TWI382451B - 製造半導體鍍層基板之方法 - Google Patents
製造半導體鍍層基板之方法 Download PDFInfo
- Publication number
- TWI382451B TWI382451B TW093141280A TW93141280A TWI382451B TW I382451 B TWI382451 B TW I382451B TW 093141280 A TW093141280 A TW 093141280A TW 93141280 A TW93141280 A TW 93141280A TW I382451 B TWI382451 B TW I382451B
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- plasma
- plating
- coating
- roughened
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C4/00—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge
- C23C4/02—Pretreatment of the material to be coated, e.g. for coating on selected surface areas
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C4/00—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge
- C23C4/04—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge characterised by the coating material
- C23C4/10—Oxides, borides, carbides, nitrides or silicides; Mixtures thereof
- C23C4/11—Oxides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C4/00—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge
- C23C4/12—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge characterised by the method of spraying
- C23C4/134—Plasma spraying
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P10/00—Bonding of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Drying Of Semiconductors (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Inorganic Compounds Of Heavy Metals (AREA)
- Oxygen, Ozone, And Oxides In General (AREA)
- Coating By Spraying Or Casting (AREA)
- ing And Chemical Polishing (AREA)
- Chemically Coating (AREA)
- Other Surface Treatments For Metallic Materials (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/807,716 US20050215059A1 (en) | 2004-03-24 | 2004-03-24 | Process for producing semi-conductor coated substrate |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200535926A TW200535926A (en) | 2005-11-01 |
| TWI382451B true TWI382451B (zh) | 2013-01-11 |
Family
ID=34862056
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW093141280A TWI382451B (zh) | 2004-03-24 | 2004-12-30 | 製造半導體鍍層基板之方法 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US20050215059A1 (https=) |
| EP (1) | EP1580292A1 (https=) |
| JP (1) | JP4785834B2 (https=) |
| KR (1) | KR20050094766A (https=) |
| CN (1) | CN101304815A (https=) |
| IL (1) | IL178084A (https=) |
| TW (1) | TWI382451B (https=) |
| WO (1) | WO2005098930A2 (https=) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8067067B2 (en) * | 2002-02-14 | 2011-11-29 | Applied Materials, Inc. | Clean, dense yttrium oxide coating protecting semiconductor processing apparatus |
| US10242888B2 (en) | 2007-04-27 | 2019-03-26 | Applied Materials, Inc. | Semiconductor processing apparatus with a ceramic-comprising surface which exhibits fracture toughness and halogen plasma resistance |
| US10622194B2 (en) | 2007-04-27 | 2020-04-14 | Applied Materials, Inc. | Bulk sintered solid solution ceramic which exhibits fracture toughness and halogen plasma resistance |
| EP2187843B1 (de) * | 2007-09-13 | 2015-10-07 | DERU GmbH | Endoprothesenkomponente |
| US9090046B2 (en) * | 2012-04-16 | 2015-07-28 | Applied Materials, Inc. | Ceramic coated article and process for applying ceramic coating |
| CN109112464A (zh) * | 2018-09-20 | 2019-01-01 | 安徽富乐德科技发展有限公司 | 一种半导体清洗腔陶瓷溶射层的制备方法 |
| CN114381683B (zh) * | 2020-10-20 | 2024-04-12 | 中国兵器工业第五九研究所 | 基体防护涂层的制备方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020094686A1 (en) * | 1999-06-28 | 2002-07-18 | Gorczyca Thomas Bert | Semiconductor processing article |
| US20030129772A1 (en) * | 2001-12-07 | 2003-07-10 | Komico Co., Ltd | Method of fabricating and repairing ceramic components for semiconductor fabrication using plasma spray process |
Family Cites Families (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5172934A (https=) * | 1974-12-23 | 1976-06-24 | Mitsubishi Heavy Ind Ltd | |
| US4245229A (en) * | 1979-01-26 | 1981-01-13 | Exxon Research & Engineering Co. | Optical recording medium |
| US4349408A (en) * | 1981-03-26 | 1982-09-14 | Rca Corporation | Method of depositing a refractory metal on a semiconductor substrate |
| US4656730A (en) * | 1984-11-23 | 1987-04-14 | American Telephone And Telegraph Company, At&T Bell Laboratories | Method for fabricating CMOS devices |
| GB2185758B (en) * | 1985-12-28 | 1990-09-05 | Canon Kk | Method for forming deposited film |
| US5391275A (en) * | 1990-03-02 | 1995-02-21 | Applied Materials, Inc. | Method for preparing a shield to reduce particles in a physical vapor deposition chamber |
| US5202008A (en) * | 1990-03-02 | 1993-04-13 | Applied Materials, Inc. | Method for preparing a shield to reduce particles in a physical vapor deposition chamber |
| JPH0598412A (ja) * | 1991-10-07 | 1993-04-20 | Nippon Steel Corp | 被溶射材料の前処理方法 |
| FI92897C (fi) * | 1993-07-20 | 1995-01-10 | Planar International Oy Ltd | Menetelmä kerrosrakenteen valmistamiseksi elektroluminenssikomponentteja varten |
| JP3347555B2 (ja) * | 1994-12-01 | 2002-11-20 | キヤノン株式会社 | リチウム二次電池の負極の作製方法 |
| US5651797A (en) * | 1995-08-07 | 1997-07-29 | Joray Corporation | Apparatus and method for the immersion cleaning and transport of semiconductor components |
| US5788304A (en) * | 1996-05-17 | 1998-08-04 | Micron Technology, Inc. | Wafer carrier having both a rigid structure and resistance to corrosive environments |
| US5916454A (en) * | 1996-08-30 | 1999-06-29 | Lam Research Corporation | Methods and apparatus for reducing byproduct particle generation in a plasma processing chamber |
| JPH1146006A (ja) * | 1997-07-25 | 1999-02-16 | Canon Inc | 光起電力素子およびその製造方法 |
| US6087191A (en) * | 1998-01-22 | 2000-07-11 | International Business Machines Corporation | Method for repairing surface defects |
| US6221269B1 (en) * | 1999-01-19 | 2001-04-24 | International Business Machines Corporation | Method of etching molybdenum metal from substrates |
| US6504233B1 (en) * | 1999-06-28 | 2003-01-07 | General Electric Company | Semiconductor processing component |
| US6296716B1 (en) * | 1999-10-01 | 2001-10-02 | Saint-Gobain Ceramics And Plastics, Inc. | Process for cleaning ceramic articles |
| US6663914B2 (en) * | 2000-02-01 | 2003-12-16 | Trebor International | Method for adhering a resistive coating to a substrate |
| TW503449B (en) * | 2000-04-18 | 2002-09-21 | Ngk Insulators Ltd | Halogen gas plasma-resistive members and method for producing the same, laminates, and corrosion-resistant members |
| JP2002249864A (ja) * | 2000-04-18 | 2002-09-06 | Ngk Insulators Ltd | 耐ハロゲンガスプラズマ用部材およびその製造方法 |
| US6479108B2 (en) * | 2000-11-15 | 2002-11-12 | G.T. Equipment Technologies, Inc. | Protective layer for quartz crucibles used for silicon crystallization |
| US6805952B2 (en) * | 2000-12-29 | 2004-10-19 | Lam Research Corporation | Low contamination plasma chamber components and methods for making the same |
| WO2002090008A1 (fr) * | 2001-05-01 | 2002-11-14 | Center For Advanced Science And Technology Incubation, Ltd. | Procede de nettoyage d'une structure, procede anticorrosion et structure mettant en oeuvre ceux-ci |
| US6503824B1 (en) * | 2001-10-12 | 2003-01-07 | Mosel Vitelic, Inc. | Forming conductive layers on insulators by physical vapor deposition |
| JP2003212598A (ja) * | 2001-11-13 | 2003-07-30 | Tosoh Corp | 石英ガラス部品及びセラミック部品並びにそれらの製造方法 |
| US6623559B2 (en) * | 2001-12-10 | 2003-09-23 | Nanotek Instruments, Inc. | Method for the production of semiconductor quantum particles |
| US6656535B2 (en) * | 2001-12-21 | 2003-12-02 | Applied Materials, Inc | Method of fabricating a coated process chamber component |
| US6861101B1 (en) * | 2002-01-08 | 2005-03-01 | Flame Spray Industries, Inc. | Plasma spray method for applying a coating utilizing particle kinetics |
| US6632689B2 (en) * | 2002-01-30 | 2003-10-14 | Motorola, Inc. | Method for processing semiconductor wafers in an enclosure with a treated interior surface |
| US20030221702A1 (en) * | 2002-05-28 | 2003-12-04 | Peebles Henry C. | Process for cleaning and repassivating semiconductor equipment parts |
| US7402747B2 (en) * | 2003-02-18 | 2008-07-22 | Kyocera Corporation | Photoelectric conversion device and method of manufacturing the device |
-
2004
- 2004-03-24 US US10/807,716 patent/US20050215059A1/en not_active Abandoned
- 2004-12-30 TW TW093141280A patent/TWI382451B/zh not_active IP Right Cessation
-
2005
- 2005-01-17 EP EP05250218A patent/EP1580292A1/en not_active Ceased
- 2005-01-21 KR KR1020050005915A patent/KR20050094766A/ko not_active Ceased
- 2005-03-17 JP JP2007505028A patent/JP4785834B2/ja not_active Expired - Fee Related
- 2005-03-17 WO PCT/US2005/009108 patent/WO2005098930A2/en not_active Ceased
- 2005-03-17 CN CNA2005800088863A patent/CN101304815A/zh active Pending
-
2006
- 2006-09-14 IL IL178084A patent/IL178084A/en active IP Right Grant
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020094686A1 (en) * | 1999-06-28 | 2002-07-18 | Gorczyca Thomas Bert | Semiconductor processing article |
| US20030129772A1 (en) * | 2001-12-07 | 2003-07-10 | Komico Co., Ltd | Method of fabricating and repairing ceramic components for semiconductor fabrication using plasma spray process |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2005098930A2 (en) | 2005-10-20 |
| EP1580292A1 (en) | 2005-09-28 |
| TW200535926A (en) | 2005-11-01 |
| JP2007530788A (ja) | 2007-11-01 |
| JP4785834B2 (ja) | 2011-10-05 |
| US20050215059A1 (en) | 2005-09-29 |
| KR20050094766A (ko) | 2005-09-28 |
| IL178084A (en) | 2013-09-30 |
| IL178084A0 (en) | 2006-12-31 |
| CN101304815A (zh) | 2008-11-12 |
| WO2005098930A3 (en) | 2006-11-09 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MK4A | Expiration of patent term of an invention patent |