KR101226466B1 - Circuit board assembly - Google Patents

Abstract

The circuit board 30 is provided with the 1st board | substrate 31 in which the detection wiring pattern 32 was formed, and the some connector 35A-35C mounted in the 1st board | substrate 31, and the connector 35A-35C. Each of the plurality of pins 36a to 36h includes a pair of detection pins electrically connected to each other via the detection wiring pattern 32.

Description

Circuit Board Assembly {CIRCUIT BOARD ASSEMBLY}

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a substrate having a conductor wiring formed thereon, a circuit board having a plurality of connectors mounted on the substrate, a circuit board assembly having the same, and a misinsertion detection apparatus.

In the manufacturing process of electronic components such as semiconductor integrated circuit devices (hereinafter, simply referred to as device under test (DUT)), an electronic component test apparatus is used to test the performance and function of the DUT.

The electronic component test apparatus includes a test head having a socket in electrical contact with the DUT, a tester for testing the DUT through the test head, and sequentially returning the DUT onto the test head. It has a handler to classify.

The test head includes a socket board on which a socket is mounted, and a performance board electrically connected to the socket board, and it is known that these test boards are connected through a cable. In the test head of such a structure, many board | substrates are mounted in any board, and the cable can be attached or detached from each board.

However, if the same shape connector is used for a plurality of purposes on the same board, there is a problem of incorrect insertion of the connector. If the test power of the DUT is supplied to the socket board with the connector inserted incorrectly, the electronic components mounted on the socket board may be damaged by high voltage.

The problem to be solved by the present invention is to provide a circuit board, a circuit board assembly and a misinsertion detection device capable of preventing misinsertion of a connector.

(1) According to the present invention, there is provided a circuit board having a substrate on which conductor wiring is formed and a plurality of connectors mounted on the substrate, wherein a plurality of pins each of the connectors are electrically connected to each other through the conductor wiring. There is provided a circuit board comprising a pin for detection of (see claim 1).

In the above invention, it is preferable that the position of at least one detection pin of the detection pins in the connector is different from the position of the detection pin in the other connector of the plurality of connectors (see claim 2).

(2) According to the present invention, a first circuit board having a first substrate on which first conductor wiring is formed and a plurality of first connectors mounted on the first substrate, and a second connector coupleable to the first connector A circuit board assembly having a plurality of cables each having a plurality of cables, wherein the plurality of first pins each of the first connector includes a pair of first detecting pins electrically connected to each other through the first conductor wiring. A circuit board assembly is provided (see claim 3).

In the above invention, the position of at least one of the first detecting pins of the first detecting pins in the first connector is different from the position of the first detecting pins in the other first connectors of the plurality of first connectors. It is preferred to be different (see claim 4).

In the above invention, each of the plurality of cables has a third connector at the other end, and the circuit board assembly is mounted on the second substrate and the second substrate on which the second conductor wiring is formed, and the plurality of cables connectable to the third connector. It is further preferred to further comprise a second circuit board having a fourth connector (see claim 5).

In the present invention, the plurality of second pins each of the second connector includes a pair of second detection pins disposed at positions corresponding to the first detection pins, and the plurality of second pins each of the third connectors has a plurality of second pins. The third pin includes a pair of third detection pins electrically connected to the second detection pins through a conductive wire of the cable, and the plurality of fourth pins of the fourth connector includes the third detection pins. And a pair of fourth detection pins disposed at a position corresponding to the first detection pin, wherein one of the fourth detection pins is electrically connected to the fourth detection pins of the other fourth connector through the second conductor wiring. It is preferred that there is (see claim 6).

In the above invention, it is preferable that all combinations of the fourth detection pins in the second circuit board are connected in series through the second conductor wiring (see claim 7).

In the present invention, the third pin further comprises a pair of fifth detecting pins electrically connected to each other through a conductor of the cable, wherein the fourth pin is disposed at a position corresponding to the fifth detecting pin. And a pair of sixth detection pins, wherein one of the fourth detection pins is electrically connected to a fourth detection pin of the other fourth connector through the fifth and sixth detection pins. It is preferred that there is (see claim 8).

In the above invention, a second circuit board having a second substrate on which second conductor wiring is formed is further provided, and the other ends of the plurality of cables are preferably directly connected to the second substrate (see claim 9).

(3) According to the present invention, there is provided a misinsertion detection device for detecting a misinsertion of a connector in an electronic component testing apparatus, comprising: said circuit board assembly, input means for inputting a detection signal to said circuit board assembly, and said circuitry; A misinsertion detecting apparatus is provided, comprising determining means for determining whether to supply test power to the circuit board assembly based on the presence or absence of the output of the detection signal from the board assembly (claims). 10).

In the present invention, the determining means determines to supply the test power to the circuit board assembly when the detection signal is output from the circuit board assembly, and the detection signal is not output from the circuit board assembly. In this case, it is desirable to determine not to supply test power to the circuit board assembly (see claim 11).

In the present invention, a pair of detection pins among a plurality of pins of the connector are electrically connected to each other. Therefore, by confirming that the detection signal input from one detection pin is output from the other detection pin after insertion of the connector, it is possible to confirm that the connector inserted previously is the connector to be inserted before power supply. Therefore, incorrect insertion of the connector can be prevented.

BRIEF DESCRIPTION OF THE DRAWINGS The schematic sectional drawing of the electronic component test apparatus in embodiment of this invention.
2 is a schematic cross-sectional view of a test head in an embodiment of the present invention.
3 is an exploded view of the test head shown in FIG.
Fig. 4 is a diagram showing a connection relationship between a socket board, a cable, and a performance board in the embodiment of the present invention.
Fig. 5 is a block diagram showing a misinsertion detection apparatus in the embodiment of the present invention.
Fig. 6 is a diagram showing a path for detecting connector misinsertion in the embodiment of the present invention.
7 is a view showing an example of a connection relationship when a connector is incorrectly inserted in the embodiment of the present invention.
8 is a diagram showing an example of a connection relationship when a cable of another specification is wrongly connected in the embodiment of the present invention.
Fig. 9 is a diagram showing a connection relationship between a performance board and a cable in another embodiment of the present invention.

EMBODIMENT OF THE INVENTION Hereinafter, embodiment of this invention is described based on drawing.

1 is a schematic cross-sectional view of an electronic component test apparatus in an embodiment of the present invention, FIG. 2 is a schematic cross-sectional view of a test head in an embodiment of the present invention, and FIG. 3 is an exploded view of the test head shown in FIG.

As shown in FIG. 1, the electronic component test apparatus according to the present embodiment sends a test signal to the DUT through the test head 10 and the test head 10 electrically connected to the DUT, and simultaneously checks the response signal. The tester 2 and the handler 1 which sequentially convey the DUT onto the test head 10 and classify the completed DUT according to the test result are provided. The electronic component test apparatus is a device that tests whether the DUT operates properly in a state where a high or low temperature heat stress is applied to the DUT (or a normal temperature state), and classifies the DUT according to the test result.

As shown in FIG. 1, the upper part of the test head 10 is provided with the socket 33 which electrically contacts a DUT at the time of a test. As shown in FIG. 1, the socket 33 enters the inside of the handler 1 through the opening 1a formed in the handler 1, and the returned DUT is connected to the socket 33 by the handler 1. Close to) On the other hand, as the handler 1, a heat plate type or a chamber type can be used.

As shown in FIG. 2 and FIG. 3, the test head 10 includes a test head main body 11 and a high fix 15 (interface device). In the test head main body 11, a pin electronic card 12 in which an electronic circuit used for testing a DUT is assembled is housed. The pin electronics card 12 is electrically connected to the tester 2 via the cable 3 shown in FIG. 1 and can be attached to or detached from the high fix 15 through the connectors 13 and 16. Is connected.

The high fix 15 is mounted on the test head main body 11 in order to electrically relay between the test head main body 11 and the performance board 20 (described later). The upper part of the high fix 15 is provided with a connector 17 for electrically connecting with the performance board 20. The connectors 16 and 17 of the high fix 15 are electrically connected through a cable 18.

The test head 10 in the present embodiment further includes a socket board 30 and a performance board 20.

The performance board 20 is mounted on the high fix 15, the second board 21, the fourth connector 24 mounted on the upper surface of the second board 21, and the second board 21. A connector 23 mounted on the bottom surface of the bottom portion is provided. The connectors 23 and 24 are electrically connected through wiring patterns and through holes (not shown) formed on the second substrate 21. The lower connector 23 is capable of being coupled to the upper connector 17 of the high fix 15, and the connectors 17 and 23 are coupled to each other so that the high fix 15 and the performance board 20 are connected. Is electrically connected. On the other hand, the above-mentioned fourth connector 24 is a generic term for three fourth connectors 24A to 24C described later with reference to FIGS. 4 to 8. 2 and 3 show only two fourth connectors 24, in practice, tens to hundreds of connectors 24 are mounted on one performance board 20. In FIG.

The socket board 30 is provided on the performance board 20, and the first board 31 on which the above-described socket 33 is mounted is mounted on the upper surface, and a plurality of agents mounted on the bottom surface of the first board 31. 1 connector 35 is provided. On the other hand, in practice, one or more socket boards 30 are provided on one performance board 20. The socket 33 has a plurality of contact pins 34, and the sockets and the DUT are electrically connected by contacting these contact pins 34 with terminals derived from the DUT during the test of the DUT. The socket 33 and the first connector 35 are electrically connected to each other via a wiring pattern or through hole (not shown) formed in the first substrate 31. The first connector 35 described above is a generic term for three first connectors 35A to 35C described below with reference to FIGS. 4 to 8. In addition, although only two 1st connectors 35 are shown in FIG. 2 and FIG. 3, dozens of connectors 35 are actually mounted in one socket board 30. In FIG.

The performance board 20 and the socket board 30 are electrically connected through the cable 40. A second connector 43 connectable to the first connector 35 of the socket board 30 is connected to the upper end of the cable 40, so that the cable 40 can be detached from the socket board 30. It is. On the other hand, the lower end of the cable 40 is connected to a third connector 45 that can be coupled to the fourth connector 24 of the performance board 30, and the cable 40 can be attached and detached from the performance board 20. It is supposed to be done. In addition, the above-mentioned 2nd connector 43 is a general term of three 2nd connectors 43A-43C demonstrated after referring FIG. 4-FIG. 8, and the above-mentioned 3rd connector 45 is also FIG. 4-FIG. A general term of three third connectors 45A to 45C to be described later with reference to 8. In addition, the cable 40 mentioned above is a general term of three cables 40A-40C demonstrated later, referring FIGS. 4-8.

4 is a diagram showing a connection relationship between a socket board, a cable, and a performance board in the embodiment of the present invention, and FIG. 5 is a block diagram showing a misinsertion detection apparatus in the embodiment of the present invention.

Hereinafter, the structure of these 1st-4th connector and these connection relationship are demonstrated, referring FIG. 4 and FIG. On the other hand, in order to make understanding easy, although the case where the performance board 20 and the socket board 30 are connected by three sets of cables 40A-40C is demonstrated as an example in FIG. The board 20 and the socket board 30 are connected through the tens of sets of cables 40.

The three first connectors 35A to 35C shown in FIG. 4 are receptacle connectors having, for example, eight pins 36a to 36h held in an insulating housing. In addition, below, the eight pins which each connector has with respect to any connector are 1st pin, 2nd pin,... , The eighth pin. Although all three 1st connectors 35A-35C have the same structure, the position of the pin (detection pin) for detecting misinsertion of a connector differs. On the other hand, the "detection pin" in this embodiment is an expression used conveniently to make it clear that there is no difference in structure with the other pin which a connector has, and the use with that other pin is different. In addition, the number of pins which a connector has is not specifically limited, In reality, dozens of pins are provided in one connector.

In the first connector 35A on the left side of FIG. 4, the first and second pins 36a and 36b (the first detection pin) are directly connected to each other through the detection wiring pattern 32 formed on the first substrate 31. Is connected. Although not specifically shown, the second to sixth pins 36c to 36f are also connected to the wiring pattern on the first substrate 31, but these pins 36c to 36f are not directly connected to each other.

In the first connector 35A on the left side, the first and second pins 36a and 36b are used to detect misinsertion of the first and second connectors 35A and 43A. 36f) is used for testing of the DUT, and the seventh and eighth pins 36g and 36h are not particularly used.

In contrast, unlike the first connector 35A described above, in the first connector 35B in FIG. 4, the third and fourth pins 36c and 36d (the first detection pin) have a detection wiring pattern ( 32 are directly connected to each other. Although not particularly shown, the first, second, fifth and sixth fins 36a, 36b, 36e, and 36f are also connected to the wiring pattern on the first substrate 31, but these fins 36a, 36b, 36e and 36f) are not directly connected.

In the central first connector 35B, the third and fourth pins 36c and 36d are used to detect misinsertion of the first and second connectors 35B and 43B, and the first, second, and fifth And the sixth connectors 36a, 36b, 36e, and 36f are used for testing the DUT, and the seventh and eighth pins 36g and 36h are not particularly used.

On the other hand, in the first connector 35C on the right side of FIG. 4, unlike the first connectors 35A and 35B described above, the sixth and seventh connectors 36e and 36f (the first detection pin) detect the wiring pattern. (32) is directly connected to each other. Although not specifically shown, the first to fourth pins 36a to 36d are also connected to the wiring pattern on the first substrate 31, but these pins 36a to 36d are not directly connected to each other.

In the first connector 35c on the right side, the fifth and sixth pins 36e and 36f are formed of the first and second pins. It is used to detect misinsertion of the connectors 35C and 43C, the first to fourth pins 36a to 36d are used for the test of the DUT, and the seventh and eighth pins 36g and 36h are not particularly used.

As described above, by changing the position of the detection pin for each connector, even if a connector having the same shape is used for a plurality of purposes in the same socket board 30, misinsertion of the connector can be prevented more reliably. In addition, although the position of the detection pin was not overlapped in three connectors 35A-35C, it is not limited to this in particular. The position of at least one of the two detection pins may be different from that of the two detection pins in the other connector.

The three second connectors 43A to 43C shown in FIG. 4 are plug-type connectors having, for example, eight pins 44a to 44h held in an insulating housing. All three second connectors 43A to 43C have the same structure. On the other hand, the second connectors 43A to 43C may be receptacle connectors, in which case the first connectors 35A to 35C are plug-in connectors.

The pins 44a to 44h of the second connectors 43A to 43C are able to contact the pins 36a to 36h of the first connectors 35A to 35C, respectively, at the time of engagement. Thus, the first and second pins 44a and 44b in the second connector 43A on the left side of FIG. 4, the third and fourth pins 44c and 44d in the second connector 43B in the center, and In the second connector 43C on the right side, the fifth and sixth pins 44e and 44f correspond to an example of the second detecting pin in the present invention.

The three third connectors 45A to 45C shown in FIG. 4 are also plug-type connectors having, for example, eight pins 46a to 46h held in an insulating housing, and all have the same structure. In FIG. 4, in the third connector 45A on the left side, the first to sixth pins 46a to 46f are connected to the first to sixth pins of the second connector 43A via the conductive wire 41 of the cable 40A. 44a-44f), respectively, are electrically connected. Thus, the first and second pins 46a and 46b at the third connector 45A on the left side of FIG. 4, the third and fourth pins 46c and 46d at the center third connector 45B, and The fifth and sixth pins 46e and 46f in the third connector 45C on the right side correspond to an example of the third detecting pin in the present invention.

The seventh and eighth pins 46g and 46h (the fifth detection pin) of the third connector 45A on the left side are electrically connected to each other via the detection lead 42 of the cable 40A. On the other hand, similarly to the second connector 43A, the seventh and eighth pins 44g and 44h are electrically connected to each other through the conductive wire of the cable 40A. In FIG. 4, the 3rd connectors 45B and 45C of the center and the right side are also connected to the 2nd connectors 43B and 43C via the cables 40B and 40C in the same way. In any of the third connectors 45A to 45C, the seventh and eighth pins 46g and 46h are used to detect whether cables of different specifications are connected incorrectly.

The three fourth connectors 24A to 24C shown in FIG. 4 are receptacle connectors having eight pins 25a to 25h held in an insulating housing, for example, and all have the same structure. On the other hand, the fourth connectors 24A to 24C may be plug type connectors, and in this case, the third connectors 45A to 45C become receptacle connectors.

The pins 25a to 25h of the fourth connectors 24A to 24C can come into contact with the pins 46a to 46h of the third connectors 45A to 45C, respectively, and any of the fourth connectors 24A to 24C. Also, the seventh and eighth pins 25g and 25h (sixth detection pins) are used to detect whether cables of different specifications are not connected incorrectly. In contrast, in response to the first connectors 35A to 35C, at least two pins among the first to sixth pins 25a to 25f detect incorrect insertion of the connector at the respective fourth connectors 24A to 24C. To be used.

In the fourth connector 24A on the left side in Fig. 4, the first and second pins 25a and 25b (fourth detection pins) are used to detect misinsertion of the connector, and the third to sixth pins 25c to 25f. ) Is used to test the DUT. In the fourth connector 24A on the left side, the second pin 25b is connected to the seventh pin 25g via the detection wiring pattern 22 formed on the second substrate 21, and the eighth pin. 25h is connected to the third pin 25c of the fourth connector 24B in the center via the detection wiring pattern 22.

In contrast, in the fourth connector 24B in FIG. 4, the third and fourth pins 25c and 25d (fourth detection pins) are used to detect misinsertion of the connector. The fifth and sixth pins 25a, 25b, 25e, and 25f are used for testing the DUT. In the center fourth connector 24B, the fourth pin 25d is connected to the seventh pin 25g through the detection wiring pattern 22, and the eighth pin 25h is connected to the detection wiring pattern ( 22 is connected to the fifth pin 25e of the fourth connector 24C on the right side.

On the other hand, in the 4th connector 24C on the right side in FIG. 4, 5th and 6th pins 25e and 25f (the detection pin) are used for the detection of the misinsertion of a connector, and 1st-4th pins 25a- 25d) is used for testing of the DUT. In the fourth connector 24C on the right side, the sixth pin 25f is connected to the seventh pin 25g via the detection wiring pattern 22.

On the other hand, when the identification of cables 40A to 40C is unnecessary, the fourth detection pins of the fourth connectors 24A to 24C are directly connected to each other through the detection wiring pattern 22 to form the seventh and eighth pins. (25g, 25h) may be used to test the DUT.

As shown in FIG. 5, the first pin 25a of the fourth connector 24A on the left side and the eighth pin 25h of the fourth connector 24C on the right side detect misinsertion of the tester 2. It is connected to the apparatus 5.

The misinsertion detection device 5 is a device for detecting misinsertion of the second connectors 43A to 43C into the first connectors 35A to 35C, and includes an input unit 6 and a determination unit 7. As a result, the misinsertion detection device 5 can also detect misinsertion of the third connectors 45A to 45C to the fourth connectors 24A to 24C.

The input part 6 is connected to the 1st pin 25a of the 4th connector 24A of the left side, and it becomes possible to input the detection signal for detecting the misinsertion of a connector to the 1st pin 25a. have. As the detection signal, a confirmation signal for confirming whether or not the high fix 15 is attached to the test head main body 11 may be used.

The determination unit 7 is connected to the eighth pin 25h of the fourth connector 24C on the right side, and confirms whether or not the detection signal input by the input unit 6 is output from the eighth pin 25h. It is possible to do. When the output of the detection signal is confirmed, the determination unit 7 permits the power supply unit 4 of the tester 2 to supply power for the test of the DUT. In contrast, when the output of the detection signal is not confirmed, the determination unit 7 does not permit the power supply unit 4 to supply the test power.

Next, the operation will be described.

Fig. 6 is a diagram showing a path for misinsertion detection in the embodiment of the present invention. Fig. 7 is a diagram showing an example of a connection relationship when a connector is misinserted in the embodiment of the present invention. Fig. 1 is a diagram showing an example in which cables of different specifications are wrongly connected.

First, in the example shown in FIG. 4, the case where all the connectors are correctly inserted will be described with reference to FIG. 6.

As shown in FIG. 6, the second connectors 43A to 43C are inserted into the first connectors 35A to 35C, respectively, and the third connectors 45A to 45C are respectively attached to the fourth connectors 24A to 24C. When inserted, misinsertion detection in which all the detection pins are connected in series between the first pin 25a of the fourth connector 24A on the left side and the eighth pin 25h of the fourth connector 24C on the right side is performed. Dragon path 50 is formed. In this state, when the input unit 6 of the erroneous insertion detection device 5 inputs the detection signal, the detection signal is outputted to the determination unit 7 via the erroneous insertion detection path 50, and the determination unit (7) permits supply of test power to the power supply unit (6). On the other hand, a plurality of misinsertion detection paths may be formed, or a misinsertion detection path may be formed for each connector so as to detect misinsertion of each connector individually.

On the other hand, as shown in FIG. 7, for example, the 2nd connector 43A which should be originally inserted in the 1st connector 35A of the left side is wrongly inserted in the 1st connector 35B of the center, and the 1st center of the center is inserted. In the case where the second connector 43B to be inserted into the connector 35B is incorrectly inserted into the first connector 35A on the left side, the first pin 36a and the second pin 36b of the first connector 35B in the center are inserted. ) Are not connected to each other, so that the misinsertion detection path 50 is not formed.

For example, as shown in FIG. 8, when the cable 40 'which does not have the detection conductor 42 as a center cable is used incorrectly, the 7th pin 46g of the center 2nd connector 45B is used. ) And the misinsertion detection path 50 is blocked between the eighth pin 46h.

In the case as shown in Fig. 7 or Fig. 8, even if the input part 6 of the erroneous insertion detection device 5 inputs a detection signal, the detection signal is not output to the determination unit 7, so that the determination is made. The unit 7 does not permit the supply of the test power to the power supply unit 6.

As described above, in the present embodiment, a pair of detection pins among the plurality of pins 36a to 36h included in the first connectors 35A to 35C are electrically connected to each other. Therefore, after inserting the connector, the input signal is input from one of the detection pins and the output signal is supplied from the other detection pin to confirm that the detection signal is output from the other detection pin. You can see that is the connector that should be inserted.

In this embodiment, a pair of detection pins among the plurality of pins 46a to 46h of the third connectors 45A to 45C are electrically connected to each other. Therefore, after the connector is inserted, the detection signal is input from one detection pin and the signal for detection is output from the other detection pin, thereby confirming that the cable having the correct specification is connected. .

In addition, embodiment described above was described in order to make understanding of this invention easy, and was not described in order to limit this invention. Therefore, each element disclosed in the said embodiment is intended to include all the design changes and equivalents which belong to the technical scope of this invention.

For example, the lower end of the cable 40 may be directly connected to the wiring pattern on the second substrate 21 by soldering or the like without using the third and fourth connectors 45 and 24.

In addition, a pair of detection pins, which are electrically connected to each other, are provided in the fourth connector 24 of the performance board 20 to detect misinsertion of the third connector 46 into the fourth connector 24. You may also do it. For example, in the example shown in FIG. 9, the 1st and 2nd pins 25a and 25b (the 1st detection pin) in the 4th connector 24 are the 3rd connector 45 to the 4th connector 24. It is used for the detection of misinsertion. As shown in FIG. 9, the first and second pins 25a and 25b of the fourth connector 24 are the wiring patterns 22 for detection formed on the second substrate 21 of the performance board 20. Through them, they are electrically connected to each other. On the other hand, in that case, the 4th connector 24 in this embodiment is equivalent to an example of the 1st connector in this invention, and the 3rd connector 45 in this embodiment is a thing of the 2nd connector in this invention. It corresponds to an example. In addition, although not shown in particular, by changing the position of a detection pin for every connector, incorrect insertion of a connector can be prevented more reliably. In that case, the upper end of the cable 40 may be directly connected to the wiring pattern on the first substrate 31 by soldering or the like without using the first and second connectors 35 and 43.

2… Tester
5 ... Incorrect Insertion Detection Device
6 ... Input
7 ... Judgment
10... Test head
20... Performance board
21 ... Second substrate
22... Detection wiring pattern
24, 24 A to 24 C. Fourth connector
30 ... Socket board
31 ... The first substrate
32 ... Detection wiring pattern
35,35A to 35C. First connector
40, 40 A to 40 C. cable
41... ferry
42 ... Detection Lead
43,43A to 43C... Second connector
45,45A ~ 45C... Third connector
50... Misinsertion detection path

Claims (11)

delete delete A first circuit board having a first substrate on which first conductor wiring is formed and a plurality of first connectors mounted on the first substrate;
A circuit board assembly having a plurality of cables each having a second connector at one end that can be coupled to the first connector,
And a plurality of first pins each of the first connector includes a pair of first detection pins electrically connected to each other through the first conductor wiring. The method according to claim 3,
The position of at least one of the first detecting pins of the first detecting pins in the first connector is different from the position of the first detecting pins in the other first connectors of the plurality of first connectors. Circuit board assembly. The method according to claim 3,
The plurality of cables each have a third connector at the other end,
The circuit board assembly further includes a second circuit board having a second substrate having a second conductor wiring formed thereon and a plurality of fourth connectors mounted on the second substrate and coupled with the third connector. Board assembly. The method according to claim 5,
The plurality of second pins each of the second connector includes a pair of second detection pins disposed at positions corresponding to the first detection pins,
The plurality of third pins each of the third connector includes a pair of third detection pins electrically connected to the second detection pins through a conductive wire of the cable,
The plurality of fourth pins included in the fourth connector includes a pair of fourth detection pins disposed at positions corresponding to the third detection pins.
One side of the fourth detection pin is electrically connected to a fourth detection pin of the other fourth connector via the second conductor wiring. The method of claim 6,
And a combination of all of the fourth detection pins in the second circuit board is connected in series via the second conductor wiring. The method of claim 6,
The third pin further includes a pair of fifth detecting pins electrically connected to each other through a conductor of the cable,
The fourth pin further includes a pair of sixth detection pins disposed at positions corresponding to the fifth detection pins.
One of the fourth detection pins is electrically connected to a fourth detection pin of the other fourth connector via the fifth and sixth detection pins. The method according to claim 3,
And a second circuit board having a second substrate on which second conductor wiring is formed,
The other end of the plurality of cables is directly connected to the second substrate. delete delete

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