JP5351171B2 - Circuit board assembly and erroneous insertion detection device - Google Patents

Description

The present invention relates to a circuit board assembly including a circuit board (Circuit Board) having a substrate (Substrate) on which conductor wiring is formed and a plurality of connectors mounted on the substrate, and an erroneous insertion detection device.

  In the manufacturing process of an electronic component such as a semiconductor integrated circuit element (hereinafter also simply referred to as a DUT (Device Under Test)), the performance and function of the DUT are tested using an electronic component test apparatus.

  This electronic component testing apparatus tests a DUT that has been tested by sequentially testing a test head having a socket in electrical contact with the DUT, a tester that tests the DUT via the test head, and the DUT onto the test head. And a handler for classifying according to the result.

  The test head includes a socket board on which a socket is mounted, and a performance board electrically connected to the socket board, and a board in which these boards are connected via a cable is known. In the test head having such a configuration, a large number of connectors are mounted on any board, and a cable can be attached to and detached from each board.

  However, when a connector having the same shape is used for a plurality of purposes on the same board, there is a problem that the connector is erroneously inserted. If power for DUT testing is supplied to the socket board with the connector inserted incorrectly, the electronic components mounted on the socket board may be damaged by high voltage.

The problem to be solved by the present invention is to provide a circuit board assembly and an erroneous insertion detection device capable of preventing erroneous insertion of a connector.

( 1 ) According to the present invention, a first circuit board having a first substrate on which a first conductor wiring is formed, and a plurality of first connectors mounted on the first substrate; A second board having a plurality of cables each having a second connector that can be fitted to the first connector at one end and a third connector at the other end, and a second conductor wiring And a second circuit board having a plurality of fourth connectors which are mounted on the second substrate and can be fitted to the third connectors, and a circuit board assembly for an electronic component testing apparatus. a is, the plurality of first pin having a first connector, respectively are mutually seen contains electrically connected to a pair of first detection pin through the first conductor wiring, wherein A plurality of second pins each of the second connector has. Includes a pair of second detection pins arranged at positions corresponding to the first detection pins, and each of the plurality of third pins of the third connector is connected to the cable conductor. A pair of third detection pins electrically connected to the second detection pins, and the plurality of fourth pins of the fourth connector correspond to the third detection pins. Including a pair of fourth detection pins arranged at positions where the third pins further include a pair of fifth detection pins electrically connected to each other via the conductors of the cable. The fourth pin further includes a pair of sixth detection pins arranged at positions corresponding to the fifth detection pins, and one of the fourth detection pins is the second detection pin. There is another fourth connector through the conductor wiring and the fifth and sixth detection pins. A circuit board assembly is provided, wherein the circuit board assembly is electrically connected to a fourth detection pin (refer to claim 1 ).

In the above invention, the position of the first detection pin of at least one of the first detection pins in the first connector is in the other first connector of the plurality of first connectors. It is preferable that the position is different from the position of the first detection pin (see claim 2 ).

In the above invention, it is preferable that all the combinations of the fourth detection pins in the second circuit board are connected in series via the second conductor wiring (see claim 3 ).

( 2 ) According to the present invention, there is provided an erroneous insertion detection device for detecting an erroneous insertion of a connector in an electronic component testing apparatus, wherein the circuit board assembly and an input for inputting a detection signal to the circuit board assembly are provided. And a determination means for determining whether or not to supply test power to the circuit board assembly based on whether or not the detection signal is output from the circuit board assembly. An insertion detection device is provided (see claim 4 ).

In the above invention, the determination means determines to supply test power to the circuit board assembly when the detection signal is output from the circuit board assembly, and the detection signal is output from the circuit board assembly. Is not output, it is preferable to determine not to supply test power to the circuit board assembly (see claim 5 ).

  In the present invention, a pair of detection pins among a plurality of pins included in the connector are electrically connected to each other. For this reason, after inserting the connector, by confirming that the detection signal input from one of the detection pins is output from the other detection pin, the insertion destination connector is originally inserted before power supply. Since it can be confirmed that the connector is a power connector, it is possible to prevent erroneous insertion of the connector.

FIG. 1 is a schematic cross-sectional view of an electronic component testing apparatus according to an embodiment of the present invention. FIG. 2 is a schematic cross-sectional view of the test head in the embodiment of the present invention. FIG. 3 is an exploded view of the test head shown in FIG. FIG. 4 is a diagram illustrating a connection relationship among the socket board, the cable, and the performance board in the embodiment of the present invention. FIG. 5 is a block diagram showing an erroneous insertion detection apparatus in the embodiment of the present invention. FIG. 6 is a diagram illustrating a detection path for erroneous connector insertion according to the embodiment of the present invention. FIG. 7 is a diagram illustrating an example of a connection relationship when a connector is erroneously inserted in the embodiment of the present invention. FIG. 8 is a diagram illustrating an example of a connection relationship when cables having different specifications are erroneously connected in the embodiment of the present invention. FIG. 9 is a diagram showing a connection relationship between a performance board and a cable in another embodiment of the present invention.

DESCRIPTION OF SYMBOLS 2 ... Tester 5 ... Error insertion detection apparatus 6 ... Input part 7 ... Judgment part 10 ... Test head 20 ... Performance board 21 ... 2nd board | substrate 22 ... Wiring pattern 24, 24A-24C ... 4th connector 30 ... Socket Board 31... First substrate 32... Detection wiring pattern 35, 35 A to 35 C... First connector 40, 40 A to 40 C. 45A to 45C ... third connector 50 ... path for erroneous insertion detection

  Hereinafter, embodiments of the present invention will be described with reference to the drawings.

  FIG. 1 is a schematic sectional view of an electronic component testing apparatus according to the present embodiment, FIG. 2 is a schematic sectional view of a test head according to the present embodiment, and FIG. 3 is an exploded view of the test head shown in FIG.

  As shown in FIG. 1, the electronic component testing apparatus according to the present embodiment includes a test head 10 electrically connected to a DUT, a tester that sends a test signal to the DUT via the test head 10 and inspects a response signal. 2 and a handler 1 that sequentially conveys the DUTs onto the test head 10 and classifies the DUTs that have been tested according to the test results. This electronic component testing apparatus tests whether a DUT operates properly in a state where a high or low temperature thermal stress is applied to the DUT (or a normal temperature state), and classifies the DUT according to the test result. It is.

  As shown in FIG. 1, a socket 33 that is in electrical contact with the DUT during a test is provided on the top of the test head 10. As shown in the figure, the socket 33 enters the inside of the handler 1 through an opening 1 a formed in the handler 1, and the transported DUT is pressed against the socket 33 by the handler 1. As the handler 1, a heat plate type or a chamber type can be used.

  As shown in FIGS. 2 and 3, the test head 10 includes a test head main body 11 and HiFix 15 (interface device). Inside the test head main body 11 is accommodated a pin electronics card 12 in which an electronic circuit used for DUT testing is incorporated. The pin electronics card 12 is electrically connected to the tester 2 via the cable 3 shown in FIG. 1 and is detachably connected to the HiFix 15 via connectors 13 and 16.

  The HiFix 15 is mounted on the test head main body 11 in order to electrically relay between the test head main body 11 and the performance board 20 (described later). A connector 17 for electrically connecting to the performance board 20 is provided on the upper part of the HiFix 15. The connectors 16 and 17 included in the HiFix 15 are electrically connected via a cable 18.

  The test head 10 in this embodiment further includes a socket board 30 and a performance board 20.

  The performance board 20 is mounted on the HiFix 15 and mounted on the second substrate 21, the fourth connector 24 mounted on the upper surface of the second substrate 21, and the lower surface of the second substrate 21. The connector 23 is provided. The connectors 23 and 24 are electrically connected via a wiring pattern or a through hole (not shown) formed on the second substrate 21. The lower connector 23 can be fitted into the upper connector 17 of the HiFix 15, and the HiFix 15 and the performance board 20 are electrically connected by fitting these connectors 17 and 23 together. It has come to be. The above-described fourth connector 24 is a general term for three fourth connectors 24A to 24C, which will be described later with reference to FIGS. 2 and FIG. 3 show only two fourth connectors 24, but actually, several tens to several hundreds of connectors 24 are mounted on one performance board 20.

  The socket board 30 is provided on the performance board 20, and includes a first substrate 31 on which the socket 33 is mounted on the upper surface, and a plurality of first connectors mounted on the lower surface of the first substrate 31. 35. In practice, one or more socket boards 30 are provided on one performance board 20. The socket 33 has a plurality of contact pins 34, and when the DUT is tested, the contact pins 34 and terminals derived from the DUT come into contact with each other, whereby the socket and the DUT are electrically connected. The socket 33 and the first connector 35 are electrically connected via a wiring pattern or a through hole (not shown) formed on the first substrate 31. The above-described first connector 35 is a general term for three first connectors 35A to 35C described later with reference to FIGS. 2 and FIG. 3 show only two first connectors 35, but actually, dozens of connectors 35 are mounted on one socket board 30.

  The performance board 20 and the socket board 30 are electrically connected via a cable 40. A second connector 43 that can be fitted to the first connector 35 of the socket board 30 is connected to the upper end of the cable 40 so that the cable 40 can be attached to and detached from the socket board 30. On the other hand, a third connector 45 that can be fitted to the fourth connector 24 of the performance board 20 is connected to the lower end of the cable 40 so that the cable 40 can be detached from the performance board 20. . The above-mentioned second connector 43 is a generic name of three second connectors 43A to 43C described later with reference to FIGS. 4 to 8, and the above-described third connector 45 is also referred to the same drawing. However, it is a general term for three third connectors 45A to 45C described later. The above-described cable 40 is a general term for three cables 40A to 40C described later with reference to FIGS.

  FIG. 4 is a diagram showing a connection relationship between the socket board, the cable, and the performance board in the present embodiment, and FIG.

  Below, the structure of the 1st-4th connector and those connection relations are demonstrated, referring FIG.4 and FIG.5. For ease of understanding, FIG. 4 to FIG. 8 will be described with an example in which the performance board 20 and the socket board 30 are connected by three sets of cables 40A to 40C. The socket board 30 is connected through several tens of cables 40.

  The three first connectors 35A to 35C shown in FIG. 4 are receptacle-type connectors having eight pins 36a to 36h held in, for example, an insulating housing. In the following, for each connector, the eight pins of each connector are referred to as a first pin, a second pin,..., An eighth pin from the left side to the right side in FIG. . The three first connectors 35A to 35C all have the same structure, but the positions of pins (detection pins) for detecting erroneous insertion of the connectors are different. Note that the “detection pin” in the present embodiment has no structural difference from other pins included in the connector, and is an expression used for the sake of convenience in order to clarify the difference in use with the other pins. Further, the number of pins included in the connector is not particularly limited, and actually, several tens of pins are provided in one connector.

  In the left first connector 35 </ b> A in FIG. 4, the first and second pins 36 a and 36 b (first detection pins) are connected via the detection wiring pattern 32 formed on the first substrate 31. They are directly connected to each other. On the other hand, although not particularly illustrated, the second to sixth pins 36c to 36f are also connected to the wiring pattern on the first substrate 31, but these pins 36c to 36f are not directly connected to each other. .

  In the left first connector 35A, the first and second pins 36a and 36b are used to detect erroneous insertion of the first and second connectors 35A and 43A, and the third to sixth pins 36c to 36f are used. Are used for testing the DUT, and the seventh and eighth pins 36g and 36h are not particularly used.

  On the other hand, in the first first connector 35B in FIG. 4, unlike the first connector 35A, the third and fourth pins 36c and 36d (first detection pins) are the detection wiring patterns. They are directly connected to each other via 32. On the other hand, although not particularly shown, the first, second, fifth and sixth pins 36a, 36b, 36e and 36f are also connected to the wiring pattern on the first substrate 31, but these pins 36a and 36b. 36e and 36f are not directly connected to each other.

  In the first first connector 35B, the third and fourth pins 36c and 36d are used for detecting erroneous insertion of the first and second connectors 35B and 43B, and the first, second, fifth and fifth pins are used. Six connectors 36a, 36b, 36e, and 36f are used for the DUT test, and the seventh and eighth pins 36g and 36h are not particularly used.

  On the other hand, in the first connector 35C on the right side in FIG. 4, unlike the first connectors 35A and 35B, the sixth and seventh connectors 36e and 36f (first detection pins) are the detection wiring patterns. They are directly connected to each other via 32. On the other hand, although not particularly illustrated, the first to fourth pins 36a to 36d are also connected to the wiring pattern on the first substrate 31, but these pins 36a to 36d are not directly connected to each other. .

  In the right first connector 35c, the fifth and sixth pins 36e and 36f are used for detecting erroneous insertion of the first and second connectors 35C and 43C, and the first to fourth pins 36a to 36d are used. Are used for testing the DUT, and the seventh and eighth pins 36g and 36h are not particularly used.

  As described above, by changing the position of the detection pin for each connector, erroneous insertion of the connector can be more reliably prevented even if the same shape connector is used for a plurality of applications in the same socket board 30. it can. In addition, although it demonstrated so that the position of the pin for a detection might not overlap at all in the three connectors 35A-35C, it is not specifically limited to this. It is only necessary that the position of at least one of the two detection pins is different from the position of the two detection pins in the other connector.

  The three second connectors 43A to 43C shown in FIG. 4 are plug-type connectors having, for example, eight pins 44a to 44h held in an insulating housing. All of the three second connectors 43A to 43C have the same structure. The second connectors 43A to 43C may be receptacle-type connectors. In this case, the first connectors 35A to 35C are plug-type connectors.

  The pins 44a to 44h of the second connectors 43A to 43C can contact the pins 36a to 36h of the first connectors 35A to 35C, respectively, when fitted. Accordingly, the first and second pins 44a and 44b in the second connector 43A on the left side in FIG. 4, the third and fourth pins 44c and 44d in the second connector 43B in the center, and the second pins on the right side in FIG. In the connector 43C, the fifth and sixth pins 44e and 44f correspond to an example of a second detection pin in the present invention.

  The three third connectors 45A to 45C shown in FIG. 4 are also plug-type connectors having, for example, eight pins 46a to 46h held in an insulating housing, and all have the same structure. In the third connector 45A on the left side in FIG. 4, the first to sixth pins 46a to 46f are connected to the first to sixth pins 44a to 44f of the second connector 43A via the conducting wire 41 of the cable 40A. Are electrically connected to each other. Accordingly, the first and second pins 46a and 46b in the third connector 45A on the left side in FIG. 4, the third and fourth pins 46c and 46d in the third connector 45B in the center, and the third pin on the right side in FIG. The fifth and sixth pins 46e and 46f in the connector 45C correspond to an example of a third detection pin in the present invention.

  The seventh and eighth pins 46g and 46h (fifth detection pins) of the third connector 45A on the left side are electrically connected to each other via the detection conductor 42 of the cable 40A. Similarly, in the second connector 43A, the seventh and eighth pins 44g and 44h are electrically connected to each other via the conducting wire of the cable 40A. In FIG. 4, the center and right third connectors 45B and 45C are also connected to the second connectors 43B and 43C via the cables 40B and 40C in the same manner. In any of the third connectors 45A to 45C, the seventh and eighth pins 46g and 46h are used to detect whether cables having different specifications are not erroneously connected.

  The four fourth connectors 24A to 24C shown in FIG. 4 are, for example, receptacle-type connectors having eight pins 25a to 25h held in an insulating housing, and all have the same structure. Note that the fourth connectors 24A to 24C may be plug-type connectors. In this case, the third connectors 45A to 45C are receptacle-type connectors.

  The pins 25a to 25h of the fourth connectors 24A to 24C can be in contact with the pins 46a to 46h of the third connectors 45A to 45C, respectively. In any of the fourth connectors 24A to 24C, The seventh and eighth pins 25g and 25h (sixth detection pins) are used to detect whether cables having different specifications are connected by mistake. On the other hand, in correspondence with the first connectors 35A to 35C, in each of the fourth connectors 24A to 24C, any two of the first to sixth pins 25a to 25f are not connected to the connector. Used to detect insertion.

  In the left fourth connector 24A in FIG. 4, the first and second pins 25a and 25b (fourth detection pins) are used for detecting erroneous insertion of the connector, and the third to sixth pins 25c. ˜25f is used for DUT testing. In the left fourth connector 24A, the second pin 25b is connected to the seventh pin 25g via the detection wiring pattern 22 formed on the second substrate 21, and the eighth pin 24b The pin 25h is connected to the third pin 25c of the central fourth connector 24B via the detection wiring pattern 22.

  On the other hand, in the central fourth connector 24B in FIG. 4, the third and fourth pins 25c and 25d (fourth detection pins) are used to detect erroneous insertion of the connector, and the first and second pins The second, fifth and sixth pins 25a, 25b, 25e and 25f are used for the DUT test. In the fourth connector 24B at the center, the fourth pin 25d is connected to the seventh pin 25g via the detection wiring pattern 22, and further, the eighth pin 25h is connected to the detection wiring pattern. 22 is connected to the fifth pin 25e of the fourth connector 24C on the right side.

  On the other hand, in the fourth connector 24C on the right side in FIG. 4, the fifth and sixth pins 25e and 25f (fourth detection pins) are used for detecting erroneous insertion of the connector, and the first to fourth pins are used. Pins 25a to 25d are used for testing the DUT. In the fourth connector 24 </ b> C on the right side, the sixth pin 25 f is connected to the seventh pin 25 g through the detection wiring pattern 22.

  When the confirmation of the cables 40A to 40C is unnecessary, the fourth detection pins of the fourth connectors 24A to 24C are directly connected to each other via the detection wiring pattern 22, and the seventh and eighth The pins 25g and 25h may be used for the DUT test.

  As shown in FIG. 5, the first pin 25 a of the left fourth connector 24 </ b> A and the eighth pin 25 h of the right fourth connector 24 </ b> C are connected to the erroneous insertion detection device 5 provided in the tester 2. Has been.

  The erroneous insertion detection device 5 is a device for detecting erroneous insertion of the second connectors 43A to 43C into the first connectors 35A to 35C, and includes an input unit 6 and a determination unit 7. As a result, the erroneous insertion detection device 5 can also detect erroneous insertion of the third connectors 45A to 45C into the fourth connectors 24A to 24C.

  The input unit 6 is connected to the first pin 25a of the left fourth connector 24A, and can input a detection signal for detecting erroneous insertion of the connector to the first pin 25a. ing. As this detection signal, a confirmation signal for confirming whether or not the HiFix 15 is attached to the test head main body 11 may be used.

  The determination unit 7 is connected to the eighth pin 25h of the fourth connector 24C on the right side, and confirms whether or not the detection signal input by the input unit 6 is output from the eighth pin 25h. Is possible. When the output of the detection signal is confirmed, the determination unit 7 permits the power supply unit 4 of the tester 2 to supply power for the DUT test. On the other hand, when the output of the detection signal is not confirmed, the determination unit 7 does not permit the power supply unit 4 to supply the test power.

  Next, the operation will be described.

  6 is a diagram illustrating an erroneous insertion detection path in the present embodiment, FIG. 7 is a diagram illustrating an example of a connection relationship when a connector is erroneously inserted in the present embodiment, and FIG. 8 is a diagram of cables having different specifications in the present embodiment. It is a figure which shows an example at the time of being connected accidentally.

  First, the case where all the connectors are correctly inserted in the example shown in FIG. 4 will be described with reference to FIG.

  As shown in FIG. 6, when the second connectors 43A to 43C are inserted into the first connectors 35A to 35C, respectively, and the third connectors 45A to 45C are inserted into the fourth connectors 24A to 24C, respectively. Between the first pin 25a of the left fourth connector 24A and the eighth pin 25h of the right fourth connector 24C, there is an erroneous insertion detection path 50 in which all detection pins are connected in series. It is formed. In this state, when the input unit 6 of the erroneous insertion detection device 5 inputs a detection signal, the detection signal is output to the determination unit 7 via the erroneous insertion detection path 50, and the determination unit 7 is connected to the power supply unit 6. Is allowed to supply test power. A plurality of erroneous insertion detection paths may be formed, or an erroneous insertion detection path may be formed for each connector so that erroneous insertion of each connector can be detected individually.

  On the other hand, for example, as shown in FIG. 7, the second connector 43A to be originally inserted into the first connector 35A on the left side is erroneously inserted into the first connector 35B at the center and the first connector at the center is inserted. If the second connector 43B to be inserted into the connector 35B is accidentally inserted into the left first connector 35A, the first pin 36a and the second pin 36b of the central first connector 35B are inserted. Are not connected to each other, the erroneous insertion detection path 50 is not formed.

  Further, for example, as shown in FIG. 8, when the cable 40 ′ that does not have the detection conductor 42 is used as the center cable by mistake, the seventh pin 46g of the center second connector 45B is used. And the eighth pin 46h, the erroneous insertion detection path 50 is blocked.

  In the case shown in FIG. 7 or FIG. 8, even if the input unit 6 of the erroneous insertion detection device 5 inputs a detection signal, the detection signal is not output to the determination unit 7, so the determination unit 7 The supply of test power to the supply unit 6 is not permitted.

  As described above, in the present embodiment, the pair of detection pins among the plurality of pins 36a to 36h included in the first connectors 35A to 35C are electrically connected to each other. For this reason, after inserting the connector, input a detection signal from one detection pin and confirm that the detection signal is output from the other detection pin before supplying test power. Thus, it can be confirmed that the connector at the insertion destination is the connector to be originally inserted.

  In the present embodiment, a pair of detection pins among the plurality of pins 46a to 46h included in the third connectors 45A to 45C are electrically connected to each other. For this reason, after inserting the connector, input the detection signal from one detection pin, and check that the detection signal is output from the other detection pin. Can be confirmed.

  The embodiment described above is described for facilitating the understanding of the present invention, and is not described for limiting the present invention. Therefore, each element disclosed in the above embodiment is intended to include all design changes and equivalents belonging to the technical scope of the present invention.

  For example, the lower end of the cable 40 may be directly connected to the wiring pattern on the second substrate 21 without using the third and fourth connectors 45 and 24 by soldering or the like.

  In addition, a pair of detection pins electrically connected to each other is provided on the fourth connector 24 of the performance board 20 to detect erroneous insertion of the third connector 46 into the fourth connector 24. Also good. For example, in the example shown in FIG. 9, the first and second pins 25 a and 25 b (first detection pins) of the fourth connector 24 are erroneously inserted into the fourth connector 24. Used for detection. As shown in the figure, the first pin 25 a and the second pin 25 b of the fourth connector 24 are connected to each other via a detection wiring pattern 22 formed on the second substrate 21 of the performance board 20. Is electrically connected. In this case, the fourth connector 24 in the present embodiment corresponds to an example of the first connector in the present invention, and the third connector 45 in the present embodiment corresponds to an example of the second connector in the present invention. Equivalent to. Further, although not shown in particular, it is possible to more reliably prevent erroneous insertion of the connector by changing the position of the detection pin for each connector. Further, in this case, the upper end of the cable 40 may be directly connected to the wiring pattern on the first substrate 31 without using the first and second connectors 35 and 43 by soldering or the like.

Claims (5)

A first circuit board having a first substrate on which a first conductor wiring is formed, and a plurality of first connectors mounted on the first substrate;
A plurality of cables each having a second connector that can be fitted to the first connector at one end and a third connector at the other end ;
A second board on which a second conductor wiring is formed, and a second circuit board mounted on the second board and having a plurality of fourth connectors that can be fitted to the third connector; A circuit board assembly for an electronic component testing apparatus comprising :
Said plurality of first pin having a first connector, respectively are mutually seen contains electrically connected to a pair of first detection pin through the first conductor wiring,
The plurality of second pins respectively included in the second connector include a pair of second detection pins arranged at positions corresponding to the first detection pins,
The plurality of third pins respectively included in the third connector includes a pair of third detection pins electrically connected to the second detection pins via the conductive wires of the cable,
The plurality of fourth pins of the fourth connector include a pair of fourth detection pins arranged at positions corresponding to the third detection pins,
The third pin further includes a pair of fifth detection pins that are electrically connected to each other via the conductor of the cable,
The fourth pin further includes a pair of sixth detection pins arranged at positions corresponding to the fifth detection pins,
One of the fourth detection pins is electrically connected to a fourth detection pin of another fourth connector through the second conductor wiring and the fifth and sixth detection pins. A circuit board assembly characterized by being connected . The position of the first detection pin of at least one of the first detection pins in the first connector is a first detection in the other first connector of the plurality of first connectors. 2. The circuit board assembly according to claim 1 , wherein the position of the circuit board is different from the position of the working pin. The combination of all of the fourth detection pin of the second circuit board, the circuit board assembly of claim 1 or 2, characterized in that connected in series via the second conductor wiring . An erroneous insertion detection device for detecting erroneous insertion of a connector in an electronic component testing device,
A circuit board assembly according to any of claims 1 to 3 ,
Input means for inputting a detection signal to the circuit board assembly;
An erroneous insertion detection device comprising: a determination unit configured to determine whether test circuit power can be supplied to the circuit board assembly based on whether the detection signal is output from the circuit board assembly; . The determination unit determines to supply test power to the circuit board assembly when the detection signal is output from the circuit board assembly, and the detection signal is not output from the circuit board assembly. The erroneous insertion detection apparatus according to claim 4 , wherein, in the event of failure, a determination is made not to supply test power to the circuit board assembly.

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