WO2017023037A1 - Prise de test - Google Patents

Prise de test Download PDF

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Publication number
WO2017023037A1
WO2017023037A1 PCT/KR2016/008366 KR2016008366W WO2017023037A1 WO 2017023037 A1 WO2017023037 A1 WO 2017023037A1 KR 2016008366 W KR2016008366 W KR 2016008366W WO 2017023037 A1 WO2017023037 A1 WO 2017023037A1
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WO
WIPO (PCT)
Prior art keywords
conductive
conductive elastic
guide
insertion hole
device under
Prior art date
Application number
PCT/KR2016/008366
Other languages
English (en)
Korean (ko)
Inventor
정영배
Original Assignee
주식회사 아이에스시
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 아이에스시 filed Critical 주식회사 아이에스시
Publication of WO2017023037A1 publication Critical patent/WO2017023037A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals

Definitions

  • the present invention relates to a test socket, and more particularly to a test socket made to be removable from the conductive pad.
  • test socket is generally used for the stability of the electrical connection between the device under test and the device under test.
  • the test socket connects the terminals of the device under test and the pad of the test apparatus with each other so that electrical signals can be exchanged in both directions.
  • These test sockets can be largely divided into a pin type and a rubber type according to the connection means.
  • Pogo pins are generally used for the pin type, and a rubber type (rubber) is used. type), a conductive elastic portion is used.
  • FIG. 1 is an exemplary view showing a test socket having a conventional pogo pin, the pogo pin 21 disclosed in Korean Patent Laid-Open No. 10-2011-0065047 (prior document 1) is provided with a spring 23 therein.
  • the shock absorbing against the mechanical shock which may occur during the electrical characteristic inspection of the device under test 1 can be effectively performed.
  • the test socket 20 provided with the pogo pin 21 has a problem of lowering the transmission of an electrical signal.
  • the electrical signal transmitted from the device under test 1 is transmitted to the test device 3 via the contact pin 22, the spring 23 and the contact tip 24.
  • the current flowing through the spring 23 is a long electrical path in the process of flowing along the spiral direction of the spring 23, there is a problem that the characteristics of the electrical signal is degraded as the resistance is increased. Therefore, there is a problem that the electrical inspection of the device under test 1 cannot be performed correctly.
  • the terminal 2 of the device under test 1 when the terminal 2 of the device under test 1 is not accurately guided to the center of the contact pin 22, the terminal 2 of the device under test 1 may be damaged by the contact pin 22. There is also.
  • test socket which has an electroconductive elastic part which prevents the terminal 2 of the device under test 1 from being damaged, and electrically connects the device under test 1 and the test apparatus 3 electrically, is increasing. .
  • Figure 2 is an exemplary view showing a test socket provided with a conventional conductive elastic portion.
  • the conductive elastic portion 31 is elastically deformed when the terminal 2 of the device under test 1 is connected to the test socket 30.
  • the device 3 is electrically connected. That is, the conductive elastic portion 31 is provided with a plurality of conductive particles 32 in the insulating elastic material, when the terminal 2 of the device under test 1 presses the conductive elastic portion 31, the conductive elastic portion ( 31 is a compression deformation, the conductive particles 32 are electrically connected to electrically connect the device under test 1 and the test device 3.
  • test socket 30 provided with the conductive elastic portion 31 has a short lifespan of the test socket 30 due to a problem that the upper surface of the conductive elastic portion 31 is damaged in a repetitive inspection process.
  • the technical problem of the present invention for solving the above problems is to provide a test socket made to be removable from the conductive pad.
  • an embodiment of the present invention is disposed in a position corresponding to the terminal of the device under test, a plurality of conductive elastic portion arranged in the insulating elastic material in a plurality of conductive particles along the vertical direction;
  • An elastic support part surrounding the conductive elastic part and supporting the conductive elastic part;
  • An insulation support having a first insertion hole through which the lower portion of the conductive elastic portion is inserted and supported, and having a second insertion hole positioned below the first insertion hole and into which a pad of the inspection apparatus is inserted;
  • a plurality of guide parts coupled to an upper surface of the insulating support part and configured to guide terminal movement of the device under test; And a conductive pad supported and fixed to the guide part so that a conductive part is disposed on an upper surface of the conductive elastic part and detachable from the guide part.
  • the conductive elastic portion the lower surface forms a truncated conical shape having a larger diameter than the upper surface, the lower conductive elastic portion is inserted into the first insertion hole is supported; and the upper conductive elastic portion And an upper conductive elastic portion symmetrically formed and connected to each other.
  • the first insertion hole may be formed larger than the second insertion hole.
  • the guide portion may be made of an insulating material.
  • the upper end of the guide portion may be positioned above the upper surface of the conductive pad to guide the terminal of the device under test to the upper surface of the conductive portion.
  • the inclined portion may be formed on the upper portion of the guide portion.
  • two or more of the guide portion may be located adjacent to one conductive elastic portion.
  • the conductive pad has a shape corresponding to the upper surface of the conductive elastic portion and a plurality of conductive portions configured to be detachable on the upper portion of the conductive elastic portion; and the conductive portion is formed and connected to the conductive And a seat part supporting and fixing the part to the guide part, wherein the seat part may be formed to be detachable from the guide part.
  • the conductive portion may be made of a metal or conductive powder.
  • the conductive pad connected to the terminal of the device under test is detachable from the guide part, when the conductive pad is damaged during the repeated inspection of the test socket, the user can selectively replace only the conductive pad. have. Therefore, the life of the test socket can be extended only by replacing the conductive pad.
  • the guide portion is configured to guide the terminal movement of the device under test connected to the upper surface of the conductive pad. That is, the guide portion guides the terminal movement of the device under test so that the terminal of the device under test presses the center of the conductive portion of the conductive pad.
  • the guide portion is arranged so that two or more neighbors with respect to one conductive elastic portion to guide the terminal of the device under test to the correct point of the conductive portion. Therefore, the device under test and the test apparatus can be electrically connected with each other stably.
  • the elastic support portion is formed so as to surround the outer surface of the conductive elastic portion, when the elastic support portion is compressed from the terminal of the device under test, it is possible to prevent the conductive particles provided inside the elastic support portion from being separated out of the elastic support portion. Can be.
  • the conductive elastic portion is made to have an upper conductive elastic portion and a lower conductive elastic portion symmetrical.
  • the diameters of the boundary portions of the upper conductive elastic portion and the lower conductive elastic portion are increased, and electrical signals transmitted from the device under test can be smoothly transmitted to the inspection apparatus.
  • the electrical signal measurement of the device under test can be made accurately.
  • 1 is an exemplary view showing a test socket provided with a conventional pogo pin.
  • Figure 2 is an exemplary view showing a test socket provided with a conventional conductive elastic portion.
  • FIG 3 is a schematic perspective view showing a test socket according to a first embodiment of the present invention.
  • test socket 4 is a cross-sectional view of the test socket according to the first embodiment of the present invention.
  • FIG. 5 is an operational state diagram of the crimped test socket according to the first embodiment of the present invention.
  • FIG. 6 is a plan view of a test socket according to a first embodiment of the present invention.
  • FIG. 7 is a cross-sectional view illustrating a test socket according to a second embodiment of the present invention.
  • FIG. 8 is a plan view of a test socket according to a third embodiment of the present invention.
  • Figure 3 is a schematic perspective view showing a test socket according to a first embodiment of the present invention
  • Figure 4 is a cross-sectional view of the test socket according to a first embodiment of the present invention
  • Figure 5 is a first embodiment of the present invention 6 is a view illustrating an operation state of the crimped test socket according to an embodiment
  • FIG. 6 is a plan view of the test socket according to the first embodiment of the present invention.
  • the test socket 1000 is for electrically connecting the terminal 2 of the device under test 1 to be inspected and the pad 4 of the test apparatus 3 with each other. Function as an intermediary member.
  • the test socket 1000 is disposed between the device under test 1 and the test device 3 so that the upper part is directly or indirectly connected to the terminal 2 of the device under test 1, and the lower part is connected to the test device ( It is connected directly or indirectly to the pad 4 of 3) to perform the inspection of the device under test 1.
  • the terminal 2 of the device under test 1 will be described as an example of a solder ball of a ball grid array (BGA) arranged in a line on a two-dimensional array.
  • BGA ball grid array
  • the test socket 1000 may include a conductive elastic portion 100, an elastic support portion 200, an insulating support portion 300, a guide portion 400, and a conductive pad 500. have.
  • the conductive elastic portion 100 may be formed of the upper conductive elastic portion 110 and the lower conductive elastic portion 120.
  • the upper conductive elastic part 110 and the lower conductive elastic part 120 are configured in a pair, and the upper conductive elastic part 110 and the lower conductive elastic part 120 may be integrally formed.
  • the upper conductive elastic portion 110 and the lower conductive elastic portion 120 may form a truncated cone shape. That is, the lower diameter D1 of the lower conductive elastic portion 120 is larger than the upper diameter D2 of the lower conductive elastic portion 120, and the lower diameter of the upper conductive elastic portion 110 is the upper conductive elastic portion ( It is formed smaller than the upper surface diameter of 110. In this case, the upper diameter of the lower conductive elastic portion 120 and the lower diameter of the upper conductive elastic portion 110 may have the same diameter and may be integrally connected.
  • the pair of upper conductive elastic parts 110 and the lower conductive elastic parts 120 are symmetrically formed on the upper surface of the lower conductive elastic parts 120 and are connected to each other. That is, the boundary point where the upper conductive elastic portion 110 and the lower conductive elastic portion 120 meet is formed concave.
  • the diameter of the upper and lower surfaces of the conductive elastic portion 100 is greater than the diameter of the boundary point where the upper conductive elastic portion 110 and the lower conductive elastic portion 120 meet. Accordingly, the upper surface of the conductive elastic portion 100 may be formed to have a large connection area with the conductive pad 500, and the lower surface of the conductive elastic portion 100 may have a large connection area with the pad 4 of the inspection apparatus 3. Can be formed.
  • the conductive elastic portion 100 has a large area that is connected between the conductive pad 500 and the pad 4 of the inspection apparatus 3, so that the pads 4 of the conductive pad 500 and the inspection apparatus 3 are formed. Can effectively transmit electrical signals from
  • the conductive elastic portion 100 is connected to the terminal 2 of the device under test 1.
  • the concave portion of the conductive elastic portion 100 increases in diameter, and the conductive elastic portion 100 is elastically deformed into a cylindrical shape as a whole and receives an electrical signal transmitted from the device under test 1. It is delivered stably to the inspection device (3).
  • the conductive elastic portion 100 is transferred from the device under test 1 and the inspection apparatus 3 as the upper conductive elastic portion 110 and the lower conductive elastic portion 120 having a truncated conical shape are connected to each other.
  • the electrical signal can be effectively transmitted.
  • the insulating elastic material 101 forming the conductive elastic portion 100 it is preferable to use a heat resistant polymer material having a crosslinked structure.
  • a heat resistant polymer material having a crosslinked structure it is preferable to use various things.
  • a curable polymeric substance formation material which can be used in order to obtain a crosslinked polymeric substance It is preferable to use a liquid silicone rubber.
  • the liquid silicone rubber is an addition type or condensation type liquid silicone rubber, but more preferably, an addition type liquid silicone rubber is used.
  • the silicone cured product When the conductive elastic portion 100 is formed by a liquid silicone rubber cured product (hereinafter referred to as "silicone cured product"), the silicone cured product preferably has a compression set of 10% or less at 150 ° C, more preferably. Is 8% or less, and more preferably 6% or less.
  • the conductive particles 102 provided in the conductive elastic portions 100 are used when the conductive elastic portions 100 are repeatedly used in a high temperature environment. Is disturbed, and it becomes difficult to maintain conductivity.
  • the electroconductive particle 102 uses a thing whose saturation magnetization is 0.1 kPa / m ⁇ 2> or more, More preferably, it is 0.3 kPa / m ⁇ 2> or more, More preferably, it is 0.5 kPa / m ⁇ 2> or more.
  • the particle diameter of the conductive particles 102 is preferably 1 to 100 ⁇ m, more preferably 2 to 50 ⁇ m, still more preferably 3 to 30 ⁇ m, and particularly preferably 4 to 20 ⁇ m.
  • Gold, silver, rhodium, platinum, chromium and the like can be used as the highly conductive metal coated on the surface of the magnetic core particles, and among these, it is most preferable to use gold which is chemically stable and has high conductivity.
  • the elastic support portion 200 forms a shape corresponding to the conductive elastic portion 100, and surrounds the conductive elastic portion 100.
  • the elastic support part 200 supports the conductive elastic part 100, and when the conductive elastic part 100 is pressed by the terminal 2 of the device under test 1, the inside of the conductive elastic part 100 is pressed. It is prevented that the conductive particles 102 provided in the separated from the insulating elastic material 101.
  • the elastic support 200 may be made of any one material of silicon, urethane, polycarbonate, polyethylene, but is not limited thereto, and may be used without limitation as long as the material of synthetic resin or natural resin having good elasticity and excellent insulation. have. As such, the elastic support 200 is elastically deformed with the deformation of the conductive elastic portion 100, the conductive particles 102 provided in the conductive elastic portion 100 is separated from the insulating elastic material 101 It is made to prevent that.
  • the insulating support 300 is made to support the lower portion of the conductive elastic portion 100.
  • the insulation support part 300 is formed with a first insertion hole 301 into which the plurality of conductive elastic parts 100 are inserted and supported so that the lower portion of the conductive elastic part 100 is inserted into the first insertion hole 301. It may be firmly coupled to the insulating support 300.
  • the first insertion hole 301 formed in the insulating support part 300 has the center of the terminal 2 of the device under test 1 and the first insertion hole ( A plurality of first insertion holes 301 are formed in the insulating support part 300 so that the center of the 301 is located on the same vertical line.
  • the conductive elastic portion 100 inserted into and supported by the first insertion hole 301 and the terminal 2 of the device under test 1 are aligned with each other in a virtual straight line. Is formed in the insulating support 300. Accordingly, the conductive elastic portion 100 may be disposed at a position corresponding to the terminal 2 of the device under test 1.
  • the plurality of conductive elastic parts 100 may be spaced apart from each other by a predetermined pitch, and the pitch may be formed to be equal to the pitch between the terminals 2 of the device under test 1. Can be.
  • the second insertion hole 302 formed in the insulating support part 300 is positioned below the first insertion hole 301, and the pad 4 of the inspection apparatus 3 is inserted into the second insertion hole 302. . That is, the pad 4 of the inspection device 3 is connected to the bottom surface of the conductive elastic portion 100 in a state of being inserted into the second insertion hole 302. As such, the pad 4 of the inspection apparatus 3 is connected to the lower surface of the conductive elastic portion 100 in a state of being inserted into the second insertion hole 302 so that the test socket 1000 moves left and right. Will be prevented. Thus, the electrical signal inspection can be accurately performed on the terminal 2 of the device under test 1 made of fine pitch.
  • the size of the first insertion hole 301 formed in the insulating support part 300 is larger than that of the second insertion hole 302. That is, the step portion 310 formed due to the difference in size between the first insertion hole 301 and the second insertion hole 302 is formed at a portion where the first insertion hole 301 and the second insertion hole 302 are connected.
  • the lower portion of the conductive elastic portion 100 may be fixed to the stepped portion 310.
  • the insulating support part 300 configured to support the plurality of conductive elastic parts 100 is made of an insulating material.
  • the insulation support part 300 may be made of a synthetic resin material having a high strength, light weight, and excellent insulation property, such as phenolic resin, polyester, polyurethane, and fluororesin, or may be made of a non-metallic material.
  • the insulating support part 300 may be made of various materials that are excellent in insulation and can firmly support the conductive elastic part 100 in addition to the above-described materials. In other words, the insulating support 300 is excellent in insulation and heat resistance, so that even when shrinkage or expansion of the conductive elastic portion 100 occurs, the conductive elastic portion 100 is accurately positioned.
  • the guide portion 400 is coupled to the upper surface of the insulating support portion 300, it is made to guide the movement of the terminal 2 of the device under test (1). That is, the guide unit 400 is a device under test so that when the terminal 2 of the device under test 1 descends, the terminal 2 of the device under test 1 is guided to the center of the upper surface of the conductive pad 500. The movement of (1) is controlled.
  • the guide portion 400 has a height H1 up to the upper end of the guide portion 400 based on the bottom surface of the insulating support 300 is higher than the height H2 up to the top surface of the conductive pad 500. That is, the upper end of the guide part 400 is positioned above the conductive pad 500. Accordingly, the terminal 2 of the device under test 1 may be guided by the guide part 400 and guided to the center of the upper surface of the conductive part 510 provided in the conductive pad 500.
  • the guide part 400 may be made of an insulating material, such as the insulating support part 300, to prevent the electrical signal transmitted from the terminal of the device under test 1 from being transmitted to the guide part 400.
  • the guide part 400 is disposed to be adjacent to the conductive elastic part 100 inserted into and fixed to the insulating support part 300.
  • 6 (a) to 6 (c) are plan views showing the arrangement of the guide unit 400 provided in the test socket 1000, and the guide unit 400 shown in FIG. The three may be disposed adjacent to the conductive elastic portion 100.
  • the guide portion 400 shown in (b) and (c) of Figure 6 may be arranged so that four neighboring with respect to one conductive elastic portion 100.
  • the arrangement and number of the guide parts 400 may be selectively adjusted. That is, of course, two, five, six, and the like may be arranged in various positions with respect to one conductive elastic portion 100.
  • the guide part 400 is configured to guide the terminal 2 of the device under test 1 to the center of the upper surface of the conductive part 510, and the number of the guide parts 400 is not particularly limited.
  • one conductive elastic part is provided. It is preferable that three or more guides 400 neighbor to 100. As described above, the guide part 400 is configured to smoothly connect the terminal 2 of the device under test 1 and the conductive part 510 so as to increase the inspection accuracy of the device under test 1.
  • the conductive pad 500 is provided on the conductive elastic portion 100, it is made to be supported by the guide portion 400.
  • the conductive pad 500 may include a conductive portion 510 and a sheet portion 520.
  • the conductive portion 510 has a shape corresponding to the upper surface of the conductive elastic portion 100 and is disposed on the upper surface of the conductive elastic portion 100.
  • the conductive portion 510 is configured to transmit an electrical signal transmitted from the terminal 2 of the device under test 1 to the conductive elastic portion 100.
  • the conductive portion 510 may be attached to the upper surface of the conductive elastic portion 100, but is not limited thereto.
  • the conductive part 510 is made of a conductive material capable of transmitting an electrical signal.
  • the conductive portion 510 may be a conductive powder having a structure in which a plurality of conductive particles are arranged in the vertical elastic direction in the insulating elastic material.
  • the conductive portion 510 made of such conductive powder is inspected by the conductive portion 510 as the terminal 2 of the device under test 1 presses the conductive portion 510 so that elastic deformation is possible. Damage to the terminal 2 of the device 1 can be prevented.
  • the conductive part 510 is not limited to the conductive powder, and any conductive material capable of transmitting an electrical signal may be used. That is, of course, the conductive portion may be a metal.
  • the sheet part 520 is connected to the conductive part 510 and made to support the conductive part 510. As the sheet part 520 is supported and fixed to the guide part 400, the conductive part 510 may be stably positioned on an upper surface of the conductive elastic part 100.
  • the coupling part 520 is formed in the seat part 520 corresponding to the cross section of the guide part 400, and the coupling hole 521 is inserted into and coupled to the guide part 400.
  • the guide unit 400 may be firmly supported.
  • the conductive pad 500 having the conductive portion 510 and the sheet portion 520 may be selectively detachable from the guide portion 400.
  • the user may attach the conductive pad to the guide part 400 to be detachable.
  • the life of the test socket 1000 can be extended.
  • the conductive pad 500 is made to be easily removable, the user can continue to use the test socket 1000 through the selective replacement of the conductive pad 500.
  • FIG. 7 is a cross-sectional view illustrating a test socket according to a second embodiment of the present invention.
  • Members referred to by the same reference numerals as the members shown in FIGS. 3 to 6 have the same configuration and function, respectively. Detailed description thereof will be omitted.
  • the inclined portion 410 may be further formed at the upper end of the guide portion 400.
  • the inclined portion 410 is a predetermined inclination from the guide portion 400 of the straight form.
  • the inclined part 410 formed at the upper end of the guide part 400 may have a taper shape.
  • the inclined portion 410 moves the terminal 2 of the device under test 1 to the conductive portion 510. Make sure to guide gently to the center of the upper surface of the.
  • the lower portion of the second insertion hole 302 may be further formed to be inclined expansion part 320 to facilitate the insertion of the pad (4) of the inspection device (3).
  • the expansion part 320 is formed larger than the size of the second insertion hole 302 so that the pad 4 of the inspection apparatus 3 can be easily inserted into the second insertion hole 302.
  • FIG. 8 is a plan view of a test socket according to a third exemplary embodiment of the present invention, wherein members referred to by the same reference numerals as the members shown in FIGS. 3 to 6 have the same configuration and function, respectively. Detailed description thereof will be omitted.
  • the guide portion is shown that the cross-sectional shape is not limited to a circular shape made of various forms.
  • FIG. 8 (a) is a cross-sectional shape of the guide portion 401 is a rectangular shape
  • Figure 8 (b) is a cross-sectional shape of the guide portion 402 is an arc shape
  • Figure 8 (c) The cross-sectional shape of the guide portion 403 forms a circle in which a hollow is formed.
  • the coupling hole 521 formed in the sheet part 520 is formed in a shape corresponding to the cross section of the guide parts 401, 402, and 403.
  • the cross-sectional shape of the guide part 402 when the cross-sectional shape of the guide part 402 is in the shape of an arc as shown in FIG.
  • the conductive pad 500 may be stably supported and fixed to the guide portion 402 because the support portion of the coupling hole 521 is widened.
  • the terminal 2 of the device under test 1 even when two guide parts 402 are arranged adjacent to one conductive elastic part 100.
  • the guide part 403 may form a circular shape in which a hollow is formed as shown in FIG. 8 (c).
  • the conductive elastic part 100 may be located in the hollow of the guide part 403. That is, when the guide part 403 is formed in a circular shape having a hollow, the support portion of the coupling hole 521 is wider than the case where the cross-sectional shape of the guide part 402 is formed in an arc shape, so that the conductive pad 500 ) May be more firmly supported and fixed to the guide portion 403.
  • the cross-sectional shape of the guide part protruding from the insulating support part 300 is not limited to a specific shape, but may be formed in various shapes.
  • conductive elastic portion 110 upper conductive elastic portion
  • insulation support part 400 insulation support part 400, 401, 402, 403: guide part

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)

Abstract

La présente invention concerne, selon un mode de réalisation, une prise de test comportant : une pluralité de parties élastiques conductrices agencées au niveau d'une position correspondant à une borne d'un dispositif à inspecter, et sur lesquelles une pluralité de particules conductrices sont alignées dans une direction verticale à l'intérieur d'une matière élastique isolante ; une partie de support élastique servant à supporter les parties élastiques conductrices tout en recouvrant les parties élastiques conductrices ; une partie de support isolante ayant un premier trou d'insertion dans lequel la partie inférieure de la partie élastique conductrice est insérée et supportée, et un deuxième trou d'insertion qui est positionné sous le premier trou d'insertion et dans lequel une garniture d'un dispositif d'inspection est insérée ; une pluralité de parties de guidage accouplées à la surface supérieure de la partie de support isolante, et guidant le mouvement de la borne du dispositif devant être inspecté ; et une garniture conductrice supportée par et fixée sur les parties de guidage de telle sorte qu'une partie de conduction est disposée sur la surface supérieure de la partie élastique conductrice, et formée de façon à pouvoir être attachée aux parties de guidage et détachée de celles-ci.
PCT/KR2016/008366 2015-08-04 2016-07-29 Prise de test WO2017023037A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020150110117A KR101682230B1 (ko) 2015-08-04 2015-08-04 테스트용 소켓
KR10-2015-0110117 2015-08-04

Publications (1)

Publication Number Publication Date
WO2017023037A1 true WO2017023037A1 (fr) 2017-02-09

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KR (1) KR101682230B1 (fr)
TW (1) TWI620935B (fr)
WO (1) WO2017023037A1 (fr)

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CN110911436A (zh) * 2019-12-03 2020-03-24 京东方科技集团股份有限公司 一种驱动背板、发光二极管的转移装置及转移方法
CN111208323A (zh) * 2018-11-22 2020-05-29 株式会社Isc 用于测试被测设备的测试插座

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KR102002694B1 (ko) * 2017-09-29 2019-07-23 주식회사 새한마이크로텍 전도성 접촉부 및 이를 포함하는 이방 전도성 시트
KR101879806B1 (ko) * 2017-12-07 2018-07-18 (주)티에스이 반도체 테스트 소켓의 이력관리 패드, 이의 제작 방법 및 이력관리 패드를 포함하는 반도체 테스트 장치
KR102004501B1 (ko) * 2017-12-28 2019-07-26 (주)새한마이크로텍 이방 전도성 시트
KR102032652B1 (ko) * 2018-06-07 2019-10-15 주식회사 새한마이크로텍 스프링을 구비한 이방 전도성 시트
CN114341652A (zh) * 2019-08-29 2022-04-12 株式会社Isc 测试座
KR102220168B1 (ko) * 2020-01-23 2021-02-25 (주)티에스이 신호 전송 커넥터 및 그 제조방법
KR102179457B1 (ko) * 2020-03-25 2020-11-16 (주)티에스이 테스트 소켓 및 이를 포함하는 테스트 장치와, 테스트 소켓의 제조방법
KR102427089B1 (ko) * 2020-05-27 2022-07-29 주식회사 아이에스시 전기접속용 커넥터
KR102420784B1 (ko) * 2020-10-08 2022-07-15 주식회사 아이에스시 전기 접속용 커넥터
KR102496532B1 (ko) * 2020-10-30 2023-02-06 (주)티에스이 반도체 패키지의 테스트 장치
KR102525559B1 (ko) * 2023-01-02 2023-04-25 (주)새한마이크로텍 신호 손실 방지용 테스트 소켓

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