WO2016122039A1 - Pin block and testing device having same - Google Patents

Pin block and testing device having same Download PDF

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Publication number
WO2016122039A1
WO2016122039A1 PCT/KR2015/001158 KR2015001158W WO2016122039A1 WO 2016122039 A1 WO2016122039 A1 WO 2016122039A1 KR 2015001158 W KR2015001158 W KR 2015001158W WO 2016122039 A1 WO2016122039 A1 WO 2016122039A1
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WO
WIPO (PCT)
Prior art keywords
pin
pogo
connection
block
housing
Prior art date
Application number
PCT/KR2015/001158
Other languages
French (fr)
Korean (ko)
Inventor
김유곤
김천기
Original Assignee
유니퀘스트 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 유니퀘스트 주식회사 filed Critical 유니퀘스트 주식회사
Publication of WO2016122039A1 publication Critical patent/WO2016122039A1/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07321Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support the probes being of different lengths
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2803Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor

Definitions

  • the present invention relates to a pin block and an inspection apparatus having the same, and more particularly, a pin block for connecting a function of a module substrate having a connection pin terminal connected to a main board of an electronic terminal such as a smart phone, and the same. It relates to an inspection device.
  • Smartphone manufacturing technology has become popular as an electronic product that can be easily developed by electronic companies around the world.
  • One of the reasons for this universalization is the modularization of components.
  • manufacturing techniques such as the technology of designing circuits and mounting components are necessary for each manufacturer, but now, since most necessary components are modularized and can be supplied from an external specialized company, a board mounted with modular components on the main board Is connected via the inout pin to complete the manufacture. For example, if a camera is needed, a module board equipped with a camera module supplied by an external specialist may be connected to the main board through an inout pin.
  • the module substrate 100 includes a semiconductor chip 150, a smartphone function button module (not shown), an antenna module (not shown), and the like on a flexible printed circuit board (FPCB) 130 on which the lead wire 140 is printed. At least one of the same module is electrically connected through the lead wire 140 and forms a single substrate.
  • the module substrate 100 is connected to a main circuit board mounted on an electric and electronic device (for example, a smartphone) to complete one device.
  • the module substrate is connected to the main circuit board through a connecting pin terminal connected to the end of the lead wire, and the inspection apparatus of the present invention to determine whether the module board is good before connecting the module board to the main circuit board. Functional test is performed through
  • FIG. 1 is a plan view schematically showing an example of a module substrate to be inspected
  • FIG. 2 is a cross-sectional view taken along line A-A 'of the connection pin terminal shown in FIG. 1 and 2 will be described a problem of the conventional pin block for inspecting the module substrate and the inspection device having the same.
  • the inspection apparatus includes a pin block, and a functional test is performed with the connection pin terminal 125 of the module substrate 100 inserted into the pin block.
  • the functional test is a test method that checks the quality of the module board before inserting the module board into the main circuit board. After the specific data is applied to the input pin, the desired data is output to the designated output pin. This is how the test is performed.
  • the connection pin terminals 125 are provided with a plurality of connection pins 110 serving as in / out pins for inputting and outputting electrical signals to and from the module substrate 100.
  • the connecting pin terminals 125 of the module substrate illustrated in FIG. 1 are provided with connecting pins 110a and 110b one by one from side to side. As shown in FIG. 2, the connection pin terminal 125 forms a plurality of protrusions 131a, 131b, and 131c on the FPCB 130, and top, left, and right sides of the protrusions 131a, 131b, and 131c.
  • the plurality of connection pins 110a and 110b formed of a conductor over a portion of the upper surface may be provided while maintaining an insulated state. It can be seen that due to this shape, two trenches 115a and 115b are formed.
  • a portion electrically connected to the connecting pin provided on the main circuit board is an area indicated by 'A' in FIG. 2 and the other area indicated by 'B'. Is a portion extending from the 'A' region to serve as an extension lead for forming an electrical connection with the lead wires 140a and 140b provided in the FPCB.
  • the area 'A' is referred to as a 'normal connection area' and the area 'B' is referred to as an 'FPCB connection area'.
  • FIG. 3 is a cross-sectional view illustrating a PCB connection terminal form of a main circuit board corresponding to the connection pin terminal of the module substrate shown in FIG. 2.
  • Protrusions 1131a and 1131b are formed on the PCB substrate 1130 of the main circuit board, and the conductors 1110a and 1110b are disposed on the top and side surfaces of the protrusions 1131a and 1131b and some surfaces of the PCT substrate 1130. Is formed.
  • two regions designated as 'C' are inserted into the trenches 115a and 115b of FIG. 2, respectively, so that the module substrate and the main circuit board are electrically connected.
  • connection pin terminal of the module substrate shown in FIG. 2 is called a container
  • the PCB connection terminal of the main circuit board shown in FIG. 3 is called a plug
  • the plug shown in FIG. 3 may be formed by the connecting pin terminal of the module substrate
  • the container shown in FIG. 2 may be formed by the PCB connection terminal of the mail circuit board.
  • the 'C' region shown in FIG. 3 corresponds to the 'normal connection region'
  • the 'D' region corresponds to the 'FPCB connection region'.
  • connection port of FIG. 3 is described as being provided in the main circuit board. However, when the functional test is performed, it is to be understood that the connection port of FIG.
  • the inspection device having a pin block is provided with a pin block for inserting the connecting pin terminal, and after the plurality of pogo pins are installed in the pin block, the pogo pin is connected to the connecting pin terminal while pressing the connecting pin terminal 125 from the top.
  • the function test is performed in the state of being electrically connected with.
  • Figure 4 is a shape diagram showing the shape of the pogo pin used in the conventional inspection device.
  • the conventional pogo pin 49 is composed of a housing 43, a lower pin 45 and an upper pin 41, the housing 43 has a structure in which an elastic spring is inserted.
  • the end of the lower pin 45 is connected to the connecting terminal formed on the main circuit board (or the pin block), and the upper pin 41 is connected to the module. It is connected with the connecting pin of a circuit board.
  • FIG. 5 is an explanatory diagram illustrating a process of performing inspection while the connection pin of the module substrate shown in FIG. 2 and the pogo pin shown in FIG. 4 are connected by using an inspection apparatus having a conventional pin block.
  • Figure 5 (a) shows a state before the connecting pin terminal of the module substrate is connected to the pogo pin provided in the pin block
  • Figure 5 (b) is a lower portion while the pressure is applied from the upper portion of the connecting pin terminal of the module substrate It shows the state connected with the pogo pin as going down.
  • the conventional inspection apparatus when the connecting pin terminal of the module substrate moves downward by ⁇ t, the upper pin 41 of the pogo pin is inserted into the trenches 115a and 115b of the connecting pin terminal of the module substrate, thereby making a connection. .
  • the pin block is configured to be elastically movable in the vertical direction with respect to the body.
  • a vertical impact may be applied to the pin block
  • the connecting pin terminal is the pin position (that is, In the process of finely adjusting the left and right position of the connecting pin terminal to be located in the correct connection with the pogo pin)
  • a horizontal impact may be applied to the pin block.
  • the vertical impact can be mitigated by the above-described elastic operation of the pin block, but the horizontal impact cannot be solved by the elastic operation of the pin block, and when such horizontal impact is accumulated or a threshold value is applied, the pogo is transmitted. This can be a major cause of broken pins.
  • the pogo pin is not broken, if it is slightly bent, the length thereof is shorter than that of other pogo pins, so that the corresponding pogo pin cannot be connected to the connection pin of the connection pin terminal.
  • the present invention has been made to solve the above problems, the object of the present invention is that the physical impact (especially horizontal impact) is applied when inserting the connecting pin terminal into the pin block, the pogo pin is the top of the connection pin It is to provide a pin block that can be inspected by providing a separate electrical connection even if not connected to the connection area and an inspection apparatus having the same.
  • an object of the present invention is to provide a pin block and an inspection apparatus having the same by providing a separate additional connection pin even if the pogo pin connected to the normal connection area by physical impact is broken. do.
  • Still another object of the present invention is to provide a pin block having a structure capable of minimizing damage when inserting a connection pin terminal of a module substrate into a pin block and an inspection apparatus having the same.
  • the object of the present invention is to provide a specific function coupled to the main circuit board including a printed circuit board having a plurality of connection terminals (hereinafter referred to as "PCB"), and a flexible printed circuit board coupled to the plurality of connection terminals
  • PCB printed circuit board having a plurality of connection terminals
  • 'FPCB' connecting pin terminal consisting of a plurality of connecting pins
  • the second through hole in the center A base cover having a housing portion, a base cover coupled to a lower portion of the housing portion, and having a first through hole at the center thereof, and a plurality of first pogo pins installed in the space between the housing portion and the base cover.
  • the first pogo pin and the second pogo pin can be achieved by a pin block and an inspection apparatus including the pin block, characterized in that arranged in pairs to be connected to the same connecting pin of the module substrate.
  • the pin block In the conventional pin block and the inspection apparatus having the same, if any one of a plurality of pogo pins electrically connected to the connecting pin connection area should be replaced, the pin block has to be replaced, but the pin block according to the present invention and the inspection apparatus having the same
  • the pogo pin connected to the connection pin connecting area further comprises a secondary pogo pin connected to the FPCB connection area to function stably by the auxiliary pogo pin even if some of the plurality of pogo pin problems such as broken or bent The test can now be performed.
  • the conventional pin block is broken when pogo pin breaks while colliding with the floating part of the pin block when it does not come down from the vertical vertical direction when the connection pin terminal of the module board is inserted,
  • the guide block is formed in the floating part and the guide surface is lowered in steps in the guide block, thereby inducing the connection pin terminal to be inserted into the pin block in place when the pin block is seated, thereby reducing breakage of the pogo pin. I can do it.
  • 1 is a plan view schematically showing an example of a module substrate to be inspected.
  • FIG. 2 is a cross-sectional view along the line A-A 'of the connecting pin terminal shown in FIG. 1;
  • FIG. 3 is a cross-sectional view illustrating a PCB connection terminal form of a main circuit board corresponding to a connection pin terminal of the module substrate shown in FIG. 2.
  • Figure 4 is a diagram showing the shape of the pogo pin used in the conventional inspection device.
  • FIG. 5 is an explanatory diagram illustrating a process of performing an inspection while the connection pins of the module substrate shown in FIG. 2 and the pogo pins shown in FIG. 4 are connected by using an inspection apparatus having a conventional pin block.
  • Figure 6 is a perspective view of the pin block coupling of an embodiment according to the present invention.
  • Figure 7 is an exploded perspective view of the pin block of one embodiment according to the present invention.
  • FIG 8 is a front view of a pogo pin of an embodiment according to the present invention.
  • FIG. 9 is a cross-sectional view of a pin block illustrating a process of inspecting a module substrate using an embodiment according to the present invention.
  • FIG. 10 is an enlarged view illustrating a portion where an upper pin of a pogo pin is connected to a module substrate in FIG. 9;
  • FIG. 11 is a view showing various embodiments of the tapered portion of the first pogo pin upper pin according to the present invention.
  • on or above means to be located above or below the target portion, and does not necessarily mean to be located above the gravity direction. Also, when a portion such as an area, a plate, etc. is said “on or on top” of another part, it is not only when the other part is connected or spaced "on or on top of” another part but also another part in between. It also includes cases where there is.
  • one component when one component is referred to as “connected” or “connected” with another component, the one component may be directly connected or directly connected to the other component, but in particular It is to be understood that, unless there is an opposite substrate, it may be connected or connected via another component in the middle.
  • Figure 6 is a perspective view of the pin block coupling of an embodiment according to the present invention
  • Figure 7 is an exploded perspective view of the pin block of one embodiment according to the present invention shown in Figure 6 (b).
  • FIG. 6 (a) is a perspective view illustrating a pin block coupling of an embodiment without a guide block 247
  • FIG. 6 (b) shows a perspective view of a pin block coupling of an embodiment having a guide block 247.
  • Guide block 247 is formed as extending the outer edge of the floating portion 240 as shown in the figure, the guide surface 247a is formed stepped (or inclined) to the center inside the guide block 247 Formed.
  • Pin block is composed of a base cover 210, the housing portion 230 and the floating portion 240.
  • the base cover 210 is a member that is placed on the upper connection terminal of the PCB provided in the inspection device not shown in the drawings, and is fastened by using the bolt 211 to the lower portion of the housing portion 230 disposed above,
  • the portion is provided with a plurality of first through holes 217.
  • the lower pins of the pogo pins 149 and 159 are exposed downward through the first through hole 217 to be connected to the connection terminals of the PCB provided in the inspection apparatus.
  • a plurality of pogo pins 149 and 159 are accommodated in the accommodation space formed between the base cover 210 and the housing 230.
  • the base cover 210 is provided with a coupling pin 213, it is configured to be coupled to the correct position when the housing portion 230 is coupled using the alignment pin 215.
  • a plurality of second through-holes 233 through which the upper pins of the pogo pins 149 and 159 are exposed is provided at the center of the housing portion 230.
  • the second through-hole 233 provided in the housing portion 230 it can be seen that it consists of a total of four rows, the second pogo pin 159 is located in the first row (253a), the second The first pogo pin 149 is located in row 253b, the first pogo pin 149 is located in third row 253c, and the second pogo pin 159 is located in fourth row 253d. do.
  • the second pogo pins 159 of the first row 253a and the first pogo pins 149 of the second row 253b are connected to the same connector 110a of the module substrate in pairs.
  • the first pogo pin 149 of the third row 253c and the second pogo pin 159 of the fourth row 253d positioned in the same column may be connected to the same connector 110b of the module substrate in pairs.
  • the spring 231 and the floating part 240 are placed in the upper part of the housing part 230, and the floating part 240 is coupled to the upper part of the housing part 230 by using the washer 241 and the bolt 243. .
  • a plurality of third through holes 245 are provided in the center of the floating part 240 to expose the upper pins of the pogo pins 149 and 159.
  • the first through hole 217, the second through hole 233, and the third through hole 245 provided in the base cover 210, the housing part 230, and the floating part 240 are all located at the same vertical position.
  • the hole is formed so that the upper pin and the lower pin of the pogo pins 149 and 159 can be connected to the connection pin and the PCB connection terminal of the module substrate, respectively.
  • pogo pins 149 and 159 arranged in a total of four rows are shown in the pin block of one embodiment according to the present invention, and the pogo pins 159 shown in rows 1 and 4, and 2
  • the pogo pins 149 shown in rows and 3 use different kinds of pogo pins 149 and 159 with different lengths. This will be described in detail with reference to FIG. 8.
  • the pogo pin shown in FIG. 8A (149, hereinafter referred to as 'first pogo pin') is used to connect to the 'normal connection area' of the connection pin of the module substrate, and the conventional pogo pin shown in FIG.
  • the upper pin 141 of the first pogo pin 149 is composed of a body portion 141a and a tapered portion 141b.
  • the pogo pin 159 (hereinafter, referred to as 'second pogo pin') shown in FIG. 8B is used to connect to the 'FPCB connection area' of the connection pin of the module substrate.
  • FIG. 9 is a cross-sectional view of a pin block for explaining a process of inspecting a module substrate using an embodiment according to the present invention.
  • FIG. 9A illustrates a state in which pressure is not applied to the upper portion of the module substrate.
  • the first pogo pin 149 and the second pogo pin 159 are not yet connected to the connection pin terminals of the module substrate. Indicates the state.
  • FIG. 9B when pressure is applied to the upper portion of the module substrate, as shown in FIG. 9B, the spring 231 interposed between the housing part 230 and the floating part 240 is compressed and the floating part 240 is pressed. Downwards, a portion of the upper pins of the first pogo pin 149 and the second pogo pin 159 through the through hole formed in the center of the floating portion 240 is projected through the connection pin 110a of the module substrate Electrical connection with the
  • FIG. 10 is an enlarged view illustrating a portion where the upper pin of the pogo pin is connected to the module substrate in FIG. 9.
  • FIG. 10A illustrates a state in which pressure is not applied to the upper portion of the module substrate.
  • the first pogo pin 149 and the second pogo pin 159 are not yet connected to the connection pin terminals of the module substrate.
  • the arrow shows the direction in which the module substrate is lowered by the pressure applied on the module substrate.
  • 10 (b) shows a portion of the upper pins of the first pogo pin 149 and the second pogo pin 159 through the through hole formed in the center of the floating part 240 as the floating part descends downward.
  • substrate is shown.
  • the upper pin 151 of the second pogo pin is connected to the FPCB connection region of the connecting pin 110a, and the tapered portion 141b of the upper pin 141 of the first pogo pin 149 is the connecting pin.
  • the first pogo pin according to the present invention is connected to the bottom surface while the pogo pin is fully inserted into the trench 115b of the connection pin 110b while the first pogo pin according to the present invention is connected to the normal connection area of the 110b. It can be seen that a predetermined region of the tapered portion 141b is connected to the connection pin 110b formed at the inlet side of the trench 115b by inserting a portion of the predetermined region into the trench 115b of the connection pin 110b.
  • the conventional pogo pin is connected to the bottom surface of the trench 115b should be connected to the connection of the pogo pin, but the first pogo pin according to the present invention Even if the attachment of the pin 141 (that is, the tapered portion 141b of the present invention) is not inserted to the bottom surface of the trench 115b, the pin 141 can be connected to the connection pin 110b.
  • the tapered portion corresponding to the first diameter D1 is not inserted into the trench 115b and positioned at an upper portion thereof, and the tapered portion corresponding to the third diameter D3 is spaced apart from the bottom surface of the trench 115b. You can see that it is located at.
  • the outer circumferential portion corresponding to the second diameter D2 of the tapered portion 141b is connected to the conductive portion formed on the inner wall of the trench 115b.
  • the electrical connection can be realized even if the upper pin 141 is not inserted to the bottom of the connection pin 110b, thereby accurately connecting the first pogo pin. It can be carried out stably while also minimizing the problem of probe damage due to the conventional wrong connection operation.
  • connection pin 110b formed on the module substrate
  • the corresponding connection pin is caused by the second pogo pin. It can be seen that the inspection can be performed by stably maintaining the connection with 110b.
  • Figure 11 (a) to (c) is a view showing various embodiments of the tapered portion of the upper pin of the first pogo pin according to the present invention.
  • the tapered portion of the first pogo pin in the present invention is composed of a semi-elliptic spherical shape (141a) as shown in Figure 11 (a), or conical shape (141c) as shown in Figure 11 (b), or It can be configured as a semi-spherical shape (141d) as shown in Fig. 11 (c), preferably a semi-elliptic shape as shown in Fig. 11 (a).
  • the same purpose can be achieved even if the tapered portion of the first pogo pin is composed of a semi-elliptic spherical shape, a truncated cone shape, or a pyramidal shape made of a polyhedron.
  • the pin block according to the present invention is further provided with a second pogo pin additionally, unlike shown in Figure 8, the shape of the upper pin 141 of the first pogo pin 149 conventional pogo pin (49) It can be implemented to be implemented in the same shape as the upper pin of, and to be connected to the bottom surface of the trench of the connecting pin formed on the module substrate.

Abstract

The present invention relates to a pin block and a testing device having same. A pin block, according to the present invention, has two pogo pins and enables identical connecting pins on a module substrate to be connected to the two pogo pins. The pin block, according to the present invention, further has auxiliary pogo pins, which are connected to an FPCB connection area, other than the pogo pins being connected to a connecting pin connection area, thereby enabling stable execution of function testing by means of the auxiliary pogo pins even if some of the plurality of pogo pins break or bend. And the pin block has formed thereon a guide block having a guide surface (247a), thereby enabling a connecting pin terminal of the module substrate to be guided so as to be accurately inserted into a proper position.

Description

핀블록 및 이를 구비하는 검사 장치Pin block and inspection device having same
본 발명은 핀블록 및 이를 구비하는 검사 장치에 관한 것으로서, 보다 상세하게는 스마트폰과 같은 전자 단말의 메인보드에 접속되는 접속핀단자를 갖는 모듈 기판을 기능 검사하기 위해 접속하는 핀블록 및 이를 구비하는 검사 장치에 관한 것이다.The present invention relates to a pin block and an inspection apparatus having the same, and more particularly, a pin block for connecting a function of a module substrate having a connection pin terminal connected to a main board of an electronic terminal such as a smart phone, and the same. It relates to an inspection device.
스마트폰 제조 기술은 세계 각국의 전자 업체가 손쉽게 개발할 수 있는 전자제품으로 보편화되었다. 이러한 보편화가 가능해진 이유 중의 하나는 부품의 모듈화라고 할 수 있다. 종래에는 각 제조 업체마다 회로를 독자적으로 설계하고 부품을 실장하는 기술 등의 제조기술이 필요하였으나 현재는 필요한 부품이 대부분 모듈화되어 외부 전문업체로부터 공급받을 수 있으므로 메인보드에 모듈화된 부품이 실장된 기판을 인아웃 핀을 통해 접속시키면 제조가 완료된다. 예를 들어 카메라가 필요하면 외부 전문업체로부터 공급되는 카메라 모듈이 구비된 모듈 기판을 메인보드에 인아웃 핀을 통해 접속시키면 되는 것이다. 이렇게 메인보드에 인아웃 핀을 통해 접속되며 인아웃 접속핀이 구비되는 카메라 모듈, 스피커 모듈, 또는 마이크 모듈 등이 각각 구비되는 기판을 본 발명에서는 '모듈 기판'이라고 부르기로 한다. 모듈 기판(100)은 리드선(140)이 인쇄되어 있는 FPCB(Flexible Printed Circuit Board)(130) 상에, 반도체칩(150), 스마트폰 기능버튼 모듈(미도시), 안테나 모듈(미도시) 등과 같은 적어도 하나 이상의 모듈이 리드선(140)을 통해 전기적으로 연결되며 하나의 기판 형태를 이루고 있다. 이러한 모듈 기판(100)은 전기 전자 장치(예컨대 스마트폰 등)에 탑재되어 있는 메인 회로 기판에 접속되어 하나의 장치를 완성하게 된다.Smartphone manufacturing technology has become popular as an electronic product that can be easily developed by electronic companies around the world. One of the reasons for this universalization is the modularization of components. Conventionally, manufacturing techniques such as the technology of designing circuits and mounting components are necessary for each manufacturer, but now, since most necessary components are modularized and can be supplied from an external specialized company, a board mounted with modular components on the main board Is connected via the inout pin to complete the manufacture. For example, if a camera is needed, a module board equipped with a camera module supplied by an external specialist may be connected to the main board through an inout pin. As described above, a substrate provided with a camera module, a speaker module, a microphone module, etc., each of which is connected to the main board through an inout pin and is provided with an inout connecting pin, will be referred to as a "module board" in the present invention. The module substrate 100 includes a semiconductor chip 150, a smartphone function button module (not shown), an antenna module (not shown), and the like on a flexible printed circuit board (FPCB) 130 on which the lead wire 140 is printed. At least one of the same module is electrically connected through the lead wire 140 and forms a single substrate. The module substrate 100 is connected to a main circuit board mounted on an electric and electronic device (for example, a smartphone) to complete one device.
모듈 기판은 리드선의 종단에 연결되어 있는 접속핀단자를 통해 메인 회로 기판에 접속이 이루어지는데, 이러한 모듈 기판을 메인 회로 기판에 접속하기 전에 해당 모듈 기판의 양품 여부를 판별하기 위해 본 발명의 검사 장치를 통한 기능 검사 (Functional Test)가 수행된다.The module substrate is connected to the main circuit board through a connecting pin terminal connected to the end of the lead wire, and the inspection apparatus of the present invention to determine whether the module board is good before connecting the module board to the main circuit board. Functional test is performed through
도 1은 검사 대상인 모듈 기판의 일례를 개략적으로 나타낸 평면도이고, 도 2는 도 1에 제시된 접속핀단자의 A-A' 방향 단면도이다. 도 1 및 도 2를 참조하여 모듈 기판을 검사하는 종래 핀블록 및 이를 구비하는 검사 장치의 문제점에 대해 설명하기로 한다. 1 is a plan view schematically showing an example of a module substrate to be inspected, and FIG. 2 is a cross-sectional view taken along line A-A 'of the connection pin terminal shown in FIG. 1 and 2 will be described a problem of the conventional pin block for inspecting the module substrate and the inspection device having the same.
검사 장치에는 핀블록이 구비되며, 핀블록에 모듈 기판(100)의 접속핀단자(125)가 삽입된 상태로 기능 검사(functional test)가 수행된다. 기능 검사는 모듈 기판을 메인 회로 기판에 삽입하여 사용하기 전에 모듈 기판의 양품 여부를 검사하는 검사 방법의 일종으로 입력 핀에 특정 데이터를 인가한 후 정해진 출력 핀에 원하는 데이터가 출력되는지 여부를 이용하여 검사를 수행하는 방식이다. 이러한 접속핀단자(125)는 모듈 기판(100)에 전기적 신호를 입출력하기 위한 인/아웃 핀(In/Out Pin) 역할을 하는 다수 개 접속핀(110)이 구비된다.The inspection apparatus includes a pin block, and a functional test is performed with the connection pin terminal 125 of the module substrate 100 inserted into the pin block. The functional test is a test method that checks the quality of the module board before inserting the module board into the main circuit board. After the specific data is applied to the input pin, the desired data is output to the designated output pin. This is how the test is performed. The connection pin terminals 125 are provided with a plurality of connection pins 110 serving as in / out pins for inputting and outputting electrical signals to and from the module substrate 100.
도 1에 도시된 모듈 기판의 접속핀단자(125)는 좌우로 하나씩 접속핀(110a, 110b)이 구비된다. 도 2에 도시된 단면도와 같이 접속핀단자(125)는 FPCB(130) 상부에 다수 개 돌출부(131a, 131b, 131c)를 형성하고, 돌출부(131a, 131b, 131c)의 상면, 좌우면 및 FPCB 상면 일부에 걸쳐 도전체로 형성되는 복수 개 접속핀(110a, 110b)을 상호 절연 상태를 유지하면서 구비되는 형태를 갖는다. 이러한 형태로 인해 두 개의 트렌치(115a, 115b)가 형성됨을 알 수 있다. 접속핀단자(125)가 메인 회로 기판에 삽입될 때, 메인 회로 기판에 구비되는 접속핀과 실질적으로 전기적으로 접속되는 부분은 도 2에서 'A'로 표시된 영역이며, 나머지 'B'로 표시된 영역은 'A' 영역과 연장 형성되어 FPCB에 구비되는 리드선(140a, 140b)과 전기적인 접속을 형성하기 위한 연장 도선 역할을 하는 부분이다. 설명의 편의상 'A' 영역을 '정상 접속영역'이라 부르고, 'B' 영역을 'FPCB 연결영역'이라 칭하기로 한다.The connecting pin terminals 125 of the module substrate illustrated in FIG. 1 are provided with connecting pins 110a and 110b one by one from side to side. As shown in FIG. 2, the connection pin terminal 125 forms a plurality of protrusions 131a, 131b, and 131c on the FPCB 130, and top, left, and right sides of the protrusions 131a, 131b, and 131c. The plurality of connection pins 110a and 110b formed of a conductor over a portion of the upper surface may be provided while maintaining an insulated state. It can be seen that due to this shape, two trenches 115a and 115b are formed. When the connecting pin terminal 125 is inserted into the main circuit board, a portion electrically connected to the connecting pin provided on the main circuit board is an area indicated by 'A' in FIG. 2 and the other area indicated by 'B'. Is a portion extending from the 'A' region to serve as an extension lead for forming an electrical connection with the lead wires 140a and 140b provided in the FPCB. For convenience of description, the area 'A' is referred to as a 'normal connection area' and the area 'B' is referred to as an 'FPCB connection area'.
도 3은 도 2에 제시된 모듈 기판의 접속핀단자에 대응되는 메인 회로 기판의 PCB 접속단자 형태를 보여주는 단면도이다. 메인 회로 기판의 PCB 기판(1130) 상부에 돌출부(1131a, 1131b)를 형성하고, 돌출부(1131a, 1131b)의 상면, 측면 및 PCT 기판(1130)의 일부 면에 걸쳐 도전체(1110a. 1110b)가 형성된다. 도 3에서 'C'로 표시된 두 개 영역이 각각 도 2의 트렌치(115a, 115b)에 삽입되게 되어, 모듈 기판과 메인 회로 기판이 전기적으로 접속되게 되는 것이다.3 is a cross-sectional view illustrating a PCB connection terminal form of a main circuit board corresponding to the connection pin terminal of the module substrate shown in FIG. 2. Protrusions 1131a and 1131b are formed on the PCB substrate 1130 of the main circuit board, and the conductors 1110a and 1110b are disposed on the top and side surfaces of the protrusions 1131a and 1131b and some surfaces of the PCT substrate 1130. Is formed. In FIG. 3, two regions designated as 'C' are inserted into the trenches 115a and 115b of FIG. 2, respectively, so that the module substrate and the main circuit board are electrically connected.
업계에서는 도 2에 도시된 모듈 기판의 접속핀단자를 용기(receptacle)라 부르고, 이와 대응되는 도 3에 도시된 메인 회로 기판의 PCB 접속단자를 플러그(plug)라고 부른다. 물론 모듈 기판의 접속핀단자로 도 3에 도시된 플러그를 형성하고, 메일 회로 기판의 PCB 접속단자로 도 2에 도시된 용기를 형성할 수도 있음은 물론이다. 이 경우 도 3에 도시된 'C' 영역이 '정상 접속영역'으로 대응되며, 'D' 영역이 'FPCB 연결영역'으로 대응된다.In the industry, the connection pin terminal of the module substrate shown in FIG. 2 is called a container, and the PCB connection terminal of the main circuit board shown in FIG. 3 is called a plug. Of course, the plug shown in FIG. 3 may be formed by the connecting pin terminal of the module substrate, and the container shown in FIG. 2 may be formed by the PCB connection terminal of the mail circuit board. In this case, the 'C' region shown in FIG. 3 corresponds to the 'normal connection region', and the 'D' region corresponds to the 'FPCB connection region'.
상기 설명에서 도 3의 접속구의 형상이 메인 회로 기판에 구비되는 것으로 설명하였으나, 기능 검사를 수행할 경우에는 검사 장치의 핀블록에 구비되는 것으로 이해되어져야 한다.In the above description, the shape of the connector of FIG. 3 is described as being provided in the main circuit board. However, when the functional test is performed, it is to be understood that the connection port of FIG.
한편 핀블록을 구비하는 검사 장치는 접속핀단자를 삽입하기 위한 핀블록을 구비하고, 핀블록에는 다수 개 포고핀을 설치한 후, 접속핀단자(125)를 상부에서 누르면서 포고핀이 접속핀단자와 전기적으로 접속시킨 상태에서 기능 검사를 수행하게 된다. 도 4는 종래 검사 장치에 사용되는 포고핀의 형상을 보여주는 형상도이다. 종래 포고핀(49)은 하우징(43)과, 하부핀(45) 및 상부핀(41)으로 구성되며, 하우징(43) 내부에는 탄성 스프링이 삽입되는 구조를 갖는다. 모듈 기판을 메인 회로 기판(또는 검사 장치의 핀블록)에 끼우면, 하부핀(45)의 끝 단은 메인 회로 기판(또는 핀블록)에 형성되는 접속단자와 접속되며, 상부핀(41)은 모듈 회로 기판의 접속핀과 접속된다.On the other hand, the inspection device having a pin block is provided with a pin block for inserting the connecting pin terminal, and after the plurality of pogo pins are installed in the pin block, the pogo pin is connected to the connecting pin terminal while pressing the connecting pin terminal 125 from the top. The function test is performed in the state of being electrically connected with. Figure 4 is a shape diagram showing the shape of the pogo pin used in the conventional inspection device. The conventional pogo pin 49 is composed of a housing 43, a lower pin 45 and an upper pin 41, the housing 43 has a structure in which an elastic spring is inserted. When the module board is inserted into the main circuit board (or the pin block of the inspection apparatus), the end of the lower pin 45 is connected to the connecting terminal formed on the main circuit board (or the pin block), and the upper pin 41 is connected to the module. It is connected with the connecting pin of a circuit board.
도 5는 종래 핀블록을 구비하는 검사 장치를 이용하여 도 2에 제시된 모듈 기판의 접속핀과 도 4에 제시된 포고핀이 접속되면서 검사를 수행하는 과정을 설명하는 설명도이다. 도 5(a)는 모듈 기판의 접속핀단자가 핀블록에 구비되는 포고핀과 접속되기 전의 상태를 도시한 것이고, 도 5(b)는 모듈 기판의 접속핀단자의 상부에서 압력이 가해지면서 하부로 내려가면서 포고핀과 접속된 상태를 도시한 것이다. 종래 검사 장치는 모듈 기판의 접속핀단자가 하부 방향으로 △t 만큼 이동하면 모듈 기판의 접속핀단자에 구비된 트렌지(115a, 115b)에 포고핀의 상부핀(41)이 삽입되면서 접속이 이루어진다.FIG. 5 is an explanatory diagram illustrating a process of performing inspection while the connection pin of the module substrate shown in FIG. 2 and the pogo pin shown in FIG. 4 are connected by using an inspection apparatus having a conventional pin block. Figure 5 (a) shows a state before the connecting pin terminal of the module substrate is connected to the pogo pin provided in the pin block, Figure 5 (b) is a lower portion while the pressure is applied from the upper portion of the connecting pin terminal of the module substrate It shows the state connected with the pogo pin as going down. In the conventional inspection apparatus, when the connecting pin terminal of the module substrate moves downward by Δt, the upper pin 41 of the pogo pin is inserted into the trenches 115a and 115b of the connecting pin terminal of the module substrate, thereby making a connection. .
그런데, 이와 같이 포고핀의 상부핀(41)을 트렌치(115a, 115b)의 바닥면까지 삽입해야만 했던 종래 포고핀 및 검사 장치에 의하면, 트렌치 내부에 상부핀(41)을 삽입하는 과정에서 또는 상부핀(41)의 단부가 바닥면에 닿는 과정에서 가해지는 충격 등으로 일부 탐침이 파손되는 문제점이 발생할 수 있다. 특히 일부 포고핀에 손상이 발생하더라도 다수의 포고핀이 지그에 일체로 삽입 고정되는 구조상의 이유로, 손상된 포고핀만을 교체하지 못하고 핀블록 전체를 교환해야 하므로 손실 비용이 막대한 문제점이 있었다.By the way, according to the conventional pogo pin and inspection device that had to insert the upper pin 41 of the pogo pin to the bottom surface of the trenches 115a and 115b, in the process of inserting the upper pin 41 in the trench or the upper Some probes may be damaged due to an impact applied while the end portion of the pin 41 contacts the bottom surface. Particularly, even if some pogo pins are damaged, a large number of pogo pins are integrally inserted into and fixed to the jig, and thus, the entire cost of the pin blocks must be replaced instead of only the damaged pogo pins.
또한, 핀블록에 접속핀단자를 삽입하는 과정에서 충격이 가해지는데, 이러한 충격을 완화할 수 있도록 핀블록은 몸체에 대해 수직 방향으로 탄성 동작 가능하게 구성된다. 여기서, 접속핀단자를 핀블록에 접속시키기까지의 과정을 살펴보면, 접속핀단자를 핀블록에 삽입하는 과정에서 핀블록에 수직 방향 충격이 가해질 수 있고, 접속핀단자가 핀블록의 정위치(즉, 포고핀과 정확한 접속)에 위치하도록 접속핀단자의 좌우 위치를 미세 조정하는 과정에서 핀블록에 수평 방향 충격이 가해질 수 있다.In addition, an impact is applied in the process of inserting the connecting pin terminal into the pin block, so that the shock is relieved, the pin block is configured to be elastically movable in the vertical direction with respect to the body. Here, looking at the process of connecting the connecting pin terminal to the pin block, in the process of inserting the connecting pin terminal into the pin block, a vertical impact may be applied to the pin block, the connecting pin terminal is the pin position (that is, In the process of finely adjusting the left and right position of the connecting pin terminal to be located in the correct connection with the pogo pin), a horizontal impact may be applied to the pin block.
여기서, 수직 방향 충격은 전술한 핀블록의 탄성 동작에 의해 완화될 수 있으나, 수평 방향 충격의 경우는 핀블록의 탄성 동작으로 해결할 수 없게 되고, 이러한 수평 방향 충격이 누적되거나 임계치 이상이 가해지면 포고핀이 부러지는 고장을 야기하는 주요 원인으로 작용하게 된다. 나아가 포고핀이 부러지지는 않더라도 약간 구부러질 경우에는 다른 포고핀보다 길이가 짧아져서 해당 포고핀이 접속핀단자의 접속핀과 접속되지 못하여 기능 검사를 수행할 수 없는 문제점이 발생하였다.Here, the vertical impact can be mitigated by the above-described elastic operation of the pin block, but the horizontal impact cannot be solved by the elastic operation of the pin block, and when such horizontal impact is accumulated or a threshold value is applied, the pogo is transmitted. This can be a major cause of broken pins. In addition, even if the pogo pin is not broken, if it is slightly bent, the length thereof is shorter than that of other pogo pins, so that the corresponding pogo pin cannot be connected to the connection pin of the connection pin terminal.
본 발명은 상기와 같은 문제점을 해결하기 위하여 안출된 것으로서, 본 발명의 목적은 접속핀단자를 핀블록에 삽입할 때 물리적인 충격(특히 수평방향의 충격)이 가해져서 포고핀이 접속핀의 정상 접속영역과 접속하지 못하더라도 별도의 전기 접속을 제공하여 검사할 수 있는 핀블록 및 이를 구비하는 검사 장치를 제공하는 것이다.The present invention has been made to solve the above problems, the object of the present invention is that the physical impact (especially horizontal impact) is applied when inserting the connecting pin terminal into the pin block, the pogo pin is the top of the connection pin It is to provide a pin block that can be inspected by providing a separate electrical connection even if not connected to the connection area and an inspection apparatus having the same.
또한 본 발명은 물리적 충격에 의해 정상 접속영역에 접속되는 포고핀이 부러지더라도 별도의 부가 접속핀을 제공하여 원활한 기능 검사를 수행할 수 있는 핀블록 및 이를 구비하는 검사 장치를 제공하는 것을 목적으로 한다.In addition, an object of the present invention is to provide a pin block and an inspection apparatus having the same by providing a separate additional connection pin even if the pogo pin connected to the normal connection area by physical impact is broken. do.
본 발명의 또 다른 목적은 모듈 기판의 접속핀단자를 핀블록에 삽입할 때 파손을 최소화할 수 있는 구조를 갖는 핀블록 및 이를 구비하는 검사 장치를 제공하는 것을 목적으로 한다.Still another object of the present invention is to provide a pin block having a structure capable of minimizing damage when inserting a connection pin terminal of a module substrate into a pin block and an inspection apparatus having the same.
본 발명의 상기 목적은 다수 개 접속단자를 갖는 인쇄회로기판(이하 'PCB'라 함)을 포함하는 메인 회로 기판과 결합되어 특정 기능을 제공하고, 상기 다수 개 접속단자와 결합되는 플렉서블 인쇄 회로기판(이하, 'FPCB'라 함)상에 형성되는 다수 개 접속핀으로 구성되는 접속핀단자를 포함하도록 구성되는 모듈 기판의 상기 접속핀단자와 결합되는 핀블록에 있어서, 중앙에는 제2관통홀을 구비하는 하우징부와, 하우징부 하부에 사이 공간을 가지면서 결합되며 중앙에 제1관통홀을 구비하는 베이스커버와, 하우징부와 상기 베이스커버 사이의 상기 사이 공간에 설치되는 복수 개 제1포고핀 및 복수 개 제2포고핀과, 중앙에 제1관통홀을 구비하고, 상기 하우징부 상부에 결합되는 플로팅부와, 하우징부와 플로팅부 사이에 설치되는 복수 개 스프링을 포함하고, 제1포고핀과 제2포고핀은 쌍으로 모듈 기판의 동일한 접속핀에 접속되도록 배치되는 것을 특징으로 하는 핀블록과 이러한 핀블록을 포함하는 검사 장치에 의해서 달성 가능하다.The object of the present invention is to provide a specific function coupled to the main circuit board including a printed circuit board having a plurality of connection terminals (hereinafter referred to as "PCB"), and a flexible printed circuit board coupled to the plurality of connection terminals In the pin block coupled to the connecting pin terminal of the module substrate configured to include a connecting pin terminal consisting of a plurality of connecting pins (hereinafter referred to as 'FPCB'), the second through hole in the center A base cover having a housing portion, a base cover coupled to a lower portion of the housing portion, and having a first through hole at the center thereof, and a plurality of first pogo pins installed in the space between the housing portion and the base cover. And a plurality of second pogo pins, a floating portion having a first through hole at the center, coupled to an upper portion of the housing portion, and a plurality of springs installed between the housing portion and the floating portion, The first pogo pin and the second pogo pin can be achieved by a pin block and an inspection apparatus including the pin block, characterized in that arranged in pairs to be connected to the same connecting pin of the module substrate.
종래 핀블록 및 이를 구비하는 검사 장치에서는 접속핀 접속영역과 전기적으로 접속되는 다수 개 포고핀 중에서 하나라도 고장이 발생할 경우 핀블록을 교체하여야 하였으나, 본 발명에 따른 핀블록 및 이를 구비하는 검사 장치에 의하면 접속핀 접속영역에 접속되는 포고핀 외에도 FPCB 연결 영역과 접속되는 보조의 포고핀을 더 구비함으로써 복수 개 포고핀 중에서 일부가 부러지거나 구부러지는 등의 문제가 발생하더라도 보조 포고핀에 의해서 안정적으로 기능 검사를 수행할 수 있게 되었다.In the conventional pin block and the inspection apparatus having the same, if any one of a plurality of pogo pins electrically connected to the connecting pin connection area should be replaced, the pin block has to be replaced, but the pin block according to the present invention and the inspection apparatus having the same In addition to the pogo pin connected to the connection pin connecting area further comprises a secondary pogo pin connected to the FPCB connection area to function stably by the auxiliary pogo pin even if some of the plurality of pogo pin problems such as broken or bent The test can now be performed.
또한, 종래 핀블록은 모듈기판의 접속핀단자가 삽입될 때 정확한 수직 상부 방향에서 내려오지 않을 경우 핀블록의 플로팅부와 충돌되면서 포고핀이 부러지는 파손이 발생되었으나, 본 발명에 따른 핀블록의 경우는 플로팅부에 가이드블록을 형성하고 가이드블록 내측에 단계적으로 낮아지는 안내면을 형성함으로써 접속핀단자가 핀블록에 안착시 해당 핀블록의 정위치에 삽입되도록 유도하여 포고핀이 부러지는 파손을 감소시킬 수 있게 되었다.In addition, the conventional pin block is broken when pogo pin breaks while colliding with the floating part of the pin block when it does not come down from the vertical vertical direction when the connection pin terminal of the module board is inserted, In this case, the guide block is formed in the floating part and the guide surface is lowered in steps in the guide block, thereby inducing the connection pin terminal to be inserted into the pin block in place when the pin block is seated, thereby reducing breakage of the pogo pin. I can do it.
도 1은 검사 대상인 모듈 기판의 일례를 개략적으로 나타낸 평면도.1 is a plan view schematically showing an example of a module substrate to be inspected.
도 2는 도 1에 제시된 접속핀단자의 A-A' 방향 단면도.FIG. 2 is a cross-sectional view along the line A-A 'of the connecting pin terminal shown in FIG. 1; FIG.
도 3은 도 2에 제시된 모듈 기판의 접속핀단자에 대응되는 메인 회로 기판의 PCB 접속단자 형태를 보여주는 단면도.3 is a cross-sectional view illustrating a PCB connection terminal form of a main circuit board corresponding to a connection pin terminal of the module substrate shown in FIG. 2.
도 4는 종래 검사 장치에 사용되는 포고핀의 형상을 보여주는 형상도.Figure 4 is a diagram showing the shape of the pogo pin used in the conventional inspection device.
도 5는 종래 핀블록을 구비하는 검사 장치를 이용하여 도 2에 제시된 모듈 기판의 접속핀과 도 4에 제시된 포고핀이 접속되면서 검사를 수행하는 과정을 설명하는 설명도.5 is an explanatory diagram illustrating a process of performing an inspection while the connection pins of the module substrate shown in FIG. 2 and the pogo pins shown in FIG. 4 are connected by using an inspection apparatus having a conventional pin block.
도 6은 본 발명에 따른 일 실시예의 핀블록 결합 사시도.Figure 6 is a perspective view of the pin block coupling of an embodiment according to the present invention.
도 7은 본 발명에 따른 일 실시예의 핀블록 분해 사시도.Figure 7 is an exploded perspective view of the pin block of one embodiment according to the present invention.
도 8은 본 발명에 따른 일 실시예의 포고핀 정면도.8 is a front view of a pogo pin of an embodiment according to the present invention.
도 9는 본 발명에 따른 일 실시예를 이용하여 모듈 기판을 검사하는 과정을 설명하는 핀블록 단면도.9 is a cross-sectional view of a pin block illustrating a process of inspecting a module substrate using an embodiment according to the present invention.
도 10은 도 9에서 포고핀의 상부핀이 모듈 기판과 접속되는 부분을 확대 도시한 확대도.FIG. 10 is an enlarged view illustrating a portion where an upper pin of a pogo pin is connected to a module substrate in FIG. 9; FIG.
도 11은 본 발명에 따른 제1포고핀 상부핀의 테이퍼부의 다양한 실시예를 나타낸 도면.11 is a view showing various embodiments of the tapered portion of the first pogo pin upper pin according to the present invention.
본 발명에서 사용하는 용어는 단지 특정한 실시예를 설명하기 위해 사용된 것으로, 본 발명을 한정하려는 의도가 아니다. 단수의 표현은 문맥상 명백하게 다르게 뜻하지 않는 한, 복수의 표현을 포함한다. 본 명세서에서, "포함하다" 또는 "가지다" 등의 용어는 명세서상에 기재된 특징, 숫자, 단계, 동작, 구성요소, 부품 또는 이들을 조합한 것이 존재함을 지정하려는 것이지, 하나 또는 그 이상의 다른 특징들이나 숫자, 단계, 동작, 구성요소, 부품 또는 이들을 조합한 것들의 존재 또는 부가 가능성을 미리 배제하지 않는 것으로 이해되어야 한다.The terminology used herein is for the purpose of describing particular example embodiments only and is not intended to be limiting of the present invention. Singular expressions include plural expressions unless the context clearly indicates otherwise. As used herein, the terms "comprise" or "have" are intended to indicate that there is a feature, number, step, action, component, part, or combination thereof described on the specification, and one or more other features. It is to be understood that the present invention does not exclude the possibility of the presence or the addition of numbers, steps, operations, components, components, or a combination thereof.
또한, 본 명세서에서, "~ 상에 또는 ~ 상부에" 라 함은 대상 부분의 위 또는 아래에 위치함을 의미하는 것이며, 반드시 중력 방향을 기준으로 상 측에 위치하는 것을 의미하는 것은 아니다. 또한, 영역, 판 등의 부분이 다른 부분 "상에 또는 상부에" 있다고 할 때, 이는 다른 부분 "바로 상에 또는 상부에" 접속하여 있거나 간격을 두고 있는 경우뿐 아니라 그 중간에 또 다른 부분이 있는 경우도 포함한다.In addition, in the present specification, "on or above" means to be located above or below the target portion, and does not necessarily mean to be located above the gravity direction. Also, when a portion such as an area, a plate, etc. is said "on or on top" of another part, it is not only when the other part is connected or spaced "on or on top of" another part but also another part in between. It also includes cases where there is.
또한, 본 명세서에서, 일 구성요소가 다른 구성요소와 "연결된다" 거나 "접속된다" 등으로 언급된 때에는, 상기 일 구성요소가 상기 다른 구성요소와 직접 연결되거나 또는 직접 접속될 수도 있지만, 특별히 반대되는 기재가 존재하지 않는 이상, 중간에 또 다른 구성요소를 매개하여 연결되거나 또는 접속될 수도 있다고 이해되어야 할 것이다.In addition, in the present specification, when one component is referred to as "connected" or "connected" with another component, the one component may be directly connected or directly connected to the other component, but in particular It is to be understood that, unless there is an opposite substrate, it may be connected or connected via another component in the middle.
또한, 본 명세서에서, 제1, 제2 등의 용어는 다양한 구성요소들을 설명하는데 사용될 수 있지만, 상기 구성요소들은 상기 용어들에 의해 한정되어서는 안 된다. 상기 용어들은 하나의 구성요소를 다른 구성요소로부터 구별하는 목적으로만 사용된다.Also, in this specification, terms such as first and second may be used to describe various components, but the components should not be limited by the terms. The terms are used only for the purpose of distinguishing one component from another.
이하에서, 첨부된 도면을 참조하여 본 발명의 바람직한 실시예, 장점 및 특징에 대하여 상세히 설명하도록 한다.Hereinafter, with reference to the accompanying drawings will be described in detail a preferred embodiment, advantages and features of the present invention.
본 발명의 상세한 설명에 앞서, 본 발명의 검사 장치를 통해 검사가 수행되는 대상인 모듈 기판에 대해 간략히 설명하도록 한다. Prior to the detailed description of the present invention, a brief description will be given of a module substrate to be inspected through the inspection apparatus of the present invention.
도 6은 본 발명에 따른 일 실시예의 핀블록 결합 사시도이며, 도 7은 도 6(b)에 도시된 본 발명에 따른 일 실시예의 핀블록 분해 사시도이다. Figure 6 is a perspective view of the pin block coupling of an embodiment according to the present invention, Figure 7 is an exploded perspective view of the pin block of one embodiment according to the present invention shown in Figure 6 (b).
도 6(a)는 가이드블록(247)을 구비하지 않는 실시예의 핀블록 결합 사시도이며, 도 6(b)는 가이드블록(247)을 구비하는 실시예의 핀블록 결합 사시도를 도시한 것이다. 가이드블록(247)은 도면에 도시된 바와 같이 플로팅부(240)의 외곽 테두리부를 상부로 연장 형성한 것이며, 가이드블록(247)의 내측에는 중심부로 단차지게(또는 경사지게) 형성되는 안내면(247a)을 형성하였다. 가이드블록(247)을 채택하는 경우, 모듈 기판의 접속핀단자가 핀블록 상에 놓여질 때 최초의 수평 위치가 정위치로부터 약간 벗어나게 놓여지더라도 안내면(247a)을 따라 정확한 위치로 삽입되도록 유도하는 기능을 한다. 즉, 가이드블록(247) 내측에 형성되는 안내면(247a)을 따라 모듈 기판의 접속핀단자를 정위치로 놓여지도록 유도할 수 있으므로 포고핀이 부러지는 경우를 줄일 수 있게 되었다.6 (a) is a perspective view illustrating a pin block coupling of an embodiment without a guide block 247, and FIG. 6 (b) shows a perspective view of a pin block coupling of an embodiment having a guide block 247. Guide block 247 is formed as extending the outer edge of the floating portion 240 as shown in the figure, the guide surface 247a is formed stepped (or inclined) to the center inside the guide block 247 Formed. In the case of adopting the guide block 247, when the connecting pin terminal of the module board is placed on the pin block, a function of inducing the insertion into the correct position along the guide surface 247a even if the initial horizontal position is slightly away from the home position. Do it. That is, since the connection pin terminals of the module substrate may be guided along the guide surface 247a formed inside the guide block 247, the pogo pins may be broken.
본 발명에 따른 핀블록은 베이스커버(210), 하우징부(230) 및 플로팅부(240)로 구성된다. 베이스 커버(210)는 도면상으로 도시되지 않은 검사 장치에 구비되는 PCB의 접속단자 상부에 놓여지며, 상부에 배치되는 하우징부(230) 하부에 볼트(211)를 이용하여 체결되는 부재로서, 가운데 부분에는 다수 개 제1관통홀(217)을 구비한다. 이러한 제1관통홀(217)를 통하여 포고핀(149, 159)의 하부핀이 하부로 노출되면서 검사 장치에 구비되는 PCB의 접속단자와 접속되게 된다. 베이스 커버(210)와 하우징부(230) 사이에는 형성되는 수용공간에는 복수 개 포고핀(149, 159)이 수용된다. 또한, 베이스 커버(210)에는 결합핀(213)이 구비되고, 얼라인핀(215)를 이용하여 하우징부(230)과 결합시 정확한 위치에 결합될 수 있도록 구성하였다.Pin block according to the present invention is composed of a base cover 210, the housing portion 230 and the floating portion 240. The base cover 210 is a member that is placed on the upper connection terminal of the PCB provided in the inspection device not shown in the drawings, and is fastened by using the bolt 211 to the lower portion of the housing portion 230 disposed above, The portion is provided with a plurality of first through holes 217. The lower pins of the pogo pins 149 and 159 are exposed downward through the first through hole 217 to be connected to the connection terminals of the PCB provided in the inspection apparatus. A plurality of pogo pins 149 and 159 are accommodated in the accommodation space formed between the base cover 210 and the housing 230. In addition, the base cover 210 is provided with a coupling pin 213, it is configured to be coupled to the correct position when the housing portion 230 is coupled using the alignment pin 215.
하우징부(230) 중앙부에는 포고핀(149, 159)의 상부핀이 노출되는 복수 개 제2관통홀(233)이 구비됨을 알 수 있다. 하우징부(230)에 구비되는 제2관통홀(233)을 살펴보면, 총 네 개의 행으로 이루어져 있음을 알 수 있는데, 제1행(253a)에는 제2포고핀(159)가 위치되고, 제2행(253b)에는 제1포고핀(149)가 위치되고, 제3행(253c)에는 제1포고핀(149)가 위치되고, 제4행(253d)에는 제2포고핀(159)이 위치된다. 이때 동일한 열에 위치하는 제1행(253a)의 제2포고핀(159)과 제2행(253b)의 제1포고핀(149)이 쌍으로 모듈 기판의 동일한 접속구(110a)와 접속되며, 유사하게 동일한 열에 위치하는 제3행(253c)의 제1포고핀(149)과 제4행(253d)의 제2포고핀(159)이 쌍으로 모듈 기판의 동일한 접속구(110b)와 접속되게 된다. 하우징부(230) 상부에는 스프링(231), 플로팅부(240)가 차례대로 놓여지고, 와셔(241)와 볼트(243)을 이용하여 플로팅부(240)가 하우징부(230) 상부에 결합된다. 플로팅부(240) 중앙에도 포고핀(149, 159)의 상부핀이 노출되는 복수 개 제3관통홀(245)이 구비된다. 베이스커버(210), 하우징부(230), 및 플로팅부(240)에 구비되는 제1관통홀(217), 제2관통홀(233) 및 제3관통홀(245)은 모두 동일한 수직 위치에 홀을 형성하여 포고핀(149, 159)의 상부핀과 하부핀이 각각 모듈 기판의 접속핀과 PCB 접속단자와 접속될 수 있도록 구성된다.It can be seen that a plurality of second through-holes 233 through which the upper pins of the pogo pins 149 and 159 are exposed is provided at the center of the housing portion 230. Looking at the second through-hole 233 provided in the housing portion 230, it can be seen that it consists of a total of four rows, the second pogo pin 159 is located in the first row (253a), the second The first pogo pin 149 is located in row 253b, the first pogo pin 149 is located in third row 253c, and the second pogo pin 159 is located in fourth row 253d. do. In this case, the second pogo pins 159 of the first row 253a and the first pogo pins 149 of the second row 253b are connected to the same connector 110a of the module substrate in pairs. The first pogo pin 149 of the third row 253c and the second pogo pin 159 of the fourth row 253d positioned in the same column may be connected to the same connector 110b of the module substrate in pairs. The spring 231 and the floating part 240 are placed in the upper part of the housing part 230, and the floating part 240 is coupled to the upper part of the housing part 230 by using the washer 241 and the bolt 243. . A plurality of third through holes 245 are provided in the center of the floating part 240 to expose the upper pins of the pogo pins 149 and 159. The first through hole 217, the second through hole 233, and the third through hole 245 provided in the base cover 210, the housing part 230, and the floating part 240 are all located at the same vertical position. The hole is formed so that the upper pin and the lower pin of the pogo pins 149 and 159 can be connected to the connection pin and the PCB connection terminal of the module substrate, respectively.
도 7에 도시된 바와 본 발명에 따른 일 실시예의 핀블록에는 총 4개 행으로 배열된 복수 개 포고핀(149, 159)이 제시되는데 1행 및 4행에 제시된 포고핀(159)과, 2행 및 3행에 제시된 포고핀(149)은 서로 다른 길이를 갖는 서로 다른 종류의 포고핀(149, 159)을 사용하고 있음을 알 수 있다. 이를 도 8을 이용하여 자세히 설명하기로 한다. 도 8(a)에 도시된 포고핀(149, 이하, '제1포고핀'이라 한다)은 모듈 기판의 접속핀의 '정상 접속영역'에 접속하는데 사용되는 것으로서, 도 4에 제시된 종래 포고핀(49)과 비교할 때 전체적으로 동일한 형상을 가지나 상부핀(141)의 굵기가 더 굵게 형성하였음을 알 수 있다. 제1포고핀(149)의 상부핀(141)은 몸체부(141a)와 테이퍼부(141b)로 이루어진다. 도 8(b)에 도시된 포고핀(159, 이하, '제2포고핀'이라 한다)은 모듈 기판의 접속핀의 'FPCB 연결영역'에 접속하는데 사용되는 것이다.7 and a plurality of pogo pins 149 and 159 arranged in a total of four rows are shown in the pin block of one embodiment according to the present invention, and the pogo pins 159 shown in rows 1 and 4, and 2 It can be seen that the pogo pins 149 shown in rows and 3 use different kinds of pogo pins 149 and 159 with different lengths. This will be described in detail with reference to FIG. 8. The pogo pin shown in FIG. 8A (149, hereinafter referred to as 'first pogo pin') is used to connect to the 'normal connection area' of the connection pin of the module substrate, and the conventional pogo pin shown in FIG. Compared with (49) it can be seen that the overall shape is the same, but the thickness of the upper pin 141 is formed thicker. The upper pin 141 of the first pogo pin 149 is composed of a body portion 141a and a tapered portion 141b. The pogo pin 159 (hereinafter, referred to as 'second pogo pin') shown in FIG. 8B is used to connect to the 'FPCB connection area' of the connection pin of the module substrate.
도 9는 본 발명에 따른 일 실시예를 이용하여 모듈 기판을 검사하는 과정을 설명하는 핀블록 단면도이다. 설명의 편의상 복수 개 제1포고핀과 복수 개 제2포고핀 중에서 각각 하나씩만 도시하였다. 도 9(a)는 모듈 기판의 상부에 아직 압력이 가해지지 않은 상태를 도시한 것으로서, 제1포고핀(149) 및 제2포고핀(159)은 모듈 기판의 접속핀단자와 아직 접속되지 않은 상태를 나타낸다. 이후, 모듈 기판의 상부에 압력이 가해지면, 도 9(b)에 도시된 바와 같이 하우징부(230)와 플로팅부(240) 사이에 개재된 스프링(231)이 압착되면서 플로팅부(240)가 아래 방향으로 하강하게 되고, 플로팅부(240) 중앙에 형성된 관통홀을 통해서 제1포고핀(149) 및 제2포고핀(159)의 상부핀의 일부가 돌출되면서 모듈 기판의 접속핀(110a)과 전기적으로 접속되게 된다.9 is a cross-sectional view of a pin block for explaining a process of inspecting a module substrate using an embodiment according to the present invention. For convenience of description, only one of the plurality of first pogo pins and the plurality of second pogo pins is shown. FIG. 9A illustrates a state in which pressure is not applied to the upper portion of the module substrate. The first pogo pin 149 and the second pogo pin 159 are not yet connected to the connection pin terminals of the module substrate. Indicates the state. Subsequently, when pressure is applied to the upper portion of the module substrate, as shown in FIG. 9B, the spring 231 interposed between the housing part 230 and the floating part 240 is compressed and the floating part 240 is pressed. Downwards, a portion of the upper pins of the first pogo pin 149 and the second pogo pin 159 through the through hole formed in the center of the floating portion 240 is projected through the connection pin 110a of the module substrate Electrical connection with the
도 10은 도 9에서 포고핀의 상부핀이 모듈 기판과 접속되는 부분을 확대 도시한 확대도이다. 도 10(a)는 모듈 기판의 상부에 아직 압력이 가해지지 않은 상태를 도시한 것으로서, 제1포고핀(149) 및 제2포고핀(159)은 모듈 기판의 접속핀단자와 아직 접속되지 않은 상태를 나타내며, 화살표는 모듈 기판 상부에서 가해지는 압력에 의해 모듈 기판이 하강하는 방향을 도시한 것이다. 도 10(b)는 플로팅부가 아래 방향으로 하강한 상태로서 플로팅부(240) 중앙에 형성된 관통홀을 통해서 제1포고핀(149) 및 제2포고핀(159)의 상부핀의 일부가 돌출되면서 모듈 기판의 접속핀(110b)과 전기적으로 접속된 상태를 도시한 것이다. 즉, 제2포고핀의 상부핀(151)은 접속핀(110a)의 FPCB 연결영역에 접속됨을 알 수 있고, 제1포고핀(149) 상부핀(141)의 테이퍼부(141b)는 접속핀(110b)의 정상 접속영역과 접속되는데, 종래 포고핀은 접속핀(110b)의 트렌치(115b)에 완전 삽입되면서 바닥면과 접속을 이루는 반면 본 발명에 따른 제1포고핀은 상부핀(141)의 테이퍼부(141b) 소정 영역이 접속핀(110b)의 트렌치(115b) 내부로 일부가 삽입되어 트렌치(115b) 입구측에 형성되는 접속핀(110b)과 접속됨을 알 수 있다.FIG. 10 is an enlarged view illustrating a portion where the upper pin of the pogo pin is connected to the module substrate in FIG. 9. FIG. 10A illustrates a state in which pressure is not applied to the upper portion of the module substrate. The first pogo pin 149 and the second pogo pin 159 are not yet connected to the connection pin terminals of the module substrate. Indicate the state, the arrow shows the direction in which the module substrate is lowered by the pressure applied on the module substrate. 10 (b) shows a portion of the upper pins of the first pogo pin 149 and the second pogo pin 159 through the through hole formed in the center of the floating part 240 as the floating part descends downward. The state connected electrically with the connection pin 110b of a module board | substrate is shown. That is, it can be seen that the upper pin 151 of the second pogo pin is connected to the FPCB connection region of the connecting pin 110a, and the tapered portion 141b of the upper pin 141 of the first pogo pin 149 is the connecting pin. The first pogo pin according to the present invention is connected to the bottom surface while the pogo pin is fully inserted into the trench 115b of the connection pin 110b while the first pogo pin according to the present invention is connected to the normal connection area of the 110b. It can be seen that a predetermined region of the tapered portion 141b is connected to the connection pin 110b formed at the inlet side of the trench 115b by inserting a portion of the predetermined region into the trench 115b of the connection pin 110b.
여기서, 제1포고핀의 접속을 위한 삽입 구조를 상세히 살펴보면, 종래 포고핀은 트렌치(115b)의 바닥면까지 삽입되어 접속되어야 포고핀의 접속이 가능하였으나, 본 발명에 따른 제1포고핀은 상부핀(141)의 첨부(즉, 본 발명의 테이퍼부(141b))가 트렌치(115b)의 바닥면까지 삽입되지 않더라도 접속핀(110b)과 접속 가능하게 된다.Here, looking at the insertion structure for the connection of the first pogo pin in detail, the conventional pogo pin is connected to the bottom surface of the trench 115b should be connected to the connection of the pogo pin, but the first pogo pin according to the present invention Even if the attachment of the pin 141 (that is, the tapered portion 141b of the present invention) is not inserted to the bottom surface of the trench 115b, the pin 141 can be connected to the connection pin 110b.
이는, 본 발명의 제1포고핀(149)의 상부핀(141)을 트렌치(115b)로 삽입하게 되면, 도 10(b)에 도시된 바와 같이 테이퍼부(141b)의 제2직경(D1)(즉, 접속핀(110)의 트렌치 폭(W1)과 동일한 직경)에 해당하는 외주연이 트렌치(115b)에 걸림 동작됨에 기인한다.This, when the upper pin 141 of the first pogo pin 149 of the present invention is inserted into the trench 115b, the second diameter (D1) of the tapered portion (141b) as shown in Figure 10 (b) The outer circumferential edge corresponding to the same diameter as the trench width W1 of the connection pin 110 is caught by the trench 115b.
그리고, 제1직경(D1)에 해당하는 테이퍼부는 트렌치(115b)에 삽입되지 않고 그 상부에 위치하게 되고, 제3직경(D3)에 해당하는 테이퍼부는 트렌치(115b)의 저면으로부터 이격된 상부 영역에 위치한 상태임을 알 수 있다.In addition, the tapered portion corresponding to the first diameter D1 is not inserted into the trench 115b and positioned at an upper portion thereof, and the tapered portion corresponding to the third diameter D3 is spaced apart from the bottom surface of the trench 115b. You can see that it is located at.
상기와 같은 삽입 상태가 완료되면, 테이퍼부(141b)의 제2 직경(D2)에 해당하는 외주연 부위는 트렌치(115b)의 내벽에 형성된 도전부와 접속이 이루어지게 된다.When the insertion state as described above is completed, the outer circumferential portion corresponding to the second diameter D2 of the tapered portion 141b is connected to the conductive portion formed on the inner wall of the trench 115b.
결국, 본 발명에 따른 제1포고핀에 의하면, 상부핀(141)을 접속핀(110b)의 저면까지 삽입하지 않더라도 전기적 접속이 구현될 수 있게 되고, 이에 따라 제1포고핀의 접속 동작을 정확하면서도 안정적으로 실시할 수 있어 종래 잘못된 접속 동작에 따른 탐침 파손 문제를 최소화할 수 있게 되었다.As a result, according to the first pogo pin according to the present invention, the electrical connection can be realized even if the upper pin 141 is not inserted to the bottom of the connection pin 110b, thereby accurately connecting the first pogo pin. It can be carried out stably while also minimizing the problem of probe damage due to the conventional wrong connection operation.
나아가 모듈 기판에 형성되는 하나의 접속핀(110b)과 접속하는 포고핀을 두 개로 가져감으로써 제1포고핀이 트렌치(115b)에 삽입되거나 접속되면서 부러지더라도 제2포고핀에 의해서 해당 접속핀(110b)과의 접속을 안정적으로 유지하여 검사를 수행할 수 있음을 알 수 있다.Furthermore, by bringing two pogo pins connected with one connection pin 110b formed on the module substrate to two, even if the first pogo pin is broken while being inserted into or connected to the trench 115b, the corresponding connection pin is caused by the second pogo pin. It can be seen that the inspection can be performed by stably maintaining the connection with 110b.
도 11(a) 내지 (c)는 본 발명에 따른 제1포고핀 상부핀의 테이퍼부의 다양한 실시예를 나타낸 도면이다. 도 11을 참조하면, 본 발명에 제1포고핀의 테이퍼부는 도 11(a)와 같은 반타원구형(141a)으로 구성하거나, 또는 도 11(b)와 같은 원뿔형(141c)으로 구성하거나, 또는 도 11(c)와 같은 반구형(141d)으로 구성할 수 있으며, 바람직하게는 도 11(a)와 같은 반타원구형으로 구성하는 것이 가장 좋다.Figure 11 (a) to (c) is a view showing various embodiments of the tapered portion of the upper pin of the first pogo pin according to the present invention. Referring to Figure 11, the tapered portion of the first pogo pin in the present invention is composed of a semi-elliptic spherical shape (141a) as shown in Figure 11 (a), or conical shape (141c) as shown in Figure 11 (b), or It can be configured as a semi-spherical shape (141d) as shown in Fig. 11 (c), preferably a semi-elliptic shape as shown in Fig. 11 (a).
상기의 바람직한 실시예 외에, 제1포고핀의 테이퍼부 선단이 절단된 반타원구형, 선단이 절단된 원뿔형, 또는 다면체로 이루어진 각뿔형 등으로 구성하여도 동일한 목적을 달성할 수 있음은 물론이다.In addition to the above preferred embodiment, the same purpose can be achieved even if the tapered portion of the first pogo pin is composed of a semi-elliptic spherical shape, a truncated cone shape, or a pyramidal shape made of a polyhedron.
물론, 본 발명에 따른 핀블록에는 제2포고핀이 부가적으로 더 구비되므로, 도 8에 도시된 바와는 달리 제1포고핀(149)의 상부핀(141)의 형상을 종래 포고핀(49)의 상부핀과 동일한 형상으로 구현하고, 모듈 기판에 형성되는 접속핀의 트렌치의 바닥면과 접속되도록 구현할 수 있음은 물론이다.Of course, the pin block according to the present invention is further provided with a second pogo pin additionally, unlike shown in Figure 8, the shape of the upper pin 141 of the first pogo pin 149 conventional pogo pin (49) It can be implemented to be implemented in the same shape as the upper pin of, and to be connected to the bottom surface of the trench of the connecting pin formed on the module substrate.
상기에서 본 발명의 바람직한 실시예가 특정 용어들을 사용하여 설명 및 도시되었지만 그러한 용어는 오로지 본 발명을 명확히 설명하기 위한 것일 뿐이며, 본 발명의 실시예 및 기술된 용어는 다음의 청구범위의 기술적 사상 및 범위로부터 이탈되지 않고서 여러가지 변경 및 변화가 가해질 수 있는 것은 자명한 일이다.While the preferred embodiments of the present invention have been described and illustrated using specific terms, such terms are only for clarity of the present invention, and the embodiments and the described terms of the present invention are defined and the technical spirit and scope of the following claims. It is obvious that various changes and changes can be made without departing from the scope.
*이와 같이 변형된 실시예들은 본 발명의 사상 및 범위로부터 개별적으로 이해되어져서는 안되며, 본 발명의 청구범위 안에 속한다고 해야 할 것이다.* Such modified embodiments should not be understood individually from the spirit and scope of the present invention, but should fall within the claims of the present invention.

Claims (8)

  1. 다수 개 접속단자를 갖는 인쇄회로기판(이하 'PCB'라 함)을 포함하는 메인 회로 기판과 결합되어 특정 기능을 제공하고, 상기 다수 개 접속단자와 결합되는 플렉서블 인쇄 회로기판(이하, 'FPCB'라 함)상에 형성되는 다수 개 접속핀으로 구성되는 접속핀단자를 포함하도록 구성되는 모듈 기판의 상기 접속핀단자와 결합되는 핀블록에 있어서,Flexible printed circuit board (hereinafter referred to as 'FPCB') coupled with the main circuit board including a printed circuit board having a plurality of connection terminals (hereinafter referred to as 'PCB') to provide a specific function and coupled to the plurality of connection terminals. In the pin block coupled to the connecting pin terminal of the module substrate configured to include a connecting pin terminal consisting of a plurality of connecting pins formed on the
    중앙에는 제2관통홀(233)을 구비하는 하우징부(230)와,A housing portion 230 having a second through hole 233 in the center thereof;
    상기 하우징부 하부에 사이 공간을 가지면서 결합되며 중앙에 제1관통홀(217)을 구비하는 베이스커버(210)와,A base cover 210 coupled to the lower portion of the housing part with a space therebetween and having a first through hole 217 at the center thereof;
    상기 하우징부(230)와 상기 베이스커버(210) 사이의 상기 사이 공간에 설치되는 복수 개 제1포고핀(149) 및 복수 개 제2포고핀(159)과,A plurality of first pogo pins 149 and a plurality of second pogo pins 159 installed in the space between the housing part 230 and the base cover 210;
    중앙에 제1관통홀(245)을 구비하고, 상기 하우징부 상부에 결합되는 플로팅부(240)와,A floating portion 240 having a first through hole 245 in the center thereof and coupled to an upper portion of the housing portion;
    상기 하우징부(230)와 상기 플로팅부(240) 사이에 설치되는 복수 개 스프링(231)을 포함하고,It includes a plurality of springs 231 installed between the housing portion 230 and the floating portion 240,
    상기 제1포고핀(149)과 상기 제2포고핀(159)은 쌍으로 상기 모듈 기판의 동일한 접속핀에 접속되도록 배치되는 것을 특징으로 하는 핀블록.The first pogo pin (149) and the second pogo pin (159) pin block, characterized in that arranged in order to be connected to the same connection pin of the module substrate.
  2. 제1항에 있어서,The method of claim 1,
    상기 모듈 기판의 접속핀단자를 형성하는 상기 접속핀을 상기 메인 회로 기판의 접속단자와 결합하는 정상 접속영역과 상기 FPCB에 구비되는 리드선과 결합되는 FPCB 연결영역으로 구분할 때, 상기 제1포고핀(149)은 상기 정상 접속영역에서 접속되고, 상기 제2포고핀(159)은 상기 FPCB 연결영역에서 접속되는 것을 특징으로 하는 핀블록.When the connection pin forming the connection pin terminal of the module substrate is divided into a normal connection region coupled with a connection terminal of the main circuit board and an FPCB connection region coupled with a lead wire provided in the FPCB, the first pogo pin ( 149 is connected in the normal connection area, and the second pogo pin (159) is connected in the FPCB connection area.
  3. 제2항에 있어서,The method of claim 2,
    상기 제2포고핀(159)은 상기 제2포고핀(149) 보다 길이가 긴 것을 특징으로 하는 핀블록.The second pogo pin (159) is a pin block, characterized in that longer than the second pogo pin (149).
  4. 제2항에 있어서,The method of claim 2,
    상기 접속핀은 상기 정상 접속영역에 일정 폭(W)을 갖는 트렌치(115a)가 구비되고,The connection pin is provided with a trench 115a having a predetermined width (W) in the normal connection region,
    상기 제1포고핀(149)는 상부핀(141) 및 상기 상부핀(141)의 일 부위를 수용하는 하우징(143)을 포함하고,The first pogo pin 149 includes an upper pin 141 and a housing 143 for accommodating a portion of the upper pin 141.
    상기 상부핀(141)은,The upper pin 141,
    일 단부는 상기 하우징 내부에 수용되고, 상기 하우징 외부로 돌출되는 몸체(141a) 및 상기 몸체의 단부에 형성되는 테이퍼부(141b)를 포함하고,One end is accommodated in the housing, and includes a body 141a protruding out of the housing and a tapered portion 141b formed at an end of the body,
    상기 테이퍼부(141b)는,The tapered portion 141b,
    상기 트렌치의 폭보다 더 큰 제1 직경(D1), 상기 트렌치의 폭과 동일한 제2 직경(D2), 및 상기 트렌치의 폭보다 작은 제3 직경(D3)을 순차적으로 갖도록 구성되는 것을 특징으로 하는 핀블록.And a first diameter D1 larger than the width of the trench, a second diameter D2 equal to the width of the trench, and a third diameter D3 smaller than the width of the trench. Pinblock.
  5. 제4항에 있어서,The method of claim 4, wherein
    상기 테이퍼부(141b)는 반타원구형, 원뿔형, 또는 반구형으로 형성되는 것을 특징으로 하는 핀블록.The tapered portion (141b) is a pin block, characterized in that formed in a semi-elliptic, conical, or hemispherical.
  6. 제4항에 있어서,The method of claim 4, wherein
    일 단부는 상기 하우징 내부에 수용되고, 타 단부는 상기 하우징 외부로 돌출되는 상부핀을 더 포함하는 것을 특징으로 하는 핀블록.One end is accommodated in the housing, the other end pin block further comprises an upper pin protruding out of the housing.
  7. 제1항에 있어서,The method of claim 1,
    상기 플로팅부(240)는 외곽 테두리 일부가 상부로 연장 형성되는 가이드블록(247)을 더 구비하고, 상기 가이드블록(247)의 내측면에는 중심부로 단차지게형성되는 안내면(247a)을 포함하는 것을 특징으로 하는 핀블록.The floating part 240 further includes a guide block 247 having a portion of an outer edge extending upward, and an inner surface of the guide block 247 includes a guide surface 247a which is formed to be stepped toward the center. Pin block characterized in that.
  8. 제1항 내지 제7항 중에서 선택된 어느 한 항의 핀블록을 포함하는 것을 특징으로 하는 검사 장치.An inspection apparatus comprising a pin block of any one of claims 1 to 7.
PCT/KR2015/001158 2015-01-27 2015-02-04 Pin block and testing device having same WO2016122039A1 (en)

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Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106790901A (en) * 2017-01-10 2017-05-31 深圳市思榕科技有限公司 A kind of pogo pin mechanisms floating installation
US11493551B2 (en) 2020-06-22 2022-11-08 Advantest Test Solutions, Inc. Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
US11549981B2 (en) 2020-10-01 2023-01-10 Advantest Test Solutions, Inc. Thermal solution for massively parallel testing
US11567119B2 (en) 2020-12-04 2023-01-31 Advantest Test Solutions, Inc. Testing system including active thermal interposer device
US11573262B2 (en) 2020-12-31 2023-02-07 Advantest Test Solutions, Inc. Multi-input multi-zone thermal control for device testing
US11587640B2 (en) 2021-03-08 2023-02-21 Advantest Test Solutions, Inc. Carrier based high volume system level testing of devices with pop structures
US11656273B1 (en) 2021-11-05 2023-05-23 Advantest Test Solutions, Inc. High current device testing apparatus and systems
US11674999B2 (en) 2020-11-19 2023-06-13 Advantest Test Solutions, Inc. Wafer scale active thermal interposer for device testing
US11808812B2 (en) 2020-11-02 2023-11-07 Advantest Test Solutions, Inc. Passive carrier-based device delivery for slot-based high-volume semiconductor test system
US11821913B2 (en) 2020-11-02 2023-11-21 Advantest Test Solutions, Inc. Shielded socket and carrier for high-volume test of semiconductor devices
US11835549B2 (en) 2022-01-26 2023-12-05 Advantest Test Solutions, Inc. Thermal array with gimbal features and enhanced thermal performance

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102548793B1 (en) * 2016-08-22 2023-06-27 세메스 주식회사 Apparatus for testing semiconductor devices
KR102628818B1 (en) * 2017-02-24 2024-01-25 삼성전자주식회사 Pogo module and electronic device including thereof
KR101970805B1 (en) * 2017-06-13 2019-04-19 프라임텍 주식회사 Pin block having enhanced accuracy
KR102059870B1 (en) * 2019-01-09 2019-12-27 금동식 Contactor for testing camera module
KR102151695B1 (en) * 2019-06-10 2020-09-03 주식회사 엔티에스 Contact-type terminal connection device for testing
WO2021093330A1 (en) * 2019-11-12 2021-05-20 苏州华兴源创科技股份有限公司 Probe module
KR102377330B1 (en) 2020-07-22 2022-03-22 신동익 Pin block device for printed circuit board testing apparatus
KR102174269B1 (en) * 2020-09-22 2020-11-04 주식회사 새한마이크로텍 Probe assembly for inspection of chip parts
KR102292037B1 (en) * 2020-12-18 2021-08-23 황동원 Contact and socket device for burn-in and testing semiconductor IC
KR102357377B1 (en) * 2021-09-06 2022-02-08 가온솔루션 주식회사 Probe pin and probe unit with them
KR102654553B1 (en) * 2023-12-13 2024-04-04 주식회사 프로이천 Nest plate

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040046583A1 (en) * 2002-09-06 2004-03-11 Wei-Fang Fan Modular socket of integrated circuit
KR20080023028A (en) * 2006-09-08 2008-03-12 삼성전자주식회사 Pogo pin and contactor for testing semiconductor device comprising the same pogo pin
US20110298487A1 (en) * 2010-06-08 2011-12-08 Nobuhiro Katsuma Semiconductor testing apparatus and testing method
KR101348422B1 (en) * 2013-10-08 2014-01-10 주식회사 아이티엔티 Pogo block device of automatic test equipment
KR101471652B1 (en) * 2013-07-01 2014-12-26 (주)티에스이 Insert and Apparatus for testing semiconductor package including the same

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040046583A1 (en) * 2002-09-06 2004-03-11 Wei-Fang Fan Modular socket of integrated circuit
KR20080023028A (en) * 2006-09-08 2008-03-12 삼성전자주식회사 Pogo pin and contactor for testing semiconductor device comprising the same pogo pin
US20110298487A1 (en) * 2010-06-08 2011-12-08 Nobuhiro Katsuma Semiconductor testing apparatus and testing method
KR101471652B1 (en) * 2013-07-01 2014-12-26 (주)티에스이 Insert and Apparatus for testing semiconductor package including the same
KR101348422B1 (en) * 2013-10-08 2014-01-10 주식회사 아이티엔티 Pogo block device of automatic test equipment

Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106790901B (en) * 2017-01-10 2019-06-07 深圳市思榕科技有限公司 A kind of pogopin mechanism floating installation
CN106790901A (en) * 2017-01-10 2017-05-31 深圳市思榕科技有限公司 A kind of pogo pin mechanisms floating installation
US11493551B2 (en) 2020-06-22 2022-11-08 Advantest Test Solutions, Inc. Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
US11841392B2 (en) 2020-06-22 2023-12-12 Advantest Test Solutiions, Inc. Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
US11549981B2 (en) 2020-10-01 2023-01-10 Advantest Test Solutions, Inc. Thermal solution for massively parallel testing
US11940487B2 (en) 2020-10-01 2024-03-26 Advantest Test Solutions, Inc. Thermal solution for massively parallel testing
US11821913B2 (en) 2020-11-02 2023-11-21 Advantest Test Solutions, Inc. Shielded socket and carrier for high-volume test of semiconductor devices
US11808812B2 (en) 2020-11-02 2023-11-07 Advantest Test Solutions, Inc. Passive carrier-based device delivery for slot-based high-volume semiconductor test system
US11674999B2 (en) 2020-11-19 2023-06-13 Advantest Test Solutions, Inc. Wafer scale active thermal interposer for device testing
US11774492B2 (en) 2020-12-04 2023-10-03 Advantest Test Solutions, Inc. Test system including active thermal interposer device
US11754620B2 (en) 2020-12-04 2023-09-12 Advantest Test Solutions, Inc. DUT placement and handling for active thermal interposer device
US11609266B2 (en) 2020-12-04 2023-03-21 Advantest Test Solutions, Inc. Active thermal interposer device
US11567119B2 (en) 2020-12-04 2023-01-31 Advantest Test Solutions, Inc. Testing system including active thermal interposer device
US11846669B2 (en) 2020-12-04 2023-12-19 Advantest Test Solutions, Inc. Active thermal interposer device
US11852678B2 (en) 2020-12-31 2023-12-26 Advantest Test Solutions, Inc. Multi-input multi-zone thermal control for device testing
US11573262B2 (en) 2020-12-31 2023-02-07 Advantest Test Solutions, Inc. Multi-input multi-zone thermal control for device testing
US11742055B2 (en) 2021-03-08 2023-08-29 Advantest Test Solutions, Inc. Carrier based high volume system level testing of devices with pop structures
US11587640B2 (en) 2021-03-08 2023-02-21 Advantest Test Solutions, Inc. Carrier based high volume system level testing of devices with pop structures
US11656273B1 (en) 2021-11-05 2023-05-23 Advantest Test Solutions, Inc. High current device testing apparatus and systems
US11835549B2 (en) 2022-01-26 2023-12-05 Advantest Test Solutions, Inc. Thermal array with gimbal features and enhanced thermal performance

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