TWI323785B - Inspection fixture for printed wiring board - Google Patents

Inspection fixture for printed wiring board Download PDF

Info

Publication number
TWI323785B
TWI323785B TW095119556A TW95119556A TWI323785B TW I323785 B TWI323785 B TW I323785B TW 095119556 A TW095119556 A TW 095119556A TW 95119556 A TW95119556 A TW 95119556A TW I323785 B TWI323785 B TW I323785B
Authority
TW
Taiwan
Prior art keywords
pin
plate
hole
coil spring
probe
Prior art date
Application number
TW095119556A
Other languages
English (en)
Chinese (zh)
Other versions
TW200722759A (en
Inventor
Shinhichi Nakamura
Katsuaki Ishikawa
Hirokazu Tanaka
Original Assignee
Ohnishi Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ohnishi Electronics Co Ltd filed Critical Ohnishi Electronics Co Ltd
Publication of TW200722759A publication Critical patent/TW200722759A/zh
Application granted granted Critical
Publication of TWI323785B publication Critical patent/TWI323785B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
TW095119556A 2005-12-12 2006-06-02 Inspection fixture for printed wiring board TWI323785B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005357718A JP4448086B2 (ja) 2005-12-12 2005-12-12 プリント配線板の検査治具

Publications (2)

Publication Number Publication Date
TW200722759A TW200722759A (en) 2007-06-16
TWI323785B true TWI323785B (en) 2010-04-21

Family

ID=38165570

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095119556A TWI323785B (en) 2005-12-12 2006-06-02 Inspection fixture for printed wiring board

Country Status (4)

Country Link
JP (1) JP4448086B2 (enrdf_load_stackoverflow)
KR (1) KR100869720B1 (enrdf_load_stackoverflow)
CN (1) CN1982896B (enrdf_load_stackoverflow)
TW (1) TWI323785B (enrdf_load_stackoverflow)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009036532A (ja) * 2007-07-31 2009-02-19 Koyo Technos:Kk 検査冶具および検査装置
WO2009016746A1 (ja) * 2007-08-01 2009-02-05 Elia Co., Ltd. コンタクタ及びインターフェース組立体
JP4901811B2 (ja) * 2008-05-27 2012-03-21 ミツイ精密株式会社 電気的コネクタ、カメラレンズ及びカメラ
JP5226429B2 (ja) * 2008-08-25 2013-07-03 大西電子株式会社 プリント配線板の検査治具
KR101522723B1 (ko) * 2013-10-28 2015-06-01 김철군 반도체 테스트 소켓의 핀장치
CN105842490A (zh) * 2016-05-25 2016-08-10 国家电网公司 继电保护端子排防损害装置
US11131691B2 (en) * 2017-03-30 2021-09-28 Nhk Spring Co., Ltd. Probe holder and probe unit
KR101911496B1 (ko) * 2018-04-13 2018-12-28 황동원 반도체 디바이스 테스트 소켓장치
KR102413287B1 (ko) * 2020-10-21 2022-06-27 주식회사 오킨스전자 테스트 소켓
CN112305394B (zh) * 2020-11-06 2021-04-27 法特迪精密科技（苏州）有限公司 探针承插件及探针组件

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2532331B2 (ja) * 1992-11-09 1996-09-11 日本発条株式会社 導電性接触子
JPH07294552A (ja) * 1994-04-26 1995-11-10 Onishi Denshi Kk プリント配線板の導通検査治具
WO2000003250A1 (en) * 1998-07-10 2000-01-20 Nhk Spring Co., Ltd. Conductive contact
JP4655392B2 (ja) 2001-03-16 2011-03-23 イビデン株式会社 導通検査治具及びその製造方法
CN2502280Y (zh) * 2001-08-13 2002-07-24 吴志成 可提高测试密度的治具
JP4251855B2 (ja) * 2002-11-19 2009-04-08 株式会社ヨコオ 高周波・高速用デバイスの検査治具の製法
CN2677944Y (zh) * 2003-12-03 2005-02-09 陈嘉隆 检测电路板的治具

Also Published As

Publication number Publication date
TW200722759A (en) 2007-06-16
CN1982896A (zh) 2007-06-20
JP4448086B2 (ja) 2010-04-07
KR100869720B1 (ko) 2008-11-21
KR20070062396A (ko) 2007-06-15
CN1982896B (zh) 2012-01-11
JP2007163217A (ja) 2007-06-28

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees