TWI494327B - A photohardenable composition, and a molded article having a fine pattern on its surface - Google Patents
A photohardenable composition, and a molded article having a fine pattern on its surface Download PDFInfo
- Publication number
- TWI494327B TWI494327B TW098116714A TW98116714A TWI494327B TW I494327 B TWI494327 B TW I494327B TW 098116714 A TW098116714 A TW 098116714A TW 98116714 A TW98116714 A TW 98116714A TW I494327 B TWI494327 B TW I494327B
- Authority
- TW
- Taiwan
- Prior art keywords
- compound
- photocurable composition
- mold
- fine pattern
- pattern
- Prior art date
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- 239000000203 mixture Substances 0.000 title claims description 184
- 150000001875 compounds Chemical class 0.000 claims description 184
- 239000003999 initiator Substances 0.000 claims description 55
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Classifications
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Description
本發明係有關於一種光硬化性組成物及表面具有微細圖案之成形體的製造方法。
在光學構件、記錄媒體、半導體裝置等之製造中,短時間形成微細圖案的方法已知有,令表面具有該微細圖案之翻轉圖案的模具按壓在基板表面所配置之光硬化性組成物,然後對該光硬化性組成物照射光,使該光硬化性組成物硬化,而在基板表面形成微細圖案的方法(奈米壓模)(參照專利文獻1、及專利文獻2)。
但是,該方法中,由於光硬化性組成物之硬化物密接於模具,故難以令硬化物與模具分離。因此,必須在模具表面塗佈脫模劑。但是,由於脫模劑本身的膜厚、脫模劑的塗佈不均等,使得精密地轉印模具的翻轉圖案一事變得困難。
作為可形成脫模性佳之硬化物的光硬化性組成物,已有人提出下述者。
(1)包含有:含氟單體、不含氟單體、含氟界面活性劑或含氟聚合物、及聚合起始劑的光硬化性組成物(參照專利文獻3)。
另外,光學構件(透鏡陣列、光子晶體等)的用途中,會有折射率需為1.54以上的情形。但是,(1)的光硬化性組成物中,由於包含折射率低的含氟單體,故難以得到高折射率且脫模性佳的硬化物。
專利文獻1:美國專利第6696220號說明書
專利文獻2:特開2004-071934號公報
專利文獻3:國際公開第2006/114958號手冊
發明揭示
本發明提供一種可得到脫膜性及高折射率兩者兼具之硬化物的光硬化性組成物、及一種可製造高折射率之成形體的方法,該成形體係表面具有精密地轉印了模具之翻轉圖案的微細圖案者。
本發明之光硬化性組成物,其特徵在於包含有:化合物(A),係硬化前於波長589nm下的折射率為1.55以上之化合物,且具有2個以上(甲基)丙烯醯氧基者;化合物(B),係具有氟原子,且具有1個以上碳-碳不飽和雙鍵者(惟,化合物(A)除外);化合物(C),係具有1個(甲基)丙烯醯氧基者(惟,化合物(B)除外);及光聚合起始劑(D),且,化合物(A)、化合物(B)、化合物(C)及光聚合起始劑(D)的合計(100質量%)中,化合物(A)為61~90質量%、化合物(B)為2~15質量%、化合物(C)為5~35質量%、光聚合起始劑(D)為1~12質量%。
本發明之光硬化性組成物,除了前述化合物(A)~(C)、及光聚合起始劑(D)以外,更可含有含氟界面活性劑(E)。
本發明之光硬化性組成物,係以實質上不含溶劑為佳。
本發明之光硬化性組成物,其硬化後於波長589nm下的折射率宜為1.54以上。
本發明之表面具有微細圖案之成形體的製造方法,其特徵在於包含有以下步驟:使本發明之光硬化性組成物與模具之具有該翻轉圖案的表面接觸,該模具係在表面具有前述微細圖案之翻轉圖案;在使前述光硬化性組成物接觸前述模具之表面的狀態下,對前述光硬化性組成物照射光,使前述光硬化性組成物硬化成硬化物;及將前述模具自前述硬化物分離,而得到其表面具有微細圖案之成形體。
本發明之表面具有微細圖案之成形體的製造方法,其特徵在於包含有以下步驟:將本發明之光硬化性組成物配置於基板之表面;令表面具有前述微細圖案之翻轉圖案的模具按壓前述光硬化性組成物,使該模具的翻轉圖案接觸前述光硬化性組成物;在前述模具按壓前述光硬化性組成物的狀態下,對前述光硬化性組成物照射光,使前述光硬化性組成物硬化成硬化物;及將前述模具或將前述基板及前述模具自前述硬化物分離,而得到其表面具有微細圖案之成形體。
本發明之表面具有微細圖案之成形體的製造方法,其特徵在於包含有以下步驟:將本發明之光硬化性組成物配置於模具之具有該翻轉圖案的表面上,該模具係在表面具有前述微細圖案之翻轉圖案;令基板按壓前述光硬化性組成物;在前述基板按壓前述光硬化性組成物的狀態下,對前述光硬化性組成物照射光,使前述光硬化性組成物硬化成硬化物;及將前述模具或將前述基板及前述模具自前述硬化物分離,而得到其表面具有微細圖案之成形體。
本發明之表面具有微細圖案之成形體的製造方法,其特徵在於包含有以下步驟:令基板與表面具有前述微細圖案之翻轉圖案的模具接近或接觸,使該模具的翻轉圖案成為在前述基板側;將本發明之光硬化性組成物填充於前述基板與前述模具之間;在前述基板與前述模具接近或接觸的狀態下,對前述光硬化性組成物照射光,使前述光硬化性組成物硬化成硬化物;及將前述模具或將前述基板及前述模具自前述硬化物分離,而得到其表面具有微細圖案之成形體。
又,本發明之表面具有微細圖案之成形體的製造方法中,用以硬化光硬化性組成物的光之波長宜為200~500nm。
根據本發明之光硬化性組成物,可得到脫膜性及高折射率兩者兼具的硬化物。
根據本發明之表面具有微細圖案之成形體的製造方法,可製造高折射率之成形體,該成形體係表面具有精密地轉印了模具之翻轉圖案的微細圖案者。
第1圖係顯示表面具有微細圖案之成形體的製造方法之一例的截面圖。
第2圖係顯示表面具有微細圖案之成形體的製造方法之另一例的截面圖。
第3圖係顯示表面具有微細圖案之成形體之一例的截面圖。
第4圖係顯示表面具有微細圖案之成形體之另一例的截面圖。
本說明書中,將以式(B1)所表示之化合物記載為化合物(B1)。以其他式所表示之化合物亦同樣地記載。又,本說明書中,(甲基)丙烯醯氧基意指,丙烯醯氧基或甲基丙烯醯氧基。又,本說明書中,(甲基)丙烯酸酯意指,丙烯酸酯或甲基丙烯酸酯。
本發明之光硬化性組成物係含有化合物(A)~(C)、及光聚合起始劑(D),且因應需要而含有含氟界面活性劑(E)及添加劑(F)的組成物。
化合物(A):硬化前於波長589nm下的折射率為1.55以上的化合物,且具有2個以上(甲基)丙烯醯氧基的化合物。
化合物(B):具有氟原子,且具有1個以上碳-碳不飽和雙鍵的化合物(惟,化合物(A)除外)。
化合物(C):具有1個(甲基)丙烯醯氧基的化合物(惟,化合物(B)除外)。
本發明之光硬化性組成物在25℃下之黏度係以200~1000mPa.s為佳,且以300~600mPa.s為較佳。光硬化性組成物的黏度若為該範圍,則無須進行特別操作(例如,將光硬化性組成物高溫加熱成低黏度的操作等),即可輕易進行光硬化性組成物與模具之具有翻轉圖案之表面的接觸。
本發明之光硬化性組成物,係以實質上不含溶劑為佳。光硬化性組成物若實質上不含溶劑,則無須進行除了照射光線以外的特別操作(例如,將光硬化性組成物高溫加熱以除去溶媒的操作等),即可輕易進行光硬化性組成物的硬化。
溶劑係指,具有使化合物(A)~(C)、光聚合起始劑(D)、含氟界面活性劑(E)、及添加劑(F)之任一者溶解之能力的化合物。
實質上不含溶劑意指,完全不含溶劑,或,可含有調製光硬化性組成物時使用的溶劑作為殘留溶劑。惟,殘留溶劑宜極力去除,以光硬化性組成物(100質量%)中,含10質量%以下為較佳。
本發明之光硬化性組成物的感度可藉由,對厚度約1.5μm的光硬化性組成物照射來自高壓水銀燈(在1.5~2.0kHz中,於254nm、315nm、及365nm具有主波長的光源)的光後,直到光硬化性組成物完全硬化為止的累計光量來表示。該累計光量係以1000mJ/cm2
以下為佳,且以150mJ/cm2
~750mJ/cm2
為較佳。該累計光量若大於1000mJ/cm2
,則需要20秒以上的時間來使光硬化性組成物硬化,造成生產效率降低。
本發明之光硬化性組成物,其硬化後於波長589nm下的折射率係以1.54以上為佳,且以1.54~1.62為較佳。該折射率小於1.54時,無法大幅縮短焦距,故無法減小微透鏡陣列等光學元件的尺寸。
硬化後之光硬化性組成物於波長589nm下的折射率係使用阿貝折射率計在23℃下進行測定的。
本發明之光硬化性組成物之硬化後的對水之接觸角,會成為硬化物之脫模性的標準。該接觸角係以75度以上為佳,且以80~116度為較佳。該接觸角小於75度時,會變得難以脫模,造成光硬化性組成物附著於模具,恐有使模具破損之虞。該接觸角係依據JIS R3257來進行測定。
化合物(A)係硬化前於波長589nm下的折射率為1.55以上的化合物,且具有2個以上(甲基)丙烯醯氧基的化合物。
硬化前之化合物(A)於波長589nm下的折射率為1.55以上,且以1.55~1.63為佳。該折射率小於1.55時,無法得到於波長589nm下的折射率為1.54以上的光硬化性組成物之硬化物。
硬化前之化合物(A)於波長589nm下的折射率係使用阿貝折射率計在23℃下進行測定的。
化合物(A)宜為液體,化合物(A)在25℃下之黏度係以10Pa.S以下為佳,且特別係以1Pa.S以下為最佳。黏度若大於10Pa.S,則恐有變得無法與化合物(B)及化合物(C)均勻混合之虞,且恐有透明性降低而變得無法用於光學用途之虞。另外,本說明書中,係使用以標準液(JS50(在25℃下為33.17mPa.S))校正完成之黏度計(東機產業社製、TV-20)進行測定為佳。
化合物(A)可舉:具有2個以上苯環的芳香族化合物,且具有2個以上(甲基)丙烯醯氧基的化合物。2個以上苯環亦可形成稠環(萘環、蒽環、茀環等)。
具有2個以上苯環的芳香族化合物可舉:以下式(A1)~(A7)所表示之具有雙酚骨架的化合物、具有萘骨架的化合物、具有蒽骨架的化合物、具有茀骨架的化合物等。
惟,R1
表示氫原子或甲基;R0
表示碳數1~5之烷基;R7
表示碳數1~5之烷基、(CH2
CH2
O)p
或(CH2
CH2
CH2
O)q
;p表示1~4之整數;q表示1~4之整數。
就折射率高及相容性的觀點來看,化合物(A)特別係以具有茀骨架的化合物為最佳。
具有茀骨架的化合物可舉:以式(A5)~(A7)所表示之茀骨架的二(甲基)丙烯酸酯化合物。具有茀骨架的化合物的市售品可舉:OGSOL EA-F5003(大阪Gas Chemical社製)、NK ESTER A-BPEF(新中村化學工業社製)等。
化合物(A)可使用單獨1種,亦可合併2種以上使用。
化合物(A)的含有量係化合物(A)、化合物(B)、化合物(C)及光聚合起始劑(D)的合計(100質量%)當中的61~90質量%,且以63~80質量%為佳。化合物(A)的含有量若為61質量%以上,則可得到於波長589nm下的折射率為1.54以上的光硬化性組成物之硬化物。化合物(A)的含有量若為90質量%以下,則硬化物不會產生層分離。
化合物(B)係具有氟原子,且具有1個以上碳-碳不飽和雙鍵的化合物(惟,化合物(A)除外)。
化合物(B)可舉:(甲基)丙烯酸氟酯類、氟二烯類、氟乙烯醚類、氟環狀單體類等,就相容性的觀點來看,係以(甲基)丙烯酸氟酯類為佳。
本發明之光硬化性組成物中因含有化合物(B),而可在分離模具與業已硬化之該光硬化性組成物時,輕易進行脫模。
化合物(B)在25℃下之黏度係以300mPa.S以下為佳,且特別係以150mPa.S以下為最佳。黏度若大於300mPa.S,則恐有變得無法與化合物(A)及化合物(C)均勻混合之虞,且恐有透明性降低而變得無法用於光學用途之虞。
(甲基)丙烯酸氟酯類係以化合物(B1)為佳。
惟,R1
表示氫原子或甲基;R2
及R3
分別獨立表示為氫原子或碳數1~4的烷基;R4
及R5
分別獨立表示為氟原子或碳數1~4的全氟烷基;R6
表示氫原子或氟原子;m表示1~4之整數;n表示1~16之整數。就相容性的觀點來看,n係以1~10之整數為佳。m係以1~2之整數為佳。
作為(甲基)丙烯酸氟酯類,宜可使用下述化合物。
3-(全氟-3-甲基丁基)-2-羥丙基(甲基)丙烯酸酯、2,2,2-三氟-1-(三氟甲基)乙基(甲基)丙烯酸酯、CH2
=CHCOOCH2
CF2
OCF2
CF2
OCF3
、CH2
=CHCOOCH2
CF2
O(CF2
CF2
O)3
CF3
、CH2
=C(CH3
)COOCH2
CF2
OCF2
CF2
OCF3
、CH2
=C(CH3
)COOCH2
CF2
O(CF2
CF2
O)3
CF3
、CH2
=CHCOOCH2
CF(CF3
)OCF2
CF(CF3
)O(CF2
)3
F、CH2
=CHCOOCH2
CF(CF3
)O(CF2
CF(CF3
)O)2
(CF2
)3
F、CH2
=C(CH3
)COOCH2
CF(CF3
)OCF2
CF(CF3
)O(CF2
)3
F、CH2
=C(CH3
)COOCH2
CF(CF3
)O(CF2
CF(CF3
)O)2
(CF2
)3
F、CH2
=CFCOOCH2
CH(OH)CH2
(CF2
)6
CF(CF3
)2
、CH2
=CFCOOCH2
CH(CH2
OH)CH2
(CF2
)6
CF(CF3
)2
、CH2
=CFCOOCH2
CH(OH)CH2
(CF2
)10
F、CH2
=CFCOOCH2
CH(CH2
OH)CH2
(CF2
)10
F、CH2
=CHCOOCH2
CF2
(OCF2
CF2
)n
OCF2
CH2
OCOCH=CH2
(惟,n表示4~20之整數)等。
就相容性及環境特性的觀點來看,(甲基)丙烯酸氟酯類特別係以下述化合物為最佳。
CH2
=CHCOO(CH2
)2
(CF2
)10
F、CH2
=CHCOO(CH2
)2
(CF2
)8
F、CH2
=CHCOO(CH2
)2
(CF2
)6
F、CH2
=C(CH3
)COO(CH2
)2
(CF2
)10
F、CH2
=C(CH3
)COO(CH2
)2
(CF2
)8
F、CH2
=C(CH3
)COO(CH2
)2
(CF2
)6
F、CH2
=CHCOOCH2
(CF2
)6
F、CH2
=C(CH3
)COOCH2
(CF2
)6
F、CH2
=CHCOOCH2
(CF2
)7
F、CH2
=C(CH3
)COOCH2
(CF2
)7
F、CH2
=CHCOOCH2
CF2
CF2
H、CH2
=CHCOOCH2
(CF2
CF2
)2
H、CH2
=CHCOOCH2
(CF2
CF2
)4
H、CH2
=C(CH3
)COOCH2
(CF2
CF2
)H、CH2
=C(CH3
)COOCH2
(CF2
CF2
)2
H、CH2
=C(CH3
)COOCH2
(CF2
CF2
)4
H。
氟二烯類係以化合物(B2)為佳。
惟,R8
及R9
分別獨立表示為氫原子、氟原子、碳數1~3的烷基、或碳數1~3的氟烷基;Q表示氧原子、以-NR10
-(R10
表示氫原子、碳數1~6的烷基、烷羰基或甲苯磺醯基)所表示之基、或可具有官能基的2價有機基(-OCF2
CF(O(CF2
)3
PO(OC2
H5
)2
)CH2
-、-CH2
CH(C(CF3
)2
OH)CH2
-、-CH2
CH(C(CF3
)2
OH)-、-CH2
CH(C(CF3
)2
OH)CH2
CH2
-、-CH2
CH(CH2
C(CF3
)2
OH)CH2
CH2
-、-CH2
C(CH3
)(CH2
SO2
F)CH2
-、-CF2
C(CF3
)(OCH2
OCH2
CF3
)CH2
-、-OCF2
CF(OCF2
CF2
SO2
F)CH2
-、-OCF2
CF(OCF2
CF2
CH2
NH2
)CH2
-、-OCF2
CF(O(CF2
)3
CN)-、-OCF2
CF(OCF2
CF2
CH2
NH2
)CH2
-、-CF2
C(CF3
)(OH)-、-CF2
C(CF3
)(OH)CH2
-、-CF2
C(CF3
)(OH)-、-OCF2
CF(O(CF2
)3
OC2
H5
)CH2
-、-CF2
C(CF3
)(OCH2
OCH3
)CH2
-、-CH2
CH(CH2
C(CF3
)2
OH)CH2
-、或-CH2
CH(CH2
C(CF3
)2
OH)-等)。
就相容性及環境特性的觀點來看,氟二烯類特別係以下述化合物為最佳。
CF2
=CFCF2
C(CF3
)(OH)CH=CH2
、CF2
=CFCF2
C(CF3
)(OH)CH2
CH=CH2
、CF2
=CFCF2
C(CF3
)(OCH2
OCH2
CF3
)CH2
CH=CH2
、CF2
=CFCF2
C(CF3
)(OCH2
OCH3
)CH2
CH=CH2
。
化合物(B)可使用單獨1種,亦可合併2種以上使用。
化合物(B)的含有量係化合物(A)、化合物(B)、化合物(C)及光聚合起始劑(D)的合計(100質量%)當中的2~15質量%,且以4~10質量%為佳。化合物(B)的含有量若為2質量%以上,則可得到脫模性佳的硬化物,此外還可抑制光硬化性組成物發泡。由於可抑制光硬化性組成物發泡,故調製時變得容易過濾,此外還可排除在進行奈米壓模時因氣泡混入而造成的圖案形狀之缺陷。化合物(B)的含有量若為15質量%以下,則可均勻混合,故可得到機械性強度佳的硬化物,此外還可抑制光硬化性組成物之硬化物於波長589nm下的折射率降低至小於1.54。
化合物(C)係具有1個(甲基)丙烯醯氧基的化合物(惟,化合物(B)除外)。
化合物(C)係使其他成分溶解的成分,且係使化合物(A)與化合物(B)之相容性提高的成分。化合物(A)與化合物(B)之相容性若良好,則可抑制光硬化性組成物在調製時發泡,且變得容易通過濾器等,使得光硬化性組成物的調製變容易,又,可得到均勻的光硬化性組成物。此外,由於可得到均質的硬化物,而可充分發揮脫模性、機械性強度。
化合物(C)在25℃下之黏度係以300mPa.S以下為佳,且特別係以150mPa.S以下為最佳。黏度若大於300mPa.S,則恐有變得無法與化合物(A)及化合物(B)均勻混合之虞,且恐有透明性降低而變得無法用於光學用途之虞。
化合物(C)可舉下述化合物。
苯氧基乙基(甲基)丙烯酸酯、2-羥-3-苯氧基丙基(甲基)丙烯酸酯、苯氧基乙二醇(甲基)丙烯酸酯、苯氧基二乙二醇(甲基)丙烯酸酯、(甲基)丙烯酸苯甲酯、甲氧基三乙二醇(甲基)丙烯酸酯、甲氧基聚乙二醇(甲基)丙烯酸酯、(甲基)丙烯醯氧乙基六氫鄰苯二甲酸酯((meth)acryloyloxyethylhexahydrophthalate)、(甲基)丙烯酸二十二酯、2-(甲基)丙烯醯氧乙基琥珀酸乙酯、(甲基)丙烯酸十八酯、(甲基)丙烯酸異十八酯、(甲基)丙烯酸異十二酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸3-(三甲氧基矽)丙酯、(甲基)丙烯酸丁酯、(甲基)丙烯酸乙氧基乙酯、(甲基)丙烯酸甲氧基乙酯、(甲基)丙烯酸環氧丙酯、四氫糠基(甲基)丙烯酸酯、(甲基)丙烯酸烯丙酯、(甲基)丙烯酸2-羥乙酯、(甲基)丙烯酸2-羥丙酯、(甲基)丙烯酸N,N-二乙胺乙酯、(甲基)丙烯酸N,N-二甲胺乙酯、(甲基)丙烯酸二甲胺乙酯、(甲基)丙烯酸2-甲基-2-金剛酯、(甲基)丙烯酸2-乙基-2-金剛酯、(甲基)丙烯酸3-羥-1-金剛酯、(甲基)丙烯酸1-金剛酯、(甲基)丙烯酸異冰片酯、(甲基)丙烯酸2-萘酯、2-羥-3-苯氧基丙基(甲基)丙烯酸酯、(甲基)丙烯酸2-(4-苯甲醯基-3-羥苯氧基)乙酯、(甲基)丙烯酸9-蒽酯、鄰(甲基)丙烯酸螢光酯、(甲基)丙烯酸2-(9H-咔唑-9-基)乙酯、(甲基)丙烯酸鋯酯、(甲基)丙烯酸β-羧乙酯、(甲基)丙烯酸辛酯、(甲基)丙烯酸癸酯、(甲基)丙烯酸2-(三級丁胺)乙酯、1,2,2,6,6-五甲基-4-吡啶(甲基)丙烯酸酯、(甲基)丙烯酸正丁酯、(甲基)丙烯酸三級丁酯、4-三級丁基環己基(甲基)丙烯酸酯、鄰苯酚環氧丙醚(甲基)丙烯酸酯、羥乙基化鄰苯酚(甲基)丙烯酸酯等。
就相容性的觀點來看,化合物(C)係以具有芳香環的(甲基)丙烯酸酯((甲基)丙烯酸苯氧基乙酯、(甲基)丙烯酸2-羥-3-苯氧基丙酯、(甲基)丙烯酸苯氧基乙二醇酯、(甲基)丙烯酸苯氧基二乙二醇酯、(甲基)丙烯酸苯甲酯、2-(甲基)丙烯醯氧乙基六氫鄰苯二甲酸酯等),或,宜為具有金剛烷骨架的(甲基)丙烯酸酯((甲基)丙烯酸2-甲基-2-金剛酯、(甲基)丙烯酸2-乙基-2-金剛酯、(甲基)丙烯酸3-羥-1-金剛酯、(甲基)丙烯酸1-金剛酯等)為佳。
化合物(C)可使用單獨1種,亦可合併2種以上使用。
化合物(C)的含有量係化合物(A)、化合物(B)、化合物(C)及光聚合起始劑(D)的合計(100質量%)當中的5~35質量%,且以10~30質量%為佳。化合物(C)的含有量若為5質量%以上,則化合物(A)與化合物(B)的相容性將變得良好。化合物(C)的含有量若為35質量%以下,則可得到於波長589nm下的折射率為1.54以上的光硬化性組成物之硬化物。
光聚合起始劑(D)可舉:苯乙酮系光聚合起始劑、苯偶姻系光聚合起始劑、二苯基酮系光聚合起始劑、噻吨酮系光聚合起始劑、α-胺酮系光聚合起始劑、α-羥酮系光聚合起始劑、α-醯肟酯、苯甲基-(鄰乙氧羧基)-α-單肟、氧化醯膦、乙醛酸酯、3-香豆素酮(ketocoumarin)、2-乙蒽醌(ethyl anthraquinone)、樟腦醌(camphoroquinone)、硫化四甲鋰、偶氮二異丁腈、過氧化苯甲醯、二烷基過氧化物、過氧異丁酸三級丁酯等。其中,就感度及相容性的觀點來看,係以苯乙酮系光聚合起始劑、苯偶姻系光聚合起始劑、α-胺酮系光聚合起始劑或二苯基酮系光聚合起始劑為佳。
苯乙酮系光聚合起始劑可舉下述化合物。
苯乙酮、對(三級丁基)1’,1’,1’-三氯苯乙酮、氯苯乙酮、2’,2’-二乙氧苯乙酮、羥苯乙酮、2,2-二甲氧-2’-苯苯乙酮、2-胺苯乙酮、二烷基胺苯乙酮等。
苯偶姻系光聚合起始劑可舉下述化合物。
苯甲基、苯偶姻、苯偶姻甲醚、苯偶姻乙醚、苯偶姻異丙醚、苯偶姻異丁醚、1-羥環己苯酮、2-羥-2-甲基-1-苯-2-甲基丙烷-1-酮、1-(4-異丙苯)-2-羥-2-甲基丙烷-1-酮、苯甲基二甲縮酮等。
α-胺酮系光聚合起始劑可舉下述化合物。
2-苯甲基-2-二甲胺-1-(4-嗎啉苯)-丁酮-1、2-甲基-1[4-(甲硫基)苯]-2-嗎啉丙烷-1-酮等。
二苯基酮系光聚合起始劑可舉下述化合物。
二苯基酮、苯甲醯苯甲酸、苯甲醯苯甲酸甲酯、鄰苯甲醯苯甲酸甲酯、4-苯二苯基酮、羥二苯基酮、羥丙基二苯基酮、丙烯酸二苯基酮、4,4’-雙(二甲胺)二苯基酮等。
光聚合起始劑(D)可使用單獨1種,亦可合併2種以上使用。
光聚合起始劑(D)的含有量係化合物(A)、化合物(B)、化合物(C)及光聚合起始劑(D)的合計(100質量%)當中的1~12質量%,且以3~10質量%為佳。光聚合起始劑(D)的含有量若為1質量%以上,則無須進行加熱等操作,即可輕易得到硬化物。光聚合起始劑(D)的含有量若為12質量%以下,則可均勻混合,故殘留於硬化物的光聚合起始劑(D)將變少,可抑制硬化物之物性的降低。
光硬化性組成物除了化合物(A)~(C)、及光聚合起始劑(D)以外,更可含有含氟界面活性劑(E)。
含氟界面活性劑(E)係使硬化物的脫模性提高的成分。
含氟界面活性劑(E)係以含氟界面活性劑(E)的全元素中(100質量%),氟含有量為10~70質量%的含氟界面活性劑為佳,且以氟含有量為10~40質量%的含氟界面活性劑為較佳。含氟界面活性劑可為水溶性亦可為脂溶性,就光硬化性組成物的相容性及硬化物的分散性的觀點來看,係以脂溶性為佳。
含氟界面活性劑(E)係以陰離子性含氟界面活性劑、陽離子性含氟界面活性劑、兩性含氟界面活性劑、或非離子性含氟界面活性劑為佳,且就光硬化性組成物的相容性及硬化物的分散性的觀點來看,係以非離子性含氟界面活性劑為較佳。
陰離子性含氟界面活性劑係以多氟烷基羧酸鹽、多氟烷基磷酸酯、或多氟烷基磺酸鹽為佳。
陰離子性含氟界面活性劑的具體例可舉:Surflon S-111(商品名、AGC Seimichemical社製)、Fluorad FC-143(商品名、住友3M社製)、Megaface F-120(商品名、DIC社製)等。
陽離子性含氟界面活性劑係以多氟烷基羧酸的三甲銨鹽或多氟烷基磺酸醯胺的三甲銨鹽為佳。
陽離子性含氟界面活性劑的具體例可舉:Surflon S-121(商品名、AGC Seimichemical社製)、Fluorad FC-134(商品名、住友3M社製)、Megaface F-150(商品名、DIC社製)等。
兩性含氟界面活性劑係以多氟烷基甜菜鹼為佳。
兩性含氟界面活性劑的具體例可舉:Surflon S-132(商品名、AGC Seimichemical社製)、Fluorad FX-172(商品名、住友3M社製)、Megaface F-120(商品名、DIC社製)等。
非離子性含氟界面活性劑係以多氟烷基氧化胺或多氟烷基-環氧烷加成物為佳。
非離子性含氟界面活性劑的具體例可舉:Surflon S-145(商品名、AGC Seimichemical社製)、Surflon S-393(商品名、AGC Seimichemical社製)、Surflon KH-20(商品名、AGC Seimichemical社製)、Surflon KH-40(商品名、AGC Seimichemical社製)、Fluorad FC-170(商品名、住友3M社製)、Fluorad FC-430(商品名、住友3M社製)、Megaface F-141(商品名、DIC社製)等。
含氟界面活性劑(E)可使用單獨1種,亦可合併2種以上使用。
含氟界面活性劑(E)的含有量相對於化合物(A)、化合物(B)、化合物(C)及光聚合起始劑(D)的合計100質量份,係以0.01~3質量份為佳,且以0.1~1質量份為較佳。含氟界面活性劑(E)的含有量若為0.01質量份以上,則脫模性會提高。含氟界面活性劑(E)的含有量若為3質量份以下,則可抑制光硬化性組成物的硬化阻礙,又,可抑制硬化物的相分離。
光硬化性組成物除了化合物(A)~(C)、及光聚合起始劑(D)、含氟界面活性劑(E)以外,亦可含有其他的添加劑(F)。
添加劑(F)可舉:具有碳-碳不飽和雙鍵的化合物(惟,化合物(A)~(C)除外)、光敏劑、聚合物、金屬氧化物微粒子、碳化合物、金屬微粒子、其他有機化合物等。
光敏劑可舉:正丁胺、二正丁胺、三正丁膦、烯丙硫脲、s-苯甲基異硫脲-對甲苯亞磺酸酯、三乙胺、甲基丙烯酸二乙胺乙酯、三伸四乙胺、4,4’-雙(二烷胺)二苯基酮等胺化合物。
聚合物可舉:含氟聚合物、聚苯乙烯、聚噻吩、聚酯低聚物、聚碳酸酯、聚(甲基)丙烯酸酯等。
金屬氧化物微粒子可舉:氧化鈦、氧化矽披覆氧化鈦、氧化鋯、氧化鋅、氧化矽、氧化鋁、氧化鐵等。
碳化合物可舉:奈米碳管、富勒烯(fullerene)、鑽石、DLC等。
金屬微粒子可舉:銅、鉑等。
其他有機化合物可舉:紫質、金屬紫質(metalloporphyrin)等。
添加劑(F)的總量宜為光硬化性組成物(100質量%)中的20質量%以下。添加劑(F)的總量若為20質量%以下,則可均勻混合光硬化性組成物,而可得到均質的光硬化性組成物。
以上說明的本發明之光硬化性組成物中,由於含有化合物(A),故可得到於波長589nm下的折射率為1.54以上的光硬化性組成物之硬化物。又,由於含有化合物(B),故可得到脫模性佳的硬化物。
此外,由於含有化合物(C),故化合物(A)與化合物(B)的相容性佳,其結果,會更提高硬化物的脫模性及機械性強度。
本發明之表面具有微細圖案之成形體的製造方法具有下述(1)~(3)之步驟。
(1)使本發明之光硬化性組成物與模具之具有該翻轉圖案的表面接觸,該模具係在表面具有前述微細圖案之翻轉圖案。
(2)在使光硬化性組成物接觸模具之表面的狀態下,對光硬化性組成物照射光,使光硬化性組成物硬化成硬化物。
(3)將模具自硬化物分離,而得到其表面具有微細圖案之成形體。
本發明之表面具有微細圖案之成形體的製造方法,更具體而言,可舉下述(a)~(c)之方法。
(a)之方法:
具有下述步驟(a-1)~(a-4)的方法。
(a-1)如第1圖所示,將光硬化性組成物20配置於基板30之表面。
(a-2)如第1圖所示,令模具10按壓光硬化性組成物20,使該模具10的翻轉圖案12接觸光硬化性組成物20。
(a-3)在模具10按壓光硬化性組成物20的狀態下,對光硬化性組成物20照射光,使光硬化性組成物20硬化成硬化物。
(a-4)將模具10或將基板30及模具10自硬化物分離,而得到其表面具有微細圖案之成形體。
(b)之方法:
具有下述步驟(b-1)~(b-4)的方法。
(b-1)如第2圖所示,將光硬化性組成物20配置於模具10的翻轉圖案12之表面。
(b-2)如第2圖所示,令基板30按壓模具10之表面的光硬化性組成物20。
(b-3)在基板30按壓光硬化性組成物20的狀態下,對光硬化性組成物20照射光,使光硬化性組成物20硬化成硬化物。
(b-4)將模具10或將基板30及模具10自硬化物分離,而得到其表面具有微細圖案之成形體。
(c)之方法:
具有下述步驟(c-1)~(c-4)的方法。
(c-1)如第1圖所示,令基板30與模具10接近或接觸,使模具10的翻轉圖案12成為在基板30側。
(c-2)如第1圖所示,將光硬化性組成物20填充於基板30與模具10之間。
(c-3)在基板30與模具10接近或接觸的狀態下,對光硬化性組成物20照射光,使光硬化性組成物20硬化成硬化物。
(c-4)將模具10或將基板30及模具10自硬化物分離,而得到其表面具有微細圖案之成形體。
基板可舉:無機材料製基板或有機材料製基板。
無機材料製基板可舉:矽晶圓、玻璃、石英玻璃、金屬(鋁、鎳、銅等)、金屬氧化物(氧化鋁等)、氮化矽、氮化鋁、鈮酸鋰(lithium niobate)等。
有機材料製基板可舉:氟樹脂、矽氧樹脂、丙烯酸樹脂、聚碳酸酯、聚酯(聚對苯二甲酸乙二酯等)、聚醯亞胺、聚丙烯、聚乙烯、尼龍樹脂(nylon resin)、聚苯硫醚(polyphenylene sulfide)、環狀聚烯烴等。
就與光硬化性組成物之密接性佳的觀點來看,基板可使用進行過表面處理的基板。表面處理可舉:底漆塗佈處理、臭氧處理、電漿蝕刻處理等。使用在底漆塗佈處理的底漆可舉:矽烷偶合劑、矽氮烷(silazane)等。
模具可舉:非透光材料製模具或透光材料製模具。
模具用之非透光材料可舉:矽晶圓、鎳、銅、不銹鋼、鈦、SiC、雲母等。
模具用之透光材料可舉:石英、玻璃、聚二甲基矽氧烷、環狀聚烯烴、聚碳酸酯、聚對苯二甲酸乙二酯、透明氟樹脂等。
基板及模具中之至少一者係為一種可透射光線達40%以上的材料,該光線係具有可令光聚合起始劑(D)起作用之波長者。
模具在表面具有翻轉圖案。翻轉圖案係對應成形體之表面之微細圖案的翻轉圖案。
翻轉圖案具有微細的凸部及/或凹部。
凸部可舉:延伸於模具之表面的長條狀凸條、散佈於表面的突起等。
凹部可舉:延伸於模具之表面的長條狀槽、散佈於表面的孔等。
凸條或槽的形狀可舉:直線、曲線、彎曲形狀等。凸條或槽亦可多數平行存在而構成條紋狀。
凸條或槽的與長度方向垂直之方向的截面形狀可舉:長方形、梯形、三角形、半圓形等。
突起或孔的形狀可舉:三角柱、四角柱、六角柱、圓柱、三角錐、四角錐、六角錐、圓錐、半球、多面體等。
凸條或槽的寬度,以平均計係以50nm~500μm為佳,且以70nm~300μm為較佳。凸條的寬度意指,與長度方向垂直之方向的截面中的底邊長度。槽的寬度意指,與長度方向垂直之方向的截面中的上邊長度。
突起或孔的寬度,以平均計係以50nm~500μm為佳,且以70nm~300μm為較佳。當底面為細長時,突起的寬度意指,與長度方向垂直之方向的截面中的底邊長度;並非如此時,則意指突起之底面中的最大長度。當開口部為細長時,孔的寬度意指,與長度方向垂直之方向的截面中的上邊長度;並非如此時,則意指孔之開口部中的最大長度。
凸條的高度,以平均計係以50nm~500μm為佳,且以70nm~300μm為較佳。
凹條的深度,以平均計係以50nm~500μm為佳,且以70nm~300μm為較佳。
翻轉圖案密集的區域中,鄰接之凸部(或凹部)間的間隔,以平均計係以50nm~500μm為佳,且以70nm~300μm為較佳。鄰接之凸部間的間隔意指,從凸部之截面的底邊終端到鄰接之凸部之截面的底邊始端的距離。鄰接之凹部間的間隔意指,從凹部之截面的上邊終端到鄰接之凹部之截面的上邊始端的距離。
凸部的最小尺寸係以50nm~500μm為佳,且以70nm~300μm為較佳,特別係以70nm~150μm為最佳。凸部的最小尺寸意指,凸部的寬度、長度及高度當中最小的尺寸。
凹部的最小尺寸係以50nm~500μm為佳,且以70nm~300μm為較佳,特別係以70nm~150μm為最佳。凹部的最小尺寸意指,凹部的寬度、長度及深度當中最小的尺寸。
步驟(a-1):
光硬化性組成物的配置方法可舉:噴墨法、灌模法(potting method)、旋轉式塗佈法、滾筒式塗佈法、鑄塗法、浸塗法、模壓口塗佈法、蘭幕爾-布羅吉法(Langmuir-Blodgett method)、真空蒸鍍法等。
光硬化性組成物可配置於基板之全面,亦可配置於基板表面之一部分。
步驟(a-2):
令模具按壓光硬化性組成物時的加壓力(計示壓)係以大於0至10MPa以下為佳,且以0.1MPa~5MPa為較佳。令模具按壓光硬化性組成物時的溫度係以0~100℃為佳,且以10~60℃為較佳。
步驟(b-1):
光硬化性組成物的配置方法可舉:噴墨法、灌模法、旋轉式塗佈法、滾筒式塗佈法、鑄塗法、浸塗法、模壓口塗佈法、蘭幕爾-布羅吉法、真空蒸鍍法等。
光硬化性組成物可配置於模具的翻轉圖案之全面,亦可配置於翻轉圖案之一部分,且係以配置於翻轉圖案之全面為佳。
步驟(b-2):
令基板按壓光硬化性組成物時的加壓力(計示壓)係以大於0至10MPa以下為佳,且以0.1MPa~5MPa為較佳。令基板按壓光硬化性組成物時的溫度係以0~100℃為佳,且以10~60℃為較佳。
步驟(c-2):
將光硬化性組成物填充於基板與模具之間的方法可舉,藉由毛細現象將光硬化性組成物吸引至空隙的方法。
填充光硬化性組成物時的溫度係以0~100℃為佳,且以10~60℃為較佳。
步驟(a-3)、(b-3)、及(c-3):
照射光的方法可舉:使用透光材料製模具從該模具側照射光的方法、使用透光材料製基板從該基板側照射光的方法等。光的波長係以200~500nm為佳,且以250~400nm為較佳。照射光時,亦可將光硬化性組成物加熱來促進硬化。
照射光時的溫度係以0~100℃為佳,且以10~60℃為較佳。
步驟(a-4)、(b-4)、及(c-4):
將模具或將基板及模具自硬化物分離時的溫度係以0~100℃為佳,且以10~60℃為較佳。
將基板及模具自硬化物分離時,如第3圖所示,可得到僅由具有轉印了模具之翻轉圖案之表面的硬化物42所構成的表面具有微細圖案44之成形體40。
僅將模具自硬化物分離時,如第4圖所示,可得到由具有轉印了模具之翻轉圖案之表面的硬化物42及基板30所構成的表面具有微細圖案44之成形體40(積層體)。
表面具有微細圖案之成形體可舉下述物品。
光學元件:微透鏡陣列、光波導元件、光開關元件(柵極偏光元件、波長板等)、夫瑞奈波帶片(Fresenel zone plate)元件、二元元件、炫耀元件(blazed element)、光子晶體等。
防反射構件:AR(抗反射)塗佈構件等。
晶片類:生物晶片、μ-TAS(微型全分析系統)用晶片、微型晶片等。
其他:紀錄媒體、顯示器材料、觸媒之受載體、濾器、感測器構件、半導體裝置之製造所使用的光阻、奈米壓模等的子模(daughter mold)等。
作為光阻使用時,可藉由將具有該微細圖案之成形體作為光罩來蝕刻基板,而在基板形成微細圖案。
以上說明的本發明之表面具有微細圖案之成形體的製造方法中,由於使用可得到脫膜性及高折射率兩者兼具之硬化物的本發明之光硬化性組成物,故可製造高折射率之成形體,該成形體係表面具有精密地轉印了模具之翻轉圖案的微細圖案者。
以下舉出實施例來說明本發明,但本發明不受限於該等實施例。
例1~6、15、及16為實施例,例7~14為比較例。
光硬化性組成物的折射率係如下述般地求出。
對光硬化性組成物照射來自高壓水銀燈(在1.5~2.0kHz中,於254nm、315nm、及365nm具有主波長的光源)的光15秒後,得到硬化物。
針對該硬化物,使用阿貝折射率測定裝置(ATAGO社製、2T型),在23℃下測定該硬化物於波長589nm下的折射率。
光硬化性組成物的感度係如下述般地求出。
以旋轉式塗佈法將光硬化性組成物塗膜,使其厚度成為約1.5μm,然後照射來自高壓水銀燈(在1.5~2.0kHz中,於254nm、315nm、及365nm具有主波長的光源)的光後,求出直到完全硬化為止的累計光量,並令其為感度。
光硬化性組成物是否完全硬化,係測定IR光譜,根據丙烯酸部分的烯烴有無吸收來判斷。累計光量為1000mJ/cm2
以下的值時,判斷感度為良好。
光硬化性組成物在25℃下的黏度,係使用以標準液(JS50(在25℃下為33.17mPa.S))校正完成之黏度計(東機產業社製、TV-20)進行測定。
硬化物的對水之接觸角係如下述般地測定。
對光硬化性組成物照射來自高壓水銀燈(在1.5~2.0kHz中,於254nm、315nm、及365nm具有主波長的光源)的光15秒後,得到硬化物。
針對該硬化物,使用接觸角計(協和界面科學社製、CA-X150型),依據JISR3257使4μL的水滴在硬化物之表面上來測定。
對水之接觸角會成為硬化物之脫模性的標準。接觸角為75度以上時,判斷脫模性為良好。
化合物(A71):大阪Gas Chemical社製、商品名:OGSOL EA-F5003;9,9-雙(4-羥苯)茀環氧乙烷改質二丙烯酸酯;於波長589nm下的折射率:1.583。
化合物(B11):Aldrich社製、3,3,4,4,5,5,6,6,7,7,8,8,8-十三氟丙烯酸辛酯。
CH2
=CHCOOCH2
CH2
(CF2
)6
F………(B11)
化合物(B21):1,1,2,3,3-五氟-4-三氟甲基-4-羥-1,6-庚二烯。
CF2
=CFCF2
C(CF3
)(OH)CH2
CH=CH2
………(B21)
化合物(B21)之合成
將CF2
ClCFClCF2
C(O)CF3
108g及脫水四氫呋喃500mL倒入2L的玻璃製反應器後,冷卻至0℃。在氮環境下,花大約5.5小時將另外以脫水四氫呋喃200mL稀釋2M的CH2
=CHCH2
MgCl之四氫呋喃溶液200mL而成者滴入至此。滴入結束後,在0℃下攪拌30分鐘,並在室溫下攪拌17小時後,滴入2N鹽酸200mL。接著,加入水200mL及二乙醚300mL,並進行分液,即得到作為有機層之二乙醚層。以硫酸鎂乾燥有機層後,進行過濾,即得到粗液。以蒸發器濃縮粗液,接著進行減壓蒸餾,即得到85g的CF2
ClCFClCF2
C(CF3
)(OH)CH2
CH=CH2
(餾出溫度:60~66℃/0.7kPa)。
接著,將鋅81g及二氧陸圜(dioxane)170mL倒入500mL的玻璃製反應器,並以碘進行鋅的活化。然後,加熱至100℃,並花1.5小時滴入以二氧陸圜50mL稀釋前述合成之CF2
ClCFClCF2
C(CF3
)(OH)CH2
CH=CH2
84g而成者。滴入結束後,在100℃下攪拌40小時。過濾反應液,並以少量的二氧陸圜來洗淨。將濾液減壓蒸餾,即得到30g的CF2
=CFCF2
C(CF3
)(OH)CH2
CH=CH2
(餾出溫度:36~37℃/1kPa)。以下,揭示1
H-NMR及19
F-NMR的資料。
1
H-NMR(399.8MHz、溶劑:CDCl3
、基準:四甲基矽烷)δ(ppm):2.74(d,J=7.3,2H),3.54(boad s,1H),5.34(m,2H),5.86(m,1H)。
19
F-NMR(376.2MHz、溶劑:CDCl3
、基準:CFCl3
)δ(ppm):-75.7(m,3F),-92.2(m,1F),-106.57(m,1F),-112.6(m,2F),-183.5(m,1F)。
化合物(C1):出光興產社製、甲基丙烯酸2-甲基-2-金剛酯。
光聚合起始劑(D1):Ciba.Geigy.Specialty社製、商品名:IRGACURE651。
含氟界面活性劑(E1):非離子系含氟界面活性劑、AGC Seimichemical社製、商品名:Surflon S-393。
添加劑(F1):氧化鈦(Aldrich社製、奈米粉末)。
添加劑(F2):氧化鋯(Aldrich社製、奈米粉末)。
將化合物(A71)2.60g、化合物(B11)0.20g、及化合物(C1)1.04g加入管瓶容器(內容積6mL),接著混合光聚合起始劑(D1)0.16g,再以5.0μm的聚四氟乙烯(以下,記載為PTFE)製濾器進行過濾,即得到光硬化性組成物。該組成物的組成顯示於表1,評價結果顯示於表2。
將化合物(A71)2.60g、化合物(B11)0.20g、及化合物(C2)1.04g加入管瓶容器(內容積6mL),接著混合光聚合起始劑(D1)0.16g,再以5.0μm的PTFE製濾器進行過濾,即得到光硬化性組成物。該組成物的組成顯示於表1,評價結果顯示於表2。
將化合物(A71)3.00g、化合物(B11)0.28g、及化合物(C1)0.60g加入管瓶容器(內容積6mL),接著混合光聚合起始劑(D1)0.12g,再以5.0μm的PTFE製濾器進行過濾,即得到光硬化性組成物。該組成物的組成顯示於表1,評價結果顯示於表2。
將化合物(A71)2.60g、化合物(B11)0.20g、及化合物(C1)1.04g加入管瓶容器(內容積6mL),接著混合光聚合起始劑(D1)0.16g、及含氟界面活性劑(E1)0.004g,再以5.0μm的PTFE製濾器進行過濾,即得到光硬化性組成物。該組成物的組成顯示於表1,評價結果顯示於表2。
將化合物(A71)2.60g、化合物(B11)0.20g、及化合物(C1)1.04g加入管瓶容器(內容積6mL),接著加入光聚合起始劑(D1)0.16g、及添加劑(Fl)0.12g,以高速攪拌機進行混合,再以5.0μm的PTFE製濾器進行過濾,即得到光硬化性組成物。該組成物的組成顯示於表1,評價結果顯示於表2。
將化合物(A71)2.60g、化合物(B11)0.20g、及化合物(C1)1.04g加入管瓶容器(內容積6mL),接著加入光聚合起始劑(D1)0.16g、及添加劑(F2)0.12g,以高速攪拌機進行混合,再以5.0μm的PTFE製濾器進行過濾,即得到光硬化性組成物。該組成物的組成顯示於表1,評價結果顯示於表2。
將化合物(A71)2.20g、化合物(B11)0.40g、及化合物(C1)1.24g加入管瓶容器(內容積6mL),接著混合光聚合起始劑(D1)0.16g,再以5.0μm的PTFE製濾器進行過濾,即得到光硬化性組成物。該組成物的組成顯示於表1,評價結果顯示於表2。
將化合物(A71)3.68g、化合物(B11)0.08g、及化合物(C1)0.20g加入管瓶容器(內容積6mL),接著混合光聚合起始劑(D1)0.04g,但卻產生了層分離而無法得到均勻的組成物。
將化合物(A71)2.60g、化合物(B11)0.04g、及化合物(C1)1.20g加入管瓶容器(內容積6mL),接著混合光聚合起始劑(D1)0.16g,再以5.0μm的PTFE製濾器進行過濾,即得到光硬化性組成物。該組成物的組成顯示於表1,評價結果顯示於表2。
將化合物(A71)2.60g、化合物(B11)0.80g、及化合物(C1)0.44g加入管瓶容器(內容積6mL),接著混合光聚合起始劑(D1)0.16g,但卻產生了層分離而無法得到均勻的組成物。
將化合物(A71)3.40g、化合物(B11)0.32g、及化合物(C1)0.08g加入管瓶容器(內容積6mL),接著混合光聚合起始劑(D1)0.20g,但卻產生了層分離而無法得到均勻的組成物。
將化合物(A71)2.44g、化合物(B11)0.08g、及化合物(C1)1.44g加入管瓶容器(內容積6mL),接著混合光聚合起始劑(D1)0.04g,再以5.0μm的PTFE製濾器進行過濾,即得到光硬化性組成物。該組成物的組成顯示於表1,評價結果顯示於表2。
將化合物(A71)2.60g、化合物(B11)0.20g、及化合物(C1)1.18g加入管瓶容器(內容積6mL),接著混合光聚合起始劑(D1)0.02g,再以5.0μm的PTFE製濾器進行過濾,即得到光硬化性組成物。該組成物的組成顯示於表1,評價結果顯示於表2。
將化合物(A71)2.52g、化合物(B11)0.20g、及化合物(C1)0.68g加入管瓶容器(內容積6mL),接著混合光聚合起始劑(D1)0.60g,但光聚合起始劑(D1)沒有完全溶解,無法得到均勻的組成物。
將化合物(A71)2.60g、化合物(B21)0.20g、及化合物(C1)1.04g加入管瓶容器(內容積6mL),接著混合光聚合起始劑(D1)0.16g,再以5.0μm的PTFE製濾器進行過濾,即得到光硬化性組成物。該組成物的組成顯示於表1,評價結果顯示於表2。
惟,表1的「-」意指,未使用含氟界面活性劑(E)及/或添加劑(F),表2的「-」意指,未評價或無法評價各物性。
在25℃下,將例1的光硬化性組成物滴1滴到矽晶圓上,得到均勻地塗佈有該組成物的矽晶圓。令表面具有寬800nm、深180nm、長10μm之凹部的石英製模具按壓矽晶圓上的光硬化性組成物,並以此狀態直接以0.5MPa(計示壓)加壓。
接著,在25℃下,從模具側對光硬化性組成物照射來自高壓水銀燈(在1.5~2.0kHz中,於254nm、315nm、及365nm具有主波長的光源)的光15秒,即得到光硬化性組成物之硬化物。在25℃下,將模具自矽晶圓分離,即得到矽晶圓之表面形成有硬化物的成形體,該硬化物係於其表面具有模具凹部翻轉後的凸部者。該凸部自底面到頂面的高度為178~180nm。
以本發明之製造方法所製得的表面具有微細圖案之成形體,作為微透鏡陣列、光波導元件、光開關元件(柵極偏光元件、波長板等)、夫瑞奈波帶片元件、二元元件、炫耀元件、光子晶體等光學元件或防反射構件;生產用複印模等是有用的。
另外,在此沿用2008年5月29日申請的日本專利申請案2008-140764號的專利說明書、申請專利範圍、圖式及發明摘要的所有內容,作為本發明之專利說明書的揭示,納入本發明。
10...模具
12...翻轉圖案
20...光硬化性組成物
30...基板
40...成形體
42...硬化物
44...微細圖案
第1圖係顯示表面具有微細圖案之成形體的製造方法之一例的截面圖。
第2圖係顯示表面具有微細圖案之成形體的製造方法之另一例的截面圖。
第3圖係顯示表面具有微細圖案之成形體之一例的截面圖。
第4圖係顯示表面具有微細圖案之成形體之另一例的截面圖。
10...模具
12...翻轉圖案
20...光硬化性組成物
30...基板
Claims (10)
- 一種光硬化性組成物,其特徵在於包含有:化合物(A),係硬化前於波長589nm下的折射率為1.55以上之化合物,且係具有2個以上苯環、2個以上(甲基)丙烯醯氧基並且2個以上苯環可形成稠環的芳香族化合物;化合物(B),係具有氟原子,且具有1個以上碳-碳不飽和雙鍵者(惟,化合物(A)除外);化合物(C),係具有1個(甲基)丙烯醯氧基者(惟,化合物(B)除外);及光聚合起始劑(D),且,化合物(A)、化合物(B)、化合物(C)及光聚合起始劑(D)的合計(100質量%)中,化合物(A)為61~90質量%、化合物(B)為2~15質量%、化合物(C)為5~35質量%、光聚合起始劑(D)為1~12質量%。
- 如申請專利範圍第1項之光硬化性組成物,其更含有含氟界面活性劑(E)。
- 如申請專利範圍第1或2項之光硬化性組成物,其實質上不含溶劑。
- 如申請專利範圍第1或2項之光硬化性組成物,其中,硬化後於波長589nm下的折射率為1.54以上。
- 一種表面具有微細圖案之成形體的製造方法,其特徵在於包含有以下步驟:使申請專利範圍第1~4項中任一項之光硬化性組成 物與模具之具有該翻轉圖案的表面接觸,該模具係在表面具有前述微細圖案之翻轉圖案;在使前述光硬化性組成物接觸前述模具之表面的狀態下,對前述光硬化性組成物照射光,使前述光硬化性組成物硬化成硬化物;及將前述模具自前述硬化物分離,而得到其表面具有微細圖案之成形體。
- 一種表面具有微細圖案之成形體的製造方法,其特徵在於包含有以下步驟:將申請專利範圍第1~4項中任一項之光硬化性組成物配置於基板之表面;令表面具有前述微細圖案之翻轉圖案的模具按壓前述光硬化性組成物,使該模具的翻轉圖案接觸前述光硬化性組成物;在前述模具按壓前述光硬化性組成物的狀態下,對前述光硬化性組成物照射光,使前述光硬化性組成物硬化成硬化物;及將前述模具或將前述基板及前述模具自前述硬化物分離,而得到其表面具有微細圖案之成形體。
- 一種表面具有微細圖案之成形體的製造方法,其特徵在於包含有以下步驟:將申請專利範圍第1~4項中任一項之光硬化性組成物配置於模具之具有該翻轉圖案的表面上,該模具係在表面具有前述微細圖案之翻轉圖案; 令基板按壓前述光硬化性組成物;在前述基板按壓前述光硬化性組成物的狀態下,對前述光硬化性組成物照射光,使前述光硬化性組成物硬化成硬化物;及將前述模具或將前述基板及前述模具自前述硬化物分離,而得到其表面具有微細圖案之成形體。
- 一種表面具有微細圖案之成形體的製造方法,其特徵在於包含有以下步驟:令基板與表面具有前述微細圖案之翻轉圖案的模具接近或接觸,使該模具的翻轉圖案成為在前述基板側;將申請專利範圍第1~4項中任一項之光硬化性組成物填充於前述基板與前述模具之間;在前述基板與前述模具接近或接觸的狀態下,對前述光硬化性組成物照射光,使前述光硬化性組成物硬化成硬化物;及將前述模具或將前述基板及前述模具自前述硬化物分離,而得到其表面具有微細圖案之成形體。
- 如申請專利範圍第5~8項中任一項之表面具有微細圖案之成形體的製造方法,其中,將光硬化性組成物硬化時使用的光之波長為200~500nm。
- 一種成形體,係藉由申請專利範圍第5~9項中任一項之表面具有微細圖案之成形體的製造方法所製得者。
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Cited By (4)
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---|---|---|---|---|
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US11780819B2 (en) | 2019-11-27 | 2023-10-10 | Meta Platforms Technologies, Llc | Aromatic substituted alkane-core monomers and polymers thereof for volume Bragg gratings |
US11879024B1 (en) | 2020-07-14 | 2024-01-23 | Meta Platforms Technologies, Llc | Soft mold formulations for surface relief grating fabrication with imprinting lithography |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007116972A1 (ja) * | 2006-04-07 | 2007-10-18 | Asahi Glass Company, Limited | ワイヤグリッド型偏光子およびその製造方法 |
CN101809046A (zh) * | 2007-09-28 | 2010-08-18 | 旭硝子株式会社 | 光固化性组合物、精细图案形成体的制造方法和光学元件 |
WO2009123290A1 (ja) * | 2008-04-03 | 2009-10-08 | 旭硝子株式会社 | ワイヤグリッド型偏光子およびその製造方法 |
EP2264492B1 (en) * | 2008-04-08 | 2014-07-02 | Asahi Glass Company, Limited | Manufacturing method for a wire grid polarizer |
KR20110031440A (ko) * | 2008-07-10 | 2011-03-28 | 아사히 가라스 가부시키가이샤 | 와이어 그리드형 편광자 및 그 제조 방법 |
CN102239197A (zh) * | 2008-12-05 | 2011-11-09 | 旭硝子株式会社 | 光固化性组合物及表面具有微细图案的成形体的制造方法 |
WO2010146983A1 (ja) * | 2009-06-19 | 2010-12-23 | 日産化学工業株式会社 | 低誘電率インプリント材料 |
TWI510355B (zh) * | 2010-01-29 | 2015-12-01 | Aji Co Ltd | 造形方法 |
JP5693925B2 (ja) * | 2010-02-04 | 2015-04-01 | 丸善石油化学株式会社 | 樹脂型、成形体、及び成形体の製造方法 |
TWI428225B (zh) * | 2010-03-10 | 2014-03-01 | Asahi Kasei E Materials Corp | Resin mold |
JP2012185477A (ja) * | 2011-02-15 | 2012-09-27 | Panasonic Corp | 複合光学素子用樹脂組成物、複合光学素子、ならびに複合光学素子を備えた撮像装置および光学式記録再生装置 |
JP5671377B2 (ja) * | 2011-03-07 | 2015-02-18 | 富士フイルム株式会社 | インプリント用硬化性組成物、パターン形成方法およびパターン |
TWI461285B (zh) * | 2011-05-18 | 2014-11-21 | Choung Lii Chao | 微結構基板製造方法 |
JP5895757B2 (ja) * | 2011-08-23 | 2016-03-30 | Jsr株式会社 | 感光性組成物、成形物の製造方法、成形物および半導体装置 |
JP5895427B2 (ja) * | 2011-09-29 | 2016-03-30 | 凸版印刷株式会社 | 低反射構造を成型するための原版の製造方法 |
JP5959865B2 (ja) | 2012-02-09 | 2016-08-02 | キヤノン株式会社 | 光硬化物及びその製造方法 |
WO2013129345A1 (ja) * | 2012-02-29 | 2013-09-06 | 出光興産株式会社 | (メタ)アクリレート系組成物、樹脂、及び成形体 |
JP5952040B2 (ja) * | 2012-03-15 | 2016-07-13 | 東京応化工業株式会社 | 光インプリント用の膜形成組成物及び光学部材の製造方法 |
KR20150003158A (ko) * | 2012-04-09 | 2015-01-08 | 아사히 가라스 가부시키가이샤 | 미세 패턴을 표면에 갖는 물품의 제조 방법 |
WO2013154112A1 (ja) | 2012-04-10 | 2013-10-17 | ダイキン工業株式会社 | インプリント用樹脂モールド材料組成物 |
JP2016072453A (ja) * | 2014-09-30 | 2016-05-09 | 株式会社トクヤマ | パターンの形成方法 |
WO2018194262A1 (ko) * | 2017-04-17 | 2018-10-25 | 삼성에스디아이 주식회사 | 명암비 개선 광학 필름, 이를 포함하는 편광판 및 이를 포함하는 액정표시장치 |
US11360385B1 (en) * | 2018-07-24 | 2022-06-14 | Magic Leap, Inc. | Eyepiece assembly adhesion using a zero residual layer region |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004051790A (ja) * | 2002-07-19 | 2004-02-19 | Mitsubishi Chemicals Corp | 重合性組成物及びその硬化物 |
WO2006114958A1 (ja) * | 2005-04-21 | 2006-11-02 | Asahi Glass Company, Limited | 光硬化性組成物、微細パターン形成体およびその製造方法 |
WO2007071497A1 (en) * | 2005-12-20 | 2007-06-28 | Ciba Holding Inc. | Oxime ester photoinitiators |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1997000276A1 (en) * | 1995-06-14 | 1997-01-03 | Ucb, S.A. | Active energy ray-curable resin compositions, a cured article and an optical lens obtained therefrom, and novel (meth)acrylate compounds therefor |
DE19706515A1 (de) * | 1997-02-19 | 1998-08-20 | Inst Neue Mat Gemein Gmbh | Hydroxylgruppen-arme organisch/anorganische Komposite, Verfahren zu deren Herstellung und deren Verwendung |
US6696220B2 (en) | 2000-10-12 | 2004-02-24 | Board Of Regents, The University Of Texas System | Template for room temperature, low pressure micro-and nano-imprint lithography |
JP2004071934A (ja) | 2002-08-08 | 2004-03-04 | Kanegafuchi Chem Ind Co Ltd | 微細パターンの製造方法および転写材料 |
JP4655043B2 (ja) | 2004-11-30 | 2011-03-23 | 旭硝子株式会社 | モールド、および転写微細パターンを有する基材の製造方法 |
JP5125507B2 (ja) * | 2005-04-13 | 2013-01-23 | Jsr株式会社 | 樹脂組成物、硬化膜及び積層体 |
JP4821175B2 (ja) * | 2005-05-26 | 2011-11-24 | Jsr株式会社 | ウレタン(メタ)アクリレート、放射線硬化性組成物、及びその硬化膜 |
JP4770354B2 (ja) * | 2005-09-20 | 2011-09-14 | 日立化成工業株式会社 | 光硬化性樹脂組成物及びこれを用いたパターン形成方法 |
JP4930517B2 (ja) | 2007-02-07 | 2012-05-16 | 旭硝子株式会社 | インプリント用モールドおよびその製造方法 |
JP2009001002A (ja) | 2007-05-24 | 2009-01-08 | Univ Waseda | モールド、その製造方法および転写微細パターンを有する基材の製造方法 |
CN101679568B (zh) * | 2007-06-20 | 2012-07-04 | 旭硝子株式会社 | 光固化性组合物及表面具有精细图案的成形体的制造方法 |
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004051790A (ja) * | 2002-07-19 | 2004-02-19 | Mitsubishi Chemicals Corp | 重合性組成物及びその硬化物 |
WO2006114958A1 (ja) * | 2005-04-21 | 2006-11-02 | Asahi Glass Company, Limited | 光硬化性組成物、微細パターン形成体およびその製造方法 |
WO2007071497A1 (en) * | 2005-12-20 | 2007-06-28 | Ciba Holding Inc. | Oxime ester photoinitiators |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11718580B2 (en) | 2019-05-08 | 2023-08-08 | Meta Platforms Technologies, Llc | Fluorene derivatized monomers and polymers for volume Bragg gratings |
US20210155585A1 (en) * | 2019-11-27 | 2021-05-27 | Facebook Technologies, Llc | Anthraquinone derivatized monomers and polymers for volume bragg gratings |
US11780819B2 (en) | 2019-11-27 | 2023-10-10 | Meta Platforms Technologies, Llc | Aromatic substituted alkane-core monomers and polymers thereof for volume Bragg gratings |
US11879024B1 (en) | 2020-07-14 | 2024-01-23 | Meta Platforms Technologies, Llc | Soft mold formulations for surface relief grating fabrication with imprinting lithography |
Also Published As
Publication number | Publication date |
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KR101652680B1 (ko) | 2016-08-31 |
US20110020617A1 (en) | 2011-01-27 |
KR101702278B1 (ko) | 2017-02-03 |
TW201002743A (en) | 2010-01-16 |
CN102027026A (zh) | 2011-04-20 |
EP2289955A4 (en) | 2011-10-05 |
JPWO2009145061A1 (ja) | 2011-10-06 |
KR20110021727A (ko) | 2011-03-04 |
CN102027026B (zh) | 2013-06-19 |
EP2289955B1 (en) | 2014-10-15 |
KR20160105911A (ko) | 2016-09-07 |
EP2289955A1 (en) | 2011-03-02 |
US8258201B2 (en) | 2012-09-04 |
WO2009145061A1 (ja) | 2009-12-03 |
JP5617632B2 (ja) | 2014-11-05 |
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