WO2016158410A1 - 基板処理装置および基板処理方法 - Google Patents
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Abstract
Description
5 加熱部
6,6a~6c 処理液供給部
9 基板
31 基板保持部
33 基板回転機構
61,61a 第1ノズル
62,62a 第2ノズル
71 第1液膜
72 第2液膜
73 (第1液膜の)上面
91 (基板の)上面
92 (基板の)下面
95 異物
J1 中心軸
S11~S14 ステップ
Claims (19)
- 基板を処理する基板処理装置であって、
水平状態に基板を保持する基板保持部と、
前記基板の上面上に第1処理液および前記第1処理液よりも比重が小さく沸点が高い第2処理液を供給し、前記第1処理液の液膜である第1液膜、および、前記第1液膜の上面を覆う前記第2処理液の液膜である第2液膜を前記基板の前記上面上に形成する処理液供給部と、
を備え、
前記第1処理液の沸点以上かつ前記第2処理液の沸点よりも低い温度にて前記第1液膜の加熱が行われることにより、前記第2液膜と前記基板との間にて気化した前記第1処理液により、前記基板の前記上面上の異物を前記基板の前記上面から剥離させて前記第2液膜内へと移動させる。 - 請求項1に記載の基板処理装置であって、
上下方向を向く中心軸を中心として前記基板を前記基板保持部と共に回転させることにより、前記第2液膜を前記基板の前記上面上から除去する基板回転機構をさらに備える。 - 請求項1または2に記載の基板処理装置であって、
前記第1処理液の気化と並行して、前記処理液供給部から前記第2液膜に前記第2処理液が継続的に供給される。 - 請求項1ないし3のいずれかに記載の基板処理装置であって、
前記第1処理液の気化と並行して、前記処理液供給部から前記第1液膜に前記第1処理液が継続的に供給される。 - 請求項1ないし4のいずれかに記載の基板処理装置であって、
前記基板を下面側から加熱することにより前記第1液膜の前記加熱を行う加熱部をさらに備える。 - 請求項1ないし5のいずれかに記載の基板処理装置であって、
前記第1処理液の沸点よりも高くかつ前記第2処理液の沸点よりも低い温度にて前記処理液供給部から前記基板上に供給された前記第2処理液により、前記第1液膜の前記加熱が行われる。 - 請求項1ないし6のいずれかに記載の基板処理装置であって、
前記処理液供給部が、
前記第1処理液を前記基板の前記上面に向けて吐出する第1ノズルと、
前記第2処理液を前記基板の前記上面に向けて吐出する第2ノズルと、
を備え、
前記第2液膜が形成された状態で、前記第1ノズルの先端が、前記基板の前記上面と前記第2液膜の上面との間に位置する。 - 請求項1ないし7のいずれかに記載の基板処理装置であって、
前記第1液膜が前記基板の前記上面全体を覆い、
前記第2液膜が前記第1液膜の前記上面全体を覆う。 - 請求項1ないし8のいずれかに記載の基板処理装置であって、
前記第1処理液がハイドロフルオロエーテルであり、前記第2処理液が純水である。 - 請求項1ないし8のいずれかに記載の基板処理装置であって、
前記第1処理液がハイドロフルオロエーテルであり、前記第2処理液がイソプロピルアルコールである。 - 基板を処理する基板処理方法であって、
a)水平状態に保持された基板の上面上に第1処理液および前記第1処理液よりも比重が小さく沸点が高い第2処理液を供給し、前記第1処理液の液膜である第1液膜、および、前記第1液膜の上面を覆う前記第2処理液の液膜である第2液膜を前記基板の前記上面上に形成する工程と、
b)前記第1処理液の沸点以上かつ前記第2処理液の沸点よりも低い温度にて前記第1液膜の加熱を行うことにより、前記第2液膜と前記基板との間にて気化した前記第1処理液により、前記基板の前記上面上の異物を前記基板の前記上面から剥離させて前記第2液膜内へと移動させる工程と、
を備える。 - 請求項11に記載の基板処理方法であって、
前記b)工程よりも後に、上下方向を向く中心軸を中心として前記基板を回転させることにより、前記第2液膜を前記基板の前記上面上から除去する工程をさらに備える。 - 請求項11または12に記載の基板処理方法であって、
前記b)工程と並行して、前記第2液膜に前記第2処理液が継続的に供給される。 - 請求項11ないし13のいずれかに記載の基板処理方法であって、
前記b)工程と並行して、前記第1液膜に前記第1処理液が継続的に供給される。 - 請求項11ないし14のいずれかに記載の基板処理方法であって、
前記b)工程において、前記基板を下面側から加熱することにより前記第1液膜の前記加熱が行われる。 - 請求項11ないし15のいずれかに記載の基板処理方法であって、
前記第1処理液の沸点よりも高くかつ前記第2処理液の沸点よりも低い温度にて前記基板上に供給された前記第2処理液により、前記b)工程における前記第1液膜の前記加熱が行われる。 - 請求項11ないし16のいずれかに記載の基板処理方法であって、
前記第1液膜が前記基板の前記上面全体を覆い、
前記第2液膜が前記第1液膜の前記上面全体を覆う。 - 請求項11ないし17のいずれかに記載の基板処理方法であって、
前記第1処理液がハイドロフルオロエーテルであり、前記第2処理液が純水である。 - 請求項11ないし17のいずれかに記載の基板処理方法であって、
前記第1処理液がハイドロフルオロエーテルであり、前記第2処理液がイソプロピルアルコールである。
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CN201680014580.7A CN107408502B (zh) | 2015-03-27 | 2016-03-16 | 基板处理装置和基板处理方法 |
US15/558,042 US10549322B2 (en) | 2015-03-27 | 2016-03-16 | Substrate processing apparatus and substrate processing method |
KR1020177025399A KR101976968B1 (ko) | 2015-03-27 | 2016-03-16 | 기판 처리 장치 및 기판 처리 방법 |
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JP7016265B2 (ja) * | 2018-01-11 | 2022-02-04 | 株式会社Screenホールディングス | 基板処理方法及び基板処理装置 |
JP7045196B2 (ja) * | 2018-01-15 | 2022-03-31 | 東京応化工業株式会社 | 基板処理装置及び基板処理方法 |
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TWI691358B (zh) * | 2019-03-04 | 2020-04-21 | 日商長瀨過濾器股份有限公司 | 過濾器洗淨方法及過濾器洗淨裝置 |
JP7301662B2 (ja) * | 2019-07-29 | 2023-07-03 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
JP7427475B2 (ja) * | 2020-02-28 | 2024-02-05 | 株式会社Screenホールディングス | 基板処理方法 |
US11550223B2 (en) | 2020-05-25 | 2023-01-10 | Chongqing Konka Photoelectric Technology Research Institute Co., Ltd. | Coating method and coating system |
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TWI644343B (zh) | 2018-12-11 |
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US10549322B2 (en) | 2020-02-04 |
US20180068876A1 (en) | 2018-03-08 |
JP6453688B2 (ja) | 2019-01-16 |
CN107408502A (zh) | 2017-11-28 |
KR101976968B1 (ko) | 2019-05-09 |
CN107408502B (zh) | 2020-10-16 |
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