TWI626439B - 缺陷檢查系統 - Google Patents
缺陷檢查系統 Download PDFInfo
- Publication number
- TWI626439B TWI626439B TW103120087A TW103120087A TWI626439B TW I626439 B TWI626439 B TW I626439B TW 103120087 A TW103120087 A TW 103120087A TW 103120087 A TW103120087 A TW 103120087A TW I626439 B TWI626439 B TW I626439B
- Authority
- TW
- Taiwan
- Prior art keywords
- film
- defect inspection
- mask
- defect
- inspection system
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/02—Mechanical
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Liquid Crystal (AREA)
- Polarising Elements (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013124040A JP6177017B2 (ja) | 2013-06-12 | 2013-06-12 | 欠陥検査システム |
JPJP2013-124040 | 2013-06-12 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201502495A TW201502495A (zh) | 2015-01-16 |
TWI626439B true TWI626439B (zh) | 2018-06-11 |
Family
ID=52022245
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW103120087A TWI626439B (zh) | 2013-06-12 | 2014-06-10 | 缺陷檢查系統 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP6177017B2 (ko) |
KR (2) | KR102369758B1 (ko) |
CN (1) | CN105247351B (ko) |
TW (1) | TWI626439B (ko) |
WO (1) | WO2014199952A1 (ko) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6641093B2 (ja) * | 2015-03-20 | 2020-02-05 | 住友化学株式会社 | 光学フィルム及び積層光学フィルムの欠陥検査方法 |
JP6704230B2 (ja) * | 2015-09-30 | 2020-06-03 | 日東電工株式会社 | 長尺状偏光子の検査方法、検査システムおよび製造方法 |
KR101748208B1 (ko) * | 2016-03-07 | 2017-06-19 | 동우 화인켐 주식회사 | 편광판, 시트상 제품 검사 시스템 및 방법 |
JP6774803B2 (ja) * | 2016-07-14 | 2020-10-28 | 東京エレクトロン株式会社 | 液滴吐出装置及び吐出検査方法 |
KR102438892B1 (ko) * | 2017-03-03 | 2022-08-31 | 스미또모 가가꾸 가부시키가이샤 | 결함 검사 시스템, 필름 제조 장치, 필름 제조 방법, 인자 장치 및 인자 방법 |
JP6934733B2 (ja) * | 2017-03-03 | 2021-09-15 | 住友化学株式会社 | マーキング装置、欠陥検査システム及びフィルム製造方法 |
JP6978842B2 (ja) * | 2017-03-03 | 2021-12-08 | 住友化学株式会社 | マーキング装置、欠陥検査システム及びフィルム製造方法 |
KR102475056B1 (ko) * | 2017-03-03 | 2022-12-06 | 스미또모 가가꾸 가부시키가이샤 | 결함 마킹 방법 및 결함 마킹 장치, 원반의 제조 방법 및 원반, 그리고 시트의 제조 방법 및 시트 |
KR102469408B1 (ko) * | 2017-03-03 | 2022-11-22 | 스미또모 가가꾸 가부시키가이샤 | 결함 검사 시스템, 필름 제조 장치, 필름 제조 방법, 인자 장치 및 인자 방법 |
JP6991721B2 (ja) * | 2017-03-03 | 2022-01-12 | 住友化学株式会社 | マーキング装置、欠陥検査システム及びフィルム製造方法 |
JP6408654B1 (ja) * | 2017-06-16 | 2018-10-17 | 株式会社オプトン | 検査装置 |
KR102603009B1 (ko) * | 2017-09-05 | 2023-11-15 | 스미또모 가가꾸 가부시키가이샤 | 결함 기록 시스템 및 필름 제조 시스템, 그리고 필름의 제조 방법 |
CN107703152A (zh) * | 2017-10-27 | 2018-02-16 | 深圳精创视觉科技有限公司 | 光学膜缺点自动标示装置 |
JP7044583B2 (ja) | 2018-02-22 | 2022-03-30 | 住友化学株式会社 | フィルムの製造方法、フィルム捲回装置 |
CN108982530A (zh) * | 2018-05-24 | 2018-12-11 | 京东方科技集团股份有限公司 | 一种背光卷料的检测系统 |
JP2019215371A (ja) * | 2019-08-26 | 2019-12-19 | 住友化学株式会社 | 光学フィルム及び積層光学フィルムの欠陥検査方法 |
CN112874163A (zh) * | 2021-01-14 | 2021-06-01 | 恒美光电股份有限公司 | 一种光学膜缺点喷印装置 |
CN113466256B (zh) * | 2021-06-29 | 2022-04-15 | 深圳市楠轩光电科技有限公司 | 一种光学薄膜缺陷批量式检测设备 |
US11867639B2 (en) * | 2021-09-15 | 2024-01-09 | Te Connectivity Solutions Gmbh | Method and apparatus for flattening and imaging a printed thin film product |
CN113978139B (zh) * | 2021-11-23 | 2023-01-10 | 深圳市盛波光电科技有限公司 | 一种薄膜缺陷喷码补喷处理方法及处理系统 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001059821A (ja) * | 1999-08-24 | 2001-03-06 | Fuji Photo Film Co Ltd | 表面検査方法及び装置 |
JP2008093849A (ja) * | 2006-10-06 | 2008-04-24 | Canon Inc | 液滴吐出ヘッド及び液滴吐出装置 |
TW201040515A (en) * | 2009-04-10 | 2010-11-16 | Nitto Denko Corp | Optical film raw roll |
CN101981438A (zh) * | 2008-03-31 | 2011-02-23 | 住友化学株式会社 | 偏光薄膜的检查方法 |
JP2011167941A (ja) * | 2010-02-18 | 2011-09-01 | Seiko Epson Corp | 液体噴射ヘッド、液体噴射ヘッドユニット及び液体噴射装置 |
JP2011218712A (ja) * | 2010-04-13 | 2011-11-04 | Seiko Epson Corp | インクジェット印刷装置 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000062166A (ja) * | 1998-08-18 | 2000-02-29 | Dainippon Screen Mfg Co Ltd | 描画ヘッド装置 |
JP2002292853A (ja) * | 2001-03-29 | 2002-10-09 | Tomoegawa Paper Co Ltd | マーキングシステム、マーキング方法およびマーキング装置 |
KR20050013491A (ko) * | 2003-07-28 | 2005-02-04 | 닛토덴코 가부시키가이샤 | 시트형상 제품의 검사 방법 및 검사 시스템 |
GB2432837B (en) * | 2004-07-30 | 2008-08-20 | Sumitomo Chemical Co | Polymeric compound, thin polymer film, and thin polymer film element including the same |
JP4671773B2 (ja) * | 2005-06-10 | 2011-04-20 | 株式会社Isowa | 印刷装置 |
JP4514059B2 (ja) | 2006-12-11 | 2010-07-28 | 日東電工株式会社 | シート状成形体の検査結果記録方法及び検査結果記録システム |
JP2010030768A (ja) * | 2008-07-30 | 2010-02-12 | Seiko Epson Corp | 給送装置及び記録装置 |
JP5588223B2 (ja) | 2009-05-26 | 2014-09-10 | 旭化成イーマテリアルズ株式会社 | ワイヤグリッド偏光フィルム用欠陥マーキング装置及び欠陥マーキング方法 |
JP2013016398A (ja) * | 2011-07-05 | 2013-01-24 | Sumitomo Chemical Co Ltd | 光学シートの製造方法 |
-
2013
- 2013-06-12 JP JP2013124040A patent/JP6177017B2/ja active Active
-
2014
- 2014-06-09 KR KR1020217010535A patent/KR102369758B1/ko active IP Right Grant
- 2014-06-09 CN CN201480030723.4A patent/CN105247351B/zh active Active
- 2014-06-09 WO PCT/JP2014/065231 patent/WO2014199952A1/ja active Application Filing
- 2014-06-09 KR KR1020157034307A patent/KR20160018510A/ko not_active IP Right Cessation
- 2014-06-10 TW TW103120087A patent/TWI626439B/zh active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001059821A (ja) * | 1999-08-24 | 2001-03-06 | Fuji Photo Film Co Ltd | 表面検査方法及び装置 |
JP2008093849A (ja) * | 2006-10-06 | 2008-04-24 | Canon Inc | 液滴吐出ヘッド及び液滴吐出装置 |
CN101981438A (zh) * | 2008-03-31 | 2011-02-23 | 住友化学株式会社 | 偏光薄膜的检查方法 |
TW201040515A (en) * | 2009-04-10 | 2010-11-16 | Nitto Denko Corp | Optical film raw roll |
JP2011167941A (ja) * | 2010-02-18 | 2011-09-01 | Seiko Epson Corp | 液体噴射ヘッド、液体噴射ヘッドユニット及び液体噴射装置 |
JP2011218712A (ja) * | 2010-04-13 | 2011-11-04 | Seiko Epson Corp | インクジェット印刷装置 |
Also Published As
Publication number | Publication date |
---|---|
KR20210043007A (ko) | 2021-04-20 |
CN105247351A (zh) | 2016-01-13 |
JP2014240816A (ja) | 2014-12-25 |
KR102369758B1 (ko) | 2022-03-03 |
KR20160018510A (ko) | 2016-02-17 |
TW201502495A (zh) | 2015-01-16 |
WO2014199952A1 (ja) | 2014-12-18 |
CN105247351B (zh) | 2019-12-24 |
JP6177017B2 (ja) | 2017-08-09 |
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