ATE376191T1 - Prüfung eines testobjekts mit abtastung vom taktsignal und vom datensignal - Google Patents

Prüfung eines testobjekts mit abtastung vom taktsignal und vom datensignal

Info

Publication number
ATE376191T1
ATE376191T1 AT05103301T AT05103301T ATE376191T1 AT E376191 T1 ATE376191 T1 AT E376191T1 AT 05103301 T AT05103301 T AT 05103301T AT 05103301 T AT05103301 T AT 05103301T AT E376191 T1 ATE376191 T1 AT E376191T1
Authority
AT
Austria
Prior art keywords
clock signal
signal
data signal
data
clock
Prior art date
Application number
AT05103301T
Other languages
English (en)
Inventor
Bernd Laquai
Joerg-Walter Mohr
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Application granted granted Critical
Publication of ATE376191T1 publication Critical patent/ATE376191T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
AT05103301T 2005-04-22 2005-04-22 Prüfung eines testobjekts mit abtastung vom taktsignal und vom datensignal ATE376191T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP05103301A EP1715355B1 (de) 2005-04-22 2005-04-22 Prüfung eines Testobjekts mit Abtastung vom Taktsignal und vom Datensignal

Publications (1)

Publication Number Publication Date
ATE376191T1 true ATE376191T1 (de) 2007-11-15

Family

ID=34939467

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05103301T ATE376191T1 (de) 2005-04-22 2005-04-22 Prüfung eines testobjekts mit abtastung vom taktsignal und vom datensignal

Country Status (5)

Country Link
US (1) US7260493B2 (de)
EP (1) EP1715355B1 (de)
JP (1) JP4594896B2 (de)
AT (1) ATE376191T1 (de)
DE (1) DE602005002931T2 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7379837B1 (en) * 2006-07-21 2008-05-27 Qlogic, Corporation Method and system for testing integrated circuits
US8176351B2 (en) * 2006-08-21 2012-05-08 National Instruments Corporation Sampling mechanism for data acquisition counters
US7707000B2 (en) * 2007-04-19 2010-04-27 Agilent Technologies, Inc. Test instrument and system responsive to execution time data
US7797121B2 (en) * 2007-06-07 2010-09-14 Advantest Corporation Test apparatus, and device for calibration
US7834615B2 (en) * 2007-07-02 2010-11-16 Texas Instruments Incorporated Bist DDR memory interface circuit and method for self-testing the same using phase relationship between a data signal and a data strobe signal
US8094766B2 (en) * 2008-07-02 2012-01-10 Teradyne, Inc. Tracker circuit and method for automated test equipment systems
US8191033B1 (en) * 2008-11-20 2012-05-29 Marvell International Ltd. In situ clock jitter measurement
US8645589B2 (en) 2009-08-03 2014-02-04 National Instruments Corporation Methods for data acquisition systems in real time applications
US8647369B2 (en) 2010-05-19 2014-02-11 Josef E. Gorek Minimal profile anterior bracket for spinal fixation
EP3379764B1 (de) 2017-03-22 2019-07-17 Kabushiki Kaisha Toshiba Halbleiterbauelement
CN111124978B (zh) 2019-10-30 2021-07-06 苏州浪潮智能科技有限公司 一种并行总线相位校正的方法及装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3731210A (en) * 1972-05-04 1973-05-01 Itt Corp Nutley Reduction of timing resolution in digital phase lock loops
US4876655A (en) * 1985-12-02 1989-10-24 Tektronix, Inc. Method and apparatus for evaluating jitter
JPH01164118A (ja) * 1987-12-21 1989-06-28 Nec Corp 時間差測定回路
US5835506A (en) * 1997-04-29 1998-11-10 Credence Systems Corporation Single pass doublet mode integrated circuit tester
JP2000098007A (ja) * 1998-09-18 2000-04-07 Advantest Corp 半導体試験装置
JP2000314767A (ja) * 1999-04-30 2000-11-14 Asahi Kasei Microsystems Kk クロックジッタの測定方法
JP4495308B2 (ja) * 2000-06-14 2010-07-07 株式会社アドバンテスト 半導体デバイス試験方法・半導体デバイス試験装置
JP4782271B2 (ja) * 2000-07-06 2011-09-28 株式会社アドバンテスト 半導体デバイス試験方法・半導体デバイス試験装置
JP2002042498A (ja) * 2000-07-24 2002-02-08 Mitsubishi Electric Corp 半導体記憶装置、補助装置および試験装置
JP2002196053A (ja) * 2000-12-25 2002-07-10 Ando Electric Co Ltd Ｉｃ測定装置
JP2003059298A (ja) * 2001-08-09 2003-02-28 Mitsubishi Electric Corp 半導体記憶装置
JP4152323B2 (ja) * 2002-01-10 2008-09-17 株式会社アドバンテスト 被測定ｌｓｉの試験装置
KR100988486B1 (ko) * 2002-03-08 2010-10-20 주식회사 아도반테스토 반도체 시험 장치 및 그 타이밍 측정 방법
JP4002811B2 (ja) * 2002-10-04 2007-11-07 株式会社アドバンテスト マルチストローブ生成装置、試験装置、及び調整方法

Also Published As

Publication number Publication date
EP1715355B1 (de) 2007-10-17
DE602005002931D1 (de) 2007-11-29
EP1715355A1 (de) 2006-10-25
US20060247881A1 (en) 2006-11-02
DE602005002931T2 (de) 2008-06-12
JP4594896B2 (ja) 2010-12-08
JP2006300954A (ja) 2006-11-02
US7260493B2 (en) 2007-08-21

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