TWI696234B - 電子零件搬送裝置及電子零件檢查裝置 - Google Patents

電子零件搬送裝置及電子零件檢查裝置 Download PDF

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Publication number
TWI696234B
TWI696234B TW107105516A TW107105516A TWI696234B TW I696234 B TWI696234 B TW I696234B TW 107105516 A TW107105516 A TW 107105516A TW 107105516 A TW107105516 A TW 107105516A TW I696234 B TWI696234 B TW I696234B
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TW
Taiwan
Prior art keywords
information
conveying
button
electronic
electronic component
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TW107105516A
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English (en)
Chinese (zh)
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TW201834127A (zh
Inventor
山崎孝
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日商精工愛普生股份有限公司
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Publication of TW201834127A publication Critical patent/TW201834127A/zh
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Publication of TWI696234B publication Critical patent/TWI696234B/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • User Interface Of Digital Computer (AREA)
TW107105516A 2017-02-28 2018-02-14 電子零件搬送裝置及電子零件檢查裝置 TWI696234B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017-035980 2017-02-28
JP2017035980A JP2018141699A (ja) 2017-02-28 2017-02-28 電子部品搬送装置および電子部品検査装置

Publications (2)

Publication Number Publication Date
TW201834127A TW201834127A (zh) 2018-09-16
TWI696234B true TWI696234B (zh) 2020-06-11

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Family Applications (1)

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TW107105516A TWI696234B (zh) 2017-02-28 2018-02-14 電子零件搬送裝置及電子零件檢查裝置

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JP (1) JP2018141699A (enExample)
CN (1) CN108508345A (enExample)
TW (1) TWI696234B (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW202443168A (zh) * 2020-12-22 2024-11-01 韓商泰克元股份有限公司 電子元件輸送裝置及用於處理電子元件的分類機

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5720031A (en) * 1995-12-04 1998-02-17 Micron Technology, Inc. Method and apparatus for testing memory devices and displaying results of such tests
JPH1138083A (ja) * 1997-07-14 1999-02-12 Advantest Corp Ｉｃテストハンドラ
TW373076B (en) * 1997-07-14 1999-11-01 Advantest Corp IC test handler
TW200416924A (en) * 2003-02-27 2004-09-01 Taiwan Semiconductor Mfg Petri-Net based simulation method for a probed equipment of an IC foundry
TW201703951A (zh) * 2015-07-31 2017-02-01 Seiko Epson Corp 電子零件搬送裝置及電子零件檢查裝置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5828674A (en) * 1997-09-16 1998-10-27 Teradyne, Inc. Production interface for integrated circuit test system
KR100802435B1 (ko) * 2001-12-17 2008-02-13 미래산업 주식회사 반도체 소자 테스트 핸들러의 소자 이송장치의 작업위치인식방법
US7567947B2 (en) * 2006-04-04 2009-07-28 Optimaltest Ltd. Methods and systems for semiconductor testing using a testing scenario language
JP4221014B2 (ja) * 2006-06-20 2009-02-12 ファナック株式会社 ロボット制御装置
JP5359801B2 (ja) * 2009-11-13 2013-12-04 セイコーエプソン株式会社 電子部品検査装置、および電子部品搬送装置
JP5621313B2 (ja) * 2010-05-14 2014-11-12 セイコーエプソン株式会社 電子部品検査装置及び電子部品搬送方法
JP5713589B2 (ja) * 2010-06-30 2015-05-07 東洋機械金属株式会社 成形機
JP5903858B2 (ja) * 2011-12-06 2016-04-13 セイコーエプソン株式会社 電子部品搬送装置及び電子部品検査装置
US20130200915A1 (en) * 2012-02-06 2013-08-08 Peter G. Panagas Test System with Test Trays and Automated Test Tray Handling
JP2016070777A (ja) * 2014-09-30 2016-05-09 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
JP2016176897A (ja) * 2015-03-23 2016-10-06 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
JP2016156715A (ja) * 2015-02-25 2016-09-01 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
JP6543958B2 (ja) * 2015-02-26 2019-07-17 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5720031A (en) * 1995-12-04 1998-02-17 Micron Technology, Inc. Method and apparatus for testing memory devices and displaying results of such tests
JPH1138083A (ja) * 1997-07-14 1999-02-12 Advantest Corp Ｉｃテストハンドラ
TW373076B (en) * 1997-07-14 1999-11-01 Advantest Corp IC test handler
TW200416924A (en) * 2003-02-27 2004-09-01 Taiwan Semiconductor Mfg Petri-Net based simulation method for a probed equipment of an IC foundry
TW201703951A (zh) * 2015-07-31 2017-02-01 Seiko Epson Corp 電子零件搬送裝置及電子零件檢查裝置

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JP2018141699A (ja) 2018-09-13
CN108508345A (zh) 2018-09-07
TW201834127A (zh) 2018-09-16

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