KR20230102167A - Z type insulated barrel contact pin for testing electric terminal - Google Patents

Abstract

The present invention relates to a contact pin for testing electrical terminals mounted on a printed circuit board, etc. The upper contact end, the lower contact end, and the Z-type spring can be manufactured in various forms, respectively, by assembling and providing an insulation barrel made of an insulator to a pin in which the mold spring is integrally manufactured, and the manufacturing process is simplified due to the simple structure. Not only can cost be reduced, but also straightness, twist and electrical properties can be improved.

Description

Z type insulated barrel contact pin for electric terminal test {Z TYPE INSULATED BARREL CONTACT PIN FOR TESTING ELECTRIC TERMINAL}

The present invention relates to a contact pin for testing an electrical terminal for testing an electrical terminal mounted on a printed circuit board, etc. It relates to a type insulated barrel contact pin.

A pogo pin, generally called a spring pin, is used for testing in semiconductor and IT fields. These pogo pins are probes used during testing of inspection objects such as semiconductor wafers/packages, LCD modules, camera modules, and image sensors.

1 is a diagram for explaining a general pogo pin.

Referring to FIG. 1, in general, the pogo pin 10 includes an upper probe 11, a lower probe 12, a spring 13 providing elastic force between the upper and lower probes 11 and 12, and an upper It includes a body 14 accommodating the lower end of the probe 11, the upper end of the lower probe 12, and the spring 13 therein.

2 is a cross-sectional view of a socket for inspecting a semiconductor package using a general pogo pin.

Referring to FIG. 2 , a socket 1 for inspecting a semiconductor package generally includes a plurality of pogo pins 10 and an insulating body 20 in which the plurality of pogo pins 10 are accommodated at predetermined intervals.

In the pogo pin 10, the upper probe 11 protrudes upward from the insulating body 20, and the lower probe 12 protrudes downward from the insulating body 20. At this time, the distance between the pogo pins 10 is the distance between the external terminal 2a of the semiconductor package 2 contacting the upper probe 11 and the contact pad of the test board 3 contacting the lower probe 12. It is accommodated so that it has the same spacing as (3a).

When the semiconductor package 2 is pressed for semiconductor package inspection, the external terminals 2a of the semiconductor package 2 come into contact with the upper probe 11 of the pogo pin 10, and the lower probe 12 is tested. In contact with the contact pad 3a of the board 3, the upper probe 11 and the lower probe 12 are elastically supported by the spring 13 inside the pogo pin 10 so that the semiconductor package 2 The semiconductor package can be inspected by electrically connecting the test board (3) with the test board (3).

However, general pogo pins are produced by separately manufacturing the upper probe, lower probe, spring, and body using MCT machining or CNC machining, and then assembling them. Cylindrical machining using MCT machining or CNC machining is having various shapes

It was difficult to manufacture the upper probe, lower probe, spring, and body, and in particular, the work was cumbersome because these parts had to be reassembled after each part was processed.

In order to solve this problem, a contact pin for electrical terminal test with a simplified manufacturing process has been proposed in Republic of Korea Patent Registration No. 10-1577396 (registration date: 2015.12.08.). Republic of Korea Patent Registration No. 10-1577396 is proposed by the present applicant, and the upper probe, lower probe, spring, and body constituting the pogo pin are separately manufactured through processing, and then assembled by assembling through the assembly process. As one plate was processed and manufactured as an integral part, the assembly process was omitted, thereby simplifying the manufacturing process to some extent.

However, the contact pin according to the prior art proposed in Korean Patent Registration No. 10-1577396 has a first pillar chain inner body, a second pillar chain upper contact end, a third pillar chain lower contact end, the upper contact end and the lower contact end It is composed of a spring member integrally connected between the spring member and one connecting member integrally connecting the inner surface of the second columnar body and one end of the inner body, and the structure is complicated and the manufacturing process is complicated, and the contact In some cases, bending may occur due to lack of strength in the part for maintaining the straightness of the

KR 10-1577396 B1, 2015. 12. 08.

Therefore, the present invention has been proposed to solve the problems of the prior art, and has a simple structure as it is composed of a single part, improves insulation and stability by making the exoskeleton made of an insulating material, and reduces manufacturing costs by simplifying the shape of the product. It is about a Z-type insulated barrel contact pin for electrical terminal testing that can be done.

The present invention according to an aspect for achieving the above object is a voice contact stage; It is integrally formed between the lower contact unit and the upper contact end and the lower contact end to connect the upper contact end and the lower contact end to each other, including a spring formed of a Z-shaped spring, and an outside insulator; plastic resins Provides a Z-type contact pin for electrical terminal testing that is assembled with an insulated barrel.

Preferably, the upper contact end, the lower contact end, and the spring may be characterized in that they are produced by pressing a flat plate material of a single material and then rolling or folding the press-worked plate material.

Preferably, it may be characterized in that the spring and the lower contact end are formed in a symmetrical structure.

Preferably, the upper contact end and the lower contact end may form a plurality of contact points.

Preferably, the upper contact end, the lower contact end, and the Z-shaped spring may be formed of a single material such as beryllium cooper (BeCu) or integrally formed of a heterogeneous material made of one material.

Preferably, the insulating barrel may be characterized in that it is formed of an insulating material such as plastic resin.

As described above, according to the present invention, the upper contact end, the lower contact end, and the Z-type spring are provided by assembling and providing a contact pin integrally manufactured with a spring after pressing a base material of a single material to an insulating barrel. Each can be manufactured in various shapes, and the structure is simple, which simplifies the manufacturing process to reduce manufacturing costs, as well as improve straightness, twist, and electrical characteristics.

1 is a cross-sectional view of a typical pogo pin;
2 is a cross-sectional view of a socket for inspecting a semiconductor package using a general pogo pin;
3 is a view showing a Z-shaped insulating barrel contact pin for testing an electrical terminal according to an embodiment of the present invention;
4 is a top plan view of the contact pins shown in FIG. 3;
5 is a cross-sectional view of the contact pin shown in FIG. 3;
6 to 8 are diagrams for explaining a manufacturing process of the contact pin shown in FIG. 3;
9 is a front view illustrating a modified example of the contact pin shown in FIG. 3;

Hereinafter, the advantages and characteristics of the present invention, and methods for achieving them will become clear with reference to the embodiments described below in detail in conjunction with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below, and may be implemented in a variety of different forms. And it is provided to completely inform those skilled in the art of the scope of the invention to which the present invention belongs, the present invention

is only defined by the scope of the claims. In addition, in describing the present invention, if it is determined that related known technologies may obscure the gist of the present invention, a detailed description thereof will be omitted, and the same reference numerals in the drawings refer to the same elements.

FIG. 3 is a view for explaining a Z-shaped insulated barrel contact pin for testing an electric terminal according to an embodiment of the present invention, and FIG. 4 is a plan view of an upper contact end of the contact pin shown in FIG. 3 viewed from above. Here, (a) of FIG. 3 is a front view of the contact pin, (b) is a side view of the contact pin, and FIG. 4 is a cross-sectional view of the contact pin.

3 and 4, the Z-shaped insulating barrel contact pin 30 for testing the electric terminal according to the embodiment of the present invention has an upper contact end 31, a lower contact end 32, and an upper contact end 31 ) and the lower contact end 32 and an insulating barrel 34 surrounding the Z-shaped spring 33. At this time, the upper contact end 31, the lower contact end 32, and the Z-shaped spring 33 are manufactured by punching the base material, the plate A, into a desired shape, folding it, and integrally pressing it.

Thereafter, the Z-shaped spring 33 manufactured by press working is put into the insulation barrel 34 and assembled and fixed.

In this way, the upper contact end 31, the lower contact end 32, and the Z-shaped spring 33 are integrally manufactured to simplify the manufacturing process, thereby reducing manufacturing costs.

In addition, the upper contact end 31, the lower contact end 32, and the Z-shaped spring 33 are integrally manufactured to improve conductivity between the upper contact end 31 and the lower contact end 32.

In addition, the barrel of the pogo pin is made of an insulator to reduce defects caused by interference with the pogo pins at narrow intervals.

Referring to FIG. 9 , a contact pin 50 according to another modification includes an upper contact end 51, a Z-shaped spring 53, an insulating barrel 54, and a shoulder member 52. The upper contact end 51, the spring 53, and the shoulder member 52 have the same shape as the upper contact end 31 and the lower contact end 32 of the Z-shaped insulating barrel contact pin shown in FIG. On the other hand, the lower contact end may be formed in a straight bar (BAR) shape so as to be directly bound to the printed circuit board.

As described above, the technical spirit of the present invention has been specifically described in the preferred embodiment, but the above preferred embodiment is for explanation and not for limitation. As such, those skilled in the art will understand that various TTLF examples are possible through the combination of the embodiments of the present invention within the scope of the technical idea of the present invention.

1: Socket for semiconductor package inspection
2: Semiconductor package
2a: external terminal
3 : Test board
3a: contact pad
10 : pogo pin
11: upper probe
12: lower probe
13 : spring
14: body
20: insulating body
A: Plate
30, 50: Z-type spring insulated barrel contact pin
31, 51: upper contact stage
32: lower contact end
52: shoulder member
33, 53: Z-type spring
34, 54: insulation barrel

Claims (6)

upper contact end; lower contact end; and
A Z-shaped spring integrally formed between the upper contact end and the lower contact end to interconnect the upper contact end and the lower contact end;
A Z-type insulated barrel contact pin for electrical terminal testing, characterized in that for assembling a barrel made of an outside insulator, including a.
According to claim 1,
The upper contact end, the lower contact end, and the spring are Z-type insulated barrel contact pins for electrical terminal testing, characterized in that produced by pressing a flat plate material of a single material and then folding the pressed plate material.
According to claim 1,
The upper contact end and the lower contact end are Z-type insulated barrel contact pins for electrical terminal testing, characterized in that formed in a symmetrical structure.
According to claim 1,
The lower contact end is a Z-type insulated barrel contact pin for electrical terminal testing, characterized in that formed in a bar (bar) shape.
According to claim 1,
The upper contact end, the lower contact end, and the spring are all of a single material such as beryllium cooper (BeCu) or integrally formed of a heterogeneous material made of one plate, Z-type insulated barrel contact pin for electric terminal test .
According to claim 1,
A Z-type insulated barrel contact pin for electrical terminal testing, characterized in that the upper contact end, the lower contact end, and the Z-type spree are assembled into a barrel made of an insulator.

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