WO2009011148A1 - 圧電薄膜共振素子及びこれを用いた回路部品 - Google Patents
圧電薄膜共振素子及びこれを用いた回路部品 Download PDFInfo
- Publication number
- WO2009011148A1 WO2009011148A1 PCT/JP2008/053920 JP2008053920W WO2009011148A1 WO 2009011148 A1 WO2009011148 A1 WO 2009011148A1 JP 2008053920 W JP2008053920 W JP 2008053920W WO 2009011148 A1 WO2009011148 A1 WO 2009011148A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- surface electrode
- thin film
- piezoelectric thin
- resonant element
- same
- Prior art date
Links
- 239000010409 thin film Substances 0.000 title abstract 2
- 239000010408 film Substances 0.000 abstract 2
- 239000005001 laminate film Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
- H03H9/171—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator implemented with thin-film techniques, i.e. of the film bulk acoustic resonator [FBAR] type
- H03H9/172—Means for mounting on a substrate, i.e. means constituting the material interface confining the waves to a volume
- H03H9/174—Membranes
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02007—Details of bulk acoustic wave devices
- H03H9/02015—Characteristics of piezoelectric layers, e.g. cutting angles
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02007—Details of bulk acoustic wave devices
- H03H9/02086—Means for compensation or elimination of undesirable effects
- H03H9/02118—Means for compensation or elimination of undesirable effects of lateral leakage between adjacent resonators
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02007—Details of bulk acoustic wave devices
- H03H9/02157—Dimensional parameters, e.g. ratio between two dimension parameters, length, width or thickness
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/13—Driving means, e.g. electrodes, coils for networks consisting of piezoelectric or electrostrictive materials
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/13—Driving means, e.g. electrodes, coils for networks consisting of piezoelectric or electrostrictive materials
- H03H9/132—Driving means, e.g. electrodes, coils for networks consisting of piezoelectric or electrostrictive materials characterized by a particular shape
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
- H03H9/171—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator implemented with thin-film techniques, i.e. of the film bulk acoustic resonator [FBAR] type
- H03H9/172—Means for mounting on a substrate, i.e. means constituting the material interface confining the waves to a volume
- H03H9/175—Acoustic mirrors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/46—Filters
- H03H9/54—Filters comprising resonators of piezo-electric or electrostrictive material
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/46—Filters
- H03H9/54—Filters comprising resonators of piezo-electric or electrostrictive material
- H03H9/56—Monolithic crystal filters
- H03H9/566—Electric coupling means therefor
- H03H9/568—Electric coupling means therefor consisting of a ladder configuration
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
- H03H3/04—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks for obtaining desired frequency or temperature coefficient
- H03H2003/0414—Resonance frequency
- H03H2003/0421—Modification of the thickness of an element
- H03H2003/0428—Modification of the thickness of an element of an electrode
Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020097026922A KR101242314B1 (ko) | 2007-07-13 | 2008-03-05 | 압전 박막 공진 소자 및 이를 이용한 회로 부품 |
JP2009523557A JP5009369B2 (ja) | 2007-07-13 | 2008-03-05 | 圧電薄膜共振素子及びこれを用いた回路部品 |
CN2008800232853A CN101689845B (zh) | 2007-07-13 | 2008-03-05 | 压电薄膜共振元件以及利用它的电路部件 |
US12/642,048 US8125123B2 (en) | 2007-07-13 | 2009-12-18 | Piezoelectric thin film resonant element and circuit component using the same |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/064015 WO2009011022A1 (ja) | 2007-07-13 | 2007-07-13 | 圧電薄膜共振素子及びこれを用いた回路部品 |
JPPCT/JP2007/064015 | 2007-07-13 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/642,048 Continuation US8125123B2 (en) | 2007-07-13 | 2009-12-18 | Piezoelectric thin film resonant element and circuit component using the same |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2009011148A1 true WO2009011148A1 (ja) | 2009-01-22 |
Family
ID=40259371
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/064015 WO2009011022A1 (ja) | 2007-07-13 | 2007-07-13 | 圧電薄膜共振素子及びこれを用いた回路部品 |
PCT/JP2008/053920 WO2009011148A1 (ja) | 2007-07-13 | 2008-03-05 | 圧電薄膜共振素子及びこれを用いた回路部品 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/064015 WO2009011022A1 (ja) | 2007-07-13 | 2007-07-13 | 圧電薄膜共振素子及びこれを用いた回路部品 |
Country Status (4)
Country | Link |
---|---|
US (1) | US8125123B2 (ja) |
KR (1) | KR101242314B1 (ja) |
CN (1) | CN101689845B (ja) |
WO (2) | WO2009011022A1 (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9071224B2 (en) | 2011-12-12 | 2015-06-30 | Taiyo Yuden Co., Ltd. | Filter and duplexer |
JP2018037906A (ja) * | 2016-08-31 | 2018-03-08 | 太陽誘電株式会社 | 圧電薄膜共振器、フィルタおよびマルチプレクサ。 |
US10615776B2 (en) | 2017-07-03 | 2020-04-07 | Taiyo Yuden Co., Ltd. | Piezoelectric thin film resonator, filter, and multiplexer |
JP2020202413A (ja) * | 2019-06-05 | 2020-12-17 | 太陽誘電株式会社 | 圧電薄膜共振器、フィルタおよびマルチプレクサ |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5563739B2 (ja) * | 2008-02-20 | 2014-07-30 | 太陽誘電株式会社 | 圧電薄膜共振器、フィルタ、デュープレクサ、通信モジュール、および通信装置 |
US8830012B2 (en) * | 2010-09-07 | 2014-09-09 | Wei Pang | Composite bulk acoustic wave resonator |
JP5792554B2 (ja) * | 2011-08-09 | 2015-10-14 | 太陽誘電株式会社 | 弾性波デバイス |
KR101856060B1 (ko) | 2011-12-01 | 2018-05-10 | 삼성전자주식회사 | 체적 음향 공진기 |
US9331666B2 (en) | 2012-10-22 | 2016-05-03 | Qualcomm Mems Technologies, Inc. | Composite dilation mode resonators |
KR101918031B1 (ko) | 2013-01-22 | 2018-11-13 | 삼성전자주식회사 | 스퓨리어스 공진을 감소시키는 공진기 및 공진기 제작 방법 |
JP6336712B2 (ja) * | 2013-01-28 | 2018-06-06 | 太陽誘電株式会社 | 圧電薄膜共振器、フィルタおよびデュプレクサ |
JP6185292B2 (ja) * | 2013-06-10 | 2017-08-23 | 太陽誘電株式会社 | 弾性波デバイス |
KR20150023086A (ko) * | 2013-08-22 | 2015-03-05 | (주)와이솔 | 압전 소자 기반 진동 모듈 |
JP6333540B2 (ja) * | 2013-11-11 | 2018-05-30 | 太陽誘電株式会社 | 圧電薄膜共振子、フィルタ、及び分波器 |
JP6325799B2 (ja) | 2013-11-11 | 2018-05-16 | 太陽誘電株式会社 | 圧電薄膜共振器、フィルタおよびデュプレクサ |
JP6325798B2 (ja) | 2013-11-11 | 2018-05-16 | 太陽誘電株式会社 | 圧電薄膜共振器、フィルタおよびデュプレクサ |
CN105428520A (zh) * | 2015-11-09 | 2016-03-23 | 业成光电(深圳)有限公司 | 压电元件的制造方法及压电基板 |
US10778180B2 (en) * | 2015-12-10 | 2020-09-15 | Qorvo Us, Inc. | Bulk acoustic wave resonator with a modified outside stack portion |
KR102642910B1 (ko) * | 2016-05-18 | 2024-03-04 | 삼성전기주식회사 | 음향 공진기 및 그 제조 방법 |
KR20180018149A (ko) * | 2016-08-12 | 2018-02-21 | 삼성전기주식회사 | 체적 음향 공진기 |
US10903814B2 (en) * | 2016-11-30 | 2021-01-26 | Samsung Electro-Mechanics Co., Ltd. | Bulk acoustic wave resonator |
US10873316B2 (en) * | 2017-03-02 | 2020-12-22 | Samsung Electro-Mechanics Co., Ltd. | Acoustic resonator and method of manufacturing the same |
US10256788B2 (en) * | 2017-03-31 | 2019-04-09 | Avago Technologies International Sales Pte. Limited | Acoustic resonator including extended cavity |
WO2019141073A1 (zh) | 2018-01-19 | 2019-07-25 | 武汉衍熙微器件有限公司 | 一种薄膜体声波谐振器 |
US10892730B2 (en) | 2018-05-30 | 2021-01-12 | Vanguard International Semiconductor Singapore Pte. Ltd. | Acoustic filter with packaging-defined boundary conditions and method for producing the same |
WO2020203093A1 (ja) * | 2019-03-29 | 2020-10-08 | 株式会社村田製作所 | 弾性波装置 |
CN111130492B (zh) * | 2019-12-31 | 2021-06-01 | 诺思(天津)微系统有限责任公司 | 悬翼结构具有角部的体声波谐振器、滤波器及电子设备 |
US11381230B2 (en) * | 2020-09-04 | 2022-07-05 | Northeastern University | Microelectromechanical tunable delay line circuit |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030141946A1 (en) * | 2002-01-31 | 2003-07-31 | Ruby Richard C. | Film bulk acoustic resonator (FBAR) and the method of making the same |
JP2005073175A (ja) * | 2003-08-27 | 2005-03-17 | Fujitsu Media Device Kk | 圧電薄膜共振子及びその製造方法 |
US20050269904A1 (en) * | 2004-06-03 | 2005-12-08 | Shuichi Oka | Thin film bulk acoustic resonator and method of manufacturing the same |
JP2006050021A (ja) * | 2004-07-30 | 2006-02-16 | Toshiba Corp | 薄膜圧電共振器及びその製造方法 |
JP2007110281A (ja) * | 2005-10-12 | 2007-04-26 | Ube Ind Ltd | 窒化アルミニウム薄膜およびそれを用いた圧電薄膜共振子 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE69739289D1 (de) * | 1996-10-17 | 2009-04-16 | Avago Technologies Wireless Ip | Chtoberflächenwellenresonatoren |
FI107660B (fi) * | 1999-07-19 | 2001-09-14 | Nokia Mobile Phones Ltd | Resonaattorirakenne |
JP2001251159A (ja) * | 2000-03-08 | 2001-09-14 | Mitsubishi Electric Corp | 薄膜圧電素子及びその製造方法 |
JP2005045694A (ja) | 2003-07-25 | 2005-02-17 | Sony Corp | 薄膜バルク音響共振子およびその製造方法 |
JP4028468B2 (ja) | 2003-09-29 | 2007-12-26 | 株式会社東芝 | 薄膜圧電共振器 |
JP4280198B2 (ja) * | 2004-04-30 | 2009-06-17 | 株式会社東芝 | 薄膜圧電共振器 |
US7161448B2 (en) * | 2004-06-14 | 2007-01-09 | Avago Technologies Wireless Ip (Singapore) Pte. Ltd. | Acoustic resonator performance enhancements using recessed region |
DE102004042167B4 (de) * | 2004-08-31 | 2009-04-02 | Advanced Micro Devices, Inc., Sunnyvale | Verfahren zum Ausbilden einer Halbleiterstruktur, die Transistorelemente mit unterschiedlich verspannten Kanalgebieten umfasst, und entsprechende Halbleiterstruktur |
JP4432972B2 (ja) * | 2004-09-10 | 2010-03-17 | 株式会社村田製作所 | 圧電薄膜共振子 |
TWI365603B (en) | 2004-10-01 | 2012-06-01 | Avago Technologies Wireless Ip | A thin film bulk acoustic resonator with a mass loaded perimeter |
US7280007B2 (en) * | 2004-11-15 | 2007-10-09 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Thin film bulk acoustic resonator with a mass loaded perimeter |
JP4535841B2 (ja) | 2004-10-28 | 2010-09-01 | 富士通メディアデバイス株式会社 | 圧電薄膜共振子及びこれを用いたフィルタ |
JP4373936B2 (ja) * | 2005-02-02 | 2009-11-25 | 株式会社東芝 | 薄膜圧電共振器及びその製造方法 |
JP4435049B2 (ja) * | 2005-08-08 | 2010-03-17 | 株式会社東芝 | 薄膜圧電共振器及びその製造方法 |
JP2007295280A (ja) * | 2006-04-25 | 2007-11-08 | Toshiba Corp | 電子素子 |
JP4252584B2 (ja) * | 2006-04-28 | 2009-04-08 | 富士通メディアデバイス株式会社 | 圧電薄膜共振器およびフィルタ |
JP2008109402A (ja) * | 2006-10-25 | 2008-05-08 | Toshiba Corp | 薄膜圧電共振器およびその製造方法 |
JP2008135648A (ja) * | 2006-11-29 | 2008-06-12 | Toshiba Corp | 半導体装置及び半導体装置の製造方法 |
-
2007
- 2007-07-13 WO PCT/JP2007/064015 patent/WO2009011022A1/ja active Application Filing
-
2008
- 2008-03-05 KR KR1020097026922A patent/KR101242314B1/ko active IP Right Grant
- 2008-03-05 WO PCT/JP2008/053920 patent/WO2009011148A1/ja active Application Filing
- 2008-03-05 CN CN2008800232853A patent/CN101689845B/zh active Active
-
2009
- 2009-12-18 US US12/642,048 patent/US8125123B2/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030141946A1 (en) * | 2002-01-31 | 2003-07-31 | Ruby Richard C. | Film bulk acoustic resonator (FBAR) and the method of making the same |
JP2005073175A (ja) * | 2003-08-27 | 2005-03-17 | Fujitsu Media Device Kk | 圧電薄膜共振子及びその製造方法 |
US20050269904A1 (en) * | 2004-06-03 | 2005-12-08 | Shuichi Oka | Thin film bulk acoustic resonator and method of manufacturing the same |
JP2006050021A (ja) * | 2004-07-30 | 2006-02-16 | Toshiba Corp | 薄膜圧電共振器及びその製造方法 |
JP2007110281A (ja) * | 2005-10-12 | 2007-04-26 | Ube Ind Ltd | 窒化アルミニウム薄膜およびそれを用いた圧電薄膜共振子 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9071224B2 (en) | 2011-12-12 | 2015-06-30 | Taiyo Yuden Co., Ltd. | Filter and duplexer |
JP2018037906A (ja) * | 2016-08-31 | 2018-03-08 | 太陽誘電株式会社 | 圧電薄膜共振器、フィルタおよびマルチプレクサ。 |
US10615776B2 (en) | 2017-07-03 | 2020-04-07 | Taiyo Yuden Co., Ltd. | Piezoelectric thin film resonator, filter, and multiplexer |
JP2020202413A (ja) * | 2019-06-05 | 2020-12-17 | 太陽誘電株式会社 | 圧電薄膜共振器、フィルタおよびマルチプレクサ |
JP7383404B2 (ja) | 2019-06-05 | 2023-11-20 | 太陽誘電株式会社 | 圧電薄膜共振器、フィルタおよびマルチプレクサ |
Also Published As
Publication number | Publication date |
---|---|
US8125123B2 (en) | 2012-02-28 |
KR101242314B1 (ko) | 2013-03-12 |
WO2009011022A1 (ja) | 2009-01-22 |
CN101689845B (zh) | 2013-01-23 |
KR20100023892A (ko) | 2010-03-04 |
US20100148636A1 (en) | 2010-06-17 |
CN101689845A (zh) | 2010-03-31 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2009011148A1 (ja) | 圧電薄膜共振素子及びこれを用いた回路部品 | |
ATE504975T1 (de) | Piezoelektrischer resonator, piezoelektrischer filter und kommunikationsvorrichtung | |
WO2009028316A1 (ja) | 圧電フィルムセンサ | |
WO2009050881A1 (ja) | 超音波探触子 | |
TW200644049A (en) | Film bulk acoustic resonator and filter circuit | |
EP1653612A3 (en) | Piezoelectric thin-film resonator and filter using the same | |
WO2008090651A1 (ja) | 圧電共振子及び圧電フィルタ | |
WO2005019785A3 (en) | Capacitive sensor | |
WO2008102577A1 (ja) | 弾性表面波センサー装置 | |
EP1850478A3 (en) | Piezoelectric thin-film resonator and filter using the same | |
WO2009075088A1 (ja) | 表面波装置及びデュプレクサ | |
TW200746630A (en) | Piezoelectric resonator and method for manufacturing thereof | |
WO2008093873A1 (ja) | ZnO系半導体素子 | |
WO2006004198A3 (en) | Liquid sensor and liquid container including the sensor | |
WO2006046545B1 (ja) | 弾性表面波素子及び通信装置 | |
JP2006189853A5 (ja) | ||
EP1753039A4 (en) | MULTILAYER PIEZOELECTRIC ELEMENT AND MANUFACTURING METHOD THEREFOR | |
WO2009028027A1 (ja) | 圧電薄膜共振子、それを用いたフィルタ、そのフィルタを用いたデュプレクサおよびそのフィルタまたはそのデュプレクサを用いた通信機 | |
WO2009057489A1 (ja) | 積層型圧電素子、これを備えた噴射装置及び燃料噴射システム | |
EP1689080A3 (en) | Film bulk acoustic resonator and a method for manufacturing the same | |
TW200640779A (en) | Micro movable device and method of making the same using wet etching | |
HK1093097A1 (en) | Angular speed measuring transducer | |
EP1708289A3 (en) | Piezoelectric film laminate and method of manufacturing the same, surface acoustic wave device, frequency filter, oscillator, electronic circuit, and electronic instrument | |
CN105917202A (zh) | 压电传感器 | |
EP1523097A3 (en) | Air-gap type FBAR, method for fabricating the same, and filter and duplexer using the same |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
WWE | Wipo information: entry into national phase |
Ref document number: 200880023285.3 Country of ref document: CN |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 08721340 Country of ref document: EP Kind code of ref document: A1 |
|
WWE | Wipo information: entry into national phase |
Ref document number: 2009523557 Country of ref document: JP |
|
ENP | Entry into the national phase |
Ref document number: 20097026922 Country of ref document: KR Kind code of ref document: A |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 08721340 Country of ref document: EP Kind code of ref document: A1 |