WO2018120298A1 - 画素结构及工作方法、阵列基板 - Google Patents

画素结构及工作方法、阵列基板 Download PDF

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Publication number
WO2018120298A1
WO2018120298A1 PCT/CN2017/071005 CN2017071005W WO2018120298A1 WO 2018120298 A1 WO2018120298 A1 WO 2018120298A1 CN 2017071005 W CN2017071005 W CN 2017071005W WO 2018120298 A1 WO2018120298 A1 WO 2018120298A1
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Prior art keywords
common electrode
potential
gate
electrode line
pixel
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PCT/CN2017/071005
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English (en)
French (fr)
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陈帅
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深圳市华星光电技术有限公司
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Application filed by 深圳市华星光电技术有限公司 filed Critical 深圳市华星光电技术有限公司
Priority to US15/328,620 priority Critical patent/US10186224B2/en
Priority to JP2019531635A priority patent/JP2020501197A/ja
Priority to KR1020197021457A priority patent/KR20190095450A/ko
Priority to EP17889423.4A priority patent/EP3564740A4/en
Publication of WO2018120298A1 publication Critical patent/WO2018120298A1/zh

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    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1343Electrodes
    • G02F1/134309Electrodes characterised by their geometrical arrangement
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    • G09G3/34Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
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    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
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    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611Control of matrices with row and column drivers
    • G09G3/3674Details of drivers for scan electrodes
    • G09G3/3677Details of drivers for scan electrodes suitable for active matrices only
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/1214Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
    • H01L27/124Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
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    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
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    • HELECTRICITY
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    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/1214Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
    • H01L27/1255Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs integrated with passive devices, e.g. auxiliary capacitors

Definitions

  • the present invention relates to the field of TFT display devices, and in particular to a pixel structure and a working method for improving the common electrode voltage stability of a liquid crystal panel, and an array substrate.
  • Crosstalk is a common phenomenon in TFT-LCD display failure, which means that the image of one area affects the picture of other areas.
  • the TFT-LCD can be classified into vertical crosstalk and horizontal crosstalk depending on the position of the crosstalk. Taking the VA display mode as an example, the crosstalk picture is judged, and if there is a bad phenomenon, the horizontal direction is horizontal crosstalk.
  • the causes of different types of crosstalk are different.
  • the driving voltage of one data line is always 128 gray level potential, and the driving voltage of the other one is 2/3 time is 128 gray level potential, 1
  • the time of /3 is 255 gray level potential, and the potentials of the two data lines are periodically reversed, resulting in a corresponding change in the potential of the common electrode line.
  • the result of the change of the common electrode line potential is that the overall picture is dark, and 255 gray
  • the lateral region of the step potential will appear darker horizontal blocks due to the larger variation of the common electrode line potential.
  • the horizontal crosstalk solution uses a column inversion or a dot inversion (Dot Inversion) driver, but this solution is susceptible to process changes, making the left and right data lines The capacitive coupling effect on the common electrode lines is different, so that horizontal crosstalk cannot be completely eliminated.
  • Dot Inversion dot Inversion
  • the capacitance C DC structure between the data line and the common electrode line has a first metal layer (Metal1), an N+ layer, an AS layer (alkyl silane film), a SiNx layer (insulating layer), and a second metal.
  • Layer (Metal2) the existence of the AS layer and the N+ layer between Metal1 and Metal2, resulting in a difference in the size of the C DC driven by the positive frame and the negative frame, respectively represented as C DC + and C DC -, such a change
  • C DC + and C DC - such a change
  • the technical problem to be solved by the present invention is the technical problem that the common electrode line ACOM driving capability is insufficient in the prior art, and the present invention provides a method of short-circuiting the common electrode line ACOM and the gate signal line in a certain manner to improve the public.
  • the present invention provides a pixel structure, the pixel structure including a data line, a gate, a pixel electrode, and a common electrode line that drives the gate; a capacitance between the common electrode line and the pixel electrode is a storage capacitor; The common electrode line is electrically connected to the gate.
  • the common electrode line is disposed and connected to the gate in the same layer.
  • the common electrode line is shorted to the gate by the lap metal line.
  • the common electrode line potential is equal to the gate potential;
  • the present invention also provides an array substrate comprising the pixel structure, the common electrode line in each of the pixel structures being electrically connected to a corresponding one of the gate lines.
  • the common electrode line in each of the pixel structures is electrically connected to a corresponding one of the gate lines.
  • the present invention also provides a method for operating a pixel structure, the pixel structure comprising a data line, a gate, a pixel electrode, and a common electrode line driving the gate; a capacitance between the common electrode line and the pixel electrode is a storage capacitor; the common electrode line is electrically connected to the gate; the method includes:
  • the potential of the n+2th gate line signal is turned on, it is a high potential, and the n+2th storage capacitor is The pixel electrode is normally charged, and the potential of the common electrode line of the n+2th storage capacitor is maintained at a low potential;
  • the potential of the common electrode line of the nth stage storage capacitor is low.
  • the common electrode line ACOM and the scan driving gate (Gate line) are short-circuited together in a certain manner to improve the driving capability of the common electrode line ACOM, and before each scanning driving gate Gate is opened, the public The electrode line ACOM) can maintain a stable potential Vlow.
  • the advantage of using the scan driving gate Gate line to drive the common electrode line ACOM is that the potential of the scan driving gate Gate line is independently controlled by the IC, the driving capability thereof is stronger than the general design, and the control of the common electrode line can be reduced.
  • the WOA trace non-COM signal wire on array (WOA)) provides a wider space for other design structures of the liquid crystal panel.
  • the first effect is to improve the driving ability of the common electrode line
  • Figure 1 is a schematic view of the structure of the present invention
  • FIG. 2 is an equivalent circuit diagram of the present invention
  • FIG. 3 is a schematic diagram of waveforms of a common electrode line ACOM and an nth gate line signal according to the present invention
  • Figure 4 is a flow chart of the working method of the present invention.
  • the present invention provides a pixel structure for improving the common electrode voltage regulation of a liquid crystal panel, including a data line 3 (DATA), a gate 1 (Gate), a pixel electrode 4 (Pixel), and a driving station.
  • a common electrode line 2 (ACOM) of the gate a capacitance between the common electrode line 2 (ACOM) and the pixel electrode 4 (Pixel) is a storage capacitor Cst; the common electrode line 2 (ACOM) and the gate 1 Shorted, the common electrode line 2 and the lower gate 1 are disconnected.
  • the potential of the gate 1 is independently controlled by the IC integrated circuit.
  • the common electrode line 2 (ACOM) and the gate 1 have the same potential.
  • the pixel structure for improving the common electrode voltage stabilizing of a liquid crystal panel is used for a TFT-LCD display device, wherein the array substrate includes the pixel structure, the common electrode line 2 in each of the pixel structures, and A corresponding one of the gates 1 is electrically connected.
  • the embodiment further provides a working method for improving the pixel structure of the common electrode of the liquid crystal panel. As shown in FIG. 4, the method includes:
  • the potential of the common electrode line (ACOM) of the nth stage storage capacitor Cstn is a low potential Vlow.
  • the gate signal potential Gate n+1 of the n+1th stage is turned on.
  • the common electrode line can also overlap the metal of other layers.
  • the line connects the gate lines with vias.
  • a conductive layer is disposed in the insulating layer to connect the common electrode line to the gate.

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mathematical Physics (AREA)
  • Optics & Photonics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Geometry (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Liquid Crystal (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

一种画素结构,包括数据线(3)、栅极(1)、像素电极(4)以及驱动栅极(1)的公共电极线(2);公共电极线(2)与像素电极(4)之间的电容为存储电容;公共电极线(2)与栅极(1)短接。一种用于画素结构的工作方法及阵列基板。与现有技术相比提高了公共电极线的驱动能力;减少公共电极线ACOM的WOA走线;节省液晶面板的设计空间。

Description

画素结构及工作方法、阵列基板 技术领域
本发明涉及TFT显示装置领域,特别涉及一种用于改善液晶面板共电极稳压性的画素结构及工作方法、阵列基板。
背景技术
串扰是TFT-LCD显示不良中比较常见的一种现象,是指某一区域的画面会影响到其他区域的画面。TFT-LCD根据串扰的位置不同可以分为垂直串扰及水平串扰。以VA显示模式为例,判断串扰的画面,若出现不良现象为水平向则为水平串扰。导致不同类型串扰的原因有所不同,在这里,我们只探讨水平串扰的不良现象,通常情况下,驱动方式的不同将会导致不同宏观表现的水平串扰,例如帧反转可能会出现线状水平串扰,而列反转和点反转的水平串扰现象就会很轻微。但是,无论哪种驱动方式,产生这种画面不良的真因都是一致的,源于数据线路和共电极的电容耦合作用。当数据线路电位发生变化时,便会经由数据线路与公共电极线(ACOM)之间的寄生电容(CDC)在公共电极线形成一个瞬间的电位跳变。若公共电极线(ACOM)的信号延迟较为严重或电压驱动能力不足,则电位无法很快恢复到预设定电位,这个电位跳变会通过储存电容Cst的耦合作用拉低像素跨压,导致像素亮度降低从而形成水平串扰。以VA显示模式、Row Inversion(行反转)的驱动方式为例,其中一条数据线的驱动电压始终为128灰阶电位,另一条的驱动电压有2/3的时间为128灰阶电位、1/3的时间为255灰阶电位,两条数据线的电位周期性反转,导致公共电极线的电位也发生相应的变化,公共电极线电位变化导致的结果是画面整体偏暗,而255灰阶电位的横向区域则会由于公共电极线电位变化更大而出现颜色更暗的水平区块。通常情况下,水平串扰的解决方案是采用列反转(Column Inversion)或者行反转(Dot Inversion)的驱动方式,但是这种解决方案容易受到制程变化带来的影响,使得左右两条数据线对公共电极线的电容耦合作用不同,使得水平串扰不能被完全消除。
在4MASK制程下,数据线和公共电极线之间的电容CDC结构依次有第一金属层(Metal1),N+层,AS层(烷基硅烷薄膜),SiNx层(绝缘层)及第二金属层(Metal2),Metal1和Metal2之间存在着AS层和N+层,导致了在正帧和负帧驱动下CDC的大小存在差异,分别表示为CDC+和CDC-,这样的变化使得左右两条数据线对公共电极线的电容耦合作用存在较大差异。
现有技术中,龙骨结构是横向贯穿在一起的,并通过两边的金属线提供 DC驱动电压,这种设计易导致公共电极线ACOM驱动能力不足。因此,提供一种公共电极线ACOM驱动能力强的结构及方法就很有必要。
发明内容
本发明所要解决的技术问题是现有技术中存在的公共电极线ACOM驱动能力不足的技术问题,本发明提供一种将公共电极线ACOM与栅极信号线以一定方式短接在一起,提高公共电极线ACOM的驱动能力的画素结构。
为解决上述技术问题,本发明采用的技术方案如下:
本发明提供了一种画素结构,所述画素结构包括数据线、栅极、像素电极以及驱动所述栅极的公共电极线;所述公共电极线与像素电极之间的电容为存储电容;所述公共电极线与栅极电性连接。
进一步地,所述公共电极线与所述栅极同层设置且连接。
进一步地,公共电极线通过搭接金属线与栅极短接。
进一步地,所述公共电极线电位与栅极电位相等;所述栅极中第n级栅极信号与所述第n+1级存储电容的公共电极线电位相等;其中,n=1,2,3,…。
本发明还提供了一种阵列基板,包括所述的画素结构,每一所述画素结构内的所述公共电极线和与其对应的一条栅极线电性连接。
进一步地,每一所述画素结构内的所述公共电极线和与其对应的一条栅极线电性连接。
本发明还提供了一种画素结构的工作方法,所述画素结构包括数据线、栅极、像素电极以及驱动所述栅极的公共电极线;所述公共电极线与像素电极之间的电容为存储电容;所述公共电极线与栅极电性连接;所述方法包括:
(1)第n级栅极信号电位关闭后,保持在低电位,此时第n+1级存储电容的公共电极线的电位为低电位;
(2)第n+1级栅极信号电位开启后,为高电位,第n+1级存储电容的像素电极正常充电,第n+1级存储电容的公共电极线的电位维持为低电位,第n+2级存储电容的公共电极线的电位为高电位;
(3)第n+1级栅极信号电位关闭后,为低电位,第n+2级存储电容的公共电极线的电位为低电位;
(4)第n+2级栅极线信号电位开启后,为高电位,第n+2级存储电容的 像素电极正常充电,第n+2级存储电容的公共电极线的电位维持为低电位;
(5)重复步骤(1)~(4)。
进一步地,所述工作方法中,第n级栅极信号电位开启之前,所述第n级存储电容的公共电极线的电位为低电位。
进一步地,所述第n级栅极信号电位关闭后经过时间t后开启,第n+1级栅极信号电位开启。本发明与现有技术相比公共电极线ACOM与扫描驱动栅极(Gate line)以一定方式短接在一起,提高公共电极线ACOM的驱动能力,在每条扫描驱动栅极Gate开启之前,公共电极线ACOM)都可以维持一个稳定的电位Vlow不变。这种利用扫描驱动栅极Gate line驱动公共电极线ACOM的有益效果在于:扫描驱动栅极Gate line的电位由IC独立进行控制,其驱动能力相比一般设计强,且可以减少单独控制公共电极线的WOA走线(非COM信号阵列外布线(Wire on array,WOA)),为液晶面板的其他设计结构提供更为宽泛的空间。
本发明的有益效果:
效果一,提高了公共电极线的驱动能力;
效果二,减少公共电极线ACOM的WOA走线;
效果三,节省液晶面板的设计空间。
附图说明
图1是本发明的结构示意图;
图2是本发明的等效电路图;
图3是本发明公共电极线ACOM与第n级栅极线信号波形示意图;
图4本发明的工作方法流程图。
具体实施方式
为了使本发明的目的、技术方案及优点更加清楚明白,以下结合实施例,对本发明进行进一步详细说明。应当理解,此处所描述的具体实施例仅仅用以解释本发明,并不用于限定本发明。
如图1和图2所示,本发明提供一种改善液晶面板共电极稳压性的画素结构,包括数据线3(DATA)、栅极1(Gate)、像素电极4(Pixel)以及驱动所 述栅极的公共电极线2(ACOM);所述公共电极线2(ACOM)与像素电极4(Pixel)之间的电容为存储电容Cst;所述公共电极线2(ACOM)与栅极1短接,公共电极线2与下方的栅极1为断开设置。
所述栅极1的电位由IC集成电路独立进行控制。所述公共电极线2(ACOM)及栅极1电位相等。
如图2,所述栅极1,第n级栅极信号Gate n与所述第n+1级存储电容Cst n+1的公共电极线2(ACOM)电位相等;其中,n=1,2,3,…。
所述用于改善液晶面板共电极稳压性的画素结构用于TFT-LCD显示装置,其中,阵列基板包括所述的画素结构,每一所述画素结构内的所述公共电极线2和与其对应的一条栅极1电性连接。
如图2,为本实施例所述结构的等效电路图。基于此,本实施例还提供一种用于改善液晶面板共电极稳压性的画素结构的工作方法,如图4所示,所述方法包括:
(1)第n级栅极信号电位Gate n关闭后,保持在低电位Vlow,此时第n+1级存储电容Cstn+1的公共电极线2(ACOM)的电位为低电位Vlow;
(2)第n+1级栅极信号电位Gate n+1开启后,为高电位Vhigh,第n+1级存储电容Cstn+1的像素电极4(Pixel)正常充电,第n+1级存储电容Cstn+1的公共电极线2(ACOM)的电位维持为低电位Vlow,第n+2级存储电容Cstn+2的公共电极线2(ACOM)的电位为高电位Vhigh;
(3)第n+1级栅极信号电位Gate n+1关闭后,为低电位Vlow,第n+2级存储电容Cstn+2的公共电极线2(ACOM)的电位为低电位Vlow;
(4)第n+2级栅极信号电位Gate n+2开启后,为高电位Vhigh,第n+2级存储电容Cstn+2的像素电极4(Pixel)正常充电,第n+2级存储电容Cst n+2的公共电极线2(ACOM)的电位维持为低电位Vlow;
(5)重复步骤(1)~(4)。
如图3和图4所示,所述方法中,第n级栅极信号电位开启之前,所述第n级存储电容Cstn的公共电极线(ACOM)的电位为低电位Vlow。所述第n级栅极信号电位关闭后经过时间t后开启,第n+1级栅极信号电位Gate n+1开启。
作为本发明的另一种实施方式,公共电极线还可以通过搭接其他层的金属 线以过孔连接栅极线。如在绝缘层中设置一层导电层,使公共电极线与栅极连接。
尽管上面对本发明说明性的具体实施方式进行了描述,以便于本技术领域的技术人员能够理解本发明,但是本发明不仅限于具体实施方式的范围,对本技术领域的普通技术人员而言,只要各种变化只要在所附的权利要求限定和确定的本发明精神和范围内,一切利用本发明构思的发明创造均在保护之列。

Claims (9)

  1. 一种画素结构,其中:所述画素结构包括数据线、栅极、像素电极以及驱动所述栅极的公共电极线;所述公共电极线与像素电极之间的电容为存储电容;所述公共电极线与栅极电性连接。
  2. 根据权利要求1所述的画素结构,其中:所述公共电极线与所述栅极同层设置且连接。
  3. 根据权利要求1所述的画素结构,其中:公共电极线通过搭接金属线与栅极短接。
  4. 根据权利要求1所述的画素结构,其中:所述公共电极线电位与栅极电位相等;所述栅极中第n级栅极信号与所述第n+1级存储电容的公共电极线电位相等;其中,n=1,2,3,…。
  5. 一种阵列基板,其中:包括画素结构,所述画素结构包括数据线、栅极、像素电极以及驱动所述栅极的公共电极线;所述公共电极线与像素电极之间的电容为存储电容;所述公共电极线与栅极电性连接;每一所述画素结构内的所述公共电极线和与其对应的一条栅极电性连接。
  6. 根据权利要求5所述的阵列基板,其中:每一所述画素结构内的所述公共电极线和与其对应的一条栅极电性连接。
  7. 一种画素结构的工作方法,其中,所述画素结构包括数据线、栅极、像素电极以及驱动所述栅极的公共电极线;所述公共电极线与像素电极之间的电容为存储电容;所述公共电极线与栅极电性连接;所述方法包括:
    (1)第n级栅极信号电位关闭后,保持在低电位,此时第n+1级存储电容的公共电极线的电位为低电位;
    (2)第n+1级栅极信号电位开启后,为高电位,第n+1级存储电容的像素电极正常充电,第n+1级存储电容的公共电极线的电位维持为低电位,第n+2级存储电容的公共电极线的电位为高电位;
    (3)第n+1级栅极信号电位关闭后,为低电位,第n+2级存储电容的公共电极线的电位为低电位;
    (4)第n+2级栅极线信号电位开启后,为高电位,第n+2级存储电容的像素电极正常充电,第n+2级存储电容的公共电极线的电位维持为低电位;
    (5)重复步骤(1)~(4)。
  8. 根据权利要求7所述的画素结构的工作方法,其中:所述工作方法中,第n级栅极信号电位开启之前,所述第n级存储电容的公共电极线的电位为低电位。
  9. 根据权利要求7所述的画素结构的工作方法,其中:所述第n级栅极信号电位关闭后经过时间t后开启,第n+1级栅极信号电位开启。
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US10186224B2 (en) 2019-01-22
EP3564740A1 (en) 2019-11-06
JP2020501197A (ja) 2020-01-16
EP3564740A4 (en) 2020-09-16
CN106502011A (zh) 2017-03-15
KR20190095450A (ko) 2019-08-14

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