TWI405981B - Circuit board, circuit board assembly and mistaken insertion detection device - Google Patents
Circuit board, circuit board assembly and mistaken insertion detection device Download PDFInfo
- Publication number
- TWI405981B TWI405981B TW098130184A TW98130184A TWI405981B TW I405981 B TWI405981 B TW I405981B TW 098130184 A TW098130184 A TW 098130184A TW 98130184 A TW98130184 A TW 98130184A TW I405981 B TWI405981 B TW I405981B
- Authority
- TW
- Taiwan
- Prior art keywords
- connector
- circuit board
- pins
- detecting
- pin
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/11—Printed elements for providing electric connections to or between printed circuits
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0266—Marks, test patterns or identification means
- H05K1/0268—Marks, test patterns or identification means for electrical inspection or testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/64—Means for preventing incorrect coupling
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10007—Types of components
- H05K2201/10189—Non-printed connector
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10227—Other objects, e.g. metallic pieces
- H05K2201/10356—Cables
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/16—Inspection; Monitoring; Aligning
- H05K2203/163—Monitoring a manufacturing process
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/16—Inspection; Monitoring; Aligning
- H05K2203/168—Wrong mounting prevention
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Hardware Design (AREA)
- Details Of Connecting Devices For Male And Female Coupling (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
- Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
Abstract
Description
本發明係關於具有形成導體線路的基板(substrate)、以及實裝在基板上的複數連接器的電路板(Circuit Board),以及具有上述電路板的電路板組裝及誤插入檢出裝置。The present invention relates to a circuit board having a substrate for forming a conductor line and a plurality of connectors mounted on the substrate, and a circuit board assembly and misinsertion detecting device having the above circuit board.
半導體積體電路元件等的電子元件(以下也簡稱作DUT(受測試器件))的製造過程中,使用電子元件測試裝置測試DUT的性能、功能。In the manufacturing process of an electronic component such as a semiconductor integrated circuit component (hereinafter also referred to simply as a DUT (tested device)), the performance and function of the DUT are tested using an electronic component tester.
此電子元件測試裝置包括測試頭,具有與DUT電氣接觸的插座;測試器,經由測試頭測試DUT;處理器,依序搬送DUT至測試頭上,並依測試結果分類測試結束的DUT。The electronic component testing device includes a test head having a socket in electrical contact with the DUT, a tester that tests the DUT via the test head, a processor that sequentially transports the DUT to the test head, and classifies the tested DUT according to the test result.
測試頭具有實裝插座的插座板、以及與此插座板電氣連接的工作特性板;已知經由纜線連接這些電路板。如此構成的測試頭中,任一電路板中都實裝多數的連接器,可以從各電路板裝卸纜線。The test head has a socket plate with a socket mounted and a working characteristic board electrically connected to the socket board; these circuit boards are known to be connected via a cable. In the test head thus constructed, a plurality of connectors are mounted in any of the boards, and the cables can be loaded and unloaded from the respective boards.
不過,同一電路板中同一形狀的連接器用於複數的用途時,有連接器誤插入的問題。連接器誤插入狀態中,供給DUT的測試用電源至插座板時,實裝在插座板的電子元件恐怕會被高電壓損壞。However, when a connector of the same shape in the same board is used for a plurality of purposes, there is a problem that the connector is mistakenly inserted. When the connector is misinserted and the test power supply of the DUT is supplied to the socket board, the electronic components mounted on the socket board may be damaged by high voltage.
本發明欲解決的課題係提供可防止連接器誤插入的電路板、電路板組裝及誤插入檢出裝置。The problem to be solved by the present invention is to provide a circuit board, a circuit board assembly, and an erroneous insertion detecting device that can prevent the connector from being erroneously inserted.
(1)根據本發明,提供一電路板,包括形成導體線路的基板、以及實裝在上述基板上的複數的連接器;上述連接器各具有複數的接腳,包括經由上述導體線路互相電氣連接的一對檢出接腳(申請專利範圍第1項)。(1) According to the present invention, there is provided a circuit board comprising: a substrate forming a conductor line; and a plurality of connectors mounted on the substrate; each of the connectors having a plurality of pins including electrically connected to each other via the conductor line A pair of checkout pins (part 1 of the patent application scope).
上述發明中,上述連接器的上述檢出接腳中最好至少一檢出接腳的位置不同於上途複數的連接器中其他連接器的檢出接腳的位置(申請專利範圍第2項)。In the above invention, it is preferable that at least one of the detecting pins of the connector is different from the position of the detecting pin of the other connector in the plurality of connectors in the upper (multiple patent application) ).
(2)根據本發明,提供一電路板組裝,包括第1電路板,具有形成第1導體線路的第1基板、以及實裝在上述第1基板上的複數的第1連接器;以及複數的纜線,分別在一端具有可嵌合上述第1連接器的第2連接器;上述第1連接器的分別具有的複數的第1接腳,其中包括經由上述第1導體線路互相電氣連接的一對第1檢出接腳(申請專利範圍第3項)。(2) According to the present invention, there is provided a circuit board assembly comprising: a first circuit board having a first substrate forming a first conductor line; and a plurality of first connectors mounted on the first substrate; and a plurality of Each of the cables has a second connector that is engageable with the first connector at one end, and a plurality of first pins of the first connector that are electrically connected to each other via the first conductor line Check the pin for the first (patent item 3).
上述發明中,上述第1連接器的上述第1檢出接腳中最好至少一第1檢出接腳的位置不同於上途複數的第1連接器中其他第1連接器的第1檢出接腳的位置(申請專利範圍第4項)。In the above invention, it is preferable that at least one of the first detecting pins of the first connector of the first connector is different from the first one of the other first connectors of the first connector. The position of the pin (the fourth part of the patent application scope).
上述發明中,最好更包括第2電路板,上述複數的纜線在另一端分別具有第3連接器,上述電路板組裝中,具有形成第2導體線路的第2基板、以及實裝在上述第2基板上可與上述第3連接器嵌合的複數的第4連接器(申請專利範圍第5項)。In the above invention, it is preferable to further include a second circuit board, wherein the plurality of cables each have a third connector at the other end, and the circuit board assembly includes a second substrate on which the second conductor line is formed, and is mounted on the circuit board A plurality of fourth connectors that can be fitted to the third connector on the second substrate (the fifth item of the patent application).
上述發明中,上述第2連接器最好分別具有複數的第2接腳,包括配置於對應上述第1檢出接腳位置的一對第2檢出接腳;上述第3連接器分別具有複數的第3接腳,包括經由上述纜線的導線電氣連接至上述第2檢出接腳的一對第3檢出接腳;上述第4連接器具有複數的第4接腳,包括配置於對應上述第3檢出接腳位置的一對第4檢出接腳;上述第4檢出接腳的其中之一,經由上述第2導體線路電氣連接至另一第4連接器的第4檢出接腳(申請專利範圍第6項)。In the above invention, preferably, the second connector includes a plurality of second pins, and includes a pair of second detecting pins disposed at positions corresponding to the first detecting pins; and the third connectors respectively have plural numbers The third pin includes a pair of third detecting pins electrically connected to the second detecting pin via the wires of the cable; the fourth connector has a plurality of fourth pins, including a pair of fourth detecting pins at the third detecting pin position; one of the fourth detecting pins being electrically connected to the fourth detecting device via the second conductor line Pin (applicable to item 6 of the patent scope).
上述發明中,上述第2電路板中全部上述第4檢出接腳的組合最好經由上述第2導體線路串聯連接(申請專利範圍第7項)。In the above invention, it is preferable that the combination of all of the fourth detecting pins in the second circuit board is connected in series via the second conductor line (the seventh item of the patent application).
上述發明中,上述第3接腳最好包括經由上述纜線的導線電氣連接至一對第5檢出接腳;上述第4接腳,包括配置於對應上述第5檢出接腳位置的一對第6檢出接腳;上述第4檢出接腳的其中之一,經由上述第5及第6檢出接腳電氣連接至另一第4連接器的第4檢出接腳(申請專利範圍第8項)。In the above invention, the third leg preferably includes a pair of fifth detecting pins electrically connected via a wire of the cable, and the fourth pin includes a first pin disposed at a position corresponding to the fifth detecting pin. The sixth detecting pin; one of the fourth detecting pins is electrically connected to the fourth detecting pin of the other fourth connector via the fifth and sixth detecting pins (patent application) Item 8 of the scope).
上述發明中,最好更包括第2電路板,具有形成第2導體線路的第2基板,上述複數的纜線的另一端直接連接至上述第2基板(申請專利範圍第9項)。In the above invention, it is preferable to further include a second circuit board having a second substrate on which the second conductor line is formed, and the other end of the plurality of cables is directly connected to the second substrate (No. 9 of the patent application).
(3)根據本發明,提供一誤插入檢出裝置,用於檢出電子元件測試裝置中的連接器誤插入,包括;上述電路板組裝;輸入裝置,輸入檢出信號至上述電路板組裝;以及判斷裝置,根據來自上述電路板組裝的上述檢出信號有無輸出,判斷可否供給測試電源至上述電路板組裝(申請專利範圍第10項)。(3) According to the present invention, there is provided an erroneous insertion detecting device for detecting a mis-insertion of a connector in an electronic component testing device, comprising: said circuit board assembly; an input device, inputting a detection signal to said circuit board assembly; And the judging means determines whether or not the test power supply can be supplied to the circuit board assembly based on the presence or absence of the detection signal from the circuit board assembly (application No. 10).
上述發明中,上述判斷裝置最好當上述電路板組裝輸出上述檢出信號時,判斷供給測試電源至上述電路板組裝,且當上述電路板組裝不輸出上述檢出信號時,判斷不供給測試電源至上述電路板組裝(申請專利範圍第11項)。In the above invention, it is preferable that the determining means determines that the test power supply is supplied to the circuit board assembly when the circuit board is assembled and outputs the detection signal, and determines that the test power is not supplied when the circuit board assembly does not output the detection signal. To the above board assembly (application for the scope of the 11th item).
本發明中,連接器具有的複數接腳中,一對檢出接腳互相電氣連接。因此,連接器插入後,藉由確認其中一檢出接腳輸入的檢出信號從另一檢出接腳輸出,在電源供給前,由於可以確認插入處的連接器是本來應插入的連接器,因此可以防止連接器的誤插入。In the present invention, among the plurality of pins of the connector, the pair of detecting pins are electrically connected to each other. Therefore, after the connector is inserted, by confirming that the detection signal of one of the detection pin inputs is output from the other detection pin, before the power supply, it can be confirmed that the connector at the insertion point is the connector that should be inserted. Therefore, the connector can be prevented from being inserted by mistake.
以下,根據圖面說明本發明的實施例。Hereinafter, embodiments of the present invention will be described based on the drawings.
第1圖係本實施例中電子元件測試裝置的概略剖面圖,第2圖係本實施例中測試頭的概略剖面圖,以及第3圖係第2圖中顯示的測試頭的分解圖。Fig. 1 is a schematic cross-sectional view showing an electronic component testing apparatus in the present embodiment, Fig. 2 is a schematic cross-sectional view of the test head in the present embodiment, and Fig. 3 is an exploded view showing the test head shown in Fig. 2.
本實施例中電子元件測試裝置,如第1圖所示,包括測試頭10,與DUT電氣連接;測試器2,經由測試頭10送出測試信號至DUT並檢查應答信號;以及處理器1,依序搬送DUT至測試頭10上,並依測試結果分類測試結束的DUT。此電子元件測試裝置,在對DUT施加高溫或低溫的熱應力的狀態(或是常溫狀態)下,測試DUT是否適當動作,並依上述測試結果分類DUT。The electronic component testing device in this embodiment, as shown in FIG. 1, includes a test head 10 electrically connected to the DUT; the tester 2 sends a test signal to the DUT via the test head 10 and checks the response signal; and the processor 1 The DUT is sequentially transferred to the test head 10, and the DUTs at the end of the test are classified according to the test results. The electronic component testing device tests whether the DUT is properly operated in a state in which high temperature or low temperature thermal stress is applied to the DUT (or a normal temperature state), and classifies the DUT according to the above test results.
如第1圖所示,在測試頭10的上部,設置測試時與DUT電氣接觸的插座33。插座33,如同圖中所示,經由處理器1中形成的開口1a,進入處理器1的內部,搬送來的DUT以處理器1按壓至插座33。又,可以使用加熱板型、密室型作為處理器1。As shown in Fig. 1, on the upper portion of the test head 10, a socket 33 which is in electrical contact with the DUT during the test is set. The socket 33 enters the inside of the processor 1 via the opening 1a formed in the processor 1 as shown in the drawing, and the transported DUT is pressed by the processor 1 to the socket 33. Further, a heater plate type or a cell type can be used as the processor 1.
測試頭10,如第2及3圖所示,包括測試頭本體11與高夾具15(界面裝置)。測試頭本體11的內部,收容納入DUT的測試使用的電子電路的腳位訊號卡(Pin Electronics Card)12。腳位訊號卡12經由第1圖所示的纜線3電氣連接至測試器2,且經由連接器13、16可裝卸地連接至高夾具15。The test head 10, as shown in Figures 2 and 3, includes a test head body 11 and a high clamp 15 (interface device). The inside of the test head body 11 houses a Pin Electronics Card 12 of an electronic circuit used for testing of the DUT. The foot signal card 12 is electrically connected to the tester 2 via the cable 3 shown in FIG. 1, and is detachably connected to the high jig 15 via the connectors 13, 16.
高夾具15為了在測試頭本體11與工作特性板20(後述)之間電氣中繼,安裝在測試頭本體11上方。高夾具15的上部,設置用以電氣連接至工作特性板20的連接器17。高夾具15具有的連接器16、17,經由纜線18電氣連接。The high jig 15 is mounted above the test head body 11 for electrical relaying between the test head body 11 and the operating characteristic plate 20 (described later). The upper portion of the high jig 15 is provided with a connector 17 for electrical connection to the work characteristic plate 20. The high clamp 15 has connectors 16, 17 that are electrically connected via a cable 18.
本實施例中,測試頭10更包括插座板30及工作特性板20。In this embodiment, the test head 10 further includes a socket board 30 and a working characteristic board 20.
工作特性板20安裝在高夾具15的上方,包括第2基板21、安裝在第2基板21上表面的第4連接器24、實裝在第2基板21下表面的連接器23。連接器23、24經由形成於第2基板21上的線路圖案、穿孔(未圖示)電氣連接。下側的連接器23可嵌合高夾具15上側的連接器17,由於這些連接器17、23嵌合,高夾具15與工作特性板20之間電氣連接。又,上述第4連接器24係參照第4~8圖後所說明的3個第4連接器24A~24C的總稱。又,第2及3圖中只圖示2個第4連接器24,但實際上一枚工作特性板20上實裝了數十~數百個連接器24。The work characteristic plate 20 is mounted above the high jig 15, and includes a second substrate 21, a fourth connector 24 attached to the upper surface of the second substrate 21, and a connector 23 mounted on the lower surface of the second substrate 21. The connectors 23 and 24 are electrically connected via a line pattern formed on the second substrate 21 and a through hole (not shown). The connector 23 on the lower side can be fitted to the connector 17 on the upper side of the high jig 15, and since these connectors 17, 23 are fitted, the high jig 15 and the work characteristic plate 20 are electrically connected. Further, the fourth connector 24 is a general term referring to the three fourth connectors 24A to 24C described later in FIGS. 4 to 8. Further, in the second and third figures, only the two fourth connectors 24 are shown. However, actually, the tens to hundreds of connectors 24 are mounted on one of the operating characteristic plates 20.
插座板30設置於工作特性板20的上方,包括上表面實裝上述插座33的第1基板31、以及實裝於第1基板31下表面的複數的第1連接器35。又,實際上,1枚工作特性板20的上方設置1枚或複數枚的插座板30。插座33具有複數的接觸腳34,測試DUT時,藉由這些接觸腳34與從DUT導出的端子接觸,插座與DUT電氣接觸。插座33與第1連接器35之間經由第1基板31中形成的線路圖案、穿孔(未圖示)而電氣連接。又,上述第1連接器35係參照第4~8圖後所說明的3個第1連接器35A~35C的總稱。又,第2及3圖中只圖示2個第1連接器35,但實際上一枚插座板30上實裝了數十個連接器35。The socket board 30 is disposed above the operation characteristic board 20, and includes a first board 31 on which the socket 33 is mounted on the upper surface, and a plurality of first connectors 35 mounted on the lower surface of the first board 31. Further, actually, one or a plurality of socket boards 30 are provided above one working characteristic plate 20. The socket 33 has a plurality of contact pins 34 which, when the DUT is tested, are in electrical contact with the DUT by contact with the terminals derived from the DUT. The socket 33 and the first connector 35 are electrically connected via a line pattern formed in the first substrate 31 and a through hole (not shown). Further, the first connector 35 is a general term referring to the three first connectors 35A to 35C described later in FIGS. 4 to 8. Further, in the second and third figures, only the two first connectors 35 are shown. However, actually, dozens of connectors 35 are mounted on one socket plate 30.
工作特性板20與插座板30之間經由纜線40而電氣連接。纜線40的上端連接至可嵌合插座板30的第1連接器35的第2連接器43,纜線40可從插座板30裝卸。另一方面,纜線40的下端連接至可嵌合工作特性板20的第4連接器24的第3連接器45,纜線40可從工作特性板20裝卸。又,上述第2連接器43係參照第4~8圖後所說明的3個第2連接器43A~43C的總稱,上述的第3連接器45係參照同圖後所說明的3個第3連接器45A~45C的總稱。又,上述的纜線40係參照第4~8圖後所說明的3組纜線40A~40C的總稱。The working characteristic board 20 and the socket board 30 are electrically connected via a cable 40. The upper end of the cable 40 is connected to the second connector 43 of the first connector 35 to which the socket board 30 can be fitted, and the cable 40 can be detached from the socket board 30. On the other hand, the lower end of the cable 40 is connected to the third connector 45 of the fourth connector 24 into which the work characteristic plate 20 can be fitted, and the cable 40 can be detached from the work characteristic plate 20. Further, the second connector 43 refers to the general name of the three second connectors 43A to 43C described later in FIGS. 4 to 8, and the third connector 45 described above refers to the three thirds described later. A general term for connectors 45A to 45C. Moreover, the above-mentioned cable 40 is a general term of the three sets of cables 40A to 40C described later in the fourth to eighth drawings.
第4圖係本發明實施例中插座板、纜線及工作特性板的連接關係圖;第5圖係顯示本發明實施例中誤插入檢出裝置的方塊圖。4 is a connection diagram of a socket board, a cable, and a working characteristic board in the embodiment of the present invention; and FIG. 5 is a block diagram showing an erroneous insertion detecting apparatus in the embodiment of the present invention.
以下,參照第4及5圖,說明關於第1~第4連接器的構成及這些連接關係。又,為了容易理解,第4~8圖中以3組纜線40A~40C連接工作特性板20與插座板30的情況來說明,但實際上工作特性板20與插座板30之間係經由數十組纜線40連接。Hereinafter, the configurations of the first to fourth connectors and the connection relationships will be described with reference to FIGS. 4 and 5. Further, in order to facilitate understanding, in the fourth to eighth drawings, the case where the operation characteristic plate 20 and the socket plate 30 are connected by the three sets of cables 40A to 40C will be described. However, actually, the number between the operation characteristic plate 20 and the socket plate 30 is limited. Ten sets of cables 40 are connected.
第4圖所示的3個第1連接器35A~35C,是具有例如保持在絕緣性外殼內的8支接腳36a~36h的插孔型連接器。又,以下,關於任一連接器,各連接器具有的8支接腳在第4圖中從左側往右側稱作第1接腳、第2接腳、…第8接腳。3個第1連接器35A~35C,任一都具有同一構造,但用於檢出連接器誤插入的接腳(檢出接腳)的位置不同。又,本實施例中「檢出接腳」與連接器具有的其他接腳在構成並無不同,係為了明確與上述其他接腳的用途不同而方便使用的表現。又,連接器具有的接腳數量並未特別限定,實際上一連接器上設置數十支接腳。The three first connectors 35A to 35C shown in Fig. 4 are jack-type connectors having, for example, eight pins 36a to 36h held in an insulating case. Further, hereinafter, in any of the connectors, the eight pins of each connector are referred to as a first pin, a second pin, ... an eighth pin from the left side to the right side in Fig. 4 . Each of the three first connectors 35A to 35C has the same structure, but the position of the pin (detection pin) for detecting that the connector is erroneously inserted is different. Further, in the present embodiment, the "detection pin" and the other pins of the connector are not different in configuration, and the expression is convenient to use in order to clarify the use of the other pins. Further, the number of pins that the connector has is not particularly limited, and actually, dozens of pins are provided on one connector.
第4圖中左側的第1連接器35A中,第1及第2接腳36a、36b(第1檢出接腳)經由第1基板31上形成的檢出線路圖案32互相直接連接。另一方面,未特別圖示,第2~第6的接腳36c~36f也連接至第1基板31上的線路圖案,但這些接腳36c~36f彼此未直接連接。In the first connector 35A on the left side in FIG. 4, the first and second pins 36a and 36b (first detecting pins) are directly connected to each other via the detection line pattern 32 formed on the first substrate 31. On the other hand, the second to sixth pins 36c to 36f are also connected to the line pattern on the first substrate 31, but these pins 36c to 36f are not directly connected to each other.
左側的第1連接器35A中,第1及第2接腳36a、36b用於第1及第2連接器35A、43A的誤插入檢出,第3~第6接腳36c~36f用於DUT測試,並未特別使用第7及第8接腳36g、36h。In the first connector 35A on the left side, the first and second pins 36a and 36b are used for detecting the erroneous insertion of the first and second connectors 35A and 43A, and the third to sixth pins 36c to 36f are used for the DUT. For the test, the 7th and 8th pins 36g, 36h are not particularly used.
相對於此,第4圖中央的第1連接器35B中,與前述的第1連接器35A不同,第3及第4接腳36c、36d(第1檢出接腳)經由檢出線路圖案32互相直接連接。另一方面,雖未特別圖示,第1、第2、第5及第6接腳36a、36b、36e、36f也連接至第1基板31上的線路圖案,但這些接腳36a、36b、36e、36f不互相直接連接。On the other hand, in the first connector 35B at the center of FIG. 4, unlike the first connector 35A described above, the third and fourth pins 36c and 36d (first detection pins) pass through the detection line pattern 32. Connect directly to each other. On the other hand, the first, second, fifth, and sixth pins 36a, 36b, 36e, and 36f are also connected to the line pattern on the first substrate 31, but these pins 36a and 36b are not shown. 36e, 36f are not directly connected to each other.
此中央的第1連接器35B中,第3及第4接腳36c、36d用於第1及第2連接器35B、43B的誤插入檢出,第1、第2、第5及第6接腳36a、36b、36e、36f用於DUT測試,並未特別使用第7及第8接腳36g、36h。In the center first connector 35B, the third and fourth pins 36c and 36d are used for detecting the erroneous insertion of the first and second connectors 35B and 43B, and the first, second, fifth, and sixth connections are used. The legs 36a, 36b, 36e, 36f are used for the DUT test, and the 7th and 8th pins 36g, 36h are not particularly used.
另一方面,第4圖中右側的第1連接器35C中,不同於前述的第1連接器35A、35B,第5及第6接腳36e、36f(第1檢出接腳)經由檢出線路圖案32互相直接連接。另一方面,雖未特別圖示,第1、~第4接腳36a~36d也連接至第1基板31上的線路圖案,但這些接腳36a~36d不互相直接連接。On the other hand, in the first connector 35C on the right side in Fig. 4, the fifth and sixth pins 36e and 36f (first detecting pin) are detected differently from the first connectors 35A and 35B described above. The line patterns 32 are directly connected to each other. On the other hand, although the first to fourth pins 36a to 36d are also connected to the line pattern on the first substrate 31, the pins 36a to 36d are not directly connected to each other.
右側的第1連接器35c中,第5及第6接腳36e、36f用於第1及第2連接器35C、43C的誤插入檢出,第1~第4接腳36a~36d用於DUT測試,並未特別使用第7及第8接腳36g、36h。In the first connector 35c on the right side, the fifth and sixth pins 36e and 36f are used for detecting the erroneous insertion of the first and second connectors 35C and 43C, and the first to fourth pins 36a to 36d are used for the DUT. For the test, the 7th and 8th pins 36g, 36h are not particularly used.
如上述,藉由改變每個連接器檢出接腳位置,同一插座板30中同一形狀的連接器即使用於複數的用途,也可以更確實防止連接器誤插入。又,雖以3個連接器35A~35C中檢出接腳位置完全不重複來說明,但不特別限定於此。只要2支檢出接腳中至少一檢出接腳位置不同於其他連接器的2支檢出接腳位置即可。As described above, by changing the position of the pin for each connector, the connector of the same shape in the same socket board 30 can more reliably prevent the connector from being erroneously inserted even if it is used for a plurality of purposes. In addition, although the position where the pin is detected in the three connectors 35A to 35C is not completely described, the present invention is not limited thereto. As long as at least one of the two detection pins is different from the position of the two detection pins of the other connectors.
第4圖所示的3個第2連接器43A~43C,是具有例如保持在絕緣性外殼內的8支接腳44a~44h的插頭型連接器。3個第2連接器43A~43C,任一都具有同一構造。又,第2連接器43A~43C也可以是插孔型連接器,此時第1連接器35A~35B為插頭型連接器。The three second connectors 43A to 43C shown in Fig. 4 are plug-type connectors having, for example, eight pins 44a to 44h held in an insulating case. Any of the three second connectors 43A to 43C has the same structure. Further, the second connectors 43A to 43C may be jack-type connectors, and in this case, the first connectors 35A to 35B are plug-type connectors.
第2連接器43A~43C的接腳44a~44h,嵌合時可以與第1連接器35A~35B的接腳36a~36h分別接觸。因此,第4圖左側的第2連接器43A的第1及第2接腳44a、44b,中央的第2連接器43B的第3及第4接腳44c、44d,以及右側的第2連接器43C的第5及第6接腳44e、44f,相當於本發明中第2檢出接腳的一範例。The pins 44a to 44h of the second connectors 43A to 43C can be brought into contact with the pins 36a to 36h of the first connectors 35A to 35B, respectively. Therefore, the first and second pins 44a and 44b of the second connector 43A on the left side of Fig. 4, the third and fourth pins 44c and 44d of the second connector 43B at the center, and the second connector on the right side. The fifth and sixth pins 44e and 44f of the 43C correspond to an example of the second detecting pin in the present invention.
第4圖所示的3個第3連接器45A~45C,是具有保持在例如絕緣性外殼內的8支接腳46a~46h的插頭型連接器,任一都具有同一構造。第4圖中左側的第3連接器45A中第1~第6接腳46a~46f,經由纜線40A的導線41,分別電氣連接第2連接器43A的第1~第6接腳44a~44f。因此,第4圖中左側的第3連接器45A的第1及第2接腳46a、46b,中央的第3連接器45B的第3及第4接腳46c、46d,以及右側的第3連接器45C的第5及第6接腳46e、46f,相當於本發明中第3檢出接腳的一範例。The three third connectors 45A to 45C shown in Fig. 4 are plug-type connectors having eight pins 46a to 46h held in, for example, an insulative housing, and have the same structure. The first to sixth pins 46a to 46f of the third connector 45A on the left side in Fig. 4 are electrically connected to the first to sixth pins 44a to 44f of the second connector 43A via the wires 41 of the cable 40A. . Therefore, the first and second pins 46a and 46b of the third connector 45A on the left side in Fig. 4, the third and fourth pins 46c and 46d of the third connector 45B in the center, and the third connection on the right side. The fifth and sixth pins 46e and 46f of the device 45C correspond to an example of the third detecting pin in the present invention.
左側的第3連接器45A的第7及第8接腳46g、46h(第5檢出接腳)經由纜線40A的檢出導線42互相電氣連接。又,第2連接器43A中也同樣地,第7及第8接腳44g、44h經由纜線40A的導線互相電氣連接。第4圖中央及右側的第3連接器45B、45C,也以同樣的要領,經由纜線40B、40C連接至第2連接器43B、43C。任一第3連接器45A~45C中,第7及第8接腳46g、46h都用於檢出是否有誤接不同規格的纜線。The seventh and eighth pins 46g and 46h (the fifth detection pin) of the third connector 45A on the left side are electrically connected to each other via the detection lead 42 of the cable 40A. Further, in the second connector 43A, the seventh and eighth pins 44g and 44h are electrically connected to each other via the wires of the cable 40A. The third connectors 45B and 45C at the center and the right side in Fig. 4 are also connected to the second connectors 43B and 43C via the cables 40B and 40C in the same manner. In any of the third connectors 45A to 45C, the seventh and eighth pins 46g and 46h are used to detect whether or not the cables of different specifications are mistakenly connected.
第4圖所示的3個第4連接器24A~24C,是具有保持在例如絕緣性外殼內的8支接腳25a~25h的插孔型連接器,任一都具有同一構造。又,第4連接器24A~24C可以是插頭型連接器,此時第3連接器45A~45B為插孔型連接器。The three fourth connectors 24A to 24C shown in Fig. 4 are jack-type connectors having eight pins 25a to 25h held in, for example, an insulative housing, and have the same structure. Further, the fourth connectors 24A to 24C may be plug-type connectors, and in this case, the third connectors 45A to 45B are jack-type connectors.
第4連接器24A~24C的接腳25a~25h可以分別接觸第3連接器45A~45B的接腳46a~46h,第4連接器24A~24C的其中任一,第7及第8接腳25g、25h(第6檢出接腳)都用於檢出是否有誤接不同規格的纜線。相對地,對應第1連接器35A~35C,各第4連接器24A~24C中,第1~第6接腳25a~25f中的任兩支接腳用於檢出連接器的誤插入。The pins 25a to 25h of the fourth connectors 24A to 24C can be respectively brought into contact with the pins 46a to 46h of the third connectors 45A to 45B, and any of the fourth connectors 24A to 24C, the seventh and eighth pins 25g. 25h (the 6th detection pin) is used to detect whether there is a misconnection of cables of different specifications. In contrast, among the first connectors 35A to 35C, one of the first to sixth pins 25a to 25f of each of the fourth connectors 24A to 24C is used to detect the erroneous insertion of the connector.
第4圖中左側的第4連接器24A中,第1及第2接腳25a、25b(第4檢出接腳)用於檢出連接器的誤插入,第3~第6接腳25c~25f用於DUT測試。左側的第4連接器24A中,第2接腳25b經由形成於第2基板21上的檢出線路圖案22連接至第7接腳25g,又,第8接腳25h經由檢出線路圖案22連接至中央的第4連接器24B的第3接腳25c。In the fourth connector 24A on the left side in Fig. 4, the first and second pins 25a and 25b (fourth detection pin) are used to detect the erroneous insertion of the connector, and the third to sixth pins 25c to 25f is used for DUT testing. In the fourth connector 24A on the left side, the second pin 25b is connected to the seventh pin 25g via the detection line pattern 22 formed on the second substrate 21, and the eighth pin 25h is connected via the detection line pattern 22. The third pin 25c of the fourth connector 24B to the center.
相對於此,第4圖中央的第4連接器24B中,第3及第4接腳25c、25d(第4檢出接腳)用於檢出連接器的誤插入,第1、第2、第5及第6接腳25a、25b、25e、25f用於DUT測試。中央的第4連接器24B中,第4接腳25d經由檢出線路圖案22連接至第7接腳25g,又,第8接腳25h經由檢出線路圖案22連接至右側的第4連接器24C的第5接腳25e。On the other hand, in the fourth connector 24B at the center of FIG. 4, the third and fourth pins 25c and 25d (fourth detection pin) are used to detect the erroneous insertion of the connector, and the first and second. The fifth and sixth pins 25a, 25b, 25e, 25f are used for DUT testing. In the fourth connector 24B of the center, the fourth pin 25d is connected to the seventh pin 25g via the detection line pattern 22, and the eighth pin 25h is connected to the fourth connector 24C on the right side via the detection line pattern 22. The fifth pin 25e.
另一方面,第4圖中右側的第4連接器24C中,第5及第6接腳25e、25f(第4檢出接腳)用於檢出連接器的誤插入,第1~第4接腳25a~25d用於DUT測試。右側的第4連接器24C中,第6接腳25f經由檢出線路圖案22連接至第7接腳25g。On the other hand, in the fourth connector 24C on the right side in Fig. 4, the fifth and sixth pins 25e and 25f (fourth detection pin) are used to detect the erroneous insertion of the connector, and the first to fourth. Pins 25a-25d are used for DUT testing. In the fourth connector 24C on the right side, the sixth pin 25f is connected to the seventh pin 25g via the detection line pattern 22.
又,確認不要纜線40A~40C時,第4連接器24A~24C的第4檢出接腳經由檢出線路圖案22互相連接,第7及第8接腳25g、25h用於DUT測試。When it is confirmed that the cables 40A to 40C are not to be used, the fourth detection pins of the fourth connectors 24A to 24C are connected to each other via the detection line pattern 22, and the seventh and eighth pins 25g and 25h are used for the DUT test.
如第5圖所示,左側的第4連接器24A的第1接腳25a、以及右側的第4連接器24C的第8接腳25h連接至設置於測試器2的誤插入檢出裝置5。As shown in FIG. 5, the first pin 25a of the fourth connector 24A on the left side and the eighth pin 25h of the fourth connector 24C on the right side are connected to the erroneous insertion detecting device 5 provided in the tester 2.
此誤插入檢出裝置5係用於檢出第2連接器43A~43C誤插入第1連接器35A~35C,具有輸入部6及判斷部7。又,結果此誤插入檢出裝置5也可以檢出第3連接器45A~45C誤插入第4連接器24A~24C。The erroneous insertion detecting device 5 detects that the second connectors 43A to 43C are erroneously inserted into the first connectors 35A to 35C, and has the input unit 6 and the determination unit 7. Further, as a result, the erroneous insertion detecting device 5 can detect that the third connectors 45A to 45C are erroneously inserted into the fourth connectors 24A to 24C.
輸入部6,連接至左側的第4連接器24A的第1接腳25a,可輸入用於檢出連接器誤插入的檢出信號至第1接腳25a。又,用於確認高夾具15是否安裝於測試頭本體11的確認信號也可以用作此檢出信號,判斷部7,連接至右側的第4連接器24C的第8接腳25h,可以確認輸入部6輸入的檢出信號是否從第8接腳25h輸出。確認檢出信號的輸出時,判斷部7對於測試器2的電源供給部4,允許用於DUT測試的電源供給。相對於此,不確認檢出信號的輸出時,判斷部7對於電源供給部4,不允許測試電源的供給。The input unit 6 is connected to the first pin 25a of the fourth connector 24A on the left side, and can input a detection signal for detecting the erroneous insertion of the connector to the first pin 25a. Further, a confirmation signal for confirming whether or not the high jig 15 is attached to the test head main body 11 can be used as the detection signal, and the determination unit 7 is connected to the eighth pin 25h of the fourth connector 24C on the right side to confirm the input. Whether or not the detection signal input from the unit 6 is output from the eighth pin 25h. When the output of the detection signal is confirmed, the determination unit 7 allows the power supply for the DUT test to be supplied to the power supply unit 4 of the tester 2. On the other hand, when the output of the detection signal is not confirmed, the determination unit 7 does not allow the supply of the test power to the power supply unit 4.
其次說明作用。Second, explain the role.
第6圖係顯示本實施例中誤插入的檢出路線圖,第7圖係顯示實施例中連接器誤插入時連接關係的一範例圖,以及第8圖係顯示本實施例中不同規格的纜線錯誤連接時的一範例圖。Fig. 6 is a view showing a detection route of erroneous insertion in the embodiment, Fig. 7 is a view showing an example of a connection relationship when the connector is erroneously inserted in the embodiment, and Fig. 8 is a view showing different specifications in the embodiment. An example diagram when the cable is incorrectly connected.
首先,第4圖所示的範例中,全部的連接器正確插入的情況,參照第6圖說明。First, in the example shown in Fig. 4, the case where all the connectors are correctly inserted will be described with reference to Fig. 6.
如第6圖所示,第2連接器43A~43C分別插入第1連接器35A~35C,以及第3連接器45A~45C分別插入第4連接器24A~24C時,左側的第4連接器24A的第1接腳25a與右側的第4連接器24C的第8接腳25h之間,形成全部的檢出接腳串聯的誤插入檢出路線50。此狀態中,誤插入檢出裝置5的輸入部6輸入檢出信號時,上述檢出信號經由誤插入檢出路線50輸出至判斷部7,判斷部7對於電源供給部4,不允許測試電源的供給。又,也可以形成複數的誤插入檢出路線,且為了可以個別檢出各連接器的誤插入,可以每個連接器形成誤插入檢出路線。As shown in Fig. 6, when the second connectors 43A to 43C are inserted into the first connectors 35A to 35C, respectively, and the third connectors 45A to 45C are inserted into the fourth connectors 24A to 24C, respectively, the fourth connector 24A on the left side is inserted. Between the first pin 25a and the eighth pin 25h of the fourth connector 24C on the right side, an erroneous insertion detecting route 50 in which all the detecting pins are connected in series is formed. In this state, when the input unit 6 of the erroneous insertion detecting device 5 inputs the detection signal, the detection signal is output to the determination unit 7 via the erroneous insertion detection route 50, and the determination unit 7 does not allow the test power supply to the power supply unit 4. Supply. Further, a plurality of erroneous insertion detection routes may be formed, and in order to individually detect erroneous insertion of each connector, an erroneous insertion detection route may be formed for each connector.
相對於此,例如,第7圖所示,本來應插入左側的第1連接器35A的第2連接器43A誤插入中央的第1連接器35B,以及應插入中央的第1連接器35B的第2連接器43B誤插入左側的第1連接器35A時,因為中央的第1連接器35B的第1接腳36a與第2接腳36b未互相連接,不形成誤插入檢出路線50。On the other hand, for example, as shown in FIG. 7, the second connector 43A of the first connector 35A to be inserted into the left side is erroneously inserted into the first connector 35B at the center, and the first connector 35B to be inserted into the center. When the connector 43B is erroneously inserted into the first connector 35A on the left side, the first pin 36a and the second pin 36b of the first connector 35B in the center are not connected to each other, and the erroneous insertion detecting route 50 is not formed.
又,例如,第8圖所示,誤用不具有檢出導線42的纜線40’作為中央的纜線時,中央的第2連接器43B的第7接腳46g與第8接腳46h之間,誤插入檢出路線50被遮斷。Further, for example, as shown in Fig. 8, when the cable 40' not having the detected lead wire 42 is misused as the center cable, between the seventh pin 46g and the eighth pin 46h of the center second connector 43B The erroneous insertion detection route 50 is blocked.
如第7、8圖所示的情況,誤插入檢出裝置5的輸入部6即使輸入檢出信號,因為上述檢出信號不輸出至判斷部7,判斷部7對於電源供給部4,不允許測試電源的供給。In the case shown in FIGS. 7 and 8, even if the detection signal is input to the input unit 6 of the erroneous insertion detecting device 5, since the detection signal is not output to the determination unit 7, the determination unit 7 does not allow the power supply unit 4. Test the supply of power.
如上述,本實施例中,具有第1連接器35A~35C的複數的接腳36a~36h中的一對檢出接腳互相電氣連接。因 此,連接器插入後,確認從其中一檢出接腳輸入檢出信號,而此檢出信號由另一檢出接腳輸出,藉此在供給測試電源前,可以確認插入處的連接器係本來應插入的連接器。As described above, in the present embodiment, one of the plurality of pins 36a to 36h having the first connectors 35A to 35C is electrically connected to each other. because After the connector is inserted, it is confirmed that the detection signal is input from one of the detection pins, and the detection signal is output by the other detection pin, thereby confirming the connector system at the insertion point before supplying the test power source. The connector that should have been inserted.
又,本實施例中,第3連接器45A~45C具有的複數接腳46a~46h中的一對檢出接腳互相電氣連接。因此,連接器插入後,確認從其中一檢出接腳輸入檢出信號,而此檢出信號由另一檢出接腳輸出,藉此可以確認連接正確規格的纜線。Further, in the present embodiment, one of the plurality of pins 46a to 46h of the third connectors 45A to 45C is electrically connected to each other. Therefore, after the connector is inserted, it is confirmed that the detection signal is input from one of the detection pins, and the detection signal is output by the other detection pin, thereby confirming that the cable of the correct specification is connected.
又,以上說明的實施例係為了容易理解本發明的記載,不是為了限定本發明而記載。因此,上述實施例中開示的各要素以包含屬於本發明技術範圍的全部設計變更、均等物為主旨。The embodiments described above are intended to facilitate the understanding of the present invention and are not intended to limit the invention. Therefore, each element disclosed in the above embodiments is intended to include all design changes and equivalents belonging to the technical scope of the present invention.
例如,也可以不使用第3及第4連接器45、24,纜線40的下端以焊接等直接連接至第2基板21上的配線圖案上。For example, the third and fourth connectors 45 and 24 may be omitted, and the lower end of the cable 40 may be directly connected to the wiring pattern on the second substrate 21 by soldering or the like.
又,工作特性板20的第4連接器24中,也可以設置互相電氣連接的一對檢出接腳,進行檢出第3連接器45誤插入至第4連接器24。例如,第9圖所示的範例中,第4連接器24的第1及第2接腳25a、25b(第1檢出接腳)用以檢出第3連接器45誤插入至第4連接器24。如同圖中所示,第4連接器24的第1接腳25a、及第2接腳25b,經由工作特性板20在第2基板21上形成的檢出線路22,互相電氣連接。又,在此情況下,本實施例中第4連接器24相當於本發明第1連接器的一範例,本實施例中第3連接器45相當於本發明的第2連接器的一範例。又,雖未特別圖示,但藉由改變每個連接器中檢出接腳位置,可以更確實防止連接器的誤插入。又,在此情況下,也可以不使用第1及第2連接器35、43,纜線40的上端以焊接等直接連接至第1基板31上的線路圖案。Further, in the fourth connector 24 of the operation characteristic plate 20, a pair of detection pins electrically connected to each other may be provided, and the third connector 45 may be detected to be erroneously inserted into the fourth connector 24. For example, in the example shown in FIG. 9, the first and second pins 25a and 25b (first detecting pin) of the fourth connector 24 are used to detect that the third connector 45 is mistakenly inserted into the fourth connection. 24. As shown in the drawing, the first pin 25a and the second pin 25b of the fourth connector 24 are electrically connected to each other via the detection line 22 formed on the second substrate 21 via the operating characteristic plate 20. Further, in this case, the fourth connector 24 in the present embodiment corresponds to an example of the first connector of the present invention, and the third connector 45 in the present embodiment corresponds to an example of the second connector of the present invention. Further, although not specifically shown, it is possible to more reliably prevent erroneous insertion of the connector by changing the position of the pin detected in each connector. Moreover, in this case, the first and second connectors 35 and 43 may not be used, and the upper end of the cable 40 may be directly connected to the line pattern on the first substrate 31 by soldering or the like.
1...處理器1. . . processor
1a...開口1a. . . Opening
2...測試器2. . . Tester
3...纜線3. . . Cable
4...電源供給部4. . . Power supply department
5...誤插入檢出裝置5. . . Mis-insertion detection device
6...輸入部6. . . Input section
7...判斷部7. . . Judgment department
10...測試頭10. . . Test head
11...測試頭本體11. . . Test head body
12...腳位訊號卡12. . . Foot signal card
13...連接器13. . . Connector
15...高夾具15. . . High fixture
16...連接器16. . . Connector
17...連接器17. . . Connector
18...纜線18. . . Cable
20...工作特性板20. . . Work feature board
21...第2基板twenty one. . . Second substrate
22...檢出線路圖案twenty two. . . Detected line pattern
23...連接器twenty three. . . Connector
24、24A~24C...第4連接器24, 24A ~ 24C. . . 4th connector
25c...第3接腳25c. . . 3rd pin
25g...第7接腳25g. . . 7th pin
25h...第8接腳25h. . . 8th pin
30...插座板30. . . Socket board
31...第1基板31. . . First substrate
32...檢出線路圖案32. . . Detected line pattern
33...插座33. . . socket
34...接觸腳34. . . Contact foot
35、35A~35C...第1連接器35, 35A ~ 35C. . . 1st connector
36a-36h...接腳36a-36h. . . Pin
40、40’、40A~40C...纜線40, 40', 40A ~ 40C. . . Cable
41...導線41. . . wire
42...檢出導線42. . . Detecting wire
43、43A~43C...第2連接器43, 43A ~ 43C. . . 2nd connector
44a~44h...接腳44a~44h. . . Pin
45、45A~45C...第3連接器45, 45A ~ 45C. . . 3rd connector
46a~46h...接腳46a~46h. . . Pin
以及as well as
50...誤插入檢出路線50. . . Incorrectly inserted checkout route
[第1圖]係本發明實施例中電子元件測試裝置的概略剖面圖;[Fig. 1] is a schematic cross-sectional view showing an electronic component testing device in an embodiment of the present invention;
[第2圖]係本發明實施例中測試頭的概略剖面圖;[Fig. 2] is a schematic cross-sectional view of a test head in an embodiment of the present invention;
[第3圖]係第2圖中所示的測試頭的分解圖;[Fig. 3] is an exploded view of the test head shown in Fig. 2;
[第4圖]係本發明實施例中插座板、纜線及工作特性板的連接關係圖;[Fig. 4] is a connection diagram of a socket board, a cable, and a working characteristic board in the embodiment of the present invention;
[第5圖]係顯示本發明實施例中誤插入檢出裝置的方塊圖;[Fig. 5] is a block diagram showing an erroneous insertion detecting device in the embodiment of the present invention;
[第6圖]係顯示本發明實施例中連接器誤插入的檢出路線圖;[Fig. 6] is a diagram showing a detection route for erroneous insertion of a connector in the embodiment of the present invention;
[第7圖]係顯示本發明實施例中連接器誤插入時連接關係的一範例圖;[Fig. 7] is a view showing an example of a connection relationship when a connector is erroneously inserted in the embodiment of the present invention;
[第8圖]係顯示本發明實施例中不同規格的纜線錯誤連接時的連接關係的一範例圖;以及[Fig. 8] is a view showing an example of a connection relationship when cables of different specifications are incorrectly connected in the embodiment of the present invention;
[第9圖]係顯示本發明其他實施例中工作特性板與纜線的連接關係圖。[Fig. 9] is a view showing a connection relationship between a work characteristic board and a cable in another embodiment of the present invention.
20...工作特性板20. . . Work feature board
21...第2基板twenty one. . . Second substrate
22...檢出線路圖案twenty two. . . Detected line pattern
24A~24C...第4連接器24A~24C. . . 4th connector
25a~h...接腳25a~h. . . Pin
30...插座板30. . . Socket board
31...第1基板31. . . First substrate
32...檢出線路圖案32. . . Detected line pattern
33...插座33. . . socket
34...接觸腳34. . . Contact foot
35A~35C...第1連接器35A~35C. . . 1st connector
36a~36h...接腳36a~36h. . . Pin
40A~40C...纜線40A~40C. . . Cable
41...導線41. . . wire
42...檢出導線42. . . Detecting wire
43A~43C...第2連接器43A~43C. . . 2nd connector
44a~44h...接腳44a~44h. . . Pin
45A~45C...第3連接器45A~45C. . . 3rd connector
46a-~46h...接腳46a-~46h. . . Pin
Claims (9)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2008/068390 WO2010041324A1 (en) | 2008-10-09 | 2008-10-09 | Circuit board, circuit board assembly and misinsertion detecting device |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201027093A TW201027093A (en) | 2010-07-16 |
TWI405981B true TWI405981B (en) | 2013-08-21 |
Family
ID=42100289
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW098130184A TWI405981B (en) | 2008-10-09 | 2009-09-08 | Circuit board, circuit board assembly and mistaken insertion detection device |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP5351171B2 (en) |
KR (1) | KR101226466B1 (en) |
CN (1) | CN102172107A (en) |
TW (1) | TWI405981B (en) |
WO (1) | WO2010041324A1 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105467256A (en) * | 2015-05-14 | 2016-04-06 | 华润赛美科微电子(深圳)有限公司 | Chip testing and sorting method |
CN108666824B (en) * | 2017-03-31 | 2020-11-20 | 比亚迪股份有限公司 | Rail transit vehicle, plug-in assembly of door system of rail transit vehicle and method of plug-in assembly |
CN107103869A (en) * | 2017-06-26 | 2017-08-29 | 上海天马微电子有限公司 | Display test system and test method thereof |
CN108469583B (en) * | 2018-05-28 | 2024-03-22 | 格力电器(郑州)有限公司 | ICT tester |
CN113655646B (en) * | 2021-08-16 | 2023-10-24 | 京东方科技集团股份有限公司 | Display panel, display module and display device |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02247990A (en) * | 1989-03-20 | 1990-10-03 | Fujitsu Ltd | Connection status detection method for inter-unit cable |
TWM277161U (en) * | 2005-05-17 | 2005-10-01 | Joinsoon Electronic Mfg Co Ltd | Connector assembly with prevention of faulty insertion |
TW200725260A (en) * | 2005-12-30 | 2007-07-01 | Mitac Int Corp | Error insertion simulation device for computer test |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4204062B2 (en) * | 2004-02-16 | 2009-01-07 | 株式会社オリンピア | Game machine |
-
2008
- 2008-10-09 WO PCT/JP2008/068390 patent/WO2010041324A1/en active Application Filing
- 2008-10-09 CN CN2008801314390A patent/CN102172107A/en active Pending
- 2008-10-09 KR KR1020117009874A patent/KR101226466B1/en active IP Right Grant
- 2008-10-09 JP JP2010532741A patent/JP5351171B2/en not_active Expired - Fee Related
-
2009
- 2009-09-08 TW TW098130184A patent/TWI405981B/en not_active IP Right Cessation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02247990A (en) * | 1989-03-20 | 1990-10-03 | Fujitsu Ltd | Connection status detection method for inter-unit cable |
TWM277161U (en) * | 2005-05-17 | 2005-10-01 | Joinsoon Electronic Mfg Co Ltd | Connector assembly with prevention of faulty insertion |
TW200725260A (en) * | 2005-12-30 | 2007-07-01 | Mitac Int Corp | Error insertion simulation device for computer test |
Also Published As
Publication number | Publication date |
---|---|
WO2010041324A1 (en) | 2010-04-15 |
KR101226466B1 (en) | 2013-01-28 |
CN102172107A (en) | 2011-08-31 |
KR20110082021A (en) | 2011-07-15 |
TW201027093A (en) | 2010-07-16 |
JP5351171B2 (en) | 2013-11-27 |
JPWO2010041324A1 (en) | 2012-03-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7307427B2 (en) | Method and apparatus for engineering a testability interposer for testing sockets and connectors on printed circuit boards | |
US20060082358A1 (en) | Interface apparatus for semiconductor device tester | |
TWI405981B (en) | Circuit board, circuit board assembly and mistaken insertion detection device | |
TWI432755B (en) | Test system and test method for pcba | |
US20060024990A1 (en) | Universal measuring adapter system | |
CN212749137U (en) | Test apparatus with configurable probe fixture | |
US6300781B1 (en) | Reliable method and apparatus for interfacing between a ball grid array handler and a ball grid array testing system | |
KR101249022B1 (en) | High speed burn-in test apparatus | |
KR100807469B1 (en) | Zif connector type board and testing method of the same | |
CN213813688U (en) | Test fixture for low-light-level microscope | |
KR20090003097A (en) | The connecting device for burn in testing equipment | |
CN109283369A (en) | A kind of automatically controlled tooling of on-line checking and preparation method thereof and working method | |
KR200274849Y1 (en) | The socket connecting structure of dut for testing the device | |
KR100592367B1 (en) | Combination structure of burn-in board and expansion board | |
US6605952B2 (en) | Zero connection for on-chip testing | |
KR20040018871A (en) | Vertical Type Probe Device | |
JP2007281101A (en) | Printed wiring structure of control board | |
KR100685129B1 (en) | Check board of pogo pin joint | |
JPH11329614A (en) | Connector and inspection method using it | |
JP5040790B2 (en) | Diagnostic board for semiconductor test equipment | |
CN117572213A (en) | Test structure and method applied to PCBA board card | |
KR20000008963U (en) | Semiconductor Device Package Tester with Novel Socket Adapter | |
KR20060128806A (en) | Ic module examination apparatus for printed circuit board | |
KR20070035769A (en) | Printed-circuit board for measuring contact resistance of the connector and method for measuring contact resistance using the same | |
JPH0729784U (en) | Contact confirmation type socket |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |