WO2002023609A1 - Procede de gravure de silicium a vitesse elevee - Google Patents
Procede de gravure de silicium a vitesse elevee Download PDFInfo
- Publication number
- WO2002023609A1 WO2002023609A1 PCT/JP2001/007962 JP0107962W WO0223609A1 WO 2002023609 A1 WO2002023609 A1 WO 2002023609A1 JP 0107962 W JP0107962 W JP 0107962W WO 0223609 A1 WO0223609 A1 WO 0223609A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- silicon
- etching
- etching method
- gas
- speed
- Prior art date
Links
- 238000005530 etching Methods 0.000 title claims abstract description 197
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 126
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 126
- 239000010703 silicon Substances 0.000 title claims abstract description 126
- 238000000034 method Methods 0.000 title claims abstract description 57
- 238000012545 processing Methods 0.000 claims abstract description 75
- 230000001965 increasing effect Effects 0.000 claims abstract description 15
- 239000002245 particle Substances 0.000 claims abstract description 9
- 150000002500 ions Chemical class 0.000 claims abstract description 7
- 239000007789 gas Substances 0.000 claims description 111
- 150000002222 fluorine compounds Chemical class 0.000 claims description 10
- 230000007246 mechanism Effects 0.000 claims description 10
- 239000000758 substrate Substances 0.000 claims description 10
- 230000005684 electric field Effects 0.000 claims description 8
- 230000008878 coupling Effects 0.000 claims description 5
- 238000010168 coupling process Methods 0.000 claims description 5
- 238000005859 coupling reaction Methods 0.000 claims description 5
- 229910021421 monocrystalline silicon Inorganic materials 0.000 claims description 4
- 230000005672 electromagnetic field Effects 0.000 claims description 3
- 230000007935 neutral effect Effects 0.000 claims description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims 2
- 230000015572 biosynthetic process Effects 0.000 claims 2
- 239000001301 oxygen Substances 0.000 claims 2
- 229910052760 oxygen Inorganic materials 0.000 claims 2
- 230000005415 magnetization Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 12
- 239000003507 refrigerant Substances 0.000 description 10
- 238000001020 plasma etching Methods 0.000 description 9
- 238000001816 cooling Methods 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 5
- 238000012546 transfer Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 238000010791 quenching Methods 0.000 description 4
- 230000000171 quenching effect Effects 0.000 description 4
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 229910052731 fluorine Inorganic materials 0.000 description 3
- 239000011737 fluorine Substances 0.000 description 3
- -1 for example Substances 0.000 description 3
- 238000009616 inductively coupled plasma Methods 0.000 description 3
- 238000005459 micromachining Methods 0.000 description 3
- 230000009257 reactivity Effects 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 230000008033 biological extinction Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 230000001939 inductive effect Effects 0.000 description 2
- 238000003754 machining Methods 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 1
- 241000252067 Megalops atlanticus Species 0.000 description 1
- 241000287463 Phalacrocorax Species 0.000 description 1
- 101150107341 RERE gene Proteins 0.000 description 1
- 235000018936 Vitellaria paradoxa Nutrition 0.000 description 1
- 238000007792 addition Methods 0.000 description 1
- 230000003796 beauty Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000007596 consolidation process Methods 0.000 description 1
- 238000007865 diluting Methods 0.000 description 1
- 229910001882 dioxygen Inorganic materials 0.000 description 1
- 238000000635 electron micrograph Methods 0.000 description 1
- 238000000609 electron-beam lithography Methods 0.000 description 1
- 125000001153 fluoro group Chemical group F* 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002366 halogen compounds Chemical class 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- SBEQWOXEGHQIMW-UHFFFAOYSA-N silicon Chemical compound [Si].[Si] SBEQWOXEGHQIMW-UHFFFAOYSA-N 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- TXEYQDLBPFQVAA-UHFFFAOYSA-N tetrafluoromethane Chemical compound FC(F)(F)F TXEYQDLBPFQVAA-UHFFFAOYSA-N 0.000 description 1
- 230000007723 transport mechanism Effects 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/321—After treatment
- H01L21/3213—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer
- H01L21/32133—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only
- H01L21/32135—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by vapour etching only
- H01L21/32136—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by vapour etching only using plasmas
- H01L21/32137—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by vapour etching only using plasmas of silicon-containing layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32091—Radio frequency generated discharge the radio frequency energy being capacitively coupled to the plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32137—Radio frequency generated discharge controlling of the discharge by modulation of energy
- H01J37/32155—Frequency modulation
- H01J37/32165—Plural frequencies
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3266—Magnetic control means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/3065—Plasma etching; Reactive-ion etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/308—Chemical or electrical treatment, e.g. electrolytic etching using masks
- H01L21/3081—Chemical or electrical treatment, e.g. electrolytic etching using masks characterised by their composition, e.g. multilayer masks, materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/32—Processing objects by plasma generation
- H01J2237/33—Processing objects by plasma generation characterised by the type of processing
- H01J2237/334—Etching
- H01J2237/3343—Problems associated with etching
- H01J2237/3347—Problems associated with etching bottom of holes or trenches
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP01967676A EP1329948A4 (en) | 2000-09-14 | 2001-09-13 | FAST SILICON RATE PROCESS |
KR1020037003805A KR100875770B1 (ko) | 2000-09-14 | 2001-09-13 | 실리콘 기판의 가공 방법 |
US10/380,428 US7022616B2 (en) | 2000-09-14 | 2001-09-13 | High speed silicon etching method |
AU2001288042A AU2001288042A1 (en) | 2000-09-14 | 2001-09-13 | High speed silicon etching method |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000280376A JP3920015B2 (ja) | 2000-09-14 | 2000-09-14 | Si基板の加工方法 |
JP2000-280376 | 2000-09-14 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2002023609A1 true WO2002023609A1 (fr) | 2002-03-21 |
Family
ID=18765225
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2001/007962 WO2002023609A1 (fr) | 2000-09-14 | 2001-09-13 | Procede de gravure de silicium a vitesse elevee |
Country Status (8)
Country | Link |
---|---|
US (1) | US7022616B2 (ja) |
EP (1) | EP1329948A4 (ja) |
JP (1) | JP3920015B2 (ja) |
KR (1) | KR100875770B1 (ja) |
CN (1) | CN1284213C (ja) |
AU (1) | AU2001288042A1 (ja) |
TW (1) | TW506015B (ja) |
WO (1) | WO2002023609A1 (ja) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004082007A1 (ja) * | 2003-03-12 | 2004-09-23 | Tokyo Electron Limited | 半導体処理用の基板保持構造及びプラズマ処理装置 |
WO2004097909A2 (en) * | 2003-04-24 | 2004-11-11 | Tokyo Electron Limited | Method and apparatus for deep trench silicon etch |
EP1498941A2 (en) * | 2003-07-15 | 2005-01-19 | Air Products And Chemicals, Inc. | Unsaturated oxygenated fluorocarbons for selective anisotropic etch applications |
WO2005008760A2 (de) * | 2003-07-11 | 2005-01-27 | Infineon Technologies Ag | Verfahren zum anisotropen ätzen einer ausnehmung in ein siliziumsubstrat und verwendung einer plasmaätzanlage |
JP4660687B2 (ja) * | 2003-10-22 | 2011-03-30 | アークレイ株式会社 | 試験片供給装置 |
CN103337444A (zh) * | 2013-06-08 | 2013-10-02 | 天通吉成机器技术有限公司 | 一种干法等离子刻蚀机的反应腔 |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100403616B1 (ko) * | 2001-01-03 | 2003-10-30 | 삼성전자주식회사 | 플라즈마 장치에 의한 플라즈마 처리 공정의 시뮬레이션방법 |
US20050103441A1 (en) * | 2001-11-14 | 2005-05-19 | Masanobu Honda | Etching method and plasma etching apparatus |
JP4377698B2 (ja) * | 2002-04-08 | 2009-12-02 | 東京エレクトロン株式会社 | プラズマエッチング方法及びプラズマエッチング装置 |
JP4431402B2 (ja) | 2002-04-08 | 2010-03-17 | 東京エレクトロン株式会社 | プラズマエッチング方法 |
JP3972846B2 (ja) | 2003-03-25 | 2007-09-05 | セイコーエプソン株式会社 | 半導体装置の製造方法 |
JP4781106B2 (ja) * | 2003-06-13 | 2011-09-28 | 住友精密工業株式会社 | シリコンエッチング方法及び装置並びにエッチングシリコン体 |
US7993460B2 (en) * | 2003-06-30 | 2011-08-09 | Lam Research Corporation | Substrate support having dynamic temperature control |
KR101083558B1 (ko) * | 2003-12-01 | 2011-11-14 | 파나소닉 주식회사 | 플라즈마 에칭 방법 |
US20050241671A1 (en) * | 2004-04-29 | 2005-11-03 | Dong Chun C | Method for removing a substance from a substrate using electron attachment |
JP4182921B2 (ja) | 2004-06-08 | 2008-11-19 | セイコーエプソン株式会社 | ノズルプレートの製造方法 |
US7988816B2 (en) | 2004-06-21 | 2011-08-02 | Tokyo Electron Limited | Plasma processing apparatus and method |
US7740737B2 (en) | 2004-06-21 | 2010-06-22 | Tokyo Electron Limited | Plasma processing apparatus and method |
US7951262B2 (en) * | 2004-06-21 | 2011-05-31 | Tokyo Electron Limited | Plasma processing apparatus and method |
WO2005124844A1 (ja) * | 2004-06-21 | 2005-12-29 | Tokyo Electron Limited | プラズマ処理装置及び方法 |
US7615164B2 (en) * | 2004-06-23 | 2009-11-10 | Micron Technology, Inc. | Plasma etching methods and contact opening forming methods |
JP4629421B2 (ja) * | 2004-12-06 | 2011-02-09 | パナソニック株式会社 | ドライエッチング方法及びドライエッチング装置 |
JP4488999B2 (ja) * | 2005-10-07 | 2010-06-23 | 株式会社日立ハイテクノロジーズ | エッチング方法およびエッチング装置 |
EP1786027A3 (en) * | 2005-11-14 | 2009-03-04 | Schott AG | Plasma etching of tapered structures |
KR100777151B1 (ko) | 2006-03-21 | 2007-11-16 | 주식회사 디엠에스 | 하이브리드형 플라즈마 반응장치 |
US20080149592A1 (en) * | 2006-12-05 | 2008-06-26 | Belen Rodolfo P | Plasma etch process for controlling line edge roughness |
JP4607930B2 (ja) * | 2007-09-14 | 2011-01-05 | 株式会社東芝 | プラズマ処理装置およびプラズマ処理方法 |
WO2011115008A1 (ja) * | 2010-03-16 | 2011-09-22 | 株式会社 アルバック | エッチング方法及びエッチング装置 |
JP2015220366A (ja) * | 2014-05-19 | 2015-12-07 | 株式会社ディスコ | ウェーハの加工方法 |
US10586710B2 (en) * | 2017-09-01 | 2020-03-10 | Tokyo Electron Limited | Etching method |
Citations (6)
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EP0472941A2 (en) * | 1990-07-31 | 1992-03-04 | Applied Materials, Inc. | VHF/UHF plasma process for use in forming integrated circuit structures on semiconductor wafers |
JPH05129248A (ja) * | 1991-10-30 | 1993-05-25 | Nippon Soken Inc | 高速ドライエツチング方法 |
EP0665575A1 (en) * | 1994-01-28 | 1995-08-02 | Applied Materials, Inc. | Plasma processing systems |
JPH0864585A (ja) * | 1994-06-13 | 1996-03-08 | Matsushita Electric Ind Co Ltd | プラズマ発生加工方法およびその装置 |
US5536364A (en) * | 1993-06-04 | 1996-07-16 | Nippon Soken, Inc. | Process of plasma etching silicon |
JPH11297672A (ja) * | 1998-04-09 | 1999-10-29 | Tadahiro Omi | シャワープレート、シャワープレート周辺構造及びプロセス装置 |
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JPS5632730A (en) * | 1979-08-27 | 1981-04-02 | Fujitsu Ltd | Manufacture of semiconductor device |
DE3574418D1 (en) * | 1984-05-30 | 1989-12-28 | Fujitsu Ltd | Pattern-forming material and its production and use |
EP0565212A2 (en) * | 1986-12-19 | 1993-10-13 | Applied Materials, Inc. | Iodine etch process for silicon and silicides |
US5707486A (en) * | 1990-07-31 | 1998-01-13 | Applied Materials, Inc. | Plasma reactor using UHF/VHF and RF triode source, and process |
US5295395A (en) * | 1991-02-07 | 1994-03-22 | Hocker G Benjamin | Diaphragm-based-sensors |
US6518195B1 (en) * | 1991-06-27 | 2003-02-11 | Applied Materials, Inc. | Plasma reactor using inductive RF coupling, and processes |
JP2913936B2 (ja) | 1991-10-08 | 1999-06-28 | 日本電気株式会社 | 半導体装置の製造方法 |
US5880036A (en) * | 1992-06-15 | 1999-03-09 | Micron Technology, Inc. | Method for enhancing oxide to nitride selectivity through the use of independent heat control |
US5869402A (en) * | 1994-06-13 | 1999-02-09 | Matsushita Electric Industrial Co., Ltd. | Plasma generating and processing method and apparatus thereof |
DE19813239C1 (de) * | 1998-03-26 | 1999-12-23 | Fraunhofer Ges Forschung | Verdrahtungsverfahren zur Herstellung einer vertikalen integrierten Schaltungsstruktur und vertikale integrierte Schaltungsstruktur |
US6103585A (en) * | 1998-06-09 | 2000-08-15 | Siemens Aktiengesellschaft | Method of forming deep trench capacitors |
US6054365A (en) * | 1998-07-13 | 2000-04-25 | International Rectifier Corp. | Process for filling deep trenches with polysilicon and oxide |
US6318384B1 (en) * | 1999-09-24 | 2001-11-20 | Applied Materials, Inc. | Self cleaning method of forming deep trenches in silicon substrates |
US6291357B1 (en) * | 1999-10-06 | 2001-09-18 | Applied Materials, Inc. | Method and apparatus for etching a substrate with reduced microloading |
US6593244B1 (en) * | 2000-09-11 | 2003-07-15 | Applied Materials Inc. | Process for etching conductors at high etch rates |
-
2000
- 2000-09-14 JP JP2000280376A patent/JP3920015B2/ja not_active Expired - Lifetime
-
2001
- 2001-09-13 CN CNB018156517A patent/CN1284213C/zh not_active Expired - Lifetime
- 2001-09-13 US US10/380,428 patent/US7022616B2/en not_active Expired - Lifetime
- 2001-09-13 AU AU2001288042A patent/AU2001288042A1/en not_active Abandoned
- 2001-09-13 WO PCT/JP2001/007962 patent/WO2002023609A1/ja active Application Filing
- 2001-09-13 EP EP01967676A patent/EP1329948A4/en not_active Ceased
- 2001-09-13 TW TW090122786A patent/TW506015B/zh not_active IP Right Cessation
- 2001-09-13 KR KR1020037003805A patent/KR100875770B1/ko active IP Right Grant
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0472941A2 (en) * | 1990-07-31 | 1992-03-04 | Applied Materials, Inc. | VHF/UHF plasma process for use in forming integrated circuit structures on semiconductor wafers |
JPH05129248A (ja) * | 1991-10-30 | 1993-05-25 | Nippon Soken Inc | 高速ドライエツチング方法 |
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Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2004082007A1 (ja) * | 2003-03-12 | 2004-09-23 | Tokyo Electron Limited | 半導体処理用の基板保持構造及びプラズマ処理装置 |
US7837828B2 (en) | 2003-03-12 | 2010-11-23 | Tokyo Electron Limited | Substrate supporting structure for semiconductor processing, and plasma processing device |
KR100752800B1 (ko) * | 2003-03-12 | 2007-08-29 | 동경 엘렉트론 주식회사 | 반도체처리용의 기판유지구조 및 플라즈마 처리장치 |
WO2004097909A2 (en) * | 2003-04-24 | 2004-11-11 | Tokyo Electron Limited | Method and apparatus for deep trench silicon etch |
WO2004097909A3 (en) * | 2003-04-24 | 2005-01-27 | Tokyo Electron Ltd | Method and apparatus for deep trench silicon etch |
WO2005008760A3 (de) * | 2003-07-11 | 2005-06-09 | Infineon Technologies Ag | Verfahren zum anisotropen ätzen einer ausnehmung in ein siliziumsubstrat und verwendung einer plasmaätzanlage |
WO2005008760A2 (de) * | 2003-07-11 | 2005-01-27 | Infineon Technologies Ag | Verfahren zum anisotropen ätzen einer ausnehmung in ein siliziumsubstrat und verwendung einer plasmaätzanlage |
US7799691B2 (en) | 2003-07-11 | 2010-09-21 | Infineon Technologies Ag | System and method for anisotropically etching a recess in a silicon substrate |
EP1498941A3 (en) * | 2003-07-15 | 2005-05-04 | Air Products And Chemicals, Inc. | Unsaturated oxygenated fluorocarbons for selective anisotropic etch applications |
SG130031A1 (en) * | 2003-07-15 | 2007-03-20 | Air Prod & Chem | Unsaturated oxygenated fluorocarbons for selective aniostropic etch applications |
EP1498941A2 (en) * | 2003-07-15 | 2005-01-19 | Air Products And Chemicals, Inc. | Unsaturated oxygenated fluorocarbons for selective anisotropic etch applications |
JP4660687B2 (ja) * | 2003-10-22 | 2011-03-30 | アークレイ株式会社 | 試験片供給装置 |
CN103337444A (zh) * | 2013-06-08 | 2013-10-02 | 天通吉成机器技术有限公司 | 一种干法等离子刻蚀机的反应腔 |
Also Published As
Publication number | Publication date |
---|---|
JP2002093776A (ja) | 2002-03-29 |
CN1284213C (zh) | 2006-11-08 |
TW506015B (en) | 2002-10-11 |
CN1459125A (zh) | 2003-11-26 |
US7022616B2 (en) | 2006-04-04 |
KR100875770B1 (ko) | 2008-12-24 |
EP1329948A4 (en) | 2007-09-12 |
US20040097079A1 (en) | 2004-05-20 |
KR20030045069A (ko) | 2003-06-09 |
AU2001288042A1 (en) | 2002-03-26 |
EP1329948A1 (en) | 2003-07-23 |
JP3920015B2 (ja) | 2007-05-30 |
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