WO2005050836A1 - 端面反射型弾性表面波装置及びその製造方法 - Google Patents
端面反射型弾性表面波装置及びその製造方法 Download PDFInfo
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- WO2005050836A1 WO2005050836A1 PCT/JP2004/016603 JP2004016603W WO2005050836A1 WO 2005050836 A1 WO2005050836 A1 WO 2005050836A1 JP 2004016603 W JP2004016603 W JP 2004016603W WO 2005050836 A1 WO2005050836 A1 WO 2005050836A1
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- thin film
- piezoelectric thin
- acoustic wave
- surface acoustic
- wave device
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Classifications
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02614—Treatment of substrates, e.g. curved, spherical, cylindrical substrates ensuring closed round-about circuits for the acoustical waves
- H03H9/02629—Treatment of substrates, e.g. curved, spherical, cylindrical substrates ensuring closed round-about circuits for the acoustical waves of the edges
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02637—Details concerning reflective or coupling arrays
- H03H9/02669—Edge reflection structures, i.e. resonating structures without metallic reflectors, e.g. Bleustein-Gulyaev-Shimizu [BGS], shear horizontal [SH], shear transverse [ST], Love waves devices
Definitions
- Edge reflection type surface acoustic wave device and method of manufacturing the same
- the present invention relates to an edge-reflection type surface acoustic wave device and a method of manufacturing the same, and more particularly, to an edge-reflection type surface acoustic wave device having a structure in which a piezoelectric thin film and an interdigital electrode force S are laminated in this order on a substrate.
- the present invention relates to a surface acoustic wave device and a method for manufacturing the same.
- a surface acoustic wave mainly composed of a SH wave or a longitudinal wave is used, and the surface wave is reflected between a pair of end faces of a substrate.
- Various end-face reflective surface acoustic wave devices are known!
- FIG. 9 is a perspective view showing an end-face reflection type surface acoustic wave device disclosed in Patent Document 3.
- IDT electrodes 103 and 104 are formed on a surface acoustic wave substrate 102.
- the IDT electrodes 103 and 104 are arranged along the surface wave propagation direction.
- Reflecting end faces 102b and 102c are provided along the outermost electrode fingers of IDTs 103 and 104.
- the excited surface wave is configured to be reflected between the reflection end faces 102b and 102c.
- a piezoelectric substrate is used as the surface acoustic wave substrate 102, but it may be formed of an insulating substrate or a structure in which a piezoelectric thin film is laminated on a piezoelectric substrate.
- the reflection end faces 102b and 102c are formed by applying a groove force from the upper surface 102a of the surface acoustic wave substrate 102 using a cutting blade.
- the reflection end faces 102b and 102c are formed by the groove processing by the cutting blade so as not to penetrate the surface acoustic wave substrate 102. Therefore, it is said that chipping of the substrate can be reduced.
- Patent Document 4 discloses an edge-reflection surface acoustic wave device in which a ladder-type filter is configured.
- FIG. 10 is a perspective view showing the end-face reflection type surface acoustic wave device described in Patent Document 4.
- the surface acoustic wave substrate 121 is fixed on the package substrate 130.
- the surface wave substrate 121 is constituted by a piezoelectric substrate.
- three series arm resonators S1 to S3 composed of end face reflection type surface acoustic wave resonators and six parallel arm resonators P1 to P6 are configured.
- Grooves 122 and 123 are formed on the upper surface of the surface acoustic wave substrate 121 in parallel with the direction in which the electrode fingers of each resonator extend.
- the grooves 122 and 123 are formed by dicing or the like.
- the parallel arm resonators PI, P4, and P5 use one end face 122a of the groove 122 and the end face 121a of the surface acoustic wave substrate 121 as a pair of reflection end faces.
- the series arm resonators S1-S3 use the end face 122b of the groove 122 and the end face 123a of the groove 123 as a pair of reflection end faces.
- the parallel arm resonators P2, P3, and P6 use the end face 123b of the groove 123 and the end face 121b of the surface acoustic wave substrate 121 as a pair of reflection end faces.
- Each resonator is electrically connected by a bonding wire so that the series arm resonators S1 to S3 and the parallel arm resonators P1 to P6 form a ladder circuit.
- Patent Document 5 discloses an end-face reflection type surface acoustic wave device schematically shown in FIG. That is, in the end-face reflection type surface acoustic wave device 141, a first-stage end-face reflection type longitudinally coupled resonator filter 143 and a second-stage end-face reflection type longitudinally coupled resonator filter 144 are formed on the surface wave substrate 142. The end face reflection type longitudinally coupled resonator filters 143 and 144 are cascaded.
- each of the end face reflection type longitudinally coupled resonator filter 143 and the end face reflection type vertical coupled resonator filter 144 uses a pair of reflection end faces 142a and 142b.
- the reflection end faces 142a and 142b are formed by processing the surface acoustic wave substrate 142 along the outermost electrode fingers so as to be parallel to the direction in which the electrode fingers extend.
- the end surfaces 142a and 142b are formed by cutting the force on the upper surface 142c of the surface acoustic wave substrate 142 using a dicer.
- Patent Document 1 JP-A-7-263998
- Patent Document 2 Japanese Patent Application Laid-Open No. 9-294045
- Patent Document 3 JP-A-2000-278091
- Patent Document 4 JP-A-11 46127
- Patent Document 5 JP-A-2002-261573
- the reflection end surface is formed by performing cutting from the upper surface side of the surface acoustic wave substrate using a dicer-cutting blade. It had been. Therefore, the position of the reflection end face tends to shift to a desired position force due to a variation in the positional accuracy of the dicer or the like. For this reason, undesired ripples tend to occur due to the displacement of the reflection end face.
- the reflection end face is formed by cutting using a dicer or the like, even if a groove is formed through the surface acoustic wave substrate 102 as shown in FIG. Since the substrate was cut, chipping in which a part of the substrate was chipped sometimes occurred. If chipping occurs at a part of the reflection end face, it becomes difficult to sufficiently reflect the surface wave. Therefore, there is a problem that the impedance ratio, which is the ratio of the impedance at the anti-resonance point to the impedance at the resonance point, becomes small.
- the plurality of parallel arm resonators P1, P4, P5 share the end face 121a and the end face 122a.
- the series arm resonators S1-S3 also share a pair of end faces 122b, 123a
- the parallel arm resonators P2, P3, P6 also have a common pair of end faces 121b, 123b. Therefore, it is necessary to make the distance between the reflection end faces of a plurality of surface acoustic wave resonators equal, and the degree of freedom in design is small. Not only that, since bonding wires are used to connect the surface acoustic wave resonators, it has been difficult to reduce the size and reduce the height.
- the first end face reflection type longitudinally coupled resonator filter 143 and the second stage end face reflection type longitudinally coupled resonator filter 144 In either case, the end surfaces 142a and 142b of the piezoelectric substrate 142 are used as reflection end surfaces. Therefore, in the end face reflection type longitudinally coupled resonator filters 143 and 144, it is necessary to make the distance between the pair of reflection end faces equal, and the degree of freedom in design is small.
- An object of the present invention is to provide a reflective end face that can be formed with high precision in view of the above-described current state of the art, and to suppress deterioration in characteristics due to variations in the position of the reflective end face.
- the present invention relates to an edge-reflective surface acoustic wave device including a substrate, a piezoelectric thin film formed on the substrate, and an interdigital electrode formed on the piezoelectric thin film.
- a reflector provided near the outermost electrode finger of the electrode and reflecting the excited surface wave is not provided on the substrate, but is provided on the piezoelectric thin film.
- the reflection portion is a concave portion having a reflection end surface extending in parallel to a direction in which the electrode finger extends.
- the recess is provided as a groove penetrating the piezoelectric thin film.
- the piezoelectric thin film is formed of a piezoelectric single crystal thin film.
- LiNbO or LiTaO is preferably used as the piezoelectric single crystal thin film.
- the substrate is a LiNbO substrate
- the piezoelectric thin film is made of LiNbO or LiTaO.
- the substrate is a LiTaO substrate
- the piezoelectric thin film is made of LiNbO or LiTaO.
- the device further includes a buffer layer disposed between the substrate and the piezoelectric thin film.
- the device further includes an SiO film formed so as to cover the interdigital electrode and the piezoelectric thin film.
- an SiO film formed between the substrate and the piezoelectric thin film is further provided.
- the method for manufacturing an edge-reflection surface acoustic wave device includes a step of preparing a substrate, a step of forming a piezoelectric thin film on the substrate, and an interdigital A step of forming a pole; and a step of forming, on the piezoelectric thin film, a reflecting portion disposed near an outermost electrode finger of the interdigital electrode.
- the formation of the reflection portion is performed by etching the piezoelectric thin film.
- the step of forming a reflection portion on the piezoelectric thin film is the same as the step of forming the piezoelectric thin film. Is done.
- the step of forming a reflection portion on the piezoelectric thin film includes forming the interdigital electrode on the piezoelectric thin film. It is done after doing.
- the reflection portion provided near the outermost electrode finger of the interdigital electrode and reflecting the excited surface wave is disposed on the substrate. It is provided on the piezoelectric thin film. Accordingly, the piezoelectric thin film can be processed with higher precision and easier than a hard substrate, so that the accuracy of the reflection end face can be improved. Therefore, it is possible to prevent variations and deterioration in the characteristics of the end face reflection type surface acoustic wave device.
- the reflection portion for forming the reflection end face as described above is provided on the piezoelectric thin film.
- a reflecting portion may be provided by forming a concave portion or the like so as to reach the substrate beyond the piezoelectric thin film.
- the processing of the concave portion and the like for forming the reflective portion extends to the substrate beyond the piezoelectric thin film, but the reflective end face is constituted only by the inner surface of the concave portion and the like provided in the piezoelectric thin film. Therefore, the reflection end face itself is hardly affected by chipping or the like. Therefore, the accuracy of the reflection end face can be effectively improved. More preferably, it is desirable that the reflecting portion is provided only on the piezoelectric thin film. That is, the reflection portion is preferably not provided on the substrate, but is provided on the piezoelectric thin film disposed on the substrate.
- the reflecting portion can be formed with high accuracy and the reflecting portion only needs to be formed only on the piezoelectric thin film, the degree of freedom in design can be increased.
- the degree of freedom in design can be increased.
- in a structure having a plurality of end-reflection surface acoustic wave resonators and filters it is possible to easily form the optimum reflection part for each of the plurality of end-reflection surface acoustic wave resonators and filters by processing the piezoelectric thin film. it can.
- wiring electrodes and the like can be formed on the piezoelectric thin film, the number of bonding wires can be reduced or the number of bonding wires can be reduced. Therefore, it is possible to reduce the size and height of the end surface reflection type surface acoustic wave device.
- the reflecting portion is a concave portion having a reflecting end face extending in parallel to the direction in which the electrode fingers extend
- the reflecting end face can be easily formed simply by processing the piezoelectric thin film by etching or the like. can do.
- the concave portion is provided as a groove penetrating the piezoelectric thin film
- the concave portion may reach the substrate below the piezoelectric thin film beyond the groove penetrating the piezoelectric thin film.
- the reflection end surface is formed by the inner surface of the groove provided in the piezoelectric thin film. Therefore, since it is not necessary to process the substrate for forming the reflection end face itself, it is unlikely that the accuracy of the reflection end face is reduced by chipping or the like.
- the piezoelectric thin film is composed of a piezoelectric single crystal thin film, good characteristics can be obtained because the electromechanical coupling coefficient is larger than that of a piezoelectric polycrystalline film.
- the piezoelectric single crystal thin film is one selected from LiNbO or LiTaO force.
- a large electromechanical coupling coefficient can be obtained.
- the substrate is a LiNbO substrate and the piezoelectric thin film is LiNbO or LiTaO
- the substrate force is an SLiTaO substrate, and the piezoelectric thin film is LiNbO or LiTaO.
- a piezoelectric single crystal film is obtained.
- a buffer layer is further provided between the substrate and the piezoelectric thin film, the crystallinity of the piezoelectric thin film can be improved, and the adhesion of the piezoelectric thin film to the substrate can be improved.
- Wave number temperature characteristics can be improved.
- the reflecting portion arranged near the outermost electrode finger of the interdigital electrode is formed on the piezoelectric thin film. Therefore, the reflection end face can be formed only by treating the piezoelectric thin film so as to form the reflection portion on the piezoelectric thin film. Therefore, the accuracy of the position of the reflection end face can be improved, and an end face reflection type surface acoustic wave device excellent in reproducing the formation can be provided. In addition, since chipping of the substrate does not occur, deterioration of characteristics due to chipping hardly occurs.
- the processing at the time of forming the reflection end face is performed by processing the piezoelectric thin film so as to form the reflection portion only on the piezoelectric thin film that is not a substrate.
- the step of forming the reflecting portion on the piezoelectric thin film is performed by etching a portion where the reflecting portion is provided, the reflecting end face is raised by etching. It can be formed accurately and easily.
- the step of forming the reflection portion on the piezoelectric thin film may be performed in the step of forming the piezoelectric thin film.
- the reflection portion can be formed simultaneously with the formation of the thin film.
- the reflecting portion on the piezoelectric thin film is formed with high precision near the outermost electrode finger of the interdigital electrode. be able to.
- FIGS. 1 (a) and 1 (b) are a perspective view and a front sectional view of an edge-reflective surface acoustic wave device according to a first embodiment of the present invention.
- FIGS. 2 (a) to 2 (d) are views of an edge-reflection surface acoustic wave device according to an embodiment of the present invention. It is each partial notch front sectional drawing which shows a manufacturing process.
- FIG. 3 is a partially cutaway front view showing a state in which a concave portion is formed by etching in the method for manufacturing an edge-reflective surface acoustic wave device according to the present invention.
- FIGS. 4 (a) and 4 (b) are front views of respective partially cutouts showing a modification of a process for forming a reflection portion in the method of manufacturing an edge-reflection surface acoustic wave device according to the present invention. It is sectional drawing.
- FIG. 5 is a front cross-sectional view for explaining a modification of the edge-reflection surface acoustic wave device according to the present invention.
- FIG. 6 is a front cross-sectional view for explaining another modification of the edge-reflection surface acoustic wave device according to the present invention.
- FIG. 7 is a perspective view showing an edge-reflective surface acoustic wave device according to a second embodiment of the present invention.
- FIG. 8 is a perspective view showing a conventional edge-reflective surface acoustic wave device, which is a conventional edge-reflective surface acoustic wave device, which is described as a comparative example of the embodiment shown in FIG. 7.
- FIG. 8 is a perspective view showing a conventional edge-reflective surface acoustic wave device, which is a conventional edge-reflective surface acoustic wave device, which is described as a comparative example of the embodiment shown in FIG. 7.
- FIG. 8 is a perspective view showing a conventional edge-reflective surface acoustic wave device, which is a conventional edge-reflective surface acoustic wave device, which is described as a comparative example of the embodiment shown in FIG. 7.
- FIG. 8 is a perspective view showing a conventional edge-reflective surface acoustic wave device, which is a conventional edge-reflective surface acoustic wave device, which is described as a comparative example of the embodiment shown in FIG. 7.
- FIG. 9 is a perspective view showing another example of a conventional edge reflection type surface acoustic wave device.
- FIG. 10 is a perspective view showing still another example of a conventional edge reflection type surface acoustic wave device.
- FIG. 11 is a perspective view showing still another example of a conventional edge reflection type surface acoustic wave device.
- FIGS. 1 (a) and 1 (b) are a perspective view and a front sectional view showing an edge-reflective surface acoustic wave device according to one embodiment of the present invention.
- the edge-reflection surface acoustic wave device 1 is a substrate made of a 36-degree rotation Y-plate LiTaO single-crystal substrate.
- the piezoelectric thin film 3 is composed of a LiTaO single crystal thin film having the same orientation as the substrate. However, in the present invention, the piezoelectric thin film
- a piezoelectric thin film is composed of one or more kinds of piezoelectric single crystal thin films selected from 33. Good characteristics can be obtained by such a piezoelectric single crystal thin film having a large electromechanical coupling coefficient.
- IDT electrodes 4, 5, 6, and 7 are formed on the piezoelectric thin film 3.
- Each of the IDT electrodes 417 has a plurality of electrode fingers.
- the IDT electrode 4 and the IDT electrode 5 constitute a first longitudinally coupled resonator type surface acoustic wave filter 8, and the IDT electrodes 4 and 5 are arranged along the surface wave propagation direction.
- a concave portion 10 which is a reflective portion of the piezoelectric thin film 3 is formed so as to be in contact with the outer edge of the outermost electrode finger 4 a of the IDT electrode 4.
- a concave portion 11 as a reflecting portion is formed in the piezoelectric thin film 3 so as to contact an outer edge of the outermost electrode finger 5a of the IDT electrode 5.
- the concave portions 10 and 11 are provided so as not to penetrate the piezoelectric thin film 3, but may be grooves that penetrate the piezoelectric thin film 3.
- the concave portions 10, 11 serving as reflecting portions are provided for forming the reflecting end faces 10a, 11a.
- the The reflection end faces 10a, 11a extend in parallel with each other and extend in the direction in which the electrode fingers extend.
- the IDT electrodes 4 and 5 are arranged between the pair of reflection end faces 10a and 11a.
- the first-stage longitudinally coupled resonator type surface acoustic wave filter 8 is an end-face reflection type longitudinally coupled resonator type surface acoustic wave filter using a pair of reflection end faces 10a and 1la.
- the IDT electrode 6 is connected to the IDT electrode 5 by a wiring electrode 12.
- the IDT electrodes 6 and 7 constitute a second longitudinally coupled resonator type surface acoustic wave filter 13. That is, the IDT electrodes 6 and 7 are arranged in the surface wave propagation direction, and the concave portion 14 serving as a reflection portion is formed so as to be in contact with the outer edge of the outermost electrode finger 6a of the IDT electrode 6.
- a concave portion 15 as a reflecting portion is formed in the piezoelectric thin film 3 so as to be in contact with the outer edge of the outermost electrode finger 7a of the IDT electrode 7.
- End surfaces 14a and 15a inside concave portions 14 and 15, which are reflection portions, constitute reflection end surfaces.
- the concave portions 14 and 15 serving as the reflecting portions are provided so as to penetrate the piezoelectric thin film 3 similarly to the concave portions 10 and 11, but may not reach the lower surface of the piezoelectric thin film 3.
- the end face reflection type surface acoustic wave device 1 of the present embodiment is a two-stage filter in which the longitudinally coupled resonator type surface acoustic wave filters 8 and 13 are cascaded.
- Each of the longitudinally coupled resonator-type surface acoustic wave filters 8 and 13 uses the inner end faces of the concave portions 10, 11, 14, and 15, which are the reflectors provided in the piezoelectric thin film 3, as the reflection end faces. ing.
- the concave portions 10, 11, 14, and 15 that are the reflective portions constituting the reflective end face may be provided in the piezoelectric thin film 3, and the concave portions 10, 11, 14, and 15 are formed by etching or the like. It is easily formed with high precision by the method. That is, in the end surface reflection type surface acoustic wave device 1, a reflection end surface can be formed without cutting the hard substrate 2 using a dicer or the like. Therefore, the end face can be formed with high accuracy, and a high frequency can be realized in which chipping or the like is hardly generated.
- the recesses 10, 11, 14, and 15 may be formed to reach the substrate 2 beyond the piezoelectric thin film 3.
- the reflection end surface is constituted by the inner surfaces of the concave portions 10, 11, 14, and 15 provided in the piezoelectric thin film.
- chipping or the like is likely to occur at the portion reaching the substrate, whereas chipping is unlikely to occur at the inner surfaces of the concave portions 10, 11, 14, and 15 provided in the piezoelectric thin film. Therefore, it is necessary to form the reflection end face with high accuracy.
- the concave portions 10, 11, 14, and 15 are formed only in the piezoelectric thin film 3 which is not a substrate.
- the edge reflection type surface acoustic wave device 1 In manufacturing the edge reflection type surface acoustic wave device 1, first, as shown in FIG. 2 (a), a wafer-like substrate 2A is prepared. Next, the piezoelectric thin film 3 is formed on the entire surface of the substrate 2A.
- the piezoelectric thin film 3 is formed by an appropriate thin film forming method such as a MOCVD method. In this embodiment, a LiTaO single crystal thin film having a thickness of
- the substrate 2A is a 36 ° rotating Y-plate LiTaO single-crystal substrate, the piezoelectric thin film
- Film 3 is formed as a LiTaO epitaxial single crystal thin film having the same crystal orientation as substrate 2A.
- IDT electrodes 4, 5, 6, 7 and wiring 12 are formed.
- FIG. 2B only the IDT electrodes 4 and 5 are shown. Further, a plurality of IDT electrodes 4, 5, 6, 7 and wirings 12 are formed on the piezoelectric thin film of the force substrate 2A which is not shown in FIG. 2 (b).
- the formation of the IDT electrodes 4, 5, 6, 7 and the wiring 12 can be performed by a lift-off method using photolithography.
- the IDT electrodes 4, 5, 6, and 7 are formed so that the thickness of the IDT electrodes 4, 5, 6, and 7 that also generate A1 force is 0.08 ⁇ , that is, 1. .
- ⁇ is the wavelength of the surface acoustic wave.
- a photoresist 21 is applied to portions of the IDT electrodes 4, 5, 6, 7 and the wiring 12 which are not etched in a later step.
- etching is performed by reactive ion etching.
- the portion of the piezoelectric thin film 3 that is not covered with the resist 21 is etched, and the concave portions 10, 11, 14, which are 3.5 / zm deep reflecting portions. 15 is formed.
- the wafer-like substrate 2 A is cut into individual edge-reflection surface acoustic wave devices, thereby obtaining the edge-reflection surface acoustic wave device. You can get one.
- the etching rate is lower than that in the case where the piezoelectric single crystal itself is etched by reactive ion etching. About 5-7 times faster. Therefore, in the above embodiment, a groove having a depth of about 3.5 m can be formed by reactive ion etching for about 3 to 5 hours.
- two end face reflection type longitudinally coupled surface acoustic wave resonator filters are formed using the substrate 2.
- the reflection end faces of the wave filters 8 and 13 are formed by forming concave portions 10 and 11 or concave portions 14 and 15 as reflective portions in the piezoelectric thin film, respectively. Therefore, as is apparent from FIG. 2, a pair of reflection end faces of each longitudinally coupled resonator surface acoustic wave filter can be formed at an appropriate position for each filter. Therefore, it is possible to provide an end-reflection surface acoustic wave device in which the degree of freedom of design is increased and a plurality of longitudinally coupled surface acoustic wave resonator filters having desired frequency characteristics are configured.
- the outermost electrode fingers 4a and 5a of the IDT electrodes 4 and 5 are formed in advance with a narrower electrode finger width than the other electrode fingers when forming the IDT electrodes 4 and 5. (See Fig. 2 (b)).
- IDT electrode fingers 4A and 5A having a plurality of electrode fingers having the same width may be formed.
- the resist 21A may be arranged so as not to reach the outer region of the portion where the outermost electrode finger is formed. Therefore, in the structure shown in FIG. In this case, the electrode finger portions that are not covered with the resist are removed, and a structure similar to the structure shown in FIG. 2D can be obtained. That is, the width of the outermost electrode finger is narrower than that of the other electrode fingers, and the recess is formed so as to be in contact with the outer edge of the outermost electrode finger.
- the concave portions 10, 11, 14, and 15 which are the reflection portions for forming the reflection end face in the piezoelectric thin film 3 are formed by forming the IDT electrodes 417.
- a piezoelectric thin film provided with a concave portion may be formed in advance.
- at least one IDT electrode may be formed on the piezoelectric thin film between a pair of recesses provided in the piezoelectric thin film.
- the formation of the concave portion is performed by reactive ion etching.
- the etching method is not particularly limited, and ion etching, ECR etching, or the like may be used.
- the etching may be performed by a danilogical etching using a method such as the above.
- the reflection end faces 10a, 11a, 14a, and 15a form an angle of 90 ° with respect to the substrate surface, but if they are within a range of about 90 ° ⁇ 30 °, there is no problem in practical use. Has been experimentally confirmed.
- the depth of the concave portions 10, 11, 14, 15, which are the above-mentioned reflecting portions, may be 1 wavelength or more when the dielectric constant of the piezoelectric thin film 3 is 20 or more with respect to the surface wave wavelength. Is sufficient, and preferably at least two wavelengths, whereby better properties are obtained.
- the surface wave used is not particularly limited as long as it can constitute an edge-reflection surface acoustic wave device, and one of an SH component, an SV component, and a longitudinal wave component is used as a main component.
- An appropriate surface wave is used.
- SH waves in the surface acoustic wave device of the present invention.
- the ratio of the main component is 70% or more.
- the crystal orientation of the piezoelectric thin film should be (0 °, 85 ° — 160 °, 0 °) in Euler angle.
- LiTaO film When used as a piezoelectric thin film, its crystal orientation is Euler's angle (90 °, 90 °, 30 ° -110 °), and the crystal orientation is in the range of (90 °, 90 °, 30-135 °). Masu! / ⁇ .
- a buffer layer 31 may be provided between the substrate and the piezoelectric thin film.
- the buffer layer 31 acts to enhance the crystallinity of the piezoelectric thin film 3 formed on the buffer layer 31 and also functions to firmly adhere the piezoelectric thin film 3 to the substrate 2.
- Examples of a material constituting such a buffer layer 31 include Pt, ZnO, Au, Al, Ag, A1N, and GaN.
- the buffer layer 31 is used as a ground layer by electrically connecting the buffer layer and a portion of the IDT electrode connected to the ground potential.
- the thickness of the buffer layer 31 is not particularly limited because it is formed as a base layer of the piezoelectric thin film 3.
- the concave portions 10 and 11 serving as the reflecting portions are formed so as to penetrate the piezoelectric thin film 3.
- the substrate 2 is made of a suitable single crystal or ceramic, preferably a piezoelectric single crystal, and more preferably a LiTaO single crystal or a LiNbO single crystal. Board 2 and
- a preferable combination of the piezoelectric thin film 3 is that when the substrate 2 is a LiTaO substrate
- the thin film 3 is preferably made of LiTaO, LiNbO or ZnO.
- Substrate 2 is LiNbO
- the piezoelectric thin film 3 is preferably made of LiTaO, LiNbO or ZnO.
- an epitaxially grown piezoelectric single crystal thin film can be reliably obtained as the piezoelectric thin film 3.
- the piezoelectric thin film 3 is a piezoelectric single crystal thin film that is epitaxially grown, a large electromechanical coupling coefficient can be obtained, and the bandwidth can be expanded.
- the orientation of the piezoelectric thin film 3 can be freely selected, and for example, a large electromechanical coupling coefficient can be obtained. Therefore, the orientation of the piezoelectric thin film can be selected according to the desired characteristics of the surface acoustic wave device.
- the height dimension of the reflection end face In order to reflect surface waves and obtain good characteristics, the height dimension of the reflection end face must be
- the wavelength of the surface wave is preferably at least one wavelength, more preferably at least two wavelengths. Therefore, the thickness of the piezoelectric thin film 3 is preferably at least one wavelength, more preferably at least two wavelengths.
- an SiO film 32 may be formed on the piezoelectric thin film 3 and the IDT electrodes 4 and 5 to further improve the temperature characteristics.
- an SiO film 32 may be formed on the piezoelectric thin film 3 and the IDT electrodes 4 and 5 to further improve the temperature characteristics. in this case,
- the recess may be formed by etching.
- the thickness of the iO film 32 is preferably in the range of 0.15 ⁇ 0.4. Below 0.15 ⁇ , temperature characteristics
- the effect of improving the performance may not be sufficiently obtained. If the value exceeds 0.4 ⁇ , the surface wave may be damped. The same effect can be obtained by forming SiO under the piezoelectric film.
- the thickness of the IDT electrodes 417 is not limited to the numerical range of the above-described embodiment, but may be 0.01 ⁇ -0.15 in the case of an electrode made of A1, Au or Pt, Ta, If it is composed of W, it should be within the range of 0.003 ⁇ -0.04 ⁇ , Cu, Ni, and Ag. That is, when an SH type surface wave is used, a thinner electrode film can be used than in the case of a general surface acoustic wave device.
- FIG. 7 is a perspective view showing an edge-reflective surface acoustic wave device according to a second embodiment of the present invention.
- the end surface reflection type surface acoustic wave device 41 is composed of a ladder type filter in which three series arm resonators S1 to S3 and two parallel arm resonators PI and ⁇ 2 are connected to form a ladder type filter. This is an end face reflection type surface acoustic wave device having a filter configuration.
- Each of the series arm resonators S1 to S3 and the parallel arm resonators PI and # 2 has an IDT electrode and a reflection end face formed by a side surface of a concave portion which is a reflection portion disposed on both sides of the IDT electrode.
- the piezoelectric thin film 43 is formed on the substrate 42, and the series arm resonators S1 to S3 or the parallel arm resonators PI and ⁇ 2 are formed on the piezoelectric thin film 43.
- IDT electrodes 44-48 are formed.
- a concave portion 49-58 constituting a reflecting portion is provided.
- the concave portions 49-58 are configured to penetrate the piezoelectric thin film 43.
- the inner side surface of each of the concave portions 49-58 which is a reflection portion, forms a reflection end surface, and the reflection end surface extends in parallel with the direction in which the electrode fingers of each resonator extend.
- the edge-reflection surface acoustic wave device 41 of the second embodiment is provided except that the five end-reflection surface acoustic wave resonators are provided so as to form a ladder-type filter. It is made of the same material as that of the end surface reflection type surface acoustic wave device 1 of the first embodiment.
- the distance between the pair of reflection end faces 49a and 50a of the parallel arm resonator S1 is equal to the distance between the reflection end faces of the series arm resonators S2 and S3. The distance is different.
- the distance between the pair of reflection end faces 55a and 56a of the parallel arm resonator P1 is different from the distance between the pair of reflection end faces 57a and 58a of the parallel arm resonator P2.
- the plurality of end face reflection type surface acoustic wave resonators which are constituted Can be selected.
- the concave portion is formed in the piezoelectric thin film 43 to form the reflection end face, but the concave portion may extend to the substrate 42 below the piezoelectric thin film 43.
- the reflection end surface is constituted by the inner surface of the concave portion provided in the piezoelectric thin film 43. Therefore, the reflection end face is formed with high precision because it is hardly affected by chipping or the like at the portion reaching the substrate.
- the concave portion is provided only in the piezoelectric thin film 43 so as not to reach the substrate 42.
- FIG. 8 is a perspective view showing an edge-reflection surface acoustic wave device 201 in which three series arm resonators S1 to S3 and two parallel arm resonators PI and P2 are formed on one surface wave substrate 202.
- FIG. 8 In this end surface reflection type surface acoustic wave device 201, the pair of reflection end surfaces of the series arm resonators SI, S2, and S3 are formed by cutting the top surface force of the surface wave substrate 202 using a dicer or the like. These are the reflection end surfaces 202a and 202b.
- the reflection end faces of the series arm resonators S1 to S3 are shared, the optimum IDT logarithm and thus the distance between the reflection end faces cannot be adopted as the series arm resonators S1 to S3.
- a pair of reflection end surfaces is similarly used for the parallel arm resonators PI and P2, and therefore, the optimum IDT logarithm and The distance between the reflective end faces cannot be adopted.
- a groove is Since it is necessary to use wires in such a manner, miniaturization and low profile cannot be achieved.
- the reflection end surface is formed by providing the piezoelectric thin film 43 with the concave portion as the reflection portion as described above. Therefore, it is possible to easily adopt the optimum IDT logarithm and the distance between the reflection end faces for each series arm resonator S1 to S3 and the parallel arm resonators PI and P2, thereby greatly increasing the design flexibility.
- the wiring electrode is formed on the piezoelectric thin film 43. Therefore, it is not necessary to electrically connect the series arm resonator and the parallel arm resonator by a bonding wire. Therefore, the end surface reflection type surface acoustic wave device can be reduced in size and height, and the reliability of the electrical connection can be improved. In addition, it is possible to perform a simple electrical connection operation.
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- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
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