WO2012023470A1 - 無アルカリガラス - Google Patents
無アルカリガラス Download PDFInfo
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- WO2012023470A1 WO2012023470A1 PCT/JP2011/068252 JP2011068252W WO2012023470A1 WO 2012023470 A1 WO2012023470 A1 WO 2012023470A1 JP 2011068252 W JP2011068252 W JP 2011068252W WO 2012023470 A1 WO2012023470 A1 WO 2012023470A1
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- alkali
- glass
- free glass
- temperature
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C3/00—Glass compositions
- C03C3/04—Glass compositions containing silica
- C03C3/076—Glass compositions containing silica with 40% to 90% silica, by weight
- C03C3/089—Glass compositions containing silica with 40% to 90% silica, by weight containing boron
- C03C3/091—Glass compositions containing silica with 40% to 90% silica, by weight containing boron containing aluminium
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/02—Details
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/02—Details
- H05B33/04—Sealing arrangements, e.g. against humidity
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K77/00—Constructional details of devices covered by this subclass and not covered by groups H10K10/80, H10K30/80, H10K50/80 or H10K59/80
- H10K77/10—Substrates, e.g. flexible substrates
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C3/00—Glass compositions
- C03C3/04—Glass compositions containing silica
- C03C3/076—Glass compositions containing silica with 40% to 90% silica, by weight
- C03C3/083—Glass compositions containing silica with 40% to 90% silica, by weight containing aluminium oxide or an iron compound
- C03C3/085—Glass compositions containing silica with 40% to 90% silica, by weight containing aluminium oxide or an iron compound containing an oxide of a divalent metal
- C03C3/087—Glass compositions containing silica with 40% to 90% silica, by weight containing aluminium oxide or an iron compound containing an oxide of a divalent metal containing calcium oxide, e.g. common sheet or container glass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K2101/00—Properties of the organic materials covered by group H10K85/00
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K2102/00—Constructional details relating to the organic devices covered by this subclass
- H10K2102/301—Details of OLEDs
- H10K2102/361—Temperature
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
Definitions
- the present invention relates to an alkali-free glass, and more particularly to an alkali-free glass suitable for an organic EL display.
- Organic EL displays are thin and excellent in moving picture display and have low power consumption. Therefore, they are used for applications such as mobile phone displays.
- Glass plates are widely used as substrates for organic EL displays.
- the glass plate for this application is mainly required to have the following characteristics. (1) In order to prevent a situation in which alkali ions are diffused into the semiconductor material formed in the heat treatment step, substantially no alkali metal oxide is contained. (2) It is excellent in productivity to reduce the cost of the glass plate. Excellent devitrification resistance and meltability. (3) In the manufacturing process of p-Si • TFT, the strain point is high in order to reduce thermal shrinkage.
- the strain point is a characteristic that becomes an index of heat resistance. As the strain point is higher, thermal shrinkage is less likely to occur in the manufacturing process of the p-Si • TFT.
- Patent Document 1 discloses a glass plate having a high strain point.
- the organic EL display is composed of two glass plates, a negative electrode such as metal, an organic light emitting layer, a positive electrode such as ITO, a sealing material, and the like.
- an organic resin such as an epoxy resin has been used as a sealing material.
- an organic resin material has a problem of causing deterioration of an organic light emitting layer because it has a low oxygen and moisture barrier property (gas barrier property). It was. For this reason, the research which raises the airtightness inside a display using a glass sealing material is actively performed, and has already been put into practical use in some organic EL displays.
- the thermal expansion coefficient tends to be higher, and the thermal expansion coefficient is usually 60 to 80 ⁇ 10 ⁇ 7 / ° C.
- the higher the strain point the lower the thermal expansion coefficient of the glass plate.
- the thermal expansion coefficient is less than 40 ⁇ 10 ⁇ 7 / ° C. (see Patent Document 1).
- the glass plate for organic EL display is required to have a thermal expansion coefficient that matches the thermal expansion coefficient of the glass sealing material.
- the present invention is excellent in productivity (especially devitrification resistance), and matches the thermal expansion coefficient of the glass sealing material, and by creating an alkali-free glass having a high strain point, the production cost of the glass plate
- the technical problem is to secure the airtightness inside the organic EL display while reducing the cost of the glass plate and to reduce the thermal shrinkage of the glass plate in the manufacturing process of the p-Si • TFT.
- the present inventor has found that the above technical problem can be solved by strictly regulating the glass characteristics of the alkali-free glass, and proposes as the present invention. That is, the alkali-free glass of the present invention contains substantially no alkali metal oxide, has a strain point higher than 680 ° C., and has an average coefficient of thermal expansion of 40 to 60 ⁇ 10 ⁇ 7 in a temperature range of 30 to 380 ° C. The liquid phase temperature is lower than 1220 ° C.
- substantially no alkali metal oxide means that the content of alkali metal oxides (Li 2 O, Na 2 O, K 2 O) in the glass composition is 1000 ppm (mass) or less. Refers to the case.
- the strain point refers to a value measured based on the method of ASTM C336.
- the “average thermal expansion coefficient in the temperature range of 30 to 380 ° C.” can be measured with a dilatometer or the like.
- “Liquid phase temperature” is obtained by passing the standard sieve 30 mesh (500 ⁇ m) and putting the glass powder remaining in 50 mesh (300 ⁇ m) into a platinum boat, and then holding it in a temperature gradient furnace for 24 hours to precipitate crystals. It can be calculated by measuring the temperature.
- the alkali-free glass of the present invention has a glass composition of SiO 2 55 to 70%, Al 2 O 3 10 to 20%, B 2 O 3 0.1 to 4.5%, MgO as a glass composition. It contains 0 to 1%, CaO 5 to 15%, SrO 0.5 to 5% and BaO 5 to 15%.
- the alkali-free glass of the present invention is characterized in that the molar ratio SiO 2 / Al 2 O 3 is 4.5 to 8.
- the alkali-free glass of the present invention is characterized in that the molar ratio CaO / BaO is 0.5 to 10.
- the alkali-free glass of the present invention is characterized by further containing 0.001 to 1% by mass of SnO.
- the alkali-free glass of the present invention is characterized in that the temperature at 10 2.5 poise is 1660 ° C. or lower.
- the “temperature at 10 2.5 poise” can be measured by the platinum ball pulling method.
- the alkali-free glass of the present invention is characterized by having a viscosity at a liquidus temperature of 10 4.8 poise or more.
- the “viscosity at the liquidus temperature” can be measured by a platinum ball pulling method.
- the alkali-free glass of the present invention is characterized by being formed by an overflow downdraw method.
- the alkali-free glass of the present invention is characterized by being used for an organic EL device, particularly an organic EL display.
- the alkali-free glass according to the embodiment of the present invention contains substantially no alkali metal oxide, has a strain point higher than 680 ° C., and an average coefficient of thermal expansion in the temperature range of 30 to 380 ° C. of 40 to 60 ⁇ 10. -7 / ° C and the liquidus temperature is lower than 1220 ° C.
- the reason for limiting the glass properties in this way is shown below.
- the strain point is higher than 680 ° C., preferably 690 ° C. or higher, more preferably 700 ° C. or higher, and further preferably 710 ° C. or higher. In this way, thermal contraction of the glass substrate can be suppressed in the manufacturing process of the p-Si • TFT.
- the average thermal expansion coefficient in the temperature range of 30 to 380 ° C. is 40 to 60 ⁇ 10 ⁇ 7 / ° C., preferably 40 to 55 ⁇ 10 ⁇ 7 / ° C. (however, 40 ⁇ 10 ⁇ 7 / ° C.), more preferably 40 to 50 ⁇ 10 ⁇ 7 / ° C., still more preferably 40 to 48 ⁇ 10 ⁇ 7 / ° C., particularly preferably 42 to 48 ⁇ 10 ⁇ 7 / ° C., most preferably It is preferably 42 to 46 ⁇ 10 ⁇ 7 / ° C. In this way, it becomes easy to match the thermal expansion coefficient of the glass sealing material.
- the metal member (electrode or the like) is higher than the thermal expansion coefficient of the glass plate in the same manner as the glass sealing material. Therefore, from the viewpoint of preventing peeling of the metal member, it is significant to regulate the average thermal expansion coefficient in the temperature range of 30 to 380 ° C. within the above range.
- the liquidus temperature is less than 1220 ° C., preferably 1200 ° C. or less, more preferably 1190 ° C. or less, and further preferably 1180 ° C. or less. If it does in this way, it will become easy to prevent the situation where devitrification crystal occurs at the time of glass manufacture, and productivity falls. Furthermore, since it becomes easy to shape
- the liquidus temperature is an index of devitrification resistance. The lower the liquidus temperature, the better the devitrification resistance.
- the temperature at 10 2.5 poise is preferably 1660 ° C. or lower, 1650 ° C. or lower, particularly 1640 ° C. or lower.
- the temperature at 10 2.5 poise increases, glass melting becomes difficult and the production cost of the glass plate increases.
- the temperature at 10 2.5 poise corresponds to the melting temperature, and the lower this temperature, the better the meltability.
- the viscosity is 10 4.8 poise or more at the liquidus temperature, 10 5.0 poise or more, 10 5.2 poise or higher, particularly preferably at least 10 5.5 poise.
- the liquid phase viscosity is an index of moldability. The higher the liquid phase viscosity, the better the moldability.
- the alkali-free glass of the present embodiment has a glass composition in terms of mass%, SiO 2 55 to 70%, Al 2 O 3 10 to 20%, B 2 O 3 0.1 to 4.5%, MgO 0 to 1. %, CaO 5-15%, SrO 0.5-5%, BaO 5-15%.
- % display represents the mass%.
- SiO 2 is a component that forms a glass skeleton.
- the SiO 2 content is preferably 55 to 70%, 55 to 68%, particularly 58 to 65%.
- the content of SiO 2 is less than 55%, it is difficult to increase the strain point. In addition, the acid resistance decreases and the density becomes too high.
- the content of SiO 2 is more than 70%, the high-temperature viscosity is increased and the meltability is lowered, and devitrification crystals such as cristobalite are liable to precipitate, and the liquidus temperature is increased.
- Al 2 O 3 is a component that forms a glass skeleton, a component that increases the strain point, and a component that further suppresses phase separation.
- the content of Al 2 O 3 is preferably 10 to 20%, 12 to 20%, particularly preferably 14 to 20%.
- the content of Al 2 O 3 is less than 10%, the strain point is lowered and the glass is easily phase separated.
- the content of Al 2 O 3 is more than 20%, devitrification crystals such as mullite and anorthite are liable to precipitate, and the liquidus temperature becomes high.
- the molar ratio SiO 2 / Al 2 O 3 is an important component ratio in order to achieve both a high strain point and high devitrification resistance. As described above, both components have an effect of increasing the strain point. However, when the amount of SiO 2 is relatively increased, devitrification crystals such as cristobalite are likely to precipitate. On the other hand, when the amount of Al 2 O 3 is relatively large, alkaline earth aluminosilicate devitrified crystals such as mullite and anorthite are likely to precipitate. Therefore, the molar ratio SiO 2 / Al 2 O 3 is preferably 4.5 to 8, 4.5 to 7, 5.5 to 7, particularly 6 to 7.
- B 2 O 3 is a component that enhances meltability and increases devitrification resistance.
- the content of B 2 O 3 is preferably 0.1 to 4.5%, 0.1 to 4%, 0.1 to 3.5%, particularly preferably 0.1 to 3%.
- BHF resistance buffered hydrofluoric acid resistance
- MgO is a component that lowers the high temperature viscosity and increases the meltability.
- the MgO content is preferably 0 to 1%, 0 to 0.8%, 0.1 to 0.8%, particularly preferably 0.1 to 0.5%. If the content of MgO is more than 1%, the devitrification resistance tends to be lowered, and the thermal expansion coefficient becomes too low, and the difference in thermal expansion coefficient from the glass sealing material becomes too large.
- CaO is a component that lowers the high-temperature viscosity without significantly lowering the strain point and remarkably increases the meltability, and also effectively increases the thermal expansion coefficient.
- CaO is a component that lowers the raw material cost because the introduced raw material is relatively inexpensive among alkaline earth metal oxides.
- the CaO content is preferably 5 to 15%, 5 to 12%, 5 to 10%, particularly preferably 5 to 8%. When the content of CaO is less than 5%, it is difficult to enjoy the above effect. On the other hand, if the content of CaO is more than 15%, the glass tends to devitrify and the thermal expansion coefficient becomes too high.
- SrO is a component that suppresses phase separation and increases devitrification resistance. Furthermore, it is a component that lowers the high-temperature viscosity without increasing the strain point and increases the meltability, and also suppresses the rise in the liquidus temperature.
- the SrO content is preferably 0.5 to 5%, 0.5 to 4%, particularly preferably 0.5 to 3.5%. When the content of SrO is less than 0.5%, it is difficult to enjoy the effect of suppressing phase separation and the effect of improving devitrification resistance. On the other hand, when the SrO content is more than 5%, strontium silicate devitrification crystals are likely to precipitate, and devitrification resistance is likely to be lowered.
- BaO is a component that remarkably increases devitrification resistance among alkaline earth metal oxides.
- the BaO content is preferably 5 to 15%, 5 to 14%, 5 to 13%, and particularly preferably 5 to 12%.
- the content of BaO is less than 5%, the liquidus temperature becomes high and the devitrification resistance decreases.
- the content of BaO is more than 15%, the high-temperature viscosity becomes too high, and the meltability is lowered.
- devitrified crystals containing BaO are liable to precipitate and the liquidus temperature is increased.
- the molar ratio CaO / BaO is an important component ratio in order to achieve both a high strain point and high devitrification resistance and to reduce the manufacturing cost of the glass plate.
- the molar ratio CaO / BaO is preferably 0.5 to 10, 1 to 9, 1.5 to 8, 1.5 to 7, and particularly preferably 1.8 to 6.
- the molar ratio CaO / BaO is smaller than 0.5, in addition to the high temperature viscosity becoming too high, the raw material cost is likely to rise.
- the molar ratio CaO / BaO is larger than 10, the liquidus temperature becomes high, devitrification resistance is lowered, and as a result, it becomes difficult to form a glass plate.
- the following components may be added.
- the content of the other components other than the above components is preferably 10% or less, particularly 5% or less in total, from the viewpoint of accurately enjoying the effects of the present embodiment.
- SnO 2 is a component that has a good clarification action in a high temperature range, a component that increases the strain point, and a component that decreases high temperature viscosity.
- the SnO 2 content is preferably 0 to 1%, 0.001 to 1%, 0.01 to 0.5%, particularly preferably 0.05 to 0.3%. If the content of SnO 2 is more than 1%, SnO 2 devitrified crystals are likely to precipitate. Incidentally, when the content of SnO 2 is less than 0.001%, it becomes difficult to enjoy the above-mentioned effects.
- SnO 2 is suitable as a fining agent, but as long as the glass properties are not impaired, as a fining agent, 5% of metal powder such as F 2 , Cl 2 , SO 3 , C, Al or Si is used. Can be added. Further, as a fining agent, also CeO 2 or the like may be added up to 5%.
- As 2 O 3 and Sb 2 O 3 are also effective as fining agents.
- the alkali-free glass of this embodiment does not completely exclude the inclusion of these components, but it is preferable not to use these components as much as possible from an environmental viewpoint.
- As 2 O 3 tends to decrease solarization when contained in a large amount in the glass, its content is preferably 1% or less, 0.5% or less, particularly preferably 0.1% or less. It is desirable not to contain it.
- “substantially does not contain As 2 O 3 ” refers to the case where the content of As 2 O 3 in the glass composition is less than 0.05%.
- the content of Sb 2 O 3 is preferably 2% or less, 1% or less, and particularly preferably 0.5% or less, and it is desirable not to contain it substantially.
- “substantially does not contain Sb 2 O 3 ” refers to a case where the content of Sb 2 O 3 in the glass composition is less than 0.05%.
- Cl has an effect of promoting the melting of the alkali-free glass. For this reason, if Cl is added, the melting temperature can be lowered and the action of the clarifying agent can be promoted. As a result, it is possible to extend the life of the glass manufacturing kiln while reducing the melting cost. However, if the content of Cl is too large, the strain point decreases, so the Cl content is preferably 3% or less, 1% or less, and particularly preferably 0.5% or less.
- a raw material for introducing Cl a raw material such as an alkaline earth metal oxide chloride such as strontium chloride or aluminum chloride can be used as a raw material for introducing Cl.
- ZnO is a component that enhances the meltability. However, if ZnO is contained in a large amount, the glass tends to devitrify and the strain point tends to decrease.
- the content of ZnO is preferably 0 to 5%, 0 to 3%, 0 to 0.5%, particularly preferably 0 to 0.3%, and is desirably substantially not contained.
- substantially does not contain ZnO refers to a case where the content of ZnO in the glass composition is 0.2% or less.
- P 2 O 5 is a component that increases the strain point. However, if P 2 O 5 is contained in a large amount, the glass is likely to undergo phase separation.
- the content of P 2 O 5 is preferably 0 to 1.5%, 0 to 1.2%, particularly preferably 0 to 1%.
- TiO 2 is a component that lowers the viscosity at high temperature and increases the meltability, and is a component that suppresses solarization. However, if a large amount of TiO 2 is contained, the glass is colored and the transmittance tends to decrease. .
- the content of TiO 2 is preferably 0 to 5%, 0 to 3%, 0 to 1%, particularly preferably 0 to 0.02%.
- Y 2 O 3 , Nb 2 O 5 , and La 2 O 3 have a function of increasing the strain point, Young's modulus, and the like. However, if the content of these components is more than 5%, the density tends to increase.
- the alkali-free glass of this embodiment is preferably formed by the overflow down draw method.
- the overflow down draw method molten glass overflows from both sides of a heat-resistant bowl-shaped structure, and the molten glass overflows and joins at the lower end of the bowl-shaped structure to produce a glass plate by drawing downward. Is the method.
- the surface to be the surface of the glass plate is not in contact with the bowl-shaped refractory and is molded in a free surface state. For this reason, the glass plate which is unpolished and has a good surface quality can be manufactured at low cost.
- the structure and material of the bowl-shaped structure used in the overflow downdraw method are not particularly limited as long as desired dimensions and surface accuracy can be realized.
- the method of applying a force when performing downward stretch molding is not particularly limited.
- a method of rotating and stretching a heat-resistant roll having a sufficiently large width in contact with the glass plate may be adopted, or a plurality of pairs of heat-resistant rolls may be used only in the vicinity of the end face of the glass plate. You may employ
- a glass plate can be formed by, for example, a downdraw method (slot down method, etc.), a float method, or the like.
- the alkali-free glass of this embodiment is preferably used for an organic EL device, particularly an organic EL display.
- a panel manufacturer of an organic EL display manufactures a plurality of devices on a large glass plate formed by a glass manufacturer, and then cuts and cuts each device in order to reduce costs (so-called multi-surface processing). ).
- multi-surface processing the devices themselves are becoming larger, and a large glass plate is required in order to obtain a large number of these devices. Since the alkali-free glass of the present embodiment has a low liquidus temperature and a high liquidus viscosity, it can easily form a large glass substrate and satisfy such a requirement.
- Tables 1 and 2 show examples of the alkali-free glass of the present invention (sample Nos. 1 to 11) and comparative examples (samples No. 12 to 16).
- a glass batch in which glass raw materials were prepared so as to have the glass composition shown in the table was placed in a platinum crucible and melted at 1600 to 1650 ° C. for 24 hours.
- the mixture was stirred and homogenized using a platinum stirrer.
- the molten glass was poured out onto a carbon plate, formed into a plate shape, and then gradually cooled at a temperature near the annealing point for 30 minutes.
- the density is a value measured by the well-known Archimedes method.
- the average coefficient of thermal expansion CTE in the temperature range of 30 to 380 ° C. is a value measured with a dilatometer.
- strain point Ps, the annealing point Ta, and the softening point Ts are values measured based on the method of ASTM C336.
- the temperatures at high temperature viscosities of 10 4 dPa ⁇ s, 10 3 dPa ⁇ s, and 10 2.5 dPa ⁇ s are values measured by the platinum ball pulling method.
- the liquid phase temperature TL passes through a standard sieve 30 mesh (500 ⁇ m), puts the glass powder remaining in 50 mesh (300 ⁇ m) into a platinum boat, and holds it in a temperature gradient furnace for 24 hours to determine the temperature at which crystals precipitate. It is a measured value.
- the liquidus viscosity log 10 ⁇ TL is a value obtained by measuring the viscosity of the glass at the liquidus temperature TL by the platinum ball pulling method.
- Sample No. Nos. 1 to 11 do not contain an alkali metal oxide, have an average coefficient of thermal expansion CTE of 40 to 60 ⁇ 10 ⁇ 7 / ° C. in a temperature range of 30 to 380 ° C., a strain point higher than 680 ° C., and a liquidus temperature. It was 1220 ° C. or lower. Therefore, sample no. Nos. 1 to 11 are considered to be suitably usable as substrates for organic EL displays.
- sample No. Nos. 12 to 14 are inferior in moldability because of high liquidus temperature and low devitrification resistance.
- Sample No. No. 15 has a low thermal expansion coefficient, and it is difficult to match the thermal expansion coefficient of the glass sealing material.
- the alkali-free glass of the present invention is a cover glass for an image sensor such as a flat panel display substrate such as a liquid crystal display and an EL display, and a charge coupled device (CCD) and an equal magnification proximity solid-state imaging device (CIS). It can be suitably used for a substrate, a cover glass, a substrate for organic EL lighting, and the like, and can be particularly suitably used as a substrate for an organic EL display.
- a cover glass for an image sensor such as a flat panel display substrate such as a liquid crystal display and an EL display, and a charge coupled device (CCD) and an equal magnification proximity solid-state imaging device (CIS).
- CCD charge coupled device
- CIS equal magnification proximity solid-state imaging device
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Abstract
Description
(1)熱処理工程で成膜された半導体物質中にアルカリイオンが拡散する事態を防止するため、実質的にアルカリ金属酸化物を含有しないこと。
(2)ガラス板を低廉化するため、生産性に優れること。特に耐失透性や溶融性に優れること。
(3)p-Si・TFTの製造工程において、熱収縮を低減するため、歪点が高いこと。
Claims (9)
- 実質的にアルカリ金属酸化物を含有せず、歪点が680℃より高く、30~380℃の温度範囲における平均熱膨張係数が40~60×10-7/℃であり、液相温度が1220℃より低いことを特徴とする無アルカリガラス。
- ガラス組成として、質量%で、SiO2 55~70%、Al2O3 10~20%、B2O3 0.1~4.5%、MgO 0~1%、CaO 5~15%、SrO 0.5~5%、BaO 5~15%を含有することを特徴とする請求項1に記載の無アルカリガラス。
- モル比SiO2/Al2O3が4.5~8であることを特徴とする請求項1又は2に記載の無アルカリガラス。
- モル比CaO/BaOが0.5~10であることを特徴とする請求項1~3のいずれか1項に記載の無アルカリガラス。
- 更に、SnOを0.001~1質量%含むことを特徴とする請求項1~4のいずれかに1項に記載の無アルカリガラス。
- 102.5ポアズにおける温度が1660℃以下であることを特徴とする請求項1~5のいずれか1項に記載の無アルカリガラス。
- 液相温度における粘度が104.8ポアズ以上であることを特徴とする請求項1~6のいずれか1項に記載の無アルカリガラス。
- オーバーフローダウンドロー法で成形されてなることを特徴とする請求項1~7のいずれか1項に記載の無アルカリガラス。
- 有機ELデバイスに用いることを特徴とする請求項1~8のいずれか1項に記載の無アルカリガラス。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP11818112.2A EP2607326B1 (en) | 2010-08-17 | 2011-08-10 | Alkali-free glass |
CN201180039911.XA CN103068758B (zh) | 2010-08-17 | 2011-08-10 | 无碱玻璃 |
US13/817,196 US9023744B2 (en) | 2010-08-17 | 2011-08-10 | Alkali-free glass |
KR1020137004364A KR101779033B1 (ko) | 2010-08-17 | 2011-08-10 | 무알칼리 유리 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010-182068 | 2010-08-17 | ||
JP2010182068A JP5751439B2 (ja) | 2010-08-17 | 2010-08-17 | 無アルカリガラス |
Publications (1)
Publication Number | Publication Date |
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PCT/JP2011/068252 WO2012023470A1 (ja) | 2010-08-17 | 2011-08-10 | 無アルカリガラス |
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US (1) | US9023744B2 (ja) |
EP (1) | EP2607326B1 (ja) |
JP (1) | JP5751439B2 (ja) |
KR (1) | KR101779033B1 (ja) |
CN (1) | CN103068758B (ja) |
TW (1) | TWI593653B (ja) |
WO (1) | WO2012023470A1 (ja) |
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CN105502929A (zh) * | 2012-12-28 | 2016-04-20 | 安瀚视特控股株式会社 | 显示器用玻璃基板及其制造方法 |
JP2016524583A (ja) * | 2013-05-10 | 2016-08-18 | コーニング インコーポレイテッド | 低融点ガラス又は吸収薄膜を使用した透明ガラスシートのレーザー溶接 |
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TWI570086B (zh) * | 2010-11-08 | 2017-02-11 | 日本電氣硝子股份有限公司 | 無鹼玻璃 |
JP5680125B2 (ja) * | 2012-04-11 | 2015-03-04 | AvanStrate株式会社 | ガラス板の製造方法 |
JP5651634B2 (ja) * | 2012-04-11 | 2015-01-14 | AvanStrate株式会社 | ガラス板の製造方法 |
CN104350018B (zh) | 2012-06-07 | 2018-10-19 | Agc 株式会社 | 无碱玻璃及使用了该无碱玻璃的无碱玻璃板 |
WO2014087971A1 (ja) | 2012-12-05 | 2014-06-12 | 旭硝子株式会社 | 無アルカリガラス基板 |
JP6037117B2 (ja) * | 2012-12-14 | 2016-11-30 | 日本電気硝子株式会社 | ガラス及びガラス基板 |
JP6365826B2 (ja) * | 2013-07-11 | 2018-08-01 | 日本電気硝子株式会社 | ガラス |
CN105555725B (zh) * | 2013-09-20 | 2020-04-14 | Agc株式会社 | 无碱玻璃 |
JP6256744B2 (ja) * | 2013-10-17 | 2018-01-10 | 日本電気硝子株式会社 | 無アルカリガラス板 |
CN116040940A (zh) * | 2015-04-03 | 2023-05-02 | 日本电气硝子株式会社 | 玻璃 |
EP3303236B1 (en) | 2015-06-02 | 2021-09-29 | Corning Incorporated | Laminated glass article with tinted layer |
CN109071317A (zh) | 2016-04-27 | 2018-12-21 | Agc株式会社 | 无碱玻璃 |
TWI822657B (zh) | 2016-05-04 | 2023-11-21 | 美商康寧公司 | 有色的鋁矽酸鹽玻璃成分和包括其之玻璃製品 |
JP7044064B2 (ja) * | 2016-08-05 | 2022-03-30 | Agc株式会社 | 無アルカリガラス基板、積層基板、およびガラス基板の製造方法 |
US11066326B2 (en) | 2016-12-20 | 2021-07-20 | Nippon Electric Glass Co., Ltd. | Glass |
KR102526728B1 (ko) * | 2016-12-29 | 2023-04-27 | 코닝 인코포레이티드 | 솔라리제이션 저항성의 희토류 도핑된 유리들 |
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- 2011-08-10 US US13/817,196 patent/US9023744B2/en not_active Expired - Fee Related
- 2011-08-10 WO PCT/JP2011/068252 patent/WO2012023470A1/ja active Application Filing
- 2011-08-10 KR KR1020137004364A patent/KR101779033B1/ko active IP Right Grant
- 2011-08-10 EP EP11818112.2A patent/EP2607326B1/en active Active
- 2011-08-15 TW TW100129090A patent/TWI593653B/zh active
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Cited By (5)
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CN105502929A (zh) * | 2012-12-28 | 2016-04-20 | 安瀚视特控股株式会社 | 显示器用玻璃基板及其制造方法 |
CN105502929B (zh) * | 2012-12-28 | 2019-08-09 | 安瀚视特控股株式会社 | 显示器用玻璃基板及其制造方法 |
JP2016524583A (ja) * | 2013-05-10 | 2016-08-18 | コーニング インコーポレイテッド | 低融点ガラス又は吸収薄膜を使用した透明ガラスシートのレーザー溶接 |
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Also Published As
Publication number | Publication date |
---|---|
US9023744B2 (en) | 2015-05-05 |
KR101779033B1 (ko) | 2017-09-18 |
EP2607326B1 (en) | 2018-03-07 |
TWI593653B (zh) | 2017-08-01 |
EP2607326A4 (en) | 2014-10-08 |
CN103068758B (zh) | 2017-06-13 |
KR20140000197A (ko) | 2014-01-02 |
TW201219332A (en) | 2012-05-16 |
CN103068758A (zh) | 2013-04-24 |
EP2607326A1 (en) | 2013-06-26 |
JP5751439B2 (ja) | 2015-07-22 |
JP2012041217A (ja) | 2012-03-01 |
US20130244859A1 (en) | 2013-09-19 |
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