WO2008123144A1 - 磁気センサ及びその感度測定方法 - Google Patents
磁気センサ及びその感度測定方法 Download PDFInfo
- Publication number
- WO2008123144A1 WO2008123144A1 PCT/JP2008/055282 JP2008055282W WO2008123144A1 WO 2008123144 A1 WO2008123144 A1 WO 2008123144A1 JP 2008055282 W JP2008055282 W JP 2008055282W WO 2008123144 A1 WO2008123144 A1 WO 2008123144A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- sensitivity
- section
- magnetic
- magneto
- field strength
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/0206—Three-component magnetometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Measuring Magnetic Variables (AREA)
- Hall/Mr Elements (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/532,518 US9116195B2 (en) | 2007-03-23 | 2008-03-21 | Magnetic sensor and sensitivity measuring method thereof |
EP08722634.6A EP2131205B1 (en) | 2007-03-23 | 2008-03-21 | Magnetic sensor and its sensitivity measuring method |
JP2009509077A JP5027217B2 (ja) | 2007-03-23 | 2008-03-21 | 磁気センサ及びその感度測定方法 |
CN2008800095678A CN101641609B (zh) | 2007-03-23 | 2008-03-21 | 磁传感器及其灵敏度测量方法 |
KR1020097017514A KR101124025B1 (ko) | 2007-03-23 | 2008-03-21 | 자기 센서 및 그 감도 측정 방법 |
US14/798,620 US20150316638A1 (en) | 2007-03-23 | 2015-07-14 | Magnetic sensor and sensitivity measuring method thereof |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007077742 | 2007-03-23 | ||
JP2007-077742 | 2007-03-23 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/532,518 A-371-Of-International US9116195B2 (en) | 2007-03-23 | 2008-03-21 | Magnetic sensor and sensitivity measuring method thereof |
US14/798,620 Continuation US20150316638A1 (en) | 2007-03-23 | 2015-07-14 | Magnetic sensor and sensitivity measuring method thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008123144A1 true WO2008123144A1 (ja) | 2008-10-16 |
Family
ID=39830641
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/055282 WO2008123144A1 (ja) | 2007-03-23 | 2008-03-21 | 磁気センサ及びその感度測定方法 |
Country Status (6)
Country | Link |
---|---|
US (2) | US9116195B2 (ja) |
EP (1) | EP2131205B1 (ja) |
JP (3) | JP5027217B2 (ja) |
KR (1) | KR101124025B1 (ja) |
CN (3) | CN105589050B (ja) |
WO (1) | WO2008123144A1 (ja) |
Cited By (18)
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JP2012013705A (ja) * | 2010-07-05 | 2012-01-19 | Melexis Tessenderlo N.V. | 磁気角度センサ |
JP2012047708A (ja) * | 2010-08-30 | 2012-03-08 | Asahi Kasei Electronics Co Ltd | 磁気センサ |
JP2012220382A (ja) * | 2011-04-11 | 2012-11-12 | Toyohashi Univ Of Technology | 磁性金属異物を検出する方法およびそのための装置 |
JP2013500469A (ja) * | 2009-07-22 | 2013-01-07 | アレグロ・マイクロシステムズ・インコーポレーテッド | 磁界センサの診断動作モードを生成するための回路および方法 |
JP2015169517A (ja) * | 2014-03-06 | 2015-09-28 | 旭化成エレクトロニクス株式会社 | 磁気検出装置、電流センサ及び磁気検出方法 |
JP2015194450A (ja) * | 2014-03-31 | 2015-11-05 | 旭化成エレクトロニクス株式会社 | ホール起電力信号処理装置、電流センサ及びホール起電力信号処理方法 |
US9201122B2 (en) | 2012-02-16 | 2015-12-01 | Allegro Microsystems, Llc | Circuits and methods using adjustable feedback for self-calibrating or self-testing a magnetic field sensor with an adjustable time constant |
US9638764B2 (en) | 2015-04-08 | 2017-05-02 | Allegro Microsystems, Llc | Electronic circuit for driving a hall effect element with a current compensated for substrate stress |
US9645220B2 (en) | 2014-04-17 | 2017-05-09 | Allegro Microsystems, Llc | Circuits and methods for self-calibrating or self-testing a magnetic field sensor using phase discrimination |
US9735773B2 (en) | 2014-04-29 | 2017-08-15 | Allegro Microsystems, Llc | Systems and methods for sensing current through a low-side field effect transistor |
WO2018016510A1 (ja) * | 2016-07-22 | 2018-01-25 | 旭化成エレクトロニクス株式会社 | 電流センサ |
US10107873B2 (en) | 2016-03-10 | 2018-10-23 | Allegro Microsystems, Llc | Electronic circuit for compensating a sensitivity drift of a hall effect element due to stress |
US10162017B2 (en) | 2016-07-12 | 2018-12-25 | Allegro Microsystems, Llc | Systems and methods for reducing high order hall plate sensitivity temperature coefficients |
JP2019036581A (ja) * | 2017-08-10 | 2019-03-07 | 株式会社東栄科学産業 | 電磁石 |
JP2019149552A (ja) * | 2013-12-26 | 2019-09-05 | アレグロ・マイクロシステムズ・エルエルシー | センサ診断のための方法および装置 |
US10520559B2 (en) | 2017-08-14 | 2019-12-31 | Allegro Microsystems, Llc | Arrangements for Hall effect elements and vertical epi resistors upon a substrate |
JP2020060457A (ja) * | 2018-10-11 | 2020-04-16 | Tdk株式会社 | 磁気センサ装置 |
JP2020094883A (ja) * | 2018-12-12 | 2020-06-18 | Tdk株式会社 | 磁気センサ装置 |
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JP5027217B2 (ja) | 2007-03-23 | 2012-09-19 | 旭化成エレクトロニクス株式会社 | 磁気センサ及びその感度測定方法 |
US9222992B2 (en) | 2008-12-18 | 2015-12-29 | Infineon Technologies Ag | Magnetic field current sensors |
US8717016B2 (en) | 2010-02-24 | 2014-05-06 | Infineon Technologies Ag | Current sensors and methods |
US8760149B2 (en) | 2010-04-08 | 2014-06-24 | Infineon Technologies Ag | Magnetic field current sensors |
DE102010028390B4 (de) * | 2010-04-29 | 2012-12-06 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren zur Bestimmung eines Erregerleiterabstandes von einem Magnetfeldsensor, Verfahren zum Kalibrieren des Magnetfeldsensors sowie ein kalibrierbarer Magnetfeldsensor und Verwendung einer Erregerleiterstruktur zur Bestimmung eines Erregerleiterabstandes |
US8680843B2 (en) * | 2010-06-10 | 2014-03-25 | Infineon Technologies Ag | Magnetic field current sensors |
US8283742B2 (en) | 2010-08-31 | 2012-10-09 | Infineon Technologies, A.G. | Thin-wafer current sensors |
US8669761B2 (en) * | 2010-12-15 | 2014-03-11 | Nxp B.V. | Stray-field sensor circuit and method |
US8975889B2 (en) | 2011-01-24 | 2015-03-10 | Infineon Technologies Ag | Current difference sensors, systems and methods |
US8963536B2 (en) | 2011-04-14 | 2015-02-24 | Infineon Technologies Ag | Current sensors, systems and methods for sensing current in a conductor |
US8890518B2 (en) * | 2011-06-08 | 2014-11-18 | Allegro Microsystems, Llc | Arrangements for self-testing a circular vertical hall (CVH) sensing element and/or for self-testing a magnetic field sensor that uses a circular vertical hall (CVH) sensing element |
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TWI457583B (zh) * | 2012-11-02 | 2014-10-21 | Univ Nat Kaohsiung Applied Sci | Three - axis magnetic field sensing device with magnetic flux guide |
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JP2015075465A (ja) * | 2013-10-11 | 2015-04-20 | 旭化成エレクトロニクス株式会社 | 3次元磁界測定装置及び3次元磁界測定方法 |
CN103616649A (zh) * | 2013-12-02 | 2014-03-05 | 暨南大学 | 基于光纤光栅激光器的磁场传感器灵敏度调谐方法 |
JP2016017830A (ja) * | 2014-07-08 | 2016-02-01 | 旭化成エレクトロニクス株式会社 | 磁気センサ |
US9678169B2 (en) * | 2014-07-09 | 2017-06-13 | Voltafield Technology Corp. | Testing assembly for testing magnetic sensor and method for testing magnetic sensor |
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US9523745B2 (en) * | 2015-02-19 | 2016-12-20 | Sii Semiconductor Corporation | Magnetic sensor and method of manufacturing the same |
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Cited By (26)
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JP2013500469A (ja) * | 2009-07-22 | 2013-01-07 | アレグロ・マイクロシステムズ・インコーポレーテッド | 磁界センサの診断動作モードを生成するための回路および方法 |
JP2012013705A (ja) * | 2010-07-05 | 2012-01-19 | Melexis Tessenderlo N.V. | 磁気角度センサ |
JP2012047708A (ja) * | 2010-08-30 | 2012-03-08 | Asahi Kasei Electronics Co Ltd | 磁気センサ |
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Also Published As
Publication number | Publication date |
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EP2131205A4 (en) | 2013-08-28 |
CN103257325A (zh) | 2013-08-21 |
JPWO2008123144A1 (ja) | 2010-07-15 |
CN105589050B (zh) | 2019-08-20 |
CN101641609A (zh) | 2010-02-03 |
EP2131205B1 (en) | 2018-05-02 |
CN101641609B (zh) | 2013-06-05 |
CN105589050A (zh) | 2016-05-18 |
JP5616399B2 (ja) | 2014-10-29 |
JP2012215579A (ja) | 2012-11-08 |
US9116195B2 (en) | 2015-08-25 |
US20100117638A1 (en) | 2010-05-13 |
KR20090107546A (ko) | 2009-10-13 |
US20150316638A1 (en) | 2015-11-05 |
EP2131205A1 (en) | 2009-12-09 |
KR101124025B1 (ko) | 2012-03-27 |
JP6033801B2 (ja) | 2016-11-30 |
JP2014098713A (ja) | 2014-05-29 |
JP5027217B2 (ja) | 2012-09-19 |
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