミング調整回路
US9406384B2 (en) Matching semiconductor circuits
KR19990080811A (ko) 플래쉬 이이피롬의 소거회로
KR970008190A (ko) 반도체장치의 모드 설정회로
KR100850276B1 (ko) 반도체 장치에 적합한 내부전원전압 발생회로
TWI559327B (zh) 反及(nand)邏輯字線選擇技術

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties