TWI638002B - Flame-retardant biaxial alignment film polyester film, flame retardant polyester film laminate formed by the polyester film, and flexible circuit substrate - Google Patents
Flame-retardant biaxial alignment film polyester film, flame retardant polyester film laminate formed by the polyester film, and flexible circuit substrate Download PDFInfo
- Publication number
- TWI638002B TWI638002B TW103137007A TW103137007A TWI638002B TW I638002 B TWI638002 B TW I638002B TW 103137007 A TW103137007 A TW 103137007A TW 103137007 A TW103137007 A TW 103137007A TW I638002 B TWI638002 B TW I638002B
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- Taiwan
- Prior art keywords
- polyester film
- film
- flame
- retardant
- weight
- Prior art date
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- 239000003063 flame retardant Substances 0.000 title claims abstract description 120
- RNFJDJUURJAICM-UHFFFAOYSA-N 2,2,4,4,6,6-hexaphenoxy-1,3,5-triaza-2$l^{5},4$l^{5},6$l^{5}-triphosphacyclohexa-1,3,5-triene Chemical compound N=1P(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP=1(OC=1C=CC=CC=1)OC1=CC=CC=C1 RNFJDJUURJAICM-UHFFFAOYSA-N 0.000 title claims abstract description 118
- 229920006267 polyester film Polymers 0.000 title claims abstract description 111
- 239000000758 substrate Substances 0.000 title claims description 5
- 239000002245 particle Substances 0.000 claims abstract description 62
- -1 polyparaphenylene Polymers 0.000 claims abstract description 52
- 239000011362 coarse particle Substances 0.000 claims abstract description 19
- 229920003207 poly(ethylene-2,6-naphthalate) Polymers 0.000 claims abstract description 13
- 239000011112 polyethylene naphthalate Substances 0.000 claims abstract description 13
- 229910052751 metal Inorganic materials 0.000 claims description 32
- 239000002184 metal Substances 0.000 claims description 32
- 125000004432 carbon atom Chemical group C* 0.000 claims description 16
- 229920000139 polyethylene terephthalate Polymers 0.000 claims description 14
- 239000005020 polyethylene terephthalate Substances 0.000 claims description 14
- 230000003746 surface roughness Effects 0.000 claims description 14
- 125000003118 aryl group Chemical group 0.000 claims description 12
- 230000014759 maintenance of location Effects 0.000 claims description 11
- 229910052739 hydrogen Inorganic materials 0.000 claims description 10
- 239000001257 hydrogen Substances 0.000 claims description 10
- 125000000217 alkyl group Chemical group 0.000 claims description 8
- 238000010030 laminating Methods 0.000 claims description 7
- 125000002947 alkylene group Chemical group 0.000 claims description 4
- 125000003710 aryl alkyl group Chemical group 0.000 claims description 4
- 229920006395 saturated elastomer Polymers 0.000 claims description 3
- 238000009864 tensile test Methods 0.000 claims description 2
- 125000004435 hydrogen atom Chemical class [H]* 0.000 claims 2
- 229910052698 phosphorus Inorganic materials 0.000 abstract description 29
- 230000007062 hydrolysis Effects 0.000 abstract description 23
- 238000006460 hydrolysis reaction Methods 0.000 abstract description 23
- 239000011574 phosphorus Substances 0.000 abstract description 21
- UEZVMMHDMIWARA-UHFFFAOYSA-M phosphonate Chemical compound [O-]P(=O)=O UEZVMMHDMIWARA-UHFFFAOYSA-M 0.000 abstract description 19
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 abstract description 16
- 229940122361 Bisphosphonate Drugs 0.000 abstract description 10
- 150000004663 bisphosphonates Chemical class 0.000 abstract description 7
- 229920000265 Polyparaphenylene Polymers 0.000 abstract 1
- KDYFGRWQOYBRFD-UHFFFAOYSA-N succinic acid Chemical compound OC(=O)CCC(O)=O KDYFGRWQOYBRFD-UHFFFAOYSA-N 0.000 abstract 1
- 239000010408 film Substances 0.000 description 126
- 229920000728 polyester Polymers 0.000 description 23
- 239000010410 layer Substances 0.000 description 21
- 238000005259 measurement Methods 0.000 description 11
- 238000000034 method Methods 0.000 description 11
- 238000011156 evaluation Methods 0.000 description 10
- 230000000052 comparative effect Effects 0.000 description 8
- 150000002431 hydrogen Chemical class 0.000 description 8
- 125000004437 phosphorous atom Chemical group 0.000 description 8
- 229920000642 polymer Polymers 0.000 description 8
- 229910052791 calcium Inorganic materials 0.000 description 6
- 239000011575 calcium Substances 0.000 description 6
- 238000009998 heat setting Methods 0.000 description 6
- 239000000203 mixture Substances 0.000 description 6
- ABLZXFCXXLZCGV-UHFFFAOYSA-N Phosphorous acid Chemical compound OP(O)=O ABLZXFCXXLZCGV-UHFFFAOYSA-N 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 5
- 238000007334 copolymerization reaction Methods 0.000 description 5
- 229910052736 halogen Inorganic materials 0.000 description 5
- 150000002367 halogens Chemical class 0.000 description 5
- 229910052749 magnesium Inorganic materials 0.000 description 5
- 239000011777 magnesium Substances 0.000 description 5
- 229920005989 resin Polymers 0.000 description 5
- 239000011347 resin Substances 0.000 description 5
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- ADCOVFLJGNWWNZ-UHFFFAOYSA-N antimony trioxide Chemical compound O=[Sb]O[Sb]=O ADCOVFLJGNWWNZ-UHFFFAOYSA-N 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 4
- 238000002844 melting Methods 0.000 description 4
- 230000008018 melting Effects 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 238000010298 pulverizing process Methods 0.000 description 4
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 3
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 3
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 3
- 239000002253 acid Substances 0.000 description 3
- 238000005266 casting Methods 0.000 description 3
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical compound OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 125000004051 hexyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 125000001147 pentyl group Chemical group C(CCCC)* 0.000 description 3
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 3
- 238000005809 transesterification reaction Methods 0.000 description 3
- FJKROLUGYXJWQN-UHFFFAOYSA-N 4-hydroxybenzoic acid Chemical compound OC(=O)C1=CC=C(O)C=C1 FJKROLUGYXJWQN-UHFFFAOYSA-N 0.000 description 2
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 description 2
- IAYPIBMASNFSPL-UHFFFAOYSA-N Ethylene oxide Chemical compound C1CO1 IAYPIBMASNFSPL-UHFFFAOYSA-N 0.000 description 2
- OFOBLEOULBTSOW-UHFFFAOYSA-N Malonic acid Chemical compound OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 2
- KKEYFWRCBNTPAC-UHFFFAOYSA-N Terephthalic acid Chemical compound OC(=O)C1=CC=C(C(O)=O)C=C1 KKEYFWRCBNTPAC-UHFFFAOYSA-N 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- 239000000654 additive Substances 0.000 description 2
- WNLRTRBMVRJNCN-UHFFFAOYSA-N adipic acid Chemical compound OC(=O)CCCCC(O)=O WNLRTRBMVRJNCN-UHFFFAOYSA-N 0.000 description 2
- 125000005600 alkyl phosphonate group Chemical group 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 2
- WERYXYBDKMZEQL-UHFFFAOYSA-N butane-1,4-diol Chemical compound OCCCCO WERYXYBDKMZEQL-UHFFFAOYSA-N 0.000 description 2
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 2
- 239000003054 catalyst Substances 0.000 description 2
- 238000002485 combustion reaction Methods 0.000 description 2
- 229920001577 copolymer Polymers 0.000 description 2
- NNBZCPXTIHJBJL-UHFFFAOYSA-N decalin Chemical compound C1CCCC2CCCCC21 NNBZCPXTIHJBJL-UHFFFAOYSA-N 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- USIUVYZYUHIAEV-UHFFFAOYSA-N diphenyl ether Chemical compound C=1C=CC=CC=1OC1=CC=CC=C1 USIUVYZYUHIAEV-UHFFFAOYSA-N 0.000 description 2
- BXKDSDJJOVIHMX-UHFFFAOYSA-N edrophonium chloride Chemical compound [Cl-].CC[N+](C)(C)C1=CC=CC(O)=C1 BXKDSDJJOVIHMX-UHFFFAOYSA-N 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 229910000039 hydrogen halide Inorganic materials 0.000 description 2
- 239000012433 hydrogen halide Substances 0.000 description 2
- 230000001771 impaired effect Effects 0.000 description 2
- QQVIHTHCMHWDBS-UHFFFAOYSA-N isophthalic acid Chemical compound OC(=O)C1=CC=CC(C(O)=O)=C1 QQVIHTHCMHWDBS-UHFFFAOYSA-N 0.000 description 2
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 2
- 239000005001 laminate film Substances 0.000 description 2
- 229940082328 manganese acetate tetrahydrate Drugs 0.000 description 2
- CESXSDZNZGSWSP-UHFFFAOYSA-L manganese(2+);diacetate;tetrahydrate Chemical compound O.O.O.O.[Mn+2].CC([O-])=O.CC([O-])=O CESXSDZNZGSWSP-UHFFFAOYSA-L 0.000 description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 2
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- RXOHFPCZGPKIRD-UHFFFAOYSA-N naphthalene-2,6-dicarboxylic acid Chemical compound C1=C(C(O)=O)C=CC2=CC(C(=O)O)=CC=C21 RXOHFPCZGPKIRD-UHFFFAOYSA-N 0.000 description 2
- 238000000059 patterning Methods 0.000 description 2
- ZJAOAACCNHFJAH-UHFFFAOYSA-N phosphonoformic acid Chemical compound OC(=O)P(O)(O)=O ZJAOAACCNHFJAH-UHFFFAOYSA-N 0.000 description 2
- XNGIFLGASWRNHJ-UHFFFAOYSA-N phthalic acid Chemical compound OC(=O)C1=CC=CC=C1C(O)=O XNGIFLGASWRNHJ-UHFFFAOYSA-N 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- 239000002685 polymerization catalyst Substances 0.000 description 2
- YPFDHNVEDLHUCE-UHFFFAOYSA-N propane-1,3-diol Chemical compound OCCCO YPFDHNVEDLHUCE-UHFFFAOYSA-N 0.000 description 2
- 230000002040 relaxant effect Effects 0.000 description 2
- CXMXRPHRNRROMY-UHFFFAOYSA-N sebacic acid Chemical compound OC(=O)CCCCCCCCC(O)=O CXMXRPHRNRROMY-UHFFFAOYSA-N 0.000 description 2
- 238000010583 slow cooling Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 2
- 229920002725 thermoplastic elastomer Polymers 0.000 description 2
- 229920005992 thermoplastic resin Polymers 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- USSLAFCGNMDMNX-UHFFFAOYSA-N 1,2,3,4-tetrahydronaphthalene-1,2-dicarboxylic acid Chemical compound C1=CC=C2C(C(O)=O)C(C(=O)O)CCC2=C1 USSLAFCGNMDMNX-UHFFFAOYSA-N 0.000 description 1
- PXGZQGDTEZPERC-UHFFFAOYSA-N 1,4-cyclohexanedicarboxylic acid Chemical compound OC(=O)C1CCC(C(O)=O)CC1 PXGZQGDTEZPERC-UHFFFAOYSA-N 0.000 description 1
- 238000001644 13C nuclear magnetic resonance spectroscopy Methods 0.000 description 1
- 238000005160 1H NMR spectroscopy Methods 0.000 description 1
- ISPYQTSUDJAMAB-UHFFFAOYSA-N 2-chlorophenol Chemical compound OC1=CC=CC=C1Cl ISPYQTSUDJAMAB-UHFFFAOYSA-N 0.000 description 1
- IKCQWKJZLSDDSS-UHFFFAOYSA-N 2-formyloxyethyl formate Chemical compound O=COCCOC=O IKCQWKJZLSDDSS-UHFFFAOYSA-N 0.000 description 1
- XFEGRFIENDJTCK-UHFFFAOYSA-N 2-phenyl-2,3-dihydroindene-1,1-dicarboxylic acid Chemical compound C1C2=CC=CC=C2C(C(=O)O)(C(O)=O)C1C1=CC=CC=C1 XFEGRFIENDJTCK-UHFFFAOYSA-N 0.000 description 1
- WMRCTEPOPAZMMN-UHFFFAOYSA-N 2-undecylpropanedioic acid Chemical compound CCCCCCCCCCCC(C(O)=O)C(O)=O WMRCTEPOPAZMMN-UHFFFAOYSA-N 0.000 description 1
- QLIQIXIBZLTPGQ-UHFFFAOYSA-N 4-(2-hydroxyethoxy)benzoic acid Chemical compound OCCOC1=CC=C(C(O)=O)C=C1 QLIQIXIBZLTPGQ-UHFFFAOYSA-N 0.000 description 1
- NEQFBGHQPUXOFH-UHFFFAOYSA-N 4-(4-carboxyphenyl)benzoic acid Chemical compound C1=CC(C(=O)O)=CC=C1C1=CC=C(C(O)=O)C=C1 NEQFBGHQPUXOFH-UHFFFAOYSA-N 0.000 description 1
- 229940090248 4-hydroxybenzoic acid Drugs 0.000 description 1
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 239000005995 Aluminium silicate Substances 0.000 description 1
- 229930185605 Bisphenol Natural products 0.000 description 1
- MODAJCKVRUSEKK-UHFFFAOYSA-N C(C)OP(OCC)=O.[Ca] Chemical compound C(C)OP(OCC)=O.[Ca] MODAJCKVRUSEKK-UHFFFAOYSA-N 0.000 description 1
- XAQIFMKKLINDSF-UHFFFAOYSA-N C(C)OP(OCC)=O.[Mg] Chemical compound C(C)OP(OCC)=O.[Mg] XAQIFMKKLINDSF-UHFFFAOYSA-N 0.000 description 1
- DBKFYOISCCPYTQ-UHFFFAOYSA-K C1(=CC=CC=C1)P([O-])=O.[Al+3].C1(=CC=CC=C1)P([O-])=O.C1(=CC=CC=C1)P([O-])=O Chemical compound C1(=CC=CC=C1)P([O-])=O.[Al+3].C1(=CC=CC=C1)P([O-])=O.C1(=CC=CC=C1)P([O-])=O DBKFYOISCCPYTQ-UHFFFAOYSA-K 0.000 description 1
- OYVITKZRFJLFQW-UHFFFAOYSA-L C=1(C(=CC=CC1)P([O-])(=O)[O-])C1=CC=CC=C1.[Ca+2] Chemical compound C=1(C(=CC=CC1)P([O-])(=O)[O-])C1=CC=CC=C1.[Ca+2] OYVITKZRFJLFQW-UHFFFAOYSA-L 0.000 description 1
- AABLYIRKGMFTNC-UHFFFAOYSA-L C=1(C(=CC=CC1)P([O-])(=O)[O-])C1=CC=CC=C1.[Mg+2] Chemical compound C=1(C(=CC=CC1)P([O-])(=O)[O-])C1=CC=CC=C1.[Mg+2] AABLYIRKGMFTNC-UHFFFAOYSA-L 0.000 description 1
- 229940126062 Compound A Drugs 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- NLDMNSXOCDLTTB-UHFFFAOYSA-N Heterophylliin A Natural products O1C2COC(=O)C3=CC(O)=C(O)C(O)=C3C3=C(O)C(O)=C(O)C=C3C(=O)OC2C(OC(=O)C=2C=C(O)C(O)=C(O)C=2)C(O)C1OC(=O)C1=CC(O)=C(O)C(O)=C1 NLDMNSXOCDLTTB-UHFFFAOYSA-N 0.000 description 1
- 238000005481 NMR spectroscopy Methods 0.000 description 1
- UJRQJKHXRVXHTJ-UHFFFAOYSA-N P(OC)(OC)=O.[Mg] Chemical compound P(OC)(OC)=O.[Mg] UJRQJKHXRVXHTJ-UHFFFAOYSA-N 0.000 description 1
- 229910019142 PO4 Inorganic materials 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- 241000248459 Stentor Species 0.000 description 1
- YTEOLLYMGRPAJO-UHFFFAOYSA-L [Ca++].[O-]P(=O)c1ccccc1.[O-]P(=O)c1ccccc1 Chemical compound [Ca++].[O-]P(=O)c1ccccc1.[O-]P(=O)c1ccccc1 YTEOLLYMGRPAJO-UHFFFAOYSA-L 0.000 description 1
- RCQQRABULHKBIB-UHFFFAOYSA-L [Mg++].[O-]P(=O)c1ccccc1.[O-]P(=O)c1ccccc1 Chemical compound [Mg++].[O-]P(=O)c1ccccc1.[O-]P(=O)c1ccccc1 RCQQRABULHKBIB-UHFFFAOYSA-L 0.000 description 1
- 239000012790 adhesive layer Substances 0.000 description 1
- 235000011037 adipic acid Nutrition 0.000 description 1
- 239000001361 adipic acid Substances 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 235000012211 aluminium silicate Nutrition 0.000 description 1
- ZJKCITHLCNCAHA-UHFFFAOYSA-K aluminum dioxidophosphanium Chemical group [Al+3].[O-][PH2]=O.[O-][PH2]=O.[O-][PH2]=O ZJKCITHLCNCAHA-UHFFFAOYSA-K 0.000 description 1
- QVKQNISQFCPYGN-UHFFFAOYSA-K aluminum;dimethylphosphinate Chemical compound [Al+3].CP(C)([O-])=O.CP(C)([O-])=O.CP(C)([O-])=O QVKQNISQFCPYGN-UHFFFAOYSA-K 0.000 description 1
- 239000003963 antioxidant agent Substances 0.000 description 1
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- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 229910000019 calcium carbonate Inorganic materials 0.000 description 1
- NQNNDUGXFGSQES-UHFFFAOYSA-L calcium ethyl(methoxy)phosphinate Chemical compound C(C)P(OC)([O-])=O.[Ca+2].COP([O-])(=O)CC NQNNDUGXFGSQES-UHFFFAOYSA-L 0.000 description 1
- DONULGYRZAGJQH-UHFFFAOYSA-L calcium;dimethylphosphinate Chemical compound [Ca+2].CP(C)([O-])=O.CP(C)([O-])=O DONULGYRZAGJQH-UHFFFAOYSA-L 0.000 description 1
- 229910000420 cerium oxide Inorganic materials 0.000 description 1
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- VEIOBOXBGYWJIT-UHFFFAOYSA-N cyclohexane;methanol Chemical compound OC.OC.C1CCCCC1 VEIOBOXBGYWJIT-UHFFFAOYSA-N 0.000 description 1
- 238000011982 device technology Methods 0.000 description 1
- DRNJFFYTADAYNB-UHFFFAOYSA-H dialuminum;dioxido-oxo-phenyl-$l^{5}-phosphane Chemical compound [Al+3].[Al+3].[O-]P([O-])(=O)C1=CC=CC=C1.[O-]P([O-])(=O)C1=CC=CC=C1.[O-]P([O-])(=O)C1=CC=CC=C1 DRNJFFYTADAYNB-UHFFFAOYSA-H 0.000 description 1
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- VIBDJEWPNNCFQO-UHFFFAOYSA-N ethane-1,1,2-triol Chemical compound OCC(O)O VIBDJEWPNNCFQO-UHFFFAOYSA-N 0.000 description 1
- SMNZHEHSKZSQLM-UHFFFAOYSA-N ethyl(methoxy)phosphinic acid Chemical compound CCP(O)(=O)OC SMNZHEHSKZSQLM-UHFFFAOYSA-N 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
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- XXMIOPMDWAUFGU-UHFFFAOYSA-N hexane-1,6-diol Chemical compound OCCCCCCO XXMIOPMDWAUFGU-UHFFFAOYSA-N 0.000 description 1
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- NLYAJNPCOHFWQQ-UHFFFAOYSA-N kaolin Chemical compound O.O.O=[Al]O[Si](=O)O[Si](=O)O[Al]=O NLYAJNPCOHFWQQ-UHFFFAOYSA-N 0.000 description 1
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- YACKEPLHDIMKIO-UHFFFAOYSA-N methylphosphonic acid Chemical compound CP(O)(O)=O YACKEPLHDIMKIO-UHFFFAOYSA-N 0.000 description 1
- 239000006082 mold release agent Substances 0.000 description 1
- 239000000178 monomer Substances 0.000 description 1
- KYTZHLUVELPASH-UHFFFAOYSA-N naphthalene-1,2-dicarboxylic acid Chemical compound C1=CC=CC2=C(C(O)=O)C(C(=O)O)=CC=C21 KYTZHLUVELPASH-UHFFFAOYSA-N 0.000 description 1
- WPUMVKJOWWJPRK-UHFFFAOYSA-N naphthalene-2,7-dicarboxylic acid Chemical compound C1=CC(C(O)=O)=CC2=CC(C(=O)O)=CC=C21 WPUMVKJOWWJPRK-UHFFFAOYSA-N 0.000 description 1
- SLCVBVWXLSEKPL-UHFFFAOYSA-N neopentyl glycol Chemical compound OCC(C)(C)CO SLCVBVWXLSEKPL-UHFFFAOYSA-N 0.000 description 1
- 150000002896 organic halogen compounds Chemical class 0.000 description 1
- 150000002903 organophosphorus compounds Chemical class 0.000 description 1
- 235000006408 oxalic acid Nutrition 0.000 description 1
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 description 1
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- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 1
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- 229920002098 polyfluorene Polymers 0.000 description 1
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- 239000011148 porous material Substances 0.000 description 1
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
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Abstract
本發明之目的係提供一種聚酯薄膜本身以磷系難燃劑難燃化,且可抑制因該等難燃劑所致之聚酯薄膜之耐水解性降低,進而抑制因難燃劑所致之製膜性降低及機械特性降低之難燃性二軸配向聚酯薄膜、及由其所成之難燃性聚酯薄膜積層體及可撓性電路基板者。
本發明係藉由難燃性二軸配向聚酯薄膜所得者,該難燃性二軸配向聚酯薄膜係以聚酯薄膜重量為基準,含有70重量%以上且99.5重量%以下之聚對苯二甲酸乙二酯或聚萘二甲酸乙二酯,及0.5重量%以上且30重量%以下之以特定膦酸鹽或二膦酸鹽表示之平均粒徑0.5~3.0μm之難燃劑粒子,且該聚酯薄膜中所含最大長度10μm以上之粗大粒子之個數為10個/m2以下。
Description
本發明係關於具有難燃性之二軸配向聚酯薄膜、由其所成之難燃性聚酯薄膜積層體及可撓性電路基板者,更詳言之,係關於難燃性優異同時抑制製膜性降低及機械特性降低之難燃性二軸配向聚酯薄膜、由其所成之難燃性聚酯薄膜積層體及可撓性電路基板。
隨著行動電話等電子設備技術之進步,可撓性印刷電路(以下有時簡稱為FPC)基板之需求急遽擴大。近年來,隨著製造物責任法之施行,為確保對於火災之安全性而期望FPC所用之樹脂之難燃化。
過去使用之有機鹵素化合物、含鹵素有機磷化合物等之鹵系難燃劑,難燃效果雖高,但成形‧加工時鹵素游離,產生腐蝕性之鹵化氫氣體而有腐蝕成形‧加工設備之可能性、且使作業環境惡化之可能性而受到指責。且該等鹵系難燃劑在火災等燃燒時有產生鹵化氫等氣體之可能性而受到指責。因此,近年來殷切期望使用不含鹵素
之難燃劑代替鹵系難燃劑。
使用聚酯薄膜,尤其是聚對苯二甲酸乙二酯或聚萘二甲酸乙二酯之二軸延伸薄膜由於具有優異之機械性質、耐熱性、耐藥品性,故已廣泛使用作為磁碟、照相薄膜、包裝用薄膜、電子零件用薄膜、電絕緣薄膜、金屬層合用薄膜及保護用薄膜等之材料。
又,作為聚酯樹脂難燃化方法之1,已檢討於聚酯中共聚合磷化合物之方法。例如日本特開2007-9111號公報(專利文獻1)中揭示藉由於羧基膦酸成分中使用特定之羧基膦酸成分,即使未併用其他磷化合物仍可以少量對聚2,6-萘二甲酸乙二酯薄膜賦予高的難燃性。然而,如專利文獻1之含有羧基膦酸化合物之聚2,6-萘二甲酸乙二酯薄膜在薄膜狀態下雖展現高的難燃性,但關於可撓性印刷電路等用途中加工後之難燃性有無法再現薄膜難燃性之情況。
作為其他磷系難燃劑,例如日本特開2009-179037號公報(專利文獻2)、日本特開2010-89334號公報(專利文獻3)中已提案將含膦酸金屬鹽等無機金屬之磷酸系衍生物之難燃層積層於聚酯薄膜上而成之積層薄膜。然而所提案之積層薄膜鑑於因多孔質基材薄膜之薄膜內部之孔洞構造而提高燃燒性,係於基材薄膜上設置使用難燃劑與硬化劑之難燃層之技術。且,日本特開2010-229390號公報(專利文獻4)中記載調配無機金屬之磷酸系衍生物之組成物及難燃被覆電線,係使熱可塑性彈性體
樹脂難燃化之技術,熱可塑性彈性體樹脂由於為伸長度高之樹脂,故係不會有隨著難燃劑之添加而使物性降低之問題者。此外國際公開第2012/090732號說明書(專利文獻5)中提案含有膦酸鹽或二膦酸鹽之難燃性聚酯薄膜,以磷系難燃劑使聚對苯二甲酸烷二酯或聚萘二甲酸烷二酯之聚酯薄膜本身難燃化,進而提案可抑制因該等難燃劑所致之耐水解性降低之難燃性二軸配向聚酯薄膜。
專利文獻1:日本特開2007-9111號公報
專利文獻2:日本特開2009-179037號公報
專利文獻3:日本特開2010-89334號公報
專利文獻4:日本特開2010-229390號公報
專利文獻5:國際公開第2010/090732號說明書
本發明人等在使用膦酸鹽或二膦酸鹽作為難燃劑之聚酯薄膜之檢討過程中,發現將該等難燃劑添加於聚酯薄膜中時,容易伴隨製膜性降低,且容易使所得薄膜之機械強度降低之新的課題。
亦即本發明之目的係消除該課題,而提供以磷系難燃劑使聚對苯二甲酸乙二酯或聚萘二甲酸乙二酯之聚酯薄膜本身難燃化,且抑制因該等難燃劑所致之耐水解性降低,進而抑制因難燃劑所致之製膜性降低及機械特性降低之難燃性二軸配線聚酯薄膜、由其所成之難燃性聚酯
薄膜積層體及可撓性電路基板。
本發明人等為解決前述課題而積極檢討之結果,發現膦酸鹽或二膦酸鹽與聚酯不相溶時在薄膜中以如粒子等之異物存在,且粗大粒子之比例高,故因該等因素引起製膜性降低及機械特性降低,且發現藉由控制粒徑與粗大難燃劑粒子之頻度而提高製膜性與機械強度,因而完成本發明。
亦即本發明之目的可藉由難燃性二軸配向聚酯薄膜(項1)達成,該難燃性二軸配向聚酯薄膜之特徵係以聚酯薄膜重量為基準,含有70重量%以上且99.5重量%以下之聚對苯二甲酸乙二酯或聚萘二甲酸乙二酯,及0.5重量%以上且30重量%以下之以下述式(1)或下述式(2)表示之平均粒徑0.5~3.0μm之難燃劑粒子,
(式中,R1、R2表示氫、碳數1~6之烷基及/或芳基,M表示金屬,m表示M之價數),
(式中,R3、R4表示氫、碳數1~6之烷基及/或芳基,R5表示碳數1~6之伸烷基或碳數6~10之伸芳基、烷基伸芳基或芳基伸烷基,M表示金屬,n表示M之價數),且該聚酯薄膜中所含最大長度10μm以上之粗大粒子之個數為10個/m2以下。
另本發明之難燃性二軸配向聚酯薄膜亦較好包含以下之樣態。
(項2)如項1所記載之難燃性二軸配向聚酯薄膜,其中前述聚酯薄膜之機械強度為150MPa以上。
(項3)如項1或2所記載之難燃性二軸配向聚酯薄膜,其中在121℃、2大氣壓之飽和水蒸氣中處理10小時後之前述聚酯薄膜之拉伸強度保持率為80%以上。
(項4)如項1~3中任一項所記載之難燃性二軸配向聚酯薄膜,其中前述聚酯薄膜之表面粗糙度Ra為0.1μm以上且未達0.5μm。
且本發明亦包含以下樣態。
(項5)一種難燃性聚酯薄膜積層體,其係積層如項1~4中任一項所記載之難燃性二軸配向聚酯薄膜與金屬層而成者。
(項6)如項5所記載之難燃性聚酯薄膜積層體,
其係用於可撓性印刷電路基板者。
(項7)一種可撓性電路基板,其係使用如項5或6所記載之難燃性聚酯薄膜積層體者。
依據本發明,本發明之難燃性二軸配向聚酯薄膜之製膜性優異,不降低聚對苯二甲酸乙二酯或聚萘二甲酸乙二酯之聚酯所具有之機械特性或耐水解性,且具備高的難燃性,故可適當地使用於例如可撓性印刷電路基板、扁平纜線(flat cable)、太陽能電池用背板等。
以下,詳細說明本發明。
本發明之難燃性二軸配向聚酯薄膜係以聚酯薄膜重量為基準,含有70重量%以上且99.5重量%以下之範圍之聚對苯二甲酸乙二酯或聚萘二甲酸乙二酯作為聚合物成分,且含有0.5重量%以上且30重量%以下之範圍之以下述式(1)或下述式(2)表示之平均粒徑0.5~3.0μm之難燃劑粒子,
(式中,R1、R2表示氫、碳數1~6之烷基及/或芳基,M表示金屬,m表示M之價數),
(式中,R3、R4表示氫、碳數1~6之烷基及/或芳基,R5表示碳數1~6之伸烷基或碳數6~10之伸芳基、烷基伸芳基或芳基伸烷基,M表示金屬,n表示M之價數),且該聚酯薄膜中所含最大長度10μm以上之粗大粒子之個數為10個/m2以下。
本發明之難燃性二軸配向性聚酯薄膜係使用聚對苯二甲酸乙二酯或聚萘二甲酸乙二酯作為聚合物成分。該聚合物成分之含量以聚酯薄膜重量為基準,為70重量%以上且99.5重量%以下之範圍。該等聚合物成分之含量之下限值較好為75重量%,更好為78重量%,又更好為80重量%,最好為85重量%。
且,該等聚合物成分之含量之上限值基於與後述難燃成分之含量之關係較好為99重量%,更好為96重量%,又更好為92重量%,最好為90重量%。
該等聚合物成分之含量未達下限值時薄膜之機械強度降低。另一方面,該等聚合物成分之含量超過上限值時相對地使難燃成分之含量減少,無法展現充分之難燃性。
本發明之聚對苯二甲酸乙二酯或聚萘二甲酸乙二酯在不損及本發明目的之範圍內亦可為具有主成分以外之成分(以下,有時稱為共聚合成分)之共聚物,較好可使用以該等聚酯之全部重複單位之莫耳數為基準未達25mol%之範圍之共聚合成分,更好為20mol%以下,又更好為15mol%以下。
該共聚合成分例示為例如草酸、己二酸、鄰苯二甲酸、癸二酸、十二烷二羧酸、間苯二甲酸、對苯二甲酸、1,4-環己烷二羧酸、4,4’-二苯基二羧酸、苯基茚滿二羧酸、2,6-萘二羧酸、2,7-萘二羧酸、四氫萘二羧酸、十氫萘二羧酸、二苯基醚二羧酸等二羧酸、對-羥基苯甲酸、對-羥基乙氧基苯甲酸等氧羧酸、或乙二醇、三亞甲基二醇、四亞甲基二醇、六亞甲基二醇、環己烷二甲醇、新戊二醇、雙酚碸之環氧乙烷加成物、雙酚A之環氧乙烷加成物、二乙二醇、聚環氧乙烷二醇等二醇,較好使用選自該等中之主成分以外之成分。該等共聚合成分可使用1種或亦可使用2種以上。
該等共聚合成分亦可作為單體成分調配,經共聚合化者,且亦可為藉由與其他聚酯之酯交換反應而共聚合化者。
此外,本發明之聚對苯二甲酸乙二酯或聚萘
二甲酸乙二酯在不損及本發明目的之範圍內,亦可為至少2種聚酯之摻合物,或與聚酯以外之熱可塑性樹脂之摻合物。該等其他成分以聚酯薄膜重量為基準可在20重量%以下之範圍使用,更好為15重量%以下,又更好為10重量%以下。聚酯以外之熱可塑性樹脂例示為例如聚烯烴系樹脂、聚苯乙烯系樹脂、聚醯亞胺系樹脂等。
該等聚酯之固有黏度以鄰-氯酚作為溶劑在25℃下測定之固有黏度較好為0.4dl/g以上且1.5dl/g以下,更好為0.5dl/g以上且1.2dl/g以下。
本發明係使用作為難燃成分之以下述式(1)表示膦酸鹽或以下述式(2)表示之二膦酸鹽作為難燃劑粒子。以下有時將該等通稱為膦酸鹽類。
(式中,R1、R2表示氫、碳數1~6之烷基及/或芳基,M表示金屬,m表示M之價數),
(式中,R3、R4表示氫、碳數1~6之烷基及/或芳基,R5表示碳數1~6之伸烷基或碳數6~10之伸芳基、烷基伸芳基或芳基伸烷基,M表示金屬,n表示M之價數)。
該膦酸鹽係亦稱為膦酸金屬鹽之化合物,R1、R2例示為氫、甲基、乙基、正丙基、異丙基、正丁基、第三丁基、戊基、己基、苯基。且M例示為鋁、鎂、鈣,價數m為2~4之整數。
具體列舉為二甲基膦酸鈣、甲基乙基膦酸鈣、二乙基膦酸鈣、苯基膦酸鈣、聯苯膦酸鈣、二甲基膦酸鎂、甲基乙基膦酸鎂、二乙基膦酸鎂、苯基膦酸鎂、聯苯膦酸鎂、二甲基膦酸鋁、甲基乙基膦酸鋁、二乙基膦酸鋁、苯基膦酸鋁、聯苯膦酸鋁。
此外,二膦酸鹽中,R3、R4例示為氫、甲基、乙基、正丙基、異丙基、正丁基、第三丁基、戊基、己基、苯基,R5例示為亞甲基、伸乙基、伸丙基、伸丁基、伸戊基、伸己基、伸苯基。且M例示為鋁、鎂、鈣,價數n為2~4之整數。
以式(2)表示之二膦酸鹽列舉為乙烷-1,2-雙(膦酸)鈣等烷雙膦酸鈣、乙烷-1,2-雙(甲基膦酸)鈣等
烷雙(烷基膦酸)鈣、烷雙膦酸鎂、烷雙(烷基膦酸)鎂、烷雙膦酸鋁、烷雙(烷基膦酸)鋁等。
該等膦酸鹽類中,以二乙基膦酸鋁最佳。
本發明藉由使用該膦酸鹽類作為難燃成分,相較於過去之磷系難燃劑,由於對於聚對苯二甲酸乙二酯或聚萘二甲酸乙二酯之強度高的聚酯之物性降低之影響少,故可以達到迄今無法添加之程度添加大量難燃成分。因此,對於例如在與金屬層積層而使用之用途中加工時,若為以往相較於積層金屬層前之難燃性聚酯薄膜,金屬積層體之難燃性會降低,本發明具有能獲得與難燃性聚酯薄膜本身同樣高的難燃性之特徵。
該膦酸鹽類之含量以聚酯薄膜之重量為基準為0.5重量%以上且30重量%以下。且該膦酸鹽類含量之下限值較好為1重量%,更好為4重量%,又更好為8重量%,最好為10重量%。且,該膦酸鹽類含量之上限值較好為25重量%,更好為22重量%,又更好為20重量%,最好為15重量%。膦酸鹽類之含量未達下限值時難燃性不足,另一方面,膦酸鹽類之含量超過上限值時薄膜製膜性與機械強度降低。
該膦酸鹽類具有粒子形狀,在本發明中稱為難燃劑粒子。本發明之難燃劑粒子之平均粒徑為0.5μm以上且3.0μm以下,該平均粒徑之下限較好為1.0μm,更好為1.5μm。且該難燃劑粒子之平均粒徑之上限較好為2.5μm。平均粒徑未達下限時,薄膜製膜時之操作性降
低,會有在薄膜中之分散性不充分之情況。另一方面,超過上限之平均粒徑時,薄膜製膜時容易破裂,製膜性降低,即使可製膜仍有薄膜強度降低之情況。
且,本發明之難燃性二軸配向聚酯薄膜中所含之最大長度10μm以上之粗大粒子之個數必須為10個/m2以下,更好為5個/m2以下。該難燃劑粒子之粒徑分佈相當廣,發現該等粗大粒子對製膜性降低或薄膜強度降低帶來影響。亦即,發現該難燃劑粒子之粒徑分佈之分佈範圍相較於聚酯薄膜中廣泛使用之粒子之粒徑分佈更廣,因此,在添加難燃劑粒子前未進行前處理時,由於超過上述範圍之數的粗大粒子存在於薄膜中,故引起製膜性或薄膜強度之下降者。
為了使粗大粒子之個數成為上述範圍,可藉由例如在製膜步驟之前使難燃劑粒子進行粉碎、分級等加工,預先去除該等粗大粒子,可獲得高的機械強度與優異外觀性之難燃性二軸配向聚酯薄膜。
此處難燃劑粒子之平均粒徑係如測定方法欄之說明,針對聚酯薄膜之剖面,使用HIROX股份有限公司之數位顯微鏡KH-3000,以3500倍之倍率取樣20個粒子,測定各個粒徑中之最大長度,去除20點中之最小值與最大值由18點之平均值求出。
且粗大粒子之最大長度可使用萬能投影機,以透過照明放大至20倍測定粒子之最大長度而求出。
本發明中之磷原子濃度以聚酯薄膜之重量為基準較好為0.1重量%以上且7重量%以下。且該磷原子濃度之下限值更好為1.0重量%,又更好為2.0重量%,最好為2.5重量%。另一方面該磷原子濃度之上限值更好為6.0重量%,又更好為5.0重量。
本發明之特徵係藉由對聚對苯二甲酸乙二酯或聚萘二甲酸乙二酯之強度高的聚酯使用由本發明之膦酸鹽類所成之特定尺寸之難燃劑粒子,相較於過去之添加型磷系成分或共聚合型磷系成分,不損及聚酯之機械特性。
另一方面高至超過上限值之磷原子濃度時,添加之膦酸鹽類之量過多使薄膜之機械強度與製膜性變得缺乏。此外,具有之特徵為即使接近磷原子濃度之下限值之範圍,亦即接近過去之磷系成分之含量之範圍,相較於其他磷系成分仍展現高的難燃性,在與金屬層積層使用之用途中加工時仍可再現與難燃性聚酯薄膜本身同樣高的難燃性。於磷系成分之含量較少之範圍內仍展現該效果之理由認為係因構成膦酸鹽類之金屬成分所致之自由基捕獲效果。
本發明之難燃性二軸配向聚酯薄膜中,為了提高薄膜之操作性,在不損及發明效果之範圍內亦可添加惰性粒子等。該惰性粒子列舉為例如含有週期表第IIA、第IIB、
第IVA、第IVB元素之無機粒子(例如高嶺土、氧化鋁、氧化鈦、碳酸鈣、二氧化矽等)、由交聯聚矽氧、交聯聚苯乙烯、交聯丙烯酸樹脂粒子等耐熱性高的聚合物所成之粒子。
薄膜中含有惰性粒子時,惰性粒子之平均粒徑較好為0.001~0.5μm之範圍,以聚酯薄膜重量為基準較好以0.01~10重量%之範圍含有,更好為0.05~5重量%,最好為0.05~3重量%。
本發明之難燃性二軸配性聚酯薄膜中,在不損及本發明目的之範圍內可視需要進一步調配熱安定劑、抗氧化劑、紫外線吸收劑、脫模劑、著色劑、抗靜電劑等添加劑。
本發明之聚酯薄膜厚度較好為2μm以上且200μm以下。過去,以於聚酯薄膜中添加磷系難燃劑之方法難燃化時,由於引起聚酯薄膜之機械特性或耐水解性之降低,故無法以磷系難燃劑使聚酯薄膜本身難燃化,而使用將含難燃劑之其他層積層於聚酯薄膜上之手法,相對於此,本發明係具有可將磷系難燃劑添加於具有該厚度之聚酯薄膜本身中之特徵者。
聚酯薄膜之厚度可依據用途在上述範圍內調整。例如扁平纜線用途時,更好為2~100μm,又更好為5~75μm,最好為10~50μm。又在可撓性印刷電路基板用
途時,更好為2~150μm,又更好為5~100μm,最好為10~75μm。
本發明之難燃性二軸配向聚酯薄膜之表面粗糙度Ra(中心線平均粗糙度)較好為0.1μm以上且未達2μm。表面粗糙度Ra之上限更好為未達1.5μm,又更好未達1.0μm,最好未達0.5μm。另表面粗糙度Ra之下限可為0.2μm以上,又亦可為0.3μm以上。更好表面粗糙度Ra之範圍為0.1μm以上且未達1.5μm,更好為0.1μm以上且未達1.0μm,最好為0.1μm以上且未達0.5μm。此外本發明之難燃成分之含量較多之區域,可為0.2μm以上且未達1.5μm,0.3μm以上且未達1.0μm,或0.3μm以上且未達0.5μm。
且本發明之難燃性二軸配向聚酯薄膜之Rmax(最大高度)較好未達3μm,更好未達2.5μm,又更好未達2.0μm。
該表面粗糙度係藉由使用特定量之由上述平均粒徑且去除粗大粒子之膦酸鹽類所成之難燃劑粒子而得。
藉由使本發明之難燃性二軸配向聚酯薄膜具有該表面粗糙度Ra,可提高透過熱密封層或接著層等與其他層積層時之接著性,且可較好地使用於例如可撓性電路基板、扁平纜線、太陽能電池背板等之用途。另一方面
因存在粗大粒子使Rmax超過上限時,缺乏製膜性與薄膜之機械強度。
且,進而本發明之難燃性二軸配向聚酯薄膜具有0.1μm以上且未達0.5μm之表面粗糙度Ra時,由於薄膜平坦性優異,故作為可撓性電路基板使用時可使金屬層之電路圖型高纖細化。
本發明之難燃性二軸配向聚酯薄膜之機械強度較好為150MPa以上,更好為160MPa以上,又更好為170MPa以上,最好為180MPa以上。該薄膜機械強度係藉由將調配於聚酯薄膜中之難燃劑粒子之平均粒徑設為上述範圍內,且使最大長度10μm以上之粗大粒子減低至10個/m2以下而獲得。
本發明之難燃性二軸配向聚酯薄膜之在121℃、2大氣壓之飽和水蒸氣中處理10小時後之聚酯薄膜拉伸強度保持率較好為80%以上。該薄膜拉伸強度保持率更好為85%以上。該拉伸強度保持率係指聚酯薄膜之薄膜連續製膜方向(以下有時稱為長度方向、縱向、MD方向)或其正交方向(以下有時稱為寬度方向、橫向、TD方向)之至少一方向之拉伸強度保持率,且更好兩方向均滿足。
本發明之難燃性二軸配向聚酯薄膜係使用本
發明之膦酸鹽類作為難燃成分,且藉由控制其平均粒徑與薄膜中所含粗大粒子之數,在難燃性優異之同時亦具有優異之耐水解性,濕熱處理後仍可維持高的薄膜拉伸強度保持率。
本發明之難燃性二軸配向聚酯薄膜之製造可使用習知製膜方法製造,例如使含膦酸鹽之聚酯充分乾燥後,在熔點~(熔點+70)℃之溫度下於擠出機內熔融,通過T模嘴熔融擠出,使薄膜狀熔融物在冷卻輥(澆鑄滾筒)上急冷而成為未延伸薄膜,接著使該未延伸薄膜逐次或同時二軸延伸,並熱固定之方法而製造。藉逐次二軸延伸進行製膜時,使未延伸薄膜於縱向在60~170℃延伸2.3~5.5倍,更好2.5~5.0倍之範圍,接著以STENTOR於橫向在80~170℃延伸2.3~5.0倍,更好2.5~4.8倍之範圍。
熱固定處理係在180~260℃,更好190~240℃之溫度在拉緊下或限制收縮下進行熱固定,熱固定時間較好為1~1000秒。且同時二軸延伸時,可應用上述之延伸溫度、延伸倍率、熱固定溫度等。此外,亦可在熱固定後進行鬆弛處理。
本發明之難燃性二軸配向聚酯薄膜可使用作為與金屬層積層之難燃性聚酯薄膜積層體。此處之金屬層包含在薄
膜上形成層狀之形狀者、導線等之形狀者、電路等一定圖型形狀者等。
該難燃性聚酯薄膜積層體可較好地使用於要求難燃性或耐水解性之用途,例示為例如扁平纜線或可撓性印刷電路基板等之用途。此外,亦可使用於與金屬層貼合之其他用途。
本發明之難燃性二軸配向聚酯薄膜及其積層體可使用於可撓性印刷電路基板。
使用於該用途中時,較好將金屬層積層於難燃性二軸配向聚酯薄膜之一面上,作為可撓性印刷電路基板而使用。本用途中使用之金屬層例示為銅箔。金屬層之接合手段或形狀之具體手段並無特別限制,可利用例如將金屬層積層於難燃性二軸配向聚酯薄膜上後,使金屬層進行圖型化之所謂減去法、於難燃性二軸配向聚酯薄膜上以圖型狀電鍍金屬之加成法、將沖壓成圖型狀之金屬層貼合於難燃性二軸配向聚酯薄膜上之燙印箔(stamping foil)等。
使用本發明之難燃性聚酯薄膜積層體獲得之可撓性印刷電路基板,由於聚酯薄膜本身之難燃性非常高,在與金屬層積層使用之可撓性印刷電路基板用途中加工時亦展現與難燃性二軸配向聚酯薄膜本身同樣高的難燃性,且亦具備充分之機械強度與耐水解性,故作為可撓性
印刷電路基板之長期耐久性亦優異。且,本發明之難燃性二軸配向聚酯薄膜由於彎折性亦優異,故在可撓性印刷電路基板中加工時之沖壓性優異,進而由於可兼具難燃性與彎折性,故獲得可撓性高之可撓性印刷電路基板。
又,本發明之聚酯薄模具有0.1μm以上且未達0.5μm之表面粗糙度Ra時,由於薄膜平坦性優異,故作為可撓性印刷電路基板使用時可使金屬層之電路圖型高纖細化。
本發明之難燃性二軸配向聚酯薄膜及其積層體由於反射率特性亦優異,故可使用作為LED之可撓性印刷電路基板。
以下,以實施例詳述本發明,但本發明並不僅限定於該等實施例。又,各特性值係藉以下方法測定。此外,實施例中之份及%只要無特別指明,則分別意指重量份及重量%。
藉由1H-NMR測定、13C-NMR測定,特定出聚酯之成分及共聚合成分及各成分量。
使用NMR及EPMA特定出磷成分之種類。
針對聚酯薄膜,由螢光X射線之發光強度算出磷原子濃度。
針對聚酯薄膜之剖面,使用HIROX股份有限公司之數位顯微鏡KH-3000,以3500倍之倍率取樣20個粒子,測定各個粒徑中之最大長度,去除20點中之最小值與最大值由18點之平均值求出。
使用萬能投影機,以透過照明放大至20倍,計算具有10μm以上之最大長度之粒子數,藉以下基準進行評價。測定面積為1m2。
○:具有10μm以上之最大長度之粒子數為10個/m2以下
×:具有10μm以上之最大長度之粒子數超過10個/m2
藉由薄膜製造步驟中之過濾器壓力變化量(△P)進行評價。
○:△P=未達0.5MPa/h
△:△P=0.5MPa/h以上且未達1.0MPa/h
×:△P=1.0MPa/h以上
將樣品薄膜切成寬10mm、長150mm,將樣品安裝於夾具間100mm,根據JIS-C2151以拉伸速度100mm/min之條件進行拉伸試驗,讀取破裂時之荷重拉伸曲線之荷重、伸長度。測定進行5次,且以平均值作為結果。將荷重除以拉伸前之樣品剖面積算出破裂強度(MPa),破裂伸長度係以將拉伸前之樣品長度作為100時之%算出。測定係在調節成溫度23±2℃、濕度50±5%之室內進行。測定裝置係使用Orientec公司製之TENSILON UCT-100型。
○:破裂強度為150MPa以上
×:破裂強度未達150MPa
將薄膜切成150mm長×10mm寬之短條狀之試料片,將試驗片以不銹鋼製之夾具吊掛在設定成121℃‧2atm‧潤濕飽和模式‧100%RH之環境試驗機內。隨後,經過10小時後自環境試驗機取出試料片,測定拉伸強度。以薄膜長度方向為測定方向進行5次測定,求得其平均值且藉以下基準評價耐水解性。測定裝置係使用Orientec公司製之TENSILON UCT-100型。
拉伸強度保持率(%)=(處理後之拉伸強度X/初期之拉伸強度X0)×100
(式中,拉伸強度X表示在121℃、2atm、100%RH之條件下經特定時間處理後之拉伸強度,拉伸強度X0表示處理前之初期拉伸強度)
○:10小時後之拉伸強度保持率為80%以上
△:10小時後之拉伸強度保持率為50%以上且未達80%
×:10小時後之拉伸強度保持率未達50%
以UL-94VTM法評價薄膜樣品。將樣品切成20cm×5cm,在23±2℃、50±5%RH中放置48小時,隨後將試料下端垂直保持在距離燃燒器上方10mm。以內徑9.5mm、火焰長度19mm之本生燈(Bunsen burner)作為加熱源,使該試料之下端與火焰接觸3秒。沿著VTM-0、VTM-1、VTM-2之評價基準評價難燃性,在n=5之測定次數中,以相同評等數最多者作為評等。
使用小坂研究所股份有限公司製之觸針式表面粗糙度計(SURFCORDER SE-30C),藉以下條件針對聚酯薄膜表面進行測定,測定所算出之中心線平均粗糙度Ra、最大高度Rmax,使用4次測定之平均值根據下述基準進行
評價。又中心線平均粗糙度Ra(A評價)中為○評價時,亦一併記載更細分化之基準(B評價:○++、○+)。
測定長度:2.5mm
截斷:0.25mm
測定環境:室溫、大氣中
○:0.1μm以上且未達2μm
×:未達0.1μm或2μm以上
○++:0.1μm以上且未達0.5μm
○+:0.5μm以上且未達2μm
○:未達3μm
×:3μm以上
使用固有黏度0.60dl/g、末端羧基濃度25當量/噸之聚對苯二甲酸酯(酯交換觸媒:乙酸錳四水鹽、聚合觸媒:三氧化銻)作為聚酯,以聚酯薄膜之重量為基準含有5重量%之二甲基膦酸鋁(表1中,記載為磷化合物A,平均粒徑2μm,藉粉碎、分級加工去除粗大粒子(最大長度10μm以上))之組成物以170℃乾燥機乾燥3小時
後,投入擠出機中,以熔融溫度280℃熔融混練,藉由280℃之狹縫模嘴擠出後,在表面溫度設定為25℃之澆鑄滾筒上冷卻固化製作未延伸薄膜。
將該未延伸薄膜導入加熱至100℃之輥群中,於長度方向(縱向)延伸3.5倍,且以25℃之輥群冷卻。接著,邊以夾具保持縱向延伸之薄膜之兩端邊導入拉幅機中,在加熱至120℃之環境中朝與長度方向垂直之方向(橫向)延伸3.8倍。隨後,在拉幅機內進行230℃之熱固定,於180℃朝寬度方向鬆弛2%後,經均勻緩慢冷卻而冷卻至室溫,獲得50μm厚之二軸延伸薄膜。所得薄膜特性示於表1。本實施例之薄膜之難燃性、機械特性、耐水解性優異。且表面粗糙度之指標之一的Ra為0.10μm,Rmax為1.8μm,製膜性與機械特性優異。
除了將難燃劑變更為二乙基膦酸鋁(表1中,記載為磷化合物B,平均粒徑2μm,藉粉碎、分級加工去除粗大粒子(最大長度10μm以上))以外,餘進行與實施例1相同之操作,獲得厚度50μm之二軸延伸薄膜。所得薄膜之特性示於表1。本實施例之薄膜之製膜性、難燃性、機械特性及耐水解性均優異。
除了將難燃劑含量變更為3重量%以外,餘進行與實
施例2相同之操作,獲得厚度50μm之二軸延伸薄膜。所得薄膜之特性示於表1。本實施例之薄膜之製膜性、難燃性、機械特性及耐水解性均優異。
除了將難燃劑含量變更為10重量%以外,餘進行與實施例2相同之操作,獲得厚度50μm之二軸延伸薄膜。所得薄膜之特性示於表1。本實施例之薄膜之製膜性、難燃性、機械特性及耐水解性均優異。
除了將難燃劑之含量變更為15重量%以外,餘進行與實施例2相同之操作,獲得厚度50μm之二軸延伸薄膜。所得薄膜之特性示於表1。本實施例之薄膜之製膜性、難燃性、機械特性及耐水解性均優異。
除了將難燃劑含量變更為30重量%以外,餘進行與實施例2相同之操作,獲得厚度50μm之二軸延伸薄膜。所得薄膜之特性示於表1。本實施例之薄膜之製膜性、難燃性、機械特性及耐水解性均優異。
使用固有黏度0.57dl/g、末端羧基濃度25當量/噸之
聚2,6-萘二甲酸乙二酯(酯交換觸媒:乙酸錳四水鹽、聚合觸媒:三氧化銻)作為聚酯,以聚酯薄膜之重量為基準含有5重量%之二乙基膦酸鋁(磷化合物B,平均粒徑2μm,藉粉碎、分級加工去除粗大粒子(最大長度10μm以上))之組成物以180℃乾燥機乾燥5小時後,投入擠出機中,以熔融溫度300℃熔融混練,以300℃之狹縫模嘴擠出後,在表面溫度設定為60℃之澆鑄滾筒上冷卻固化製作未延伸薄膜。
將該未延伸薄膜導入加熱至140℃之輥群中,於長度方向(縱向)延伸3.5倍,以60℃之輥群冷卻。接著,邊以夾具保持縱向延伸之薄膜之兩端邊導入拉幅機中,在加熱至150℃之環境中朝與長度方向垂直之方向(橫向)延伸3.5倍。隨後,在拉幅機內進行230℃之熱固定,於180℃朝寬度方向鬆弛2%後,經均勻緩慢冷卻而冷卻至室溫,獲得50μm厚之二軸延伸薄膜。所得薄膜之特性示於表1。本實施例之薄膜之製膜性、難燃性、機械特性及耐水解性優異。
除了將難燃劑含量變更為15重量%以外,餘進行與實施例7相同之操作,獲得厚度50μm之二軸延伸薄膜。所得薄膜之特性示於表1。本實施例之薄膜之製膜性、難燃性、機械特性及耐水解性均優異。
除了將難燃劑之平均粒徑由2μm變更為3μm以外,餘進行與實施例2相同之操作,獲得厚度50μm之二軸延伸薄膜。所得薄膜之特性示於表1。本實施例之薄膜之製膜性、難燃性、機械特性及耐水解性均優異。
除了未添加難燃劑以外,餘進行與實施例1相同之操作,獲得厚度50μm之二軸延伸薄膜。所得薄膜之特性示於表1。本比較例之薄膜之製膜性、機械特性、耐水解性、外觀性雖優異,但難燃性不足。
除了將難燃劑含量變更為45重量%以外,餘進行與實施例1相同之操作,獲得厚度50μm之二軸延伸薄膜。所得薄膜之特性示於表1。本比較例之薄膜之製膜性不足,無法獲得二軸延伸薄膜。
除了將難燃劑變更為未去除粗大粒子之二乙基膦酸鋁(表1中,記載為磷化合物B’,平均粒徑2μm)以外,餘進行與實施例4相同之操作,獲得厚度50μm之二軸延伸薄膜。所得薄膜之特性示於表1。本比較例之製膜性不足,且所得二軸延伸薄膜之表面粗糙,機械特性、耐水解
性亦低。
除了將難燃劑變更為未去除粗大粒子之二乙基膦酸鋁(表1中,記載為磷化合物B’,平均粒徑30μm)以外,餘進行與實施例4相同之操作,獲得厚度50μm之二軸延伸薄膜。所得薄膜之特性示於表1。本比較例之製膜性不足,且所得二軸延伸薄膜之表面粗糙,機械特性、耐水解性亦低。
表1中,PET表示聚對苯二甲酸乙二酯,PEN表示聚2,6-萘二甲酸乙二酯。
本發明之難燃性二軸配向聚酯薄膜之製膜性優異,不會使聚對苯二甲酸乙二酯或聚萘二甲酸乙二酯之聚酯所具有之機械特性或耐水解性降低,且具備高難燃性,故可較好地使用於例如可撓性電路基板、扁平纜線、太陽能電池用背板等。
Claims (7)
- 一種難燃性二軸配向聚酯薄膜,其特徵係以聚酯薄膜重量為基準,含有70重量%以上且99.5重量%以下之聚對苯二甲酸乙二酯或聚萘二甲酸乙二酯,及0.5重量%以上且30重量%以下之以下述式(1)或下述式(2)表示之平均粒徑0.5~3.0μm之難燃劑粒子,
- 如請求項1之難燃性二軸配向聚酯薄膜,其中根據JIS-C2151以拉伸速度100mm/min之條件進行拉伸試驗 所得前述聚酯薄膜之機械強度為150MPa以上。
- 如請求項1之難燃性二軸配向聚酯薄膜,其中在121℃、2大氣壓之飽和水蒸氣中處理10小時後之前述聚酯薄膜之拉伸強度保持率為80%以上。
- 如請求項1之難燃性二軸配向聚酯薄膜,其中前述聚酯薄膜之表面之中心線平均粗糙度Ra為0.1μm以上且未達0.5μm。
- 一種難燃性聚酯薄膜積層體,其係積層如請求項1~4中任一項之難燃性二軸配向聚酯薄膜與金屬層而成者。
- 如請求項5之難燃性聚酯薄膜積層體,其係用於可撓性印刷電路基板者。
- 一種可撓性電路基板,其係使用如請求項5之難燃性聚酯薄膜積層體者。
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