WO2004091266A1 - 回路基板およびその製造方法 - Google Patents
回路基板およびその製造方法 Download PDFInfo
- Publication number
- WO2004091266A1 WO2004091266A1 PCT/JP2004/004756 JP2004004756W WO2004091266A1 WO 2004091266 A1 WO2004091266 A1 WO 2004091266A1 JP 2004004756 W JP2004004756 W JP 2004004756W WO 2004091266 A1 WO2004091266 A1 WO 2004091266A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- base material
- resin base
- electronic component
- circuit board
- component
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 88
- 229920005989 resin Polymers 0.000 claims abstract description 197
- 239000011347 resin Substances 0.000 claims abstract description 197
- 239000000758 substrate Substances 0.000 claims abstract description 89
- 238000004519 manufacturing process Methods 0.000 claims abstract description 42
- 238000010438 heat treatment Methods 0.000 claims abstract description 32
- 229920001169 thermoplastic Polymers 0.000 claims abstract description 22
- 239000004416 thermosoftening plastic Substances 0.000 claims abstract description 22
- 238000004132 cross linking Methods 0.000 claims abstract description 17
- 239000000463 material Substances 0.000 claims description 196
- 239000004065 semiconductor Substances 0.000 claims description 83
- 239000004020 conductor Substances 0.000 claims description 6
- 230000015572 biosynthetic process Effects 0.000 claims description 5
- 238000007639 printing Methods 0.000 claims description 5
- 238000002844 melting Methods 0.000 claims description 2
- 230000008018 melting Effects 0.000 claims description 2
- 230000002708 enhancing effect Effects 0.000 abstract 1
- 229920000139 polyethylene terephthalate Polymers 0.000 description 8
- 239000005020 polyethylene terephthalate Substances 0.000 description 8
- 238000007650 screen-printing Methods 0.000 description 6
- 239000003990 capacitor Substances 0.000 description 5
- 230000000052 comparative effect Effects 0.000 description 5
- -1 polyethylene terephthalate Polymers 0.000 description 5
- 229920005992 thermoplastic resin Polymers 0.000 description 5
- 238000001723 curing Methods 0.000 description 4
- 125000000524 functional group Chemical group 0.000 description 4
- 229920000728 polyester Polymers 0.000 description 4
- 229920000098 polyolefin Polymers 0.000 description 4
- 229920005672 polyolefin resin Polymers 0.000 description 4
- 229920001187 thermosetting polymer Polymers 0.000 description 4
- 229920000122 acrylonitrile butadiene styrene Polymers 0.000 description 3
- 239000000853 adhesive Substances 0.000 description 3
- 230000001070 adhesive effect Effects 0.000 description 3
- 239000000956 alloy Substances 0.000 description 3
- 229910045601 alloy Inorganic materials 0.000 description 3
- 150000007942 carboxylates Chemical group 0.000 description 3
- 125000003055 glycidyl group Chemical group C(C1CO1)* 0.000 description 3
- 238000007731 hot pressing Methods 0.000 description 3
- 239000012948 isocyanate Substances 0.000 description 3
- 150000002513 isocyanates Chemical class 0.000 description 3
- 229920000515 polycarbonate Polymers 0.000 description 3
- 239000004417 polycarbonate Substances 0.000 description 3
- 229920000642 polymer Polymers 0.000 description 3
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 2
- 238000001227 electron beam curing Methods 0.000 description 2
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 2
- IQPQWNKOIGAROB-UHFFFAOYSA-N isocyanate group Chemical group [N-]=C=O IQPQWNKOIGAROB-UHFFFAOYSA-N 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 238000000016 photochemical curing Methods 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 2
- NLHHRLWOUZZQLW-UHFFFAOYSA-N Acrylonitrile Chemical compound C=CC#N NLHHRLWOUZZQLW-UHFFFAOYSA-N 0.000 description 1
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- BZHJMEDXRYGGRV-UHFFFAOYSA-N Vinyl chloride Chemical compound ClC=C BZHJMEDXRYGGRV-UHFFFAOYSA-N 0.000 description 1
- 238000009933 burial Methods 0.000 description 1
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- 238000004891 communication Methods 0.000 description 1
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- 238000003754 machining Methods 0.000 description 1
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- 238000004904 shortening Methods 0.000 description 1
- 125000000542 sulfonic acid group Chemical group 0.000 description 1
Classifications
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
- H05K1/182—Printed circuits structurally associated with non-printed electric components associated with components mounted in the printed circuit board, e.g. insert mounted components [IMC]
- H05K1/185—Components encapsulated in the insulating substrate of the printed circuit or incorporated in internal layers of a multilayer circuit
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/538—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
- H01L23/5389—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates the chips being integrally enclosed by the interconnect and support structures
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/18—High density interconnect [HDI] connectors; Manufacturing methods related thereto
- H01L24/19—Manufacturing methods of high density interconnect preforms
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/18—High density interconnect [HDI] connectors; Manufacturing methods related thereto
- H01L24/20—Structure, shape, material or disposition of high density interconnect preforms
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/82—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected by forming build-up interconnects at chip-level, e.g. for high density interconnects [HDI]
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/93—Batch processes
- H01L24/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L24/96—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being encapsulated in a common layer, e.g. neo-wafer or pseudo-wafer, said common layer being separable into individual assemblies after connecting
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/568—Temporary substrate used as encapsulation process aid
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/04105—Bonding areas formed on an encapsulation of the semiconductor or solid-state body, e.g. bonding areas on chip-scale packages
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/18—High density interconnect [HDI] connectors; Manufacturing methods related thereto
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/91—Methods for connecting semiconductor or solid state bodies including different methods provided for in two or more of groups H01L2224/80 - H01L2224/90
- H01L2224/92—Specific sequence of method steps
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
- H01L2924/1815—Shape
- H01L2924/1816—Exposing the passive side of the semiconductor or solid-state body
- H01L2924/18162—Exposing the passive side of the semiconductor or solid-state body of a chip with build-up interconnect
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- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19105—Disposition of discrete passive components in a side-by-side arrangement on a common die mounting substrate
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/01—Dielectrics
- H05K2201/0104—Properties and characteristics in general
- H05K2201/0129—Thermoplastic polymer, e.g. auto-adhesive layer; Shaping of thermoplastic polymer
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/11—Treatments characterised by their effect, e.g. heating, cooling, roughening
- H05K2203/1189—Pressing leads, bumps or a die through an insulating layer
Definitions
- the present invention relates to a circuit board formed by embedding an electronic component in a resin base material and a manufacturing method thereof.
- circuit boards used in these devices not only serve as wiring boards for mounting electronic components such as semiconductor chips, resistors, capacitors, and sensors on both sides, but are also thin and compact with these electronic components built into them. A method for realizing the above has been developed.
- FIG. 6A to FIG. 6D are process cross-sectional views illustrating the method for manufacturing the circuit board.
- the semiconductor chip 21 and the electronic component 23 are arranged at predetermined positions on the main surface of the resin base material 24 made of thermoplastic resin.
- the semiconductor chip 21 is also a kind of electronic component, but will be described separately.
- the bump electrode 22 of the semiconductor chip 21 is disposed so as to face the main surface of the resin base material 24.
- the resin base material 24 on which the semiconductor chip 21 and the electronic component 23 are arranged is arranged in a hot press apparatus having a pair of hot press plates 25 and 26.
- the resin base material 24 is heated and softened by the lower hot press plate 26.
- the upper heat press plate 25 is pushed down to press-fit the semiconductor chip 21 and the electronic component 23 into the resin base material 24.
- the temperature of the pair of hot press plates 25 and 26 is lowered to cure the resin base material 24.
- FIG. 6C a resin base material 24 in which the semiconductor chip 21 and the electronic component 23 are embedded is obtained.
- the bump electrode 2 2 of the semiconductor chip 2 1 and the electronic component 2 For example, a conductor paste is screen-printed so as to include the three electrode terminals 2 3 1 and hardened to form the electrode wiring 27. Thereby, the semiconductor chip 21 and the electronic component 23 are built in the resin base material 24, and a circuit board in which these are connected by the predetermined electrode wiring 27 is obtained.
- polyesters such as polyethylene terephthalate (PET), polyolefin, vinyl chloride, polystreptone, and acrylonitrile tolbutadiene styrene.
- PET polyethylene terephthalate
- the semiconductor chip 2 1 and the electronic component 2 3 can be embedded in the resin base material 24 at a temperature of about 160 °. .
- FIG. 7A to FIG. 7E are cross-sectional views for explaining main processes when a circuit board is manufactured by this method.
- a conductor paste is printed on the main surface of the temporary substrate 28 by, for example, screen printing and cured to form the electrode wiring 27.
- the electrode wiring 27 and the bump electrode 2 2 of the semiconductor chip 21 are connected by a general connection method.
- This step is performed by inserting a temporary substrate 28 and a resin base material 29 on which a semiconductor chip 21 is mounted between two hot press plates, and applying heat and pressure.
- a heat radiating plate 30 is attached to the back surface of the resin base material 29 as shown in the drawing. That is, as shown in FIG. 7D, if at least one of the resin base material 29 and the heat sink 30 is heated and pressurized with the temporary substrate 28 remaining, the heat sink 30 is made into the resin base material 29. Can be glued to. Thereafter, as shown in FIG. 7E, by removing the temporary substrate 28, a circuit substrate in which the semiconductor chip 21 and the electrode wiring 27 are embedded in the resin base material 29 is formed. In the case of this method, since it is formed in the resin base material 29 including the electrode wiring 27, not only a thinner circuit board can be realized, but a multilayer circuit board can be easily stacked by further stacking them. Can be made.
- a base material is formed with a semi-cured thermosetting resin, and the temperature of the base material is equal to or higher than the softening temperature.
- a method for embedding a semiconductor chip is also being developed. This method is suitable for the production of circuit boards with a small number of built-in components, such as IC force, but it is difficult to set work conditions when many electronic components are built in several times.
- thermoplastic resin or a thermosetting resin is used as a resin base material. If a thermoplastic resin is used, it is easy to press-fit and embed semiconductor chips and electronic components. Therefore, it is suitable as a method for manufacturing IC cards, memory cards, etc. that are not exposed to high temperatures after the process of embedding semiconductor chips.
- the present invention solves the above-described conventional problems.
- a semiconductor chip or an electronic component is embedded in a resin base material, it is performed at a relatively low temperature, and then heat resistance is imparted to the resin base material.
- An object of the present invention is to provide a highly accurate circuit board and a method for manufacturing the same while suppressing the rate.
- a method for manufacturing a circuit board according to the present invention comprises heating a resin base material including a thermoplastic component and a crosslinkable component to soften the electronic component having a protruding electrode in the resin base material.
- the method comprises a step of embedding, a step of cross-linking and curing a crosslinkable component in the resin base material, and a step of forming on the surface of the resin base material an electrode wiring connected to the protruding electrode of the electronic component. That is, a resin base material containing a thermoplastic component and a crosslinkable component is used as the resin base material.
- thermoplastic component of the resin base material As a result, in the process of embedding the electronic component, it can be easily softened at a relatively low temperature by the thermoplastic component of the resin base material and the electronic component can be press-fitted. Moreover, heat resistance as a circuit board can be improved by bridging crosslinkable components after embedding electronic components. By this manufacturing method, It is possible to realize a circuit board with a small board deformation rate and high board dimension accuracy.
- the step of embedding the electronic component in the resin substrate includes the step of placing the surface opposite to the protruding electrode forming surface of the electronic component in contact with the resin substrate, and heating and softening the resin substrate to You may make it consist of the process of press-fitting and embedding components in the resin base material.
- the step of embedding the electronic component in the resin base material includes the step of placing the protruding electrode forming surface of the electronic component in contact with the main surface of the resin base material, and heating and softening the resin base material to make the electronic component.
- the thickness of the resin base material may be equal to or less than the thickness including the protruding electrodes of the electronic component.
- the electronic component can be press-embedded in the resin base material by selecting one of the above in consideration of the shape, thickness, thickness variation, etc. of the electronic component.
- the dimensional accuracy of the circuit board can be improved by improving the heat resistance by crosslinking the crosslinkable component in the resin base material.
- the degree of freedom in the manufacturing process can be increased.
- the thickness of the resin base material is equal to or less than the thickness including the protruding electrode of the electronic component.
- the protruding electrodes can be reliably exposed on the surface of the resin base material.
- the thickness of the resin base material is preferably substantially the same as the thickness of the electronic component including the projecting electrode, but may be thinner. However, it is desirable that the thickness of the resin base material be thicker than the protruding electrodes so that the electronic component can be securely fixed to the resin base material. If it is thin, it may be press-embedded and then hot-pressed in the same manner using another resin base material so that the entire electronic component is embedded in the resin base material.
- the step of embedding the electronic component in the resin base material includes a step of temporarily fixing the surface opposite to the protruding electrode forming surface of the electronic component in contact with the temporary substrate, and a temporary substrate on which the electronic component is temporarily fixed. It is good also as the process of arrange
- a convex portion corresponding to each thickness of the electronic component having a different thickness is provided, and the top of the protruding electrode of the electronic component is aligned and fixed in an anti-static manner. It may be.
- a protrusion that corrects the thickness of each electronic component is provided on the temporary substrate in advance. It becomes easy to align the tops of the electrodes. Thereby, the protruding electrode of the electronic component can be reliably exposed from the resin base material.
- the step of embedding the electronic component in the resin base material includes a step of temporarily fixing the surface opposite to the protruding electrode forming surface of the electronic component in contact with the temporary substrate, and a temporary substrate on which the electronic component is temporarily fixed. It consists of a step of placing a resin base material on the top and a step of heating and softening the resin base material to embed an electronic component in the resin base material.
- the temporary substrate is removed after the step of forming the electrode wiring. May be. By this method, the temporary substrate can be removed after at least the electrode wiring is formed, so that the circuit board can be easily handled until the final process, and the manufacturing yield can be improved.
- the step of embedding the electronic component in the resin base material includes the step of temporarily fixing the protruding electrode forming surface of the electronic component in contact with the temporary substrate, and the step of heating and softening the resin base material to make the electronic component a resin base.
- the method includes a step of embedding in the material and a step of removing the temporary substrate, and the thickness of the resin base material may be equal to or less than the thickness including the protruding electrodes of the electronic component.
- the thickness of the resin substrate is desirably substantially the same as the thickness of the electronic component including the protruding electrode, but may be thinner. However, it is desirable that the thickness of the resin base material be thicker than the protruding electrode so that the electronic component can be securely fixed to the resin base material. If it is thin, it may be press-embedded and then hot-pressed in the same manner using another resin base material so that the entire electronic component is embedded in the resin base material.
- the circuit board manufacturing method of the present invention includes a step of heating and softening a resin base material including a thermoplastic component and a crosslinkable component to embed an electronic component having a protruding electrode in a resin base material, The process of forming the electrode wiring connected to the protruding electrode of the electronic component on the surface of the resin base material, and heating and softening the resin base material to press the electrode wiring and the electronic component into the resin base material
- the method includes a step of making the electrode wiring and the resin base material the same surface, and a step of crosslinking and curing the crosslinkable component in the resin base material.
- the surface of the electrode wiring and the surface of the resin substrate can be made substantially the same. Also in this case, the heat resistance as a circuit board can be improved by crosslinking the crosslinkable component in the resin base material after embedding the electrode wiring.
- the electronic component may be a semiconductor chip
- the protruding electrode may be a bump electrode.
- the step of forming the electrode wiring may be performed by printing and curing the conductive material.
- the thermoplastic component in the resin base material may be a material having a melting point of 50 ° C. to 150 ° C. By setting it within this temperature range, the heating temperature when the electronic component is press-fitted and incorporated can be lowered, and even an electronic component with low heat resistance can be incorporated.
- the circuit board of the present invention includes a thermoplastic component and a crosslinkable component, a heat resistant substrate cured by crosslinking the crosslinkable component, and exposing at least the surface of the protruding electrode in the heat resistant substrate.
- the surface of the electrode wiring and the surface of the heat resistant base material may be the same surface.
- FIG. 1A to FIG. 1D are process cross-sectional views illustrating a method for manufacturing a circuit board according to the first embodiment of the present invention.
- FIG. 2A to FIG. 2D are process cross-sectional views for explaining a circuit board manufacturing method according to the second embodiment of the present invention.
- FIG. 3A to FIG. 3D are process sectional views for explaining a circuit board manufacturing method according to the third embodiment of the present invention.
- FIG. 4A to FIG. 4D are process cross-sectional views illustrating the method for manufacturing a circuit board according to the fourth embodiment of the present invention.
- FIG. 5A to FIG. 5D are process cross-sectional views illustrating the method for manufacturing a circuit board according to the fifth embodiment of the present invention.
- FIGS. 6A to 6D are process cross-sectional views illustrating a conventional circuit board manufacturing method.
- FIGS. 7A to 7E are process cross-sectional views illustrating another conventional circuit board manufacturing method. Best form for
- FIG. 1A to 1D are process cross-sectional views illustrating a method for manufacturing a circuit board according to the first embodiment of the present invention.
- the protruding electrode 2 is not formed on the main surface of the resin base material 3 (hereinafter referred to as the resin base material 3) containing the thermoplastic component and the crosslinkable component.
- the electronic component 1 having the protruding electrode 2 is arranged with the surfaces facing each other.
- the electronic component 1 will be described as the semiconductor chip 1 and the protruding electrode 2 will be described as the bump electrode 2.
- the resin base material 3 on which the semiconductor chip 1 is arranged is placed in a hot press apparatus having a pair of hot press plates 4 and 5, and then heat and pressure are applied to conduct the semiconductor.
- the body chip 1 is pressed into the resin base material 3 and embedded.
- the resin base material 3 is fixed in advance on one of the pair of heat press plates 4 and 5, and then the semiconductor chip 1 is disposed on the surface of the resin base material 3, It is good also as a method of heating and pressurizing with the hot press plates 4 and 5.
- the resin base material 3 in which the semiconductor chip 1 is embedded is taken out from the heat press apparatus, and the crosslinkable component, which is a component contained in the resin base material 1, is cross-linked and cured.
- the crosslinking reaction for example, ultraviolet irradiation, electron beam irradiation, or a method in which these and a heating action are combined can be used.
- the heat resistance of the resin substrate 3 is greatly improved, and this is called the heat resistant substrate 70.
- an electrode wiring 6 connected to the bump electrode 2 is formed on the heat resistant substrate 70.
- the electrode wiring 6 is formed by a method such as screen printing with a conductive paste, for example.
- an intermediate base material may be provided between the upper hot press plate 4 and the semiconductor chip 1.
- a fluororesin sheet or the like is used as the intermediate base material. This intermediate base material prevents the semiconductor chip 1 from being adsorbed to the upper hot press plate 4 and facilitates peeling.
- Such a method using an intermediate substrate is also effective in the following embodiments.
- FIGS. 2A to 2D are process cross-sectional views for explaining a circuit board manufacturing method according to the second exemplary embodiment of the present invention.
- the circuit board manufacturing method according to the present embodiment includes a method in which the bump electrodes 2 of the semiconductor chip 1 are arranged and embedded toward the main surface of the resin base material 8.
- the bump electrode 2 faces the resin substrate 8 on the main surface of a resin substrate 8 (hereinafter referred to as resin substrate 8) containing a thermoplastic component and a crosslinkable component.
- resin substrate 8 a resin substrate 8 containing a thermoplastic component and a crosslinkable component.
- the semiconductor chip 1 is arranged as follows.
- the semiconductor chip 1 is attached to the resin base material by applying heat and pressure. 8 Press fit and embed.
- the resin base material 8 in which the semiconductor chip 1 is embedded is taken out, and the crosslinkable component in the resin base material 8 is cross-linked and cured as shown in FIG. 2C.
- the heat resistance of the resin base material 8 is improved and the heat resistant base material 90 is obtained as in the first embodiment.
- an electrode wiring 6 connected to the bump electrode 2 is formed on the heat resistant substrate 90.
- the electrode wiring 6 is formed, for example, by a method such as screen printing using a conductive paste. If the conductive paste is printed and then cured, the semiconductor substrate 1 is embedded in the heat resistant substrate 90, and the circuit board 9 having the electrode wiring 6 formed on the surface is obtained.
- fluorine is interposed between the hot press plate 4 and the semiconductor chip 1.
- an intermediate base material such as a resin may be disposed.
- a fluororesin sheet or the like is used as the intermediate base material. This intermediate base material prevents the semiconductor chip 1 from being adsorbed to the upper hot press plate 4 and facilitates peeling.
- the resin substrate 8 has the same force as the thickness of the electronic component 1 including the protruding electrode 2.
- the present invention is not limited to this, and a thinner resin substrate may be used.
- the thickness of the resin base material 8 may be at least thicker than the protruding electrode 2 so long as the electronic component 1 is fixed when the electronic component 1 is press-fitted.
- a resin base material having the same composition may be further placed and heat-pressed again to embed the electronic component 1 in the resin base material.
- Embodiments 1 and 2 polyester, polyolefin, polycarbonate, ABS, polymer alloy, etc. are used as the thermoplastic component in the resin substrate, and vinyl group, isocyanate group are used as the crosslinkable component.
- a component containing a blocked isocyanate, a glycidyl group, a carboxylate group or the like in the skeleton can be used.
- the curing treatment method for the crosslinkable component can be appropriately selected according to the crosslinkable component used, such as ultraviolet irradiation or heat treatment.
- the crosslinkable component in the resin base material is crosslinked and cured to impart heat resistance, and then the electrode wiring is formed.
- the substrate dimensional accuracy is not deteriorated by the printing formation of the conductive material or the heat treatment during the thermosetting.
- the cross-linking component may be cross-linked and cured.
- the present invention is not limited to this.
- semiconductor chips not only semiconductor chips but also electronic components such as resistors, capacitors, and various sensors that have projecting electrodes on the surface can be embedded in the same manner to manufacture a circuit board. it can.
- FIG. 3A to 3D are process cross-sectional views illustrating a method for manufacturing a circuit board according to the third embodiment of the present invention.
- the temporary board 10 The semiconductor chip 1 is fixed in contact with the temporary substrate 10 so as to face away from the surface on which the bump electrode 2 is formed.
- an adhesive or the like may be applied to the semiconductor chip 1.
- the adhesive for example, if a material having a characteristic that loses adhesiveness at the heating temperature at the time of hot pressing is used, the semiconductor chip 1 can be easily peeled off from the temporary substrate 10 at the same time as being embedded by press-fitting.
- FIG. 3A shows an example in which two semiconductor chips 1 are arranged. However, a plurality of semiconductor chips 1 may be provided, or a combination of semiconductor chips 1 and other electronic components may be used.
- a resin base material 11 including a thermoplastic component and a crosslinkable component in a heat press apparatus having a pair of heat press plates 4 and 5 (hereinafter referred to as resin base material 11) And a temporary substrate 10 on which the semiconductor chip 1 is fixed.
- the temporary substrate 10 is arranged so that the bump electrode 2 of the semiconductor chip 1 faces the resin base material 11.
- heat and pressure are applied by a pair of hot press plates 4 and 5.
- the semiconductor chip 1 is embedded in the resin base material 11, so that the temporary substrate 10 is removed from the hot press apparatus.
- the crosslinkable component in the resin base material 11 is crosslinked and cured to impart heat resistance.
- the resin base material 11 becomes a heat-resistant base material 120 having heat resistance.
- an electrode wiring 6 connected to the bump electrode 2 is formed on the heat-resistant base material 120.
- the electrode wiring 6 is formed, for example, by a method such as screen printing using a conductive pace. If the conductive paste is printed and then cured, the semiconductor chip 1 is embedded in the heat-resistant base material 120 and the circuit board 12 having the electrode wiring 6 formed on the surface is obtained.
- the semiconductor chip 1 is fixed using the temporary substrate 10, these semiconductor chips 1 are not displaced when hot pressing is performed, so that press-fitting with high positioning accuracy is possible. It becomes. Thereby, the electrode wiring 6 connected to the bump electrode 2 can be formed in a fine pattern. Further, depending on the fixing method to the temporary substrate 10, it can be taken out without being completely cooled in the hot press apparatus and cooled outside the apparatus. With such a method, it is possible to shorten the process time.
- the resin base material 1 1 is the electronic component 1 including the protruding electrode 2.
- the present invention is not limited to this, and a thinner resin substrate 8 may be used.
- the thickness of the resin base material 8 may be at least thicker than the protruding electrode 2 so long as the electronic component 1 can be fixed when the electronic component 1 is press-fitted.
- a resin base material having the same composition may be further disposed and hot-pressed again to embed the electronic component 1 in the resin base material.
- a convex portion (not shown) for correcting the thickness of each electronic component may be provided on the temporary substrate 10 in advance.
- the convex portion may be formed by machining the temporary substrate 10 or may be formed on the temporary substrate 10 with another material.
- FIG. 4A to FIG. 4D are process cross-sectional views for explaining the circuit board manufacturing method according to the fourth exemplary embodiment of the present invention.
- the semiconductor chip 1 is fixed at a predetermined position on the main surface of the temporary substrate 10 with the surface on which the bump electrodes 2 are formed facing the temporary substrate 10.
- an adhesive it is preferable to use an adhesive as in the third embodiment.
- FIG. 4A shows an example in which two semiconductor chips 1 are arranged, a plurality of semiconductor chips 1 may be used, and semiconductor chips 1 and electronic components such as capacitors and sensors. Can be mixed with
- thermoplastic base material containing a thermoplastic component and a crosslinkable component on the heat press plate 5 below the heat press apparatus having a pair of heat press plates 4 and 5 And resin base material 1 3
- the temporary substrate 10 to which the semiconductor chip 1 is fixed is arranged on the upper hot press plate 4 so that the semiconductor chip 1 fixed to the temporary substrate 10 faces the resin base material 13.
- heating and pressurization are applied by the upper hot press plate 4 and the lower hot press plate 5.
- the semiconductor chip 1 is press-embedded in the resin base material 13. After embedding, cool and remove from the hot press machine, and remove the temporary substrate 10.
- the temporary substrate 10 to which the semiconductor chip 1 is fixed is not limited to the method in which the semiconductor substrate 1 is fixed to the hot press plate 4 and then heated and pressurized, but also the temporary substrate 10 It may be placed on the surface of the material 13 and heated and pressed by the hot press plates 4 and 5.
- the crosslinkable component in the resin base material 13 is crosslinked and cured to impart heat resistance.
- the heat resistance of the resin base material is improved and the heat resistant base material 140 is obtained.
- an electrode wiring 6 connected to the bump electrode 2 is formed on the heat resistant base material 140 as shown in FIG. 4D.
- a conductive paste is formed by a method such as screen printing. If the conductive paste is printed and then cured, the semiconductor substrate 1 is embedded in the heat-resistant substrate 140, and the circuit board 14 having the electrode wiring 6 formed on the surface is obtained.
- the semiconductor chip 1 is fixed using the temporary substrate 10 in the same manner as in the third embodiment, the semiconductor chip 1 is not displaced during hot pressing, so that the positional accuracy is improved. High press-in burial is possible. Thereby, the electrode wiring 6 connected to the bump electrode 2 can be formed in a fine pattern. Further, depending on the fixing method to the temporary substrate 10, it can be taken out without being completely cooled in the hot press apparatus and cooled outside the apparatus. With such a method, it is possible to shorten the process time.
- polyester, polyolefin, polycarbonate, ABS, polymer alloy, etc. are used as the thermoplastic component in the resin substrate, and vinyl group, isocyanate group are used as the crosslinkable component.
- vinyl group, isocyanate group are used as the crosslinkable component.
- a component containing a blocked isocyanate, a glycidyl group, a carboxylate group or the like in the skeleton can be used.
- the crosslinkable component in the resin base material is crosslinked and cured to impart heat resistance, and then the electrode wiring is formed.
- the substrate dimensional accuracy is not deteriorated by the printing formation of the conductive material or the heat treatment during the thermosetting.
- the crosslinkable component may be crosslinked and cured after the electrode wiring is formed.
- the semiconductor chip is mounted as the electronic component has been described.
- the present invention is not limited to this range. In other words, not only semiconductor chips, but also electronic components such as resistors, capacitors, and various sensors .. If at least the surface has a protruding electrode, it is embedded in the same way to manufacture a circuit board. be able to.
- FIG. 5A to FIG. 5D are process cross-sectional views for explaining the circuit board manufacturing method according to the fifth exemplary embodiment of the present invention.
- FIG. 5A shows that the semiconductor chip 1 is press-fitted and embedded in the resin base material 13 by the method described in the first embodiment, and the electrode wiring 6 is formed without cross-linking the crosslinkable component in the resin base material 13. Shows the state. That is, after the semiconductor chip 1 is press-embedded and the resin base material 13 is cooled, the resin base material 13 is cured. In this state, for example, a conductive paste is printed by screen printing or the like to form the electrode wiring 6. After printing, the resin is cured. In this state, the electrode wiring 6 protrudes from the surface of the resin base material 13.
- FIG. 5B the resin base material 13 in a state where the electrode wiring 6 is formed is placed in a hot press apparatus having a pair of hot press plates 15 and 16, and heating and pressurization are performed.
- FIG. 5C shows a state in which the semiconductor chip 1 and the electrode wiring 6 are both pressed and embedded in the resin base material 1 3 by heating and pressurizing.
- the crosslinkable component in the resin base material 13 is crosslinked and cured.
- the resin base material 13 is given heat resistance and becomes a heat resistant base material 170. If heat resistance is imparted by this crosslinking reaction, a circuit board 17 as shown in FIG. 5D can be obtained.
- the crosslinkable component is crosslinked after embedding the electrode wiring 6 in the resin base material 13, not only can the heat resistance be improved, but the surface of the circuit board 17 can be flattened. Therefore, it is possible to easily further increase the number of layers by using such a circuit board 17.
- Table 1 shows the results of measuring the deformation rate of the resin base material by heating with respect to the sample prepared based on the embodiment of the present invention.
- the deformation rate of the film which is a resin base material
- the deformation rate of the film is such that the distance between the two specified points on the resin base material at room temperature and the distance between the two points change due to elongation when heated to each temperature. Expressed as a ratio to the value. The smaller the deformation rate, the better the heat resistance.
- the embedded semiconductor chip is heated After the semiconductor chip was press-fitted into the resin substrate and embedded, the resin substrate was returned to room temperature and its operating characteristics were evaluated.
- the thickness of the resin substrate used was 0.1 mm, and the shape of the semiconductor chip was 5 mm X 5 mm X 0.1 mm.
- Sample 1 shown in Table 1 is .. Using a resin base material made of a material having a segment in which alkoxysilane is grafted as a functional group on a part of the olefin resin, a semiconductor chip is heated in this resin base material at a temperature of 1600 It was press-fitted at a temperature of 35 ° C and a pressure of 35 ON. Sample 2 uses a resin base material made of a material having a segment in which a carboxylic acid group or a hydroxyl group is grafted as a functional group on a part of the olefin resin, and the semiconductor chip is heated at a temperature of Implanted at 1600 ° C and pressurizing pressure 3 5 ON.
- Comparative Example 1 a semiconductor chip was embedded in a resin base material made of a polyethylene film at a heating temperature of 160 and a pressing force of 35 ON. Further, in Comparative Example 2, a semiconductor chip was embedded in a resin base material made of polyethylene terephthalate (PET) at a heating temperature of 160 ° C. and a pressurizing pressure of 3550 N. In Comparative Example 3, a resin substrate made of a polyimide film was used. Since polyimide films are not thermoplastic, semiconductor chips cannot be embedded. However, it is listed as a comparative example as a representative of the low deformation rate of the resin base material due to heat.
- PET polyethylene terephthalate
- sample 1 that is, a resin base material made of a material having a segment grafted with alkoxysilane as a functional group on a part of olefin resin is used.
- sample 1 that is, a resin base material made of a material having a segment grafted with alkoxysilane as a functional group on a part of olefin resin is used.
- sample 2 that is, a resin base material made of a material having a segment grafted with alkoxysilane as a functional group on a part of olefin resin is used.
- PET polyethylene terephthalate
- Sample 2 is a resin base material made of a material having a segment in which a force sulfonic acid group or a hydroxyl group is grafted as a functional group on a part of the olefin resin, but the deformation rate of the resin base material is lower than that of Sample 1. large. However, it has also been found that if it is used at a temperature of 150 ° C. or less, it can be sufficiently put into practical use.
- thermoplastic component in the resin substrate is polyester, polyolefin, polycarbonate, ABS, polymer alloy, etc.
- the bridging component is biell group, isocyanato group, Components containing a blocked isocyanate, a glycidyl group, a carboxylate group or the like in the skeleton can be used.
- the method of simultaneously pressing a plurality of electronic components using a semiconductor chip as an example has been described.
- the present invention is not particularly limited to this. It is also possible to press-fit one electronic component at a time and embed all the electronic components, and then crosslink the crosslinkable component to give heat resistance.
- the resin base material is composed of the thermoplastic component and the crosslinkable component, and the characteristic of the thermoplastic component is dominant in the process of embedding the electronic component in the resin base material. Therefore, the electronic component can be embedded in the resin base material at a relatively low temperature.
- By improving the heat resistance by crosslinking the crosslinkable component in the resin base material after embedding it is possible to realize a circuit board manufacturing method that is less likely to cause variations in board dimensions and has a low thermal deformation rate. Useful in fields that require thin and small circuit boards such as portable devices.
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Wire Bonding (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
- Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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US10/548,457 US7563650B2 (en) | 2003-04-02 | 2004-04-01 | Circuit board and the manufacturing method |
Applications Claiming Priority (2)
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JP2003099084A JP4200285B2 (ja) | 2003-04-02 | 2003-04-02 | 回路基板の製造方法 |
JP2003-099084 | 2003-04-02 |
Publications (1)
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WO2004091266A1 true WO2004091266A1 (ja) | 2004-10-21 |
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ID=33156689
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PCT/JP2004/004756 WO2004091266A1 (ja) | 2003-04-02 | 2004-04-01 | 回路基板およびその製造方法 |
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US (1) | US7563650B2 (ja) |
JP (1) | JP4200285B2 (ja) |
CN (1) | CN100379323C (ja) |
WO (1) | WO2004091266A1 (ja) |
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CN100459084C (zh) * | 2006-03-15 | 2009-02-04 | 日月光半导体制造股份有限公司 | 内埋元件的基板制造方法 |
CN100459078C (zh) * | 2006-03-15 | 2009-02-04 | 日月光半导体制造股份有限公司 | 一种基板的制造方法 |
CN100459083C (zh) * | 2006-03-15 | 2009-02-04 | 日月光半导体制造股份有限公司 | 内埋元件的基板制造方法 |
CN100459085C (zh) * | 2006-03-15 | 2009-02-04 | 日月光半导体制造股份有限公司 | 内埋元件的基板制造方法 |
CN100459077C (zh) * | 2006-03-15 | 2009-02-04 | 日月光半导体制造股份有限公司 | 基板的制造方法 |
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JP2006135195A (ja) * | 2004-11-08 | 2006-05-25 | Murata Mfg Co Ltd | セラミック多層基板の製造方法、並びにこの製造方法に用いられるセラミックグリーンシート |
JP5164362B2 (ja) | 2005-11-02 | 2013-03-21 | キヤノン株式会社 | 半導体内臓基板およびその製造方法 |
JP5496445B2 (ja) * | 2007-06-08 | 2014-05-21 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
US8904315B2 (en) * | 2007-12-17 | 2014-12-02 | Nokia Corporation | Circuit arrangements and associated apparatus and methods |
DE102008043122A1 (de) * | 2008-10-23 | 2010-04-29 | Robert Bosch Gmbh | Elektrische Schaltungsanordnung sowie Verfahren zum Herstellen einer elektrischen Schaltungsanordnung |
TWI485825B (zh) * | 2009-07-28 | 2015-05-21 | Xintec Inc | 晶片封裝體及其形成方法 |
US9723717B2 (en) | 2011-12-19 | 2017-08-01 | Advanpack Solutions Pte Ltd. | Substrate structure, semiconductor package device, and manufacturing method of semiconductor package |
US9663357B2 (en) * | 2015-07-15 | 2017-05-30 | Texas Instruments Incorporated | Open cavity package using chip-embedding technology |
CN109346448B (zh) * | 2018-09-30 | 2020-06-30 | 西安微电子技术研究所 | 一种石墨烯复合冷板及其制备方法 |
US11018030B2 (en) * | 2019-03-20 | 2021-05-25 | Semiconductor Components Industries, Llc | Fan-out wafer level chip-scale packages and methods of manufacture |
KR20210146038A (ko) * | 2020-05-26 | 2021-12-03 | 엘지이노텍 주식회사 | 패키지기판 및 이의 제조 방법 |
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Also Published As
Publication number | Publication date |
---|---|
US7563650B2 (en) | 2009-07-21 |
US20060216854A1 (en) | 2006-09-28 |
JP4200285B2 (ja) | 2008-12-24 |
CN1768557A (zh) | 2006-05-03 |
CN100379323C (zh) | 2008-04-02 |
JP2004311497A (ja) | 2004-11-04 |
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