TWI747402B - 具有高度對稱四重式氣體注入的電漿反應器 - Google Patents

具有高度對稱四重式氣體注入的電漿反應器 Download PDF

Info

Publication number
TWI747402B
TWI747402B TW109125558A TW109125558A TWI747402B TW I747402 B TWI747402 B TW I747402B TW 109125558 A TW109125558 A TW 109125558A TW 109125558 A TW109125558 A TW 109125558A TW I747402 B TWI747402 B TW I747402B
Authority
TW
Taiwan
Prior art keywords
gas
gas injection
injection channel
wires
supply
Prior art date
Application number
TW109125558A
Other languages
English (en)
Chinese (zh)
Other versions
TW202103520A (zh
Inventor
研 洛正佐
凱爾 坦汀汪
以馬德 尤瑟夫
弗拉德米爾 肯納席克
沙莫 巴那
Original Assignee
美商應用材料股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 美商應用材料股份有限公司 filed Critical 美商應用材料股份有限公司
Publication of TW202103520A publication Critical patent/TW202103520A/zh
Application granted granted Critical
Publication of TWI747402B publication Critical patent/TWI747402B/zh

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/3244Gas supply means
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45561Gas plumbing upstream of the reaction chamber
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45578Elongated nozzles, tubes with holes
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/4558Perforated rings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Vapour Deposition (AREA)
  • Drying Of Semiconductors (AREA)
  • Plasma Technology (AREA)
TW109125558A 2013-03-15 2014-02-25 具有高度對稱四重式氣體注入的電漿反應器 TWI747402B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201361789485P 2013-03-15 2013-03-15
US61/789,485 2013-03-15

Publications (2)

Publication Number Publication Date
TW202103520A TW202103520A (zh) 2021-01-16
TWI747402B true TWI747402B (zh) 2021-11-21

Family

ID=51580581

Family Applications (3)

Application Number Title Priority Date Filing Date
TW109125558A TWI747402B (zh) 2013-03-15 2014-02-25 具有高度對稱四重式氣體注入的電漿反應器
TW103106332A TWI617222B (zh) 2013-03-15 2014-02-25 具有高度對稱四重式氣體注入的電漿反應器
TW107101637A TWI703900B (zh) 2013-03-15 2014-02-25 具有高度對稱四重式氣體注入的電漿反應器

Family Applications After (2)

Application Number Title Priority Date Filing Date
TW103106332A TWI617222B (zh) 2013-03-15 2014-02-25 具有高度對稱四重式氣體注入的電漿反應器
TW107101637A TWI703900B (zh) 2013-03-15 2014-02-25 具有高度對稱四重式氣體注入的電漿反應器

Country Status (6)

Country Link
US (3) US10163606B2 (enExample)
JP (3) JP6359627B2 (enExample)
KR (1) KR102130061B1 (enExample)
CN (2) CN107221487B (enExample)
TW (3) TWI747402B (enExample)
WO (1) WO2014149200A1 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9536710B2 (en) 2013-02-25 2017-01-03 Applied Materials, Inc. Tunable gas delivery assembly with internal diffuser and angular injection
KR102104018B1 (ko) * 2013-03-12 2020-04-23 어플라이드 머티어리얼스, 인코포레이티드 방위각 및 방사상 분배 제어되는 다중-구역 가스 주입 조립체
KR102130061B1 (ko) 2013-03-15 2020-07-03 어플라이드 머티어리얼스, 인코포레이티드 매우 대칭적인 4-폴드 가스 주입부를 갖는 플라즈마 반응기
KR102553629B1 (ko) * 2016-06-17 2023-07-11 삼성전자주식회사 플라즈마 처리 장치
JP6696322B2 (ja) * 2016-06-24 2020-05-20 東京エレクトロン株式会社 ガス処理装置、ガス処理方法及び記憶媒体
US11694911B2 (en) * 2016-12-20 2023-07-04 Lam Research Corporation Systems and methods for metastable activated radical selective strip and etch using dual plenum showerhead
US10840066B2 (en) 2018-06-13 2020-11-17 Taiwan Semiconductor Manufacturing Co., Ltd. Adjustable fastening device for plasma gas injectors
CN118841306A (zh) * 2018-12-20 2024-10-25 应用材料公司 用于供应改良的气流至处理腔室的处理空间的方法和设备
US20200258718A1 (en) * 2019-02-07 2020-08-13 Mattson Technology, Inc. Gas Supply With Angled Injectors In Plasma Processing Apparatus
CN110223904A (zh) * 2019-07-19 2019-09-10 江苏鲁汶仪器有限公司 一种具有法拉第屏蔽装置的等离子体处理系统
JP7330079B2 (ja) * 2019-11-28 2023-08-21 東京エレクトロン株式会社 プラズマ処理装置
US11856706B2 (en) * 2019-12-03 2023-12-26 Applied Materials, Inc. Method and system for improving the operation of semiconductor processing
CN113707527B (zh) * 2020-05-21 2022-07-29 江苏鲁汶仪器有限公司 一种阻挡等离子体反流的分离式进气结构
US11562909B2 (en) * 2020-05-22 2023-01-24 Applied Materials, Inc. Directional selective junction clean with field polymer protections
KR102762332B1 (ko) * 2020-09-02 2025-02-03 에스케이하이닉스 주식회사 기판의 평탄화 장치 및 방법
US12340981B2 (en) 2020-12-31 2025-06-24 Beijing E-town Semiconductor Technology Co., Ltd. Workpiece processing apparatus with outer gas channel insert
KR102619579B1 (ko) * 2021-08-11 2023-12-29 주식회사 피에스에스 배기가스 처리를 위한 플라즈마 장치

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080102202A1 (en) * 2006-10-30 2008-05-01 Applied Materials, Inc. Mask etch plasma reactor with variable process gas distribution
US20090159213A1 (en) * 2007-12-19 2009-06-25 Applied Materials, Inc. Plasma reactor gas distribution plate having a path splitting manifold immersed within a showerhead
US20090162262A1 (en) * 2007-12-19 2009-06-25 Applied Material, Inc. Plasma reactor gas distribution plate having path splitting manifold side-by-side with showerhead
TW201006955A (en) * 2008-06-13 2010-02-16 Tokyo Electron Ltd Gas ring, apparatus for processing semiconductor substrate, and method of processing semiconductor substrate

Family Cites Families (87)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6236825A (ja) * 1985-08-12 1987-02-17 Hitachi Ltd ドライエツチング装置
US6024826A (en) 1996-05-13 2000-02-15 Applied Materials, Inc. Plasma reactor with heated source of a polymer-hardening precursor material
KR100276736B1 (ko) 1993-10-20 2001-03-02 히가시 데쓰로 플라즈마 처리장치
US5620523A (en) 1994-04-11 1997-04-15 Canon Sales Co., Inc. Apparatus for forming film
US5746875A (en) * 1994-09-16 1998-05-05 Applied Materials, Inc. Gas injection slit nozzle for a plasma process reactor
JP3178295B2 (ja) 1995-03-29 2001-06-18 株式会社田村電機製作所 カード移し換え装置
JPH0918614A (ja) 1995-06-29 1997-01-17 Canon Inc ファクシミリ装置
TW283250B (en) 1995-07-10 1996-08-11 Watkins Johnson Co Plasma enhanced chemical processing reactor and method
US6089182A (en) 1995-08-17 2000-07-18 Tokyo Electron Limited Plasma processing apparatus
JPH0982495A (ja) 1995-09-18 1997-03-28 Toshiba Corp プラズマ生成装置およびプラズマ生成方法
TW356554B (en) * 1995-10-23 1999-04-21 Watkins Johnson Co Gas injection system for semiconductor processing
US6200412B1 (en) 1996-02-16 2001-03-13 Novellus Systems, Inc. Chemical vapor deposition system including dedicated cleaning gas injection
US5948704A (en) 1996-06-05 1999-09-07 Lam Research Corporation High flow vacuum chamber including equipment modules such as a plasma generating source, vacuum pumping arrangement and/or cantilevered substrate support
US6367410B1 (en) 1996-12-16 2002-04-09 Applied Materials, Inc. Closed-loop dome thermal control apparatus for a semiconductor wafer processing system
US6083344A (en) 1997-05-29 2000-07-04 Applied Materials, Inc. Multi-zone RF inductively coupled source configuration
US6051073A (en) 1998-02-11 2000-04-18 Silicon Genesis Corporation Perforated shield for plasma immersion ion implantation
US6129808A (en) 1998-03-31 2000-10-10 Lam Research Corporation Low contamination high density plasma etch chambers and methods for making the same
US6230651B1 (en) 1998-12-30 2001-05-15 Lam Research Corporation Gas injection system for plasma processing
US6326597B1 (en) 1999-04-15 2001-12-04 Applied Materials, Inc. Temperature control system for process chamber
US6518190B1 (en) 1999-12-23 2003-02-11 Applied Materials Inc. Plasma reactor with dry clean apparatus and method
WO2001058212A1 (de) 2000-02-01 2001-08-09 E.G.O. Elektro-Gerätebau GmbH Elektrisches heizelement und verfahren zu seiner herstellung
US7196283B2 (en) 2000-03-17 2007-03-27 Applied Materials, Inc. Plasma reactor overhead source power electrode with low arcing tendency, cylindrical gas outlets and shaped surface
US6451161B1 (en) 2000-04-10 2002-09-17 Nano-Architect Research Corporation Method and apparatus for generating high-density uniform plasma
US6685798B1 (en) 2000-07-06 2004-02-03 Applied Materials, Inc Plasma reactor having a symmetrical parallel conductor coil antenna
US6414648B1 (en) 2000-07-06 2002-07-02 Applied Materials, Inc. Plasma reactor having a symmetric parallel conductor coil antenna
TW445540B (en) 2000-08-07 2001-07-11 Nano Architect Res Corp Bundle concentrating type multi-chamber plasma reacting system
US6450117B1 (en) 2000-08-07 2002-09-17 Applied Materials, Inc. Directing a flow of gas in a substrate processing chamber
JP3889918B2 (ja) 2000-08-25 2007-03-07 富士通株式会社 プラズマエッチング方法、プラズマエッチング装置及びプラズマ処理装置
US20020038791A1 (en) 2000-10-03 2002-04-04 Tomohiro Okumura Plasma processing method and apparatus
CN1328766C (zh) * 2001-01-22 2007-07-25 东京毅力科创株式会社 处理装置和处理方法
US6899787B2 (en) 2001-06-29 2005-05-31 Alps Electric Co., Ltd. Plasma processing apparatus and plasma processing system with reduced feeding loss, and method for stabilizing the apparatus and system
US6527911B1 (en) 2001-06-29 2003-03-04 Lam Research Corporation Configurable plasma volume etch chamber
US20030070620A1 (en) 2001-10-15 2003-04-17 Cooperberg David J. Tunable multi-zone gas injection system
US7354501B2 (en) * 2002-05-17 2008-04-08 Applied Materials, Inc. Upper chamber for high density plasma CVD
KR100862658B1 (ko) * 2002-11-15 2008-10-10 삼성전자주식회사 반도체 처리 시스템의 가스 주입 장치
JP4584565B2 (ja) 2002-11-26 2010-11-24 東京エレクトロン株式会社 プラズマ処理装置及びプラズマ処理方法
JP3881307B2 (ja) 2002-12-19 2007-02-14 株式会社日立ハイテクノロジーズ プラズマ処理装置
KR100585089B1 (ko) 2003-05-27 2006-05-30 삼성전자주식회사 웨이퍼 가장자리를 처리하기 위한 플라즈마 처리장치,플라즈마 처리장치용 절연판, 플라즈마 처리장치용하부전극, 웨이퍼 가장자리의 플라즈마 처리방법 및반도체소자의 제조방법
JP4273932B2 (ja) * 2003-11-07 2009-06-03 株式会社島津製作所 表面波励起プラズマcvd装置
JP2005201686A (ja) 2004-01-13 2005-07-28 Shimadzu Corp ガスクロマトグラフ用炎光光度検出器
US7722737B2 (en) * 2004-11-29 2010-05-25 Applied Materials, Inc. Gas distribution system for improved transient phase deposition
US20060172542A1 (en) 2005-01-28 2006-08-03 Applied Materials, Inc. Method and apparatus to confine plasma and to enhance flow conductance
KR100854995B1 (ko) * 2005-03-02 2008-08-28 삼성전자주식회사 고밀도 플라즈마 화학 기상 증착 장치
US8017029B2 (en) 2006-10-30 2011-09-13 Applied Materials, Inc. Plasma mask etch method of controlling a reactor tunable element in accordance with the output of an array of optical sensors viewing the mask backside
US9218944B2 (en) 2006-10-30 2015-12-22 Applied Materials, Inc. Mask etch plasma reactor having an array of optical sensors viewing the workpiece backside and a tunable element controlled in response to the optical sensors
WO2008088110A1 (en) 2007-01-15 2008-07-24 Jehara Corporation Plasma generating apparatus
KR101119627B1 (ko) * 2007-03-29 2012-03-07 도쿄엘렉트론가부시키가이샤 플라즈마 처리 장치
US7832354B2 (en) * 2007-09-05 2010-11-16 Applied Materials, Inc. Cathode liner with wafer edge gas injection in a plasma reactor chamber
KR101437522B1 (ko) * 2007-09-05 2014-09-03 어플라이드 머티어리얼스, 인코포레이티드 플라즈마 반응기 챔버에서 웨이퍼 에지 가스 주입부를 갖는캐소드 라이너
US7879250B2 (en) * 2007-09-05 2011-02-01 Applied Materials, Inc. Method of processing a workpiece in a plasma reactor with independent wafer edge process gas injection
US8062472B2 (en) 2007-12-19 2011-11-22 Applied Materials, Inc. Method of correcting baseline skew by a novel motorized source coil assembly
KR20090102257A (ko) 2008-03-25 2009-09-30 (주)타이닉스 유도결합형 플라즈마 에칭장치
JP5208554B2 (ja) * 2008-03-31 2013-06-12 日本碍子株式会社 Dlc成膜方法
US7987814B2 (en) 2008-04-07 2011-08-02 Applied Materials, Inc. Lower liner with integrated flow equalizer and improved conductance
US8236133B2 (en) * 2008-05-05 2012-08-07 Applied Materials, Inc. Plasma reactor with center-fed multiple zone gas distribution for improved uniformity of critical dimension bias
US20090277587A1 (en) 2008-05-09 2009-11-12 Applied Materials, Inc. Flowable dielectric equipment and processes
US8317970B2 (en) 2008-06-03 2012-11-27 Applied Materials, Inc. Ceiling electrode with process gas dispersers housing plural inductive RF power applicators extending into the plasma
JP2010062318A (ja) 2008-09-03 2010-03-18 Tokyo Electron Ltd ガス供給部材およびプラズマ処理装置
CN102160166B (zh) * 2008-09-16 2013-05-22 东京毅力科创株式会社 基板处理装置和基板载置台
JP5056735B2 (ja) * 2008-12-02 2012-10-24 東京エレクトロン株式会社 成膜装置
DE212010000009U1 (de) * 2009-09-10 2011-05-26 LAM RESEARCH CORPORATION (Delaware Corporation), California Auswechselbare obere Kammerteile einer Plasmaverarbeitungsvorrichtung
KR101095172B1 (ko) 2009-10-01 2011-12-16 주식회사 디엠에스 플라즈마 반응 챔버의 사이드 가스 인젝터
US8741097B2 (en) 2009-10-27 2014-06-03 Tokyo Electron Limited Plasma processing apparatus and plasma processing method
KR101810532B1 (ko) * 2010-03-12 2017-12-19 어플라이드 머티어리얼스, 인코포레이티드 다중 인젝트를 이용하는 원자 층 증착 챔버
JP5567392B2 (ja) 2010-05-25 2014-08-06 東京エレクトロン株式会社 プラズマ処理装置
JP5723130B2 (ja) 2010-09-28 2015-05-27 東京エレクトロン株式会社 プラズマ処理装置
US8486242B2 (en) 2010-10-18 2013-07-16 Applied Materials, Inc. Deposition apparatus and methods to reduce deposition asymmetry
JP5800547B2 (ja) 2011-03-29 2015-10-28 東京エレクトロン株式会社 プラズマ処理装置及びプラズマ処理方法
JP2013033816A (ja) 2011-08-01 2013-02-14 Tokyo Electron Ltd プラズマ処理装置
TW201325326A (zh) 2011-10-05 2013-06-16 Applied Materials Inc 電漿處理設備及其基板支撐組件
US8933628B2 (en) 2011-10-28 2015-01-13 Applied Materials, Inc. Inductively coupled plasma source with phase control
US9017481B1 (en) * 2011-10-28 2015-04-28 Asm America, Inc. Process feed management for semiconductor substrate processing
US20130256271A1 (en) 2012-04-03 2013-10-03 Theodoros Panagopoulos Methods and apparatuses for controlling plasma in a plasma processing chamber
US9111722B2 (en) 2012-04-24 2015-08-18 Applied Materials, Inc. Three-coil inductively coupled plasma source with individually controlled coil currents from a single RF power generator
US9082591B2 (en) 2012-04-24 2015-07-14 Applied Materials, Inc. Three-coil inductively coupled plasma source with individually controlled coil currents from a single RF power generator
US9161428B2 (en) 2012-04-26 2015-10-13 Applied Materials, Inc. Independent control of RF phases of separate coils of an inductively coupled plasma reactor
US9449794B2 (en) * 2012-07-20 2016-09-20 Applied Materials, Inc. Symmetrical inductively coupled plasma source with side RF feeds and spiral coil antenna
US10170279B2 (en) * 2012-07-20 2019-01-01 Applied Materials, Inc. Multiple coil inductively coupled plasma source with offset frequencies and double-walled shielding
US9928987B2 (en) * 2012-07-20 2018-03-27 Applied Materials, Inc. Inductively coupled plasma source with symmetrical RF feed
US9896769B2 (en) * 2012-07-20 2018-02-20 Applied Materials, Inc. Inductively coupled plasma source with multiple dielectric windows and window-supporting structure
US10249470B2 (en) * 2012-07-20 2019-04-02 Applied Materials, Inc. Symmetrical inductively coupled plasma source with coaxial RF feed and coaxial shielding
US9082590B2 (en) * 2012-07-20 2015-07-14 Applied Materials, Inc. Symmetrical inductively coupled plasma source with side RF feeds and RF distribution plates
US9536710B2 (en) 2013-02-25 2017-01-03 Applied Materials, Inc. Tunable gas delivery assembly with internal diffuser and angular injection
KR102104018B1 (ko) 2013-03-12 2020-04-23 어플라이드 머티어리얼스, 인코포레이티드 방위각 및 방사상 분배 제어되는 다중-구역 가스 주입 조립체
KR102130061B1 (ko) * 2013-03-15 2020-07-03 어플라이드 머티어리얼스, 인코포레이티드 매우 대칭적인 4-폴드 가스 주입부를 갖는 플라즈마 반응기
US10553398B2 (en) 2013-09-06 2020-02-04 Applied Materials, Inc. Power deposition control in inductively coupled plasma (ICP) reactors
US9779953B2 (en) 2013-09-25 2017-10-03 Applied Materials, Inc. Electromagnetic dipole for plasma density tuning in a substrate processing chamber

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080102202A1 (en) * 2006-10-30 2008-05-01 Applied Materials, Inc. Mask etch plasma reactor with variable process gas distribution
US20090159213A1 (en) * 2007-12-19 2009-06-25 Applied Materials, Inc. Plasma reactor gas distribution plate having a path splitting manifold immersed within a showerhead
US20090162262A1 (en) * 2007-12-19 2009-06-25 Applied Material, Inc. Plasma reactor gas distribution plate having path splitting manifold side-by-side with showerhead
TW201006955A (en) * 2008-06-13 2010-02-16 Tokyo Electron Ltd Gas ring, apparatus for processing semiconductor substrate, and method of processing semiconductor substrate

Also Published As

Publication number Publication date
TWI703900B (zh) 2020-09-01
CN104782234B (zh) 2017-07-14
JP6937354B2 (ja) 2021-09-22
TW201817287A (zh) 2018-05-01
KR102130061B1 (ko) 2020-07-03
CN107221487A (zh) 2017-09-29
JP2018174340A (ja) 2018-11-08
US20190122861A1 (en) 2019-04-25
US20150371826A1 (en) 2015-12-24
TW202103520A (zh) 2021-01-16
TW201436650A (zh) 2014-09-16
JP2016519845A (ja) 2016-07-07
WO2014149200A1 (en) 2014-09-25
JP2020061563A (ja) 2020-04-16
JP6359627B2 (ja) 2018-07-18
KR20150129659A (ko) 2015-11-20
US11244811B2 (en) 2022-02-08
US10163606B2 (en) 2018-12-25
US20220157562A1 (en) 2022-05-19
TWI617222B (zh) 2018-03-01
JP6634475B2 (ja) 2020-01-22
CN107221487B (zh) 2019-06-28
US11728141B2 (en) 2023-08-15
CN104782234A (zh) 2015-07-15

Similar Documents

Publication Publication Date Title
TWI747402B (zh) 具有高度對稱四重式氣體注入的電漿反應器
CN109594061B (zh) 用于半导体处理的气体分配喷头
JP6862505B2 (ja) 方位角方向及び半径方向分布制御を備えたマルチゾーンガス注入アセンブリ
US20190330748A1 (en) Gas distribution hub for plasma processing chamber
TW201542860A (zh) 具有氣體供應環的化學氣相沈積設備
WO2025044752A1 (zh) 承载装置和半导体工艺设备
JPH05239634A (ja) 陰極スパッタリング装置
JP2016036018A (ja) プラズマ処理装置及びガス供給部材
TWI753451B (zh) 氣體調節裝置及應用該裝置的電漿蝕刻設備