Classifications

• • C—CHEMISTRY; METALLURGY
  • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
  • C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
  • C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
  • C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
  • C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
  • C08G59/32—Epoxy compounds containing three or more epoxy groups
• • C—CHEMISTRY; METALLURGY
  • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
  • C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
  • C08L63/00—Compositions of epoxy resins; Compositions of derivatives of epoxy resins
• • C—CHEMISTRY; METALLURGY
  • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
  • C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
  • C09J11/00—Features of adhesives not provided for in group C09J9/00, e.g. additives
• • C—CHEMISTRY; METALLURGY
  • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
  • C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
  • C09J11/00—Features of adhesives not provided for in group C09J9/00, e.g. additives
  • C09J11/02—Non-macromolecular additives
  • C09J11/04—Non-macromolecular additives inorganic
• • C—CHEMISTRY; METALLURGY
  • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
  • C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
  • C09J163/00—Adhesives based on epoxy resins; Adhesives based on derivatives of epoxy resins
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
  • H01L23/00—Details of semiconductor or other solid state devices
  • H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
  • H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
  • H01L23/00—Details of semiconductor or other solid state devices
  • H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
  • H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
• • H—ELECTRICITY
  • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
  • H05K1/00—Printed circuits
  • H05K1/02—Details
  • H05K1/03—Use of materials for the substrate
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
  • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
  • H01L2924/0001—Technical content checked by a classifier
  • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Definitions

• the present invention relates to an epoxy resin composition for electronic materials that is excellent in heat resistance, low thermal expansion and thermal conductivity of the resulting cured product, the cured product, and an electronic member.
• An epoxy resin composition comprising an epoxy resin and a curing agent or a curing accelerator as essential components is excellent in various physical properties such as heat resistance and moisture absorption, so that it is a semi-laminate resin material, an electrical insulating material, a semiconductor sealing material, Widely used in fiber reinforced composite materials, coating materials, molding materials, adhesive materials and the like.
• the epoxy resin composition used for each component has more heat resistance, thermal expansion and thermal conductivity.
• an epoxy resin composition used for an insulating part has a limit in achieving high thermal conductivity by using a heat radiating filler, and an improvement in thermal conductivity of the epoxy resin itself that is a matrix is required.
• Patent Documents 1 and 2 describe epoxy resins containing various mesogen skeletons.
• Patent Document 3 describes a method of adding an insulating filler having high thermal conductivity to an epoxy resin containing a mesogen skeleton.
• these epoxy resins are bifunctional epoxy resins having two epoxy groups, they have poor heat resistance and are difficult to use for electronic materials that require further stability under high temperature conditions in the future. Met.
• these epoxy resins have a high melting point, and when a melt is kneaded with a curing agent under heating conditions, a curing reaction proceeds and a suitable composition such as gelation cannot be obtained. Due to the viscosity, there were problems such as difficulty in mixing with the thermally conductive filler.
• the problem to be solved by the present invention is to provide an epoxy resin composition for electronic materials that exhibits excellent heat resistance, thermal expansibility and high thermal conductivity, and a cured product thereof.
• an epoxy resin composition having an epoxy resin that is a polyglycidyloxy-p-terphenyl compound has a low melting point and a low viscosity, and the cured product has a high thermal conductivity derived from a terphenyl skeleton.
• the present inventors have found that it exhibits excellent heat resistance derived from a multifunctional design and low thermal expansion in a high temperature region, and has completed the present invention.
• this invention relates to the epoxy resin composition for electronic materials which has the epoxy resin shown by following formula (1), and a hardening
• n and m each represents an integer of 0 to 5, and the sum of n and m is 3 or more.
• this invention relates to the epoxy resin composition for electronic materials which contains a filler further in the said epoxy resin composition for electronic materials.
• this invention relates to the epoxy resin composition for electronic materials containing a silica as a filler.
• this invention relates to the epoxy resin composition for electronic materials containing a heat conductive filler as a filler.
• this invention relates to the epoxy resin composition for electronic materials which contains a fibrous base material further to the said epoxy resin composition for electronic materials.
• this invention relates to the epoxy resin composition for electronic materials which is a heat conductive adhesive material.
• this invention relates to the epoxy resin composition for electronic materials which is an object for semiconductor sealing materials.
• this invention relates to the epoxy resin composition for electronic materials which is an object for electronic circuit board materials.
• this invention relates to the epoxy resin hardened
• this invention relates to the electronic member containing the said epoxy resin hardened
• this invention relates to the electronic member which is a heat conductive adhesive, a semiconductor sealing material, and an electronic circuit board.
• the epoxy resin of the present invention can provide a cured epoxy resin material for electronic materials that exhibits excellent heat resistance, low thermal expansibility, and high thermal conductivity.
• Thermal conductive adhesive, semiconductor sealing material, printed wiring board material, flexible blue It can be suitably used for electronic materials such as wiring board materials, interlayer insulating materials for buildup boards, conductive pastes, adhesive film materials for buildups, resist inks, resin casting materials, and adhesives.
• the epoxy resin of the present invention is excellent in thermal conductivity, it can be particularly suitably used as a heat dissipation material.
• the epoxy resin used in the present invention is a polyfunctional terphenyl type epoxy resin which is polyglycidyloxy-p-terphenyl, and is represented by the above formula (1).
• n and m are integers of 0 to 5, and the sum of n and m is 3 or more.
• the epoxy resin used in the present invention becomes multifunctional and the heat resistance of the cured product is improved, but at the same time, the vulnerability is deteriorated. Therefore, considering the balance between heat resistance and other physical properties, the sum of n and m is preferably 3 to 8, and more preferably 3 to 6.
• the epoxy resin used in the present invention can exhibit high thermal conductivity by forming a regular structure by overlapping the p-terphenyl skeleton having high planarity, and particularly has a functional group at the 4,4 ′′ position. Those having excellent molecular symmetry have high crystallinity, and thus are likely to exhibit high thermal conductivity.
• an epoxy resin having excellent thermal conductivity and a good balance between heat resistance and other cured properties includes 2,4,4 ′′ -triglycidyloxy having a functional group at the 4,4 ′′ position.
• 2,4,4 ′′ 6-tetraglycidyloxy-p-terphenyl, 2,2 ′′, 4,4 ′′ -tetraglycidyloxy-p-terphenyl, with molecular symmetry Excellent
• Examples include '-tetraglycidyloxy-p-terphenyl, 2,2 ′′, 5,5 ′′ -tetraglycidyloxy-p-terphenyl, and the like.
• a part of hydrogen bonded to the aromatic ring may be substituted with a hydrocarbon group.
• the hydrocarbon group is an optionally substituted hydrocarbon group having 1 to 18 carbon atoms, such as an alkyl group such as a methyl group, an ethyl group, an isopropyl group, or a cyclohexyl group; a vinyl group, an allyl group.
• Alkenyl groups such as cyclopropenyl group; alkynyl groups such as ethynyl group and propynyl group; aryl groups such as phenyl group, tolyl group, xylyl group and naphthyl group; and aralkyl groups such as benzyl group, phenethyl group and naphthylmethyl group It is done.
• the substituent may have any substituent as long as it does not significantly affect the epoxy resin composition for electronic materials of the present invention and the cured product thereof.
• the epoxy resin of the present invention preferably has no substituent or a hydrocarbon group having 1 to 4 carbon atoms, more preferably has no substituent, or a methyl group or an allyl group.
• the polyhydroxy-p-terphenyl compound used as a raw material for the polyfunctional terphenyl type epoxy resin represented by the formula (1) of the present invention can be produced by a known and conventional method.
• a metal catalyst such as iron or copper
• an Ullmann reaction using a metal catalyst such as copper or palladium
• Suzuki coupling reaction J. Organomet. Chem., 576, 147 (1999); Synth. Commun., 11, 513 (1981)
• the method for producing the epoxy resin represented by the formula (1) of the present invention can be produced by a known and commonly used method.
• a production method in which an epihalohydrin is reacted with a polyhydroxy-p-terphenyl compound And a production method in which an allyl halide is reacted with a polyhydroxy-p-terphenyl compound to form an allyl ether, followed by an epoxy reaction via an oxidation reaction or a halohydrin.
• Industrially, a production method in which an epihalohydrin is reacted with a polyhydroxy-p-terphenyl compound is significant, and an example thereof will be described in detail below.
• the production method of reacting a phenol compound with epihalohydrin is, for example, adding epihalohydrin in an amount of 2 to 10 times (molar basis) with respect to the number of moles of the phenolic hydroxyl group in the phenol compound, A method of reacting at a temperature of 20 to 120 ° C. for 0.5 to 10 hours while adding or gradually adding a basic catalyst in an amount of 0.9 to 2.0 times (molar basis) to the number of moles of phenolic hydroxyl group.
• the basic catalyst may be solid or an aqueous solution thereof. When an aqueous solution is used, it is continuously added and water and epihalohydrins are continuously distilled from the reaction mixture under reduced pressure or normal pressure. Alternatively, the solution may be separated and further separated to remove water and the epihalohydrin is continuously returned to the reaction mixture.
• the epihalohydrin used is not particularly limited, and examples thereof include epichlorohydrin, epibromohydrin, ⁇ -methylepichlorohydrin, and the like. Of these, epichlorohydrin is preferred because it is easily available industrially.
• the basic catalyst include alkaline earth metal hydroxides, alkali metal carbonates, and alkali metal hydroxides.
• alkali metal hydroxides are preferable from the viewpoint of excellent catalytic activity of the epoxy resin synthesis reaction, and examples thereof include sodium hydroxide and potassium hydroxide.
• these basic catalysts may be used in the form of an aqueous solution of about 10 to 55% by mass or in the form of a solid.
• a phase transfer catalyst such as a quaternary ammonium salt or crown ether may be present for the purpose of improving the reaction rate.
• the amount used is preferably 0.1 to 3.0 parts by mass with respect to 100 parts by mass of the epoxy resin used.
• organic solvents include, but are not limited to, ketones such as acetone and methyl ethyl ketone; alcohols such as methanol, ethanol, 1-propyl alcohol, isopropyl alcohol, 1-butanol, secondary butanol, and tertiary butanol; methyl Cellosolves such as cellosolve and ethyl cellosolve; ethers such as tetrahydrofuran, 1,4-dioxane, 1,3-dioxane and diethoxyethane; and aprotic polar solvents such as acetonitrile, dimethylsulfoxide and dimethylformamide. These organic solvents may be used alone or in combination of two or more kinds in order to adjust the polarity.
• reaction product of the epoxidation reaction is washed with water, unreacted epihalohydrin and the organic solvent to be used in combination are distilled off by distillation under heating and reduced pressure. Further, in order to obtain an epoxy resin with less hydrolyzable halogen, the obtained epoxy resin is again dissolved in an organic solvent such as toluene, methyl isobutyl ketone, methyl ethyl ketone, and alkali metal hydroxide such as sodium hydroxide or potassium hydroxide. Further reaction can be carried out by adding an aqueous solution of the product. At this time, a phase transfer catalyst such as a quaternary ammonium salt or crown ether may be present for the purpose of improving the reaction rate.
• an organic solvent such as toluene, methyl isobutyl ketone, methyl ethyl ketone, and alkali metal hydroxide such as sodium hydroxide or potassium hydroxide.
• a phase transfer catalyst such as a quaternary am
• the amount used is preferably 0.1 to 3.0 parts by mass with respect to 100 parts by mass of the epoxy resin used.
• the produced salt is removed by filtration, washing with water, etc., and the target polyglycidyloxy-p-terphenyl compound of the present invention is obtained by distilling off a solvent such as toluene and methyl isobutyl ketone under heating and reduced pressure. It is possible to obtain an epoxy resin characterized by containing as a main component. If the target epoxy resin crystallizes during the reaction, the resulting epoxy resin crystals are filtered, the residue is washed with water to remove the salt, and the solvent or water is distilled off under reduced pressure. An epoxy resin mainly composed of the polyglycidyloxy-p-terphenyl compound of the present invention can be obtained.
• the polyhydroxy-p-terphenyl compound may be reacted with epihalohydrin in combination with another polyhydric phenol within a range not impairing the effects of the present invention.
• the epoxy resin composition for electronic materials of the present invention comprises the epoxy resin represented by the formula (1) detailed above and a curing agent or a curing accelerator as essential components. May be used as a reaction product during production containing an oligomer component.
• the curing agent used here is not particularly limited, and any compound commonly used as a curing agent for ordinary epoxy resins can be used.
• amine compounds, amide compounds, acid anhydride compounds, A phenol type compound etc. are mentioned.
• the amine compound diaminodiphenylmethane, diaminodiphenylethane, diaminodiphenyl ether, diaminodiphenylsulfone, orthophenylenediamine, metaphenylenediamine, paraphenylenediamine, metaxylenediamine, paraxylenediamine, diethyltoluenediamine, diethylenetriamine
• Examples include triethylenetetramine, isophoronediamine, imidazole, BF3-amine complex, guanidine derivatives, guanamine derivatives, etc.
• amide compounds include polyamide resins synthesized from dimers of dicyandiamide and linolenic acid and ethylenediamine.
• acid anhydride compounds include phthalic anhydride, trimellitic anhydride, pyromellitic anhydride, maleic anhydride, tetrahydro
• examples include phthalic acid, methyltetrahydrophthalic anhydride, methyl nadic anhydride, hexahydrophthalic anhydride, methylhexahydrophthalic anhydride, etc.
• phenolic compounds include bisphenol A, bisphenol F, bisphenol S, resorcin, catechol, and hydroquinone.
• a curing accelerator can be used alone or in combination with the above curing agent in the epoxy resin composition for electronic materials of the present invention.
• Various compounds that accelerate the curing reaction of the epoxy resin can be used as the curing accelerator, and examples thereof include phosphorus compounds, tertiary amine compounds, imidazole compounds, organic acid metal salts, Lewis acids, and amine complex salts.
• the use of an imidazole compound, a phosphorus compound, and a tertiary amine compound is preferable, and particularly when used as a semiconductor sealing material, it is excellent in curability, heat resistance, electrical characteristics, moisture resistance reliability, and the like.
• Triphenylphosphine is preferable for phosphorus compounds, and 1,8-diazabicyclo- [5.4.0] -undecene (DBU) is preferable for tertiary amines.
• the epoxy resin component the polyfunctional terphenyl type epoxy resin represented by the formula (1) which is the polyglycidyloxy-p-terphenyl compound is used alone.
• other epoxy resins may be used in combination as long as the effects of the present invention are not impaired.
• another epoxy resin can be used in combination in the range where the epoxy resin is 30% by mass or more, preferably 40% by mass or more with respect to the total mass of the epoxy resin component.
• epoxy resins such as A type epoxy resin and bisphenol F type epoxy resin; Benzene type epoxy resins such as resorcinol diglycidyl ether type epoxy resin and hydroquinone diglycidyl ether type epoxy resin; Tetramethylbiphenol type epoxy resin, Triglycidyloxybiphenyl Type epoxy resins, tetraglycidyloxybiphenyl type epoxy resins, etc .; terphenyl type or partially water-added terphenyl type epoxy resins; 1,6-diglycidyloxynaphthalene type resins Xy resin, 1- (2,7-diglycidyloxynaphthyl) -1- (2-glycidyloxynaphthyl) methane, 1,1-bis (2,7-
• the melting point of the polyfunctional terphenyl type epoxy resin of the present invention is greatly reduced, and the low melting point is reduced. Viscosity can be achieved. Further lowering of melting point makes it possible to suppress gelation and curing at low temperature when kneading with a curing agent, and further lowering of viscosity can improve thermal conductivity or workability at the time of melt molding by increasing the filler filling amount. It becomes. Furthermore, the polyfunctional terphenyl type epoxy resin of the present invention is highly crystalline and difficult to dissolve in a solvent.
• solubility of a solvent can be improved by using a small amount of low viscosity or low softening point, low melting point epoxy resins with low crystallinity.
• it can be used in an electronic material that requires solubility in an organic solvent in the production process.
• the epoxy resin having a low viscosity or a low softening point and a low melting point which can be used in combination with the epoxy resin represented by the formula (1) which is the polyglycidyloxy-p-terphenyl compound
• bisphenol A type epoxy Resin bisphenol type epoxy resin such as bisphenol F type epoxy resin
• benzene type epoxy resin such as resorcinol diglycidyl ether type epoxy resin, hydroquinone diglycidyl ether type epoxy resin
• tetramethylbiphenol type epoxy resin triglycidyloxybiphenyl type epoxy resin
• Biphenyl type epoxy resins such as tetraglycidyloxybiphenyl type epoxy resins
• phenol novolac type epoxy resins cresol novolac type epoxy resins diglycidyl aniline, tetraglycidyl amino Glycidylamine type epoxy resins such as phenylmethane, triglycidyl-p-aminophenol
• the epoxy composition for electronic materials of the present invention can further contain a filler.
• the filler used here is preferably an inorganic filler, and can impart properties such as improved heat resistance, flame retardancy, a low linear expansion coefficient, and a low dielectric constant to the resin composition.
• the thermal conductivity of the epoxy resin composition for electronic materials of the present invention can be further improved.
• a filler used in the epoxy resin composition for electronic materials of the present invention fused silica, crystalline silica, alumina for improving heat resistance, imparting flame retardancy, lowering a low dielectric constant, lowering a linear expansion coefficient, etc.
• Various fillers such as silicon nitride and aluminum hydroxide are used.
• Silica is preferably used as a filler used for a semiconductor sealing material, and heat resistance can be improved and a linear expansion coefficient can be reduced.
• Examples of silica include fused silica and crystalline silica. When the blending amount of the filler is particularly large, it is preferable to use fused silica.
• the fused silica can be used in either a crushed shape or a spherical shape, but in order to increase the blending amount of the fused silica and to suppress an increase in the melt viscosity of the molding material, it is preferable to mainly use a spherical shape. . In order to further increase the blending amount of the spherical silica, it is preferable to appropriately adjust the particle size distribution of the spherical silica.
• the filling rate is preferably higher in consideration of flame retardancy, and is preferably 65% by mass or more with respect to the total amount of the epoxy resin composition for electronic materials.
• aluminum hydroxide is preferably used for electronic circuit boards and the like in order to impart flame retardancy.
• the heat conductive filler can be used for the epoxy resin composition for electronic materials of this invention.
• the heat conductive filler known and commonly used metal fillers, inorganic compound fillers, carbon fillers and the like are used. Specifically, for example, metallic fillers such as silver, copper, aluminum, iron, and stainless steel, alumina, magnesia, beryllia, silica, boron nitride, aluminum nitride, silicon nitride, silicon carbide, boron carbide, titanium carbide and the like
• carbon fillers such as diamond filler, diamond, graphite, graphite, and carbon fiber.
• At least one type of thermally conductive filler is selected and used, but it is also possible to use one or more types of thermally conductive fillers having different crystal forms, particle sizes, and the like.
• thermal conductivity and volume resistivity are high, alumina, magnesium oxide.
• the use of at least one insulating thermally conductive filler selected from zinc oxide, beryllia, boron nitride, aluminum nitride, silicon nitride, and diamond is preferred.
• a heat conductive filler having high conductivity is preferable, and use of a heat conductive filler of 10 W / m / K or more is more preferable.
• alumina, aluminum nitride, boron nitride, silicon nitride, and magnesium oxide are preferable from the viewpoint of ensuring thermal conductivity and insulation, and alumina is more preferable because the resin filling property is improved in addition to thermal conductivity and insulation. .
• thermally conductive fillers those subjected to surface treatment can also be used.
• the inorganic filler a silane-based, titanate-based, and aluminate-based coupling agent that has been surface-modified can be used.
• the average particle diameter of the heat conductive filler is not particularly limited, but a preferable lower limit is 0.2 ⁇ m and a preferable upper limit is 50 ⁇ m.
• a preferable lower limit is 0.2 ⁇ m and a preferable upper limit is 50 ⁇ m.
• the average particle size of the heat conductive filler is less than 0.2 ⁇ m, the viscosity of the epoxy resin composition for electronic materials is increased, and workability and the like may be deteriorated. If a large amount of the above thermal conductive filler having an average particle diameter exceeding 50 ⁇ m is used, the adhesive force between the cured product of the epoxy resin composition for electronic materials and the substrate is insufficient, and the warpage of the electronic component is large. Or cracks or delamination may occur under a cooling and heating cycle, or delamination may occur at the adhesive interface.
• the minimum with a more preferable average particle diameter of said heat conductive filler is 0.4 micrometer, and a more preferable upper limit is 30 micrometers.
• the shape of the said heat conductive filler is not specifically limited, From the fluidity
• the aspect ratio ratio of the length of the major axis of the particle to the length of the minor axis of the particle (length of major axis / length of minor axis)
• the content of the thermal conductive filler in the epoxy resin composition for electronic materials is not particularly limited, and is blended according to the degree of thermal conductivity required for the application, preferably, the epoxy resin composition for electronic materials.
• the content of the above-mentioned heat conductive filler is 40 to 95 parts by weight.
• the epoxy resin composition for electronic materials cannot obtain sufficient heat conductivity.
• the content of the above-mentioned heat conductive filler exceeds 95 parts by weight, the cured product of the epoxy resin composition for electronic materials and the base material have insufficient adhesive force, and the warpage of the electronic component increases, In such cases, cracks or peeling of electronic components may occur, or peeling may occur at the adhesion interface.
• content of said heat conductive filler exceeds 95 weight part, the viscosity of the epoxy resin composition for electronic materials will become high, and applicability
• the heat conductive filler is highly filled, and the use of 60 to 95 parts by weight is preferable. Considering the fluidity of the epoxy resin composition, the use of 60 to 90 weights is more preferable.
• thermally conductive filler is packed in the voids of the large particle diameter thermally conductive filler. Therefore, since it is more densely packed than using only a single particle size thermal conductive filler, it is possible to exhibit higher thermal conductivity.
• thermally conductive filler when alumina is used, the average particle size of 5 to 20 ⁇ m (large particle size) is 45 in the thermally conductive filler. It is possible to densely fill the thermally conductive filler by mixing up to 75% by weight and an average particle size of 0.4 to 1.0 ⁇ m (small particle size) in the range of 25 to 55% by weight. Thermal conductivity is obtained.
• the epoxy resin composition for electronic materials of the present invention can further contain a fibrous base material.
• a fibrous base material By adding a fibrous base material, strength and a low linear expansion coefficient can be imparted to the resin composition for electronic materials of the present invention, which can be suitably used as a fiber reinforced resin.
• the fibrous base material used includes, for example, plant fibers, glass fibers, carbon fibers, aramid fibers, and the like, which may be woven or non-woven, fiber aggregates or dispersions. good.
• Specific examples of the fibrous base material include paper, glass cloth, glass nonwoven fabric, aramid paper, aramid cloth, aramid nonwoven fabric, glass mat, and glass roving cloth.
• the glass fiber diameter is preferably 10 ⁇ m or less, the fiber density is 40 to 80 fibers / inch, and epoxy silane is used.
• the glass nonwoven fabric preferably has a basis weight of 15 g / m2, a thickness of about 0.1 mm to a basis weight of 120 g / m2, and a thickness of about 1.0 mm.
• the fibrous base material used for this invention is 100 micrometers or less in thickness.
• the filler of the present invention can be used after surface treatment.
• a silane-based, titanate-based, and aluminate-based coupling agent that has been surface-modified can be used. Due to the fluidity of the epoxy resin composition for electronic materials, it is often better to use a filler that has been treated with the above coupling agent.
• the surface treatment further improves the adhesion between the resin and the filler in the cured product.
• the interfacial thermal resistance between the resin and the thermally conductive filler is reduced, and the thermal conductivity is improved.
• silane coupling agents are preferably used.
• silane coupling agent vinyltrichlorosilane, vinyltriethoxysilane, vinyltrimethoxysilane, ⁇ -methacryloxypropyltrimethoxysilane, ⁇ ( 3,4-epoxy synchrohexyl) ethyltrimethoxysilane, ⁇ -glycidoxypropyltrimethoxysilane, ⁇ -glycylmethoxypropylmethyldiethoxysilane, N- ⁇ (aminoethyl) ⁇ -aminopropyltrimethoxysilane, N- ⁇ (aminoethyl) ⁇ -aminopropylmethyldimethoxysilane, ⁇ -aminopropyltriethoxysilane, N-phenyl- ⁇ -aminopropyltrimethoxysilane, ⁇ -mercaptopropyltrimethoxysi
• the surface treatment can be performed by a known and commonly used filler surface modification method, for example, a spray method using a fluid nozzle, a shearing stirring, a dry method such as a ball mill or a mixer, or a wet method such as an aqueous or organic solvent system. Can be adopted. It is desirable that the surface treatment using the shearing force is performed to such an extent that the filler is not destroyed.
• the system temperature in the dry method or the drying temperature after the treatment in the wet method is appropriately determined in a region where thermal decomposition does not occur depending on the type of the surface treatment agent. For example, when treating with ⁇ -aminopropyltriethoxysilane, a temperature of 80 to 150 ° C. is desirable.
• the epoxy resin composition for electronic materials of the present invention may contain an organic solvent.
• organic solvent examples include, but are not limited to, methyl ethyl ketone, acetone, dimethylformamide, methyl isobutyl ketone, methoxypropanol, cyclohexanone, methyl cellosolve, ethyl diglycol acetate, propylene glycol monomethyl ether acetate, and the like.
• the selection and proper amount used can be appropriately selected depending on the application. For example, in the printed wiring board application, a polar solvent having a boiling point of 160 ° C. or lower such as methyl ethyl ketone, acetone, dimethylformamide, etc. is preferable.
• organic solvents for example, ketones such as acetone, methyl ethyl ketone, cyclohexanone, acetates such as ethyl acetate, butyl acetate, cellosolve acetate, propylene glycol monomethyl ether acetate, carbitol acetate, It is preferable to use carbitols such as cellosolve and butyl carbitol, aromatic hydrocarbons such as toluene and xylene, amides such as dimethylformamide, dimethylacetamide and N-methylpyrrolidone, and a non-volatile content of 30 to 60 It is preferable to use at a ratio of mass%.
• ketones such as acetone, methyl ethyl ketone, cyclohexanone
• acetates such as ethyl acetate, butyl acetate, cellosolve acetate, propylene glycol monomethyl ether acetate, carbit
• the epoxy resin composition for electronic materials of the present invention may be blended with a non-halogen flame retardant that substantially does not contain a halogen atom, for example, in the field of electronic circuit boards, in order to exhibit flame retardancy. Good.
• non-halogen flame retardant examples include phosphorus flame retardant, nitrogen flame retardant, silicone flame retardant, inorganic flame retardant, organometallic salt flame retardant and the like. However, it may be used alone, or a plurality of flame retardants of the same system may be used, or different types of flame retardants may be used in combination.
• the phosphorus-based flame retardant both inorganic and organic can be used.
• the inorganic compounds include red phosphorus, monoammonium phosphate, diammonium phosphate, triammonium phosphate, ammonium phosphates such as ammonium polyphosphate, and inorganic nitrogen-containing phosphorus compounds such as phosphate amide. .
• organic phosphorus compound examples include, for example, general-purpose organic phosphorus compounds such as phosphate ester compounds, phosphonic acid compounds, phosphinic acid compounds, phosphine oxide compounds, phospholane compounds, organic nitrogen-containing phosphorus compounds, and 9,10.
• general-purpose organic phosphorus compounds such as phosphate ester compounds, phosphonic acid compounds, phosphinic acid compounds, phosphine oxide compounds, phospholane compounds, organic nitrogen-containing phosphorus compounds, and 9,10.
• the blending amount thereof is appropriately selected depending on the type of the phosphorus-based flame retardant, the other components of the curable resin composition, and the desired degree of flame retardancy. 0.1 to 2.0 mass% when using red phosphorus as a non-halogen flame retardant, based on an epoxy resin composition for electronic materials containing all of halogen-based flame retardant and other fillers and additives
• an organophosphorus compound it is preferably blended in the range of 0.1 to 10.0% by mass, particularly in the range of 0.5 to 6.0% by mass. It is preferable to mix.
• hydrotalcite, magnesium hydroxide, boric compound, zirconium oxide, black dye, calcium carbonate, zeolite, zinc molybdate, activated carbon, etc. are used in combination with the phosphorus flame retardant.
• nitrogen-based flame retardant include triazine compounds, cyanuric acid compounds, isocyanuric acid compounds, phenothiazines, and the like, and triazine compounds, cyanuric acid compounds, and isocyanuric acid compounds are preferable.
• triazine compound examples include melamine, acetoguanamine, benzoguanamine, melon, melam, succinoguanamine, ethylene dimelamine, melamine polyphosphate, triguanamine, and the like, for example, (i) guanylmelamine sulfate, melem sulfate, (Iii) Cocondensates of phenols such as phenol, cresol, xylenol, butylphenol and nonylphenol with melamines such as melamine, benzoguanamine, acetoguanamine and formguanamine and formaldehyde, (iii) ) A mixture of the co-condensate of (ii) and a phenol resin such as a phenol formaldehyde condensate; (iv) the above (ii), (iii) further modified with paulownia oil, isomerized linseed oil, etc. It is.
• cyanuric acid compound examples include cyanuric acid and cyanuric acid melamine.
• the blending amount of the nitrogen-based flame retardant is appropriately selected depending on the type of the nitrogen-based flame retardant, the other components of the curable resin composition, and the desired degree of flame retardancy.
• the epoxy resin composition for electronic materials in which all of the curing agent, non-halogen flame retardant, and other fillers and additives are blended, is preferably blended in the range of 0.05 to 10% by weight. It is preferable to blend in the range of 0.1 to 5% by mass.
• the silicone flame retardant is not particularly limited as long as it is an organic compound containing a silicon atom, and examples thereof include silicone oil, silicone rubber, and silicone resin.
• the amount of the silicone flame retardant is appropriately selected according to the type of the silicone flame retardant, the other components of the epoxy resin composition for electronic materials, and the desired degree of flame retardancy.
• the epoxy resin composition for electronic materials, non-halogen flame retardants, other fillers and additives, etc. are all blended in the range of 0.05 to 20% by mass with respect to the epoxy resin composition for electronic materials. Is preferred.
• inorganic flame retardant examples include metal hydroxide, metal oxide, metal carbonate compound, metal powder, boron compound, and low-melting glass.
• metal hydroxide examples include aluminum hydroxide, magnesium hydroxide, dolomite, hydrotalcite, calcium hydroxide, barium hydroxide, zirconium hydroxide and the like.
• the metal oxide include, for example, zinc molybdate, molybdenum trioxide, zinc stannate, tin oxide, aluminum oxide, iron oxide, titanium oxide, manganese oxide, zirconium oxide, zinc oxide, molybdenum oxide, and oxide.
• examples include cobalt, bismuth oxide, chromium oxide, nickel oxide, copper oxide, and tungsten oxide.
• metal carbonate compound examples include zinc carbonate, magnesium carbonate, calcium carbonate, barium carbonate, basic magnesium carbonate, aluminum carbonate, iron carbonate, cobalt carbonate, and titanium carbonate.
• the metal powder examples include aluminum, iron, titanium, manganese, zinc, molybdenum, cobalt, bismuth, chromium, nickel, copper, tungsten, and tin.
• boron compound examples include zinc borate, zinc metaborate, barium metaborate, boric acid, and borax.
• the low-melting-point glass include, for example, Shipley (Bokusui Brown), hydrated glass SiO2-MgO-H2O, PbO-B2O3-based, ZnO-P2O5-MgO-based, P2O5-B2O3-PbO-MgO-based. And glassy compounds such as P—Sn—O—F, PbO—V 2 O 5 —TeO 2, Al 2 O 3 —H 2 O, and lead borosilicate.
• the amount of the inorganic flame retardant is appropriately selected according to the type of inorganic flame retardant, the other components of the epoxy resin composition for electronic materials, and the desired degree of flame retardancy. It is preferably blended in the range of 0.5 to 50% by mass with respect to the curable resin composition containing all of the epoxy resin composition for electronic materials, non-halogen flame retardants and other fillers and additives. In particular, it is preferably blended in the range of 5 to 30% by mass.
• organometallic salt flame retardant examples include ferrocene, acetylacetonate metal complex, organometallic carbonyl compound, organocobalt salt compound, organosulfonic acid metal salt, metal atom and aromatic compound or heterocyclic compound. Or the compound etc. which carried out the coordinate bond are mentioned.
• the compounding amount of the organometallic salt flame retardant is appropriately selected according to the type of the organometallic salt flame retardant, the other components of the epoxy resin composition for electronic materials, and the desired degree of flame retardancy. Is, for example, in the range of 0.005 to 10% by mass based on the epoxy resin composition for electronic materials in which the epoxy resin composition for electronic materials, non-halogen flame retardant, and other fillers and additives are all blended. It is preferable to mix with.
• the epoxy resin composition for electronic materials of this invention can add various compounding agents, such as a coupling agent, a mold release agent, a pigment, an emulsifier, as needed.
• the epoxy resin composition for electronic materials of the present invention can be obtained by uniformly mixing the above-described components.
• the epoxy resin composition for electronic materials according to the present invention in which the epoxy resin represented by the formula (1) of the present invention, a curing agent or a curing accelerator is blended, is easily cured by a method similar to a conventionally known method. It can be a thing.
• the cured product include molded cured products such as laminates, cast products, adhesive layers, coating films, and films.
• the epoxy resin composition for electronic materials of the present invention can be suitably used for semiconductor sealing materials, electronic circuit board materials, and the like.
• the epoxy resin for electronic materials of the present invention is excellent in thermal conductivity, it can be particularly suitably used as a heat dissipation material among electronic materials, and can be particularly preferably used as a heat conductive adhesive material.
• Thermal conductive adhesive material when it is used as a heat conductive adhesive material, it is used to bond a portion to be radiated of an electric / electronic device such as a power module and a heat radiating member (for example, a metal plate or a heat sink) so as to develop good heat radiation.
• the form of the epoxy resin composition for electronic materials used at that time is not particularly limited, but in the case of a heat conductive adhesive material designed in a liquid or paste form, a liquid or paste heat conductive adhesive material is used. What is necessary is just to adhere
• What is designed in a solid form may be in a powder form or a chip form, and may be placed at the interface of the adhesion surface, bonded by heat melting, and cured.
• the heat conductive adhesive material of the present invention may be cured and bonded after being brought into contact with the object to be bonded in an uncured state, or cured and bonded after being brought into contact with the object to be bonded in a semi-cured state. It doesn't matter if you let them.
• the resin composition of the present invention can also be suitably used as a heat conductive adhesive sheet obtained by processing a heat conductive adhesive material into a sheet shape.
• the resin composition can be processed into a sheet shape, placed at the interface of the bonding surface, and bonded and cured by heat melting.
• the resin composition of this invention contains an amino type hardening
• the laminated body containing the resin composition of this invention can be manufactured by making it harden
• the laminate of the present invention can be suitably used for the purpose of conducting heat from one of the base material or the upper layer to the other because the resin composition layer as an intermediate layer has high thermal conductivity. It can be suitably used as a heat radiating component, which is a laminated body in which a heat generating electronic electric member such as a module and a heat radiating member such as a metal plate or a heat sink are laminated.
• the polyfunctional terphenyl type epoxy resin that is the polyglycidyloxy-p-terphenyl compound and the curing agent are used.
• a melt-mixing type epoxy resin composition for electronic materials may be obtained by sufficiently mixing until uniform using an extruder, kneader, roll or the like. At that time, silica, alumina, silicon nitride, boron nitride, and aluminum nitride are used as the filler, and the filling rate is within a range of 30 to 95% by mass of the filler per 100 parts by mass of the epoxy resin composition for electronic materials. Used.
• 65% by mass or more is preferable, and 70% by mass or more is particularly preferable, in order to greatly increase the effects. 80% by mass or more can further enhance the effect.
• the composition is molded by casting or using a transfer molding machine, injection molding machine, etc., and further heated at 50 to 200 ° C. for 2 to 10 hours to form a semiconductor device as a molded product. There is a way to get it.
• a coupling agent may be used as necessary in order to enhance the adhesion between the resin component and the inorganic filler.
• Examples of coupling agents include epoxy silane, mercapto silane, amino silane, alkyl silane, ureido silane, vinyl silane and other silane compounds, titanium compounds, aluminum compounds, zirconium compounds, phosphorus compounds, aluminum chelates, etc. It is done.
• the amount of the above coupling agent is preferably 0.01 to 5% by mass, more preferably 0.05 to 2.5% by mass with respect to the filler. If it is less than 0.01% by mass, the adhesiveness to various package components tends to decrease, and if it exceeds 5% by mass, molding defects such as voids tend to occur.
• the epoxy resin composition for electronic materials used for the semiconductor sealing material of the present invention requires a mold release agent, a colorant, a stress relaxation agent, an adhesion improver, a surfactant, etc. as other additives. It can be blended according to.
• mold release agent examples include carnauba wax, hydrocarbon, aliphatic, amide, ester, higher alcohol, and higher fatty acid metal salt.
• hydrocarbons examples include paraffin wax and polyolefin wax.
• Polyolefin waxes are roughly classified into non-polarized non-polar polyolefin waxes and oxidized polyolefin waxes, and there are polyethylene-based, polypropylene-based, and vinyl acetate-ethylene copolymer systems, respectively.
• fatty acid system montanic acid, stearic acid, ariaic acid, 12-hydroxystearic acid, as the amide system, stearic acid amide, oleic acid amide, methylenebisstearic acid amide, as the ester system, butyl stearate, stearic acid
• acid monoglycerides, stearyl stearate, and higher alcohols include stearyl alcohol, and examples of higher fatty acid metal salts include calcium stearate, zinc stearate, and magnesium stearate.
• inorganic colorants such as bengara, carbon black, glass compositions, and phthalocyanine-based compounds, anthraquinone-based, methine-based, indigoid-based, and azo-based organic compound pigments can be used.
• Carbon black is preferred because of its excellent effect.
• the stress reducing agent is not particularly limited.
• methyl acrylate-butadiene-styrene copolymer such as silicone oil, liquid rubber, rubber powder, thermoplastic resin, methyl methacrylate-butadiene- Examples include butadiene copolymer rubbers such as styrene copolymers and those described in silicone compounds.
• hydrotalcites and ion trapping agents such as bismuth hydroxide may be blended for the purpose of improving the reliability in the moisture resistance reliability test.
• the adhesion improver is not particularly limited, and examples thereof include N-cyclohexyl-2-benzothiazolylsulfanamide, N-oxydiethylene-2-benzothiazolylsulfanamide, N, N-dicyclohexyl-2-benzo Examples include thiazolylsulfanamide, Nt-butyl-2-benzothiazolylsulfanamide, compounds having a benzothiazole skeleton, indene resin, crosslinked diallyl phthalate resin powder, and butadiene rubber particles.
• surfactant examples include polyethylene glycol fatty acid ester, sorbitan fatty acid ester, fatty acid monoglyceride and the like.
• the epoxy resin composition for electronic materials used for the semiconductor encapsulating material of the present invention can be prepared by any method as long as various raw materials can be uniformly dispersed and mixed.
• the raw materials are sufficiently mixed with a mixer or the like, then melt-kneaded with a mixing roll or an extruder, and then cooled and pulverized. It is easy to use if it is tableted with dimensions and mass that match the molding conditions.
• an electronic component device provided with an element sealed with an epoxy resin composition for electronic materials used for a semiconductor sealing material obtained in the present invention
• active elements such as semiconductor chips, transistors, diodes, thyristors, and passive elements such as capacitors, resistors, and coils are mounted, and necessary portions are sealed with the semiconductor sealing material of the present invention.
• An electronic component device etc. are mentioned.
• a semiconductor element is fixed on a lead frame, a terminal part of an element such as a bonding pad and a lead part are connected by wire bonding or bump, DIP, PLCC, QFP, SOP, SOJ, TSOP, TQFP, and other general resin-encapsulated ICs that are encapsulated by transfer molding using a semiconductor encapsulation material, and 2) connected to the tape carrier by bumps
• OB module 4) Transistor, diode, thyristor Active elements such as capacitors or passive elements such as capacitors, resistors, and coils are sealed with the semiconductor sealing material of the present invention.
• OB module 4) A semiconductor chip is mounted on an interposer substrate on which terminals for connecting a hybrid IC, a multi-chip module, and a mother board are formed, and after connecting the semiconductor chip and the wiring formed on the interposer substrate by bump or wire bonding, One-side sealed packages such as BGA, CSP, MCP, etc., in which the semiconductor chip mounting side is sealed with the semiconductor sealing material of the invention, can be mentioned.
• a single-sided sealing type package including an element sealed with an epoxy resin composition for electronic materials used for a semiconductor sealing material obtained in the present invention has a feature that a warpage amount is small.
• a copper (including copper alloy) lead frame a Ni-plated lead frame in which a Ni layer is formed on the surface of a copper plate or the like by a method such as plating, or a 42 alloy lead frame should be used. Can do.
• the low pressure transfer molding method is the most common, but the injection molding method, the compression molding method, etc. It may be used.
• the epoxy resin composition for an electronic material used for the electronic circuit board of the present invention includes a printed wiring board material, a flexible wiring board material, an interlayer insulating material for a buildup board, a conductive paste, and an adhesive film for buildup Used in materials, resist inks, resin casting materials, adhesives, etc.
• passive components such as capacitors and active components such as IC chips are placed in the substrate for printed wiring boards, flexible wiring board materials, build-up board interlayer insulation materials, and build-up adhesive films. It can be used as an insulating material for a so-called electronic component-embedded substrate embedded in the substrate.
• a varnished epoxy resin composition which is reinforced.
• the reinforcing substrate that can be used here is the fibrous substrate of the present invention, and examples thereof include paper, glass cloth, glass nonwoven fabric, aramid paper, aramid cloth, glass mat, and glass roving cloth. More specifically, the varnish-like curable resin composition described above is first heated at a heating temperature corresponding to the solvent type used, preferably 50 to 170 ° C., so that a prepreg as a cured product is obtained.
• the mass ratio of the resin composition and the fibrous base material used at this time is not particularly limited, but it is usually preferable that the resin content in the prepreg is adjusted to 20 to 60% by mass.
• the prepreg obtained as described above is laminated by a conventional method, and a copper foil is appropriately stacked, and heat-pressed at 170 to 250 ° C. for 10 minutes to 3 hours under a pressure of 1 to 10 MPa, A target printed wiring board can be obtained.
• a phosphorus atom-containing compound, a curing accelerator, and an organic solvent are blended, and reverse Using an applicator such as a roll coater or comma coater, it is applied to the electrically insulating film. Subsequently, it is heated at 60 to 170 ° C. for 1 to 15 minutes using a heater to volatilize the solvent, and the adhesive composition is B-staged. Next, the metal foil is thermocompression bonded to the adhesive using a heating roll or the like.
• the pressure for pressure bonding is preferably 2 to 200 N / cm, and the temperature for pressure bonding is preferably 40 to 200 ° C. If sufficient adhesion performance can be obtained, the process may be completed here. However, if complete curing is required, post-curing is preferably performed at 100 to 200 ° C. for 1 to 24 hours.
• the thickness of the adhesive composition film after final curing is preferably in the range of 5 to 100 ⁇ m.
• an interlayer insulating material for a build-up substrate from the epoxy resin composition for electronic materials of the present invention for example, in addition to the epoxy resin composition for electronic materials, rubber, filler, etc. are appropriately blended to form a circuit. It is cured after being applied to the wiring board using a spray coating method, a curtain coating method, or the like. Then, after drilling a predetermined through-hole part etc. as needed, it treats with a roughening agent, forms the unevenness
• the plating method electroless plating or electrolytic plating treatment is preferable, and examples of the roughening agent include an oxidizing agent, an alkali, and an organic solvent.
• a build-up base can be obtained by alternately building up and forming the resin insulating layer and the conductor layer having a predetermined circuit pattern.
• the through-hole portion is formed after the outermost resin insulating layer is formed.
• a resin-coated copper foil obtained by semi-curing the resin composition on a copper foil is heat-pressed at 170 to 250 ° C. on a wiring board on which a circuit is formed, thereby forming a roughened surface and performing plating treatment. It is also possible to produce a build-up substrate by omitting the process.
• the method for producing an adhesive film for build-up from the epoxy resin composition for electronic materials of the present invention is, for example, in addition to the epoxy resin composition for electronic materials, blended with an organic solvent, and made a varnished epoxy resin composition,
• coating on a support film, forming the resin composition layer, and setting it as the adhesive film for multilayer printed wiring boards is mentioned.
• the adhesive film is softened under the lamination temperature conditions (usually 70 ° C. to 140 ° C.) in a vacuum laminating method.
• the lamination temperature conditions usually 70 ° C. to 140 ° C.
• the diameter of the through-hole of the multilayer printed wiring board is usually 0.1 to 0.5 mm, and the depth is usually 0.1 to 1.2 mm. Usually, it is preferable that the resin can be filled in this range. When laminating both surfaces of the circuit board, it is desirable to fill about 1/2 of the through hole.
• the method for producing the adhesive film described above is such that a varnish-like epoxy resin composition for electronic materials is applied to the surface of the support film, and further the organic solvent is dried by heating or hot air blowing. It can manufacture by forming the layer of an epoxy resin composition.
• the thickness of the formed layer is usually greater than or equal to the thickness of the conductor layer. Since the thickness of the conductor layer of the circuit board is usually in the range of 5 to 70 ⁇ m, the thickness of the resin composition layer is preferably 10 to 100 ⁇ m.
• the said layer may be protected with the protective film mentioned later.
• a protective film By protecting with a protective film, it is possible to prevent dust and the like from being attached to the surface of the resin composition layer and scratches.
• the above-mentioned support film and protective film are made of polyolefin such as polyethylene, polypropylene and polyvinyl chloride, polyethylene terephthalate (hereinafter sometimes abbreviated as “PET”), polyester such as polyethylene naphthalate, polycarbonate, polyimide, and further. Examples thereof include metal foil such as pattern paper, copper foil, and aluminum foil.
• the support film and the protective film may be subjected to a release treatment in addition to the mud treatment and the corona treatment.
• the thickness of the support film is not particularly limited, but is usually 10 to 150 ⁇ m, and preferably 25 to 50 ⁇ m.
• the thickness of the protective film is preferably 1 to 40 ⁇ m.
• the above support film is peeled off after laminating on the circuit board or after forming the insulating layer by heat curing. If the support film is peeled after the adhesive film is heat-cured, adhesion of dust and the like in the curing process can be prevented. In the case of peeling after curing, the support film is usually subjected to a release treatment in advance.
• the method for producing a multilayer printed wiring board using the adhesive film obtained as described above is, for example, when the layers are protected by a protective film, after peeling them, the layers are applied to the circuit board.
• Lamination is performed, for example, by vacuum lamination on one or both sides of the circuit board so as to be in direct contact.
• the laminating method may be a batch method or a continuous method using a roll. Further, the adhesive film and the circuit board may be heated (preheated) as necessary before lamination.
• the lamination conditions are such that the pressure bonding temperature (lamination temperature) is preferably 70 to 140 ° C., the pressure bonding pressure is preferably 1 to 11 kgf / cm 2 (9.8 ⁇ 10 4 to 107.9 ⁇ 104 N / m 2), and the air pressure is 20 mmHg (26 It is preferable to laminate under a reduced pressure of 0.7 hPa or less.
• the epoxy resin composition for electronic materials of the present invention is used as a conductive paste, for example, a method of dispersing fine conductive particles in the curable resin composition to obtain a composition for anisotropic conductive film, room temperature And a liquid paste resin composition for circuit connection and an anisotropic conductive adhesive.
• a cationic polymerization catalyst is used as a catalyst for the epoxy resin composition, and further a pigment, talc, and filler are added to form a resist ink composition.
• a method of forming a resist ink cured product can be mentioned.
• a method of obtaining a cured product from the epoxy resin composition for electronic materials of the present invention it is sufficient to comply with a general curing method of a curable resin composition.
• the composition obtained by the above method may be heated in a temperature range of about room temperature to about 250 ° C.
• the cured epoxy resin for electronic materials exhibits extremely excellent heat resistance, high thermal conductivity, and low thermal expansion. Therefore, electronic materials that require high temperature stability and high heat dissipation are required. It can be suitably used for applications, particularly for heat dissipation materials, and can be suitably used for thermally conductive adhesives, high-performance semiconductor sealing materials, and electronic circuit board materials.
• Measuring device “Shodex GPC-104” manufactured by Showa Denko KK Column: Showa Denko “Shodex KF-401HQ” + Showa Denko “Shodex KF-401HQ” + Showa Denko “Shodex KF-402HQ” + Showa Denko “Shodex KF-402HQ” Detector: RI (differential refractometer) Data processing: “Empower 2” manufactured by Waters Corporation Measurement conditions: Column temperature 40 ° C Mobile phase: Tetrahydrofuran Flow rate: 1.0 ml / min Standard: (Polystyrene used) “Polystyrene Standard 400” manufactured by Waters Corporation “Polystyrene Standard 530” manufactured by Waters Corporation “Polystyrene Standard 950” manufactured by Waters Corporation “Polystyrene Standard 2800” manufactured by Waters Corporation Sample: A 1.0 mass% tetrahydrofuran solution filtered in terms of resin solids and
• Synthesis example 1 (Synthesis of 2,4,4 ′′ -triglycidyloxy-p-terphenyl)
• a flask equipped with a thermometer, dropping funnel, condenser, and stirrer was charged with 55 g of 2,4,4 ′′ -trihydroxy-p-terphenyl, 274 g of epichlorohydrin, and 96 g of n-butanol while purging with nitrogen gas. I let you. After raising the temperature to 45 ° C., 53 g of a 48% aqueous sodium hydroxide solution was added over 8 hours, and then the temperature was further raised to 60 ° C. and reacted for another 1 hour.
• the reaction solution is separated into a solid content and a filtrate by filtration, 2 L of methyl ethyl ketone (hereinafter, MEK) is added to the solid content and heated to 90 ° C. to dissolve, the insoluble gel is removed by filtration, and then the solvent is distilled off under reduced pressure.
• MEK methyl ethyl ketone
• A-1 2,4,4 ′′ -triglycidyloxy-p-terphenyl
• the obtained epoxy resin (A-1) was a solid having a melting point of 157 ° C., and the epoxy equivalent was 158 g / equivalent.
• the target product was an area ratio of 85% or more by GPC measurement, and 446 peaks indicating 2,4,4 ′′ -triglycidyloxy-p-terphenyl were detected by MS measurement.
• Synthesis example 2 (Synthesis of 3,4 ′′, 5-triglycidyloxy-p-terphenyl) A flask equipped with a thermometer, dropping funnel, condenser, and stirrer was charged with nitrogen gas purge while charging 55 g of 3,4 ′′, 5-trihydroxy-p-terphenyl, 274 g of epichlorohydrin, and 96 g of n-butanol. I let you. After the temperature was raised to 40 ° C., 53 g of a 48% sodium hydroxide aqueous solution was added over 8 hours, and then the temperature was further raised to 70 ° C. and reacted for another hour.
• the reaction solution is separated into a solid content and a filtrate by filtration, 2 L of methyl ethyl ketone (hereinafter, MEK) is added to the solid content and heated to 90 ° C. to dissolve, the insoluble gel is removed by filtration, and then the solvent is distilled off under reduced pressure.
• MEK methyl ethyl ketone
• A-2 5-triglycidyloxy-p-terphenyl
• the resulting epoxy resin (A-2) was a solid having a melting point of 146 ° C., and the epoxy equivalent was 159 g / equivalent.
• MS measurement 446 peaks indicating 3,4 ′, 5-triglycidyloxy-p-terphenyl (A-2) were detected.
• Epoxy resins (A-1, A-2) of the present invention obtained in Synthesis Examples 1 and 2, reactive diluents, and bisphenol A type epoxy resins as comparative epoxy resins (Epiclon 850S manufactured by DIC Corporation) (A-3), imidazole (2PHZ-PW (manufactured by Shikoku Kasei Kogyo Co., Ltd.)) as a curing accelerator was blended with the composition shown in Table 1, and each blend was 6 cm ⁇ 11 cm ⁇ 0.8 mm. After being cured at 175 ° C. for 2 hours, the molded product was taken out from the mold, and the obtained cured product was evaluated for heat resistance, linear expansion coefficient, and thermal conductivity. The results are shown in Table 1.
• thermomechanical analyzer TMA / SS7100 manufactured by Hitachi High-Tech Science Co., Ltd.
• Measurement condition load 30mN
• Temperature increase rate Twice at 10 ° C / min
• Measurement temperature range 30 ° C to 300 ° C
• the measurement under the above conditions was carried out twice for the same sample, and the average expansion coefficient in the temperature range of 50 ° C. to 280 ° C. in the second measurement was evaluated as the linear expansion coefficient.
• Example 4 to 5 and Comparative Example 2 As the epoxy resin (A-2) of the present invention obtained in Synthesis Example 2, a reactive diluent and a comparative epoxy resin, a bisphenol A type epoxy resin (Epiclon 850S manufactured by DIC Corporation) (A-3), Table 2 using imidazole (2PHZ-PW (manufactured by Shikoku Kasei Kogyo Co., Ltd.)) as a curing accelerator and commercially available silane coupling treated alumina (manufactured by Admatechs Co., Ltd., AC9500-SCX) as an inorganic filler.
• a reactive diluent and a comparative epoxy resin a bisphenol A type epoxy resin (Epiclon 850S manufactured by DIC Corporation) (A-3), Table 2 using imidazole (2PHZ-PW (manufactured by Shikoku Kasei Kogyo Co., Ltd.)) as a curing accelerator and commercially available silane coupling treated alumina (
• the resin composition was prepared by blending with the composition shown in 1), kneading at a temperature equal to or higher than the melting temperature of the resin with three rolls, and defoaming.
• Example 4 and Example 5 were both solid at room temperature, the viscosity was lowered at a temperature equal to or higher than the melting temperature, and alumina could be easily blended.
• a cured resin test piece (60 ⁇ 110 ⁇ 0.8 mm) was prepared by hot press molding (temporary curing condition 175 ° C. ⁇ 20 minutes, main curing condition 175 ° C. ⁇ 2 time). About the obtained hardened
• the obtained cured product was allowed to stand in a dryer at 175 ° C. for 1000 hours, and then the thermal conductivity was measured.
• the case where the thermal conductivity maintenance rate was 90% or more was evaluated as ⁇ , and the case where it was 90% or less. Judged by. The results are shown in Table 2.
• the cured product of the polyfunctional terphenyl type epoxy resin represented by the formula (1) of the present invention which is a polyglycidyloxy-p-terphenyl compound is derived from the terphenyl skeleton. It exhibits excellent high thermal conductivity, excellent heat resistance derived from multifunctional design, and excellent low thermal expansion at high temperatures.
• the epoxy resin of the present invention is a crystalline solid, but when heated to the melting point or higher, it has a very low viscosity. Therefore, it may be used alone or in combination with a large amount of a diluent having low heat resistance and thermal conductivity. And high filling with inorganic filler.
• cured material containing an inorganic filler shows the extremely outstanding heat conductivity by the high heat conductivity of resin itself, and the heat conductivity improvement effect by filler high filling. Furthermore, since the cured epoxy resin for electronic materials of the present invention is excellent in heat resistance, it can maintain excellent thermal conductivity even after the heat resistance test.
• the epoxy resin composition of the present invention is useful for an electronic material, particularly a heat dissipation material, and can be suitably used particularly as a heat conductive adhesive material, a semiconductor sealing material, and an electronic circuit board material.

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