WO2015133259A1 - イオン分析装置 - Google Patents
イオン分析装置 Download PDFInfo
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- WO2015133259A1 WO2015133259A1 PCT/JP2015/054214 JP2015054214W WO2015133259A1 WO 2015133259 A1 WO2015133259 A1 WO 2015133259A1 JP 2015054214 W JP2015054214 W JP 2015054214W WO 2015133259 A1 WO2015133259 A1 WO 2015133259A1
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- ion
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- hydrogen
- hydrogen radicals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/622—Ion mobility spectrometry
- G01N27/623—Ion mobility spectrometry combined with mass spectrometry
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
- H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
- H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
- H01J49/0072—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by ion/ion reaction, e.g. electron transfer dissociation, proton transfer dissociation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
- H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]
Definitions
- the present invention relates to an ion analyzer for dissociating ions derived from sample components and analyzing fragment ions generated by the dissociation.
- the ion analyzer according to the present invention separates and detects the fragment ions generated by dissociation according to the mass-to-charge ratio, and the fragment ions generated by dissociation according to the ion mobility. It is suitable for an ion mobility meter that detects the above, or an ion mobility-mass spectrometer that combines both.
- ions derived from the compound of interest are dissociated and the resulting fragment ions (or product ions) are separated according to the mass-to-charge ratio.
- mass spectrometry is widely used.
- an ion trap time-of-flight mass spectrometer or the like is well known.
- CID Collision Induced Dissociation
- ETD Electron Transfer Dissociation
- ECD Electron Capture Dissociation
- negative molecular ions are irradiated as reactive ions in an ion trap and collide with ions derived from sample components in the ion trap to cause an interaction. Due to this interaction, the electrons of the reaction ions move to the protons of ions derived from the sample components, and the protons change into hydrogen radicals. Radical species of ions generated by this reaction dissociate specifically in a bond.
- the reaction at this time can be represented by the following formula.
- ETD and ECD are unpaired electron-induced dissociation methods unlike collision dissociation methods such as CID, cleavage of the N-C ⁇ bond of the peptide main chain occurs specifically. Therefore, c / z series fragment ions, which are difficult to generate with low energy CID, are actively generated. Further, since the cleavage is carried out while retaining the modified site such as sugar chain, it is easy to identify the modified product and the modified site, which is useful for the structural analysis of the polymer compound.
- Non-Patent Document 1 disclose a method of dissociating ions by irradiating hydroxyl ions (OH radicals) to ions derived from sample components transported under an atmospheric pressure atmosphere. Yes.
- the unpaired electron induced dissociation method using a hydroxyl radical has a limitation of dissociation in an atmospheric pressure atmosphere.
- the above dissociation method cannot be used for dissociation of ions in such an ion trap.
- Non-patent literatures 2 and 3 report examples of performing unpaired electron induced dissociation using neutral radical particles in a vacuum atmosphere.
- Non-Patent Document 2 unpaired electrons are induced in the same manner as ECD and ETD by irradiating hydrogen radicals to monovalent peptide ions captured in the cell of a Fourier transform ion cyclotron resonance mass spectrometer (FT-ICR MS). Although an attempt was made to cause mold dissociation, it was concluded that ion dissociation could not be confirmed.
- Non-Patent Document 3 reports that although the experiment in Non-Patent Document 2 was added, dissociation could not be realized.
- Non-Patent Document 4 and Patent Document 2 a neutral particle beam or a radical particle beam is accelerated using a FAB (Fast Atom Bombardment) gun and irradiated into the ion trap to be trapped in the ion trap.
- FAB Flust Atom Bombardment
- Disclosed is a method for dissociating ions. In these documents, this method is such that particles accelerated at high speed become excited, so that electrons emitted from the irradiated particles adhere to the ions trapped in the ion trap, similar to ETD and ECD. It is explained that dissociation occurs by this mechanism.
- This dissociation method does not require a charged particle optical system for irradiating neutral particles or radical particles into the ion trap. However, although it uses uncharged particles, it is a dissociation method that induces dissociation by transferring electrons in the same way as ETD and ECD, so that the ion to be dissociated must in principle be divalent or more. And monovalent ions cannot be dissociated.
- the dissociation method of irradiating ions derived from sample components with hydroxyl radicals can be applied to the dissociation of monovalent ions, but cannot be used in a vacuum atmosphere, so it is not suitable for dissociating ions trapped in an ion trap. Yes, it is not applicable to MS n analysis where n is 3 or more.
- Non-Patent Documents 2 and 3 Although dissociation methods for irradiating ions derived from sample components with hydrogen radicals have been proposed in Non-Patent Documents 2 and 3, etc., the attempt has not been successful. Although the dissociation method of irradiating ions with hydrogen radicals is also disclosed in Patent Document 2 as one of a plurality of dissociation methods, the reports in Non-Patent Documents 2 and 3 that dissociation did not succeed were disclosed. No technical improvement has been proposed. Therefore, in the ion dissociation method described in Patent Document 2, it is difficult to actually dissociate peptide molecule ions.
- the present invention has been made to solve the above-mentioned problems, and its main purpose is to dissociate monovalent ions derived from peptides captured in an ion trap or the like under a vacuum atmosphere, and to generate with low energy CID. It is an object of the present invention to provide an ion analyzer that performs unpaired electron-induced dissociation, which can generate c / z series fragment ions that are difficult to be generated.
- Non-Patent Documents 2 and 3 are methods utilizing the above mechanism, but it is experimentally observed that dissociation occurs in these documents. It is said that it was not confirmed. Also, Patent Document 2 does not propose an effective policy for actually causing dissociation.
- hydrogen radicals are used as radical particles irradiated to ions.
- hydrogen radicals are highly reactive, for example, the inner wall of a pipe or chamber wall that guides hydrogen radicals into an ion trap It is conceivable that they easily recombine into hydrogen molecules. Further, when the hydrogen radical collides with the inner wall of the pipe, the chamber wall, etc., the particle temperature immediately decreases to about room temperature. In light of these points, even if an attempt is made to irradiate ions trapped in the ion trap with hydrogen radicals, it is predicted that the efficiency with which the hydrogen radicals contributing to the reaction reach the ions to be dissociated is quite low. If this is the case, the main reason why dissociation does not occur in the above-described conventional attempts is considered to be that a sufficient amount of radicals contributing to the dissociation reaction cannot be secured.
- the inventor of the present application repeated experiments under such assumptions, particularly changing the introduction method and introduction conditions of hydrogen radicals in the ion trap. As a result, it was confirmed that unpaired electron-induced dissociation of ions can be realized by efficiently introducing hydrogen radicals into the ion trap and ensuring a sufficient amount of hydrogen radicals that contribute to the reaction with ions.
- the present invention has been made based on such experimental findings.
- the present invention made to solve the above problems is an ion analyzer for analyzing fragment ions generated by dissociating ions derived from sample components.
- an ion dissociation part for dissociating ions by introducing hydrogen radicals at a flow rate of 4 ⁇ 10 10 [atoms / s] or more into a space in which ions derived from the target sample component exist;
- a separation detection unit that separates and detects fragment ions generated in the ion dissociation unit according to at least one of mass to charge ratio or ion mobility; It is characterized by having.
- the ion dissociation part has a hydrogen density of 3 ⁇ 10 12 [atoms / m 3 ] or more with respect to the space where ions derived from the target sample component exist.
- a radical may be introduced.
- the ion dissociation part has a flow rate of 4 ⁇ 10 10 [atoms / s] or more with respect to ions derived from a target sample component captured in the ion trap, for example.
- hydrogen radicals having a density of 3 ⁇ 10 12 [atoms / m 3 ] or more are introduced for a predetermined time.
- a fragment ion peak intensity of about 0.1% or more of the peak intensity of the precursor ion can be obtained, which is sufficient in the mass spectrum. It is possible to detect fragment ion peaks.
- the hydrogen radicals are also introduced into a relatively narrow space where ions are confined.
- the introduction is more advantageous in terms of dissociation efficiency. Therefore, in the ion analyzer according to the present invention, preferably, the ion dissociation part is a high-frequency electric field such as a three-dimensional quadrupole ion trap, a multipole linear ion trap, or a cell of a Fourier transform ion cyclotron resonance mass spectrometer.
- Hydrogen radicals are introduced into an ion confinement part that confines ions in a predetermined space by the action of a magnetic field, and the ions derived from a target sample component react with hydrogen radicals inside the ion confinement part to dissociate the ions. It may be configured.
- Non-Patent Documents 2 and 3 even if the radical particles are attached to the carbonyl oxygen of the polymer ion, It is conceivable that the particles themselves are non-covalently bonded to other atoms in the ion, and unpaired electron-induced dissociation is not performed. This phenomenon is widely known in ECD and ETD.
- Non-Patent Document 6 after an ion trapped in an ion trap in ETD is irradiated with a negative ion for dissociation, a voltage is applied to the electrode to cause resonance excitation in the ion. It has been reported that unpaired electron-induced dissociation is promoted by collision with neutral particles such as helium.
- the excitation of ions by the formation of the auxiliary electric field as described above is effective in improving the dissociation efficiency. That is, in the ion analyzer according to the present invention, when an ion trap is used as the ion confinement part, the ion dissociation part is in the ion trap before or after the introduction of hydrogen radicals. It is preferable to include an auxiliary dissociation promoting unit that promotes ion dissociation by exciting the trapped ions and colliding with neutral particles introduced into the ion trap.
- a predetermined resonance excitation voltage may be applied to an end cap electrode constituting the ion trap or an electrode corresponding thereto.
- laser light irradiation may be used as means for exciting ions in order to promote ion dissociation.
- the ion dissociation unit when introducing hydrogen radicals into the ion confinement part, introduction of hydrogen radicals into a region where ions are present at as high a density as possible increases the dissociation efficiency. It is advantageous. Therefore, in the ion analyzer according to the present invention, when an ion trap is used as the ion confinement unit, the ion dissociation unit cools the ions trapped in the ion trap before introducing hydrogen radicals. Cooling with gas is recommended. Cooling makes it easier for ions to converge near the center of the ion trap. Therefore, by introducing hydrogen radicals near the center of the ion trap, the efficiency of dissociation can be increased.
- the ion dissociation part is a precursor in at least a part of a period during which hydrogen radicals are introduced into the ion trap. It is preferable that the reaction rate be suppressed by performing resonance excitation on ions included in a mass-to-charge ratio range other than ions.
- an FNF Frtered Noise Field
- an ion trap May be applied to the end cap electrode or the electrode corresponding thereto.
- the ion dissociation unit may be configured to set a long time for introducing hydrogen radicals so as to cause a plurality of dissociations.
- the ion dissociation part is a hydrogen radical that is a glass tube or a pipe having a glass film formed on at least the inner wall surface for transporting hydrogen radicals to a region where ions are present.
- a structure including an introduction pipe is preferable.
- the ion dissociation unit includes a hydrogen radical introduction tube for transporting hydrogen radicals to a region where ions are present, and a heating unit that maintains or heats the hydrogen radical introduction tube at a high temperature. It is good also as a structure containing these. Thus, loss due to recombination of hydrogen radicals during transport of hydrogen radicals can be suppressed, and the temperature of the hydrogen radicals can be kept high, so that ion dissociation efficiency can be increased.
- an inert gas is caused to flow along the inner wall surface of a hydrogen radical introduction tube for transporting hydrogen radicals to a region where ions are present. It is good also as a structure which transports a hydrogen radical, making it not contact with the inner wall surface of an inlet tube. Even with such a configuration, loss due to recombination of hydrogen radicals can be reduced and dissociation efficiency can be increased.
- a hydrogen radical flow may be directly introduced into a region where ions exist, such as in an ion trap, without using a gas pipe.
- the ion dissociation unit may include a flux shaping unit that extracts a hydrogen radical flow having directivity.
- a hydrogen radical flow having directivity extracted by such a flux shaping unit is introduced into a three-dimensional quadrupole ion trap, an introduction hole is formed in a ring electrode constituting the ion trap, It is preferable to introduce a small diameter hydrogen radical flow through the introduction hole in the vicinity of the center of the ion trap. Thereby, hydrogen radicals can be efficiently introduced into the ion trap while suppressing thermal loss of hydrogen radicals.
- monovalent ions that could not be dissociated by conventional general unpaired electron induced dissociation methods such as ETD and ECD are also dissociated with high efficiency to generate fragment ions.
- ETD and ECD are also dissociated with high efficiency to generate fragment ions.
- monovalent ions such as MALDI are predominantly generated, for example, c / z series fragment ions are generated from peptide molecule ions.
- This can be subjected to analysis.
- negative ions can be dissociated in the same manner as positive ions.
- the ion analyzer according to the present invention uses neutral particles instead of charged particles for unpaired electron-induced dissociation, the flow rate of introduction due to the influence of space charge or the like is also reduced in the region where ions are confined by the action of an electric field. A large amount of neutral particles for dissociation can be introduced without being restricted. Therefore, it is easy to improve the dissociation efficiency.
- the ion analyzer since the valence of ions is not reduced by ion dissociation, for example, by controlling the irradiation time of hydrogen radicals, it is possible to cause dissociation of the target ion multiple times. . Thereby, immonium ions derived from peptides can be easily generated, which is effective for structural analysis of peptides.
- the schematic block diagram of the mass spectrometer which is one Example of the ion analyzer which concerns on this invention.
- the schematic block diagram of the mass spectrometer which is another Example of this invention.
- FIG. 1 is a schematic configuration diagram of the mass spectrometer of the present embodiment.
- the mass spectrometer of the present embodiment captures an ion source 1 that ionizes a target sample component and ions generated by the ion source 1 by the action of a high-frequency electric field in a vacuum chamber (not shown) maintained in a vacuum atmosphere.
- An ion trap 2, a time-of-flight mass separation unit 3 that separates ions emitted from the ion trap 2 according to a mass-to-charge ratio, and an ion detector 4 that detects the separated ions are provided.
- the mass spectrometer of the present embodiment further includes a hydrogen radical irradiation unit 5 for introducing hydrogen radicals into the ion trap 2 in order to dissociate ions trapped in the ion trap 2, and a predetermined amount in the ion trap 2. And a gas supply unit 6 for supplying the gas.
- a hydrogen radical irradiation unit 5 for introducing hydrogen radicals into the ion trap 2 in order to dissociate ions trapped in the ion trap 2, and a predetermined amount in the ion trap 2.
- a gas supply unit 6 for supplying the gas.
- the ion source 1 is, for example, an ion source using an ionization method such as a MALDI method.
- the ion trap 2 is a three-dimensional quadrupole ion trap that includes an annular ring electrode 21 and a pair of end cap electrodes 22 and 24 arranged to face each other with the ring electrode 21 interposed therebetween.
- the trap voltage generation unit 7 applies either a high-frequency voltage or a DC voltage to the electrodes 21, 22, 24 at a predetermined timing, or a voltage obtained by combining them.
- the time-of-flight mass separator 3 is a linear type in this example, but may be a reflectron type, a multi-turn type, or the like, and is not a time-of-flight type mass separator, for example, using the ion separation function of the ion trap 2 itself Thus, a mass separator or an orbitrap may be used.
- the hydrogen radical irradiation unit 5 includes a hydrogen radical supply source 51 that stores hydrogen radicals or generates hydrogen radicals, a valve 52 that can adjust the flow rate, a nozzle 53 that ejects hydrogen radicals, and an ejection flow from the nozzle 53. And a skimmer 54 that has an opening on the central axis and separates a gas such as diffusing hydrogen molecules to extract a small-diameter hydrogen radical flow.
- the gas supply unit 6 includes a gas supply source 61 that stores helium, argon, or the like used as a cooling gas or, in some cases, CID gas, and a valve 62 that can adjust the flow rate.
- Various ions generated from a sample such as a peptide mixture in the ion source 1 are ejected from the ion source 1 in a packet form and introduced into the ion trap 2 through the ion introduction hole 23 formed in the inlet end cap electrode 22. Is done.
- the peptide-derived ions introduced into the ion trap 2 are captured by a high-frequency electric field formed in the ion trap 2 by a voltage applied to the ring electrode 21 from the trap voltage generator 7.
- a predetermined voltage is applied from the trap voltage generator 7 to the ring electrode 21 and the like, thereby exciting ions included in a mass-to-charge ratio range other than ions having a specific mass-to-charge ratio. 2 is excluded. Thereby, precursor ions having a specific mass-to-charge ratio are selectively captured in the ion trap 2.
- the valve 62 is opened in the gas supply unit 6, and an inert gas such as helium is introduced into the ion trap 2 as a cooling gas, whereby the precursor ions are cooled. As a result, the precursor ions are converged near the center of the ion trap 2.
- the valve 52 of the hydrogen radical irradiation unit 5 is opened, and a gas containing hydrogen radicals (hydrogen atoms) is ejected from the nozzle 53.
- a gas such as hydrogen gas (hydrogen molecules) is removed by the skimmer 54 positioned in front of the jet flow, and the hydrogen radicals that have passed through the opening of the skimmer 54 are formed into a thin beam and drilled in the ring electrode 21. It passes through the radical particle inlet 26 which is made.
- This hydrogen radical is introduced into the ion trap 2 and irradiated to the precursor ions trapped in the ion trap 2.
- the opening degree of the valve 52 and the like are adjusted in advance so that the flow rate of hydrogen radicals irradiated to the ions at this time is equal to or higher than a predetermined flow rate.
- the irradiation time of hydrogen radicals is also set appropriately in advance.
- the precursor ion undergoes unpaired electron-induced dissociation, and c / z series fragment ions derived from peptides are mainly generated.
- the generated various fragment ions are trapped in the ion trap 2 and cooled. Thereafter, a high DC voltage is applied from the trap voltage generator 7 to the end cap electrodes 22 and 24 at a predetermined timing.
- ions trapped in the ion trap 2 receive acceleration energy, and the ion injection holes 25 It is injected all at once.
- ions having a constant acceleration energy are introduced into the flight space of the time-of-flight mass separation unit 3 and separated according to the mass-to-charge ratio while flying in the flight space.
- the ion detector 4 sequentially detects the separated ions, and the data processing unit 9 receiving the detection signal creates a time-of-flight spectrum with the time point of emission of ions from the ion trap 2 being time zero, for example.
- the mass spectrum by a fragment ion is created by converting the flight time into the mass-to-charge ratio using the mass calibration information obtained in advance.
- the ions trapped in the ion trap 2 are directly irradiated with hydrogen radicals to dissociate the ions and generate fragment ions.
- dissociation methods have been attempted in Non-Patent Documents 2 and 3 but have not been successful.
- Patent Document 2 discloses such a dissociation method, it actually does No measures have been proposed for success.
- the inventor of the present application experimentally investigated the conditions for dissociating the ions by directly irradiating the ions with hydrogen radicals, and confirmed that good dissociation occurs under appropriate conditions. .
- a detailed configuration and a more preferable configuration of the mass spectrometer of the present embodiment will be described while explaining the experimental results.
- FIG. 2 shows hydrogen with respect to a monovalent ion of substance P (substance-P, molecular formula: C 63 H 98 N 18 O 13 S, amino acid sequence: RPKPQQFFGLM) trapped in the ion trap 2 in the mass spectrometer of this example. It is an actual measurement example of a mass spectrum of fragment ions generated by irradiation with radicals. In this measurement, the flow rate of hydrogen radicals irradiated to the ions trapped in the ion trap 2 is about 1.3 ⁇ 10 13 [atoms / sec], and the irradiation time is 8 [sec]. As shown in FIG.
- a CID operation may be performed, and fragment ions obtained by the two-stage dissociation may be captured in the ion trap 2 and subjected to mass spectrometry.
- FIG. 3 is an actual measurement result of the relationship between the flow rate of hydrogen radicals irradiated to ions in the ion trap 2 and the fragment peak intensity characteristics.
- the ion to be dissociated is the P substance as in the above experiment, and the ratio between the peak intensity of the c 5 fragment ion obtained from the monovalent ion at the highest SN ratio and the precursor ion peak intensity is taken as the vertical axis.
- the peak intensity of the precursor ion used for the calculation a value (68 [mV]) obtained in a preliminary experiment conducted without irradiation with hydrogen radicals was used.
- the horizontal axis of FIG. 3 shows the absolute value of the hydrogen radical flow rate.
- a quadrupole mass spectrometer was used to measure the absolute value of the hydrogen radical flow rate.
- the noise component in this measurement was about 0.02 [mV]
- the SN ratio of the precursor ion was about 3500.
- FIG. 4 is an actual measurement example of the mass spectrum in which the peak of the fragment ion appears at this time. It can be seen from this mass spectrum that the c 5 fragment ion peak is sufficiently detectable.
- the irradiation time of hydrogen radicals into the ion trap 2 was set to 60 [sec]. This value was selected because the maximum intensity of the c 5 fragment ion peak was obtained under the conditions of the maximum hydrogen radical flow rate (1.3 ⁇ 10 12 [atoms / s]) in this measurement. In this case, even if the irradiation time of hydrogen radicals was made longer than 60 [sec], the peak intensity of fragment ions was rather lowered. This is because the dissociation of fragment ions already dissociated further than the increase amount of fragment ions newly generated by dissociation, that is, the decrease amount of fragment ions generated by primary dissociation by proceeding in multiple stages. It is estimated that it is because it exceeds. On the contrary, if this phenomenon is utilized and the irradiation time of hydrogen radicals is made sufficiently long, it can be easily estimated that the dissociation finally proceeds to one amino acid residue (immonium ion).
- the valence of fragment ions decreases each time ions are dissociated, so the technique of finally obtaining immonium ions by repeating dissociation by ETD and ECD is the number of amino acid residues. It can only be applied to ions having a higher valence.
- the hydrogen radical used in the dissociation method in the present invention is neutral, the valence of the fragment ion does not decrease even when dissociation is repeated, and the irradiation time of the hydrogen radical is sufficiently increased.
- Monium ions can be generated as needed, and it can be said that the dissociation method used in the present invention is useful when immonium ions are used for structural analysis. Note that the length of irradiation time necessary for generating immonium ions can be experimentally determined in advance.
- a broad band corresponding to the mass-to-charge ratio range excluding the mass-to-charge ratio of the precursor ion while irradiating the ions with hydrogen radicals may be applied to the end cap electrodes 22 and 24.
- FNF signal A small amplitude resonance excitation voltage having a frequency component
- fragment ions generated by dissociation of the precursor ions are excited, and at least a part of them deviates from the region irradiated with hydrogen radicals in the ion trap 2. That is, since the density of fragment ions existing in the region irradiated with hydrogen radicals is reduced, it is possible to suppress the reaction between fragment ions and hydrogen radicals, thereby collecting fragment ions by primary dissociation. Can be improved.
- the radical particle discharge port 27 is provided on the same straight line as the radical particle introduction port 26 for introducing hydrogen radicals into the ion trap 2, the hydrogen irradiated into the ion trap 2 is irradiated. Most of the radicals pass through the vicinity of the center of the ion trap 2, and most of the radicals are discharged out of the ion trap 2 as they are.
- the radical particle outlet 27 is provided in this way, the gas introduced together with the hydrogen radical into the ion trap 2 is quickly exhausted to the outside of the ion trap 2 through the outlet 27, so that the residual gas pressure in the ion trap 2 is increased. Can be prevented from rising.
- the configuration may be changed so that hydrogen radicals easily remain in the ion trap 2 as in the case of normal gas introduction.
- the ring electrode 21 may not be provided with the radical particle discharge port 27.
- hydrogen radicals introduced into the ion trap 2 repeatedly collide with the inner wall of the ion trap 2 and are finally discharged to the outside of the ion trap 2. Therefore, since the hydrogen radicals confined in the ion trap 2 can contribute to the reaction many times until they are discharged, the hydrogen radicals are quickly exhausted from the ion trap 2 as in the embodiment shown in FIG.
- the flow rate of hydrogen radicals necessary for ion dissociation is small. That is, in the configuration shown in FIG. 5, the hydrogen radical flow rate is equal to the hydrogen radical flow rate with a flow rate smaller than the minimum value (4 ⁇ 10 10 [atoms / s]) of the hydrogen radical flow rate obtained from the result of FIG. An effect can be obtained.
- N A I A / ( ⁇ R 2 ) (1)
- I A is the hydrogen radical flow rate [atoms / s]
- ⁇ is the hydrogen radical velocity [m / s]
- R is the hydrogen radical flux radius [m].
- hydrogen radicals are generated by heating hydrogen gas, and since the heating temperature was 2000 K, it is estimated that ⁇ is about 7000 [m / s].
- the radius 0.75 [mm] of the radical particle inlet 26 of the ion trap 2 is used as the value of R, and I A is 4 ⁇ 10 10 [atoms / s, which is the minimum value of the hydrogen radical flow rate.
- the minimum value of N a in the experiment shown in Figure 3 is found to be 3 ⁇ 10 12 [atoms / m 3]. That is, the density of hydrogen radicals corresponding to the minimum value of the hydrogen radical flow rate obtained from the results of FIG. 3 is 3 ⁇ 10 12 [atoms / m 3 ].
- ⁇ in the equation (3) is expressed by the following equation (4).
- ⁇ ⁇ 3 ⁇ 10 -4 / ⁇ (4) This equation (4) shows that when the confinement time ⁇ is longer than 300 [ ⁇ sec], an equivalent dissociation effect can be obtained with a hydrogen radical flow rate (or hydrogen radical density) smaller than that shown in FIG. It shows that it can be obtained with the configuration.
- the inner wall surfaces of the electrodes 21, 22, 24 of the ion trap 2 are coated with a material that hardly causes recombination of hydrogen radicals, specifically, silicon dioxide (SiO 2 ) or the like. It is good to do.
- silicon dioxide SiO 2
- hydrogen radicals easily recombine with hydrogen molecules by colliding with the surfaces of the electrodes 21, 22, 24 of the ion trap 2, but on the inner wall surfaces of the electrodes 21, 22, 24.
- an appropriate coating layer of silicon dioxide is formed, the probability of recombination of hydrogen radicals can be lowered.
- the ratio of the area of the exhaust port (the gap between the electrodes 21, 22, 24, the opening of the ion introduction hole 23, and the ion injection hole 25) with respect to the internal surface area of the ion trap 2 is reduced, and the exhaust efficiency of hydrogen radicals It is desirable to reduce
- the radical electrode inlet 26 is provided in the ring electrode 21 and hydrogen radicals are introduced into the ion trap 2 through the opening.
- hydrogen is introduced into the ion trap through a gas pipe.
- a radical may be introduced.
- hydrogen radicals easily recombine into hydrogen molecules when they come into contact with the inner wall surface of the gas pipe, it is preferable to take measures to avoid such recombination.
- the material of the gas pipe itself may be a material that hardly causes recombination of hydrogen radicals, specifically, silicon dioxide as described above, or a coating layer made of an appropriate material such as silicon dioxide may be formed on the inner wall surface of the gas pipe.
- a coating layer made of an appropriate material such as silicon dioxide may be formed on the inner wall surface of the radical particle inlet 26.
- an inert gas such as helium is flowed along the inner wall surface of the gas pipe so that hydrogen radicals do not contact the inner wall surface of the gas pipe, and the hydrogen radical is allowed to flow in the center of the inert gas flow. It may be.
- the rate of reaction between ions and hydrogen radicals in the ion trap 2 depends on the temperature of the hydrogen radicals. Therefore, when supplying hydrogen radicals into the ion trap 2 through the gas pipe as described above, a heating unit or the like may be provided so as to maintain the gas pipe at a high temperature.
- the ion trap is a three-dimensional quadrupole ion trap, but may be a multipole linear ion trap.
- the density of ions trapped in the ion trap should be high.
- the linear ion trap is less affected by space charge than the three-dimensional quadrupole ion trap, and the surface density of ions can be increased.
- a linear ion trap is irradiated with hydrogen radicals in the axial direction, the flight distance in which the hydrogen radicals contribute to the reaction is extended. For these reasons, it is more advantageous in terms of dissociation efficiency to use a linear ion trap.
- the ion trap confines ions by the action of a high-frequency electric field.
- hydrogen ions are irradiated to ions confined in a cell of a Fourier transform ion cyclotron resonance mass spectrometer that confines ions by the action of a magnetic field. May be.
- ions confined in such a predetermined space for example, it is possible to dissociate ions by irradiating hydrogen radicals obliquely to the ion flow or in the same direction or in the opposite direction of the flow. Good.
- the said Example is a mass spectrometer which mass-analyses the fragment ion produced
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Abstract
Description
[M+nH]n+ + A- → {[M+nH](n-1)+}* + A → 解離
ここで、Mは目的分子、Hはプロトン、A-は反応イオン、nは正の整数であり、*はラジカル状態であることを示す。
[M+nH]n+ + e- → {[M+nH](n-1)+}* → 解離
[M+H]+ + H* → [M+2H]+ * → 解離
非特許文献2、3に開示されている解離法は上記メカニズムを利用した方法であるが、これら文献では解離が起こることは実験的に確認されなかったとされている。また、特許文献2でも実際に解離を起こすための実効的な方策は提案されていない。
a)目的とする試料成分由来のイオンが存在する空間に対して4×1010 [atoms/s]以上の流量で以て水素ラジカルを導入することにより該イオンを解離させるイオン解離部と、
b)前記イオン解離部で生成されたフラグメントイオンを質量電荷比又はイオン移動度の少なくとも一方に応じて分離して検出する分離検出部と、
を備えることを特徴としている。
イオントラップ内に捕捉したイオンを励振させるには、例えばイオントラップを構成するエンドキャップ電極又はそれに相当する電極に所定の共鳴励起電圧を印加すればよい。また、イオンの解離を促進させるためにイオンを励起する手段としてレーザ光照射を用いてもよい。
クーリングによってイオンはイオントラップの中心付近に収束し易くなるから、イオントラップの中心付近に水素ラジカルを導入することにより、解離の効率を高めることができる。
プリカーサイオン以外の質量電荷比範囲に含まれるイオンに対する共鳴励起を行うには、例えば対応する質量電荷比範囲に応じた周波数成分の信号が重畳されたFNF(Filtered Noise Field)信号を、例えばイオントラップを構成するエンドキャップ電極又はそれに相当する電極に印加すればよい。
図1は本実施例の質量分析装置の概略構成図である。
本実施例の質量分析装置は、真空雰囲気に維持される図示しない真空チャンバの内部に、目的試料成分をイオン化するイオン源1と、イオン源1で生成されたイオンを高周波電場の作用により捕捉するイオントラップ2と、イオントラップ2から射出されたイオンを質量電荷比に応じて分離する飛行時間型質量分離部3と、分離されたイオンを検出するイオン検出器4と、を備える。本実施例の質量分析装置はさらに、イオントラップ2内に捕捉されているイオンを解離させるべく該イオントラップ2内に水素ラジカルを導入するための水素ラジカル照射部5と、イオントラップ2内に所定のガスを供給するガス供給部6と、を備える。
ガス供給部6は、クーリングガスや場合によってはCIDガスとして使用されるヘリウム、アルゴンなどを貯留したガス供給源61と、流量を調整可能であるバルブ62と、を含む。
イオン源1においてペプチド混合物などの試料から生成された各種イオンはパケット状にイオン源1から射出され、入口側エンドキャップ電極22に形成されているイオン導入孔23を経てイオントラップ2の内部に導入される。イオントラップ2内に導入されたペプチド由来のイオンは、トラップ電圧発生部7からリング電極21に印加される電圧によってイオントラップ2内に形成される高周波電場に捕捉される。そのあと、トラップ電圧発生部7からリング電極21等に所定の電圧が印加され、それによって目的とする特定の質量電荷比を有するイオン以外の質量電荷比範囲に含まれるイオンは励振され、イオントラップ2から排除される。これにより、イオントラップ2内に、特定の質量電荷比を有するプリカーサイオンが選択的に捕捉される。
次に、その実験結果を説明しつつ、本実施例の質量分析装置における詳細な構成やより好ましい構成について述べる。
図2は、本実施例の質量分析装置においてイオントラップ2内に捕捉したP物質(substance-P、分子式:C63H98N18O13S、アミノ酸配列:RPKPQQFFGLM)の1価イオンに対し水素ラジカルを照射することで生成されたフラグメントイオンのマススペクトルの実測例である。この実測において、イオントラップ2内に捕捉されているイオンに照射した水素ラジカルの流量は約1.3×1013[atoms/sec]であり、照射時間は8[sec]である。図2に示すように、一般に中性粒子との衝突解離によってフラグメントイオンが生成されるCIDでは生成されることがないc系列のフラグメントピークが明確に現れている。比較のために、水素ラジカルを含まない水素分子のみをイオントラップ2内のイオンに照射する実測も行ったが、図2で見られるようなc系列のフラグメントピークは観測されなかった。この実測結果から、図1に示した構成において少なくとも上記条件の下で、水素ラジカルとイオンとの相互作用により不対電子誘導型の解離が実現されたと結論付けることができる。
図3は、イオントラップ2内のイオンに照射する水素ラジカルの流量とフラグメントピーク強度特性との関係の実測結果である。解離対象のイオンは上記実験と同じくP物質であり、その1価イオンから最も高いSN比で得られたc5フラグメントイオンのピーク強度とプリカーサイオンピーク強度との比率を縦軸とした。計算に用いたプリカーサイオンのピーク強度は、水素ラジカルを照射しない状態で実施した予備実験で得られた値(68[mV])を用いた。また、図3の横軸は水素ラジカル流量の絶対値を示している。この水素ラジカル流量の絶対値計測には四重極型質量分析装置を用いた。なお、本実測におけるノイズ成分は約0.02[mV]であり、プリカーサイオンのSN比は3500程度であった。
図1に示した本実施例の質量分析装置において、イオントラップ2内のイオンと反応を起こす水素ラジカルの実質的な密度NA[atoms/m3]は次の(1)式で表される。
NA=IA/(νπR2) …(1)
ここでIAは水素ラジカルの流量[atoms/s]であり、νは水素ラジカルの速度[m/s]、Rは水素ラジカル流束の半径[m]である。図3に示した実験では水素ガスを加熱することで水素ラジカルを生成しており、その加熱温度が2000Kであったことから、νは約7000[m/s]であると見積もられる。(1)式において、イオントラップ2のラジカル粒子導入口26の半径 0.75[mm]をRの値として用い、IAには水素ラジカル流量の最小値である4×1010[atoms/s]を代入すると、図3に示した実験においてNAの最小値は3×1012[atoms/m3]であることが分かる。即ち、図3の結果から得られた水素ラジカル流量の最小値に相当する水素ラジカルの密度は3×1012[atoms/m3]である。
dNB/dt=(IB/V)-(NB/τ)=0 → NB=τ(IB/V) …(2)
ここでIBは水素ラジカルの流量[atoms/s]であり、Vはイオントラップ2の内部の体積[m3]であり、τは水素ラジカルの排気及び再結合の両者を考慮した閉じ込め時間[sec]である。ここで、反応に対する水素ラジカルの粒子温度の影響を無視すると、図1の構成と図5の構成とで同一の解離効果を得るためには、密度NAとNBとが等しければよい。この場合、それぞれの構成で必要となる水素ラジカルの流量の比αは次の(3)式で表される。
IA/(νπR2)=τ(IB/V) → α≡IB/IA=(1/τ)V/(νπR2) …(3)
α≒3×10-4/τ …(4)
この(4)式は、閉じ込め時間τを300[μsec]よりも長くした場合には、図1の構成よりも少ない水素ラジカル流量(又は水素ラジカル密度)で以て同等の解離効果が図5の構成で得られることを示している。閉じ込め時間τを長くするためには、イオントラップ2の電極21、22、24の内壁面に、水素ラジカルの再結合を生じにくい材料、具体的には、二酸化珪素(SiO2)などによるコーティングを行うとよい。一般に知られているように、水素ラジカルはイオントラップ2の電極21、22、24の表面に衝突することで水素分子に容易に再結合してしまうが、電極21、22、24の内壁面に適宜の二酸化珪素の被膜層を形成すると、水素ラジカルの再結合の確率を下げることができる。また併せて、イオントラップ2の内部表面積に対する排気口(電極21、22、24間の間隙やイオン導入孔23、イオン射出孔25の開口)の面積の比率を小さくして、水素ラジカルの排気効率を低減することが望ましい。
また、ガス配管の内部で水素ラジカルが配管内壁面に接触しないように、ガス配管の内壁面に沿ってヘリウムなどの不活性ガスを流し、その不活性ガス流の中央部に水素ラジカルを流すようにしてもよい。
2…イオントラップ
21…リング電極
22、24…エンドキャップ電極
23…イオン導入孔
25…イオン射出孔
26…ラジカル粒子導入口
27…ラジカル粒子排出口
3…質量分離部
4…イオン検出器
5…水素ラジカル照射部
51…水素ラジカル供給源
52、62…バルブ
53…ノズル
54…スキマー
6…ガス供給部
61…ガス供給源
7…トラップ電圧発生部
8…制御部
Claims (12)
- 試料成分由来のイオンを解離して生成したフラグメントイオンを分析するイオン分析装置であって、
a)目的とする試料成分由来のイオンが存在する空間に対して4×1010 [atoms/s]以上の流量で以て水素ラジカルを導入することにより該イオンを解離させるイオン解離部と、
b)前記イオン解離部で生成されたフラグメントイオンを質量電荷比又はイオン移動度の少なくとも一方に応じて分離して検出する分離検出部と、
を備えることを特徴とするイオン分析装置。 - 試料成分由来のイオンを解離して生成したフラグメントイオンを分析するイオン分析装置であって、
a)目的とする試料成分由来のイオンが存在する空間に対して3×1012[atoms/m3]以上の密度で以て水素ラジカルを導入することにより該イオンを解離させるイオン解離部と、
b)前記イオン解離部で生成されたフラグメントイオンを質量電荷比又はイオン移動度の少なくとも一方に応じて分離して検出する分離検出部と、
を備えることを特徴とするイオン分析装置。 - 請求項1又は2に記載のイオン分析装置であって、
前記イオン解離部は、電場又は磁場の作用によりイオンを所定の空間に閉じ込めるイオン閉じ込め部に水素ラジカルを導入し、該イオン閉じ込め部の内部で目的とする試料成分由来のイオンと水素ラジカルとを反応させて該イオンを解離させることを特徴とするイオン分析装置。 - 請求項3に記載のイオン分析装置であって、
前記イオン閉じ込め部はイオントラップであり、前記イオン解離部は、水素ラジカルを導入する前又は導入した後の少なくとも一方の期間に、前記イオントラップ内に捕捉したイオンを励振させ、該イオントラップ内に導入した中性粒子に衝突させることでイオンの解離を促進させる補助解離促進部を含むことを特徴とするイオン分析装置。 - 請求項3に記載のイオン分析装置であって、
前記イオン閉じ込め部はイオントラップであり、前記イオン解離部は、水素ラジカルを導入する前又導入した後の少なくとも一方の期間に、前記イオントラップ内に捕捉したイオンにレーザ光を照射することで該イオンの解離を促進させる補助解離促進部を含むことを特徴とするイオン分析装置。 - 請求項3~5のいずれか1項に記載のイオン分析装置であって、
前記イオン閉じ込め部はイオントラップであり、前記イオン解離部は、水素ラジカルを導入する前に、前記イオントラップ内に捕捉しているイオンに対しクーリングガスによるクーリングを行うことを特徴とするイオン分析装置。 - 請求項3~5のいずれか1項に記載のイオン分析装置であって、
前記イオン閉じ込め部はイオントラップであり、前記イオン解離部は、水素ラジカルを導入する期間の少なくとも一部で、プリカーサイオン以外の質量電荷比範囲に含まれるイオンに対する共鳴励起を行うことによりイオンと水素ラジカルとの反応速度を抑制することを特徴とするイオン分析装置。 - 請求項3に記載のイオン分析装置であって、
前記イオン解離部は、複数回の解離を生起させるように水素ラジカルを導入する時間を長く設定することを特徴とするイオン分析装置。 - 請求項1~8のいずれか1項に記載のイオン分析装置であって、
前記イオン解離部は、イオンが存在する領域まで水素ラジカルを輸送するための、ガラス管又は少なくとも内壁面にガラス被膜が形成されている配管である水素ラジカル導入管を含むことを特徴とするイオン分析装置。 - 請求項1~8のいずれか1項に記載のイオン分析装置であって、
前記イオン解離部は、イオンが存在する領域まで水素ラジカルを輸送するための水素ラジカル導入管と、該水素ラジカル導入管を高温に維持する又は加熱する加熱部と、を含むことを特徴とするイオン分析装置。 - 請求項1~8のいずれか1項に記載のイオン分析装置であって、
前記イオン解離部は、イオンが存在する領域まで水素ラジカルを輸送するための水素ラジカル導入管の内壁面に沿って不活性ガスを流し、その不活性ガスの流れによって水素ラジカルが導入管内壁面に接触しないようにしつつ、イオンが存在する領域まで水素ラジカルを輸送することを特徴とするイオン分析装置。 - 請求項1~8のいずれか1項に記載のイオン分析装置であって、
前記イオン解離部は、指向性を有する水素ラジカル流を取り出す流束整形部を含むことを特徴とするイオン分析装置。
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Also Published As
Publication number | Publication date |
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EP3093871A1 (en) | 2016-11-16 |
CN106104747B (zh) | 2018-01-30 |
JPWO2015133259A1 (ja) | 2017-04-06 |
US9947520B2 (en) | 2018-04-17 |
EP4220684A1 (en) | 2023-08-02 |
EP3093871A4 (en) | 2017-01-04 |
CN106104747A (zh) | 2016-11-09 |
JP6229790B2 (ja) | 2017-11-15 |
US20160372311A1 (en) | 2016-12-22 |
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