WO2006001289A1 - シート剥離装置及び剥離方法 - Google Patents
シート剥離装置及び剥離方法 Download PDFInfo
- Publication number
- WO2006001289A1 WO2006001289A1 PCT/JP2005/011408 JP2005011408W WO2006001289A1 WO 2006001289 A1 WO2006001289 A1 WO 2006001289A1 JP 2005011408 W JP2005011408 W JP 2005011408W WO 2006001289 A1 WO2006001289 A1 WO 2006001289A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- sheet
- peeling
- plate
- wafer
- tape
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L21/6836—Wafer tapes, e.g. grinding or dicing support tapes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/27—Manufacturing methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68327—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/6834—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used to protect an active side of a device or wafer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68381—Details of chemical or physical process used for separating the auxiliary support from a device or wafer
- H01L2221/68386—Separation by peeling
- H01L2221/68395—Separation by peeling using peeling wheel
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/27—Manufacturing methods
- H01L2224/274—Manufacturing methods by blanket deposition of the material of the layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8319—Arrangement of the layer connectors prior to mounting
- H01L2224/83191—Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed only on the semiconductor or solid-state body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/8385—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01004—Beryllium [Be]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01058—Cerium [Ce]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01074—Tungsten [W]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/06—Polymers
- H01L2924/078—Adhesive characteristics other than chemical
- H01L2924/07802—Adhesive characteristics other than chemical not being an ohmic electrical conductor
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
- Y10T156/1978—Delaminating bending means
Definitions
- the present invention relates to a sheet peeling apparatus and a peeling method, and in particular, after an adhesive sheet is attached to a semiconductor wafer using a raw sheet in which a heat-sensitive adhesive sheet is laminated on the release sheet,
- the present invention relates to a sheet peeling apparatus and a peeling method suitable for peeling or removing the remaining raw fabric portion excluding an adhesive sheet.
- a semiconductor wafer (hereinafter simply referred to as “wafer”) on which a circuit surface is formed is divided into chips, and then each chip is picked up and bonded (die bonding) to a lead frame. It has been broken. This die bonding is performed by sticking a heat-sensitive adhesive sheet for die bonding in advance in the wafer processing step.
- an adhesive sheet is attached to a wafer using an original sheet in which an adhesive sheet is laminated on a release sheet, and the original sheet is fed onto a wafer and pressed. This is done by pressing with a roll. After this sticking, the cutter is rotated along the outer periphery of the wafer to cut the original, and the peeling roll is submerged between the original and the wafer so that the original around the wafer is recovered. It has become. Then, a release tape is affixed to the release sheet remaining on the wafer corresponding to the shape of the wafer, and the release sheet is wound up so that only the release sheet remains with the adhesive sheet left on the wafer. Can be peeled off.
- Patent Document 1 Japanese Patent Laid-Open No. 2003-257898
- the present invention has been devised by paying attention to such inconveniences.
- the purpose of the present invention is to make it possible to efficiently peel off unnecessary portions after applying an adhesive sheet to a plate-like body, thereby simplifying the apparatus configuration. It is another object of the present invention to provide a sheet peeling apparatus and a peeling method that can contribute to shortening the processing steps of the plate-like body.
- the present invention provides a method in which an original fabric in which an adhesive sheet is laminated on one surface of a release sheet is fed out, and the adhesive sheet is attached to a plate-like body.
- an apparatus that cuts the original fabric along the plate and peels the release sheet portion located on the plate-like body together with the original fabric portion located on the outer peripheral side around the plate-like body,
- the peeling sheet located on the plate-like body is peeled off together with the original fabric portion located on the outer peripheral side.
- the present invention is a method in which a heat-sensitive adhesive sheet is laminated on one surface of a release sheet, and a continuous strip is fed out and pasted on a plate-like body.
- the sheet is cut into the direction of the sheet, and the original fabric is cut along the outer periphery of the plate-like body, and the release sheet portion located on the plate-like body is peeled together with the original fabric portion located on the outer peripheral side of the plate-like body
- the peeling sheet positioned on the plate-like body is simultaneously peeled together with the original fabric portion located on the outer peripheral side by winding up the peeling tape.
- the sticking and scooping portion is against the table that supports the plate-like body.
- the roll includes a relatively movable roll, and the roll has a function of rotating on the original fabric with the peeling tape wound around the outer periphery and sticking the peeling tape on the peeling sheet, and opposite to the rotation direction. It can be set as the structure provided with the function which rotates to the side and performs the said peeling.
- the peeling tape is preferably provided with a width smaller than the diameter of the plate-like body.
- a semiconductor wafer can be used for the plate-like body.
- the present invention provides a method in which an original sheet in which an adhesive sheet is laminated on one surface of a release sheet is fed out, and the adhesive sheet is attached to a plate-like body, and then the original fabric is applied along the outer periphery of the plate-like body.
- a method of cutting and peeling the release sheet portion located on the plate-like body together with the outer peripheral side raw fabric portion located around the plate-like body In a method of cutting and peeling the release sheet portion located on the plate-like body together with the outer peripheral side raw fabric portion located around the plate-like body,
- a semiconductor wafer can be used as the plate-like body in the sheet peeling method.
- the release sheet located on the plate-like body and the outer peripheral side of the raw fabric portion can be peeled or removed simultaneously, so that the peeling can be performed without complicating the apparatus configuration.
- the processing time can be shortened.
- the roll that can be moved relative to the table supporting the plate-like body has a function of attaching the peeling tape and a function of winding up the peeling tape, the number of equipment parts is also increased from this point. Reduction can be achieved. As a result, positional interference with other apparatus components, which are likely to occur when the roll moves relatively, is less likely to occur, and the degree of freedom in layout of structural parts can be expanded.
- FIG. 1 is a schematic plan view showing an overall configuration of a wafer processing apparatus to which a sheet peeling apparatus and a peeling method according to the present embodiment are applied.
- FIG. 2 is a schematic cross-sectional view for explaining the wafer processing process over time
- FIG. 3 is a schematic front view showing an initial stage of temporarily attaching a raw adhesive sheet.
- FIG. 4 is a schematic front view when the adhesive sheet is temporarily attached and the original fabric is cut in the width direction.
- FIG. 5 is a schematic perspective view of a main part of the present embodiment.
- FIG. 6 is a schematic enlarged perspective view of a sheet peeling apparatus.
- FIG. 7 is a schematic front view of a sheet peeling apparatus.
- FIG. 8 (A) to (E) are schematic cross-sectional views showing a peeling process by the sheet peeling apparatus.
- FIG. 1 shows a plan view of a wafer processing apparatus according to an embodiment to which the sheet peeling apparatus and the peeling method of the present invention are applied, and FIG. 2 explains the wafer processing steps over time.
- the wafer processing apparatus 10 targets a wafer W having a UV curable protective tape PT (see FIG. 2) attached to the surface forming the circuit surface, and has a thermal adhesive property for die bonding on the back surface of the wafer W.
- the apparatus is configured as a device for processing a series of processes for mounting the wafer W on the ring frame RF via the dicing tape DT.
- the wafer processing apparatus 10 includes a cassette 11 for storing wafers W, Alignment processing is performed with a robot 12 that sucks and holds the wafer W taken out from the cassette 11, a UV irradiation unit 13 that performs UV irradiation on the protective tape PT, and an alignment device 14 that positions the wafer W.
- Affixing device 15 for affixing adhesive sheet S (see Fig.
- the sticking device 15 is applied to the wafer W using a strip-shaped raw fabric LS in which a heat-sensitive adhesive sheet S is laminated on one surface of the release sheet PS. It has a function of attaching and a function of peeling off the remaining portion or region of the original fabric LS so that the adhesive sheet S remains on the wafer W.
- the sticking device 15 includes a sticking table 40 that supports the wafer W, a sticking unit 41 that temporarily attaches the adhesive sheet S to the back side (upper face side) of the wafer W adsorbed to the sticking table 40, and a raw fabric.
- a cutting means 43 that cuts the LS in the width direction for each wafer and W, and a transfer device 45 that sucks and transfers the wafer W from the sticking table 40 (see FIG. 1), the transfer device
- the bonding table 48 for adhering the temporarily-attached adhesive sheet S to the wafer W and the release sheet on the wafer W as well as the peripheral cutting table 47.
- Sheet peeling device that peels off PS and unwanted raw material part S1 at the same time 50 (see Fig. 5).
- the pasting table 40 has a first temperature at which the upper surface side is formed as an adsorbing surface, and can be temporarily attached to Weno and W by melting the adhesive sheet S to a certain degree, this embodiment. In this state, the temperature is kept at approximately 110 ° C.
- This affixing table 40 is not shown.
- the inner table portion and the outer table portion that surrounds the inner table portion are configured.
- the inner table portion is provided in substantially the same planar shape as the wafer W so as to form a support surface of the wafer W, and is configured to keep the wafer W at approximately 110 ° C.
- the outer table portion is provided so as to be kept at a temperature lower than the temperature of the inner table portion, in this embodiment, about 40 ° C.
- the pasting table 40 has a position where it can receive the wafer W from the UV irradiation unit 13 side via the moving device 52 and a lower area of the pasting unit 41 so as to cut the outer periphery. It is provided so as to be able to reciprocate between the position reaching the upper side of 47, and can be moved up and down via an elevating device 53.
- the moving device 52 includes a pair of rails 54, 54, a slide plate 55 that is guided by the rails 54 and moves on the rail 54, and a bracket fixed to the slide plate 55.
- a motor M (see FIG. 1) that rotates and drives the ball spline shaft 58 in a state where it is threadedly engaged with the motor 57.
- the table 40 reciprocates in the left-right direction in FIG.
- the lifting device 53 includes a vertical movement mechanism 62 disposed at the center of the lower surface of the sticking table 40, a guide block 63 fixed on the slide plate 55, and four guides that can be lifted and lowered along the guide block 63.
- the vertical movement mechanism 62 advances and retreats in the vertical direction, so that the sticking table 40 moves up and down to receive the upstream force Ueno, W of the wafer processing. .
- a cutter receiving groove 40A for cutting the raw fabric LS fed from the pasting unit 41 in the width direction is formed and along the moving direction of the pasting table 40
- a rack 65 and a guide bar 67 attached to the outer surface of the rack 65 are provided at the upper part of both side surfaces!
- the pasting unit 41 is provided in the region of the plate-like frame F disposed above the pasting table 40 as shown in FIG. 3 and FIG.
- the affixing unit 41 includes a support roll 70 that supports the raw fabric LS wound in a form of a tool so that the raw fabric LS can be supplied, and a feed roll LS.
- the drive roll 71 and the pinch roll 72 for applying the output force, the two guide rolls 74 and 74 disposed between the support roll 70 and the pinch roll 72, and these guide rolls 74 and 74 are provided.
- a press roll 78 that is pressed and temporarily attached, and a tension roll 79 and a guide roll 80 disposed immediately before the press roll 78 in the feed direction of the original fabric LS are provided.
- the press roll 78 has a built-in heater as a heating means.
- the lower surface side of the pressing member 76 has an adsorbing portion, and adsorbs and holds the end portion of the original fabric LS.
- the drive roll 71 is driven to rotate by a motor Ml provided on the back side of the frame F.
- the pressing member 76, the press roll 78, and the tensioning hole 79 are provided so as to be movable up and down via cylinders 82, 83, and 84, respectively.
- a pair of pions that mate with the rack 65 are provided at both ends of the rotation center shaft 86, and at positions further outside these pions.
- a pair of openings that are provided and rotate on the guide bar 67 are arranged (see Japanese Patent Application No. 004-133069).
- the cutting means 43 advances and retreats via an arm 90 extending along the moving direction of the affixing table 40, and a uniaxial robot 91 provided on the lower surface of the distal end side (left end in FIG. 3) of the arm 90. And a cutter unit 92 provided in a possible manner.
- the cutter unit 92 includes a cutter vertical cylinder 95 supported by a bracket 94 that moves along a uniaxial robot 91, and a cutter 96 attached to the tip of the cutter vertical cylinder 95.
- the cutter up / down cylinder 95 is attached to the bracket 94 so as to be rotatable in a substantially vertical plane, whereby the cutter 96 is positioned in a state in which the tip position of the cutter 96 follows an arc locus in the substantially vertical plane.
- the angle of the blade can be adjusted, and it is set so that the adhesive sheet S does not protrude from the wafer W at the time of circular cutting described later, and the uniaxial robot 91 extends along the extending direction of the arm portion 90. It is possible to advance and retreat.
- the cutting means 43 is supported so as to be movable by driving the motor M3 on a guide 97 oriented in a direction perpendicular to the moving direction of the sticking table 40 (Y direction in FIG.
- the transfer device 45 includes a plate-like adsorption plate 100 that adsorbs the wafer W to the lower surface side, and a temperature adjustment unit 10 provided on the upper surface side of the adsorption plate 100. 1, an arm 102 that supports the suction plate 100, and a uniaxial robot 105 that moves the arm 102 in the Y direction.
- the suction plate 100 has a temporary temperature (110), which is the first temperature when the original sheet LS is cut in the width direction on the sticking table 40 and the wafers W are adsorbed.
- the wafer W having a temperature of (C) is cooled to room temperature, for example, and the viscosity of the adhesive sheet S is reduced or eliminated to prevent the transfer of the adhesive to the cutter 96.
- the transfer device 45 transfers Ueno and W from the affixing table 40 to the outer cutting table 47, and transfers the wafer W from the outer cutting table 47 to the bonding table 48.
- the wafer W after the adhesive sheet S is completely bonded by the bonding table 48 is transferred to the next process.
- the transfer device 45 is mounted from the bonding table 48 by the temperature adjustment unit 101 while being transferred from the sticking table 40 to the outer cutting table 47 and from the outer cutting table 47 to the bonding table 48.
- the temperature of the wafer W is adjusted so that the temperature adjustment time after the transfer of the wafer is not required or shortened. Yes.
- the uniaxial robot 105 is disposed substantially parallel to the guide 97 at an upper position of the guide 97 of the cutting means 43.
- This single-axis robot 105 is provided with a cylinder 106 extending in a direction perpendicular to the vertical direction and a lift slider 108 that can be lifted and lowered via the cylinder 106.
- the lift slider 108 has a base end side of the arm 102 (FIG. 5). The middle right end) is connected!
- the outer periphery cutting table 47 receives the wafer W from the sticking table 40 via the transfer device 45, sucks it, and cuts the unnecessary raw material portion S1 around the wafer W by the cutting means 43.
- the wafer W is brought into a fixed position. It is a table for supporting.
- the outer periphery cutting table 47 is maintained at room temperature as the second temperature.
- the upper surface is formed as an adsorption surface, and a circle corresponding to the periphery of the outer periphery of the wafer W is formed.
- a circumferential groove 47A is provided.
- the outer periphery cutting table 47 is supported on the ascending / descending plate 111 via the rotating mechanism 110 driven by the motor M4 on the lower surface side, and is provided to be rotatable in a plane. Accordingly, when the cutter 96 enters the circumferential groove 47A and the outer periphery cutting table 47 rotates, the function of cutting the original fabric LS in the circumferential direction, that is, circumferential cutting is achieved.
- the cutting in the circumferential direction can also be achieved by configuring the cutter unit 92 to be rotatable within a horizontal plane.
- the elevating plate 111 that supports the outer periphery cutting table 47 is provided so as to be elevable via an elevating device 120.
- the lifting device 120 includes a block 123 attached to the back side of a substantially L-shaped support 122 that supports the lifting plate 111, and is connected to both sides of the support 122.
- the pulleys 127 and 128 fixed to the output shaft of the motor M5 disposed near the lower end of the guide 125, and the belt 129 wound around these pulleys 127 and 128, are driven by the motor M5. Therefore, the outer periphery cutting table 47 can be moved up and down by rotating the screw shaft 126.
- the bonding table 48 is arranged on an upper side portion of the outer periphery cutting table 47 through a frame (not shown).
- the bonding table 48 has an upper surface configured as a suction surface.
- the wafer W is transferred from the outer peripheral cutting table 47 via the transfer device 45 and the wafer W to which the adhesive sheet S is temporarily attached is attached. By heating, the adhesive sheet S is completely bonded to the wafer W.
- the bonding table 48 is controlled to about 180 ° C. as the third temperature.
- the sheet peeling apparatus 50 is disposed on the side of the outer periphery cutting table 47.
- This sheet peeling apparatus 50 includes a peeling sheet PS located on the wafer W and an unnecessary original fabric portion located on the outer circumferential side of the wafer W, out of the original fabric LS attached to the wafer W on the outer periphery cutting table 47. Attaching the release tape ST to S 1 and winding it up Therefore, it is configured as an apparatus for peeling them simultaneously.
- the stripping tape ST has a strip shape that is considerably narrower than the diameter of the wafer W, that is, provided with such a width that the stripping described later can be realized without any inconvenience. Can be suppressed.
- the sheet peeling device 50 will be described in more detail. As shown in FIG. 6, the sheet peeling device 50 is a base frame provided so as to form a substantially rectangular parallelepiped shape by connecting prismatic members vertically and horizontally. BF, a support plate 130 arranged in a substantially vertical plane above the base frame BF, and a roll-shaped peeling tape ST rotatably supported on the support plate 130 are fed out to support the feeding.
- the roll 132, the upper guide roll 133 and the lower guide roll 134 that guide the peeling tape ST fed out from the feeding roll 132, and the peeling tape ST fed out through the lower guide roll 134 are not required.
- the roll 135 that constitutes the laminating section with the function of pasting the release sheet PS on top and the function of winding the applied release tape ST, and the roll 135 in both axial directions.
- a support arm 140 having a cylinder 139 for moving the bracket 137 that is rotatably supported on the side in the vertical direction, and a uniaxial robot that supports the support arm 140 so that the roll 135 is relatively moved along the surface of the wafer W 142 and a take-up roll 144 that winds up the peeling tape ST.
- a motor M6 capable of forward and reverse rotation is disposed at a lateral position of the feeding roll 132.
- Pulleys 146 and 147 are fixed around the output shaft of the motor M6 and the feeding roll 132, and a belt 149 is wound around the pulleys 146 and 147 so that the feeding roll 132 can be rotated forward and backward.
- the upper guide roll 133 is rotatably provided by a motor M7 disposed on the back surface side of the support plate 130, and a pinch roll 151 is disposed at a position in contact with the outer peripheral surface of the upper guide roll 133! .
- the pinch roll 151 is provided so as to be separated from and approachable to the upper guide roll 133 via a cylinder 153.
- the support arm 140 has a substantially L-shaped planar shape, and one side thereof is provided so as to be movable along the rail portion 142A of the uniaxial robot 142.
- the take-up roll 144 is supported on the free end side of the swing arm 154.
- the peristaltic arm 154 is supported by a bracket 155 whose base is located below the base frame BF.
- the free end side is urged counterclockwise in FIG. 7 by a coil spring 156 provided between the bracket 155 and the rotating arm 154 so as to contact the outer peripheral surface of the drive roll 158.
- a pulley (not shown) is fixed to the rotating shaft of the drive roll 158, and is provided so as to rotate via a belt 161 wound around the pulley 160 fixed to the output shaft of the motor M8 with brake. It has been.
- Reference numeral 162 in FIG. 7 denotes a guide roll.
- the wafer W with the protective tape PT attached to the circuit surface is transferred to the UV irradiation unit 13 by the robot 12 and subjected to a predetermined UV treatment, and the wafer W after the UV curing treatment is again robotized. Alignment processing is performed by being transferred to the alignment table 34 via Thereafter, the wafer W is again transferred to the pasting table 40 via the robot 12. At this time, the protective tape PT is adsorbed in contact with the table surface. Therefore, in this state, the back surface of the wafer W is the upper surface side.
- the sticking table 40 moves to the right side in FIG. 3 and the press roll 78 rotates, and the adhesive sheet S of the raw fabric LS that is fed out sequentially is stuck on the upper surface of the wafer W.
- the unnecessary raw fabric portion S1 that protrudes from the outer periphery of the wafer W is weakly bonded to the outer table with an adhesive force, so that when the press roll 78 rotates on the wafer W! There is no inconvenience of generating wrinkles by being pulled by the tension of the raw fabric LS and the pressing force of the press roll 78.
- the press roll 78 is controlled to maintain approximately 110 ° C by a heater that is a built-in heating means! RU
- the adhesive sheet S portion of the original fabric LS is attached to the wafer W, as shown in FIG.
- the attaching table 40 reaches the position almost directly above the outer peripheral cutting table 47.
- the pressing member 76 is lowered to bring the original fabric LS into contact with the sticking table 40.
- the cutter 96 of the cutting means 43 enters the cutter receiving groove 40A, supports the cutter unit 92, and the arm 90 moves in the direction perpendicular to the paper surface in FIG. 4 to cut the original fabric LS in the width direction. Cut into pieces.
- the pressing member 76 adsorbs the raw fabric LS located on the lower surface side of the pressing member 76 and returns to the raised position to prepare for the next bonding to the wafer W. Further, the cutting means 43 is displaced to a position where the cutting edge position of the cutter 96 rises due to the raising of the cutter up / down cylinder 95 and moves away from the upper surface position of the application table 40, that is, upward in FIG. It will be evacuated.
- the suction plate 100 of the transfer device 45 moves so as to be positioned above the sticking table 40 by the operation of the -axis robot 105 and the lowering of the cylinder 106, and the surface position of the suction plate 100 is lowered.
- the affixing table 40 moves to the original position (see FIG. 3) where the wafer W to be processed next is sucked and held (see FIG. 3), and at the same time, the outer peripheral cutting table 47 is raised and the upper surface of the cutting table 47 is The wafer W sucked on the suction plate 100 is transferred.
- the wafer W that has reached the temporary attachment temperature on the sticking table 40 is subjected to a temperature adjustment action (cooling action) while being adsorbed to the adsorption plate 100, and is kept in a state of being lowered to substantially normal temperature. .
- the transfer device 45 moves in a direction away from the upper position force of the outer periphery cutting table 47, while the cutting means 43 is moved to the outer periphery cutting. Move to table 47. Then, by moving the uniaxial robot 91 by a predetermined amount and lowering the cutter vertical cylinder 95, the cutter 96 penetrates downward at a position substantially corresponding to the outer peripheral edge of the wafer W, and the tip is received in the circumferential groove 47A. .
- the outer periphery cutting table 47 is rotated in the horizontal plane by the rotation mechanism 110, and the unnecessary raw material portion S1 protruding outside the outer periphery of the wafer W is cut along the circumferential direction via the force tutter 96. (Refer to Fig. 8 (A) and (B)).
- the cutting means 43 moves to the position where the upper position force of the outer periphery cutting table 47 is retracted again, while peeling. The peeling process described below is performed by the apparatus 50.
- the sheet peeling apparatus 50 is in the initial position in which the roll 135 is in the state shown in FIG. 1, that is, in the position retracted to the right with respect to the outer circumferential cutting table 47. It moves forward to the table 47 side.
- the motor M6 rotates in the direction to feed out the peeling tape ST, and a constant tension is applied to the peeling tape ST between the upper guide roll 133 and the roll 135 by the motor M7. Will be.
- the brake motor M8 is braked and locked.
- roll 135 is lowered by cylinder 139, and peeling tape ST extends along the radial direction of wafer W.
- 8 (C) Affixed to all right and left areas. That is, the peeling tape ST is pasted so as to straddle the unnecessary raw fabric portion S1, Ueno, and the peeling sheet PS portion on W.
- the motors M6 and M7 are reversed, and the roll 135 returns to the initial position while rotating in the opposite direction to that when the peeling tape ST is applied (see FIG. 8D).
- the release sheet PS on the wafer W is simultaneously peeled off together with the unnecessary raw fabric portion S1 (see FIG. 8E).
- the brake motor M8 is unlocked, the drive roll 158 is rotated by the motor and wound around the take-up roll 144, and the feed roll 132 is fed in the feed direction of the original fabric LS.
- unnecessary portions or regions of the original fabric LS peeled off by the peeling tape ST are wound up.
- the rotary arm 154 swings in the direction of the arrow in FIG. 7, and winding is performed as indicated by a two-dot chain line.
- the transfer device 45 moves onto the outer periphery cutting table 47, and once again adsorbs the wafer W, the temperature required for complete adhesion of the wafer W via the temperature adjustment unit. It is transferred to the upper surface of the bonding table 48 while being raised.
- the wafer W transferred to the bonding table 48 is controlled so that the bonding table 48 is maintained at approximately 180 ° C., which is the third temperature, so that the adhesive sheet S is transferred to the wafer. , W will be completely bonded to W. Then, after a predetermined time has elapsed, the wafer W is sucked by the suction plate 100 of the transfer device 45 and is subjected to a temperature adjustment operation for returning to normal temperature. [0047] Wafer W that has fallen in temperature while being attracted to transfer device 45 is transferred to mounting device 18 side, mounted on ring frame RF via dicing tape DT, and then protective tape PT is peeled off. Then, it is stored in the stocker, and a series of wafer processing operations are completed. The processing after the mounting process is the same as that of the aforementioned Japanese Patent Application No. 2004-133069.
- the peeling sheet positioned on the wafer and the outer side raw fabric portion can be peeled or removed at the same time, so that the peeling is performed without complicating the apparatus configuration. And the wafer processing time can be shortened.
- the adhesive sheet S is applied to the wafer W by the pressing force of the press roll, the adhesive sheet S is applied in the state of the raw sheet LS laminated on the release sheet PS, that is, before the adhesive sheet S is applied. Since the adhesive sheet S and the release sheet PS are not separated at the stage, the adhesive sheet S is subjected to the application pressure with the release sheet PS interposed between the press roll 78 and the adhesive sheet S. It is possible to surely prevent the press roll 78 from being damaged.
- the present invention is not limited to this. It is also possible to use an original fabric that has been provided in the form of a single sheet, and attach the adhesive sheet S to the wafer W to peel off unnecessary parts.
- the sheet peeling device 50 may arbitrarily change the configuration, layout, and the like of each part of the device as long as it can produce substantially the same action.
- the adhesive sheet S is not limited to a sheet for die bonding, and may be a protective sheet that is stuck to form a protective film! /.
- the plate-like body is not limited to a semiconductor wafer, and the planar shape of the plate-like body that can be an information recording medium such as an optical disk or DVD may be a polygonal shape such as a polarizing plate that is formed only by a circular object. . It is conceivable to use a double-sided adhesive sheet or the like as the adhesive sheet when processing these plate-like bodies.
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Dicing (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020067025573A KR20070032950A (ko) | 2004-06-25 | 2005-06-22 | 시트 박리장치 및 박리방법 |
EP05753439A EP1760773A1 (en) | 2004-06-25 | 2005-06-22 | Sheet peeling device and method |
US11/629,863 US20080011412A1 (en) | 2004-06-25 | 2005-06-22 | Sheet Peeling Apparatus and Peeling Method |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004-187518 | 2004-06-25 | ||
JP2004187518A JP4509666B2 (ja) | 2004-06-25 | 2004-06-25 | シート剥離装置及び剥離方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2006001289A1 true WO2006001289A1 (ja) | 2006-01-05 |
Family
ID=35779978
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2005/011408 WO2006001289A1 (ja) | 2004-06-25 | 2005-06-22 | シート剥離装置及び剥離方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US20080011412A1 (ja) |
EP (1) | EP1760773A1 (ja) |
JP (1) | JP4509666B2 (ja) |
KR (1) | KR20070032950A (ja) |
CN (1) | CN1977371A (ja) |
TW (1) | TW200618130A (ja) |
WO (1) | WO2006001289A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110676207A (zh) * | 2019-09-27 | 2020-01-10 | 云谷(固安)科技有限公司 | 分离装置以及分离方法 |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4746002B2 (ja) * | 2007-05-07 | 2011-08-10 | リンテック株式会社 | 移載装置及び移載方法 |
EP2003184A1 (de) * | 2007-06-16 | 2008-12-17 | Scheuten Glasgroep B.V. | Verfahren zur Herstellung eines Brandschutzmittels |
WO2009092646A2 (en) * | 2008-01-25 | 2009-07-30 | Oerlikon Assembly Equipment Ag, Steinhausen | Method and apparatus for mounting a piece of foil on a substrate |
KR101476849B1 (ko) * | 2008-07-18 | 2014-12-30 | 엘지전자 주식회사 | 박리 및 안착 통합 장치와, 이를 이용한 액정표시장치의제조방법 |
JP2010080838A (ja) | 2008-09-29 | 2010-04-08 | Lintec Corp | シート貼付装置及び貼付方法 |
JP5441516B2 (ja) * | 2009-06-25 | 2014-03-12 | ジェーシーシーエンジニアリング株式会社 | シート切断方法およびシート切断装置 |
JP2012143846A (ja) * | 2011-01-13 | 2012-08-02 | Disco Corp | シートカット装置 |
AT510561B1 (de) * | 2011-02-21 | 2012-05-15 | Inova Lisec Technologiezentrum | Verfahren und vorrichtung zum handhaben von folien-zuschnitten |
KR101981639B1 (ko) * | 2012-11-13 | 2019-05-27 | 삼성디스플레이 주식회사 | 시트 커팅 장치 및 그것을 이용한 시트 커팅 방법 |
US9613845B2 (en) * | 2014-01-17 | 2017-04-04 | Taiwan Semiconductor Manufacturing Company, Ltd. | Immersion de-taping |
JP6378910B2 (ja) * | 2014-03-19 | 2018-08-22 | 日東電工株式会社 | 剥離装置及び剥離方法 |
JP6580408B2 (ja) * | 2015-07-30 | 2019-09-25 | 株式会社ディスコ | 剥離方法および剥離装置 |
JP6597082B2 (ja) * | 2015-09-07 | 2019-10-30 | 株式会社村田製作所 | シート付与装置およびそれを用いた電子部品の製造方法 |
WO2017043862A1 (ko) * | 2015-09-07 | 2017-03-16 | 주식회사 엘지화학 | 판상 물질의 박리 장치 |
DE102017105195A1 (de) | 2017-03-10 | 2018-09-13 | Leibniz-Institut Für Polymerforschung Dresden E.V. | Verfahren zur differenzierten Sequestrierung von Stoffen verschiedener Stoffgruppen mit Hilfe von sulfatierte oder sulfonierte Komponenten enthaltenden Hydrogelen |
CN106935534B (zh) * | 2017-04-28 | 2019-11-05 | 京东方科技集团股份有限公司 | 封装装置及显示面板封装方法 |
KR102448726B1 (ko) | 2017-08-14 | 2022-09-28 | 삼성전자주식회사 | 라미네이팅 장치 및 그를 이용하는 반도체 패키지 제조 방법 |
EP3598480B1 (en) * | 2018-07-18 | 2020-09-23 | Infineon Technologies AG | Device and method for debonding a structure from a main surface region of a carrier |
CN112743963B (zh) * | 2020-12-29 | 2023-02-28 | 北京半导体专用设备研究所(中国电子科技集团公司第四十五研究所) | 一种膜片剥离装置 |
CN113844156B (zh) * | 2021-09-08 | 2023-05-12 | 四川轻化工大学 | 一种复合钢板上下钢皮剥离装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0648642A (ja) * | 1992-07-27 | 1994-02-22 | Nitto Denko Corp | 粘着体転写装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6080263A (en) * | 1997-05-30 | 2000-06-27 | Lintec Corporation | Method and apparatus for applying a protecting film to a semiconductor wafer |
JP3837320B2 (ja) * | 2001-11-07 | 2006-10-25 | リンテック株式会社 | 光ディスクの貼合装置 |
-
2004
- 2004-06-25 JP JP2004187518A patent/JP4509666B2/ja not_active Expired - Fee Related
-
2005
- 2005-06-22 EP EP05753439A patent/EP1760773A1/en not_active Withdrawn
- 2005-06-22 WO PCT/JP2005/011408 patent/WO2006001289A1/ja not_active Application Discontinuation
- 2005-06-22 KR KR1020067025573A patent/KR20070032950A/ko not_active Application Discontinuation
- 2005-06-22 US US11/629,863 patent/US20080011412A1/en not_active Abandoned
- 2005-06-22 CN CNA2005800212841A patent/CN1977371A/zh active Pending
- 2005-06-24 TW TW094121242A patent/TW200618130A/zh unknown
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0648642A (ja) * | 1992-07-27 | 1994-02-22 | Nitto Denko Corp | 粘着体転写装置 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110676207A (zh) * | 2019-09-27 | 2020-01-10 | 云谷(固安)科技有限公司 | 分离装置以及分离方法 |
CN110676207B (zh) * | 2019-09-27 | 2021-11-16 | 云谷(固安)科技有限公司 | 分离装置以及分离方法 |
Also Published As
Publication number | Publication date |
---|---|
CN1977371A (zh) | 2007-06-06 |
JP2006013104A (ja) | 2006-01-12 |
EP1760773A1 (en) | 2007-03-07 |
JP4509666B2 (ja) | 2010-07-21 |
KR20070032950A (ko) | 2007-03-23 |
TW200618130A (en) | 2006-06-01 |
US20080011412A1 (en) | 2008-01-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2006001289A1 (ja) | シート剥離装置及び剥離方法 | |
JP4795743B2 (ja) | 貼付装置 | |
TWI388024B (zh) | 工件貼付支持方法及利用該方法之工件貼附支持裝置 | |
JP5261522B2 (ja) | 貼付装置及び貼付方法 | |
JP4740297B2 (ja) | マウント装置及びマウント方法 | |
JP4452549B2 (ja) | ウエハ処理装置 | |
JP4485248B2 (ja) | 剥離装置及び剥離方法 | |
WO2006051684A1 (ja) | シート切断方法及びマウント方法 | |
WO2006057376A1 (ja) | 脆質部材の処理装置 | |
JP2006187862A (ja) | 切断装置及び切断方法 | |
JP4371890B2 (ja) | 貼付装置及び貼付方法 | |
JP2004349435A (ja) | 基板へのダイシング・ダイボンドテープの貼り付け装置 | |
JP2012028591A (ja) | 基板へのシート貼付装置 | |
TWI305663B (en) | Protective tape applying and separating method | |
WO2005101486A1 (ja) | ウエハ処理装置及びウエハ処理方法 | |
JP4886971B2 (ja) | 貼付装置 | |
JP3200938U (ja) | シート剥離装置 | |
JP6562778B2 (ja) | シート剥離装置および剥離方法 | |
JP4773063B2 (ja) | 貼付テーブル | |
WO2006123508A1 (ja) | 脆質部材の処理装置 | |
JP4922371B2 (ja) | ウエハ処理装置及び処理方法 | |
JP2005297458A (ja) | 貼付装置 | |
JP4689972B2 (ja) | ウエハ処理装置及びウエハ処理方法 | |
JP4057478B2 (ja) | シート剥離装置及び剥離方法 | |
JP7075307B2 (ja) | テープ剥離方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A1 Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BW BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS KE KG KM KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NA NG NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SM SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW |
|
AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): BW GH GM KE LS MW MZ NA SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LT LU MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
WWE | Wipo information: entry into national phase |
Ref document number: 2005753439 Country of ref document: EP |
|
WWE | Wipo information: entry into national phase |
Ref document number: 1020067025573 Country of ref document: KR |
|
WWE | Wipo information: entry into national phase |
Ref document number: 11629863 Country of ref document: US |
|
WWE | Wipo information: entry into national phase |
Ref document number: 12006502582 Country of ref document: PH |
|
WWE | Wipo information: entry into national phase |
Ref document number: 200580021284.1 Country of ref document: CN |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
WWW | Wipo information: withdrawn in national office |
Country of ref document: DE |
|
WWP | Wipo information: published in national office |
Ref document number: 2005753439 Country of ref document: EP |
|
WWP | Wipo information: published in national office |
Ref document number: 1020067025573 Country of ref document: KR |
|
WWW | Wipo information: withdrawn in national office |
Ref document number: 2005753439 Country of ref document: EP |
|
WWP | Wipo information: published in national office |
Ref document number: 11629863 Country of ref document: US |