WO2021118017A1

WO2021118017A1 - Hollow test pin

Info

Publication number: WO2021118017A1
Application number: PCT/KR2020/012220
Authority: WO
Inventors: 전진국; 차상훈; 정창모
Original assignee: 주식회사 오킨스전자
Priority date: 2019-12-12
Filing date: 2020-09-10
Publication date: 2021-06-17
Also published as: KR102158027B1

Abstract

The present invention relates to a hollow test pin comprising: a hollow body having a contact cusp placed at the bottom thereof; an elastic member received in the body; and a plunger partially inserted into the body and brought into contact with the elastic member, wherein the body comprises: a large-diameter portion providing a receiving space in which the elastic member is received; and a small-diameter portion provided integrally with the large-diameter portion with a shoulder portion interposed therebetween, having a structure with a smaller diameter than that of the large-diameter portion, and having the contact cusp placed at the bottom thereof.

Description

hollow test pin

The present invention relates to a hollow test pin, and more particularly, to a hollow test pin suitable for testing of high voltage and high current.

In general, a semiconductor product completed through a semiconductor manufacturing process undergoes various types of tests to evaluate the presence or absence of normal operation and reliability.

For example, an electrical characteristic test to check normal operation and disconnection by connecting all input/output terminals of a semiconductor product to a test signal generating circuit, and some input/output terminals such as a power input terminal of a semiconductor product to connect to a test signal generating circuit to reduce stress By applying the application, a burn-in test is performed to check the lifespan of the semiconductor product and whether defects occur.

In general, in order to inspect the electrical characteristics of a semiconductor device, an electrical connection between the semiconductor device and the test equipment must be made smoothly. As an inspection device for connecting the semiconductor device and the test equipment, there are a socket board, a probe card, a connector, and the like.

Here, the socket board is used when the semiconductor product is in the form of a semiconductor package, and the probe card is used when the semiconductor product is in the form of a semiconductor chip.

And in some discrete devices, connectors are also used as inspection devices that connect semiconductor devices and test equipment.

This inspection device serves to connect the semiconductor device side and the test equipment side to each other so that electrical signals can be exchanged in both directions. To this end, the inspection device is equipped with a probe pin as a means for contacting the semiconductor device side. have.

As an example, the test is carried out in a state in which a test board or semiconductor package such as a PCB board is mounted on a separate test socket, and the shape of the test socket is basically determined according to the shape of the test board or semiconductor package and the test socket is tested. By mechanically contacting the pad on the substrate side or the semiconductor package side and the connection terminal on the test socket side, it serves to connect the test substrate or the semiconductor package to the test equipment.

That is, the test socket is connected to the test board or the semiconductor package and at the same time connected to the test equipment and connected to each other, so that the signal of the test equipment is transmitted to the test substrate or the semiconductor package to perform the test. A probe pin is used as a means for electrically connecting a plurality of connection terminals of an IC embedded in a test socket and a plurality of pads of a test board or a semiconductor package one-to-one.

In general, a probe pin is a combination of two contact pins and a spring between them. This type of probe pin facilitates the connection between semiconductor devices and test equipment, and has the advantage of cushioning the mechanical shock generated during connection. For this reason, it is a trend that is widely used in most socket boards.

The shape of such a test pin has a very diverse structure depending on needs, such as a structure in which a spring is located outside or inside.

Republic of Korea Patent No. 10-1509200 (registered on March 31, 2015, probe pin with enhanced signal characteristics) of the applicant of the present invention describes a test pin having a structure in which an elastic member is inserted inside.

A more specific configuration of the probe pin proposed in the above registered patent includes a barrel in which an upper plunger and a lower plunger are separately provided, and the upper plunger and the lower plunger and the elastic member are accommodated therein.

In the case of a structure in which the plungers and the barrel are divided as described above, assembly is relatively difficult, and the interface between the lower plunger and the barrel and the interface between the barrel and the upper plunger are provided.

In particular, there is a fear that the detection characteristics may be deteriorated due to an increase in resistance in performing the high voltage and large current characteristics test, and there is a concern that secondary problems such as heat generation in the test pin itself may occur.

Therefore, in the current market, there is a demand for the development of a test pin having a new structure that is easy to assemble while minimizing the resistance component.

Accordingly, an object of the present invention is to provide a hollow test pin suitable for detecting high voltage and high current characteristics.

Another object of the present invention is to provide a hollow test pin that is easy to assemble.

In addition, it is to provide a hollow test pin that makes it easy to adjust the contact force by making the length of the elastic member as long as possible.

The hollow test pin of the present invention for achieving the object as described above includes a hollow body with a contact apex located at the bottom, an elastic member accommodated in the body, and a part inserted into the body to contact the elastic member and a plunger, the body being provided integrally with a large-diameter portion providing an accommodating space in which the elastic member is accommodated, and the large-diameter portion and the shoulder portion interposed therebetween. It consists of a small-diameter part where the contact point is located.

In an embodiment of the present invention, one end of the elastic member may be in contact with the inner surface of the shoulder portion while being inserted into the large diameter portion.

In an embodiment of the present invention, the plunger is provided integrally with the insertion portion inserted into the large-diameter portion and upward with the insertion portion and the plunger shoulder interposed between the large-diameter portion and exposed to the outside of the large-diameter portion, and has a diameter smaller than that of the insertion portion It can be achieved with a smaller exposed portion.

In an embodiment of the present invention, the insertion portion is hollow, and an upper portion of the elastic member may be inserted into the hollow portion of the insertion portion.

In an embodiment of the present invention, the upper end of the elastic member may be in contact with the inner surface of the plunger shoulder.

In an embodiment of the present invention, the length of the insertion part may be 50% of the length of the large diameter part.

The present invention integrates the lower plunger and the body and minimizes the resistance component by increasing the contact area between the upper plunger and the body, thereby easily detecting high voltage and large current characteristics.

In addition, the present invention can complete the assembly by inserting the upper plunger into the lower plunger-integrated hollow body and caulking the upper periphery of the hollow body, thereby providing a structure that is very easy to assemble.

In addition, the present invention can omit the overlapping portion for coupling the conventional lower plunger and the body and the overlapping portion for coupling the upper plunger and the body, so that a longer elastic member can be used compared to the conventional same-length test pin, The cushioning action can be made more smoothly, and there is an effect that the adjustment of the contact force is easy.

In addition, it can be used in various environments by maximizing the variable length at the time of contact, thereby improving versatility.

1 is an exploded perspective view of a hollow test pin according to a preferred embodiment of the present invention.

Figure 2 is a cross-sectional view of the coupled state of Figure 1;

3 is a view showing the state in which the elastic member is compressed by the contact of the lower plunger in FIG. 2 .

4 is a cross-sectional view of a hollow test pin according to another embodiment of the present invention.

- Explanation of symbols -

10: Body 11: Daekyungbu

12: small diameter part 13: contact apical part

14: shoulder 15: receiving space

16: caulking portion 20: elastic member

30: plunger 31: exposed part

32: insertion part 33: plunger shoulder

Advantages and features of the present invention and methods of achieving them will become apparent with reference to the embodiments described below in detail in conjunction with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below, but will be implemented in a variety of different forms, and only these embodiments allow the disclosure of the present invention to be complete, and common knowledge in the technical field to which the present invention belongs It is provided to fully inform the possessor of the scope of the invention, and the present invention is only defined by the scope of the claims. Sizes and relative sizes of layers and regions in the drawings may be exaggerated for clarity of description. Like reference numerals refer to like elements throughout.

Embodiments described herein will be described with reference to plan and cross-sectional views, which are ideal schematic views of the present invention. Accordingly, the shape of the illustrative drawing may be modified due to manufacturing technology and/or tolerance. Accordingly, the embodiments of the present invention are not limited to the specific form shown, but also include changes in the form generated according to the manufacturing process. Accordingly, the regions illustrated in the drawings have schematic properties, and the shapes of the illustrated regions in the drawings are intended to illustrate specific shapes of regions of the device, and not to limit the scope of the invention.

Hereinafter, preferred embodiments of the hollow test pin of the present invention will be described in detail with reference to the accompanying drawings.

1 is an exploded perspective view of a hollow test pin of the present invention, and FIG. 2 is a cross-sectional configuration view of the combined state of FIG. 1 .

1 and 2, respectively, the hollow test pin of the present invention includes a hollow body 10 having a contact apex 13 at a lower portion, an elastic member 20 accommodated inside the body 10, and , is inserted inward from the upper side of the body 10 and is configured to include a plunger 30 in contact with the elastic member 20 .

Hereinafter, the structure of the present invention hollow test pin configured as described above will be described in more detail.

First, the body 10 includes a cylindrical large-diameter portion 11 and a small-diameter portion 12 integrally formed at the lower end of the large-diameter portion 11 . In the drawings, a structure in which the cross-section of the large-diameter portion 11 and the small-diameter portion 12 is circular is illustrated and described, but the cross-section may have a polygonal structure such as a triangle or a square, and in this case, the cross-sectional shape of the plunger is also that of the large diameter portion 11 It shall be the same as the cross-sectional shape.

The end of the small diameter portion 12 has a closed structure, and the central portion protrudes downward to form the contact point portion 13 .

A shoulder portion 14 is formed between the large-diameter portion 11 and the small-diameter portion 12 so that the large-diameter portion 11 and the small-diameter portion 12 having different diameters are integrally formed.

The small diameter portion 12 serves as a conventional lower plunger, but in the present invention, the resistance component can be reduced by integrating the structure of the conventional lower plunger and the barrel.

In addition, since the assembly process for assembling the lower plunger and the barrel structure can be omitted, it is possible to improve assembly properties and improve productivity.

The large diameter portion 11 is hollow and provides an accommodation space portion 15 in which the elastic member 20 is accommodated.

The inner side of the shoulder 14 acts as a seating surface on which one end of the elastic member 20 is seated.

That is, the elastic member 20 may be a coil-type spring, and the diameter of the elastic member 20 is larger than the inner diameter of the small diameter portion 12 and smaller than the inner diameter of the large diameter portion 11 .

The length of the elastic member 20 is slightly smaller than the length of the large-diameter portion 11 .

A part of the plunger 30 is inserted into one end of the large-diameter portion 11 opposite the small-diameter portion 12 .

The plunger 30 includes an insertion portion 32 inserted into the large-diameter portion 11 , and an exposed portion 31 positioned outside the large-diameter portion 11 in the inserted state of the insertion portion 32 .

At least the insertion part 32 is hollow, and for the convenience of manufacturing, the exposed part 31 may also be hollow.

The diameter of the insertion part 32 is larger than the diameter of the exposed part 31 .

The insertion part 32 comes into contact with the inner surface of the large diameter part 11 while being inserted into the large diameter part 11 of the body 10 and accommodates the upper end of the elastic member 20 inside.

That is, the insertion part 32 located on the lower side of the plunger 30 is hollow, and a portion of the upper end of the elastic member 20 is inserted inwardly.

This structure increases the contact area between the plunger 30 and the body 10 to provide a structure suitable for detecting high voltage and high current characteristics, as well as maximize the length of the elastic member 20 .

If the length of the elastic member 20 is longer in the pin of the same length, it is possible to facilitate the buffering action, and the adjustment of the contact force becomes very easy.

In addition, by increasing the variable length of the body 10 and the plunger 30, it can be used for testing in various environments, thereby increasing versatility.

A plunger shoulder 33 is formed between the insertion portion 32 and the exposed portion 31 of the plunger 30, and the upper end of the elastic member 20 is in contact with the plunger shoulder portion 33, When the contact point 13 is in contact with the test target and an upward pressure is applied, the elastic member 20 can be compressed.

In this way, the present invention in a state in which the elastic member 20 is compressed is shown in FIG. 3 .

The upper end of the body 10 includes a caulking portion 16 bent toward the plunger 30 .

That is, the caulking process is performed by inserting the elastic member 20 inside the large-diameter portion 11 of the body 10, and inserting the insertion portion 32 of the plunger 30 into the large-diameter portion 11. 16), so that it can be easily assembled.

Since the plunger shoulder 33 is in contact with the inside of the caulking part 16 , the plunger 30 is not separated from the body 10 .

The insertion portion 32 of the plunger 30 may have a sufficient length to minimize the resistance component at the boundary with the body 10 .

The length of the insertion part 32 may have a maximum length of 50% of the length of the large diameter part 11 . In order to meet the object of the present invention, the length of the insertion portion 32 is assumed to be 50% of the length of the large diameter portion 11 .

As described above in detail, the present invention can improve assembly and reduce resistance components by providing one body 10 by changing the conventional lower plunger into an integrated structure with the barrel.

In addition, it is possible to maximize the length of the elastic member 20 by making the upper plunger 30 a hollow structure, and to maximize the contact area between the plunger 30 and the body 10 to reduce the resistance component. have.

4 is a cross-sectional configuration view of a hollow test pin according to another embodiment of the present invention.

Referring to FIG. 4 , the structure of the body 10 may be the same as that of the embodiment of FIG. 2 , and the plunger 30 may be used as a non-hollow one.

Although the embodiments according to the present invention have been described above, these are merely exemplary, and those of ordinary skill in the art will understand that various modifications and equivalent ranges of embodiments are possible therefrom. Accordingly, the true technical protection scope of the present invention should be defined by the following claims.

The present invention relates to a test pin capable of detecting high voltage and high current characteristics using a physical structure using a natural law, and has potential for industrial application.

Claims

The contact point is located at the bottom and the hollow body;

an elastic member accommodated in the body; and

and a plunger partly inserted into the body and in contact with the elastic member,

The body is

It is characterized in that it consists of a large-diameter portion providing an accommodating space in which the elastic member is accommodated, and a small-diameter portion integrally provided with the large-diameter portion and the shoulder portion therebetween and having a smaller diameter than the large-diameter portion, in which the contact point is located at the lower end Hollow test pins.
According to claim 1,

One end of the elastic member is a hollow test pin, characterized in that in contact with the inner surface of the shoulder in the state inserted into the large-diameter portion.
3. The method of claim 1 or 2,

The plunger is

an insertion part inserted into the large diameter part;

Hollow test pin, characterized in that it is provided integrally in the upward direction with the insertion part and the plunger shoulder interposed therebetween and is exposed to the outside of the large-diameter part, and comprises an exposed part having a smaller diameter than the insertion part.
4. The method of claim 3,

The insert is hollow,

A hollow test pin, characterized in that the upper part of the elastic member is inserted into the hollow of the insertion part.
5. The method of claim 4,

The upper end of the elastic member is a hollow test pin, characterized in that in contact with the inner surface of the plunger shoulder.
5. The method of claim 4,

The length of the insert is,

A hollow test pin, characterized in that 50% of the length of the large diameter part.