WO2017023037A1 - Test socket - Google Patents

Test socket Download PDF

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Publication number
WO2017023037A1
WO2017023037A1 PCT/KR2016/008366 KR2016008366W WO2017023037A1 WO 2017023037 A1 WO2017023037 A1 WO 2017023037A1 KR 2016008366 W KR2016008366 W KR 2016008366W WO 2017023037 A1 WO2017023037 A1 WO 2017023037A1
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WO
WIPO (PCT)
Prior art keywords
conductive
conductive elastic
guide
insertion hole
device under
Prior art date
Application number
PCT/KR2016/008366
Other languages
French (fr)
Korean (ko)
Inventor
정영배
Original Assignee
주식회사 아이에스시
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Filing date
Publication date
Application filed by 주식회사 아이에스시 filed Critical 주식회사 아이에스시
Publication of WO2017023037A1 publication Critical patent/WO2017023037A1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals

Definitions

  • the present invention relates to a test socket, and more particularly to a test socket made to be removable from the conductive pad.
  • test socket is generally used for the stability of the electrical connection between the device under test and the device under test.
  • the test socket connects the terminals of the device under test and the pad of the test apparatus with each other so that electrical signals can be exchanged in both directions.
  • These test sockets can be largely divided into a pin type and a rubber type according to the connection means.
  • Pogo pins are generally used for the pin type, and a rubber type (rubber) is used. type), a conductive elastic portion is used.
  • FIG. 1 is an exemplary view showing a test socket having a conventional pogo pin, the pogo pin 21 disclosed in Korean Patent Laid-Open No. 10-2011-0065047 (prior document 1) is provided with a spring 23 therein.
  • the shock absorbing against the mechanical shock which may occur during the electrical characteristic inspection of the device under test 1 can be effectively performed.
  • the test socket 20 provided with the pogo pin 21 has a problem of lowering the transmission of an electrical signal.
  • the electrical signal transmitted from the device under test 1 is transmitted to the test device 3 via the contact pin 22, the spring 23 and the contact tip 24.
  • the current flowing through the spring 23 is a long electrical path in the process of flowing along the spiral direction of the spring 23, there is a problem that the characteristics of the electrical signal is degraded as the resistance is increased. Therefore, there is a problem that the electrical inspection of the device under test 1 cannot be performed correctly.
  • the terminal 2 of the device under test 1 when the terminal 2 of the device under test 1 is not accurately guided to the center of the contact pin 22, the terminal 2 of the device under test 1 may be damaged by the contact pin 22. There is also.
  • test socket which has an electroconductive elastic part which prevents the terminal 2 of the device under test 1 from being damaged, and electrically connects the device under test 1 and the test apparatus 3 electrically, is increasing. .
  • Figure 2 is an exemplary view showing a test socket provided with a conventional conductive elastic portion.
  • the conductive elastic portion 31 is elastically deformed when the terminal 2 of the device under test 1 is connected to the test socket 30.
  • the device 3 is electrically connected. That is, the conductive elastic portion 31 is provided with a plurality of conductive particles 32 in the insulating elastic material, when the terminal 2 of the device under test 1 presses the conductive elastic portion 31, the conductive elastic portion ( 31 is a compression deformation, the conductive particles 32 are electrically connected to electrically connect the device under test 1 and the test device 3.
  • test socket 30 provided with the conductive elastic portion 31 has a short lifespan of the test socket 30 due to a problem that the upper surface of the conductive elastic portion 31 is damaged in a repetitive inspection process.
  • the technical problem of the present invention for solving the above problems is to provide a test socket made to be removable from the conductive pad.
  • an embodiment of the present invention is disposed in a position corresponding to the terminal of the device under test, a plurality of conductive elastic portion arranged in the insulating elastic material in a plurality of conductive particles along the vertical direction;
  • An elastic support part surrounding the conductive elastic part and supporting the conductive elastic part;
  • An insulation support having a first insertion hole through which the lower portion of the conductive elastic portion is inserted and supported, and having a second insertion hole positioned below the first insertion hole and into which a pad of the inspection apparatus is inserted;
  • a plurality of guide parts coupled to an upper surface of the insulating support part and configured to guide terminal movement of the device under test; And a conductive pad supported and fixed to the guide part so that a conductive part is disposed on an upper surface of the conductive elastic part and detachable from the guide part.
  • the conductive elastic portion the lower surface forms a truncated conical shape having a larger diameter than the upper surface, the lower conductive elastic portion is inserted into the first insertion hole is supported; and the upper conductive elastic portion And an upper conductive elastic portion symmetrically formed and connected to each other.
  • the first insertion hole may be formed larger than the second insertion hole.
  • the guide portion may be made of an insulating material.
  • the upper end of the guide portion may be positioned above the upper surface of the conductive pad to guide the terminal of the device under test to the upper surface of the conductive portion.
  • the inclined portion may be formed on the upper portion of the guide portion.
  • two or more of the guide portion may be located adjacent to one conductive elastic portion.
  • the conductive pad has a shape corresponding to the upper surface of the conductive elastic portion and a plurality of conductive portions configured to be detachable on the upper portion of the conductive elastic portion; and the conductive portion is formed and connected to the conductive And a seat part supporting and fixing the part to the guide part, wherein the seat part may be formed to be detachable from the guide part.
  • the conductive portion may be made of a metal or conductive powder.
  • the conductive pad connected to the terminal of the device under test is detachable from the guide part, when the conductive pad is damaged during the repeated inspection of the test socket, the user can selectively replace only the conductive pad. have. Therefore, the life of the test socket can be extended only by replacing the conductive pad.
  • the guide portion is configured to guide the terminal movement of the device under test connected to the upper surface of the conductive pad. That is, the guide portion guides the terminal movement of the device under test so that the terminal of the device under test presses the center of the conductive portion of the conductive pad.
  • the guide portion is arranged so that two or more neighbors with respect to one conductive elastic portion to guide the terminal of the device under test to the correct point of the conductive portion. Therefore, the device under test and the test apparatus can be electrically connected with each other stably.
  • the elastic support portion is formed so as to surround the outer surface of the conductive elastic portion, when the elastic support portion is compressed from the terminal of the device under test, it is possible to prevent the conductive particles provided inside the elastic support portion from being separated out of the elastic support portion. Can be.
  • the conductive elastic portion is made to have an upper conductive elastic portion and a lower conductive elastic portion symmetrical.
  • the diameters of the boundary portions of the upper conductive elastic portion and the lower conductive elastic portion are increased, and electrical signals transmitted from the device under test can be smoothly transmitted to the inspection apparatus.
  • the electrical signal measurement of the device under test can be made accurately.
  • 1 is an exemplary view showing a test socket provided with a conventional pogo pin.
  • Figure 2 is an exemplary view showing a test socket provided with a conventional conductive elastic portion.
  • FIG 3 is a schematic perspective view showing a test socket according to a first embodiment of the present invention.
  • test socket 4 is a cross-sectional view of the test socket according to the first embodiment of the present invention.
  • FIG. 5 is an operational state diagram of the crimped test socket according to the first embodiment of the present invention.
  • FIG. 6 is a plan view of a test socket according to a first embodiment of the present invention.
  • FIG. 7 is a cross-sectional view illustrating a test socket according to a second embodiment of the present invention.
  • FIG. 8 is a plan view of a test socket according to a third embodiment of the present invention.
  • Figure 3 is a schematic perspective view showing a test socket according to a first embodiment of the present invention
  • Figure 4 is a cross-sectional view of the test socket according to a first embodiment of the present invention
  • Figure 5 is a first embodiment of the present invention 6 is a view illustrating an operation state of the crimped test socket according to an embodiment
  • FIG. 6 is a plan view of the test socket according to the first embodiment of the present invention.
  • the test socket 1000 is for electrically connecting the terminal 2 of the device under test 1 to be inspected and the pad 4 of the test apparatus 3 with each other. Function as an intermediary member.
  • the test socket 1000 is disposed between the device under test 1 and the test device 3 so that the upper part is directly or indirectly connected to the terminal 2 of the device under test 1, and the lower part is connected to the test device ( It is connected directly or indirectly to the pad 4 of 3) to perform the inspection of the device under test 1.
  • the terminal 2 of the device under test 1 will be described as an example of a solder ball of a ball grid array (BGA) arranged in a line on a two-dimensional array.
  • BGA ball grid array
  • the test socket 1000 may include a conductive elastic portion 100, an elastic support portion 200, an insulating support portion 300, a guide portion 400, and a conductive pad 500. have.
  • the conductive elastic portion 100 may be formed of the upper conductive elastic portion 110 and the lower conductive elastic portion 120.
  • the upper conductive elastic part 110 and the lower conductive elastic part 120 are configured in a pair, and the upper conductive elastic part 110 and the lower conductive elastic part 120 may be integrally formed.
  • the upper conductive elastic portion 110 and the lower conductive elastic portion 120 may form a truncated cone shape. That is, the lower diameter D1 of the lower conductive elastic portion 120 is larger than the upper diameter D2 of the lower conductive elastic portion 120, and the lower diameter of the upper conductive elastic portion 110 is the upper conductive elastic portion ( It is formed smaller than the upper surface diameter of 110. In this case, the upper diameter of the lower conductive elastic portion 120 and the lower diameter of the upper conductive elastic portion 110 may have the same diameter and may be integrally connected.
  • the pair of upper conductive elastic parts 110 and the lower conductive elastic parts 120 are symmetrically formed on the upper surface of the lower conductive elastic parts 120 and are connected to each other. That is, the boundary point where the upper conductive elastic portion 110 and the lower conductive elastic portion 120 meet is formed concave.
  • the diameter of the upper and lower surfaces of the conductive elastic portion 100 is greater than the diameter of the boundary point where the upper conductive elastic portion 110 and the lower conductive elastic portion 120 meet. Accordingly, the upper surface of the conductive elastic portion 100 may be formed to have a large connection area with the conductive pad 500, and the lower surface of the conductive elastic portion 100 may have a large connection area with the pad 4 of the inspection apparatus 3. Can be formed.
  • the conductive elastic portion 100 has a large area that is connected between the conductive pad 500 and the pad 4 of the inspection apparatus 3, so that the pads 4 of the conductive pad 500 and the inspection apparatus 3 are formed. Can effectively transmit electrical signals from
  • the conductive elastic portion 100 is connected to the terminal 2 of the device under test 1.
  • the concave portion of the conductive elastic portion 100 increases in diameter, and the conductive elastic portion 100 is elastically deformed into a cylindrical shape as a whole and receives an electrical signal transmitted from the device under test 1. It is delivered stably to the inspection device (3).
  • the conductive elastic portion 100 is transferred from the device under test 1 and the inspection apparatus 3 as the upper conductive elastic portion 110 and the lower conductive elastic portion 120 having a truncated conical shape are connected to each other.
  • the electrical signal can be effectively transmitted.
  • the insulating elastic material 101 forming the conductive elastic portion 100 it is preferable to use a heat resistant polymer material having a crosslinked structure.
  • a heat resistant polymer material having a crosslinked structure it is preferable to use various things.
  • a curable polymeric substance formation material which can be used in order to obtain a crosslinked polymeric substance It is preferable to use a liquid silicone rubber.
  • the liquid silicone rubber is an addition type or condensation type liquid silicone rubber, but more preferably, an addition type liquid silicone rubber is used.
  • the silicone cured product When the conductive elastic portion 100 is formed by a liquid silicone rubber cured product (hereinafter referred to as "silicone cured product"), the silicone cured product preferably has a compression set of 10% or less at 150 ° C, more preferably. Is 8% or less, and more preferably 6% or less.
  • the conductive particles 102 provided in the conductive elastic portions 100 are used when the conductive elastic portions 100 are repeatedly used in a high temperature environment. Is disturbed, and it becomes difficult to maintain conductivity.
  • the electroconductive particle 102 uses a thing whose saturation magnetization is 0.1 kPa / m ⁇ 2> or more, More preferably, it is 0.3 kPa / m ⁇ 2> or more, More preferably, it is 0.5 kPa / m ⁇ 2> or more.
  • the particle diameter of the conductive particles 102 is preferably 1 to 100 ⁇ m, more preferably 2 to 50 ⁇ m, still more preferably 3 to 30 ⁇ m, and particularly preferably 4 to 20 ⁇ m.
  • Gold, silver, rhodium, platinum, chromium and the like can be used as the highly conductive metal coated on the surface of the magnetic core particles, and among these, it is most preferable to use gold which is chemically stable and has high conductivity.
  • the elastic support portion 200 forms a shape corresponding to the conductive elastic portion 100, and surrounds the conductive elastic portion 100.
  • the elastic support part 200 supports the conductive elastic part 100, and when the conductive elastic part 100 is pressed by the terminal 2 of the device under test 1, the inside of the conductive elastic part 100 is pressed. It is prevented that the conductive particles 102 provided in the separated from the insulating elastic material 101.
  • the elastic support 200 may be made of any one material of silicon, urethane, polycarbonate, polyethylene, but is not limited thereto, and may be used without limitation as long as the material of synthetic resin or natural resin having good elasticity and excellent insulation. have. As such, the elastic support 200 is elastically deformed with the deformation of the conductive elastic portion 100, the conductive particles 102 provided in the conductive elastic portion 100 is separated from the insulating elastic material 101 It is made to prevent that.
  • the insulating support 300 is made to support the lower portion of the conductive elastic portion 100.
  • the insulation support part 300 is formed with a first insertion hole 301 into which the plurality of conductive elastic parts 100 are inserted and supported so that the lower portion of the conductive elastic part 100 is inserted into the first insertion hole 301. It may be firmly coupled to the insulating support 300.
  • the first insertion hole 301 formed in the insulating support part 300 has the center of the terminal 2 of the device under test 1 and the first insertion hole ( A plurality of first insertion holes 301 are formed in the insulating support part 300 so that the center of the 301 is located on the same vertical line.
  • the conductive elastic portion 100 inserted into and supported by the first insertion hole 301 and the terminal 2 of the device under test 1 are aligned with each other in a virtual straight line. Is formed in the insulating support 300. Accordingly, the conductive elastic portion 100 may be disposed at a position corresponding to the terminal 2 of the device under test 1.
  • the plurality of conductive elastic parts 100 may be spaced apart from each other by a predetermined pitch, and the pitch may be formed to be equal to the pitch between the terminals 2 of the device under test 1. Can be.
  • the second insertion hole 302 formed in the insulating support part 300 is positioned below the first insertion hole 301, and the pad 4 of the inspection apparatus 3 is inserted into the second insertion hole 302. . That is, the pad 4 of the inspection device 3 is connected to the bottom surface of the conductive elastic portion 100 in a state of being inserted into the second insertion hole 302. As such, the pad 4 of the inspection apparatus 3 is connected to the lower surface of the conductive elastic portion 100 in a state of being inserted into the second insertion hole 302 so that the test socket 1000 moves left and right. Will be prevented. Thus, the electrical signal inspection can be accurately performed on the terminal 2 of the device under test 1 made of fine pitch.
  • the size of the first insertion hole 301 formed in the insulating support part 300 is larger than that of the second insertion hole 302. That is, the step portion 310 formed due to the difference in size between the first insertion hole 301 and the second insertion hole 302 is formed at a portion where the first insertion hole 301 and the second insertion hole 302 are connected.
  • the lower portion of the conductive elastic portion 100 may be fixed to the stepped portion 310.
  • the insulating support part 300 configured to support the plurality of conductive elastic parts 100 is made of an insulating material.
  • the insulation support part 300 may be made of a synthetic resin material having a high strength, light weight, and excellent insulation property, such as phenolic resin, polyester, polyurethane, and fluororesin, or may be made of a non-metallic material.
  • the insulating support part 300 may be made of various materials that are excellent in insulation and can firmly support the conductive elastic part 100 in addition to the above-described materials. In other words, the insulating support 300 is excellent in insulation and heat resistance, so that even when shrinkage or expansion of the conductive elastic portion 100 occurs, the conductive elastic portion 100 is accurately positioned.
  • the guide portion 400 is coupled to the upper surface of the insulating support portion 300, it is made to guide the movement of the terminal 2 of the device under test (1). That is, the guide unit 400 is a device under test so that when the terminal 2 of the device under test 1 descends, the terminal 2 of the device under test 1 is guided to the center of the upper surface of the conductive pad 500. The movement of (1) is controlled.
  • the guide portion 400 has a height H1 up to the upper end of the guide portion 400 based on the bottom surface of the insulating support 300 is higher than the height H2 up to the top surface of the conductive pad 500. That is, the upper end of the guide part 400 is positioned above the conductive pad 500. Accordingly, the terminal 2 of the device under test 1 may be guided by the guide part 400 and guided to the center of the upper surface of the conductive part 510 provided in the conductive pad 500.
  • the guide part 400 may be made of an insulating material, such as the insulating support part 300, to prevent the electrical signal transmitted from the terminal of the device under test 1 from being transmitted to the guide part 400.
  • the guide part 400 is disposed to be adjacent to the conductive elastic part 100 inserted into and fixed to the insulating support part 300.
  • 6 (a) to 6 (c) are plan views showing the arrangement of the guide unit 400 provided in the test socket 1000, and the guide unit 400 shown in FIG. The three may be disposed adjacent to the conductive elastic portion 100.
  • the guide portion 400 shown in (b) and (c) of Figure 6 may be arranged so that four neighboring with respect to one conductive elastic portion 100.
  • the arrangement and number of the guide parts 400 may be selectively adjusted. That is, of course, two, five, six, and the like may be arranged in various positions with respect to one conductive elastic portion 100.
  • the guide part 400 is configured to guide the terminal 2 of the device under test 1 to the center of the upper surface of the conductive part 510, and the number of the guide parts 400 is not particularly limited.
  • one conductive elastic part is provided. It is preferable that three or more guides 400 neighbor to 100. As described above, the guide part 400 is configured to smoothly connect the terminal 2 of the device under test 1 and the conductive part 510 so as to increase the inspection accuracy of the device under test 1.
  • the conductive pad 500 is provided on the conductive elastic portion 100, it is made to be supported by the guide portion 400.
  • the conductive pad 500 may include a conductive portion 510 and a sheet portion 520.
  • the conductive portion 510 has a shape corresponding to the upper surface of the conductive elastic portion 100 and is disposed on the upper surface of the conductive elastic portion 100.
  • the conductive portion 510 is configured to transmit an electrical signal transmitted from the terminal 2 of the device under test 1 to the conductive elastic portion 100.
  • the conductive portion 510 may be attached to the upper surface of the conductive elastic portion 100, but is not limited thereto.
  • the conductive part 510 is made of a conductive material capable of transmitting an electrical signal.
  • the conductive portion 510 may be a conductive powder having a structure in which a plurality of conductive particles are arranged in the vertical elastic direction in the insulating elastic material.
  • the conductive portion 510 made of such conductive powder is inspected by the conductive portion 510 as the terminal 2 of the device under test 1 presses the conductive portion 510 so that elastic deformation is possible. Damage to the terminal 2 of the device 1 can be prevented.
  • the conductive part 510 is not limited to the conductive powder, and any conductive material capable of transmitting an electrical signal may be used. That is, of course, the conductive portion may be a metal.
  • the sheet part 520 is connected to the conductive part 510 and made to support the conductive part 510. As the sheet part 520 is supported and fixed to the guide part 400, the conductive part 510 may be stably positioned on an upper surface of the conductive elastic part 100.
  • the coupling part 520 is formed in the seat part 520 corresponding to the cross section of the guide part 400, and the coupling hole 521 is inserted into and coupled to the guide part 400.
  • the guide unit 400 may be firmly supported.
  • the conductive pad 500 having the conductive portion 510 and the sheet portion 520 may be selectively detachable from the guide portion 400.
  • the user may attach the conductive pad to the guide part 400 to be detachable.
  • the life of the test socket 1000 can be extended.
  • the conductive pad 500 is made to be easily removable, the user can continue to use the test socket 1000 through the selective replacement of the conductive pad 500.
  • FIG. 7 is a cross-sectional view illustrating a test socket according to a second embodiment of the present invention.
  • Members referred to by the same reference numerals as the members shown in FIGS. 3 to 6 have the same configuration and function, respectively. Detailed description thereof will be omitted.
  • the inclined portion 410 may be further formed at the upper end of the guide portion 400.
  • the inclined portion 410 is a predetermined inclination from the guide portion 400 of the straight form.
  • the inclined part 410 formed at the upper end of the guide part 400 may have a taper shape.
  • the inclined portion 410 moves the terminal 2 of the device under test 1 to the conductive portion 510. Make sure to guide gently to the center of the upper surface of the.
  • the lower portion of the second insertion hole 302 may be further formed to be inclined expansion part 320 to facilitate the insertion of the pad (4) of the inspection device (3).
  • the expansion part 320 is formed larger than the size of the second insertion hole 302 so that the pad 4 of the inspection apparatus 3 can be easily inserted into the second insertion hole 302.
  • FIG. 8 is a plan view of a test socket according to a third exemplary embodiment of the present invention, wherein members referred to by the same reference numerals as the members shown in FIGS. 3 to 6 have the same configuration and function, respectively. Detailed description thereof will be omitted.
  • the guide portion is shown that the cross-sectional shape is not limited to a circular shape made of various forms.
  • FIG. 8 (a) is a cross-sectional shape of the guide portion 401 is a rectangular shape
  • Figure 8 (b) is a cross-sectional shape of the guide portion 402 is an arc shape
  • Figure 8 (c) The cross-sectional shape of the guide portion 403 forms a circle in which a hollow is formed.
  • the coupling hole 521 formed in the sheet part 520 is formed in a shape corresponding to the cross section of the guide parts 401, 402, and 403.
  • the cross-sectional shape of the guide part 402 when the cross-sectional shape of the guide part 402 is in the shape of an arc as shown in FIG.
  • the conductive pad 500 may be stably supported and fixed to the guide portion 402 because the support portion of the coupling hole 521 is widened.
  • the terminal 2 of the device under test 1 even when two guide parts 402 are arranged adjacent to one conductive elastic part 100.
  • the guide part 403 may form a circular shape in which a hollow is formed as shown in FIG. 8 (c).
  • the conductive elastic part 100 may be located in the hollow of the guide part 403. That is, when the guide part 403 is formed in a circular shape having a hollow, the support portion of the coupling hole 521 is wider than the case where the cross-sectional shape of the guide part 402 is formed in an arc shape, so that the conductive pad 500 ) May be more firmly supported and fixed to the guide portion 403.
  • the cross-sectional shape of the guide part protruding from the insulating support part 300 is not limited to a specific shape, but may be formed in various shapes.
  • conductive elastic portion 110 upper conductive elastic portion
  • insulation support part 400 insulation support part 400, 401, 402, 403: guide part

Abstract

One embodiment of the present invention provides a test socket comprising: a plurality of conductive elastic parts arranged at a position corresponding to a terminal of a device to be inspected, and in which a plurality of conductive particles are aligned in a vertical direction within an insulating elastic material; an elastic support part for supporting the conductive elastic parts while covering the conductive elastic parts; an insulating support part having a first insertion hole in which the lower part of the conductive elastic part is inserted and supported, and a second insertion hole which is positioned under the first insertion hole and into which a pad of an inspection device is inserted; a plurality of guide parts coupled to the upper surface of the insulating support part, and guiding the movement of the terminal of the device to be inspected; and a conductive pad supported by and fixed to the guide parts such that a conduction part is disposed on the upper surface of the conductive elastic part, and formed to be attachable to and detachable from the guide parts.

Description

테스트용 소켓Test socket
본 발명은 테스트용 소켓에 관한 것으로, 보다 상세하게는 도전성 패드의 탈착이 가능하도록 이루어진 테스트용 소켓에 관한 것이다.The present invention relates to a test socket, and more particularly to a test socket made to be removable from the conductive pad.
일반적으로 피검사 디바이스의 전기적 특성 검사를 위해서는 피검사 디바이스와 검사장치와의 전기적 연결이 안정적으로 이루어져야 된다. 이와 같이, 피검사 디바이스와 검사장치와의 전기적 연결의 안정성을 위해 일반적으로 테스트용 소켓이 사용된다.In general, in order to inspect the electrical characteristics of the device under test, the electrical connection between the device under test and the test apparatus must be made stable. As such, a test socket is generally used for the stability of the electrical connection between the device under test and the device under test.
테스트용 소켓은 피검사 디바이스의 단자와 검사장치의 패드를 서로 연결시켜 전기적 신호가 양방향으로 교환 가능하도록 이루어진 것이다. 이러한 테스트용 소켓은 접속수단에 따라 크게 핀 타입(pin type)과 러버 타입(rubber type)으로 나눠질 수 있으며, 통상 핀 타입(pin type)에는 포고핀(pogo pin)이 사용되고, 러버 타입(rubber type)에는 도전성 탄성부가 사용된다.The test socket connects the terminals of the device under test and the pad of the test apparatus with each other so that electrical signals can be exchanged in both directions. These test sockets can be largely divided into a pin type and a rubber type according to the connection means.Pogo pins are generally used for the pin type, and a rubber type (rubber) is used. type), a conductive elastic portion is used.
도 1은 종래의 포고핀이 구비된 테스트용 소켓을 보여주는 예시도로, 한국공개특허 제10-2011-0065047호(선행문헌 1)에 개시된 포고핀(21)은 내부에 스프링(23)이 마련되어 있어, 피검사 디바이스(1)의 전기적 특성 검사시 발생될 수 있는 기계적인 충격에 대한 완충이 효과적으로 이루어질 수 있다.1 is an exemplary view showing a test socket having a conventional pogo pin, the pogo pin 21 disclosed in Korean Patent Laid-Open No. 10-2011-0065047 (prior document 1) is provided with a spring 23 therein. In addition, the shock absorbing against the mechanical shock which may occur during the electrical characteristic inspection of the device under test 1 can be effectively performed.
그러나 포고핀(21)이 구비된 테스트용 소켓(20)은 전기적 신호의 전달을 저하시키는 문제가 있다. 구체적으로, 피검사 디바이스(1)로부터 전달된 전기적 신호는 접촉핀(22), 스프링(23) 및 접촉팁(24)을 통해 검사장치(3)로 전달된다. 이때, 스프링(23)을 통해 흐르는 전류는 스프링(23)의 나선방향을 따라 흐르는 과정에서 전기적 경로가 길어지게 되어, 저항이 증가됨에 따라 전기적 신호의 특성이 저하되는 문제가 있다. 따라서, 피검사 디바이스(1)의 전기적 검사가 정확히 이루어지지 못하는 문제가 있다.However, the test socket 20 provided with the pogo pin 21 has a problem of lowering the transmission of an electrical signal. Specifically, the electrical signal transmitted from the device under test 1 is transmitted to the test device 3 via the contact pin 22, the spring 23 and the contact tip 24. At this time, the current flowing through the spring 23 is a long electrical path in the process of flowing along the spiral direction of the spring 23, there is a problem that the characteristics of the electrical signal is degraded as the resistance is increased. Therefore, there is a problem that the electrical inspection of the device under test 1 cannot be performed correctly.
또한, 피검사 디바이스(1)의 단자(2)가 접촉핀(22)의 중심으로 정확히 안내되지 못할 경우에는 접촉핀(22)에 의해 피검사 디바이스(1)의 단자(2)가 손상될 수 도 있다.In addition, when the terminal 2 of the device under test 1 is not accurately guided to the center of the contact pin 22, the terminal 2 of the device under test 1 may be damaged by the contact pin 22. There is also.
따라서, 피검사 디바이스(1)의 단자(2) 손상을 방지하며, 피검사 디바이스(1)와 검사장치(3)를 전기적으로 원활히 연결하도록 이루어진 도전성 탄성부를 갖는 테스트용 소켓의 필요성이 증대되고 있다.Therefore, the necessity of the test socket which has an electroconductive elastic part which prevents the terminal 2 of the device under test 1 from being damaged, and electrically connects the device under test 1 and the test apparatus 3 electrically, is increasing. .
도 2는 종래의 도전성 탄성부가 구비된 테스트용 소켓을 보여주는 예시도이다.Figure 2 is an exemplary view showing a test socket provided with a conventional conductive elastic portion.
이러한 도전성 탄성부(31)가 구비된 테스트용 소켓(30)은 피검사 디바이스(1)의 단자(2)와의 접속 시, 도전성 탄성부(31)가 탄성 변형되며 피검사 디바이스(1)와 검사장치(3)를 전기적으로 연결시키게 된다. 즉, 도전성 탄성부(31)는 절연성 탄성 물질 내에 다수의 도전성 입자(32)가 구비되어, 피검사 디바이스(1)의 단자(2)가 도전성 탄성부(31)를 가압하게 되면 도전성 탄성부(31)는 압착 변형이 이루어지며, 도전성 입자(32)는 전기적으로 연결되어 피검사 디바이스(1)와 검사장치(3)를 전기적으로 연결시키게 된다.In the test socket 30 provided with the conductive elastic portion 31, the conductive elastic portion 31 is elastically deformed when the terminal 2 of the device under test 1 is connected to the test socket 30. The device 3 is electrically connected. That is, the conductive elastic portion 31 is provided with a plurality of conductive particles 32 in the insulating elastic material, when the terminal 2 of the device under test 1 presses the conductive elastic portion 31, the conductive elastic portion ( 31 is a compression deformation, the conductive particles 32 are electrically connected to electrically connect the device under test 1 and the test device 3.
그러나 도전성 탄성부(31)가 구비된 테스트용 소켓(30)은 반복적인 검사 과정에서 도전성 탄성부(31)의 상면이 손상되는 문제로 인해 테스트용 소켓(30)의 수명이 짧은 문제가 있다.However, the test socket 30 provided with the conductive elastic portion 31 has a short lifespan of the test socket 30 due to a problem that the upper surface of the conductive elastic portion 31 is damaged in a repetitive inspection process.
따라서, 도전성 탄성부(31)가 구비된 테스트용 소켓(30)의 수명을 연장시키기 위한 다양한 연구 개발이 필요하다.Therefore, various research and development are needed to extend the life of the test socket 30 provided with the conductive elastic portion 31.
선행기술문헌Prior art literature
선행문헌 1 : 한국공개특허 제10-2011-0065047호(2011.06.15)Prior Document 1: Korean Patent Publication No. 10-2011-0065047 (2011.06.15)
상기와 같은 문제점을 해결하기 위한 본 발명의 기술적 과제는, 도전성 패드의 탈착이 가능하도록 이루어진 테스트용 소켓을 제공하는 것이다.The technical problem of the present invention for solving the above problems is to provide a test socket made to be removable from the conductive pad.
상기 기술적 과제를 달성하기 위하여, 본 발명의 일실시예는 피검사 디바이스의 단자와 대응되는 위치에 배치되며, 절연성 탄성 물질 내에 다수의 도전성 입자가 상하방향을 따라 배열되는 복수의 도전성 탄성부; 상기 도전성 탄성부를 감싸며 상기 도전성 탄성부를 지지하는 탄성 지지부; 상기 도전성 탄성부의 하부가 삽입 지지되는 제1 삽입홀이 형성되고, 상기 제1 삽입홀의 하부에 위치되며 검사장치의 패드가 삽입되는 제2 삽입홀이 형성된 절연 지지부; 상기 절연 지지부의 상면과 결합되며, 상기 피검사 디바이스의 단자 이동을 안내하는 복수의 가이드부; 및 상기 도전성 탄성부의 상면에 도전부가 배치되도록 상기 가이드부에 지지 고정되며, 상기 가이드부와 탈착 가능하도록 이루어진 도전성 패드;를 포함하는 테스트용 소켓을 제공한다.In order to achieve the above technical problem, an embodiment of the present invention is disposed in a position corresponding to the terminal of the device under test, a plurality of conductive elastic portion arranged in the insulating elastic material in a plurality of conductive particles along the vertical direction; An elastic support part surrounding the conductive elastic part and supporting the conductive elastic part; An insulation support having a first insertion hole through which the lower portion of the conductive elastic portion is inserted and supported, and having a second insertion hole positioned below the first insertion hole and into which a pad of the inspection apparatus is inserted; A plurality of guide parts coupled to an upper surface of the insulating support part and configured to guide terminal movement of the device under test; And a conductive pad supported and fixed to the guide part so that a conductive part is disposed on an upper surface of the conductive elastic part and detachable from the guide part.
본 발명의 일실시예에 있어서, 상기 도전성 탄성부는, 하면이 상면보다 지름이 크게 형성된 원뿔대 형상을 이루며, 하부가 상기 제1 삽입홀에 삽입 지지되는 하부 도전성 탄성부;와 상기 하부 도전성 탄성부의 상면을 기준으로 대칭을 이루며 연결 형성된 상부 도전성 탄성부;를 포함할 수 있다.In one embodiment of the present invention, the conductive elastic portion, the lower surface forms a truncated conical shape having a larger diameter than the upper surface, the lower conductive elastic portion is inserted into the first insertion hole is supported; and the upper conductive elastic portion And an upper conductive elastic portion symmetrically formed and connected to each other.
본 발명의 일실시예에 있어서, 상기 제1 삽입홀은 상기 제2 삽입홀보다 더 크게 형성될 수 있다.In one embodiment of the present invention, the first insertion hole may be formed larger than the second insertion hole.
본 발명의 일실시예에 있어서, 상기 가이드부는 절연 소재로 이루어질 수 있다.In one embodiment of the present invention, the guide portion may be made of an insulating material.
본 발명의 일실시예에 있어서, 상기 가이드부의 상단부는 상기 도전성 패드의 상면보다 상부에 위치되어 상기 피검사 디바이스의 단자를 상기 도전부의 상면으로 안내하도록 이루어질 수 있다.In one embodiment of the present invention, the upper end of the guide portion may be positioned above the upper surface of the conductive pad to guide the terminal of the device under test to the upper surface of the conductive portion.
본 발명의 일실시예에 있어서, 상기 가이드부의 상부에는 경사부가 형성될 수 있다.In one embodiment of the present invention, the inclined portion may be formed on the upper portion of the guide portion.
본 발명의 일실시예에 있어서, 1개의 상기 도전성 탄성부에는 2개 이상의 상기 가이드부가 이웃하도록 위치될 수 있다.In one embodiment of the present invention, two or more of the guide portion may be located adjacent to one conductive elastic portion.
본 발명의 일실시예에 있어서, 상기 도전성 패드는, 상기 도전성 탄성부의 상면과 대응되는 형상을 이루며 상기 도전성 탄성부의 상부에 탈착 가능하도록 이루어진 복수개의 도전부;와 상기 도전부와 연결형성되며 상기 도전부를 상기 가이드부에 지지고정하는 시트부;를 포함하며, 상기 시트부는 상기 가이드부와 탈착 가능하도록 이루어질 수 있다.In one embodiment of the present invention, the conductive pad has a shape corresponding to the upper surface of the conductive elastic portion and a plurality of conductive portions configured to be detachable on the upper portion of the conductive elastic portion; and the conductive portion is formed and connected to the conductive And a seat part supporting and fixing the part to the guide part, wherein the seat part may be formed to be detachable from the guide part.
본 발명의 일실시예에 있어서, 상기 도전부는, 금속 또는 도전성 파우더로 이루어질 수 있다.In one embodiment of the present invention, the conductive portion, may be made of a metal or conductive powder.
상기에서 설명한 본 발명에 따른 테스트용 소켓의 효과를 설명하면 다음과 같다.Referring to the effect of the test socket according to the present invention described above are as follows.
본 발명에 따르면, 피검사 디바이스의 단자와 접속되는 도전성 패드는 가이드부와 탈착 가능하도록 이루어짐에 따라 테스트용 소켓의 반복적인 검사 과정에서 도전성 패드가 손상된 경우, 사용자는 도전성 패드만을 선택적으로 교체할 수 있다. 따라서, 도전성 패드의 교체만으로도 테스트용 소켓의 수명을 연장시킬 수 있다.According to the present invention, since the conductive pad connected to the terminal of the device under test is detachable from the guide part, when the conductive pad is damaged during the repeated inspection of the test socket, the user can selectively replace only the conductive pad. have. Therefore, the life of the test socket can be extended only by replacing the conductive pad.
본 발명에 따르면, 가이드부는 도전성 패드의 상면에 접속되는 피검사 디바이스의 단자 이동을 안내하도록 이루어진다. 즉, 가이드부는 피검사 디바이스의 단자가 도전성 패드의 도전부 중심을 가압하도록 피검사 디바이스의 단자 이동을 안내하게 된다.According to the present invention, the guide portion is configured to guide the terminal movement of the device under test connected to the upper surface of the conductive pad. That is, the guide portion guides the terminal movement of the device under test so that the terminal of the device under test presses the center of the conductive portion of the conductive pad.
여기서 가이드부는 1개의 도전성 탄성부에 대해 2개 이상이 이웃하도록 배치되어 피검사 디바이스의 단자를 도전부의 정확한 지점으로 안내하게 된다. 따라서, 피검사 디바이스와 검사장치는 전기적 연결이 안정적으로 이루어질 수 있다.Here, the guide portion is arranged so that two or more neighbors with respect to one conductive elastic portion to guide the terminal of the device under test to the correct point of the conductive portion. Therefore, the device under test and the test apparatus can be electrically connected with each other stably.
본 발명에 따르면, 탄성 지지부는 도전성 탄성부의 외측면을 감싸도록 이루어져 피검사 디바이스의 단자로부터 탄성 지지부가 압착되는 경우, 탄성 지지부의 내부에 구비된 도전성 입자가 탄성 지지부의 외부로 이탈되는 것이 방지될 수 있다.According to the present invention, the elastic support portion is formed so as to surround the outer surface of the conductive elastic portion, when the elastic support portion is compressed from the terminal of the device under test, it is possible to prevent the conductive particles provided inside the elastic support portion from being separated out of the elastic support portion. Can be.
본 발명에 따르면, 도전성 탄성부는 대칭을 이루는 상부 도전성 탄성부와 하부 도전성 탄성부를 갖도록 이루어진다. 이러한 도전성 탄성부는 압착시 상부 도전성 탄성부와 하부 도전성 탄성부의 경계 부분의 지름이 커지며 피검사 디바이스로부터 전달된 전기적 신호는 검사장치로 원활히 전달될 수 있다. 따라서, 피검사 디바이스의 전기적 신호 측정이 정확히 이루어질 수 있다.According to the invention, the conductive elastic portion is made to have an upper conductive elastic portion and a lower conductive elastic portion symmetrical. When the conductive elastic portion is crimped, the diameters of the boundary portions of the upper conductive elastic portion and the lower conductive elastic portion are increased, and electrical signals transmitted from the device under test can be smoothly transmitted to the inspection apparatus. Thus, the electrical signal measurement of the device under test can be made accurately.
본 발명의 효과는 상기한 효과로 한정되는 것은 아니며, 본 발명의 상세한 설명 또는 특허청구범위에 기재된 발명의 구성으로부터 추론가능한 모든 효과를 포함하는 것으로 이해되어야 한다.The effects of the present invention are not limited to the above-described effects, but should be understood to include all the effects deduced from the configuration of the invention described in the detailed description or claims of the present invention.
도 1은 종래의 포고핀이 구비된 테스트용 소켓을 보여주는 예시도이다.1 is an exemplary view showing a test socket provided with a conventional pogo pin.
도 2는 종래의 도전성 탄성부가 구비된 테스트용 소켓을 보여주는 예시도이다.Figure 2 is an exemplary view showing a test socket provided with a conventional conductive elastic portion.
도 3은 본 발명의 제1 실시예에 따른 테스트용 소켓을 보여주는 개략적인 사시도이다.3 is a schematic perspective view showing a test socket according to a first embodiment of the present invention.
도 4는 본 발명의 제1 실시예에 따른 테스트용 소켓의 단면 예시도이다.4 is a cross-sectional view of the test socket according to the first embodiment of the present invention.
도 5는 본 발명의 제1 실시예에 따른 압착된 테스트용 소켓의 작동 상태도이다.5 is an operational state diagram of the crimped test socket according to the first embodiment of the present invention.
도 6은 본 발명의 제1 실시예에 따른 테스트용 소켓의 평면도이다.6 is a plan view of a test socket according to a first embodiment of the present invention.
도 7은 본 발명의 제2 실시예에 따른 테스트용 소켓의 단면 예시도이다.7 is a cross-sectional view illustrating a test socket according to a second embodiment of the present invention.
도 8은 본 발명의 제3 실시예에 따른 테스트용 소켓의 평면도이다.8 is a plan view of a test socket according to a third embodiment of the present invention.
이하에서는 첨부한 도면을 참조하여 본 발명을 설명하기로 한다. 그러나 본 발명은 여러 가지 상이한 형태로 구현될 수 있으며, 따라서 여기에서 설명하는 실시예로 한정되는 것은 아니다. 그리고 도면에서 본 발명을 명확하게 설명하기 위해서 설명과 관계없는 부분은 생략하였으며, 명세서 전체를 통하여 유사한 부분에 대해서는 유사한 도면 부호를 붙였다.Hereinafter, with reference to the accompanying drawings will be described the present invention. As those skilled in the art would realize, the described embodiments may be modified in various different ways, all without departing from the spirit or scope of the present invention. In the drawings, parts irrelevant to the description are omitted in order to clearly describe the present invention, and like reference numerals designate like parts throughout the specification.
명세서 전체에서, 어떤 부분이 다른 부분과 "연결"되어 있다고 할 때, 이는 "직접적으로 연결"되어 있는 경우뿐 아니라, 그 중간에 다른 부재를 사이에 두고 "간접적으로 연결"되어 있는 경우도 포함한다. 또한 어떤 부분이 어떤 구성요소를 "포함"한다고 할 때, 이는 특별히 반대되는 기재가 없는 한 다른 구성요소를 제외하는 것이 아니라 다른 구성요소를 더 구비할 수 있다는 것을 의미한다.Throughout the specification, when a part is "connected" to another part, it includes not only "directly connected" but also "indirectly connected" with another member in between. . In addition, when a part is said to "include" a certain component, this means that it may further include other components, without excluding the other components unless otherwise stated.
이하 첨부된 도면을 참고하여 본 발명의 실시예를 상세히 설명하기로 한다.Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.
도 3은 본 발명의 제1 실시예에 따른 테스트용 소켓을 보여주는 개략적인 사시도이고, 도 4는 본 발명의 제1 실시예에 따른 테스트용 소켓의 단면 예시도이며, 도 5는 본 발명의 제1 실시예에 따른 압착된 테스트용 소켓의 작동 상태도이고, 도 6은 본 발명의 제1 실시예에 따른 테스트용 소켓의 평면도이다.Figure 3 is a schematic perspective view showing a test socket according to a first embodiment of the present invention, Figure 4 is a cross-sectional view of the test socket according to a first embodiment of the present invention, Figure 5 is a first embodiment of the present invention 6 is a view illustrating an operation state of the crimped test socket according to an embodiment, and FIG. 6 is a plan view of the test socket according to the first embodiment of the present invention.
도 3 내지 도 6에서 보는 바와 같이, 테스트용 소켓(1000)은 검사가 요구되는 피검사 디바이스(1)의 단자(2)와 검사장치(3)의 패드(4)를 서로 전기적으로 접속시키기 위한 매개부재로서의 기능을 수행하게 된다.As shown in FIGS. 3 to 6, the test socket 1000 is for electrically connecting the terminal 2 of the device under test 1 to be inspected and the pad 4 of the test apparatus 3 with each other. Function as an intermediary member.
이러한 테스트용 소켓(1000)은 피검사 디바이스(1)와 검사장치(3)의 사이에 배치되어 상부는 피검사 디바이스(1)의 단자(2)와 직간접적으로 접속되고, 하부는 검사장치(3)의 패드(4)와 직간접적으로 접속되어 피검사 디바이스(1)의 검사를 수행하게 된다.The test socket 1000 is disposed between the device under test 1 and the test device 3 so that the upper part is directly or indirectly connected to the terminal 2 of the device under test 1, and the lower part is connected to the test device ( It is connected directly or indirectly to the pad 4 of 3) to perform the inspection of the device under test 1.
여기서 피검사 디바이스(1)의 단자(2)는 2차원 어레이 상으로 줄지어 배열된 볼 그리드 어레이(BGA : Ball Grid Array)의 솔더볼의 형태를 일예로 설명하기로 한다.Here, the terminal 2 of the device under test 1 will be described as an example of a solder ball of a ball grid array (BGA) arranged in a line on a two-dimensional array.
도 3 내지 도 5를 참고하면, 테스트용 소켓(1000)은 도전성 탄성부(100), 탄성 지지부(200), 절연 지지부(300), 가이드부(400) 및 도전성 패드(500)를 포함할 수 있다.3 to 5, the test socket 1000 may include a conductive elastic portion 100, an elastic support portion 200, an insulating support portion 300, a guide portion 400, and a conductive pad 500. have.
도전성 탄성부(100)는 상부 도전성 탄성부(110)와 하부 도전성 탄성부(120)로 이루어질 수 있다. 여기서 상부 도전성 탄성부(110)와 하부 도전성 탄성부(120)는 한 쌍을 이루는 구성으로, 상부 도전성 탄성부(110)와 하부 도전성 탄성부(120)는 일체로 이루어질 수 있다.The conductive elastic portion 100 may be formed of the upper conductive elastic portion 110 and the lower conductive elastic portion 120. Here, the upper conductive elastic part 110 and the lower conductive elastic part 120 are configured in a pair, and the upper conductive elastic part 110 and the lower conductive elastic part 120 may be integrally formed.
이러한 상부 도전성 탄성부(110)와 하부 도전성 탄성부(120)는 원뿔대 형상을 이룰 수 있다. 즉, 하부 도전성 탄성부(120)의 하면 지름(D1)은 하부 도전성 탄성부(120)의 상면 지름(D2)보다 크게 형성되고, 상부 도전성 탄성부(110)의 하면 지름은 상부 도전성 탄성부(110)의 상면 지름 보다 작게 형성된다. 이때, 하부 도전성 탄성부(120)의 상면 지름과 상부 도전성 탄성부(110)의 하면 지름은 동일한 지름을 가지며 일체로 연결될 수 있음은 물론이다.The upper conductive elastic portion 110 and the lower conductive elastic portion 120 may form a truncated cone shape. That is, the lower diameter D1 of the lower conductive elastic portion 120 is larger than the upper diameter D2 of the lower conductive elastic portion 120, and the lower diameter of the upper conductive elastic portion 110 is the upper conductive elastic portion ( It is formed smaller than the upper surface diameter of 110. In this case, the upper diameter of the lower conductive elastic portion 120 and the lower diameter of the upper conductive elastic portion 110 may have the same diameter and may be integrally connected.
다시 말해서, 한 쌍을 이루는 상부 도전성 탄성부(110)와 하부 도전성 탄성부(120)는 하부 도전성 탄성부(120)의 상면을 기준으로 대칭을 이루며 연결 형성된다. 즉, 상부 도전성 탄성부(110)와 하부 도전성 탄성부(120)가 만나는 경계 지점은 오목하게 형성된다.In other words, the pair of upper conductive elastic parts 110 and the lower conductive elastic parts 120 are symmetrically formed on the upper surface of the lower conductive elastic parts 120 and are connected to each other. That is, the boundary point where the upper conductive elastic portion 110 and the lower conductive elastic portion 120 meet is formed concave.
구체적으로, 도전성 탄성부(100)의 상면과 하면의 지름 크기는 상부 도전성 탄성부(110)와 하부 도전성 탄성부(120)가 만나는 경계 지점의 지름보다 크게 형성된다. 따라서, 도전성 탄성부(100)의 상면은 도전성 패드(500)와의 접속 면적이 넓게 형성될 수 있고, 도전성 탄성부(100)의 하면은 검사장치(3)의 패드(4)와 접속 면적이 넓게 형성될 수 있다.Specifically, the diameter of the upper and lower surfaces of the conductive elastic portion 100 is greater than the diameter of the boundary point where the upper conductive elastic portion 110 and the lower conductive elastic portion 120 meet. Accordingly, the upper surface of the conductive elastic portion 100 may be formed to have a large connection area with the conductive pad 500, and the lower surface of the conductive elastic portion 100 may have a large connection area with the pad 4 of the inspection apparatus 3. Can be formed.
이와 같이, 도전성 탄성부(100)는 도전성 패드(500)와 검사장치(3)의 패드(4)와의 접속되는 면적이 넓게 형성됨에 따라 도전성 패드(500)와 검사장치(3)의 패드(4)로부터 전달되는 전기적 신호를 효과적으로 전달할 수 있다.As described above, the conductive elastic portion 100 has a large area that is connected between the conductive pad 500 and the pad 4 of the inspection apparatus 3, so that the pads 4 of the conductive pad 500 and the inspection apparatus 3 are formed. Can effectively transmit electrical signals from
도 5를 참고하면, 상부 도전성 탄성부(110)와 하부 도전성 탄성부(120)가 만나는 경계 지점은 오목하게 형성됨에 따라, 도전성 탄성부(100)가 피검사 디바이스(1)의 단자(2)에 의해 압착이 이루어질 경우, 도전성 탄성부(100)의 오목한 부분은 지름이 커짐과 동시에 도전성 탄성부(100)는 전체적으로 원기둥 형태로 탄성 변형이 이루어지며 피검사 디바이스(1)로부터 전달된 전기적 신호를 검사장치(3)로 안정적으로 전달하게 된다.Referring to FIG. 5, as the boundary point where the upper conductive elastic portion 110 and the lower conductive elastic portion 120 meet is formed concave, the conductive elastic portion 100 is connected to the terminal 2 of the device under test 1. When the compression is performed by the concave portion, the concave portion of the conductive elastic portion 100 increases in diameter, and the conductive elastic portion 100 is elastically deformed into a cylindrical shape as a whole and receives an electrical signal transmitted from the device under test 1. It is delivered stably to the inspection device (3).
이와 같이, 도전성 탄성부(100)는 원뿔대 형상을 갖는 상부 도전성 탄성부(110)와 하부 도전성 탄성부(120)가 연결된 형태를 이룸에 따라 피검사 디바이스(1)와 검사장치(3)로부터 전달되는 전기적 신호는 효과적으로 전달될 수 있다.As such, the conductive elastic portion 100 is transferred from the device under test 1 and the inspection apparatus 3 as the upper conductive elastic portion 110 and the lower conductive elastic portion 120 having a truncated conical shape are connected to each other. The electrical signal can be effectively transmitted.
이러한 도전성 탄성부(100)를 형성하는 절연성 탄성 물질(101)로는 가교 구조를 갖는 내열성의 고분자 물질을 이용하는 것이 바람직하다. 가교 고분자 물질을 얻기 위해 이용할 수 있는 경화성의 고분자 물질 형성 재료로서는, 다양한 것을 이용할 수 있지만, 액상 실리콘 고무를 이용하는 것이 바람직하다. 이러한 액상 실리콘 고무로는 부가형 또는 축합형의 액상 실리콘 고무가 있으나, 그 중 더욱 바람직하게는 부가형 액상 실리콘 고무를 이용하는 것이 바람직하다.As the insulating elastic material 101 forming the conductive elastic portion 100, it is preferable to use a heat resistant polymer material having a crosslinked structure. Although various things can be used as a curable polymeric substance formation material which can be used in order to obtain a crosslinked polymeric substance, It is preferable to use a liquid silicone rubber. The liquid silicone rubber is an addition type or condensation type liquid silicone rubber, but more preferably, an addition type liquid silicone rubber is used.
액상 실리콘 고무 경화물(이하,「실리콘 경화물」이라 함)에 의해 도전성 탄성부(100)가 형성될 경우, 실리콘 경화물은 150℃에서 압축 영구 왜곡이 10％ 이하인 것이 바람직하고, 보다 바람직하게는 8％ 이하, 더욱 바람직하게는 6％ 이하인 것이 바람직하다.When the conductive elastic portion 100 is formed by a liquid silicone rubber cured product (hereinafter referred to as "silicone cured product"), the silicone cured product preferably has a compression set of 10% or less at 150 ° C, more preferably. Is 8% or less, and more preferably 6% or less.
만약, 150℃에서 실리콘 경화물의 압축 영구 왜곡이 10％ 초과할 경우에는, 도전성 탄성부(100)를 고온의 환경 하에서 반복해서 사용하였을 때, 도전성 탄성부(100) 내에 구비된 도전성 입자(102)의 흐트러짐이 발생하게 되어 도전성을 유지하는 것이 곤란해진다.If the compressive permanent distortion of the silicone cured product is more than 10% at 150 ° C, the conductive particles 102 provided in the conductive elastic portions 100 are used when the conductive elastic portions 100 are repeatedly used in a high temperature environment. Is disturbed, and it becomes difficult to maintain conductivity.
이때, 도전성 입자(102)로는 자성을 나타내는 코어 입자의 표면에 고도전성 금속이 피복된 것을 이용하는 것이 바람직하다. 이러한 자성 코어 입자를 구성하는 재료로는 철, 니켈, 코발트 등의 금속을 구리, 수지에 코팅한 것으로 이용할 수 있다. 이때, 도전성 입자(102)는 포화 자화가 0.1 ㏝/㎡ 이상인 것을 이용하는 것이 바람직하고, 더 바람직하게는 0.3 ㏝/㎡ 이상, 더욱더 바람직하게는 0.5 ㏝/㎡ 이상인 것인 것이 바람직하다.At this time, it is preferable to use what electroconductive particle 102 coat | covered the highly conductive metal on the surface of the core particle which shows magnetic property. As a material constituting such magnetic core particles, a metal such as iron, nickel, cobalt or the like is coated on copper or resin. At this time, it is preferable that the electroconductive particle 102 uses a thing whose saturation magnetization is 0.1 kPa / m <2> or more, More preferably, it is 0.3 kPa / m <2> or more, More preferably, it is 0.5 kPa / m <2> or more.
이러한 도전성 입자(102)의 입경은 1 내지 100㎛인 것이 바람직하고, 보다 바람직하게는 2 내지 50㎛, 더욱 바람직하게는 3 내지 30㎛, 특히 바람직하게는 4 내지 20㎛로 형성될 수 있다.The particle diameter of the conductive particles 102 is preferably 1 to 100 µm, more preferably 2 to 50 µm, still more preferably 3 to 30 µm, and particularly preferably 4 to 20 µm.
자성 코어 입자의 표면에 피복되는 고도전성 금속으로서는 금, 은, 로듐, 백금, 크롬 등을 이용할 수 있고, 이들 중에서는 화학적으로 안정되고 높은 도전율을 갖는 금을 이용하는 것이 가장 바람직하다.Gold, silver, rhodium, platinum, chromium and the like can be used as the highly conductive metal coated on the surface of the magnetic core particles, and among these, it is most preferable to use gold which is chemically stable and has high conductivity.
한편, 탄성 지지부(200)는 도전성 탄성부(100)와 대응되는 형상을 이루며, 도전성 탄성부(100)를 감싸게 된다. 이러한 탄성 지지부(200)는 도전성 탄성부(100)를 지지하며, 도전성 탄성부(100)가 피검사 디바이스(1)의 단자(2)에 의해 압착이 이루어지는 경우, 도전성 탄성부(100)의 내부에 구비된 도전성 입자(102)가 절연성 탄성 물질(101)로부터 이탈되는 것을 방지하게 된다.On the other hand, the elastic support portion 200 forms a shape corresponding to the conductive elastic portion 100, and surrounds the conductive elastic portion 100. The elastic support part 200 supports the conductive elastic part 100, and when the conductive elastic part 100 is pressed by the terminal 2 of the device under test 1, the inside of the conductive elastic part 100 is pressed. It is prevented that the conductive particles 102 provided in the separated from the insulating elastic material 101.
이러한 탄성 지지부(200)는 실리콘, 우레탄, 폴리카보네이트, 폴리에틸렌 중 어느 하나의 소재로 이루어질 수 있으나, 이에 한정되는 것은 아니며 탄력성이 좋으면서 절연성이 우수한 합성수지 내지 천연수지의 재료라면 무엇이든 한정됨 없이 사용될 수 있다. 이와 같은, 탄성 지지부(200)는 도전성 탄성부(100)의 변형과 함께 탄성 변형이 이루어지며, 도전성 탄성부(100)의 내부에 구비된 도전성 입자(102)가 절연성 탄성 물질(101)로부터 이탈되는 것을 방지하도록 이루어진다.The elastic support 200 may be made of any one material of silicon, urethane, polycarbonate, polyethylene, but is not limited thereto, and may be used without limitation as long as the material of synthetic resin or natural resin having good elasticity and excellent insulation. have. As such, the elastic support 200 is elastically deformed with the deformation of the conductive elastic portion 100, the conductive particles 102 provided in the conductive elastic portion 100 is separated from the insulating elastic material 101 It is made to prevent that.
한편, 절연 지지부(300)는 도전성 탄성부(100)의 하부를 지지하도록 이루어진다. 이러한 절연 지지부(300)는 복수의 도전성 탄성부(100)가 삽입 지지되는 제1 삽입홀(301)이 형성되어 도전성 탄성부(100)의 하부는 제1 삽입홀(301)에 삽입된 상태로 절연 지지부(300)에 견고히 결합될 수 있다.On the other hand, the insulating support 300 is made to support the lower portion of the conductive elastic portion 100. The insulation support part 300 is formed with a first insertion hole 301 into which the plurality of conductive elastic parts 100 are inserted and supported so that the lower portion of the conductive elastic part 100 is inserted into the first insertion hole 301. It may be firmly coupled to the insulating support 300.
이러한 절연 지지부(300)에 형성된 제1 삽입홀(301)은 피검사 디바이스(1)의 단자(2)가 하강하는 경우, 피검사 디바이스(1)의 단자(2) 중심과 제1 삽입홀(301)의 중심이 가상의 동일 수직선상에 위치되도록 제1 삽입홀(301)은 절연 지지부(300)에 복수개로 형성된다. 즉, 제1 삽입홀(301)에 삽입 지지된 도전성 탄성부(100)와 피검사 디바이스(1)의 단자(2)는 가상의 일직선상에 얼라인(align) 되도록 제1 삽입홀(301)은 절연 지지부(300)에 형성된다. 따라서, 도전성 탄성부(100)는 피검사 디바이스(1)의 단자(2)와 대응되는 위치에 배치될 수 있다.When the terminal 2 of the device under test 1 descends, the first insertion hole 301 formed in the insulating support part 300 has the center of the terminal 2 of the device under test 1 and the first insertion hole ( A plurality of first insertion holes 301 are formed in the insulating support part 300 so that the center of the 301 is located on the same vertical line. In other words, the conductive elastic portion 100 inserted into and supported by the first insertion hole 301 and the terminal 2 of the device under test 1 are aligned with each other in a virtual straight line. Is formed in the insulating support 300. Accordingly, the conductive elastic portion 100 may be disposed at a position corresponding to the terminal 2 of the device under test 1.
다시 말해서, 복수개의 도전성 탄성부(100)들은 서로 일정 피치(pitch)로 이격되어 있을 수 있는데, 그 피치는 검사 대상인 피검사 디바이스(1)의 단자(2)들 사이의 피치와 동일하게 형성될 수 있다.In other words, the plurality of conductive elastic parts 100 may be spaced apart from each other by a predetermined pitch, and the pitch may be formed to be equal to the pitch between the terminals 2 of the device under test 1. Can be.
절연 지지부(300)에 형성된 제2 삽입홀(302)은 제1 삽입홀(301)의 하부에 위치되며, 제2 삽입홀(302)에는 검사장치(3)의 패드(4)가 삽입되도록 이루어진다. 즉, 검사장치(3)의 패드(4)는 제2 삽입홀(302)에 삽입된 상태로 도전성 탄성부(100)의 하면과 접속되도록 이루어진다. 이와 같이, 검사장치(3)의 패드(4)는 제2 삽입홀(302)에 삽입된 상태로 도전성 탄성부(100)의 하면과 접속되도록 이루어짐에 따라 테스트용 소켓(1000)의 좌우 이동 발생을 방지하게 된다. 따라서, 미세 피치로 이루어진 피검사 디바이스(1)의 단자(2)에 대해 전기적 신호 검사가 정확히 이루어질 수 있다.The second insertion hole 302 formed in the insulating support part 300 is positioned below the first insertion hole 301, and the pad 4 of the inspection apparatus 3 is inserted into the second insertion hole 302. . That is, the pad 4 of the inspection device 3 is connected to the bottom surface of the conductive elastic portion 100 in a state of being inserted into the second insertion hole 302. As such, the pad 4 of the inspection apparatus 3 is connected to the lower surface of the conductive elastic portion 100 in a state of being inserted into the second insertion hole 302 so that the test socket 1000 moves left and right. Will be prevented. Thus, the electrical signal inspection can be accurately performed on the terminal 2 of the device under test 1 made of fine pitch.
여기서 절연 지지부(300)에 형성된 제1 삽입홀(301)의 크기는 제2 삽입홀(302)의 크기 보다 더 크게 형성된다. 즉, 제1 삽입홀(301)과 제2 삽입홀(302)의 연결되는 부위에는 제1 삽입홀(301)과 제2 삽입홀(302)의 크기 차이로 인한 단턱부(310)가 형성되며, 도전성 탄성부(100)의 하부는 단턱부(310)에 지지 고정될 수 있다.Herein, the size of the first insertion hole 301 formed in the insulating support part 300 is larger than that of the second insertion hole 302. That is, the step portion 310 formed due to the difference in size between the first insertion hole 301 and the second insertion hole 302 is formed at a portion where the first insertion hole 301 and the second insertion hole 302 are connected. The lower portion of the conductive elastic portion 100 may be fixed to the stepped portion 310.
이와 같이, 복수의 도전성 탄성부(100)를 각각 지지하도록 이루어진 절연 지지부(300)는 절연소재로 이루어진다.As such, the insulating support part 300 configured to support the plurality of conductive elastic parts 100 is made of an insulating material.
이러한 절연 지지부(300)는 페놀수지, 폴리에스테르, 폴리우레탄, 프루오르수지 등의 질량당 강도가 크고, 경량이며, 절연성이 우수한 합성수지재로 이루어지거나 이외의 비금속 소재로 이루어질 수 있다. 여기서 절연 지지부(300)는 상술된 소재 이외에 절연성이 우수하고 도전성 탄성부(100)를 견고히 지지할 수 있는 다양한 소재로 이루어질 수도 있음은 물론이다. 다시 말해서, 절연 지지부(300)는 절연성 및 내열성이 우수하여, 도전성 탄성부(100)의 수축, 팽창이 발생될 경우라도 도전성 탄성부(100)의 위치를 정확히 잡아주도록 이루어진다.The insulation support part 300 may be made of a synthetic resin material having a high strength, light weight, and excellent insulation property, such as phenolic resin, polyester, polyurethane, and fluororesin, or may be made of a non-metallic material. Here, the insulating support part 300 may be made of various materials that are excellent in insulation and can firmly support the conductive elastic part 100 in addition to the above-described materials. In other words, the insulating support 300 is excellent in insulation and heat resistance, so that even when shrinkage or expansion of the conductive elastic portion 100 occurs, the conductive elastic portion 100 is accurately positioned.
한편, 가이드부(400)는 절연 지지부(300)의 상면과 결합되며, 피검사 디바이스(1)의 단자(2) 이동을 안내하도록 이루어진다. 즉, 가이드부(400)는 피검사 디바이스(1)의 단자(2)가 하강할 시, 피검사 디바이스(1)의 단자(2)가 도전성 패드(500)의 상면 중앙으로 안내되도록 피검사 디바이스(1)의 이동을 제어하게 된다.On the other hand, the guide portion 400 is coupled to the upper surface of the insulating support portion 300, it is made to guide the movement of the terminal 2 of the device under test (1). That is, the guide unit 400 is a device under test so that when the terminal 2 of the device under test 1 descends, the terminal 2 of the device under test 1 is guided to the center of the upper surface of the conductive pad 500. The movement of (1) is controlled.
이러한 가이드부(400)는 절연 지지부(300)의 하면을 기준으로 가이드부(400)의 상단부까지의 높이(H1)는 도전성 패드(500)의 상면까지의 높이(H2) 보다 높다. 즉, 가이드부(400)의 상단부는 도전성 패드(500)의 상부에 위치하게 된다. 따라서, 피검사 디바이스(1)의 단자(2)는 가이드부(400)의 안내를 받으며, 도전성 패드(500)에 구비된 도전부(510)의 상면 중앙으로 안내될 수 있다. 이러한 가이드부(400)는 절연 지지부(300)와 같이, 절연 소재로 이루어져 피검사 디바이스(1)의 단자로부터 전달되는 전기적 신호가 가이드부(400)로 전달되는 것이 방지될 수 있다.The guide portion 400 has a height H1 up to the upper end of the guide portion 400 based on the bottom surface of the insulating support 300 is higher than the height H2 up to the top surface of the conductive pad 500. That is, the upper end of the guide part 400 is positioned above the conductive pad 500. Accordingly, the terminal 2 of the device under test 1 may be guided by the guide part 400 and guided to the center of the upper surface of the conductive part 510 provided in the conductive pad 500. The guide part 400 may be made of an insulating material, such as the insulating support part 300, to prevent the electrical signal transmitted from the terminal of the device under test 1 from being transmitted to the guide part 400.
도 6을 참고하면, 가이드부(400)는 절연 지지부(300)에 삽입 고정된 도전성 탄성부(100)에 이웃하도록 배치된다. 도 6의 (a) 내지 (c)는 테스트용 소켓(1000)에 구비된 가이드부(400)의 배치 상태를 보여주는 평면도로, 도 6의 (a)에서 보여지는 가이드부(400)는 1개의 도전성 탄성부(100)에 대해 3개가 이웃하도록 배치될 수 있다.Referring to FIG. 6, the guide part 400 is disposed to be adjacent to the conductive elastic part 100 inserted into and fixed to the insulating support part 300. 6 (a) to 6 (c) are plan views showing the arrangement of the guide unit 400 provided in the test socket 1000, and the guide unit 400 shown in FIG. The three may be disposed adjacent to the conductive elastic portion 100.
그리고 도 6의 (b)와 (c)에서 보여지는 가이드부(400)는 1개의 도전성 탄성부(100)에 대해 4개가 이웃하도록 배치될 수 있다. 다시 말해서, 가이드부(400)의 배치 및 개수는 선택적으로 조절될 수 있다. 즉, 가이드부(400)는 1개의 도전성 탄성부(100)에 대해 2개, 5개, 6개 등이 다양한 개수로 다양한 위치에 배치될 수도 있음은 물론이다. 이와 같이, 가이드부(400)는 피검사 디바이스(1)의 단자(2)를 도전부(510)의 상면 중앙으로 안내하는 구성으로, 가이드부(400)의 개수에는 특별한 제한은 없다.And the guide portion 400 shown in (b) and (c) of Figure 6 may be arranged so that four neighboring with respect to one conductive elastic portion 100. In other words, the arrangement and number of the guide parts 400 may be selectively adjusted. That is, of course, two, five, six, and the like may be arranged in various positions with respect to one conductive elastic portion 100. As described above, the guide part 400 is configured to guide the terminal 2 of the device under test 1 to the center of the upper surface of the conductive part 510, and the number of the guide parts 400 is not particularly limited.
다만, 피검사 디바이스(1)의 단자(2)가 하강할 시, 피검사 디바이스(1)의 단자(2)가 도전부(510)의 상면 중앙으로 안정적으로 이동되도록 하기 위해서는 1개의 도전성 탄성부(100)에 대해 3개 이상의 가이드부(400)가 이웃하는 것이 바람직하다. 이와 같이, 가이드부(400)는 피검사 디바이스(1)의 단자(2)와 도전부(510)의 접속이 원활히 이루도록 하여 피검사 디바이스(1)의 검사 정확성을 높이도록 이루어진다.However, when the terminal 2 of the device under test 1 is lowered, in order to ensure that the terminal 2 of the device under test 1 is stably moved to the center of the upper surface of the conductive portion 510, one conductive elastic part is provided. It is preferable that three or more guides 400 neighbor to 100. As described above, the guide part 400 is configured to smoothly connect the terminal 2 of the device under test 1 and the conductive part 510 so as to increase the inspection accuracy of the device under test 1.
한편, 도전성 패드(500)는 도전성 탄성부(100)의 상부에 구비되며, 가이드부(400)에 지지되도록 이루어진다. 이러한 도전성 패드(500)는 도전부(510)와 시트부(520)를 포함할 수 있다.On the other hand, the conductive pad 500 is provided on the conductive elastic portion 100, it is made to be supported by the guide portion 400. The conductive pad 500 may include a conductive portion 510 and a sheet portion 520.
도전부(510)는 도전성 탄성부(100)의 상면과 대응되는 형상을 이루며, 도전성 탄성부(100)의 상면에 배치된다. 이러한 도전부(510)는 피검사 디바이스(1)의 단자(2)로부터 전달되는 전기적 신호를 도전성 탄성부(100)로 전달하도록 이루어진다. 이때, 도전부(510)는 도전성 탄성부(100)의 상면과 상호 부착될 수 있으나, 이에 한정되는 것은 아니다.The conductive portion 510 has a shape corresponding to the upper surface of the conductive elastic portion 100 and is disposed on the upper surface of the conductive elastic portion 100. The conductive portion 510 is configured to transmit an electrical signal transmitted from the terminal 2 of the device under test 1 to the conductive elastic portion 100. At this time, the conductive portion 510 may be attached to the upper surface of the conductive elastic portion 100, but is not limited thereto.
이와 같이, 도전부(510)는 전기적 신호의 전달이 가능한 도전성 소재로 이루어진다. 예로, 도전부(510)는 절연성 탄성 물질 내에 다수의 도전성 입자가 상하방향으로 배열되는 구조를 갖는 도전성 파우더가 될 수도 있다. 이러한 도전성 파우더로 이루어진 도전부(510)는 피검사 디바이스(1)의 단자(2)가 도전부(510)를 가압할 시, 탄성 변형이 가능하도록 이루어짐에 따라 도전부(510)에 의해 피검사 디바이스(1)의 단자(2)가 손상되는 것이 방지될 수 있다. 이러한 도전부(510)는 도전성 파우더로만 한정되지 않으며, 전기적 신호의 전달이 가능한 도전성 소재라면 어느 것이라도 사용 가능하다. 즉, 도전부는 금속이 될 수도 있음은 물론이다.As such, the conductive part 510 is made of a conductive material capable of transmitting an electrical signal. For example, the conductive portion 510 may be a conductive powder having a structure in which a plurality of conductive particles are arranged in the vertical elastic direction in the insulating elastic material. The conductive portion 510 made of such conductive powder is inspected by the conductive portion 510 as the terminal 2 of the device under test 1 presses the conductive portion 510 so that elastic deformation is possible. Damage to the terminal 2 of the device 1 can be prevented. The conductive part 510 is not limited to the conductive powder, and any conductive material capable of transmitting an electrical signal may be used. That is, of course, the conductive portion may be a metal.
시트부(520)는 도전부(510)와 연결되며 도전부(510)를 지지하도록 이루어진다. 이러한 시트부(520)는 가이드부(400)에 지지 고정됨에 따라 도전부(510)는 도전성 탄성부(100)의 상면에 안정적으로 위치될 수 있다.The sheet part 520 is connected to the conductive part 510 and made to support the conductive part 510. As the sheet part 520 is supported and fixed to the guide part 400, the conductive part 510 may be stably positioned on an upper surface of the conductive elastic part 100.
여기서 시트부(520)에는 가이드부(400)의 횡단면과 대응되는 형태의 결합홀(521)이 형성되고, 결합홀(521)은 가이드부(400)에 삽입 결합됨으로써, 도전성 패드(500)는 가이드부(400)에 견고히 지지될 수 있다. 이와 같은, 도전부(510)와 시트부(520)를 갖는 도전성 패드(500)는 가이드부(400)와 선택적인 탈착이 가능하도록 이루어진다.Herein, the coupling part 520 is formed in the seat part 520 corresponding to the cross section of the guide part 400, and the coupling hole 521 is inserted into and coupled to the guide part 400. The guide unit 400 may be firmly supported. As such, the conductive pad 500 having the conductive portion 510 and the sheet portion 520 may be selectively detachable from the guide portion 400.
따라서, 피검사 디바이스(1)의 반복적인 검사 과정에서 테스트용 소켓(1000)의 상부에 구비된 도전부(510)가 손상될 경우, 사용자는 가이드부(400)와 탈착 가능하도록 이루어진 도전성 패드(500)만을 선택적으로 교체함으로써, 테스트용 소켓(1000)의 수명을 연장시킬 수 있다. 이러한 도전성 패드(500)는 탈착이 간편하도록 이루어져 사용자는 도전성 패드(500)의 선택적인 교체를 통해 테스트용 소켓(1000)을 지속적으로 사용할 수 있다.Therefore, when the conductive part 510 provided on the upper part of the test socket 1000 is damaged in the repetitive inspection process of the device under test 1, the user may attach the conductive pad to the guide part 400 to be detachable. By selectively replacing only 500, the life of the test socket 1000 can be extended. The conductive pad 500 is made to be easily removable, the user can continue to use the test socket 1000 through the selective replacement of the conductive pad 500.
도 7은 본 발명의 제2 실시예에 따른 테스트용 소켓의 단면 예시도로, 도 3 내지 도 6에 도시된 부재들과 동일한 부재번호에 의해 지칭되는 부재들은 동일한 구성 및 기능을 가지는 것으로서, 그들 각각에 대한 상세한 설명은 생략하기로 한다.FIG. 7 is a cross-sectional view illustrating a test socket according to a second embodiment of the present invention. Members referred to by the same reference numerals as the members shown in FIGS. 3 to 6 have the same configuration and function, respectively. Detailed description thereof will be omitted.
도 7을 참고하면, 가이드부(400)의 상단부에는 경사부(410)가 더 형성될 수 있다. 이러한 경사부(410)는 일직선 형태의 가이드부(400)로부터 소정의 경사를 이루게 된다. 예컨대, 가이드부(400)의 횡단면이 원형인 경우에 가이드부(400)의 상단부에 형성된 경사부(410)는 테이퍼(taper) 형태로 이루어질 수 있다.Referring to FIG. 7, the inclined portion 410 may be further formed at the upper end of the guide portion 400. The inclined portion 410 is a predetermined inclination from the guide portion 400 of the straight form. For example, when the cross section of the guide part 400 is circular, the inclined part 410 formed at the upper end of the guide part 400 may have a taper shape.
이와 같은, 경사부(410)는 얼라인이 맞혀지지 않은 상태로 피검사 디바이스(1)의 단자(2)가 하강할 경우, 피검사 디바이스(1)의 단자(2)를 도전부(510)의 상면 중앙으로 부드럽게 안내되도록 한다.When the terminal 2 of the device under test 1 descends while the inclined portion 410 is not aligned, the inclined portion 410 moves the terminal 2 of the device under test 1 to the conductive portion 510. Make sure to guide gently to the center of the upper surface of the.
또한, 제2 삽입홀(302)의 하부에도 검사장치(3)의 패드(4) 삽입이 손쉽게 이루어지도록 경사를 이루는 확장부(320)가 더 형성될 수도 있다. 이러한 확장부(320)는 제2 삽입홀(302)의 크기보다 더 크게 형성되어 검사장치(3)의 패드(4)는 제2 삽입홀(302)에 손쉽게 삽입될 수 있다.In addition, the lower portion of the second insertion hole 302 may be further formed to be inclined expansion part 320 to facilitate the insertion of the pad (4) of the inspection device (3). The expansion part 320 is formed larger than the size of the second insertion hole 302 so that the pad 4 of the inspection apparatus 3 can be easily inserted into the second insertion hole 302.
도 8은 본 발명의 제3 실시예에 따른 테스트용 소켓의 평면도로, 도 3 내지 도 6에 도시된 부재들과 동일한 부재번호에 의해 지칭되는 부재들은 동일한 구성 및 기능을 가지는 것으로서, 그들 각각에 대한 상세한 설명은 생략하기로 한다.FIG. 8 is a plan view of a test socket according to a third exemplary embodiment of the present invention, wherein members referred to by the same reference numerals as the members shown in FIGS. 3 to 6 have the same configuration and function, respectively. Detailed description thereof will be omitted.
도 8을 참고하면, 가이드부는 횡단면 형상이 원형으로만 한정되지 않고 다양한 형태로 이루어진 것을 보여준다.Referring to Figure 8, the guide portion is shown that the cross-sectional shape is not limited to a circular shape made of various forms.
도 8의 (a)는 가이드부(401)의 횡단면 형상이 사각 형태를 이루는 것이고, 도 8의 (b)는 가이드부(402)의 횡단면 형상이 원호 형태를 이루어진 것이며, 도 8의 (c)는 가이드부(403)의 횡단면 형상이 중공(中孔)이 형성된 원 형태를 이루는 것이다. 여기서 시트부(520)에 형성된 결합홀(521)은 가이드부(401, 402, 403)의 횡단면에 대응되는 형태로 형성된다.8 (a) is a cross-sectional shape of the guide portion 401 is a rectangular shape, Figure 8 (b) is a cross-sectional shape of the guide portion 402 is an arc shape, Figure 8 (c) The cross-sectional shape of the guide portion 403 forms a circle in which a hollow is formed. Herein, the coupling hole 521 formed in the sheet part 520 is formed in a shape corresponding to the cross section of the guide parts 401, 402, and 403.
예를 들어, 가이드부(402)의 횡단면 형상이 도 8의 (b)와 같이 원호 형태를 이루는 경우에는 가이드부(402)의 횡단면 형상이 원형, 사각형 등으로 이루어진 가이드부보다 가이드부(402)에 지지되는 결합홀(521)의 지지부위가 더 넓어지기에 도전성 패드(500)는 가이드부(402)에 안정적으로 지지 고정될 수 있다. 여기서 가이드부(402)의 횡단면 형상이 원호 형태를 이루는 경우에는 1개의 도전성 탄성부(100)에 대해 2개의 가이드부(402)가 이웃하도록 배치된 상태에서도 피검사 디바이스(1)의 단자(2)를 도전부(510)의 상면 중앙으로 안정적으로 안내할 수 있다.For example, when the cross-sectional shape of the guide part 402 is in the shape of an arc as shown in FIG. The conductive pad 500 may be stably supported and fixed to the guide portion 402 because the support portion of the coupling hole 521 is widened. In this case, when the cross-sectional shape of the guide part 402 forms an arc shape, the terminal 2 of the device under test 1 even when two guide parts 402 are arranged adjacent to one conductive elastic part 100. ) Can be stably guided to the center of the upper surface of the conductive portion 510.
또한, 가이드부(403)는 도 8의 (c)와 같이 중공이 형성된 원 형태를 이룰 수도 있다. 이러한 가이드부(403)의 중공 내부에는 도전성 탄성부(100)가 위치될 수 있다. 즉, 가이드부(403)가 중공이 형성된 원 형태로 이루어질 경우는, 가이드부(402)의 횡단면 형상이 원호 형태를 이루는 경우보다도 결합홀(521)의 지지부위가 더 넓어지게 되어 도전성 패드(500)는 가이드부(403)에 더욱 견고히 지지 고정될 수 있다.In addition, the guide part 403 may form a circular shape in which a hollow is formed as shown in FIG. 8 (c). The conductive elastic part 100 may be located in the hollow of the guide part 403. That is, when the guide part 403 is formed in a circular shape having a hollow, the support portion of the coupling hole 521 is wider than the case where the cross-sectional shape of the guide part 402 is formed in an arc shape, so that the conductive pad 500 ) May be more firmly supported and fixed to the guide portion 403.
이와 같이, 절연 지지부(300)로부터 돌출된 가이드부의 횡단면 형상은 특정 형상으로 한정되지 않으며, 다양한 형상으로 이루어질 수 있음은 물론이다.As such, the cross-sectional shape of the guide part protruding from the insulating support part 300 is not limited to a specific shape, but may be formed in various shapes.
다만, 이는 본 발명의 바람직한 일실시예에 불과할 뿐, 본 발명의 권리 범위가 이러한 실시예의 기재 범위에 의하여 제한되는 것은 아니다.However, this is only a preferred embodiment of the present invention, the scope of the present invention is not limited by the scope of these embodiments.
전술한 본 발명의 설명은 예시를 위한 것이며, 본 발명이 속하는 기술분야의 통상의 지식을 가진 자는 본 발명의 기술적 사상이나 필수적인 특징을 변경하지 않고서 다른 구체적인 형태로 쉽게 변형이 가능하다는 것을 이해할 수 있을 것이다. 그러므로 이상에서 기술한 실시예들은 모든 면에서 예시적인 것이며 한정적이 아닌 것으로 이해해야만 한다. 예를 들어, 단일형으로 설명되어 있는 각 구성 요소는 분산되어 실시될 수도 있으며, 마찬가지로 분산된 것으로 설명되어 있는 구성 요소들도 결합된 형태로 실시될 수 있다.The foregoing description of the present invention is intended for illustration, and it will be understood by those skilled in the art that the present invention may be easily modified in other specific forms without changing the technical spirit or essential features of the present invention. will be. Therefore, it should be understood that the embodiments described above are exemplary in all respects and not restrictive. For example, each component described as a single type may be implemented in a distributed manner, and similarly, components described as distributed may be implemented in a combined form.
본 발명의 범위는 후술하는 특허청구범위에 의하여 나타내어지며, 특허청구범위의 의미 및 범위 그리고 그 균등 개념으로부터 도출되는 모든 변경 또는 변형된 형태가 본 발명의 범위에 포함되는 것으로 해석되어야 한다.The scope of the present invention is represented by the following claims, and it should be construed that all changes or modifications derived from the meaning and scope of the claims and their equivalents are included in the scope of the present invention.
부호의 설명Explanation of the sign
100: 도전성 탄성부 110: 상부 도전성 탄성부100: conductive elastic portion 110: upper conductive elastic portion
120: 하부 도전성 탄성부 200: 탄성 지지부120: lower conductive elastic portion 200: elastic support portion
300: 절연 지지부 400, 401, 402, 403: 가이드부300: insulation support part 400, 401, 402, 403: guide part
410: 경사부 500: 도전성 패드410: inclined portion 500: conductive pad
1000: 테스트용 소켓1000: test socket

Claims (9)

  1. 피검사 디바이스의 단자와 대응되는 위치에 배치되며, 절연성 탄성 물질 내에 다수의 도전성 입자가 상하방향을 따라 배열되는 복수의 도전성 탄성부;A plurality of conductive elastic parts disposed at a position corresponding to the terminals of the device under test, and having a plurality of conductive particles arranged in the insulating elastic material along the vertical direction;
    상기 도전성 탄성부를 감싸며 상기 도전성 탄성부를 지지하는 탄성 지지부;An elastic support part surrounding the conductive elastic part and supporting the conductive elastic part;
    상기 도전성 탄성부의 하부가 삽입 지지되는 제1 삽입홀이 형성되고, 상기 제1 삽입홀의 하부에 위치되며 검사장치의 패드가 삽입되는 제2 삽입홀이 형성된 절연 지지부;An insulation support having a first insertion hole through which the lower portion of the conductive elastic portion is inserted and supported, and having a second insertion hole positioned below the first insertion hole and into which a pad of the inspection apparatus is inserted;
    상기 절연 지지부의 상면과 결합되며, 상기 피검사 디바이스의 단자 이동을 안내하는 복수의 가이드부; 및A plurality of guide parts coupled to an upper surface of the insulating support part and configured to guide terminal movement of the device under test; And
    상기 도전성 탄성부의 상면에 도전부가 배치되도록 상기 가이드부에 지지 고정되며, 상기 가이드부와 탈착 가능하도록 이루어진 도전성 패드;를 포함하는 테스트용 소켓.And a conductive pad supported and fixed to the guide part so that the conductive part is disposed on an upper surface of the conductive elastic part and detachable from the guide part.
  2. 제1항에 있어서,The method of claim 1,
    상기 도전성 탄성부는, 하면이 상면보다 지름이 크게 형성된 원뿔대 형상을 이루며, 하부가 상기 제1 삽입홀에 삽입 지지되는 하부 도전성 탄성부;와The conductive elastic portion, the lower surface is formed in the shape of a truncated cone having a larger diameter than the upper surface, the lower conductive elastic portion is inserted into the first insertion hole; and
    상기 하부 도전성 탄성부의 상면을 기준으로 대칭을 이루며 연결 형성된 상부 도전성 탄성부;를 포함하는 것을 특징으로 하는 테스트용 소켓.And an upper conductive elastic part formed symmetrically with respect to the upper surface of the lower conductive elastic part.
  3. 제1항에 있어서,The method of claim 1,
    상기 제1 삽입홀은 상기 제2 삽입홀보다 더 크게 형성된 것을 특징으로 하는 테스트용 소켓.The first insertion hole is a test socket, characterized in that formed larger than the second insertion hole.
  4. 제1항에 있어서,The method of claim 1,
    상기 가이드부는 절연 소재로 이루어진 것을 특징으로 하는 테스트용 소켓.The guide socket for testing, characterized in that made of an insulating material.
  5. 제1항에 있어서,The method of claim 1,
    상기 가이드부의 상단부는 상기 도전성 패드의 상면보다 상부에 위치되어 상기 피검사 디바이스의 단자를 상기 도전부의 상면으로 안내하도록 이루어진 것을 특징으로 하는 테스트용 소켓.And an upper end portion of the guide portion positioned above the upper surface of the conductive pad to guide the terminal of the device under test to the upper surface of the conductive portion.
  6. 제1항에 있어서,The method of claim 1,
    상기 가이드부의 상부에는 경사부가 형성된 것을 특징으로 하는 테스트용 소켓.Test socket, characterized in that the inclined portion formed on the guide portion.
  7. 제1항에 있어서,The method of claim 1,
    1개의 상기 도전성 탄성부에는 2개 이상의 상기 가이드부가 이웃하도록 위치된 것을 특징으로 하는 테스트용 소켓.Test socket, characterized in that two or more of the guide portion is located adjacent to one of the conductive elastic portion.
  8. 제1항에 있어서,The method of claim 1,
    상기 도전성 패드는, 상기 도전성 탄성부의 상면과 대응되는 형상을 이루며 상기 도전성 탄성부의 상부에 탈착 가능하도록 이루어진 복수개의 도전부;와The conductive pad may include a plurality of conductive portions formed in a shape corresponding to an upper surface of the conductive elastic portion and detachable from an upper portion of the conductive elastic portion.
    상기 도전부와 연결형성되며 상기 도전부를 상기 가이드부에 지지고정하는 시트부;를 포함하며, 상기 시트부는 상기 가이드부와 탈착 가능하도록 이루어진 것을 특징으로 하는 테스트용 소켓.And a sheet portion connected to the conductive portion and supporting the conductive portion to fix the conductive portion to the guide portion, wherein the sheet portion is detachable from the guide portion.
  9. 제1항에 있어서,The method of claim 1,
    상기 도전부는, 금속 또는 도전성 파우더로 이루어진 것을 특징으로 하는 테스트용 소켓.The conductive part is a test socket, characterized in that made of metal or conductive powder.
PCT/KR2016/008366 2015-08-04 2016-07-29 Test socket WO2017023037A1 (en)

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