TW201706608A - Socket for electrical test - Google Patents
Socket for electrical test Download PDFInfo
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- TW201706608A TW201706608A TW105124403A TW105124403A TW201706608A TW 201706608 A TW201706608 A TW 201706608A TW 105124403 A TW105124403 A TW 105124403A TW 105124403 A TW105124403 A TW 105124403A TW 201706608 A TW201706608 A TW 201706608A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
Abstract
Description
本發明係關於一種測試插座，更具體而言係關於一種可拆卸導電墊的測試插座。The present invention relates to a test socket, and more particularly to a test socket for a detachable conductive pad.
一般而言，為了檢測測試目標裝置的電特性，該測試目標裝置必須穩定地電連接到一台測試設備上。如上所述，測試插座通常用於連接測試目標裝置與測試設備。In general, in order to detect the electrical characteristics of the test target device, the test target device must be stably electrically connected to a test device. As mentioned above, test sockets are typically used to connect test target devices to test equipment.
測試插座被配置成將測試目標裝置的端子連接至測試設備的襯墊，使得能夠在測試目標裝置與測試設備之間雙向交換電信號。這種測試插座根據接觸工具分為針型測試插座和橡膠型測試插座，針型測試插座使用彈簧式頂針，而橡膠型測試插座使用導電彈性部分。The test socket is configured to connect the terminals of the test target device to the pads of the test device such that electrical signals can be exchanged bidirectionally between the test target device and the test device. The test socket is classified into a needle type test socket and a rubber type test socket according to the contact tool, a needle type test socket uses a spring type thimble, and a rubber type test socket uses a conductive elastic portion.
圖1為示出具有彈簧式頂針的現有測試插座的示意圖。在韓國專利公開號10-2011-0065047（現有技術文獻1）中公開的彈簧式頂針21內設有彈簧23，因此能夠有效緩衝當檢測測試目標裝置的電特性時所可能發生的機械衝擊。Figure 1 is a schematic diagram showing an existing test socket with a spring loaded ejector pin. The spring type ejector 21 disclosed in the Korean Patent Publication No. 10-2011-0065047 (Prior Art Document 1) is provided with a spring 23, so that it is possible to effectively buffer the mechanical shock that may occur when detecting the electrical characteristics of the test target device.
然而，設有彈簧式頂針21的測試插座20具有降低電信號傳輸效果的問題。更具體而言，來自測試目標裝置1的電信號透過接觸稍22、彈簧23及接觸尖端24被傳輸到測試設備3。此時，在流經彈簧23的電流沿彈簧23的螺旋方向流動的過程中電路徑變長，導致電阻增加，從而帶來降低電信號特性的問題。因此，無法正確實現電檢查測試目標裝置1。However, the test socket 20 provided with the spring type ejector pin 21 has a problem of reducing the electric signal transmission effect. More specifically, the electrical signal from the test target device 1 is transmitted to the test device 3 through the contact tip 22, the spring 23 and the contact tip 24. At this time, in the process in which the current flowing through the spring 23 flows in the spiral direction of the spring 23, the electric path becomes long, resulting in an increase in electric resistance, thereby causing a problem of lowering the characteristics of the electric signal. Therefore, the electrical inspection test target device 1 cannot be correctly implemented.
並且，當測試目標裝置1的端子2不能被正確引導到接觸稍22的中心時，測試目標裝置1的端子2有可能被接觸稍22損傷。Also, when the terminal 2 of the test target device 1 cannot be correctly guided to the center of the contact tip 22, the terminal 2 of the test target device 1 may be slightly damaged by the contact 22.
因此，對一種能夠防止測試目標裝置1的端子2損傷且可順利電連接測試目標裝置1和測試設備3的、具有導電彈性部分的測試插座的需求日益增多。Therefore, there is an increasing demand for a test socket having a conductive elastic portion capable of preventing damage to the terminal 2 of the test target device 1 and smoothly electrically connecting the test target device 1 and the test device 3.
圖2為示出具有導電彈性部分的現有測試插座的示意圖。2 is a schematic view showing an existing test socket having a conductive elastic portion.
上述具有導電彈性部分31的測試插座30與測試目標裝置1的端子2接觸時，導電彈性部分31發生彈性變形，從而使得測試目標裝置1和測試設備3電連接。即，導電彈性部分31是透過在絕緣彈性體中包含複數個導電粒子32而成的，因此，當測試目標裝置1的端子2給導電彈性部分31加壓時，則導電彈性部分31發生壓縮變形，導致導電粒子32電連接，從而使得測試目標裝置1和測試設備3電連接。When the test socket 30 having the conductive elastic portion 31 is in contact with the terminal 2 of the test target device 1, the conductive elastic portion 31 is elastically deformed, thereby electrically connecting the test target device 1 and the test device 3. That is, the conductive elastic portion 31 is formed by including a plurality of conductive particles 32 in the insulating elastic body. Therefore, when the terminal 2 of the test target device 1 pressurizes the conductive elastic portion 31, the conductive elastic portion 31 undergoes compression deformation. The conductive particles 32 are electrically connected, thereby electrically connecting the test target device 1 and the test device 3.
但具有導電彈性部分31的測試插座30存在如下問題：由於反覆測試過程導致損傷導電彈性部分31的上面，因此測試插座30的使用壽命較短。However, the test socket 30 having the conductive elastic portion 31 has a problem that the test socket 30 has a short life due to damage to the upper surface of the conductive elastic portion 31 due to the repeated test process.
因此，為了延長具有導電彈性部分31的測試插座30的使用壽命，需要進行各種研究開發。Therefore, in order to extend the service life of the test socket 30 having the conductive elastic portion 31, various research and development is required.
現有技術文獻 （現有技術文獻1）韓國專利公開號10-2011-0065047（2011.6.15）。Prior Art Document (Prior Art Document 1) Korean Patent Publication No. 10-2011-0065047 (2011.6.15).
發明要解決的問題Problems to be solved by the invention
為了解決上述問題，本發明的目的在於提供一種可拆卸導電墊的測試插座。In order to solve the above problems, it is an object of the present invention to provide a test socket with a detachable conductive pad.
用於解決問題的方案Solution to solve the problem
為了達到上述目的，本發明的一個實施例提供一種測試插座，該測試插座包括：複數個導電彈性部分，設置在與測試目標裝置的端子對應的位置，透過在絕緣彈性體中上下方向排列複數個導電粒子而成；彈性支撐部分，包圍該導電彈性部分且支撐該導電彈性部分；絕緣支撐部分，形成有第一插入孔和第二插入孔，該第一插入孔提供該導電彈性部分的下部插入並支撐，該第二插入孔位於該第一插入孔的下部且提供測試設備的襯墊插入；複數個導向部分，與該絕緣支撐部分的上面結合，引導該測試目標裝置的端子的移動；及導電墊，由該導向部分支撐並固定，使得導電部分設置在該導電彈性部分的上面，與該導向部分可拆卸連接。In order to achieve the above object, an embodiment of the present invention provides a test socket including: a plurality of conductive elastic portions disposed at positions corresponding to terminals of the test target device, and arranged in a plurality of upper and lower directions in the insulating elastic body Conductive particles; an elastic supporting portion surrounding the conductive elastic portion and supporting the conductive elastic portion; and an insulating supporting portion formed with a first insertion hole and a second insertion hole, the first insertion hole providing a lower insertion of the conductive elastic portion And supporting, the second insertion hole is located at a lower portion of the first insertion hole and provides a gasket insertion of the test device; a plurality of guiding portions are combined with the upper surface of the insulating support portion to guide the movement of the terminal of the test target device; The conductive pad is supported and fixed by the guiding portion such that the conductive portion is disposed above the conductive elastic portion and detachably coupled to the guiding portion.
在本發明的一個實施例中，該導電彈性部分可以包括：下導電彈性部分，呈下面直徑大於上面直徑的截頭圓錐形狀，該下導電彈性部分的下面被插入並支撐在該第一插入孔；及上導電彈性部分，以該下導電彈性部分的上面為基準呈對稱狀且連接形成。In an embodiment of the present invention, the conductive elastic portion may include: a lower conductive elastic portion having a frustoconical shape having a lower diameter larger than an upper diameter, the lower surface of the lower conductive elastic portion being inserted and supported at the first insertion hole And the upper conductive elastic portion is formed in a symmetrical shape and connected with respect to the upper surface of the lower conductive elastic portion.
在本發明的一個實施例中，該第一插入孔可以形成大於該第二插入孔。In an embodiment of the invention, the first insertion hole may be formed larger than the second insertion hole.
在本發明的一個實施例中，該導向部分可以由絕緣材料製成。In an embodiment of the invention, the guiding portion may be made of an insulating material.
在本發明的一個實施例中，該導向部分的上端部位置可以高於該導電墊的上面，以便向該導電部分的上面引導該測試目標裝置的端子。In an embodiment of the invention, the upper end portion of the guiding portion may be positioned higher than the upper surface of the conductive pad to guide the terminal of the test target device to the upper surface of the conductive portion.
在本發明的一個實施例中，該導向部分的上部可以形成有傾斜部分。In an embodiment of the invention, the upper portion of the guiding portion may be formed with an inclined portion.
在本發明的一個實施例中，一個該導電彈性部分可以與至少兩個該導向部分相鄰地形成。In an embodiment of the invention, one of the electrically conductive elastic portions may be formed adjacent to at least two of the guiding portions.
在本發明的一個實施例中，該導電墊可以包括：複數個導電部分，呈與該導電彈性部分的上面對應的形狀，與該導電彈性部分的上部可拆卸連接；及薄片部，與該導電部分連接形成，將該導電部分支撐並固定在該導向部分，且該薄片部可以與該導向部分可拆卸連接。In an embodiment of the present invention, the conductive pad may include: a plurality of conductive portions having a shape corresponding to an upper surface of the conductive elastic portion, detachably connected to an upper portion of the conductive elastic portion; and a thin portion, and the conductive portion A partial connection is formed, the conductive portion is supported and fixed to the guide portion, and the sheet portion is detachably coupled to the guide portion.
在本發明的一個實施例中，該導電部分可以由金屬或導電粉末形成。In an embodiment of the invention, the conductive portion may be formed of a metal or a conductive powder.
發明的效果Effect of the invention
如上所述的根據本發明的測試插座具有如下效果：The test socket according to the present invention as described above has the following effects:
根據本發明，與測試目標裝置的端子接觸的導電墊從導向部分可拆卸，因此在測試插座的反覆測試過程中導電墊受到損傷時，用戶可選擇性地更換導電墊。從而，只要更換導電墊，就能夠延長測試插座的使用壽命。According to the present invention, the conductive pad in contact with the terminal of the test target device is detachable from the guide portion, so that the user can selectively replace the conductive pad when the conductive pad is damaged during the repeated test of the test socket. Thus, the life of the test socket can be extended by simply replacing the conductive pads.
根據本發明，導向部分被配置成引導與導電墊的上面接觸的測試目標裝置的端子移動。即，導向部分引導測試目標裝置的端子移動，使得測試目標裝置的端子給導電墊的導電部分的中心加壓。According to the invention, the guiding portion is configured to guide the movement of the terminal of the test target device in contact with the upper surface of the conductive pad. That is, the guiding portion guides the movement of the terminal of the test target device such that the terminal of the test target device pressurizes the center of the conductive portion of the conductive pad.
在此，至少兩個導向部分與一個導電彈性部分相鄰設置，以便向導電部分的正確位置引導測試目標裝置的端子。從而，測試目標裝置與測試設備能夠穩定地電連接。Here, at least two guiding portions are disposed adjacent to one of the conductive elastic portions to guide the terminals of the test target device to the correct position of the conductive portion. Thereby, the test target device and the test device can be stably electrically connected.
根據本發明，彈性支撐部分形成包圍導電彈性部分的外側面，因此，當彈性支撐部分被測試目標裝置的端子壓縮時，能夠防止包含於彈性支撐部分內部的導電粒子向彈性支撐部分的外部脫離。According to the invention, the elastic supporting portion forms the outer side surface surrounding the conductive elastic portion, and therefore, when the elastic supporting portion is compressed by the terminal of the test target device, the conductive particles contained inside the elastic supporting portion can be prevented from being detached to the outside of the elastic supporting portion.
根據本發明，導電彈性部分由對稱設置的上導電彈性部分和下導電彈性部分構成。當上述導電彈性部分被壓縮時，上導電彈性部分和下導電彈性部分的境界部分的直徑變大，從而將來自測試目標裝置的電信號能夠被順利傳輸到測試設備。因此，可以正確測定測試目標裝置的電信號。According to the invention, the electrically conductive elastic portion is composed of a symmetrically disposed upper conductive elastic portion and a lower conductive elastic portion. When the above-mentioned conductive elastic portion is compressed, the diameter of the boundary portion of the upper conductive elastic portion and the lower conductive elastic portion becomes large, so that an electric signal from the test target device can be smoothly transmitted to the test device. Therefore, the electrical signal of the test target device can be correctly measured.
本發明的效果並非限定於該效果，應當理解，包括從本發明的詳細的說明或申請專利範圍中記載的發明的結構中推論出的所有效果。The effects of the present invention are not limited to the effects, and it should be understood that all the effects deduced from the structure of the invention described in the detailed description of the invention or the scope of the invention are included.
下面將參照附圖更充分地描述本發明。然而，本發明可以以許多不同的形式來實現，並且不應被解釋為限於在此所闡述的實施例。在附圖中，為了說明的簡明，與描述無關的部分被省略，並且相同的標號始終指示相同的元件。The invention will be described more fully hereinafter with reference to the accompanying drawings. However, the invention may be embodied in many different forms and should not be construed as being limited to the embodiments set forth herein. In the drawings, parts that are not related to the description are omitted for the sake of simplicity of the description, and the same reference numerals are used to refer to the same elements.
在整個說明書中，某一部分與另一部分相“連接”時，不僅包括直接連接的情況，還包括在中間具備其他元件間接連接的情況。並且， 應該理解的是，當術語“包括”和/或“包括…的”或“包含”和/或“包含…的”被用在本說明書中時，如果沒有特別相反的記載，指定陳述的構成要素的存在，但並不排除一個或複數個其他構成要素的存在或添加。Throughout the specification, when a part is "connected" to another part, it includes not only the case of direct connection but also the case where other elements are indirectly connected in the middle. Also, it should be understood that when the terms "comprises" and/or "includes" or "includes" and/or "includes" are used in the specification, unless otherwise specified, The existence of constituent elements, but does not exclude the existence or addition of one or more other constituent elements.
下面將參照附圖詳細說明本發明的實施例。Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
圖3為示意性地示出根據本發明的第一實施例的測試插座的透視圖，圖4為根據本發明的第一實施例的測試插座的截面示意圖，圖5為根據本發明的第一實施例的壓縮的測試插座的工作狀態圖，圖6為根據本發明的第一實施例的測試插座的平面圖。3 is a perspective view schematically showing a test socket according to a first embodiment of the present invention, FIG. 4 is a schematic cross-sectional view of a test socket according to a first embodiment of the present invention, and FIG. 5 is a first view according to the present invention. FIG. 6 is a plan view showing a test socket of a first embodiment of the present invention. FIG.
如圖3至圖6所示，測試插座1000用作使待測試的測試目標裝置1的端子2和測試設備3的襯墊4電接觸的中間構件。As shown in FIGS. 3 to 6, the test socket 1000 serves as an intermediate member for electrically contacting the terminal 2 of the test target device 1 to be tested and the gasket 4 of the test device 3.
上述測試插座1000設置在測試目標裝置1與測試設備3之間，上述測試插座1000的上部直接或間接地與測試目標裝置1的端子2 接觸，上述測試插座1000的下部直接或間接地與測試設備3的襯墊4接觸，以對測試目標裝置1進行測試。The test socket 1000 is disposed between the test target device 1 and the test device 3, and the upper portion of the test socket 1000 is directly or indirectly in contact with the terminal 2 of the test target device 1, and the lower portion of the test socket 1000 is directly or indirectly connected to the test device. The pad 4 of 3 is in contact to test the test target device 1.
在此，以呈二維陣列排列的球柵陣列（Ball Grid Array，BGA）的錫珠形式為例說明測試目標裝置1的端子2。Here, the terminal 2 of the test target device 1 will be described by taking the form of a tin bead of a Ball Grid Array (BGA) arranged in a two-dimensional array as an example.
參照圖3至圖5，測試插座1000可以包括導電彈性部分100、彈性支撐部分200、絕緣支撐部分300、導向部分400及導電墊500。Referring to FIGS. 3 through 5, the test socket 1000 may include a conductive elastic portion 100, an elastic support portion 200, an insulating support portion 300, a guide portion 400, and a conductive pad 500.
導電彈性部分100可以由上導電彈性部分110和下導電彈性部分120構成。在此，上導電彈性部分110和下導電彈性部分120成一對，且上導電彈性部分110和下導電彈性部分120可以一體成型。The conductive elastic portion 100 may be composed of an upper conductive elastic portion 110 and a lower conductive elastic portion 120. Here, the upper conductive elastic portion 110 and the lower conductive elastic portion 120 are formed in a pair, and the upper conductive elastic portion 110 and the lower conductive elastic portion 120 may be integrally formed.
上述上導電彈性部分110和下導電彈性部分120可以呈截頭圓錐形狀。即，下導電彈性部分120的下面直徑D1可以形成大於下導電彈性部分120的上面直徑D2，上導電彈性部分110的下面直徑形成小於上導電彈性部分110的上面直徑。此時，下導電彈性部分120的上面直徑和上導電彈性部分110的下面直徑可以具有相同的直徑並一體連接。The upper conductive elastic portion 110 and the lower conductive elastic portion 120 may have a frustoconical shape. That is, the lower diameter D1 of the lower conductive elastic portion 120 may be formed larger than the upper diameter D2 of the lower conductive elastic portion 120, and the lower diameter of the upper conductive elastic portion 110 may be formed smaller than the upper diameter of the upper conductive elastic portion 110. At this time, the upper diameter of the lower conductive elastic portion 120 and the lower diameter of the upper conductive elastic portion 110 may have the same diameter and be integrally connected.
換句話說，成一對的上導電彈性部分110和下導電彈性部分120以下導電彈性部分120的上面為基準呈對稱狀且連接形成。即，上導電彈性部分110和下導電彈性部分120相遇的境界部位凹陷形成。In other words, the pair of upper conductive elastic portions 110 and the lower conductive elastic portion 120 are symmetrically formed and connected to each other on the basis of the upper surface of the conductive elastic portion 120. That is, the boundary portion where the upper conductive elastic portion 110 and the lower conductive elastic portion 120 meet is recessed.
更具體而言，導電彈性部分100的上面和下面的直徑形成大於上導電彈性部分110和下導電彈性部分120相遇的境界部位的直徑。因此，導電彈性部分100的上面與導電墊500接觸的面積可以較寬地形成，導電彈性部分100的下面與測試設備3的襯墊4接觸的面積可以較寬地形成。More specifically, the diameters of the upper and lower faces of the conductive elastic portion 100 are formed larger than the diameter of the boundary portion where the upper conductive elastic portion 110 and the lower conductive elastic portion 120 meet. Therefore, the area of the upper surface of the conductive elastic portion 100 in contact with the conductive pad 500 can be formed wider, and the area under the conductive elastic portion 100 in contact with the spacer 4 of the test apparatus 3 can be formed wider.
如上所述，因為導電彈性部分100與導電墊500和測試設備3的襯墊4接觸的面積較寬地形成，由此能夠有效傳輸來自導電墊500和測試設備3的襯墊4的電信號。As described above, since the area in which the conductive elastic portion 100 is in contact with the conductive pad 500 and the spacer 4 of the test apparatus 3 is formed wider, the electrical signals from the conductive pad 500 and the spacer 4 of the test apparatus 3 can be efficiently transmitted.
參照圖5，上導電彈性部分110和下導電彈性部分120相遇的境界部位凹陷形成，從而，當導電彈性部分100被測試目標裝置1的端子2壓縮時，導電彈性部分100的凹陷部分的直徑變大，同時，導電彈性部分100整體上彈性變形為圓柱形狀，從而向測試設備3穩定地傳輸來自測試目標裝置1的電信號。Referring to Fig. 5, the boundary portion where the upper conductive elastic portion 110 and the lower conductive elastic portion 120 meet is recessed, so that when the conductive elastic portion 100 is compressed by the terminal 2 of the test target device 1, the diameter of the concave portion of the conductive elastic portion 100 becomes At the same time, the conductive elastic portion 100 is elastically deformed as a whole into a cylindrical shape, thereby stably transmitting an electric signal from the test target device 1 to the test apparatus 3.
如上所述，導電彈性部分100透過連接呈截頭圓錐形狀的上導電彈性部分110和下導電彈性部分120而成，因此能夠有效傳輸來自測試目標裝置1和測試設備3的電信號。As described above, the conductive elastic portion 100 is formed by connecting the upper conductive elastic portion 110 and the lower conductive elastic portion 120 which are frustoconical in shape, and thus can efficiently transmit electrical signals from the test target device 1 and the test device 3.
較佳地，用來形成上述導電彈性部分100的絕緣彈性體101採用具有交聯結構的耐熱聚合物材料。為了獲得交聯聚合物材料可用的可固化聚合物形成材料能夠採用各種類型，但較佳採用液體矽橡膠。上述液體矽橡膠的例子包括加成型液體矽橡膠或縮合型液體矽橡膠，其中，進一步較佳採用加成型液體矽橡膠。Preferably, the insulating elastic body 101 for forming the above-described conductive elastic portion 100 is made of a heat resistant polymer material having a crosslinked structure. Various types can be employed in order to obtain a curable polymer-forming material usable for the crosslinked polymer material, but liquid helium rubber is preferably used. Examples of the above liquid ruthenium rubber include an addition liquid ruthenium rubber or a condensed liquid ruthenium rubber, and further, an addition liquid ruthenium rubber is further preferably used.
當導電彈性部分100是由液體矽橡膠的固化物（下面稱作‘矽橡膠固化物’）形成時，上述矽橡膠固化物在150℃的永久壓縮變形較佳地等於或小於10%，更較佳地等於或小於8%，進一步較佳地等於或小於6 %。When the conductive elastic portion 100 is formed of a cured product of liquid silicone rubber (hereinafter referred to as 'rubber rubber cured product'), the permanent compression deformation of the above-mentioned tantalum rubber cured product at 150 ° C is preferably equal to or less than 10%, more preferably Preferably, it is equal to or less than 8%, further preferably equal to or less than 6%.
如果矽橡膠固化物在150℃的永久壓縮變形大於10%，當在高溫環境下反覆使用導電彈性部分100時，包含在導電彈性部分100中的導電粒子102之間的鏈被毀壞，導致難以維持導電性。If the permanent compression deformation of the ruthenium rubber cured product at 150 ° C is more than 10%, when the conductive elastic portion 100 is repeatedly used in a high temperature environment, the chain between the conductive particles 102 contained in the conductive elastic portion 100 is destroyed, resulting in difficulty in maintenance. Electrical conductivity.
此時，導電粒子102較佳為其表面上塗覆有高導電性金屬的磁性核心粒子。用來形成上述磁性核心粒子的材料例子包括透過將鐵、鎳、鈷等金屬塗覆在銅或樹脂上而獲得的材料。在此，導電粒子102的飽和磁化度較佳地等於或大於0.1Wb/m2 、更較佳地等於或大於0.3Wb/m2 、進一步較佳地等於或大於0.5Wb/m2 。At this time, the conductive particles 102 are preferably magnetic core particles whose surface is coated with a highly conductive metal. Examples of the material for forming the above magnetic core particles include materials obtained by coating a metal such as iron, nickel, cobalt or the like on copper or a resin. Here, the saturation magnetization of the conductive particles 102 is preferably equal to or greater than 0.1 Wb/m 2 , more preferably equal to or greater than 0.3 Wb/m 2 , still more preferably equal to or greater than 0.5 Wb/m 2 .
上述導電粒子102的粒徑較佳為1至100㎛、更較佳為2至50㎛、進一步較佳為3至30㎛、最較佳為4至20㎛。The particle diameter of the conductive particles 102 is preferably from 1 to 100 μm, more preferably from 2 to 50 μm, still more preferably from 3 to 30 μm, most preferably from 4 to 20 μm.
塗覆在磁性核心粒子的表面上的這種高導電性金屬的例子包括金、銀、銠、鉑、鉻等，其中，最較佳的是化學穩定且具有高導電性的金。Examples of such highly conductive metals coated on the surface of the magnetic core particles include gold, silver, rhodium, platinum, chromium, etc., of which gold is chemically stable and highly conductive.
另外，彈性支撐部分200呈與導電彈性部分100對應的形狀，且包圍導電彈性部分100。上述彈性支撐部分200支撐導電彈性部分100，從而，當導電彈性部分100被測試目標裝置1的端子2壓縮時，能夠防止包含在導電彈性部分100中的導電粒子102從絕緣彈性體101脫離。In addition, the elastic supporting portion 200 has a shape corresponding to the conductive elastic portion 100 and surrounds the conductive elastic portion 100. The elastic supporting portion 200 supports the conductive elastic portion 100, so that when the conductive elastic portion 100 is compressed by the terminal 2 of the test target device 1, the conductive particles 102 contained in the conductive elastic portion 100 can be prevented from being detached from the insulating elastic body 101.
上述彈性支撐部分200可以由矽樹脂、氨基甲酸乙酯、聚碳酸酯、聚乙烯中的任一種材料製成，但不限於此，只要是彈性高且絕緣性良好的合成樹脂或天然樹脂材料即可，沒有特別限制。如上所述，在導電彈性部分100變形的同時，彈性支撐部分200發生彈性變形，以防止包含在導電彈性部分100中的導電粒子102從絕緣彈性體101脫離。The elastic supporting portion 200 may be made of any one of enamel resin, urethane, polycarbonate, and polyethylene, but is not limited thereto, as long as it is a synthetic resin or a natural resin material having high elasticity and good insulation properties. Yes, there are no special restrictions. As described above, while the conductive elastic portion 100 is deformed, the elastic supporting portion 200 is elastically deformed to prevent the conductive particles 102 contained in the conductive elastic portion 100 from being detached from the insulating elastic body 101.
另外，絕緣支撐部分300被配置成支撐導電彈性部分100的下部。上述絕緣支撐部分300形成有供複數個導電彈性部分100插入並支撐的第一插入孔301，從而使得在導電彈性部分100的下部在被插入到第一插入孔301中的狀態下可以與絕緣支撐部分300牢固結合。In addition, the insulating support portion 300 is configured to support a lower portion of the conductive elastic portion 100. The above-described insulating support portion 300 is formed with a first insertion hole 301 into which a plurality of conductive elastic portions 100 are inserted and supported, so that the lower portion of the conductive elastic portion 100 can be insulated from the support in a state of being inserted into the first insertion hole 301. Part 300 is firmly bonded.
至於形成在上述絕緣支撐部分300的第一插入孔301，複數個第一插入孔301形成在絕緣支撐部分300，使得當測試目標裝置1的端子2下降時測試目標裝置1的端子2中心和第一插入孔301的中心位於相同的虛擬垂直線上。即，第一插入孔301形成在絕緣支撐部分300，使得被插入並支撐在第一插入孔301的導電彈性部分100和測試目標裝置1的端子2在虛擬的一個直線上對齊。因此，導電彈性部分100可以設置在與測試目標裝置1的端子2對應的位置。As for the first insertion hole 301 formed in the above-described insulating support portion 300, a plurality of first insertion holes 301 are formed in the insulating support portion 300 such that the terminal 2 of the target device 1 is tested and centered when the terminal 2 of the test target device 1 is lowered The center of an insertion hole 301 is located on the same virtual vertical line. That is, the first insertion hole 301 is formed in the insulating support portion 300 such that the conductive elastic portion 100 inserted and supported at the first insertion hole 301 and the terminal 2 of the test target device 1 are aligned on a virtual straight line. Therefore, the conductive elastic portion 100 can be disposed at a position corresponding to the terminal 2 of the test target device 1.
再說，複數個導電彈性部分100可以相互隔開預定間隔（pitch），該間隔可以與用作測試物件的測試目標裝置1的端子2之間的間隔相同。Further, the plurality of conductive elastic portions 100 may be spaced apart from each other by a predetermined pitch which may be the same as the interval between the terminals 2 of the test target device 1 serving as the test article.
形成在絕緣支撐部分300的第二插入孔302位於第一插入孔301的下部，第二插入孔302供測試設備3的襯墊4插入。即，測試設備3的襯墊4在被插入到第二插入孔302中的狀態下與導電彈性部分100的下面相接觸。如上所述，在測試設備3的襯墊4在被插入到第二插入孔302中的狀態下與導電彈性部分100的下面相接觸，從而能夠防止測試插座1000發生左右移動。因此，可以針對由微細間隔構成的測試目標裝置1的端子2正確進行電信號測試。The second insertion hole 302 formed in the insulating support portion 300 is located at a lower portion of the first insertion hole 301, and the second insertion hole 302 is inserted into the gasket 4 of the test apparatus 3. That is, the gasket 4 of the test apparatus 3 is in contact with the lower surface of the conductive elastic portion 100 in a state of being inserted into the second insertion hole 302. As described above, the pad 4 of the test apparatus 3 is brought into contact with the lower surface of the conductive elastic portion 100 in a state of being inserted into the second insertion hole 302, so that the test socket 1000 can be prevented from moving left and right. Therefore, the electric signal test can be correctly performed for the terminal 2 of the test target device 1 composed of fine intervals.
在此，形成在絕緣支撐部分300的第一插入孔301形成大於第二插入孔302。即，由於第一插入孔301和第二插入孔302的大小差異而階梯部310形成在第一插入孔301與第二插入孔302相連的部位，且導電彈性部分100的下部可以由階梯部310支撐並固定。Here, the first insertion hole 301 formed in the insulating support portion 300 is formed larger than the second insertion hole 302. That is, the step portion 310 is formed at a portion where the first insertion hole 301 is connected to the second insertion hole 302 due to the difference in size of the first insertion hole 301 and the second insertion hole 302, and the lower portion of the conductive elastic portion 100 may be the step portion 310 Support and fix.
如上所述，分別支撐複數個導電彈性部分100的絕緣支撐部分300由絕緣材料製成。As described above, the insulating support portions 300 respectively supporting the plurality of conductive elastic portions 100 are made of an insulating material.
上述絕緣支撐部分300可以由酚醛樹脂、聚酯、聚氨酯、氟樹脂等每重量單位的強度大、重量輕、絕緣性優良的合成樹脂材料或其他非金屬材料製成。在此，當然，除了上述材料之外，絕緣支撐部分300可以由絕緣性優良且能夠牢固支撐導電彈性部分100的各種材料形成。換句話說，絕緣支撐部分300具有優異的絕緣性和耐熱性，因此，在導電彈性部分100發生收縮、膨脹的情況下也能夠正確固定導電彈性部分100的位置。The insulating support portion 300 may be made of a synthetic resin material or other non-metal material having a large strength, a light weight, and excellent insulation properties per gram of a phenol resin, a polyester, a polyurethane, a fluororesin or the like. Here, of course, in addition to the above materials, the insulating support portion 300 may be formed of various materials excellent in insulation and capable of firmly supporting the conductive elastic portion 100. In other words, the insulating support portion 300 has excellent insulation and heat resistance, and therefore, the position of the conductive elastic portion 100 can be correctly fixed even in the case where the conductive elastic portion 100 shrinks and expands.
另外，導向部分400與絕緣支撐部分300的上面結合，且引導測試目標裝置1的端子2 移動。即，在測試目標裝置1的端子2下降時，導向部分400控制測試目標裝置1的移動，使得測試目標裝置1的端子2被引導到導電墊500的上面中心。In addition, the guide portion 400 is coupled to the upper surface of the insulating support portion 300, and guides the terminal 2 of the test target device 1 to move. That is, when the terminal 2 of the test target device 1 is lowered, the guiding portion 400 controls the movement of the test target device 1 so that the terminal 2 of the test target device 1 is guided to the upper center of the conductive pad 500.
關於上述導向部分400，從絕緣支撐部分300的下面到導向部分400的上端部的高度H1大於從絕緣支撐部分300的下面到導電墊500的上面的高度H2 。即，導向部分400的上端部位於導電墊500的上部。因此，測試目標裝置1的端子2被導向部分400引導，以便被引導到導電墊500的導電部分510的上面中心。與絕緣支撐部分300相同地，上述導向部分400由絕緣材料製成，從而能夠防止來自測試目標裝置1的端子的電信號被傳遞到導向部分400。Regarding the above-described guide portion 400, the height H1 from the lower surface of the insulating support portion 300 to the upper end portion of the guide portion 400 is larger than the height H2 from the lower surface of the insulating support portion 300 to the upper surface of the conductive pad 500. That is, the upper end portion of the guide portion 400 is located at the upper portion of the conductive pad 500. Therefore, the terminal 2 of the test target device 1 is guided by the guiding portion 400 so as to be guided to the upper center of the conductive portion 510 of the conductive pad 500. Like the insulating support portion 300, the above-described guide portion 400 is made of an insulating material, so that an electric signal from the terminal of the test target device 1 can be prevented from being transmitted to the guide portion 400.
參照圖6，導向部分400被設置成與插入並固定在絕緣支撐部分300的導電彈性部分100鄰接。圖6的（a）部分至（c）部分為示出設於測試插座1000的導向部分400的設置狀態的平面圖。如圖6的（a）部分所示，三個導向部分400可以被設置成與一個導電彈性部分100鄰接。Referring to FIG. 6, the guide portion 400 is disposed to abut with the conductive elastic portion 100 inserted and fixed to the insulating support portion 300. Parts (a) to (c) of Fig. 6 are plan views showing the installation state of the guide portion 400 provided in the test socket 1000. As shown in part (a) of Fig. 6, the three guide portions 400 may be disposed adjacent to one of the conductive elastic portions 100.
而且，在圖6的（b）部分和（c）部分的情況下，四個導向部分400可以被設置成與一個導電彈性部分100鄰接。換句話說，導向部分400的設置狀態和個數是可選擇性調節的。即，相對於一個導電彈性部分100，兩個、五個、六個等不同個數的導向部分400 可以設置在不同位置。如上所述，導向部分400被配置成向導電部分510的上面中心引導測試目標裝置1的端子2，對導向部分400的個數沒有特別限制。Moreover, in the case of parts (b) and (c) of Fig. 6, the four guide portions 400 may be disposed adjacent to one of the conductive elastic portions 100. In other words, the set state and number of the guide portions 400 are selectively adjustable. That is, two, five, six, etc. different number of guide portions 400 may be disposed at different positions with respect to one conductive elastic portion 100. As described above, the guide portion 400 is configured to guide the terminal 2 of the test target device 1 toward the upper center of the conductive portion 510, and the number of the guide portions 400 is not particularly limited.
然而，在測試目標裝置1的端子2下降時，為使測試目標裝置1的端子2穩定地移動到導電部分510的上面中心，相對於一個導電彈性部分100較佳鄰接至少三個導向部分400。如上所述，導向部分400使測試目標裝置1的端子2與導電部分510順利接觸，以提高測試目標裝置1的測試正確性。However, when the terminal 2 of the test target device 1 is lowered, in order to stably move the terminal 2 of the test target device 1 to the upper center of the conductive portion 510, at least three guide portions 400 are preferably adjacent to one conductive elastic portion 100. As described above, the guiding portion 400 brings the terminal 2 of the test target device 1 into smooth contact with the conductive portion 510 to improve the test accuracy of the test target device 1.
另外，導電墊500被設置在導電彈性部分100的上部，且由導向部分400支撐。上述導電墊500可以包括導電部分510和薄片部520。In addition, the conductive pad 500 is disposed on the upper portion of the conductive elastic portion 100 and supported by the guide portion 400. The above conductive pad 500 may include a conductive portion 510 and a sheet portion 520.
導電部分510呈與導電彈性部分100的上面對應的形狀，且被設置在導電彈性部分100的上面。上述導電部分510被配置成將來自測試目標裝置1的端子2的電信號傳輸到導電彈性部分100。此時，導電部分510可以與導電彈性部分100的上面相互附著，但本發明不限於此。The conductive portion 510 has a shape corresponding to the upper surface of the conductive elastic portion 100, and is disposed above the conductive elastic portion 100. The above-described conductive portion 510 is configured to transmit an electrical signal from the terminal 2 of the test target device 1 to the conductive elastic portion 100. At this time, the conductive portion 510 may be attached to the upper surface of the conductive elastic portion 100, but the present invention is not limited thereto.
如上所述，導電部分510由可傳輸電信號的導電材料形成。例如，導電部分510可以為具有在絕緣彈性體中上下方向排列有複數個導電粒子的結構的導電粉末。當測試目標裝置1的端子2給導電部分510加壓時，由上述導電粉末形成的導電部分510可以發生彈性變形，因此能夠防止由於導電部分510而測試目標裝置1的端子2受到損傷。上述導電部分510的例子不限於導電粉末，只要是可傳輸電信號的導電材料即可。即，導電部分可以由金屬形成。As described above, the conductive portion 510 is formed of a conductive material that can transmit an electrical signal. For example, the conductive portion 510 may be a conductive powder having a structure in which a plurality of conductive particles are arranged in the vertical direction in the insulating elastic body. When the terminal 2 of the test target device 1 pressurizes the conductive portion 510, the conductive portion 510 formed of the above-described conductive powder can be elastically deformed, and thus it is possible to prevent the terminal 2 of the test target device 1 from being damaged due to the conductive portion 510. The example of the above-described conductive portion 510 is not limited to the conductive powder as long as it is a conductive material that can transmit an electrical signal. That is, the conductive portion may be formed of a metal.
薄片部520與導電部分510連接且支撐導電部分510。上述薄片部520由導向部分400支撐並固定，從而導電部分510可以穩定地位於導電彈性部分100的上面。The sheet portion 520 is connected to the conductive portion 510 and supports the conductive portion 510. The above-described sheet portion 520 is supported and fixed by the guide portion 400, so that the conductive portion 510 can be stably positioned above the conductive elastic portion 100.
在此，薄片部520形成有與導向部分400的橫截面對應的形狀的結合孔521，且導向部分400被插入並結合於結合孔521中，從而使得導電墊500可以由導向部分400牢固支撐。如上所述，具有導電部分510和薄片部520的導電墊500選擇性地可拆卸連接到導向部分400。Here, the sheet portion 520 is formed with a coupling hole 521 having a shape corresponding to the cross section of the guide portion 400, and the guide portion 400 is inserted and coupled in the coupling hole 521, so that the conductive pad 500 can be firmly supported by the guide portion 400. As described above, the conductive pad 500 having the conductive portion 510 and the sheet portion 520 is selectively detachably coupled to the guide portion 400.
因此，在測試目標裝置1的反覆測試過程中，如果設於測試插座1000上部的導電部分510被損傷，使用者就透過選擇性地更換與導向部分400可拆卸連接的導電墊500來能夠延長測試插座1000的使用壽命。因為上述導電墊500可容易拆卸地設置，由此用戶透過選擇性地更換導電墊500來能夠持續使用測試插座1000。Therefore, during the repeated test of the test target device 1, if the conductive portion 510 provided on the upper portion of the test socket 1000 is damaged, the user can extend the test by selectively replacing the conductive pad 500 detachably connected to the guide portion 400. The service life of the socket 1000. Since the above-described conductive pad 500 can be easily detachably disposed, the user can continue to use the test socket 1000 by selectively replacing the conductive pad 500.
圖7為根據本發明的第二實施例的測試插座的截面示意圖，透過與圖3至圖6所示的構件相同的標號表示的構件具有相同的構成和功能，因而將不會對其加以詳細說明。Figure 7 is a schematic cross-sectional view showing a test socket according to a second embodiment of the present invention, and members denoted by the same reference numerals as those of the members shown in Figures 3 to 6 have the same constitution and function, and thus will not be detailed. Description.
參照圖7，導向部分400的上端部還可形成有傾斜部分410。上述傾斜部分410從直線形狀的導向部分400形成預定傾斜角度。例如，在導向部分400的橫截面呈圓形的狀態下，形成在導向部分400的上端部的傾斜部分410可以具有錐形。Referring to FIG. 7, the upper end portion of the guide portion 400 may also be formed with an inclined portion 410. The inclined portion 410 described above forms a predetermined inclination angle from the linearly shaped guide portion 400. For example, in a state where the cross section of the guide portion 400 is circular, the inclined portion 410 formed at the upper end portion of the guide portion 400 may have a taper shape.
當測試目標裝置1的端子2以未對準的狀態下降時，上述傾斜部分410嚮導電部分510的上面中心平滑地引導測試目標裝置1的端子2。When the terminal 2 of the test target device 1 is lowered in a misaligned state, the inclined portion 410 smoothly guides the terminal 2 of the test target device 1 toward the upper center of the conductive portion 510.
並且，第二插入孔302的下部也可形成有擴張部分320，該擴張部分320傾斜以便實現測試設備3的襯墊4容易插入。上述擴張部分320形成大於第二插入孔302，從而使得測試設備3的襯墊4可容易插入到第二插入孔302中。Also, the lower portion of the second insertion hole 302 may be formed with an expanded portion 320 which is inclined to realize easy insertion of the gasket 4 of the test apparatus 3. The above-described expanded portion 320 is formed larger than the second insertion hole 302, so that the gasket 4 of the test apparatus 3 can be easily inserted into the second insertion hole 302.
圖8為根據本發明的第三實施例的測試插座的平面圖，透過與圖3至圖6所示的構件相同的標號表示的構件具有相同的構成和功能，因而將不會對其加以詳細說明。Figure 8 is a plan view of a test socket according to a third embodiment of the present invention, members having the same reference numerals as those of the members shown in Figures 3 to 6 have the same constitution and function, and thus will not be described in detail. .
由圖8可知，導向部分的橫截面形狀不限於圓形，而可以呈各種形狀。As can be seen from Fig. 8, the cross-sectional shape of the guide portion is not limited to a circular shape, but may be in various shapes.
圖8的（a）部分所示的導向部分401的橫截面形狀呈四角形，圖8的（b）部分所示的導向部分402的橫截面形狀呈圓弧形，圖8的（c）部分所示的導向部分403的橫截面形狀呈帶中孔的圓形。在此，形成在薄片部520的結合孔521形成具有與導向部分401、402、403的橫截面對應的形狀。The guide portion 401 shown in part (a) of Fig. 8 has a quadrangular cross-sectional shape, and the guide portion 402 shown in part (b) of Fig. 8 has a circular cross-sectional shape, and part (c) of Fig. 8 The cross-sectional shape of the illustrated guide portion 403 is a circle with a center hole. Here, the coupling hole 521 formed in the sheet portion 520 is formed to have a shape corresponding to the cross section of the guide portions 401, 402, 403.
如圖8的（b）部分所示，在導向部分402的橫截面形狀呈圓弧形的情況下，與導向部分402的橫截面形狀呈圓形或四角形的情況相比由導向部分402支撐的結合孔521的支撐面積更大，因此，導電墊500可以穩定地支撐並固定在導向部分402。在此，在導向部分402的橫截面形狀呈圓弧形的情況下，在相對於一個導電彈性部分100鄰接兩個導向部分402的設置狀態下也能夠將測試目標裝置1的端子2穩定地引導到導電部分510的上面中心。As shown in part (b) of Fig. 8, in the case where the cross-sectional shape of the guide portion 402 is a circular arc shape, it is supported by the guide portion 402 as compared with the case where the cross-sectional shape of the guide portion 402 is circular or quadrangular. The support area of the coupling hole 521 is larger, and therefore, the conductive pad 500 can be stably supported and fixed to the guide portion 402. Here, in the case where the cross-sectional shape of the guide portion 402 is a circular arc shape, the terminal 2 of the test target device 1 can be stably guided even in a state in which the two conductive portions 100 are adjacent to the two guide portions 402. To the upper center of the conductive portion 510.
並且，如圖8的（c）部分所示，導向部分403的橫截面可以呈帶中孔的圓形。導電彈性部分100可以位於上述導向部分403的中空內部。即，導向部分403的橫截面呈帶中孔的圓形的情況下，與導向部分402的橫截面形狀呈圓弧形的情況相比結合孔521的支撐面積更大，因此導電墊500能夠更牢固地支撐並固定在導向部分403。Also, as shown in part (c) of Fig. 8, the cross section of the guide portion 403 may have a circular shape with a center hole. The conductive elastic portion 100 may be located inside the hollow portion of the above-described guide portion 403. That is, in the case where the cross section of the guide portion 403 is a circular shape with a middle hole, the support area of the coupling hole 521 is larger than the case where the cross-sectional shape of the guide portion 402 is a circular arc shape, so the conductive pad 500 can be further It is firmly supported and fixed to the guide portion 403.
如上所述，從絕緣支撐部分300突出的導向部分的橫截面形狀不限於特定形狀，可以具有各種形狀。As described above, the cross-sectional shape of the guide portion protruding from the insulating support portion 300 is not limited to a specific shape, and may have various shapes.
但這些僅僅是本發明的一個較佳實施例，而不代表本發明的所有技術範圍，本發明的技術範圍不限於上述實施例的記載。However, these are merely preferred embodiments of the present invention and do not represent all technical scopes of the present invention, and the technical scope of the present invention is not limited to the description of the above embodiments.
上述的本發明的說明只是例示性的，只要是本發明所屬技術領域的普通技術人員，就能理解在不變更本發明的技術思想或必要特徵的情況下，也能輕易變形為其他具體形態。因此，以上所述的實施例在各方面僅是例示性的，但並不局限於此。例如，作為單一型進行說明的各結構部件也能分散進行實施，同樣，使用分散的進行說明的結構部件也能以結合的形態進行實施。The above description of the present invention has been described by way of example only, and it will be understood by those of ordinary skill in the art that the present invention can be easily modified to other specific forms without departing from the spirit and scope of the invention. Therefore, the embodiments described above are merely illustrative in all aspects, but are not limited thereto. For example, each structural member described as a single type can also be dispersed and implemented, and similarly, the structural member described using the dispersion can be implemented in a combined form.
本發明的範圍是透過所附申請專利範圍來表示，而並非透過上述詳細的說明，而由申請專利範圍的意義、範圍及其均等概念匯出的所有變更或變形的形態應解釋為包括在本發明的範圍內。The scope of the present invention is defined by the scope of the appended claims, and is not intended to Within the scope of the invention.
1‧‧‧測試目標裝置
2‧‧‧端子
3‧‧‧測試設備
4‧‧‧襯墊
20‧‧‧測試插座
21‧‧‧彈簧式頂針
22‧‧‧接觸稍
23‧‧‧彈簧
24‧‧‧接觸尖端
30‧‧‧測試插座
31‧‧‧導電彈性部分
32‧‧‧導電粒子
100‧‧‧導電彈性部分
101‧‧‧絕緣彈性體
102‧‧‧導電粒子
110‧‧‧上導電彈性部分
120‧‧‧下導電彈性部分
200‧‧‧彈性支撐部分
300‧‧‧絕緣支撐部分
301‧‧‧第一插入孔
302‧‧‧第二插入孔
310‧‧‧階梯部
320‧‧‧擴張部分
400‧‧‧導向部分
401‧‧‧導向部分
402‧‧‧導向部分
403‧‧‧導向部分
410‧‧‧傾斜部分
500‧‧‧導電墊
510‧‧‧導電部分
520‧‧‧薄片部
521‧‧‧結合孔
1000‧‧‧測試插座
D1‧‧‧下面直徑
D2‧‧‧上面直徑
H1‧‧‧上端部的高度
H2‧‧‧上面的高度1‧‧‧Test target device
2‧‧‧ terminals
3‧‧‧Test equipment
4‧‧‧ cushion
20‧‧‧Test socket
21‧‧‧Spring thimble
22‧‧‧Contact slightly
23‧‧‧ Spring
24‧‧‧Contact tip
30‧‧‧Test socket
31‧‧‧Electrically conductive part
32‧‧‧Electrical particles
100‧‧‧Electrically conductive part
101‧‧‧Insulating elastomer
102‧‧‧ conductive particles
110‧‧‧Upper conductive elastic part
120‧‧‧ under the conductive elastic part
200‧‧‧elastic support
300‧‧‧Insulation support
301‧‧‧First insertion hole
302‧‧‧Second insertion hole
310‧‧‧Steps
320‧‧‧Expanding part
400‧‧‧guided section
401‧‧‧guided section
402‧‧‧guided section
403‧‧‧guided section
410‧‧‧ sloping part
500‧‧‧Electrical mat
510‧‧‧Electrical part
520‧‧‧Sheet Department
521‧‧‧Combination hole
1000‧‧‧Test socket
D1‧‧‧ below diameter
D2‧‧‧ upper diameter
Height of the upper end of H1‧‧
H2‧‧‧ height above
［圖1］為示出具有彈簧式頂針的現有測試插座的示意圖。 ［圖2］為示出具有導電彈性部分的現有測試插座的示意圖。 ［圖3］為示意性地示出根據本發明的第一實施例的測試插座的透視圖。 ［圖4］為根據本發明的第一實施例的測試插座的截面示意圖。 ［圖5］為根據本發明的第一實施例的壓縮的測試插座的工作狀態圖。 ［圖6］為根據本發明的第一實施例的測試插座的平面圖。 ［圖7］為根據本發明的第二實施例的測試插座的截面示意圖。 ［圖8］為根據本發明的第三實施例的測試插座的平面圖。[Fig. 1] is a schematic view showing a conventional test socket having a spring type ejector pin. FIG. 2 is a schematic view showing an existing test socket having a conductive elastic portion. Fig. 3 is a perspective view schematically showing a test socket according to a first embodiment of the present invention. Fig. 4 is a schematic cross-sectional view showing a test socket according to a first embodiment of the present invention. Fig. 5 is a view showing an operational state of a compressed test socket according to a first embodiment of the present invention. Fig. 6 is a plan view showing a test socket according to a first embodiment of the present invention. Fig. 7 is a schematic sectional view showing a test socket according to a second embodiment of the present invention. Fig. 8 is a plan view showing a test socket according to a third embodiment of the present invention.
1‧‧‧測試目標裝置 1‧‧‧Test target device
2‧‧‧端子 2‧‧‧ terminals
3‧‧‧測試設備 3‧‧‧Test equipment
4‧‧‧襯墊 4‧‧‧ cushion
100‧‧‧導電彈性部分 100‧‧‧Electrically conductive part
101‧‧‧絕緣彈性體 101‧‧‧Insulating elastomer
102‧‧‧導電粒子 102‧‧‧ conductive particles
110‧‧‧上導電彈性部分 110‧‧‧Upper conductive elastic part
120‧‧‧下導電彈性部分 120‧‧‧ under the conductive elastic part
200‧‧‧彈性支撐部分 200‧‧‧elastic support
300‧‧‧絕緣支撐部分 300‧‧‧Insulation support
301‧‧‧第一插入孔 301‧‧‧First insertion hole
302‧‧‧第二插入孔 302‧‧‧Second insertion hole
310‧‧‧階梯部 310‧‧‧Steps
400‧‧‧導向部分 400‧‧‧guided section
500‧‧‧導電墊 500‧‧‧Electrical mat
510‧‧‧導電部分 510‧‧‧Electrical part
520‧‧‧薄片部 520‧‧‧Sheet Department
1000‧‧‧測試插座 1000‧‧‧Test socket
D1‧‧‧下面直徑 D1‧‧‧ below diameter
D2‧‧‧上面直徑 D2‧‧‧ upper diameter
H1‧‧‧上端部的高度 Height of the upper end of H1‧‧
H2‧‧‧上面的高度 H2‧‧‧ height above
Claims (9)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| ??10-2015-0110117 | 2015-08-04 | ||
| KR1020150110117A KR101682230B1 (en) | 2015-08-04 | 2015-08-04 | Socket for electrical test |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201706608A true TW201706608A (en) | 2017-02-16 |
| TWI620935B TWI620935B (en) | 2018-04-11 |
Family
ID=57571672
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW105124403A TWI620935B (en) | 2015-08-04 | 2016-08-02 | Socket for electrical test |
Country Status (3)
| Country | Link |
|---|---|
| KR (1) | KR101682230B1 (en) |
| TW (1) | TWI620935B (en) |
| WO (1) | WO2017023037A1 (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI669515B (en) * | 2017-05-11 | 2019-08-21 | 南韓商Ｉｓｃ股份有限公司 | Test socket |
| TWI688779B (en) * | 2017-12-07 | 2020-03-21 | 韓商Ｔｓｅ有限公司 | Pad for managing history of semiconductor test socket, manufacturing method thereof and semiconductor test device including the same |
| TWI751061B (en) * | 2020-03-25 | 2021-12-21 | 南韓商Ｔｓｅ有限公司 | Test socket and test apparatus having the same, manufacturing method for the test socket |
| CN114341652A (en) * | 2019-08-29 | 2022-04-12 | 株式会社Isc | Test seat |
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| KR102002694B1 (en) * | 2017-09-29 | 2019-07-23 | 주식회사 새한마이크로텍 | Conductive contact and anisotropic conductive sheet with the same |
| KR102004501B1 (en) * | 2017-12-28 | 2019-07-26 | (주)새한마이크로텍 | Anisotropic conductive sheet |
| KR102032652B1 (en) * | 2018-06-07 | 2019-10-15 | 주식회사 새한마이크로텍 | Anisotropic conductive sheet with springs |
| KR102088305B1 (en) * | 2018-11-22 | 2020-03-13 | 주식회사 아이에스시 | Test socket for use in testing tested device |
| CN110911436B (en) * | 2019-12-03 | 2022-05-31 | 京东方科技集团股份有限公司 | Transfer device and transfer method for driving backboard and light emitting diode |
| KR102220168B1 (en) * | 2020-01-23 | 2021-02-25 | (주)티에스이 | Data signal transmission connector and manufacturing method for the same |
| KR102427089B1 (en) * | 2020-05-27 | 2022-07-29 | 주식회사 아이에스시 | Connector for electrical connection |
| KR102420784B1 (en) * | 2020-10-08 | 2022-07-15 | 주식회사 아이에스시 | Connector for electrical connection |
| KR102496532B1 (en) * | 2020-10-30 | 2023-02-06 | (주)티에스이 | Test apparatus for semiconductor package |
| KR102525559B1 (en) * | 2023-01-02 | 2023-04-25 | (주)새한마이크로텍 | Signal Loss Prevented Test Socket |
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| US6695623B2 (en) * | 2001-05-31 | 2004-02-24 | International Business Machines Corporation | Enhanced electrical/mechanical connection for electronic devices |
| KR20110065047A (en) | 2009-12-09 | 2011-06-15 | 이재학 | Test socket, the fabrication method thereof and pogo pin |
| KR101138963B1 (en) * | 2010-01-21 | 2012-04-25 | 주식회사 아이에스시테크놀러지 | Test socket and the fabrication method therefor |
| JP2011204401A (en) * | 2010-03-24 | 2011-10-13 | Oki Semiconductor Co Ltd | Inspection socket and semiconductor inspection device |
| KR101173118B1 (en) * | 2010-08-31 | 2012-08-14 | 리노공업주식회사 | Test socket for testing semiconductor chip |
| KR101284212B1 (en) * | 2012-04-27 | 2013-07-09 | 주식회사 아이에스시 | Test socket which can be aligned easily |
| KR101419364B1 (en) * | 2012-09-11 | 2014-07-16 | 주식회사 아이에스시 | Insert for handler |
| JP2016505155A (en) * | 2013-02-19 | 2016-02-18 | 株式会社アイエスシーＩｓｃ Ｃｏ．， Ｌｔｄ． | Test socket with high density conductive part |
| KR101366171B1 (en) * | 2013-02-19 | 2014-02-24 | 주식회사 아이에스시 | Test socket with high density conduction section |
| KR101471116B1 (en) * | 2014-02-13 | 2014-12-12 | 주식회사 아이에스시 | Test socket with high density conduction section |
| KR101532393B1 (en) * | 2014-06-26 | 2015-07-01 | 주식회사 아이에스시 | Electrical test socket |
-
2015
- 2015-08-04 KR KR1020150110117A patent/KR101682230B1/en active IP Right Grant
-
2016
- 2016-07-29 WO PCT/KR2016/008366 patent/WO2017023037A1/en active Application Filing
- 2016-08-02 TW TW105124403A patent/TWI620935B/en active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI669515B (en) * | 2017-05-11 | 2019-08-21 | 南韓商Ｉｓｃ股份有限公司 | Test socket |
| TWI688779B (en) * | 2017-12-07 | 2020-03-21 | 韓商Ｔｓｅ有限公司 | Pad for managing history of semiconductor test socket, manufacturing method thereof and semiconductor test device including the same |
| CN114341652A (en) * | 2019-08-29 | 2022-04-12 | 株式会社Isc | Test seat |
| TWI751061B (en) * | 2020-03-25 | 2021-12-21 | 南韓商Ｔｓｅ有限公司 | Test socket and test apparatus having the same, manufacturing method for the test socket |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI620935B (en) | 2018-04-11 |
| WO2017023037A1 (en) | 2017-02-09 |
| KR101682230B1 (en) | 2016-12-02 |
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