WO2006112051A1 - 加速度センサ - Google Patents
加速度センサ Download PDFInfo
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- WO2006112051A1 WO2006112051A1 PCT/JP2005/016542 JP2005016542W WO2006112051A1 WO 2006112051 A1 WO2006112051 A1 WO 2006112051A1 JP 2005016542 W JP2005016542 W JP 2005016542W WO 2006112051 A1 WO2006112051 A1 WO 2006112051A1
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- axis direction
- acceleration
- support
- piezoresistive
- width
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- 230000001133 acceleration Effects 0.000 title claims abstract description 260
- 238000006073 displacement reaction Methods 0.000 claims abstract description 23
- 238000001514 detection method Methods 0.000 claims description 70
- 239000000758 substrate Substances 0.000 claims description 10
- 238000007667 floating Methods 0.000 claims description 9
- 230000002787 reinforcement Effects 0.000 claims description 3
- 238000005452 bending Methods 0.000 abstract description 11
- 230000035882 stress Effects 0.000 description 67
- 238000010586 diagram Methods 0.000 description 29
- 230000003014 reinforcing effect Effects 0.000 description 12
- 230000015572 biosynthetic process Effects 0.000 description 7
- 230000008646 thermal stress Effects 0.000 description 7
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 6
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 6
- 229910052796 boron Inorganic materials 0.000 description 6
- 229910052698 phosphorus Inorganic materials 0.000 description 6
- 239000011574 phosphorus Substances 0.000 description 6
- 230000005484 gravity Effects 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 238000002474 experimental method Methods 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005489 elastic deformation Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000005459 micromachining Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/09—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by piezoelectric pick-up
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/0802—Details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/12—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by alteration of electrical resistance
- G01P15/123—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by alteration of electrical resistance by piezo-resistive elements, e.g. semiconductor strain gauges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/18—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration in two or more dimensions
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P2015/0805—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
- G01P2015/0822—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass
- G01P2015/0825—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass for one single degree of freedom of movement of the mass
- G01P2015/0831—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass for one single degree of freedom of movement of the mass the mass being of the paddle type having the pivot axis between the longitudinal ends of the mass, e.g. see-saw configuration
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P2015/0805—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
- G01P2015/0822—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass
- G01P2015/084—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass the mass being suspended at more than one of its sides, e.g. membrane-type suspension, so as to permit multi-axis movement of the mass
- G01P2015/0842—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass the mass being suspended at more than one of its sides, e.g. membrane-type suspension, so as to permit multi-axis movement of the mass the mass being of clover leaf shape
Definitions
- the present invention relates to an acceleration sensor capable of detecting accelerations in three axial directions, ie, an X-axis direction, a Y-axis direction, and a Z-axis direction, which are orthogonal to each other.
- FIG. 15a shows an example of an acceleration sensor in a schematic perspective view (see, for example, Patent Document 1).
- the acceleration sensor 40 includes a frame portion 41, a cylindrical weight body 42 disposed in the center of the frame portion 41, and both side forces in the X-axis direction of the weight body 42, respectively.
- X-axis direction beam parts 43a and 43b that are extended toward the frame part 41 along the Y-axis direction and the Y-axis direction of the weight body 42 from both sides in the Y-axis direction toward the frame part 41.
- Y-axis beam portions 44a and 44b Y-axis beam portions 44a and 44b, four auxiliary weight bodies 45a to 45d connected to the weight body 42, and resistance elements formed on the X-axis beam portions 43a and 43b Rxl ⁇ : Rx4, Rzl ⁇ Rz4, and resistance elements Ryl ⁇ Ry4 formed on the Y-axis direction beam portions 44a, 44b.
- the central axis of the X-axis direction beam portions 43a and 43b passes through the central axis of the cylindrical weight body 42 and extends along the X-axis direction.
- the central axes of the Y-axis direction beam portions 44a and 44b are arranged on the same straight line extending along the Y-axis direction through the central axis of the weight body 42.
- These X-axis direction beam portions 43a and 43b and Y-axis direction beam portions 44a and 44b are configured so as to be capable of stagnation deformation.
- the resistance elements Rxl and Rx2 are arranged in the X-axis direction beam part 43a along the X-axis direction, and the resistance elements Rx3 and Rx4 are arranged in the X-axis direction beam part 43b along the X-axis direction.
- the resistive elements Ryl and Ry2 are arranged in the Y-axis direction beam portion 44a along the Y-axis direction, and the resistive elements Ry3 and Ry4 are arranged in the Y-axis direction beam portion 44b along the Y-axis direction.
- the resistance elements Rzl and Rz2 are arranged in the X-axis direction beam portion 43a along the X-axis direction, and the resistance elements Rz3 and Rz4 are arranged in the X-axis direction beam portion 43b along the X-axis direction.
- These resistance elements Rxl to R x4, Ryl to Ry4, and Rzl to Rz4 are used for the sag deformation of the beams 43a, 43b, 44a, 44b, respectively.
- the electrical resistance changes due to the stress change of the beam parts 43a, 43b, 44a, 44b.
- resistance elements Rxl to Rx4 form a bridge circuit as shown in FIG. 15b
- four resistance elements Ryl to Ry4 form a bridge circuit as shown in FIG. 15c
- four resistance elements Rzl to Rz4 are provided in the frame 41 for the wiring force S beams 43a, 43b, 44a and 44b for configuring the bridge circuit as shown in FIG.
- the symbol Vcc shown in FIGS. 15b to 15d indicates a voltage power input unit connected to an external voltage power source
- the symbols Pxl, Px2, Pyl, Py2, Pzl, and Pz2 represent voltage detections, respectively. Shows the part.
- Each of the weight body 42 and the auxiliary weight bodies 45a to 45d is in a floating state, and can be displaced by the bending deformation of the beam portions 43a, 43b, 44a, and 44b. Yes. For example, if a force in the X-axis direction due to acceleration in the X-axis direction acts on the weight body 42 and the auxiliary weight bodies 45a to 45d, the force body 42 and the auxiliary weight bodies 45a to 45d are Displaces in the direction. Similarly, when a force in the Y-axis direction caused by acceleration in the Y-axis direction acts on the weight body 42 and the auxiliary weight bodies 45a to 45d, the force body 42 and the auxiliary weight bodies 45a to 45d are caused by the force.
- resistance elements Rxl ⁇ : Rx4, Ryl ⁇ Ry4 due to the stress generation of the beam parts 43a, 43b, 44a, 44b due to the stagnation deformation of the beam parts 43a, 43b, 44a, 44b as described above.
- the resistance values of Rz l to Rz4 change. Due to this change in the resistance value of the resistance element, the balance of the resistance values of the four resistance elements of each bridge circuit in FIGS. 15b to 15d is lost.For example, when acceleration in the X-axis direction is generated, FIG. There is a difference between the voltages output from the voltage detectors Pxl and Px 2 of the bridge circuit.
- the magnitude of acceleration in the X-axis direction can be detected.
- acceleration in the Y-axis direction is generated, there is a difference between the voltages output from the voltage detection units Pyl and Py2 of the bridge circuit in FIG. 15c. Using this voltage difference, the magnitude of acceleration in the Y-axis direction can be detected.
- a difference occurs in the voltages output from the voltage detection units Pzl and Pz2 of the bridge circuit in FIG. 15d. Using this voltage difference, the magnitude of acceleration in the Z-axis direction can be detected.
- Patent Document 1 Japanese Patent Application Laid-Open No. 2002-296293
- Patent Document 2 JP-A-8-160070
- Patent Document 3 JP-A-6-82472
- linear beam portions 43a, 43b, 44a, 44b are respectively arranged on four sides of the weight body 42, and the weight body 42 is attached to the frame portion 41. Is linked to. For this reason, when the frame 41 is distorted by thermal stress, the beam 41a, 43b, 44a, 44b is subjected to a strain S due to the distortion of the frame 41, and the beam ⁇ 43a, 43b, 44a, 44b. Compressive stress or tensile stress is generated. Resistive elements for detecting acceleration Rxl ⁇ Rx4, Ryl ⁇ Ry4, Rzl ⁇ : Rz4i, beam 43a, 43b, 44a, 44b, respectively.
- acceleration detection resistance elements Rxl to Rx4, Ryl to Ry4, and Rzl to Rz4 are provided in the beam portions 43a, 43b, 44a, and 44b that are formed to extend in four directions of the weight body 42, respectively.
- the arrangement positions of these resistive elements are dispersed.
- the beam portions 43a, 43b, 44a, and 44b are made of silicon, phosphorus () and boron (B) are doped in the resistor element arrangement positions in the beam portions 43a, 43b, 44a, and 44b.
- Resistive elements Rx1 to Rx4, Ryl to Ry4, and Rzl to Rz4 that are piezoresistors are formed.
- the present invention has the following configuration in order to solve the above problems. That is, this invention
- a base having an XY substrate surface parallel to the XY plane including the X axis and the Y axis of the X, Y, and Z axes orthogonal to each other;
- a beam portion supporting and fixing portion that supports the beam portion in a doubly-supported manner on the base via support portions that extend outwardly from both sides of the beam portion along the X-axis direction from the beam portion;
- a connecting portion that is formed to extend outwardly along the Y-axis direction on each side force in the Y-axis direction of the beam portion while floating on the XY substrate surface of the base;
- the weight portion is configured to be displaceable in three axial directions of the X-axis direction, the Y-axis direction, and the z-axis direction by deformation of the frame-shaped beam portion,
- the beam part includes an X-axis direction acceleration detection part for detecting an X-axis direction acceleration based on a stagnation deformation of the beam part caused by a displacement of the weight part in the X-axis direction, and a Y-axis direction displacement of the weight part.
- a Z-axis direction acceleration detector for detecting the acceleration in the Z-axis direction.
- the frame-shaped beam portion is supported in the form of a double-supported beam via the support portions that extend outwardly on both sides of the beam portion along the X-axis direction.
- the configuration was supported and revered. For this reason, for example, when distortion occurs in the base due to thermal stress, the distortion in the Y-axis direction (for example, the longitudinal direction) is absorbed by the sag deformation of the support portion, and the X-axis direction (for example, the short direction). ) Strain is small in absolute displacement due to strain, and the beam region connected to the support and connecting portion is separated and absorbed according to the strain in the X-axis direction.
- connection part of the beam part with the support part and its adjacent area and the connection part It is possible to prevent distortion from occurring in the part and its adjacent region.
- X is used to detect the acceleration based on the beam distortion in the beam area where no distortion occurs due to the distortion of the base.
- the axial acceleration detection unit, the Y-axis acceleration detection unit, and the z-axis acceleration detection unit By forming the axial acceleration detection unit, the Y-axis acceleration detection unit, and the z-axis acceleration detection unit, an erroneous detection of acceleration due to distortion due to thermal stress of the base (that is, no acceleration has occurred) Despite this, there is a false detection situation where the acceleration is detected by the X-axis direction acceleration detection unit, the Y-axis direction acceleration detection unit, or the z-axis direction acceleration detection unit due to distortion due to the thermal stress of the base ) Can be suppressed.
- the frame-shaped beam portion is supported by the base in the form of a cantilever beam, and the weight portion is supported by the beam portion in the form of a cantilever beam. It is easy to promote downsizing.
- the weight portion is configured to be connected to the frame-shaped beam portion in a cantilever shape. For this reason, the displacement of the weight portion due to the acceleration is increased, whereby the stagnation deformation of the beam portion due to the displacement of the weight portion is increased, and the sensitivity of acceleration detection can be increased.
- FIG. 1 is a perspective view schematically showing a first embodiment of an acceleration sensor according to the present invention.
- FIG. Lb is a schematic plan view of the acceleration sensor in FIG. La.
- FIG. 2a is a schematic cross-sectional view of the aa portion shown in FIG. Lb.
- FIG. 2b is a schematic cross-sectional view taken along line bb shown in FIG. Lb.
- FIG. 2c is a schematic cross-sectional view of the part c c shown in FIG. Lb.
- FIG. 3a is a schematic cross-sectional view taken along line AA shown in FIG. Lb.
- FIG. 3b is a schematic cross-sectional view of the BB part shown in FIG. Lb.
- FIG. 3c is a schematic cross-sectional view of the CC portion shown in FIG. Lb.
- FIG. 4 is a diagram for explaining a configuration example relating to the thickness of the beam portion constituting the acceleration sensor of the first embodiment.
- FIG. 5 is a diagram for explaining an example of an arrangement position of a piezoresistive portion provided in a beam portion.
- FIG. 6a is a circuit diagram for explaining a bridge circuit constituting the X-axis direction acceleration detection unit of the acceleration sensor according to the first embodiment.
- FIG. 6b is a circuit diagram for explaining a bridge circuit constituting the Y-axis direction acceleration detection unit of the acceleration sensor according to the first embodiment.
- FIG. 6c is a circuit diagram for explaining a bridge circuit constituting the radial direction acceleration detection unit of the acceleration sensor according to the first embodiment.
- FIG. 7 is a schematic diagram for explaining one wiring example of a wiring pattern for connecting a plurality of piezoresistive portions provided in a beam portion to form the bridge circuit shown in FIGS. 6a to 6c.
- FIG. 8a is a schematic perspective view for explaining an example of displacement of the weight portion caused by acceleration in the X-axis direction in the acceleration sensor of the example.
- FIG. 8b is a cross-sectional view for explaining an example of the displacement of the weight due to the acceleration in the X-axis direction in the acceleration sensor of the example.
- FIG. 8c is a model diagram for explaining an example of the state of stress generated in the beam due to the stagnation deformation of the beam due to the acceleration in the X-axis direction.
- FIG. 9a is a schematic perspective view for explaining an example of displacement of the weight portion caused by acceleration in the Y-axis direction in the acceleration sensor of the embodiment.
- FIG. 9b is a cross-sectional view for explaining an example of displacement of the weight due to acceleration in the Y-axis direction in the acceleration sensor of the example.
- FIG. 9c is a model diagram for explaining an example of the state of stress generated in the beam due to the stagnation deformation of the beam due to the acceleration in the Y-axis direction.
- FIG. 10a is a schematic perspective view for explaining an example of displacement of the weight portion caused by the acceleration in the Z-axis direction in the acceleration sensor of the embodiment.
- FIG. 10b is a cross-sectional view for explaining an example of displacement of the weight due to the acceleration in the Z-axis direction in the acceleration sensor of the example.
- FIG. 10c is a model diagram for explaining an example of the state of stress generated in the beam due to the stagnation deformation of the beam due to the acceleration in the Z-axis direction.
- FIG. 11 is a model diagram for explaining an acceleration sensor according to a second embodiment.
- FIG. 12 is a model diagram for explaining an acceleration sensor according to a third embodiment.
- FIG. 13a is a model diagram for explaining another example of the beam portion.
- FIG. 13b is a model diagram for explaining still another embodiment of the beam portion.
- FIG. 13c is a model diagram for explaining another example of the beam portion.
- FIG. 14a is a schematic diagram for explaining another wiring example of a wiring pattern for connecting a plurality of piezoresistive portions provided in a beam portion to form a bridge circuit.
- FIG. 14b is a circuit diagram showing a configuration example of a bridge circuit including the piezoresistive portion and the wiring pattern related to the Z-axis direction acceleration detection shown in FIG. 14a.
- FIG. 14c is a schematic cross-sectional view for explaining an example of the wiring pattern shown in FIG. 14a.
- FIG. 15a is a schematic perspective view showing a conventional example of an acceleration sensor.
- FIG. 15b is a circuit diagram for explaining a bridge circuit for detecting acceleration in the X-axis direction in the acceleration sensor shown in FIG. 15a.
- FIG. 15c is a circuit diagram for explaining a bridge circuit for detecting acceleration in the Y-axis direction in the acceleration sensor shown in FIG. 15a.
- FIG. 15d is a circuit diagram for explaining a bridge circuit for detecting the acceleration in the Z-axis direction in the acceleration sensor shown in FIG. 15a.
- Fig. La shows a schematic perspective view of a first embodiment of the acceleration sensor according to the present invention
- Fig. Lb shows a schematic plan view of the acceleration sensor of Fig. La
- Fig. 2a shows a schematic cross-sectional view of the a-a portion of Fig. Lb
- Fig. 2b shows a schematic cross-sectional view of the b-b portion of Fig. Lb
- Fig. 2c shows the diagram lb.
- a schematic cross-sectional view of the cc portion is shown.
- Fig. 3a shows a schematic cross-sectional view of the A-A portion of Fig. Lb
- Fig. 3b shows a schematic cross-sectional view of the B-B portion of Fig. Lb
- Fig. 3c shows the diagram lb.
- a schematic cross-sectional view of the CC part of is shown.
- the acceleration sensor 1 of the first embodiment is capable of detecting accelerations in the three axial directions of the X axis, the Y axis, and the Z axis that are orthogonal to each other.
- This acceleration sensor 1 has a base 2.
- the base 2 has an XY board surface 3 parallel to the XY plane including the X axis and the Y axis, and is arranged with a frame-shaped beam 4 floating above the XY board surface 3. ing.
- This frame-shaped beam portion 4 has a rectangular shape, and support portions 5 (5a, 5b) extend outwardly along the X-axis direction from both sides of the beam portion 4 in the X-axis direction. .
- the fixing portion 6 has a frame-like shape that surrounds the formation region of the beam portion 4 and a weight portion 7 (7a, 7b) to be described later with a space therebetween.
- the fixing portion 6 is fixed to the base 2. Yes.
- the beam portion 4 is supported and fixed in a doubly supported beam shape on the base 2 via the support portions 5a and 5b. That is, in the first embodiment, the beam support / fixing portion is constituted by the support portion 5 (5a, 5b) and the fixing portion 6.
- the weight portions 7a and 7b are arranged and arranged in the Y-axis direction with the beam portion 4 interposed therebetween, and are arranged in a state of floating above the XY board surface 3 of the base 2.
- Each of these weight portions 7a and 7b is connected to the beam portion 4 by connecting portions 8 (8a and 8b) formed outwardly extending along the Y-axis direction from both sides of the beam portion 4 in the Y-axis direction.
- the connecting portion 8 (8a, 8b) is in a floating state with respect to the base 2, and the weight portions 7a, 7b are moved in the X-axis direction, the Y-axis direction, and the Z-axis direction by the bending deformation of the beam portion 4. It can be displaced in three axial directions.
- the central axes along the X-axis direction of the support portions 5a and 5b are arranged on the same straight line, and the central axes along the Y-axis direction of the connection portions 8a and 8b. Are arranged on the same straight line ing.
- the beam part 4 has a rectangular shape, and the beam part 4 has a symmetrical shape with respect to the central axis in the X direction passing through the central axis of the support parts 5a and 5b, and the central axis of the connecting parts 8a and 8b. It has a symmetric shape with respect to the Y axis center axis.
- the connecting part side belt-like beam part part 15 extending from the connecting parts 8a and 8b to the region of the beam part 4 with the width of the connecting part 8 in the Y-axis direction.
- the thickness in the Z-axis direction of (15a, 15b) is the same as the thickness of the connecting portion 8 in the Z-axis direction.
- the width of the support portion 5 to the region of the beam portion 4 is extended in the X-axis direction to the support portion side belt-like beam portion 16 (16a, 16b) (enclosed by the dotted line Z16 in FIG. 4).
- the thickness in the Z-axis direction is the same as the thickness of the support part 5 in the Z-axis direction.
- the thickness force in the Z-axis direction of the connection-side belt-like beam part 15 (15a, 15b) and the support-side belt-like beam part 16 (16a, 16b) in the beam part 4 is about 400 m, for example.
- the thickness of the other part of the beam part 4 in the Z-axis direction is approximately 5 to 10 / ⁇ ⁇ , for example, and the thickness of the other part of the beam part 4 in the negative axis direction Is thinner than the thickness in the Z-axis direction of the connecting portion side belt-like beam portion 15 (15a, 15b) and the support portion side belt-like beam portion 16 (16a, 16b) in the beam portion 4.
- the thickness of the weight portion 7 in the Z-axis direction is substantially the same as the thickness of the support portion 5 and the connecting portion 8 in the Z-axis direction, for example, about 400 m. ing.
- the center of gravity of the weight portion 7 (7a, 7b) is, for example, the position of the point W7 shown in FIG. 3b, and the fulcrum of the beam portion 4 that supports the weight portion 7 (7a, 7b) is shown in, for example, FIG. 3b.
- the position of the point W4 is the center of gravity of the weight part 7 and the fulcrum position of the beam part 4 that supports the weight part 7 (7a, 7b) are shifted in height (position in the Z-axis direction). .
- the beam part 4, the support part 5 (5a, 5b), the fixing part 6, the weight part 7 (7a, 7b), and the connection part 8 (8a, 8b) described above are SOI. (Silicon- On-Insulator) substrate (ie Si layer 10 and SiO
- a piezoresistive portion for detecting acceleration is provided by processing the following portion of the beam portion 4 made of Si. That is, as shown in the schematic enlarged view of FIG. 5, in the beam portion 4, there are pipes on both sides of the band width of the connecting portion side beam portion 15a. Resistor resistance parts R and R are provided, respectively, and both sides of the band width of the connecting part side belt-like beam part 15b.
- Piezoresistive portions R 1 and R 2 are respectively provided. These four piezoresistors R,
- R, R, and R constitute the X-axis direction acceleration detector for detecting the X-axis direction acceleration
- the beam part 4, the support part 5 (5a, 5b) and the fixed part 6 are connected to the piezoresistive parts R and R.
- FIG. 7 schematically shows one wiring example of the wiring pattern.
- the wiring pattern L electrically connects one end sides of the piezoresistive portions R and R arranged on both sides of the band width of the connecting portion side beam portion 15a, and the voltage detection portion P force S
- XI X2 XL is formed. As shown in FIG. 1, a plurality of electrode pads 18 for external connection are formed on the surface of the fixing portion 6, and the voltage detection portion P
- one end side of the piezoresistive portions R 1 and R 2 disposed on both sides of the band width of the connecting portion side beam portion 15b is electrically connected to form a voltage detecting portion P.
- the voltage detector P is electrically connected to the electrode pad 18 for external connection corresponding to the voltage detector P individually by the wiring pattern L. Also, the piezoresistor R,
- the piezoresistive portion R is provided on both sides of the band width of the support side belt-like beam portion portion 16a.
- R are arranged on each side, and the piezoresistive parts are arranged on both sides of the band width of the support side belt-like beam part 16b
- R 1 and R 2 are arranged respectively. These four piezoresistors R, R, R, R, R, R
- the ⁇ -axis direction acceleration detector for detecting the ⁇ -axis direction acceleration is configured.
- the beam part 4, the support part 5 (5a, 5b), and the fixed part 6 are formed by the piezoresistive parts R, R, R, R.
- This voltage detector P is connected to an external connection corresponding to the voltage detector P by wiring pattern L.
- the electrode pad 18 is electrically connected. Similarly, one end sides of the piezoresistive portions R and R arranged on both sides of the band width of the support side belt-like beam part 16 b are electrically connected to each other.
- This voltage detector P is connected to the wiring pattern L.
- the electrode pads 18 for external connection corresponding to the voltage detection parts P individually are electrically connected.
- the electrode pad 18 is electrically connected to an external connection electrode pad 18 for connection to an external voltage power supply Vs.
- Sarasuko the other end of the piezoresistor R, R
- Yl Y3 is electrically connected to the external connection electrode pad 18 for connection to the external ground GND by the wiring pattern L !.
- a piezoresistive portion R z is formed on each central axis along the X-axis direction of the support portions 5a and 5b, and one end side of the support portion side belt-like beam portion portion 16a in the beam portion 4 (FIG. 5).
- the piezoresistive part R is formed on the upper side, and one end side of the support side belt-like beam part 16b (z2 in Fig. 5).
- a piezoresistive section R is formed on the lower side in the example. These four piezoresistors R,
- R, R, and R constitute the Z-axis direction acceleration detector for detecting the Z-axis direction acceleration z z2 z4
- the beam part 4, the support part 5 (5a, 5b), and the fixed part 6 have the piezoresistive parts R, R, R z z z2
- R forms a wiring pattern to construct a bridge circuit as shown in Figure 6c.
- the wiring pattern L causes the piezoresistive portion R of the support portion 5a and the piezoresistor on one end side of the support portion side belt-like beam portion 16a.
- One end side with the part R is electrically connected to form a voltage detection part P.
- the voltage detector P individually corresponds to the voltage detector P by the wiring pattern L.
- the electrode pad 18 for external connection is electrically connected.
- one end side of the piezoresistive portion R of the support portion 5b and the piezoresistive portion R on one end side of the support portion side belt-like beam portion portion 16b are identical.
- a voltage detector P is formed by electrically connecting the sensors. This voltage detector P is
- Z2 Z2 Electrode for external connection individually corresponding to the voltage detection part P by wiring pattern L Electrically connected to Nod 18. Further, the wiring pattern L causes the other end side of the piezoresistive portion R and the other end side of the piezoresistive portion R of the support portion 5b to be respectively connected to the wiring pattern L.
- the electrode pad 18 is electrically connected to an external connection electrode pad 18 for connection to an external voltage power supply Vs. Furthermore, by the wiring pattern L, the other end side of the piezoresistor R and
- the other end side of the piezoresistive part R of the support part 5a is externally connected by the wiring pattern L.
- the bridge circuits shown in FIGS. 6a to 6c are configured so that the resistance values of the four piezoresistive parts are in an equilibrium state. A piezoresistive part is formed.
- the acceleration sensor 1 of the first embodiment is configured as described above, and can detect acceleration as described below. For example, when acceleration in the X-axis direction occurs, a force in the X-axis direction due to the acceleration acts on the weight portion 7 (7a, 7b). Due to the acting force in the X-axis direction on the weight part 7, the weight part 7 (7a, 7b) is, for example, from the reference state shown by the dotted line in the model diagram of FIG. As shown in the cross-sectional view, it swings and displaces in the X-axis direction. Due to such displacement of the weight portion 7 in the X-axis direction, the beam portion 4 is stagnate and deformed via the connecting portion 8, and as a result, the following stress is generated in the beam portion 4.
- a compressive stress is generated on the right side B of the beam-like portion 15b. Also, support part side belt
- Compressive stress is generated on both sides C and C of the beam part 16a.
- R 1, R 2, R 3, and R are generated by the stress caused by the acceleration in the X axis direction.
- the electrical resistance value changes.
- the piezoresistive portions R 1 and R 2 change resistance values based on, for example, tensile stress.
- the piezoresistive parts R and R have resistance values based on compressive stress, for example.
- Y2 Y3 means that acceleration occurs, and the resistance value at the time of reference changes in resistance value in the opposite direction from each other.
- the piezoresistive portion R is, for example, a resistance value change based on compressive stress.
- the piezoresistive portion R indicates a change in resistance value based on tensile stress.
- the bridge circuit of FIG. 6a! / the piezoresistive portions R 1 and R show a change in resistance value based on, for example, compressive stress
- X2 X3 shows the resistance value change based on the tensile stress, for example, and the balanced state of the resistance value of the bridge circuit in FIG. 6a is lost, and the output of the bridge circuit in FIG. 6a changes. Since the fluctuation range of the output of the bridge circuit in Fig. 6a changes depending on the magnitude of the acceleration in the X-axis direction, the magnitude of the acceleration in the X-axis direction must be detected based on the output of the bridge circuit in Fig. 6a. Can do.
- a force in the Y-axis direction resulting from the acceleration acts on the weight portion 7 (7a, 7b).
- the height position of the center of gravity of the weight portion 7 and the fulcrum position of the beam portion 4 supporting the weight portion 7 are deviated from each other. 7
- the weights 7a, 7b are moved from the reference state shown by the dotted line in the model diagram of Fig. 9a, for example, the solid line shown in Fig. 9a and the schematic diagram of Fig. 9b.
- one side of the weights 7a and 7b (the weight 7a in the examples of FIGS. 9a and 9b) is displaced in the Y-axis direction while approaching the base 2, and the other side (FIG. 9a And the example in Figure 9b Then, the weight part 7b) is displaced in the Y-axis direction while being lifted with respect to the base 2.
- the connecting portion 8 and the beam portion 4 are squeezed and deformed, and the following stress is generated in the beam portion 4.
- Tensile stress and compressive stress are applied to the lower side C of the support-side belt-like beam part 16a.
- the piezoresistive parts R 1, R 2, R 3, and R are respectively stress generations caused by acceleration in the Y-axis direction.
- the electrical resistance value changes with life.
- the piezoresistors R, R when acceleration in the Y-axis direction occurs, the piezoresistors R, R
- Yl Y2 indicates the change in resistance value based on, for example, tensile stress, and the piezoresistive parts R and R
- Y3 Y4 shows a change in resistance value based on, for example, compressive stress. Therefore, the balance state of the resistance value of the bridge circuit in FIG. 6b is lost, and the output of the bridge circuit in FIG. 6b changes. Since the fluctuation range of the output of the bridge circuit in Fig. 6b changes according to the magnitude of the acceleration in the Y-axis direction, the magnitude of the acceleration in the Y-axis direction must be detected based on the output of the bridge circuit in Fig. 6b. Can do.
- a piezoresistor is provided on the upper side C of the support side belt-like beam part 16a.
- Z2 Z4 Resistance value also changes, but the piezoresistive part Z2 is a resistance value change based on tensile stress, for example, and the piezoresistive part R is a resistance value based on compressive stress, for example.
- the change in the resistance value of Z2 and Z4 changes in the direction of the resistance value of the reference in the absence of acceleration.
- Fig. 6a shows that there is almost no change in the resistance values of these piezoresistive sections R, R, R, and R because they are arranged in areas where there is almost no stress change when axial acceleration occurs. There is no big change in the output of the bridge circuit.
- the piezoresistive portions R and R disposed on one end sides of the support-side belt-like beam portions 16a and 16b, respectively.
- the piezoresistive portion Rz is disposed in a portion where there is almost no change in stress due to acceleration in the Z-axis direction, and there is almost no electrical resistance value of the piezoresistive portion Rz.
- the balance state of the resistance value of the bridge circuit in Fig. 6c breaks down and the output of the bridge circuit in Fig. 6c changes. Since the fluctuation range of the output of the bridge circuit in Fig. 6c changes according to the magnitude of the acceleration in the Z-axis direction, the magnitude of the acceleration in the Z-axis direction is detected based on the output of the bridge circuit in Fig. 6c. be able to.
- R and R have similar resistance values. For this reason, acceleration in the Z-axis direction has occurred.
- the acceleration sensor 1 of the first embodiment includes the X-axis direction, the Y-axis direction, and the Z-axis direction. It is possible to separately detect the accelerations in the three axis directions.
- the beam portion 4 is supported by the support portion 5 (5a, 5b) in a doubly supported beam shape on the fixed portion 6, and the weight portion 7 (7a, 7b) is connected to the connecting portion 8 ( 8a and 8b) are supported in a cantilevered manner on the beam part 4.
- the distance between the part of the fixed part 6 to which the support part 5a is connected and the part of the fixed part 6 to which the support part 5b is connected can be formed short.
- the absolute displacement due to the distortion between the fixed parts caused by the distortion of the base 2 and the fixed part 6 is small.
- the beam portion 4 has a frame shape, and the frame-shaped beam portion 4 is supported by the fixing portion 6 in a doubly supported beam shape by the support portions 5 (5a, 5b).
- the corner area of the beam 4 can be deformed to release the stress.
- the support portion 5 (5a, 5b) can be deformed to release the stress. For this reason, the stagnation deformation of the beam part 4 due to the distortion of the base 2 and the fixed part 6 can be mitigated. For this reason, problems caused by ambient temperature fluctuations (for example, temperature drift problems in which the output voltage values of the bridge circuits in FIGS. 6a to 6c fluctuate due to temperature fluctuations) can be reduced.
- the piezoresistive portions for detecting the acceleration are collectively arranged on the beam portion 4 arranged in the region between the weight portions 7a and 7b. For this reason, it becomes possible to manufacture all the piezoresistive parts almost as designed, and it becomes easy to suppress variations in the output of the bridge circuit shown in FIGS. 6a to 6c.
- piezoresistive parts are fabricated by doping boron (B) and phosphorus (P) into Si constituting the beam part 4, but the arrangement positions of the piezoresistive parts are integrated, so that each piezoresistive part is Therefore, it is easy to make the boron and phosphorus dope concentrations uniform. For this reason, the resistance value of each bridge circuit can be easily balanced, and the accuracy of acceleration detection can be improved.
- all the piezoresistive portions are arranged in an intensive manner, so that the bow I of the wiring pattern for configuring each bridge circuit of Figs. 6a to 6c is simplified. It can be done.
- the beam portion 4 has a symmetrical shape with respect to the central axis in the Y-axis direction passing through the central axis along the Y-axis direction of the connecting portions 8a and 8b, and is supported.
- the shape is symmetrical with respect to the central axis in the X-axis direction passing through the central axis. For this reason, the bending deformation of the beam part 4 due to the occurrence of acceleration can be simplified, and it can contribute to the improvement of the accuracy of acceleration detection using the stress change caused by the bending deformation of the beam part 4.
- the connecting portion side belt-like beam portion 15 (15a, 15b) and the support portion side belt-like beam portion 16 (16a, 16b) in the beam portion 4 The thickness in the Z-axis direction is thicker than this part. Due to this difference in thickness, the connecting part side belt-like beam part 15 (15a, 15b) and the support part side belt-like beam part 16 (16a, 16b) and the boundary part between the other parts of the beam part 4 The strength of the stress is clear.
- the calorie velocity is detected by using the stress change of the beam part 4, so by clarifying the strength of the stress in this way, the X-axis direction, the Y-axis direction, and the Z-axis It becomes possible to detect each of the accelerations in the three axial directions more clearly.
- a reinforcing portion 20 as shown in FIG. 11 may be provided on the frame-shaped beam portion 4.
- the reinforcing portion 20 includes a portion M of the beam 4 to which the support 5 a is connected and a beam V 4 to which the support 5 b is connected.
- the both ends of the reinforcing part 20 are connected to the inner edge of the beam part 4 respectively.
- the width of the reinforcing portion 20 is equal to the width of the support portion 5 (5a, 5b), but the width of the reinforcing portion 20 is equal to the width of the support portion 5 (5a, 5b). It may be thicker or narrower than the width. Further, the thickness of the reinforcing portion 20 in the Z-axis direction may be the same as the thickness of the support portion 5 (5a, 5b) or may be thinner than the thickness of the support portion 5 (5a, 5b). Good. As described above, the width and thickness of the reinforcing portion 20 are appropriately designed in consideration of the rigidity of the beam portion 4 itself.
- the third embodiment will be described below.
- the same components as those in the first and second embodiments are denoted by the same reference numerals, and the duplicate description of the common portions is omitted.
- the support portions 5 (5a, 5b) are connected to the fixed portion 6 via the elastic portions 25 (25a, 25b), respectively.
- the configuration of the acceleration sensor of the third embodiment other than the above configuration is the same as that of the first or second embodiment.
- the characteristic elastic portion 25 (25a, 25b) in the third embodiment is a direction (in this example, orthogonal to Y) that intersects the extension forming direction (X-axis direction) of the support portion 5 (5a, 5b).
- the beam 26 is configured to extend in the axial direction (stress reducing beam) 26, and both ends of the beam 26 are fixed to the fixing portions 6.
- the support 5 (5a, 5b) is connected to the center of the beam 26.
- the beam 26 is elastically deformed according to the strain in the X-axis direction of the fixed portion 6, and this elastic deformation reduces the stress applied from the fixed portion 6 to the support portion 5 due to the strain of the fixed portion 6. Can do.
- the beam 26 can be elastically deformed according to the strain of the fixed portion 6, its width and thickness in the Z-axis direction are not particularly limited. In this third embodiment, however, the beam 26 The thickness in the Z-axis direction is the same as that of the fixed part 6 and the support part side band-like beam part part 16 in the beam part 4.
- the elastic portion 25 as described above, for example, in addition to the fixed portion 6 to the support portion 5 due to distortion of the base 2 and the fixed portion 6 due to thermal change.
- the stress that is generated can be reduced.
- the sample A having the configuration of the acceleration sensor shown in the first embodiment (see, for example, FIG. 1) and the reinforcing portion 20 shown in the second embodiment are provided in addition to the configuration of the sample A.
- Sample B having the configuration shown in FIG. 11 and sample C having the configuration provided with the elastic portion 25 shown in the third embodiment (see FIG. 12) in addition to the configuration of sample B. Prepared.
- the distortion of the beam part 4 due to the distortion of the base 2 and the fixing part 6 due to thermal fluctuation or the like can be suppressed to a small level, it is configured by a piezoresistive part for acceleration detection.
- the temperature drift of the output of the bridge circuit can be suppressed. This can improve the reliability for acceleration detection.
- the present invention is not limited to the forms of the first to third embodiments, and may take various forms.
- the X-axis direction acceleration detection unit, the Y-axis direction acceleration detection unit, and the Z-axis direction acceleration detection unit that detect acceleration are each configured to have a piezoresistive unit.
- the displacement of the weight part 7 is detected using capacitance, and the acceleration in the X-axis direction, the acceleration in the Y-axis direction, and the acceleration in the Z-axis direction are detected. It is good also as a structure.
- the beam portion 4 includes a connecting portion side belt-like beam portion 15 (15a, 15b) and a support portion side belt-like beam portion 16 (16a, 16b).
- the force beam portion 4 was configured such that the thickness in the Z-axis direction was thicker than the other portions, and the thickness in the Z-axis direction was equal or substantially equal throughout the entire Z-axis direction.
- the frame-shaped beam portion 4 has a rectangular shape.
- the frame-shaped beam portion 4 has a circular shape as shown in FIG. 13a.
- the frame-shaped beam 4 is symmetric with respect to the central axis in the X-axis direction and is symmetric with respect to the central axis in the Y-axis, but the frame-shaped beam 4 is The shape may be asymmetric with respect to the central axis in the X-axis direction, or may be asymmetrical with respect to the central axis in the Y-axis direction.
- the piezoresistive portion for detecting acceleration is arranged as shown in FIG. If the acceleration in the direction, the acceleration in the Y-axis direction, and the acceleration in the Z-axis direction can be detected using the change in the stress due to the bending deformation of the beam part 4, they are limited to the arrangement positions in FIG. It can be set as appropriate. In addition, wiring examples of wiring patterns that connect the piezoresistive portions to form a bridge circuit may be set as appropriate, and are not limited to the example of FIG.
- FIG. 14a shows another arrangement example of the piezoresistive portion and the wiring pattern.
- the beam portion 4 is provided with a reinforcing portion 20 as shown in the second embodiment.
- the piezoresistive portions Rz ′ and Rz ′ are provided in the support portions 5a and 5b, respectively.
- a piezoresistive portion R is provided on the lower side of the part side belt-like beam part 16a in the figure.
- a piezoresistive portion R is provided on the upper side of the beam portion 16b.
- the parts Rz ', Rz', R and R are the piezoresistive parts Rz, Rz, R zl z3 z which are also provided in the examples of Figs.
- the zoresistors R, R, Rz, and Rz are formed to extend along the X-axis direction, and the piezo resistance zl z3
- the resistance parts Rz ', Rz', R and R are perpendicular to the direction of elongation of the piezoresistive parts R, R, Rz and Rz z2 z4 zl z3
- the piezoresistive part involved in the output constitutes a bridge circuit as shown in Fig. 14b with the following wiring pattern.
- the Si layer 12 of the SOI substrate 13 is formed by doping boron, phosphorus or the like as shown in the schematic cross-sectional view of Fig. 14c.
- a bridge circuit consisting of the wiring pattern Ls and the wiring pattern Lm made of metal such as aluminum formed on the surface of the SOI substrate 13 by using a film forming technique such as vapor deposition or sputtering. Is configured.
- the wiring pattern Ls is represented by a dotted line
- the wiring pattern Lm is represented by a solid line.
- the following unique wiring patterns Ls and Lm are formed using the characteristics of the wiring pattern Ls and the wiring pattern Lm. That is, since the oxide film 21 is inevitably formed on the surface of the Si layer 12 of the SOI substrate 13 after the formation of the wiring pattern Ls, the wiring pattern Ls and the wiring pattern are formed by the oxide film 21. Cross wiring between the wiring pattern Ls and the wiring pattern Lm is made while ensuring insulation from the pattern Lm. In addition, a portion of the oxide film 21 where the wiring pattern Ls is formed is removed to form a hole 22, and the conductive material of the constituent material of the wiring pattern Lm enters the hole 22 and wiring is performed. By bonding to pattern Ls, wiring pattern Ls and wiring pattern Lm are electrically connected.
- the support portions 5a and 5b, the connecting portion side belt-like beam portions 15a and 15b and the support portion side belt-like beam portions 16a and 16b in the beam portion 4, and the reinforcing portion 20 are
- the thickness is about 400 m
- the parts of the beam part 4 other than the connecting part side belt part parts 15a and 15b and the support part side belt part parts 16a and 16b are 5 to:
- the thickness is about LO m. If the metal wiring pattern Lm is formed on the surface of the thin part of the beam part 4 in this way, the thin part of the beam part 4 may be warped by the internal stress of the wiring pattern Lm.
- the wiring pattern Ls is formed by doping impurities such as boron and phosphorus into the Si layer constituting the beam part 4, and the beam part 4 is thin due to the formation of the wiring pattern Ls. Almost no deformation such as warping of the portion occurs. For this reason, it is avoided to form the metal wiring pattern Lm in the thin portion of the beam portion 4, and the wiring pattern Ls is formed in the thin portion of the beam portion 4.
- the wiring pattern Ls and the wiring pattern Lm can be cross-wired.
- the wiring pattern Ls and the wiring pattern Lm are considered in consideration of simplifying the wiring configuration of the wiring pattern by utilizing the fact that the electrical connection between the wiring pattern Ls and the wiring pattern Lm is easy.
- the wiring configuration is designed. As a result, in the example of Fig. 14a, it is pulled out from the formation area of the beam 4! You can reduce the number of wiring patterns compared to the example in Fig. 7! /
- the output of the bridge circuit consisting of the piezoresistive portion force for detecting the X-axis direction acceleration varies as in the first to third embodiments.
- the magnitude of acceleration in the X-axis direction can be detected.
- the output of the ply circuit consisting of the piezoresistive force for detecting the Y-axis direction acceleration fluctuates and the Y-axis direction The magnitude of acceleration can be detected.
- the acceleration in the Z-axis direction can be detected as follows. That is, when acceleration in the Z-axis direction is generated, the weight portion 7 (7a, 7b) is displaced in the Z-axis direction as described above, and the connecting portion 8 and the beam portion 4 are stagnate and deformed. As a result, as shown in the model diagram of FIG. 9c, in the beam portion 4, tensile stress is generated on both sides C 1, C 2, D 3 and D 2 of the support-side belt-like beam portions 16a and 16b, respectively. . like this
- the zl z3 and the piezoresistive portions R 1 and R z2 z4 have a shape that extends in a direction perpendicular to each other.
- the electrical resistance values of the piezoresistive portions formed to extend in directions orthogonal to each other change in the positive and negative directions. Due to the characteristics of this piezoresistive section, the stress due to the acceleration applied in the z-axis direction causes both sides C,
- Rz ', Rz' are arranged in the part where there is almost no stress change due to the acceleration in the axial direction. For these reasons, when acceleration in the axial direction occurs, the balance state of the resistance value of the bridge circuit in FIG. 14b is lost, and the output of the bridge circuit in FIG. 14b changes. Z-axis addition Since the fluctuation range of the output of the bridge circuit in FIG. 14b changes according to the speed, the magnitude of the acceleration in the Z-axis direction can be detected based on the output of the bridge circuit in FIG. 14b.
- the amount of deformation of the beam 4 due to the acceleration in the Z-axis direction is larger than the amount of deformation of the beam 4 due to the acceleration in the Y-axis direction, for example.
- all the piezoresistive portions are formed at the same time in order to suppress variations in the electric resistance values of a plurality of piezoresistive portions, all the piezoresistive portions have substantially the same electric resistance value.
- the piezoresistive part is arranged as shown in FIG. 5 to form a bridge circuit as shown in FIGS. 6a to 6c, the bridge circuit of FIG. The output of is higher than the output of the bridge circuit in Fig.
- the output fluctuation width of the ply circuit is almost equal to the magnitude of the acceleration in any of the X-axis direction, Y-axis direction, and Z-axis direction. I like it.
- the electrical resistance value of the bridge circuit is set so that the magnitude of the output of the bridge circuit due to the acceleration in the Z-axis direction is the same as the magnitude of the output due to the acceleration in the Y-axis direction.
- the piezoresistors Rz, Rz, Rz ', and Rz' for adjusting sensitivity do not change the electrical resistance value even if acceleration in the Z-axis direction occurs, so the bridge circuit when acceleration in the Z-axis direction occurs
- the resistance value change of each side is piezoresistive part R, R, R zl z2 on each side of the bridge circuit.
- R is smaller than when only one force is not provided.
- the fixing portion 6 has a frame-like shape surrounding the formation region of the beam portion 4 and the weight portion 7 with a space therebetween. As long as the beam portion 4 can be fixed to the base 2 in a doubly-supported beam shape by the support portions 5a and 5b, it does not have to be a frame shape.
- the beam portion 4, the support portion 5, the fixing portion 6, the weight portion 7, and the connecting portion 8 are composed of SOI substrates, they are composed of SOI substrates.
- the acceleration sensor of the present invention can detect the accelerations in the three axial directions of the X-axis direction, the Y-axis direction, and the Z-axis direction with a single element with high accuracy, for example, requiring high accuracy of acceleration detection. It is effective to be provided in a small device.
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Abstract
Description
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Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
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AT05782315T ATE537457T1 (de) | 2005-04-06 | 2005-09-08 | Beschleunigungsmesser |
JP2006515400A JP3956999B2 (ja) | 2005-04-06 | 2005-09-08 | 加速度センサ |
EP05782315A EP1868000B1 (en) | 2005-04-06 | 2005-09-08 | Acceleration sensor |
US11/575,799 US7631559B2 (en) | 2005-04-06 | 2005-09-08 | Acceleration sensor |
TW095110831A TWI291027B (en) | 2005-04-06 | 2006-03-29 | Acceleration sensor |
Applications Claiming Priority (2)
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JPPCT/JP2005/006783 | 2005-04-06 | ||
PCT/JP2005/006783 WO2006114832A1 (ja) | 2005-04-06 | 2005-04-06 | 加速度センサ |
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WO2006112051A1 true WO2006112051A1 (ja) | 2006-10-26 |
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PCT/JP2005/006783 WO2006114832A1 (ja) | 2005-04-06 | 2005-04-06 | 加速度センサ |
PCT/JP2005/016542 WO2006112051A1 (ja) | 2005-04-06 | 2005-09-08 | 加速度センサ |
Family Applications Before (1)
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PCT/JP2005/006783 WO2006114832A1 (ja) | 2005-04-06 | 2005-04-06 | 加速度センサ |
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Country | Link |
---|---|
US (1) | US7631559B2 (ja) |
EP (1) | EP1868000B1 (ja) |
JP (1) | JP3956999B2 (ja) |
KR (1) | KR100867550B1 (ja) |
CN (1) | CN100454022C (ja) |
AT (1) | ATE537457T1 (ja) |
WO (2) | WO2006114832A1 (ja) |
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US8386042B2 (en) * | 2009-11-03 | 2013-02-26 | Medtronic Minimed, Inc. | Omnidirectional accelerometer device and medical device incorporating same |
DE102011076006B3 (de) * | 2011-05-17 | 2012-09-13 | Siemens Aktiengesellschaft | Kraftaufnehmer, insbesondere Wägezelle |
DE102011112935B4 (de) * | 2011-09-13 | 2015-02-12 | Micronas Gmbh | Kraftsensor |
JP5971349B2 (ja) * | 2012-11-19 | 2016-08-17 | 株式会社村田製作所 | 角加速度センサ |
JP5930127B2 (ja) * | 2013-06-04 | 2016-06-08 | 株式会社村田製作所 | 加速度センサ |
EP3121561B1 (en) * | 2014-03-20 | 2019-06-26 | KYOCERA Corporation | Sensor |
DE102015104410B4 (de) * | 2015-03-24 | 2018-09-13 | Tdk-Micronas Gmbh | Drucksensor |
TW201728905A (zh) * | 2016-02-03 | 2017-08-16 | 智動全球股份有限公司 | 加速度計 |
CN117607489B (zh) * | 2024-01-17 | 2024-04-09 | 中国工程物理研究院电子工程研究所 | 压阻式加速度传感器的敏感结构及加速度传感器 |
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JP2009229409A (ja) * | 2008-03-25 | 2009-10-08 | Murata Mfg Co Ltd | 外力検知装置の製造方法および外力検知装置 |
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Also Published As
Publication number | Publication date |
---|---|
EP1868000A1 (en) | 2007-12-19 |
JPWO2006112051A1 (ja) | 2008-11-27 |
WO2006114832A1 (ja) | 2006-11-02 |
KR20070067073A (ko) | 2007-06-27 |
CN1981197A (zh) | 2007-06-13 |
JP3956999B2 (ja) | 2007-08-08 |
US7631559B2 (en) | 2009-12-15 |
US20090183571A1 (en) | 2009-07-23 |
ATE537457T1 (de) | 2011-12-15 |
KR100867550B1 (ko) | 2008-11-10 |
EP1868000B1 (en) | 2011-12-14 |
EP1868000A4 (en) | 2010-10-06 |
CN100454022C (zh) | 2009-01-21 |
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