TW200617411A - IC tester - Google Patents

IC tester

Info

Publication number
TW200617411A
TW200617411A TW094116152A TW94116152A TW200617411A TW 200617411 A TW200617411 A TW 200617411A TW 094116152 A TW094116152 A TW 094116152A TW 94116152 A TW94116152 A TW 94116152A TW 200617411 A TW200617411 A TW 200617411A
Authority
TW
Taiwan
Prior art keywords
tester
test head
speed
testing
outputs
Prior art date
Application number
TW094116152A
Other languages
Chinese (zh)
Inventor
Akira Shimizu
Hisaki Arasawa
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Publication of TW200617411A publication Critical patent/TW200617411A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318552—Clock circuits details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing

Abstract

The present invention provides an IC tester capable of conducting high-speed testing even by use of a low-speed test head. The invention improves an IC tester for testing an object with a test head. The tester is characterized by having a parallel/serial converter, which inputs multiple outputs from the test head and outputs serial signals to the tested object.
TW094116152A 2004-06-18 2005-05-18 IC tester TW200617411A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004180739 2004-06-18
JP2005127552A JP2006030166A (en) 2004-06-18 2005-04-26 Ic tester

Publications (1)

Publication Number Publication Date
TW200617411A true TW200617411A (en) 2006-06-01

Family

ID=35896683

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094116152A TW200617411A (en) 2004-06-18 2005-05-18 IC tester

Country Status (3)

Country Link
JP (1) JP2006030166A (en)
KR (1) KR20060048345A (en)
TW (1) TW200617411A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10613128B2 (en) 2015-10-22 2020-04-07 Powertech Technology Inc. Testing device and testing method

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100825790B1 (en) 2006-11-07 2008-04-29 삼성전자주식회사 Test system employing data compression circuit and test method using the same
KR100825811B1 (en) 2007-02-27 2008-04-29 삼성전자주식회사 Automatic test equipment capable of high speed test
KR101638184B1 (en) 2009-11-13 2016-07-21 삼성전자주식회사 BOT apparatus and test system including the same
KR102087603B1 (en) 2013-10-07 2020-03-11 삼성전자주식회사 Memory test device and operating method of the same
CN111225165B (en) * 2020-01-16 2022-02-22 锐芯微电子股份有限公司 Signal output method and device of pixel column readout circuit and readable storage medium
CN115267498A (en) * 2022-07-28 2022-11-01 普源精电科技股份有限公司 Chip test circuit, chip and test equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10613128B2 (en) 2015-10-22 2020-04-07 Powertech Technology Inc. Testing device and testing method

Also Published As

Publication number Publication date
JP2006030166A (en) 2006-02-02
KR20060048345A (en) 2006-05-18

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