JPH1138083A - Ic test handler - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an IC test handler by which detailed information about an issued alarm can be easily obtained. SOLUTION: When any abnormality occurs during the ordinary action of an IC test handier, the display request of an alarm message is sent from a sequence control section 142 in a sequence control board 140 toward an input- output processing section 162 in a user interface(I/F) board 160. The input-output processing section 162 carrys out the display of the requested alarm message, and practices a helpfile housed in a hard disk device 182 to prepare a help picture corresponding to the alarm message, and many help pictures responding to an operators operation indication are displayed in answer to a need.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an IC for transporting various IC devices such as semiconductor memories when testing them.
Regarding test handler.

[0002]

2. Description of the Related Art When performing various tests on IC devices such as semiconductor memories using a semiconductor test apparatus, it is necessary to install a plurality of IC devices to be tested at predetermined test positions. An IC test handler is used to efficiently perform such an IC device installation operation.

[0003] The IC test handler includes a mechanism for transporting and rearranging IC devices, various sensors for detecting operating states and abnormalities, and control for controlling each operation by the mechanism based on the output of these sensors. Unit, an operation unit for the operator to input various settings and operation instructions, and a panel display for displaying various setting screens and displaying an alarm when an abnormality occurs. The above-described control unit monitors the output of various sensors to supply the supplied IC.
Detects the transport status of the device, etc.
When an abnormality such as a device drop occurs, the transport operation is immediately stopped, and a red light flashes and an alarm is displayed.

[0004] For example, when an abnormality such as a drop of an IC device occurs, an alarm is displayed on a panel display provided in the IC test handler in the order of several tens of digits prepared in advance corresponding to the type of abnormality that has occurred. This is done by displaying an alarm code.

[0005]

By the way, the above-mentioned I
Since an alarm is displayed by displaying a predetermined alarm code on the panel display when an abnormality occurs in the C test handler, there is a problem that it is difficult to grasp the contents only by looking at the alarm code. Normally, a manual book is prepared that describes the cause of the alarm code and how to reset the alarm in response to various alarm codes, and the operator can check this manual book for detailed information on the alarm that has occurred. Information can be obtained.

However, since the causes of alarm generation are various (for example, alarms include jams, errors, statuses, and guides), it is not easy for an unskilled operator to search a manual book to find the cause of the alarm. . Usually, descriptions of various alarms described in a manual book are often written for a skilled person who has operated an IC test handler.
Short expressions in technical terms are used. Therefore, it is not always easy for an unskilled operator to understand. Conversely, detailed explanations may be made using expressions that can be understood by anyone. However, explanations that do not use technical terms make it difficult for a skilled operator to understand.

[0007] The product life of the IC test handler itself is about 10 to 15 years, and if the software changes due to the addition or change of the IC device to be tested during the use period, It is necessary to replace the entire manual or a part of it each time, but if this replacement is not performed at the appropriate time, the displayed alarm code will not be able to correspond to the contents of the manual, and the cause of the alarm will be lost. It is difficult to find out how to do this. For example, a manual book replacement page may be distributed for a fee in response to an application from a user and this application has not been made, or if there is a replacement page but the relevant manual book page is replaced. In the case where the alarm code is not set, there is no correspondence between the actually displayed alarm code and the content described in the manual.

As described above, it is not easy for anyone to understand the series of coping methods from the occurrence of an alarm to the release of the alarm by examining the manual book. There was a need for a method that can understand the contents of alarms and how to reset them.

The present invention has been made in view of the above circumstances, and an object of the present invention is to provide an IC test handler capable of easily obtaining detailed information on an alarm that has occurred.

[0010]

In order to solve the above-mentioned problems, an IC test handler of the present invention displays a predetermined alarm by an alarm display means when an abnormality is detected by an abnormality detection means, By executing the help file stored in the help file storage means by the help function execution means, the contents of the displayed alarm and detailed information on the canceling method are displayed. As described above, by providing the help file corresponding to the alarm, detailed information on the generated alarm can be easily obtained. Also, even if the method of resetting the alarm is changed because the software used in the IC test handler is changed, the contents of the help file are updated at the same time as the software change, and the And its release method.

Also, the above-mentioned help function executing means performs interactive processing to display detailed information using at least one of a description, a figure, a table, a still image, a moving image, and an animation. The description of the contents of the alarm and how to reset it will be easy for anyone to understand. Especially,
When a predetermined portion of the display screen is instructed to be selected, the content of the detailed information to be displayed is switched stepwise by the help function executing means, so that the detailed information having an appropriate content is displayed according to the skill level of the operator. be able to. For example, at first, a simple explanation is displayed, and when an instruction for a more detailed explanation is given, a detailed explanation, a figure,
By using a still image or a moving image, the content can be displayed according to the understanding of each operator.

[0012]

DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention is shown in FIG.
The C test handler is characterized in that, when an alarm is displayed due to some abnormality, the details of the generated alarm and a method for canceling the alarm are displayed on the screen in response to a request from an operator having a different skill level. There is. Hereinafter, an IC test handler according to an embodiment will be described in detail with reference to the drawings.

FIG. 1 is an external view of an IC test handler according to an embodiment. As an example, a front view of a horizontal transport type IC test handler is shown. The IC test handler 100 shown in the figure has an opening / closing door 110 that is opened and closed to supply and collect a plurality of custom trays, an operation screen display required for performing various settings, and a predetermined alarm display when an abnormality occurs. (Liquid Crystal Display) 112 as a display unit for performing an operation, a keyboard 114 as an operation unit for inputting various setting values, operation instructions, and the like relating to an IC device to be tested and a custom tray on which the IC device is mounted, and an operation state And a signal tower 116 for lighting or blinking lights of different colors in accordance with the signal tower.

FIG. 2 is a diagram showing a schematic configuration of a mechanical section of the IC test handler 100 shown in FIG. As shown in the figure, the IC test handler 100 transports the supplied IC device to a predetermined position after heating, cools and removes the IC device after the test is completed, and the IC test handler 100 includes a stocker 122, a suction head 126, and a loader 128. , A soak chamber 130, a test chamber 132, an unsoak chamber 136, and an unloader 138.

The custom tray 120 is a container for accommodating a plurality of IC devices 118, and
Different types are used depending on the type and shape of the eight types. This custom tray 120 is used for the IC test handler 100.
It is necessary to set various data such as the size in advance because the user has some degree of freedom in the shape.

The stocker 122 is for accommodating the custom tray 120 on which the IC devices 118 before the test are mounted, and the custom tray 120 mounting the IC devices 118 classified by category based on the test result after the test is completed. is there. The stocker 122 is used for
It has a lamination portion in which a large number of 0s are stacked, and a plurality of these laminations are arranged. When the IC device 118 is supplied to the loader 128 side, the IC device 118 mounted on the uppermost stack tray 120 of the stacking portion is picked up and placed on the test tray 124, and then the loader 128 is loaded.
Transfer to the side. Kasuterei 120 at the top of the stack
When is empty, after moving this empty tray to the bottom,
The elevator (not shown) rises and pushes the second-stage custom tray 120 to the uppermost level, and the supply of the IC device 118 is continued. Also, the IC from the unloader 138 side
When storing the device 118, the test tray 12
4 is transferred onto an empty custom tray 120 at the top of the stacking section, and the custom tray 120 on which a predetermined number of IC devices 118 are mounted is sequentially lowered to be accommodated.

The above-mentioned stocker 122 is located at a position where the opening and closing door 110 shown in FIG. 1 is opened. In a normal test operation, an operator supplies the custom tray 120 to a predetermined position of the stocker 122, 12
From 2, the operation of collecting the custom tray 120 on which the IC device 118 after the test is mounted is performed.

The replacement of the IC device 118 from the custom tray 120 to the test tray 124 or the replacement of the IC device 118 from the test tray 124 to the custom tray 120 is performed by the suction head 126. The suction head 126 picks up the IC device 118 by applying a negative pressure to the inside of the head, and releases the held IC device 118 by releasing the negative pressure state.

The loader 128 is provided on the top of the custom tray 120 at the top of any one of the stackers 122.
After the C device 118 is picked up by the suction head 126 and placed on the test tray 124, the test tray 124 is transported toward the soak chamber 130.

The soak chamber 130 is a constant temperature bath for heating or cooling the IC device 118 before the test to maintain the IC device 118 at a predetermined temperature, and stores a plurality of test trays 124. Test tray 12 transported by loader 128
4 is set at the uppermost stage of the soak chamber 130 and then descends one stage at a time. By setting the descent time to a predetermined value, heating or cooling of the IC device 118 is performed until a desired temperature is reached. After reaching the lowermost stage of the soak chamber 130, the test tray 124 is discharged and transported to the test chamber 132.

The test chamber 132 is a thermostat for performing various functional tests on the IC device 118 maintained at a predetermined temperature. In the test chamber 132, each IC device 118 on the test tray 124 discharged from the soak chamber 130 is individually picked up and moved to the contact portion 134, and various functional tests are performed on each IC device 118, and the test ends. Later, the IC device 118 is stored in the original test tray 124. The contact portion 134 is provided with a plurality of IC sockets (not shown), and the IC device 118 is mounted on each of these IC sockets.
By contacting a test head (not shown) with each terminal of the IC device 118 and the semiconductor test apparatus 200
Make an electrical connection with the After the electrical connection is completed in this way, the semiconductor test apparatus 200 performs a function test on the IC device 118. Test tray 12
When the tests on all the IC devices 118 on the test device 4 are completed, the test tray 124 is placed in the unsoak chamber 1.
It is transported to the 36 side.

The unsoak chamber 136 is a constant temperature bath that slowly cools or heats the IC device 118 that is in a high or low temperature state during a test and returns it to normal temperature in order to prevent sudden application of temperature stress and dew condensation. After the test tray 124 in which the test of the IC device 118 has been completed is stored in the lowermost stage of the unsoak chamber 136, the test tray 124 is sequentially moved up by one stage and reaches the uppermost stage.
The temperature of 18 is returned to normal temperature. The test tray 124 at the top is discharged from the unsoak chamber 136 and transported to the unloader 138.

The unloader 138 is a part of the IC device 118 discharged from the unsoak chamber 136 after the test.
Are classified according to pass / fail or characteristics, and transferred to the corresponding custom tray 120. Which classification the IC devices 118 belong to and which custom trays 120 to distribute are set in advance.

A sequence control unit (described later) performs a series of controls such as the above-described transport control of the custom tray 120 and the test tray 124, heating and cooling control in the soak chamber 130 and the unsoak chamber 136, and identification management control of the IC device 118. Done.

FIG. 3 is a block diagram schematically showing a control mechanism for controlling the operation of the IC test handler 100 according to the present embodiment. As shown in FIG. 3, the IC test handler 100 according to the present embodiment has a sequence control board 140 having a configuration necessary for controlling the operation of the mechanical unit shown in FIG. A user interface (I / F) board 160 provided with a configuration necessary for the operator to input various setting data and display an alarm to the operator, a pulse motor for moving the loader 128 and the unloader 138, Motor controllers (MC) 170 and 172 for rotationally driving a servo motor (not shown), and the IC device 11
8 includes an electromagnetic valve 174 and a suction sensor 176 provided for each suction head 126 for picking up and releasing the pickup 8 and detecting its holding state.

The sequence control board 140 includes a sequence control unit 142, an input / output control unit 144, and a temperature control unit 14.
6, a user interface (I / F) conversion unit 148, and a tester interface (I / F) unit 150. The sequence control unit 142 includes a processor and a memory, and is realized by executing a predetermined program using a dedicated operating system (OS) capable of parallel processing of a plurality of tasks. The input / output control unit 144 is for controlling the operation of the mechanism unit shown in FIG. 2 in accordance with an instruction from the sequence control unit 142, and instructs the motor controllers 170 and 172 and the solenoid valve 174 to operate. Send. Also, the input / output control unit 1
44 detects the output of the suction sensor 176 and notifies the sequence controller 142 of the presence or absence of the IC device 118.
The temperature control unit 146 controls the temperatures of the soak chamber 130, the unsoak chamber 136, and the test chamber 132. The user interface conversion unit 148 controls data input / output between the sequence control board 140 and the user interface board 160.

The user interface board 160 includes an input / output processing unit 162 and an input / output interface (I /
F) section 164 is included. Input / output processing unit 1
Reference numeral 62 denotes a personal computer main body (personal computer main body) including a processor and a memory, and inputs and outputs various data by using an operating system (for example, Windows (registered trademark) of Microsoft Corporation) widely used in general personal computers. When a display and an alarm occur, a predetermined help screen is displayed. The input / output interface unit 164 includes an input / output processing unit 162 and an LCD.
The connector 112 is for connecting the keyboard 112, the keyboard 114, the mouse 180, the hard disk drive (HDD) 182, and the speaker 184, and has a connector shape conforming to a predetermined standard corresponding to a device to be connected. The hard disk device 182 stores a help file necessary for displaying the help screen described above.

The above-described sequence control unit 142, input / output control unit 144 and suction sensor 176 serve as abnormality detecting means, the input / output processing unit 162 and LCD 112 serve as alarm display means, the hard disk drive 182 serves as help file storage means, and the input / output means. The processing units 162 each correspond to a help function execution unit.

The IC test handler 100 according to the present embodiment
Has the above-described configuration, and an operation when an alarm is displayed when some abnormality occurs in the normal operation will be described next. For example, as a normal operation,
Consider an operation of replacing the IC device 118 on the test tray 124 from 20 and assume that the IC device 118 falls during the operation.

FIG. 4 is a flow chart showing an operation procedure when changing from the custom tray 120 to the test tray 124. A series of operations are performed by an operation task executed by the sequence control unit 142 shown in FIG.

First, an operation task executed by the sequence control unit 142 (in the present embodiment, various tasks for performing a normal operation will be collectively referred to as an operation task) will be described below. 144 via solenoid valve 1
The IC 74 is driven to suck the IC device 118 on the custom tray 120 by the suction head 126 (step 401). After the end of the suction operation, the operation task is based on the output of the suction sensor 176 input to the input / output control unit 144 and the IC device 118 is attached to the tip of the suction head 126.
It is confirmed whether or not is adsorbed (step 40).
2).

After confirming that the IC device 118 is being sucked, the operation task proceeds to the next step.
The suction head 126 is lifted in a state in which the IC device 118 is sucked (step 403), and it is confirmed that the IC device 118 has reached a predetermined position by a position sensor (not shown), and the lifting operation is stopped (step 404). Thereafter, the operation task checks whether or not the IC device 118 has dropped from the suction head 126 in the ascent operation based on the output of the suction sensor 176 (Step 405).

After confirming that the IC device 118 has not fallen, the operation task is next to a motor (not shown) for moving the arm on which the suction head 126 is mounted.
Is rotated to move the suction head 126 in the horizontal direction to carry the IC device (step 40).
6), the stop position is confirmed based on the transport distance of the motor, and the transport operation ends (step 407). Thereafter, the operation task checks whether or not the IC device 118 has dropped from the suction head 126 in the transport operation based on the output of the suction sensor 176 (Step 408).

After confirming that the IC device 118 has not dropped, the operation task is to lower the suction head 126 with the IC device being suctioned (step 40).
9) When the position sensor confirms that the IC device 118 has reached the predetermined position, the lowering operation is stopped (step 410). Thereafter, the operation task is performed by the suction sensor 176.
Based on the output of the suction head 126 in the descending operation.
It is checked whether or not the IC device 118 has dropped (step 411).

By the way, the operation task checks whether or not the IC device 118 has dropped in each of the above-mentioned steps 402, 405, 408, and 411. Falls, the abnormal state is detected (step 412), and an alarm is requested to be output to a state management task (hereinafter, simply referred to as “state management task”) executed by the sequence control unit 142 (step 4).
13).

FIG. 5 is a flowchart showing the operation procedure of the IC test handler 100 when an abnormality occurs during the normal operation, and shows the operation performed by the state management task. The status management task, which has received the alarm output request from the operation task, confirms that the alarm output request does not overlap with the currently output alarm (step 50).
1), the cumulative number of occurrences of this alarm is counted up (step 502). When an alarm output request that duplicates the currently output alarm is made,
This is the case where the restart of the operation is instructed without canceling the abnormal situation that caused the alarm that has occurred, and an alarm output request is made based on the same cause. Is not performed. Also,
If the cumulative number of occurrences of the same alarm is frequently counted up and becomes a large value, there is a risk of structural failure. Therefore, by monitoring the cumulative number of occurrences, an early measure can be taken.

Next, the status management task requests the input / output processing unit 162 in the user interface board 160 to display an alarm message via the user interface conversion unit 148, and the input / output processing unit 162 displays the alarm message on the LCD 112. A predetermined alarm is displayed on the screen (step 503). Further, the state management task outputs a warning sound from an alarm buzzer (not shown) via the input / output control unit 144 to notify an abnormal situation (step 50).
4) The signal tower 116 flashes red (step 505), and the operation of the entire IC test handler 100 is stopped (step 506).

In this manner, the state management task performs a series of processes when an abnormal situation occurs, and continues until the operator gives an instruction to restart the normal operation.
The operation stop state of the entire IC test handler 100 is maintained.

Next, an alarm display operation of the input / output processing unit 162 that has received an alarm display request from the state management task will be described. FIG. 6 shows the input / output processing unit 162
Is a flowchart showing an operation procedure of an alarm display performed by the CPU. Upon receiving the alarm display request from the state management task, the input / output processing unit 162 displays a predetermined alarm message corresponding to the abnormal situation that has occurred (step 601), and additionally provides a supplementary explanation of the contents. The prepared help file is started (step 602).

FIG. 7 is a diagram showing a display screen of an alarm message. The alarm message included in the display screen shown in FIG. 3 is an alarm code of about several tens of digits, and is the same as the content of an alarm display conventionally performed. Therefore, an operator who is not skilled in operation
It is not easy to understand the content of the generated alarm and the method of canceling it just by looking at the display.

In parallel with the alarm message display operation, the input / output processing unit 162 monitors whether or not the operator is required to provide a description of the contents of the alarm display and a guide display on a method of canceling the abnormal situation (see FIG. 4). Step 603). When the "guide display" button in the display screen shown in FIG. 7 is clicked by the operator by using the mouse 180, the input / output processing unit 162
Displays a specific description of the content of the alarm message that has been displayed and a method of canceling the alarm (step 604).

FIG. 8 is a diagram showing a display screen when the guide display button is clicked. As shown in this figure, this display screen contains texts that explain the content and the specific content of the cancellation method, and also includes a static image such as a diagram, table, or photo that facilitates understanding of these texts. Paintings are included. Therefore, the operator can easily understand the meaning of the alarm message by looking at these displayed contents, and can know how to cancel the generated alarm.

For example, the display screen shown in FIG. 8 and the display screens shown in FIGS.
It is created and displayed by executing the help file on Windows (registered trademark). This help file is a collection of a plurality of topics to which one piece of information is assigned, and is characterized in that links are provided between the topics so that related information can be easily searched. On the screen shown in FIG. 8, there is a part called a hot spot in the text of the content explanation, the text of the canceling method, the figure, the table, and the still image.
By clicking with 0, a pop-up window including the meaning of the term for the portion can be displayed as shown in FIG. Alternatively, after clicking the "?" Mark at the upper right of the screen, the above-described pop-up window can be displayed by moving the pointer of the mouse 180 to an item for which the user wants to know the meaning of the term and clicking.

The display screen shown in FIG. 8 is provided with a "detailed guide" button in consideration of a case where a detailed guide is displayed. Note that when it is easy to understand the content explanation shown in FIG. 8 and it is easy to understand the method of canceling the generated alarm, the "detailed guide" button may not be provided.

If the "detailed guide" button is displayed, the input / output processing unit 162 monitors whether or not the display of the detailed guide is requested by the operator (step 605). When the "Detailed guide" button is clicked using the mouse 180,
It outputs a detailed explanation of the contents on the display screen shown in FIG.

FIG. 10 is a diagram showing a specific example of the display screen when the detail display button is clicked. The display screen shown in FIG. 8 includes a moving image or an animation together with supplementary explanations not included in the display screen shown in FIG. By including a video file in the help file, a moving image can be displayed on the help screen. For example, if it is necessary to remove another structure in order to collect the dropped IC device 118, if the procedure can be explained by a moving image (or an animation), it is easy to understand and the operation becomes skillful. Even an operator who has not done so can reset the alarm according to the display. Also, the input / output processing unit 16
2, if necessary, in parallel with the display shown in FIG.
The operation guidance sound is output from the speaker 184.

After the alarm is released by the operator while watching the display screen in this way, when the restart switch (not shown) is pressed, the state management task executes the input / output processing via the user interface conversion unit 148. An instruction to stop displaying the alarm message screen and the related help screen is sent to the unit 162, and an instruction is sent via the input / output control unit 144 to switch the signal tower 116 to green lighting and to output the alarm. Stop outputting the buzzer sound. Thereafter, the normal operation by the operation task is restarted.

As described above, in the IC test handler 100 of the present embodiment, when an alarm is displayed due to occurrence of any abnormality, the specific contents and the method of canceling the alarm are determined according to the request from the operator. It is displayed step-by-step as a help screen including diagrams and still images. If necessary, explanations of terms can be displayed, and detailed guide information including moving images can be displayed. Therefore, each operator can know the details of the generated alarm and the method of canceling the alarm by selecting the display content according to the skill level.

Even if the software is changed due to the addition or change of the IC device to be tested, the help file corresponding to the changed software is displayed by simultaneously changing the help file. The inconvenience of not being able to take correspondence between the contents of the alarm and the contents of the explanation is eliminated.

The present invention is not limited to the above embodiment, and various modifications can be made within the scope of the present invention. For example, in the above-described embodiment, an alarm that occurs when the IC device 118 falls on the way is considered, but an alarm corresponding to another abnormal situation can be similarly considered. The OS used by the input / output processing unit 162 is Windows
(Registered trademark) is considered, but an OS having an equivalent function may be used.

In the above-described embodiment, the user interface board 160 has a function as a personal computer. However, a personal computer is connected separately from the IC test handler 100, and the above-described screen is displayed on the screen of the connected personal computer. The online help display operation may be performed.

In the above-described embodiment, the horizontal transport type IC test handler 100 has been described. However, the automatic dropping type or the IC combining these two types is used.
The test handler may display an online manual when an alarm occurs.

[0053]

As described above, according to the present invention, when an abnormality is detected by the abnormality detecting means, a predetermined alarm is displayed by the alarm displaying means.
The help file stored in the help file storage means is executed by the help function execution means to display the explanation of the contents of the displayed alarm and detailed information on the method of canceling the alarm, and a help file corresponding to the alarm is provided. Accordingly, detailed information on the generated alarm can be easily obtained.

Also, by performing interactive processing by the help function executing means described above, detailed information is displayed by using at least one of a description, a figure, a table, a still image, a moving image, and an animation. Anybody can easily understand the explanation about the alarm and how to cancel it.
In particular, when a predetermined portion of the display screen is instructed to be selected, the content of the detailed information to be displayed is switched stepwise by the help function executing means, so that the detailed information having an appropriate content can be provided according to the skill level of the operator. Can be displayed.

[Brief description of the drawings]

FIG. 1 is an external view of an IC test handler according to an embodiment.

FIG. 2 is a diagram illustrating a schematic configuration of a mechanical unit of the IC test handler.

FIG. 3 is a block diagram schematically showing a control mechanism for controlling the operation of the IC test handler.

FIG. 4 is a flowchart showing an operation procedure when changing from a custom tray to a test tray.

FIG. 5 is a flowchart showing an operation procedure of the IC test handler when an abnormality occurs during a normal operation.

FIG. 6 is a flowchart illustrating an operation procedure of alarm display performed by an input / output processing unit;

FIG. 7 is a diagram showing a display screen of an alarm message.

FIG. 8 is a diagram showing a display screen when a guide display button is clicked.

FIG. 9 is a diagram showing a display screen in which a popup window is partially displayed.

FIG. 10 is a diagram showing a display screen when a detail display button is clicked.

[Explanation of symbols]

 100 IC test handler 112 LCD 114 Keyboard 142 Sequence control unit 148 User interface (I / F) conversion unit 162 Input / output processing unit 164 Input / output interface (I / F) unit 180 Mouse 182 Hard disk device (HDD)

Claims (3)

[Claims] 1. An abnormality detecting means for detecting the occurrence of an abnormality, an alarm display means for displaying a predetermined alarm when the occurrence of the abnormality is detected by the abnormality detecting means, a description and cancellation of the displayed alarm A help file storing means for storing a help file including at least detailed information on a method; and executing the help file to display detailed information on the contents of an alarm displayed by the alarm display means and a canceling method. An IC test handler comprising: a help function executing unit. 2. The detailed information according to claim 1, wherein the help function executing means performs at least one of a description, a figure, a table, a still image, a moving image, and an animation by performing an interactive process. An IC test handler for displaying the following. 3. The IC according to claim 1, wherein the help function execution means switches the content of the detailed information to be displayed in a stepwise manner when a predetermined position on the display screen is instructed to be selected. Test handler.