TW373076B - IC test handler - Google Patents
IC test handlerInfo
- Publication number
- TW373076B TW373076B TW087111247A TW87111247A TW373076B TW 373076 B TW373076 B TW 373076B TW 087111247 A TW087111247 A TW 087111247A TW 87111247 A TW87111247 A TW 87111247A TW 373076 B TW373076 B TW 373076B
- Authority
- TW
- Taiwan
- Prior art keywords
- test handler
- post contents
- contents
- detail information
- post
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/025—General constructional details concerning dedicated user interfaces, e.g. GUI, or dedicated keyboards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/40—Arrangements for displaying electric variables or waveforms using modulation of a light beam otherwise than by mechanical displacement, e.g. by Kerr effect
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31912—Tester/user interface
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/32—Monitoring with visual or acoustical indication of the functioning of the machine
- G06F11/324—Display of status information
- G06F11/327—Alarm or error message display
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C29/56016—Apparatus features
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C2029/5604—Display of error information
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Human Computer Interaction (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Environmental & Geological Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Control Of Conveyors (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Disclosed is an IC test handler allowing a screen display of various post contents. Stored as a help file is detail information, e.g., on post contents of an operation screen indicative of an operation procedure of the IC test handler or on post contents of an alarm generated upon the occurrence of an abnormality. In case of displaying these post contents, the help file is executed to make a display of detail information on the post contents.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9203843A JPH1138083A (en) | 1997-07-14 | 1997-07-14 | Ic test handler |
JP20384497A JPH1138084A (en) | 1997-07-14 | 1997-07-14 | Ic test handler |
Publications (1)
Publication Number | Publication Date |
---|---|
TW373076B true TW373076B (en) | 1999-11-01 |
Family
ID=26514140
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW087111247A TW373076B (en) | 1997-07-14 | 1998-07-10 | IC test handler |
Country Status (4)
Country | Link |
---|---|
KR (1) | KR19990013599A (en) |
DE (1) | DE19831573A1 (en) |
SG (1) | SG78307A1 (en) |
TW (1) | TW373076B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI696234B (en) * | 2017-02-28 | 2020-06-11 | 日商精工愛普生股份有限公司 | Electronic parts conveying device and electronic parts inspection device |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100825774B1 (en) | 2006-03-22 | 2008-04-29 | 삼성전자주식회사 | Handler for testing a semiconductor device having a single door type stocker |
-
1998
- 1998-07-03 KR KR1019980026857A patent/KR19990013599A/en not_active Application Discontinuation
- 1998-07-10 TW TW087111247A patent/TW373076B/en active
- 1998-07-10 SG SG1998001751A patent/SG78307A1/en unknown
- 1998-07-14 DE DE19831573A patent/DE19831573A1/en not_active Withdrawn
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI696234B (en) * | 2017-02-28 | 2020-06-11 | 日商精工愛普生股份有限公司 | Electronic parts conveying device and electronic parts inspection device |
Also Published As
Publication number | Publication date |
---|---|
DE19831573A1 (en) | 1999-01-21 |
SG78307A1 (en) | 2001-02-20 |
KR19990013599A (en) | 1999-02-25 |
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