CN108508345A - 电子元器件传送装置以及电子元器件检查装置 - Google Patents

电子元器件传送装置以及电子元器件检查装置 Download PDF

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Publication number
CN108508345A
CN108508345A CN201810156886.7A CN201810156886A CN108508345A CN 108508345 A CN108508345 A CN 108508345A CN 201810156886 A CN201810156886 A CN 201810156886A CN 108508345 A CN108508345 A CN 108508345A
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CN
China
Prior art keywords
electronic component
information
button
unit
setting screen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201810156886.7A
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English (en)
Chinese (zh)
Inventor
山崎孝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
North Star Technology Co ltd
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Publication of CN108508345A publication Critical patent/CN108508345A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • User Interface Of Digital Computer (AREA)
CN201810156886.7A 2017-02-28 2018-02-24 电子元器件传送装置以及电子元器件检查装置 Pending CN108508345A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017-035980 2017-02-28
JP2017035980A JP2018141699A (ja) 2017-02-28 2017-02-28 電子部品搬送装置および電子部品検査装置

Publications (1)

Publication Number Publication Date
CN108508345A true CN108508345A (zh) 2018-09-07

Family

ID=63375711

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201810156886.7A Pending CN108508345A (zh) 2017-02-28 2018-02-24 电子元器件传送装置以及电子元器件检查装置

Country Status (3)

Country Link
JP (1) JP2018141699A (enExample)
CN (1) CN108508345A (enExample)
TW (1) TWI696234B (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW202443168A (zh) * 2020-12-22 2024-11-01 韓商泰克元股份有限公司 電子元件輸送裝置及用於處理電子元件的分類機

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101092035A (zh) * 2006-06-20 2007-12-26 发那科株式会社 机器人控制装置
CN102288887A (zh) * 2010-05-14 2011-12-21 精工爱普生株式会社 电子部件检查装置及电子部件搬送方法
CN103153578A (zh) * 2010-06-30 2013-06-12 东洋机械金属株式会社 成型机
CN103151954A (zh) * 2011-12-06 2013-06-12 精工爱普生株式会社 驱动装置、电子部件搬运装置、电子部件检查装置、机械手以及机器人装置
US20130200917A1 (en) * 2012-02-06 2013-08-08 Peter G. Panagas Test System with Hopper Equipment
CN105905600A (zh) * 2015-02-25 2016-08-31 精工爱普生株式会社 电子部件输送装置以及电子部件检查装置
CN105923341A (zh) * 2015-02-26 2016-09-07 精工爱普生株式会社 电子部件输送装置以及电子部件检查装置
CN106185301A (zh) * 2014-09-30 2016-12-07 精工爱普生株式会社 电子部件输送装置以及电子部件检查装置

Family Cites Families (10)

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Publication number Priority date Publication date Assignee Title
US5720031A (en) * 1995-12-04 1998-02-17 Micron Technology, Inc. Method and apparatus for testing memory devices and displaying results of such tests
JPH1138083A (ja) * 1997-07-14 1999-02-12 Advantest Corp Ｉｃテストハンドラ
KR19990013599A (ko) * 1997-07-14 1999-02-25 오노히로시게 아이.씨. 테스트 핸들러
US5828674A (en) * 1997-09-16 1998-10-27 Teradyne, Inc. Production interface for integrated circuit test system
KR100802435B1 (ko) * 2001-12-17 2008-02-13 미래산업 주식회사 반도체 소자 테스트 핸들러의 소자 이송장치의 작업위치인식방법
TW586174B (en) * 2003-02-27 2004-05-01 Taiwan Semiconductor Mfg Petri-Net based simulation method for a probed equipment of an IC foundry
US7567947B2 (en) * 2006-04-04 2009-07-28 Optimaltest Ltd. Methods and systems for semiconductor testing using a testing scenario language
JP5359801B2 (ja) * 2009-11-13 2013-12-04 セイコーエプソン株式会社 電子部品検査装置、および電子部品搬送装置
JP2016176897A (ja) * 2015-03-23 2016-10-06 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
CN106405368A (zh) * 2015-07-31 2017-02-15 精工爱普生株式会社 电子部件搬送装置以及电子部件检查装置

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101092035A (zh) * 2006-06-20 2007-12-26 发那科株式会社 机器人控制装置
CN102288887A (zh) * 2010-05-14 2011-12-21 精工爱普生株式会社 电子部件检查装置及电子部件搬送方法
CN103153578A (zh) * 2010-06-30 2013-06-12 东洋机械金属株式会社 成型机
CN103151954A (zh) * 2011-12-06 2013-06-12 精工爱普生株式会社 驱动装置、电子部件搬运装置、电子部件检查装置、机械手以及机器人装置
US20130200917A1 (en) * 2012-02-06 2013-08-08 Peter G. Panagas Test System with Hopper Equipment
CN106185301A (zh) * 2014-09-30 2016-12-07 精工爱普生株式会社 电子部件输送装置以及电子部件检查装置
CN105905600A (zh) * 2015-02-25 2016-08-31 精工爱普生株式会社 电子部件输送装置以及电子部件检查装置
CN105923341A (zh) * 2015-02-26 2016-09-07 精工爱普生株式会社 电子部件输送装置以及电子部件检查装置

Also Published As

Publication number Publication date
JP2018141699A (ja) 2018-09-13
TWI696234B (zh) 2020-06-11
TW201834127A (zh) 2018-09-16

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SE01 Entry into force of request for substantive examination
TA01 Transfer of patent application right
TA01 Transfer of patent application right

Effective date of registration: 20210707

Address after: Nagano, Japan

Applicant after: North Star Technology Co.,Ltd.

Address before: Tokyo, Japan

Applicant before: Seiko Epson Corp.

AD01 Patent right deemed abandoned
AD01 Patent right deemed abandoned

Effective date of abandoning: 20220603