WO2001003131A1 - Tete a effet magnetoresistant a modulation de spin, tete magnetique composee l'utilisant et unite d'entrainement de support d'enregistrement magnetique - Google Patents
Tete a effet magnetoresistant a modulation de spin, tete magnetique composee l'utilisant et unite d'entrainement de support d'enregistrement magnetique Download PDFInfo
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- WO2001003131A1 WO2001003131A1 PCT/JP1999/003614 JP9903614W WO0103131A1 WO 2001003131 A1 WO2001003131 A1 WO 2001003131A1 JP 9903614 W JP9903614 W JP 9903614W WO 0103131 A1 WO0103131 A1 WO 0103131A1
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
- G11B5/399—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures with intrinsic biasing, e.g. provided by equipotential strips
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
- G11B5/3906—Details related to the use of magnetic thin film layers or to their effects
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
- G11B5/3967—Composite structural arrangements of transducers, e.g. inductive write and magnetoresistive read
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
- G11B5/398—Specially shaped layers
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B2005/3996—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects large or giant magnetoresistive effects [GMR], e.g. as generated in spin-valve [SV] devices
Definitions
- the present invention relates to a spin valve magnetoresistive effect head and a composite magnetic head and magnetism using the same.
- the present invention relates to a spin-valve magnetoresistive head, and more particularly, to a spin-valve magnetoresistive head using a hard ferromagnetic layer for fixing the magnetization direction of a fixed magnetic layer, and a magnetic recording medium equipped with the same. ) Regarding the device. Background art
- anisotropic magnetoresistive (AMR) elements are most often used in magnetic heads mounted on magnetic recording medium devices such as hard disk drives (HDDs). ing.
- AMR anisotropic magnetoresistive
- HDDs hard disk drives
- SVMR spin-valve magnetoresistive
- SVMR head spin-valve magnetoresistive type magnetic head
- SVMR head spin-valve magnetoresistive
- SVMR head spin-valve magnetoresistive
- SVMR head spin-valve magnetoresistive type magnetic head
- SVMR head spin-valve magnetoresistive
- SVMR head spin-valve magnetoresistive
- the SVMR head 100 of the type employing an antiferromagnetic layer has a structure as shown in FIG. 1, for example.
- an SVMR element is formed by sequentially laminating an antiferromagnetic layer 102, a fixed magnetic layer 103, a nonmagnetic layer 104, and a free magnetic layer 105 on a substrate 101.
- S VMR ⁇ 3 ⁇ 4 (i ⁇ -is formed so as to correspond to the track width of the magnetic medium or the sense area S for detecting the signal magnetic field H sig from a magnetic recording medium such as a disk.
- ends are attached, for example. These ends are formed on the upper portions of the hard ferromagnetic layers 107A and 107B, for example, by the conductive electrode terminals 10A and 10B, respectively.
- 6 A, 106 B is formed by lamination.
- a sense current Is flows through the sense region S between the two electrode terminals 106A and 106B.
- the free magnetic layer is moved in response to the signal magnetic field Hsig from the hard disk. Since the magnetization direction of 105 rotates, the electric resistance of the SVMR head 100 changes sequentially. Therefore, the magnetization data transmitted to the hard disk can be detected as a voltage change between the terminals 106A and 106B.
- FIG. 2 shows another type of SVMR head 200 employing a hard ferromagnetic layer.
- the S VMR head 200 is provided on the substrate 201 with a lower layer 202, a hard ferromagnetic layer 203, a fixed magnetic layer 204, a non-magnetic layer 205, and a free magnetic layer 200. Stacked in the order of six forces, the S VMR element is formed.
- terminals 207A and 207A are located on the upper portions of the hard ferromagnetic layers 208A and 208B, respectively. 7 B is formed.
- the SVMR head 200 is also formed such that the sensing area S for detecting the signal magnetic field Hsig from the magnetic medium 2 such as a hard disk corresponds to the track width of the magnetic medium 11.
- the magnetization direction of the self-fixed magnetic layer 103 or 204 is directed forward in the X direction (perpendicular to the plane of the paper) as indicated by the arrow symbol.
- Fixed to The magnetization direction of the free magnetic layers 105 and 206 is set to be directed in the Y direction (horizontal direction with respect to the plane of the paper) when the signal magnetic field H s i from the magnetic I ⁇ medium is zero.
- the magnetization direction of the pinned magnetic layers 103 and 204 and the magnetization direction of the free magnetic layers 105 and 206 and the right angle of each TH are optimal conditions. If such a relationship between the fixed magnetic layer and the free magnetic layer can be maintained, the magnetization direction of the free magnetic layer rotates with respect to the signal magnetic field H sig from the external magnetic recording medium, and the resistance of the SVMR element is reduced. It can be changed linearly.
- the Y direction is the direction of the easy axis of magnetization of the free magnetic layers 105 and 206.
- the essentials of the two types of S VMR heads 100 and 200 shown above One difference is that one uses an exchange coupling magnetic field that employs an antiferromagnetic layer in the SVMR element to fix the magnetization direction of the fixed magnetic layer, while the other uses an exchange magnetic field that employs a hard ferromagnetic layer in the SVMR element. Thus, the direction of magnetization of the fixed magnetic layer is fixed.
- direction is used when an arrow or the like means a predetermined direction, and the word “direction” is used when the direction is not considered in the front-rear direction.
- the antiferromagnetic layer type SVMR head 100 when a regular manganese (Mn) alloy having a high Neel ⁇ 3 ⁇ 4 is used as a material of the antiferromagnetic layer, there is a case where the Neel temperature is low. Oxides such as ordered manganese alloys or nickel oxide (NiO) may be used.
- the S VMR head using the ordered Mn alloy has the advantage of having a high exchange coupling magnetic field of several hundred oersteds ( ⁇ e) and metaphysics.
- ⁇ e oersteds
- a layer thickness of 20 O A or more is required.
- it is necessary to make the SVMR element thinner in order to increase the density, it is necessary to make the SVMR element thinner, and it has a drawback that it will not be possible to meet the demand for thinner in the future.
- the static magnetic field leaking from the hard ferromagnetic layer may adversely affect the magnetic data recorded on the medium, and second, the static magnetic field leaking from the hard ferromagnetic layer may also affect the free magnetic layer. ⁇ May cause the symmetry of the waveform to be lost. Thirdly, the magnetization of the hard ferromagnetic layer itself is tilted by the magnetic field H s 1 £ from the SII medium, which is about 100 to 200 oo e, and as a result, the fixed magnetic layer That the magnetization direction may be tilted. Disclosure of the invention
- an object of the present invention is to provide a spin-valve T3 ⁇ 4 magnetoresistive effect head that solves the three problems of the conventional hard ferromagnetic layer type S VMR head and to mount the head.
- An object of the present invention is to provide a magnetic medium ⁇ 3 ⁇ 4 device.
- the above object is achieved by applying a bias magnetic field to at least the free magnetic layer, the non-magnetic metal layer, the fixed magnetic layer, and the fixed magnetic layer to fix the magnetization direction of the fixed magnetic layer, as described in claim 1.
- the magnetization direction of the self-biased magnetic field from the hard ferromagnetic layer, and the magnetization direction of the hard ferromagnetic layer Is achieved by a spin-balancing magnetoresistance effect head including an antiparallel coupling intermediate layer which is made substantially antiparallel to act on the fixed magnetic layer.
- the magnetization directions of the bias magnetization from the hard ferromagnetic layer are parallel and opposite. (Hereinafter, antiparallel) and has a function of applying a voltage to the fixed magnetic layer. Therefore, the fixed magnetic layer and the hard ferromagnetic layer are magnetically coupled in an antiparallel state with the antiparallel coupling intermediate layer interposed therebetween. Since the magnetization direction of the hard ferromagnetic layer and the magnetization direction of the hard ferromagnetic layer become different, the magnetic loop is closed, and the fixed magnetic layer and the hard ferromagnetic layer are strongly magnetically coupled. .
- the magnetic field leaking from the hard ferromagnetic layer to the outside is greatly suppressed, and the bad substance to the outside is reduced.
- the hard ferromagnetic layer is a single layer and has a thickness of at least 600 e. It preferably has a magnetic force He.
- Hc coercive force
- the spin-balf magnetoresistive effect head according to claim 2 has an if self-hard ferromagnetic layer and a
- the hard ferromagnetic layer is set so that the coercive force He is larger and the magnetic moment tBr is equal to or larger than that of the fixed magnetic layer.
- the magnetic moment of the hard ferromagnetic layer By setting the magnetic moment of the hard ferromagnetic layer large, the effective anisotropic magnetic field Hua of the fixed magnetic layer can be increased.
- the hard ferromagnetic layer be as immovable as possible with respect to the signal magnetic field Hsig;
- the coercive force He of the hard ferromagnetic layer is preferably at least 60 OOe.
- the coercive force H c of the fixed magnetic layer is the coercive force H of the hard ferromagnetic layer. It is preferably smaller than, for example, several tens of e or less.
- the spin valve magnetoresistive head it_b includes a process of applying an external field and magnetizing the hard ferromagnetic layer to align the magnetization direction of the hard ferromagnetic layer with the same direction as the signal magnetic field Hsig.
- the crossing magnetic field received from the fixed magnetic layer is about 2 to 6 kOe, it is impossible to fix the single ferromagnetic layer in a desired direction unless an external magnetic field exceeding this value is applied. If the fixed magnetic layer has a high coercive force during this magnetization, even if the external magnetic field is zero after magnetization, the fixed magnetic layer and the hard ferromagnetic layer will not be antiparallel to each other.
- Figure 3 shows a B-H loop of a laminate with ruthenium (Ru) sandwiched between two cobalt-platinum (PtCo) films having the same magnetic moment (B) and coercive force (H) as an antiparallel coupling interlayer.
- ruthenium for example, a magnetic field of 12 k 0 e is applied in (1), and then returned to zero magnetic field in (2). It cannot be made antiparallel even by the combined magnetic field, and is tilted and fixed in both C 0 Pt membrane power directions. This cannot achieve the desired effect.
- 4 (A), 4 (B) and 4 (C) show BH loops when a NiFe film is used as the pinned magnetic layer and a CoPt film is used as the hard ferromagnetic layer.
- (A) shows that the magnetic moment of the CoPt film is larger than that of NiFe
- (B) shows the magnetic moment of the CoPt film.
- (C) indicates that the magnetic moment of the CoPt film is smaller than that of NiFe when the value is equal to NiFe.
- both magnetizations are antiparallel in the state of (2) after the magnetization in (1).
- the magnetic moment of the Co Pt film in (A) and (B) is equal to or larger than that of the NiFe film, the fixed magnetic layer and the hard ferromagnetic layer are obtained only by applying ⁇ 200 Oe as the signal magnetic field Hsig. The magnetization direction of does not change from (2).
- the magnetic moment of the Co Pt film is smaller than that of the NiFe film in (C)
- the magnetic field He * is relatively low, and the force for stopping the pinned magnetic layer is weakened. This is because the larger the moment of the pinned magnetic layer, the more strongly it responds to external magnetization. Therefore, the magnetization of the fixed magnetic layer is easily rotated. As a result, the magnetic field applied to the hard ferromagnetic layer becomes stronger against the magnetic field, and it is easy to reverse.
- the hard ferromagnetic layer has a larger coercive force He than the fixed magnetic layer, and that the magnetic moment tBr is set to be equal or larger.
- the pinned magnetic layer is made of cobalt monoiron (CoFe) or copper monoiron.
- the hard ferromagnetic layer is made of cobalt (Co), cobalt monochromium (CoCr), cobalt monoplatinum (CoPt), cobalt monochromium tantalum (CoCrTa), cobalt monochromium
- CoCrPt platinum
- CoCrTaPt cobalt-chromium-tantalum-platinum
- SmCo samarium-cobalt
- Co—Fe—Oxide cobalt-iron-iron monoxide
- the parallel coupling intermediate layer may be a layer containing ruthenium (Ru).
- the spin-valve magnetoresistive head according to any one of claims 1 to 4 has an effective anisotropy of the self-fixed magnetic layer.
- the magnetic field Hua is 600 ° e or more and the external magnetic field is zero
- the magnetization direction of the fixed magnetic layer and the magnetization direction of the free magnetic layer are perpendicular to each other. It is more preferable that the angle is set within 20 degrees before and after.
- the effective anisotropic magnetic field Hua force of the fixed pinned magnetic layer is more than 600 e, the magnetization direction force and tilt of the pinned magnetic layer are suppressed by the influence of the external magnetic field, and the magnetization of the pinned magnetic layer If the direction and the magnetic easy axis of the free magnetic layer are at right angles or within 20 degrees before and after the right angle, the magnetization direction of the free magnetic layer rotates with high sensitivity to the signal magnetic field H sig from the magnetic recording medium.
- the resistance value of the SVMR element can be changed linearly.
- the spin-valve magnetoresistive head according to claim 3 has at least a conductive layer at both ends of the element in the track width direction. Edge including stack of ferromagnetic layers "? ⁇ May be added. In this case, the free magnetic layer is magnetized in the axis of easy oxidation by the exchange magnetic field from the antiferromagnetic layer at the terminal.
- the spin valve magnetoresistive head according to claim 6 is such that the pinned magnetic layer of the suijin element is cobalt-iron-iron or cobalt-iron-iron-boron.
- the hard ferromagnetic layer is composed of cobalt, cobalt-chromium, cobalt-platinum, cobalt-chromium-tantalum, cobalt-chromium-platinum, cobalt-chromium-chromium alloy, samarium-cobalt and cobalt-iron-iron.
- the anti-parallel coupling intermediate layer is composed of a layer containing ruthenium, and the antiferromagnetic layer at the end of the layer is composed of palladium-platinum-manganese (P d Pt Mn), Platinum monomanganese (PtMn), Palladium monomanganese (PdMn), Nickel monomanganese (NiMn), Chromium monomanganese (CrMn) and Nickel fluoride (Ni0) What It can be a layer including any one selected from the group.
- the spin-bulb magnetoresistive effect head according to claim 3 has at least a conductive layer and a hard ferromagnetic layer at both ends of the element in the track width direction. An end including a different stack may be provided. In this case, the free magnetic layer is magnetized in the magnetic easy axis direction by the static magnetic field from the hard ferromagnetic layer at the terminal.
- the spin valve magnetoresistive head according to claim 8 comprises a hard ferromagnetic layer and a terminal of an element portion of the spin valve magnetoresistive head. It is preferable that the hard ferromagnetic layer of the portion is made of a different material. As a result, the magnetization direction of the hard magnetic ferromagnetic layer and the magnetization direction of the hard hard magnetic Setting is facilitated.
- the spin-valve magnetoresistive effect head according to claim 9 is characterized in that the fixed magnetic layer of the woven body is made of cobalt-iron or cobalt-iron.
- the hard ferromagnetic layer is composed of a layer containing boron. It consists of a layer containing one selected from the group consisting of iron monoxide, the antiparallel bonding intermediate layer consists of a layer containing ruthenium, ii the hard ferromagnetic layer of the self-terminal part is cobalt, , Cobalt-Platinum, Cobalt-Chromium-Tantalum, Cobalt-Chromium-Platinum, Cobalt-Chromium-Tantalum-Platinum. It can be a layer containing any one selected from the group consisting of samarium monocobalt and cobalt monoiron monoxide (CoFeO).
- the present invention has a magnetic head for reproduction, a magnetic head for SI, and a magnetic head force for at least a free magnetic layer, as described in claim 11.
- An anti-parallel coupling intermediate layer that makes the magnetization direction of the magnetic field from the hard ferromagnetic layer disposed substantially antiparallel to the magnetization direction of the hard ferromagnetic layer and acts on the filf self-fixed magnetic layer.
- the mi ferromagnetic layer is a single layer and has a coercive force Hc of at least 600 e, and the Tsurumi hard ferromagnetic layer and the Tsurumi hard ferromagnetic layer are made of different materials.
- the coercive force Hc is larger and the magnetic moment tBr is equal or larger than that of the fixed magnetic layer.
- the present invention includes a magnetic recording medium and a composite magnetic head for performing ⁇ 3 ⁇ 4
- the hard ferromagnetic layer is a single layer and has a coercive force Hc of at least 600 ⁇ e. However, the material of the hard ferromagnetic layer and the material of the pinned magnetic layer are different, and the hard ferromagnetic layer has a coercive force He and a magnetic moment t Br that are equal to or larger than those of the fixed magnetic layer. Includes magnetic medium with spin-valve magnetoresistive head set. BRIEF DESCRIPTION OF THE FIGURES
- Fig. 1 is a diagram showing an example of the structure of a conventional SVMR head employing an antiferromagnetic layer.
- Fig. 2 is a diagram showing an example of the structure of a SVMR head employing a conventional hard ferromagnetic layer.
- Figure 3 shows a B-H loop of a laminate with ruthenium (Ru) sandwiched between two cobalt-platinum (PtCo) films with the same magnetic moment ( ⁇ ) and coercive force ( ⁇ ) as an antiparallel coupling interlayer.
- Ru ruthenium
- PtCo cobalt-platinum
- Figure 4 shows the B--H loop when a NiFe film was used as the pinned magnetic layer and a CoPt film was used as the hard ferromagnetic layer.
- A shows that the magnetic moment of the CoPt film is higher than that of NiFe.
- B shows the case where the magnetic moment of the C 0 Pt film is equal to Ni Fe, and
- C shows the case where the magnetic moment of the Co Pt film is smaller than that of NiFe.
- FIG. 5 is a cross-sectional view of a main part of the SVMR head of the first embodiment
- FIG. 6 is a diagram in which the SVMR head of the first embodiment is incorporated in a hard disk drive
- FIG. 7 is a diagram showing a manufacturing flow of the SVMR head employed in the composite magnetic head
- FIG. 4 is a perspective view showing a main part of an S VMR head according to a second embodiment
- FIG. 9 is a diagram showing a main part of a magnetic recording medium device equipped with a magnetic head including an SVMR head according to the present invention.
- FIG. 5 is a cross-sectional view of a main part of the SVMR head 10 according to the first embodiment of the present invention.
- This embodiment is the SVMR of the present invention.
- An example is shown in which an antiferromagnetic layer is used at the end of the head, and magnetization of the free magnetic layer is generated by an exchange magnetic field from the antiferromagnetic layer.
- the SVMR element which is the main body of the SVMR head 10, consists of an underlayer 12, a hard ferromagnetic layer 13, an antiparallel coupling intermediate layer 14, and a fixed magnetic layer on an aluminum or ceramic substrate 11. 15, a non-magnetic layer 16 and a free magnetic layer 17, which are laminated in order from the bottom.
- the hard ferromagnetic layer 13 is provided for applying a bias magnetic field to the fixed magnetic layer 15 and fixing its magnetization direction to a predetermined direction.
- the hard ferromagnetic layer 13 is magnetically coupled to the fixed magnetic layer 15 with the antiparallel coupling intermediate layer 14 interposed therebetween.
- the magnetization direction of the pinned magnetic layer 15 is substantially antiparallel to the magnetization direction of the bias magnetization applied from the hard ferromagnetic layer 13 with the antiparallel coupling intermediate layer 14 interposed therebetween.
- the modified ferromagnetic layer 13 and the hard ferromagnetic layer 15 form a closed magnetic field, and the magnetic field force leaking outside from the hard ferromagnetic layer 13 and the fixed magnetic layer 15 is suppressed.
- the hard ferromagnetic layer 13 and the pinned magnetic layer 15 have a relationship of assisting each other with respect to an external field that gives the direction of magnetization of the hard ferromagnetic layer 13 and the pinned magnetic layer 15 because the two are magnetically coupled. .
- the presence of the magnetic coupling with the hard ferromagnetic layer 13 prevents the magnetization direction force of the fixed magnetic layer 15 from tilting. .
- the hard ferromagnetic layer 13 receives an external magnetic field, the hard ferromagnetic layer 13 is prevented from tilting in the same relationship.
- the magnetization direction of the hard ferromagnetic layer 13 and the magnetization direction of the fixed magnetic layer 15, which are made almost antiparallel by the parallel coupling intermediate layer 14, are allowed to have an angle deviation within 10 from each other. What is necessary is just an antiparallel state.
- the direction of the arrow indicates that the magnetization direction of the hard ferromagnetic layer 13 is forward in the X direction and the magnetization direction of the fixed magnetic layer 15 is backward in the X direction. Have been.
- chrome (Cr) can be used for the underlayer 12.
- the hard ferromagnetic layer 13 is made of cobalt (Co), conochrome-chromium (CoCr), cobalt-platinum (CoPt), cobalt-chromium-tantalum (CoCrTa), cobalt-chromium-platinum (CoCrPt).
- a layer containing one of Cobalt-Chromium-Tantalum-Platinum (CoCrTaPt) and Samarium-Cobalt (SmCo) Can be used.
- As the anti-parallel coupling intermediate layer 14 a layer containing ruthenium (Ru) can be used as the anti-parallel coupling intermediate layer 14.
- the fixed magnetic layer 15 may use a layer containing a copper (Cu) as c nonmagnetic layer 16 which can be used a layer containing cobalt monoferric (CoF e) or cobalt iron one boron (CoFeB) it can.
- a layer containing nickel-iron (NiFe), cobalt-iron (CoFe), and cobalt-iron-boron (CoFeB) can be used as the free magnetic layer 17.
- a protective layer, thigh layer, gap layer, etc. may be added.
- the hard ferromagnetic layer 13 is a single layer and has a high coercive force Hc of at least 600 ° e.
- the coercive force Hc and the magnetic moment tBr are set so that the hard ferromagnetic layer 13 is larger than the fixed magnetic layer 15.
- the magnetic moment of the hard ferromagnetic layer 13 and the magnetic moment of the fixed magnetic layer 15 are determined in consideration of the balance between these effects.
- different materials are used for the hard ferromagnetic layer 13 and the fixed magnetic layer 15. For example, a combination of cobalt-platinum as the hard ferromagnetic layer 13 and a combination of cobalt-iron-boron as the fixed magnetic layer 15 can be employed.
- Terminals are attached to both ends of the SVMR head 10. These terminals include the underlayers 21A and 21B, the antiferromagnetic layers 2OA and 20B, the insulators 19A and 19B, and the conductive elements 18A and 18B, respectively, and are formed by being stacked in order from the bottom. Is done.
- the self-ferromagnetic layers 20 and 20B apply a free magnetic field to the free magnetic layer 17 that is substantially perpendicular to the magnetization direction of the fixed magnetic layer 15.
- the antiferromagnetic layer 20 includes palladium platinum monomanganese (PdPtMn), platinum monomanganese (PtMn), palladium monomanganese (PdMn), nickel monomanganese (NiMn), chromium monomanganese (CrMn), and nickel oxide ( A layer containing one selected from N i 0) can be used.
- the underlayer 21 a layer containing nickel-iron (NiFe) can be used as the underlayer 21 a layer containing nickel-iron (NiFe) can be used.
- a layer containing tantalum (Ta) can be used.
- a layer containing gold (Au) can be used, and a signal magnetic field Hs from a magnetic medium is interposed between the electrodes 18A and 18B. A sense Is current is passed to detect ig.
- the magnetization directions of the hard ferromagnetic layer 13 and the hard ferromagnetic layer 15 are substantially antiparallel to each other in the X direction. Magnetically coupled. Therefore, the magnetization directions of the hard ferromagnetic layer 13 and the hard ferromagnetic layer 15 are lines or substantially antiparallel to the signal magnetic field Hsig input from the magnetic recording medium in the X direction.
- the direction of magnetization of the free magnetic layer 17 is changed to the Y direction, that is, the signal magnetic field Hs ig by receiving the crossing magnetic field from the antiferromagnetic layer 20 arranged at both ends “?”. It is kept perpendicular to it.
- the magnetization direction of the free magnetic layer 17 rotates in the direction of the signal magnetic field Hsig, but the magnetization direction of the fixed magnetic layer 15 remains fixed.
- An angle occurs between the magnetization direction of 17 and the magnetization direction of fixed magnetic layer 15, and a change in resistance proportional to the cosine of the angle appears as a change in sense current flowing through the terminal electrode. That is, the signal magnetic field Hsig from the magnetic medium can be detected as a voltage change.
- the conventional S VMR head employs an antiferromagnetic layer that employs an antiferromagnetic layer.
- palladium-platinum-manganese PdPtMn
- cobalt-iron-boron is used as the fixed magnetic layer.
- the total thickness was about 430 A in order to increase the effective anisotropic magnetic field Hua of the fixed magnetic layer to 60 OOe or more.
- the layer thickness is 320 A.
- the magnetization directions of the hard ferromagnetic layer and the fixed magnetic layer are the same, so that the leakage magnetic field is minimized.
- the hard ferromagnetic layer was thinned.
- C0Pt cobalt-platinum
- the hard ferromagnetic layer 13 and the pinned magnetic layer 15 are magnetically coupled via the antiparallel coupling intermediate layer 14 to provide a hard ferromagnetic layer.
- the static magnetic field of layer 13 and pinned magnetic layer 15 draws a single closed loop, minimizing the leakage magnetic field, while the external magnetic field is pinned to hard ferromagnetic layer 13
- the magnetic layers 15 are in a mutually assisting relationship to prevent the magnetization direction from tilting. Further, the hard ferromagnetic layer 13 and the pinned magnetic layer 15 were thinned.
- the hard ferromagnetic layer 13 is made of 50 cobalt-platinum (C 0 Pt), and the hard ferromagnetic layer 15 is made of 22 cobalt-iron-boron (CoFeB). Formed the S VMR head.
- the effective anisotropic magnetic field Hua of the pinned magnetic layer 15 could be set to 600 e even though the S VMR head was a thin layer having a total thickness of 230 people.
- the SVMR head 10 of the first embodiment is used as a magnetic head for use as a magnetic disk, and such a magnetic head is used by being mounted on a hard disk drive as a magnetic storage device.
- a hard disk drive as a magnetic storage device.
- Fig. 6 shows a composite magnetic head in which the S VMR head 10 in Fig. 5 is incorporated as a reproducing magnetic head for a hard disk drive, and an inductive magnetic head for magnetic speech coexists.
- the entire structure of the pad 30 is provided.
- a hard disk 27 as a magnetic recording medium arranged opposite to the composite magnetic head 30 is shown.
- the S VMR head 10 is adopted as the magnetic head 31 of the composite magnetic head 30.
- the composite magnetic head 30 is roughly divided into a magnetic head 3 1 and a magnetic head 3 2.
- the magnetic head 3 1 has a seal 2 2 and a magnetic head 3. It is a merged type that doubles as the word pole (lower core) of 2 and has a piggyback structure that adds a magnetic head 3 2 to the back of the magnetic head 31.
- the magnetic head 31 includes the S VMR element, It consists of this SVMR element, electrode terminals 18A and 18B attached to both ends thereof, and a lower reproducing shield 28 and an upper reproducing shield 22 arranged on both sides thereof.
- the magnetic head 32 includes a magnetic coil 25 and an edge layer 24 surrounding the coil, and an edge layer 24 and a magnetic gap film 23 disposed on both sides of the edge layer 24.
- the upper magnetic pole 26 is provided.
- the lower playback shield 22 is also used as the word magnetic pole of the word S section.
- the upper electrode 22 is fixed between the upper electrode 22 and the recording upper magnetic pole 26 disposed opposite to the upper electrode 22 via a magnetic edge layer 24 and a magnetic pole gap film 23.
- the coil 25 is buried in the above-mentioned edge layer 24.
- the SII magnetic head 32 which is referred to as the magnetic head 31, is formed in the composite magnetic head 30.
- a lower shield 28 film is formed in step S40.
- the lower shield 28 is made of, for example, a Fe—N film of a nitrogen-iron-based material.
- step S41 a reproducing lower gap film is formed.
- Play lower gap layer is made of I aluminum (Al 2 0 3), for example.
- each element layer of the SVMR head 10 shown in FIG. 5 is formed and patterned, and ends are attached to both ends of the element.
- An SVMR head 10 element for example, 3 OA of chromium (Cr) as the underlayer 12, 5 OA of cobalt-platinum (CoPt) as the hard ferromagnetic layer 13, and 8 as the antiparallel coupling intermediate layer 14 Ruthenium (Ru) of A, Cobalt-Iron-Boron (CoFeB) of 22 A as fixed magnetic layer 15, Copper (Cu) of 3 OA as nonmagnetic layer 16, Cobalt with 15 as free magnetic layer 17 It is formed by stacking iron (CoFe), nickel iron (Ni Fe) of 2 OA, and tantalum (Ta) as a protective layer in this order.
- This lamination is performed by, for example, a sputtering method.
- the entire SVMR element is patterned into a flat rectangular shape using normal photolithography (lithography).
- the terminal of SVMR head 10 Similarly, the underlayers 21A and 21B, the antiferromagnetic layer 2OA.20B, the protective layers 19A and 19B are laminated in this order, and finally, a pair of layers is formed on the protective layers 19A and 19B.
- Electrode terminals 18 A and 18 B are formed.
- PdPtMn palladium-platinum-manganese
- Ta tantalum
- Au gold
- a regular alloy such as palladium-platinum-manganese (PdPtMn)
- PdPtMn palladium-platinum-manganese
- the magnetization direction of the free magnet 117 is directed to the easy axis direction (Y direction).
- the conditions of the annealing temperature, the processing time, and the applied magnetic field are set such that the magnetization direction of the free magnetic layer 17 is perpendicular to the magnetization direction of the pinned magnetic layer 15 or within 20 degrees before and after the perpendicular. Is set.
- a magnetization process is performed to align the magnetization direction of the hard ferromagnetic layer 13 on the element portion side, and the magnetization direction of the fixed magnetic layer 15 is also fixed.
- step S43 an upper gap film is formed.
- the ⁇ portion Giyappu film is made of, for example, aluminum oxide (Al 2 0 3).
- step S44 the reproducing upper shield 22 is formed. This reproduction upper shield
- NiFe nickel-iron
- step S45 a recording gap layer is formed.
- step S46 the recording coil 25 is formed.
- step S47 the upper magnetic pole 26 is formed.
- step S48 a protective film is formed.
- FIG. 8 is a perspective view showing one half of the SV MR head of the second embodiment.
- FIG. 8 shows an example in which a hard ferromagnetic layer is used at the terminal of the SVMR head 50 and magnetization of the free magnetic layer is generated by a static magnetic field from the hard ferromagnetic layer.
- the same parts as those shown in FIG. 5 are denoted by the same reference numerals.
- the element portion of the SVMR head is the same as that of the first embodiment, and a duplicate description will be omitted. It is abbreviated, and the description focuses on the features.
- the configuration of the terminal portions provided on both sides is different. That is, the lower layer H51B (A), the hard ferromagnetic layer 52B (A), the protective layer 19B (A), and the terminal 8B (A) are laminated.
- the hard ferromagnetic layer 52 at the end is made of cobalt (Co), cobalt-chromium (CoCr), cobalt-platinum (CoPt), cobalt-chromium-tantalum (CoCrTa), copper-chromium-platinum (CoCrPt).
- CoCrTaPt Cobalt-chromium-tantalum-platinum
- SmCo samarium-cobalt
- CoF e ⁇ cobalt-iron-iron monoxide
- 3 OA of iron (Fe) can be used for the lower% ⁇ 51
- 40 OA of samarium-cobalt (SmCo) can be used for the hard ferromagnetic layer 52.
- tantalum (Ta) and gold (Au) can be used for the protective layer 19 and the terminal # @ 18, respectively.
- the manufacture of the SVMR head according to the present embodiment is performed according to the manufacturing method described in the first embodiment.
- a hard ferromagnetic layer is employed at the element and the end of the SVMR head 50.
- the hard ferromagnetic layer 13 functions to set the magnetization direction of the fixed magnetic layer 15 to be equal to the signal magnetic field H s i and the IB line.
- the other hard ferromagnetic layer 52 functions to direct the magnetization direction of the free magnetic layer 17 substantially at right angles to the magnetization direction of the fixed magnetic layer 15.
- the hard ferromagnetic layer 52 of the SVMR element is subjected to a magnetic field treatment for aligning the magnetization direction of the hard ferromagnetic layer 52 at the terminal portion in one direction (Y direction).
- Heat treatment in a magnetic field is performed in the X direction perpendicular to the Y direction with the magnetization direction of 13.
- the magnetization direction determined in the Y direction of the hard ferromagnetic layer 52 on the terminal portion side may be tilted due to the influence of later processing, so that the hard ferromagnetic layer 13 and the hard ferromagnetic layer 52 usually have different materials.
- Is selected, and processing conditions are set by changing the processing temperature, processing time, and applied magnetic field so that no inconvenience occurs.Note that depending on the end T ⁇ and the hard ferromagnetic layer selected for the element part, In some cases, heating is not required.
- the hard ferromagnetic layer 13 is made of 50 A of cobalt-platinum (C 0 Pt), and the hard ferromagnetic layer 52 is made of 40 OA of samarium-cobalt (SmCo). Have been used.
- the hard ferromagnetic layer 13 of the SVMR element is magnetized in parallel with the signal magnetic field Hsig after the magnetization of the hard ferromagnetic layer 52 of the terminal, the applied magnetic field is The size of the layer 52 is set so that the magnetization direction does not change.
- the S VMR head 50 of the second embodiment is also used alone as a magnetic head for a magnetic recording medium like the S VMR element 10 of the first embodiment. Used in conjunction with the password.
- FIG. 9 is a diagram showing a main part of the magnetic medium driving device.
- the magnetic language SII medium storage device 60 is equipped with a hard disk 61 as a magnetic storage medium, and is rotated.
- the above-described composite magnetic head 30 of the present invention is disposed at a predetermined flying height facing the surface of the hard disk 61, and a reproducing operation is performed with the magnetic language 1.
- the composite magnetic head 30 is fixed to the front of the slider 122 extending from the arm 123.
- a two-stage type actuator combining a normal actuator and a micro / micro actuator can be employed.
- the magnetization direction of the hard ferromagnetic layer and the magnetization direction of the hard ferromagnetic layer are reversed, so that a magnetic loop is formed. Is closed, and the fixed magnetic layer and the hard ferromagnetic layer are magnetically and strongly coupled. As a result, the magnetic field leaking from the hard ferromagnetic layer to the outside is suppressed, so that no bad influence is exerted to the outside. On the other hand, the magnetization direction is also prevented from being tilted by receiving a magnetic field from outside the pinned magnetic layer and the hard ferromagnetic layer.
- the magnetization direction of the free magnetic layer rotates with respect to the signal magnetic field H sig from the magnetic recording medium, and the resistance value of the S VMR element changes linearly. Can be.
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- Crystallography & Structural Chemistry (AREA)
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- Mathematical Physics (AREA)
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Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020017015971A KR20020013577A (ko) | 1999-07-05 | 1999-07-05 | 스핀 밸브 자기 저항 효과 헤드 및 이것을 이용한 복합형자기 헤드 및 자기 기록 매체 구동장치 |
PCT/JP1999/003614 WO2001003131A1 (fr) | 1999-07-05 | 1999-07-05 | Tete a effet magnetoresistant a modulation de spin, tete magnetique composee l'utilisant et unite d'entrainement de support d'enregistrement magnetique |
EP99926931A EP1193693A4 (en) | 1999-07-05 | 1999-07-05 | SPIN VALVE MAGNETO RESONANCE EFFECT MAGNETIC HEAD AND IT USING COMPOSITE MAGNETIC HEAD AND MAGNETIC RECORDING MEDIUM DRIVE UNIT |
CN99816769A CN1352791A (zh) | 1999-07-05 | 1999-07-05 | 自旋阀磁阻效应磁头和使用该磁头的复合磁头及磁记录介质驱动装置 |
US10/011,096 US20020044397A1 (en) | 1999-07-05 | 2001-12-06 | Spin valve magnetoresistance effect head and compound magnetic head using it and magnetic recording medium drive unit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP1999/003614 WO2001003131A1 (fr) | 1999-07-05 | 1999-07-05 | Tete a effet magnetoresistant a modulation de spin, tete magnetique composee l'utilisant et unite d'entrainement de support d'enregistrement magnetique |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/011,096 Continuation US20020044397A1 (en) | 1999-07-05 | 2001-12-06 | Spin valve magnetoresistance effect head and compound magnetic head using it and magnetic recording medium drive unit |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2001003131A1 true WO2001003131A1 (fr) | 2001-01-11 |
Family
ID=14236166
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP1999/003614 WO2001003131A1 (fr) | 1999-07-05 | 1999-07-05 | Tete a effet magnetoresistant a modulation de spin, tete magnetique composee l'utilisant et unite d'entrainement de support d'enregistrement magnetique |
Country Status (5)
Country | Link |
---|---|
US (1) | US20020044397A1 (ja) |
EP (1) | EP1193693A4 (ja) |
KR (1) | KR20020013577A (ja) |
CN (1) | CN1352791A (ja) |
WO (1) | WO2001003131A1 (ja) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7330339B2 (en) * | 2003-07-25 | 2008-02-12 | Hitachi Global Storage Technologies Netherlands B.V. | Structure providing enhanced self-pinning for CPP GMR and tunnel valve heads |
US7072154B2 (en) * | 2003-07-29 | 2006-07-04 | Hitachi Global Storage Technologies Netherlands B.V. | Method and apparatus for providing a self-pinned bias layer that extends beyond the ends of the free layer |
US7375932B2 (en) * | 2004-11-30 | 2008-05-20 | Hitachi Global Storage Technologies Netherlands B.V. | Disk drive read head for reading cross-track magnetizations |
US7394619B2 (en) * | 2004-11-30 | 2008-07-01 | Hitachi Global Storage Technologies Netherlands B.V. | Disk drive write head for writing cross-track magnetizations |
US7079344B2 (en) * | 2004-11-30 | 2006-07-18 | Hitachi Global Storage Technologies Netherlands B.V. | Magnetic recording disk drive with data written and read as cross-track magnetizations |
US20060146452A1 (en) * | 2005-01-04 | 2006-07-06 | Min Li | CIP GMR enhanced by using inverse GMR material in AP2 |
US7821747B2 (en) * | 2006-02-10 | 2010-10-26 | Hitachi Global Storage Technologies Netherlands B.V. | Method and apparatus for providing improved pinning structure for tunneling magnetoresistive sensor |
US8623452B2 (en) * | 2010-12-10 | 2014-01-07 | Avalanche Technology, Inc. | Magnetic random access memory (MRAM) with enhanced magnetic stiffness and method of making same |
CN103887422A (zh) * | 2012-12-20 | 2014-06-25 | 中芯国际集成电路制造(上海)有限公司 | 磁阻存储器及其形成方法 |
CN103367632A (zh) * | 2013-05-27 | 2013-10-23 | 盐城彤晖磁电有限公司 | 自旋阀磁电阻传感器材料的制备方法 |
JP6296155B2 (ja) * | 2014-05-30 | 2018-03-20 | 株式会社村田製作所 | 異方性磁気抵抗素子、磁気センサおよび電流センサ |
CN109279888B (zh) * | 2018-10-22 | 2022-01-21 | 河南师范大学 | 一种自旋阀型磁阻复合材料CoFe2O4-Fe3O4的简易合成方法 |
Citations (4)
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JPH0774022A (ja) * | 1993-09-01 | 1995-03-17 | Hitachi Ltd | 多層磁気抵抗効果膜及び磁気ヘッド |
JPH0877519A (ja) * | 1994-09-08 | 1996-03-22 | Fujitsu Ltd | 磁気抵抗効果型トランスジューサ |
JPH08180327A (ja) * | 1994-12-21 | 1996-07-12 | Fujitsu Ltd | 磁気抵抗効果素子 |
JPH09282613A (ja) * | 1996-04-10 | 1997-10-31 | Sony Corp | 磁気抵抗効果型磁気ヘッド |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5549978A (en) * | 1992-10-30 | 1996-08-27 | Kabushiki Kaisha Toshiba | Magnetoresistance effect element |
JP2784457B2 (ja) * | 1993-06-11 | 1998-08-06 | インターナショナル・ビジネス・マシーンズ・コーポレイション | 磁気抵抗センサ装置 |
US5898546A (en) * | 1994-09-08 | 1999-04-27 | Fujitsu Limited | Magnetoresistive head and magnetic recording apparatus |
-
1999
- 1999-07-05 WO PCT/JP1999/003614 patent/WO2001003131A1/ja not_active Application Discontinuation
- 1999-07-05 EP EP99926931A patent/EP1193693A4/en not_active Withdrawn
- 1999-07-05 KR KR1020017015971A patent/KR20020013577A/ko not_active Application Discontinuation
- 1999-07-05 CN CN99816769A patent/CN1352791A/zh active Pending
-
2001
- 2001-12-06 US US10/011,096 patent/US20020044397A1/en not_active Abandoned
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0774022A (ja) * | 1993-09-01 | 1995-03-17 | Hitachi Ltd | 多層磁気抵抗効果膜及び磁気ヘッド |
JPH0877519A (ja) * | 1994-09-08 | 1996-03-22 | Fujitsu Ltd | 磁気抵抗効果型トランスジューサ |
JPH08180327A (ja) * | 1994-12-21 | 1996-07-12 | Fujitsu Ltd | 磁気抵抗効果素子 |
JPH09282613A (ja) * | 1996-04-10 | 1997-10-31 | Sony Corp | 磁気抵抗効果型磁気ヘッド |
Non-Patent Citations (1)
Title |
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See also references of EP1193693A4 * |
Also Published As
Publication number | Publication date |
---|---|
US20020044397A1 (en) | 2002-04-18 |
EP1193693A1 (en) | 2002-04-03 |
KR20020013577A (ko) | 2002-02-20 |
CN1352791A (zh) | 2002-06-05 |
EP1193693A4 (en) | 2006-05-03 |
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