WO2017061651A1

WO2017061651A1 - Contact pin for testing electric terminal

Info

Publication number: WO2017061651A1
Application number: PCT/KR2015/010695
Authority: WO
Inventors: 장용일
Original assignee: 넥슨전자주식회사
Priority date: 2015-10-06
Filing date: 2015-10-08
Publication date: 2017-04-13
Also published as: KR101577396B1

Abstract

An embodiment of the present invention may comprise: an inner body which is a first column; an upper contact end which is a second column, an inner surface of the second column covering a circumferential surface of one end of the inner body; a lower contact end which is a third column, an inner surface of the third column covering a circumferential surface of the other end of the inner body; a spring member integrally connected between the upper contact end and the lower contact end; and at least one connecting member integrally connecting the inner surface of the second column and a surface of one end of the inner body.

Description

Contact pins for electrical terminal testing

The present invention relates to a contact pin for electrical terminal test, the contact pin for electrical terminal test for testing the electrical terminal provided on the PCB substrate.

Pogo pins, also known as spring pins, are used in semiconductor testing and IT applications. Pogo pins are probes used to test inspection equipment such as semiconductor wafers, LCD modules, camera modules, image sensors and semiconductor packages.

Conventional pogo pins, as shown in FIG. 1, include a spring 14 for applying an elastic force to the upper probe 12, the lower probe 13, the upper probe 12 and the lower probe 13, and the upper probe ( 12 and a cylindrical body 11 for receiving the top 14 of the lower probe 13 and the spring 14.

One end of the upper probe 12 and the lower probe 13 is caught by the cylindrical body 11 to prevent departure from the cylindrical body 11 to the outside, and between the upper probe 12 and the lower probe 13 The elastic force is received by the spring 14 installed.

Figure 2 is a cross-sectional view showing a plurality of pogo pins accommodated in one insulating body, illustrating a semiconductor package inspection socket. The socket for inspecting a semiconductor package 20 includes a plurality of pogo pins 6 and an insulating body 1 for accommodating the plurality of pogo pins at predetermined intervals. The plurality of pogo pins 6 allows the upper probe 12 to protrude on the top surface of the insulating body 1 and the lower probe 13 to protrude on the bottom surface of the insulating body 1, the spacing between the pogo pins being the upper probe The insulating body (1) is equal to the interval of the external terminal (3a) of the semiconductor package 3 in contact with (12) and the same distance as the contact pad (5a) of the test board (5) in contact with the lower probe (13). Is accommodated in 1).

When the semiconductor package 3 is pressed for the semiconductor package inspection, the external terminals 3a of the semiconductor package contact the upper probe 12 of the pogo pin 6, and the lower probe 13 is connected to the test board 5. Contact the contact pads 5a of the pogo pins 6 so that the upper probes 12 and the lower probes 13 are elastically supported by the springs 14 inside the pogo pins 6. ) Can be accurately connected to the semiconductor package.

Existing pogo pins are manufactured by assembling each of the parts after the parts are manufactured by cylindrical machining and then joining them. That is, the cylindrical body, the upper probe, the lower probe, and the spring are separately manufactured through cylindrical processing such as lathe milling machine processing, and these are then assembled into the cylindrical body, the upper probe, the lower probe, and the spring to form a final pogo pin. The production is complete.

However, the cylindrical machining has a limitation in manufacturing various types of bodies, an upper probe, a lower probe, and a spring. There is also the hassle of having to reassemble these parts after each machining.

An object of the present invention is to provide a contact pin for an electrical terminal test for testing the electrical terminal provided on the PCB substrate. It is also an object of the present invention to provide a contact pin for integrated electrical terminal testing, in which the components are not completed as individual processing or assembly by standard products.

The contact pin for electrical terminal test which is embodiment of this invention is provided with the contact end and the spring in the outer surface, and has an inner body which can support the said contact end and the spring inside, The said contact end, a spring, and an inner body Can be manufactured in one piece.

The electrical contact test contact pin may include an inner body that is a first pillar body; A second pillar, wherein an inner surface of the second pillar surrounds a circumferential surface of one end of the inner body; A third pillar, the lower contact end having an inner surface of the third pillar surrounding the peripheral surface of the other end of the inner body; A spring member integrally connected between the upper and lower contact ends; And one or more connecting members integrally connecting the inner surface of the second pillar and the surface of one end of the inner body.

It may be characterized in that the contact pin made of a single piece by pressing the plate material of a single material.

The inner body, the upper contact end, the lower contact end, the spring member, and the connecting member may be made of a single material made of the same single body.

The single material constituting the contact pin for the electrical terminal test may include a BeCu material.

According to the exemplary embodiment of the present invention, various types of contact pins may be manufactured by manufacturing the inner body, the upper contact end, the lower contact end, the connection member, and the spring member in one unitary material. In addition, unlike conventional cylindrical machining, it does not require a separate assembly process, simplifying the production work.

In addition, according to the embodiment of the present invention, it can be supported through the inner body, and has a structure in which the upper contact end, the lower contact end, the connecting member, and the spring member exist in the outer body, thereby simplifying the production work have.

1 is a cross-sectional view of a conventional pogo pin.

2 is a cross-sectional view of a socket for semiconductor package inspection using a conventional pogo pin.

3 is a schematic conceptual diagram of a manufacturing process of a contact pin for electrical terminal test according to an embodiment of the present invention;

4 is a conceptual diagram illustrating an example in which a contact pin for electrical terminal test is manufactured through a press working in a sheet according to an embodiment of the present invention.

5 is a front perspective view of a contact pin for electrical terminal test according to an embodiment of the present invention.

6 is a side perspective view of a contact pin for an electrical terminal test according to an embodiment of the present invention;

7 is a cross-sectional view in the A direction of the upper contact end of the contact pin for an electrical terminal test according to an embodiment of the present invention.

8 is a sectional view in the A direction of the upper contact end of another form of the contact pin for an electrical terminal test according to an embodiment of the present invention.

Fig. 9 is a cross-sectional view in the direction of B of a holder portion of a contact pin for electrical terminal test according to an embodiment of the present invention.

10 is a perspective view of a contact pin for electrical terminal test produced by varying the interval in the spring according to an embodiment of the present invention.

11 illustrates various types of lower contact ends in accordance with an embodiment of the present invention.

12 illustrates various spring lengths in accordance with an embodiment of the present invention.

Figure 13 illustrates the location of various carrier members in accordance with an embodiment of the present invention.

The present invention is provided with a contact end and a spring on the outer surface, the inner body which can support the contact end and the spring therein, the contact end, the spring, and the contact pin for the electrical terminal test the inner body is made integrally Is to provide.

Advantages and features of the present invention, and methods for achieving them will be apparent with reference to the embodiments described below in detail with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below, but may be implemented in various forms, and is provided to fully inform the scope of the invention to those skilled in the art. The invention is defined only by the scope of the claims. In addition, in the following description of the present invention, if it is determined that related related technologies and the like may obscure the gist of the present invention, detailed description thereof will be omitted. In addition, the present invention is not limited to the embodiments disclosed below, but may be implemented in different forms, the same reference numerals in the drawings refer to the same elements.

Figure 3 is a schematic conceptual diagram of the manufacturing process of the electrical terminal test contact pin according to an embodiment of the present invention, Figure 4 is a contact pin for electrical terminal test is produced through the press working in the plate according to an embodiment of the present invention A conceptual diagram showing an example.

The contact pin 10 for electric terminal test, such as a conventional pogo pin, separates the inner body 100, the upper and lower contact ends 300, and the spring member 400 through primary processing operations such as lathe milling machine processing. There is a hassle that requires secondary work to make and assemble it. Due to the nature of the primary machining operation there is a problem that can not produce the inner body 100, the upper and lower contact end 300, the spring member 400 of various forms.

The contact pin 10 for an electrical terminal test according to the present invention has a contact end and a spring provided on an outer surface thereof, and has an inner body capable of supporting the contact end and the spring therein. A flat material of a single material (hereinafter referred to as "plate material") is press-processed so that the contact end, the spring, and the inner body are made in one piece. Since it is manufactured in one piece, it is possible to manufacture various types of contact pins. In addition, unlike conventional cylindrical machining, it does not require a separate assembly process, simplifying the production work.

To this end, as shown in FIG. 3, a flat plate is pressed to produce a contact pin 10 for electric terminal test. Here, the press working refers to a method of processing by cutting and bending the plate. In detail, as shown in FIG. 4, an inner part, an upper part 200, a lower part 300, and a spring member 400, which will be cut into a plate and become an inner body 100, After providing the outer member (outter part) and the connection member 250 to be rolled, the inner member is rolled to form a columnar inner body 100, and in turn the outer member is cut and processed to the upper contact end 200, The lower contact end 300 and the spring member 400 may be made to finally manufacture the contact pin 10 for the electrical terminal test.

Therefore, the inner body 100, the upper contact end 200, the lower contact end 300, the spring member 400, and the connection member 250 forming the contact pin 10 for the final electrical terminal test are integrally formed. It is made of the same single material.

When the inner body 100 is formed using an inner member, various shapes such as rolling round, or folding or cutting in a 'c' shape, or rolling in a '@' shape according to the outer diameter may be used. By processing to a shape it can be produced the inner body 100 of various forms. In addition, it will be apparent that the upper contact end 200 and the lower contact end 300 may also have various types of contact end structures.

As the base plate, various materials having conductivity may be used. For example, the plate may be formed of a beryllium cooper (BeCu) material having conductivity and elasticity. However, the conductive material may be used without being limited to beryllium cooper (BeCu) material.

In the following description, a contact pin is a pogo pin for inspecting a semiconductor wafer, an LCD module, a camera module, an image sensor, and a semiconductor package, as well as various connection pins such as various sockets and battery connection terminals of a mobile phone. It can include any electrically conductive pin that can be used in the.

In addition, hereinafter, the inner body 100 is referred to as an inner part, and the upper contact end 200, the lower contact end 300, and the spring member 400 will be collectively referred to as an outer part. .

5 is a front perspective view of a contact pin for electrical terminal test according to an embodiment of the present invention, Figure 6 is a side perspective view of a contact pin for electrical terminal test according to an embodiment of the present invention, Figure 7 is an embodiment of the present invention A is a cross-sectional view in the A direction of the upper contact end of the contact pin for electrical terminal according to the present invention, Figure 8 is a cross-sectional view in the A direction of the upper contact end of another form of the contact pin for electrical terminal test according to an embodiment of the present invention, Figure 9 is B direction sectional drawing of the holder part of the contact pin for electrical terminal tests which concerns on embodiment of this invention.

The contact pin for testing an electrical terminal of the present invention may include an inner body 100, an upper contact end 200, a lower contact end 300, a spring member 400, and a connection member 250. The inner body 100 is a pillar (hereinafter, referred to as a 'first pillar'), and the pillar may be a pillar having a central shape, or a pillar structure having various shapes. Can be.

Since the inner body 100 is manufactured by press working, it may be manufactured in various forms. For example, as shown in FIG. 8 (a), the cross section of the pillar body of the inner body 100 may have a branch line shape, or may have a rectangular shape as shown in FIG. 8 (b).

The upper contact end 200 is wrapped and positioned on one surface of the inner body 100, and the lower contact end 300 is wrapped and positioned on the other end surface of the inner body 100.

The upper contact end 200 is a columnar body (hereinafter, referred to as a 'second pillar'), and the inner surface of the second pillar is positioned on the circumferential surface of one end of the inner body 100. The upper contact end 200 is integrally connected with the inner body 100 by the connection member 250.

The lower contact end 300 is a columnar body (hereinafter, referred to as a 'third pillar'), and the inner surface of the third pillar is positioned on the circumferential surface of the other end of the inner body 100.

Therefore, the lower contact end 300 contacts the electrical terminal of the test object and transmits a signal of the electrical terminal to the test diagnostic apparatus through the upper contact end 200. In some cases, the reverse may be used.

For reference, the meaning of being wrapped is meant to be in contact with each other, and functions as an energization path due to contact between the inner surface and the surface. The same also applies to the following.

The spring member 400 is integrally connected between the upper contact end 200 and the lower contact end 300 and is a member including a spiral.

The spring member 400 includes a spiral upper spring 410 connected to the upper contact end 200, a spiral lower spring 430 connected to the lower contact end 300, an upper spring 410 and a lower spring 430. It may include a holder member 420 in the form of a pillar to connect. The spiral of the upper spring 410 and the lower spring 430 may be manufactured by press working. In addition, the carrier member 440 may be a member coupled to the holder member 420 to protrude. The carrier part 440 is a member that allows the holder part 420 to be easily gripped from the outside.

In addition, since the holder member 420 is manufactured by press working, it may have various forms. For example, the cross section of the pillar body of the inner body 100 may have a rectangular shape as shown in FIG. 9 (a), or may have a cylindrical shape as shown in FIG. 9 (b).

The connection member 250 is a member produced by press working in which the inner surface of the second pillar body and the surface of one end of the inner body 100 are integrally connected. The inner body 100, which is an inner member, and the outer member (the upper contact end 200, the lower contact end 300, and the spring member 400) may be integrally connected through the connection member 250. One or more of the connection members 250 may be provided to connect the inner surface of the second pillar and the surface of one end of the inner body 100.

As a result, as described above, the inner body 100, the upper contact end 200, the lower contact end 300, the connection member 250, and the spring member 400 are manufactured from a single integral material by pressing. As a result, as shown in FIG. 8, various shapes of the inner body 100 may be manufactured, and as illustrated in FIG. 9, various shapes of the holder member 420 may be manufactured. In addition, unlike conventional cylindrical machining, it does not require a separate assembly process, simplifying the production work.

In addition, the contact pin 10 for testing various types of electrical terminals can be easily manufactured, and the shape of the spring can be varied, and the spacing in the spring can be varied as shown in FIG. 10.

In addition, as shown in FIG. 11, the structure of the lower contact end 300 may be manufactured in various forms. Conventional cylindrical machining is difficult to process the linear lower contact end 300, but can be produced in various forms the structure of the lower contact end 300 through the press working as in the present invention.

In addition, as illustrated in FIG. 12, the length of the spring may be variously manufactured, but the length of the spring may be changed to be longer or shorter than the length of the spring of FIG. 12 (a). For example, as shown in FIG. 12 (b), the length of the spring can be made long.

In addition, the carrier member 440 may be manufactured to be placed at various positions, and the lower contact end as shown in FIGS. 13 (b) and (c) at the position of the carrier member 440 of FIG. 13 (a) described in the embodiment of the present invention. The 300 may be omitted and the position of the carrier member 440 may be provided at another position.

The embodiments in the above description of the present invention are presented by selecting the most preferred examples to help those skilled in the art from the various possible examples, and the technical spirit of the present invention is not necessarily limited or limited only by the embodiments. However, various changes, modifications, and other equivalent embodiments may be made without departing from the technical spirit of the present invention.

The present invention can be applied to the field of contact pins for electrical terminal test for testing electrical terminals provided on a PCB substrate.

Claims

A contact pin having a contact end and a spring on an outer surface, an inner body capable of supporting the contact end and a spring therein, wherein the contact end, the spring, and the inner body are integrally manufactured.
The contact pin of claim 1,

An inner body that is a first cylinder;

A second pillar, wherein an inner surface of the second pillar surrounds a circumferential surface of one end of the inner body;

A third pillar, the lower contact end having an inner surface of the third pillar surrounding the peripheral surface of the other end of the inner body;

A spring member integrally connected between the upper and lower contact ends; And

One or more connecting members integrally connecting the inner surface of the second pillar and the surface of one end of the inner body;

Contact pins for electrical terminal testing comprising a.
The method according to claim 2,

Contact pin for electrical terminal test, characterized in that the contact pin made by pressing a single flat material of a single material made of a single piece.
The method according to claim 3,

And the inner body, the upper contact end, the lower contact end, the spring member, and the connecting member are integrally formed of the same single material.
The method according to claim 4,

The single material constituting the contact pin for the electrical terminal test, the contact pin for electrical terminal comprising a BeCu material.