TWI323785B - Inspection fixture for printed wiring board - Google Patents

Inspection fixture for printed wiring board Download PDF

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Publication number
TWI323785B
TWI323785B TW095119556A TW95119556A TWI323785B TW I323785 B TWI323785 B TW I323785B TW 095119556 A TW095119556 A TW 095119556A TW 95119556 A TW95119556 A TW 95119556A TW I323785 B TWI323785 B TW I323785B
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TW
Taiwan
Prior art keywords
pin
plate
hole
coil spring
probe
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TW095119556A
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Chinese (zh)
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TW200722759A (en
Inventor
Shinhichi Nakamura
Katsuaki Ishikawa
Hirokazu Tanaka
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Ohnishi Electronics Co Ltd
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Publication of TW200722759A publication Critical patent/TW200722759A/en
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Publication of TWI323785B publication Critical patent/TWI323785B/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Description

1323785 九、發明說明: 【發明所屬之技術領域】 本發明係有關一種印刷線路板之檢查夾具,其係用於 檢查印刷線路板之電路的短路、絕緣狀態等。 【先前技術】 作為檢查印刷電路板用的檢查夾具,已知有如第6圖 所示之構成者。該檢查夾具係具備有:插針板(pinb〇ard) 2 ;間隔板(spacer board) 4,配設於該插針板2之表面 側,保護板6,配設於該間隔板4之表面側;探針體8,與 欲檢查的印刷線路板之端子部電性連接。探針體8係裝附 於插針板2。探針體8之構成係為:外側套(sleeve) 1〇, 安裝於插針板2,·内側套12,配設於該外側套1〇的内侧; 線圈彈簧14,收容於内侧套12内的基職;以及探針插 針16,收容於内側套12内的前端侧;探針插針16的前端 侧通過形成於保護板6的引導孔18向外側突出,該突出部 利用線圈彈簧U的彈性復原力電性連接於印刷線路板的 端子部。 上述的檢查夾具’係構成為可從外側套j 〇取下内側套 ’因此’當探針插針16磨損時,藉由取下舊的内側套 12並安裝上新的,便可以將内藏排列於該内側套12的線 圈彈簧14及探針插針16換新。 然而,於該檢查夾具中,因其構成為於外側套10之斤 方向内侧配設内側套12,並於該 拙六娃園碟佐η η惻砮12之徑方向内侧 收合線圈彈肓14以及探針插針16的 了汕的緣故,而有探針體8 318170 5 1323785 •的外徑變大,而無法充分對應近年來印刷線路板的高 化的問題。 - ㈣解決上述問題’已提案了如第7圖所示的檢查夹 .,、(例如〜、、日本專利文獻i)。該檢查夹具係具備有: :下側插針板22 ;以及配設於該下侧插針板22之上侧的上 侧插針板24;於訂難針板22設物段差料裝附孔 26 ’該裝附孔26裝附有探針插針28,探針插針別的小經 突部3(M系從下側插針板22向外側突出。另外,於上側探 針板24亦設有附段差部的裝附孔32,該裝附孔犯裝附有 線圈彈簧34’與線圈彈簀34—體成型設置的引線%則從 上側探針板24導出。上述的檢查夾具,因探針插針^本 身係裝附於下側插針板22,其外徑較小,故可以提升探針 插針28的裝㈣度(換言之,縮小探針插針28之間 隔)。 [曰本專利文獻1]特開2000— 227441號公報 鲁【發明說明】 (發明所欲解決的課題) 然而’前述的檢查夾具’有著如下的問題。第^,其 :構成雖為於下側插針板22設有用以收容探針插針28的附 段差部裝附孔26,但該附段差部裝附孔26的加工並不容 易,而使檢查夾具的製作成本變為高價,尤其在裝附多數 探針插針28的型態者中,更導致成本大幅提升。第2,探 針插針28係構成為被收容於下側插針板22的附段差部裝 附孔26,因此,因磨損等而欲將探針插針28換新時,必" 318170 6 丄 JZ:)/6:) 須先將上側插針板24從下侧插針板22取下後才可更換, 導致探針插針28的更換作業變得非常繁雜。 本發明之目的係提供一種印刷線路板的檢查夾具,其 可如期望的挟持探針插針,同時也可容易的進行其更換, 更可以對應印刷線路板的高配裝化。 (解決課題的手段) 於本發明之申請專利範圍第1項所記載的印刷線路板 之心查夾具’係具備有:插針板,其含有收容孔及裝附孔; 保護板,配設於前述插針板的單面側,且含有引導孔;探 針插針’插入前述插針板的前述裝附孔,其前端部通過前 述保護板的前述引導孔向外側突出;彈簧構件,收容於前 述插針板的f述收容孔,仙於前述探針插針之基部。 〆、中月u述插針板係含有於前述裝附孔内突出的彈性 件:前述彈性挾持構件係彈性挾持前述探針插針的 卜述探針插針的基部側被引導挾持於前述插針板 同時’其前端側也被引導挾持於前述保護 扳的則述引導孔。 線路之申請專利範圍第2項所記載的印刷 :路板之檢查夾具中,前述插針板係具備有:下側插針板, 其設置有前述收容孔;一對的上 側插針板的上側,且設置有前述裝=板::設於前述下 件係由橡膠板所構成’且前述橡:二Τ挾持構 上側插針板之間。 坂係配扠於前述一對的 另外’於本發明之申請專剎 專利_第3項所記載的印刷 318170 7 1323785 .線路板之檢查央具令,設置於前述 ▲孔之内徑係實質上相等的,前述橡膠板的彈=十板的裝附 •述-對上側插針板的前述裝附 挟持部於前 許。 7 4方向内側突出些 另外,於本發明之申請專利範 鎳路板之檢查夹具中,前述彈簧構件係由線=記載的印刷 成,且引線係-體地設置於前述線圈彈簧彈簧所構 另外’於本發明之申請專利範圍第5 :路?=夹具中’前!彈簧構件係由線圈二 彈菁的前述引線之-端部形成凸緣頭f。接觸於别述線圏 更且,於本發明之申請專利 線路板之檢查夹具中,前述探針插针記f的印刷 =針本體與設置於該插針本體之端部的小裡二 = 引述插針本體與前述小徑突部之間的 圈彈箸用的彈著承受之功能,前述小:== 圈彈簧的端部内週面。 係支撐别述線 (發明效果) 板之發明之申請專利範圍第1項所記載的印刷線路 =件係彈性挾持探針插針的外週面,故可一邊容許該探 f:之軸方向的移動一邊如期望的予以挾持,即使於使 夕數個探針插針時也可以關單的構成將探針插針挟 持。另外’因當探㈣針的基部側被料挾持於 318170 8 1323785 裝附孔的同時,其前端側被引導挾持於保護板的引導孔, 故在探針插針於軸方向進行移動時也能安定的予以挾持。 另外,探針插針例如係藉由以直線狀者構成使其可以簡單 且容易的進行更換。 :另外,依據本發明之申請專利範圍第2項所記载的印 刷線路板之檢查夹具,因前述插針板係具備有··下側插針 板與-對的上側插針板,且作為彈性挾持構件的橡膠板係 配設於一對的上側插針板之間,故在使彈性挟持構件的構 成變得簡單的同時,可以確實的支樓該橡膠板。 另外,依據本發明之申請專利範圍帛3項所記载的印 刷線路板之檢查夾具,因設置於一對上側插針板的裝附孔 之内徑係實質上相等的,且橡膠板的彈性挾持部於一對上 侧插針板的裝附孔内向徑方向内側突出些許,故可以藉由 該彈性挾持部安定並彈性的挾持探針插針 ^ 板之彈性挾持部的突出量少,故即使當探針插針往 ^ 多動時橡膠板=彈性挾持部也幾乎沒有往該移動方向彈性 變形,故可以安定的支撐探針插針。 另外,依據本發明之申請專利範 刷線路板之檢查夹且,闵骚蓉姓钟〆 β載的印 且於緩團㈣^ = 簧 線圈彈簧所構成, 於線圈彈簧係一體地設置 的構成予以箝罝外^ + 现月匕將線圈彈普相關 8 ,同時也可以消除線圈彈簧盥彳I 4 2 π 電性接觸的不良。 斤育/、5丨線之間 另外,依據本發明 刷線路板之檢查夹具, 之申請專利範圍第5項所記载的印 因彈簧構件係由線圈彈簧所構成, 318170 9 且接觸於線圈彈簧的 * 、線圈彈簧與5丨線進行焊^部形成凸緣頭狀,故不需 部使線等’便可透過該凸緣頭狀之端 . 貫/、5丨線t定的電性連接。 • 更且’依據本發明3*·由上生由 .刷線路板之檢查夹星=:!專利範圍第6項所記載的印 '、因於探針插針之插針本體與小徑突 受部之功:I部且該肩部係作為線圈彈簧用的彈簧承 从卜心Γ 線圈彈簧對探針插針的接觸狀態為安定, 精此可抑制線圈彈簧的磨 磨耗等。另外,因探針插針 突部支撐線圈彈簧的端邻 工 ⑽㈣相週面,故當附加力作用時,於 線圈彈,、之端部的屈曲之發生會被抑制 圈彈簧的壽命延長。 獨綠 【實施方式】 始^ I A參』第1圖至第5圖,說明本發明的印刷線路 ^檢Μ具的最佳實施方式。第1圖係表示本發明的檢 —夾具之-種實施方式的剖面圖;第2圖係表示第!圖之 #檢查夾具之要部的擴大剖面圖;帛3圖係將第i圖之檢查 夾具中的附引線線圈彈簧擴大表示的正面圖。 — •於第1圖及第2圖中,圖示的檢查夾具102,係且備 :有:插針板104,保護板106以及間隔板1〇8。保護板咖 係配設於插針板104的單面侧(第丨圖及第2圖中的上 側),間隔板108係夾於插針板1〇4與保護板1〇6之間。這 些板104、106、108係例如用固定用螺帽及螺栓等安装固 定。又’保護板106及間隔板108係以電性絕緣材料形成。 圖示的插針板104’係具備有:下側插針板11〇;—對 318170 10 1323785 的上側插針板112、114 ’其配設於前述下側插針板丨丨〇的 單面側(第1圖及第2圖中的上面侧);線路板116,其配 '設於下側插針板110之另一面側(第1圖及第2圖中的下 -面側);這些板Π 〇、112、114、116亦以電性絕緣材料形 . 成。1323785 IX. Description of the Invention: [Technical Field] The present invention relates to an inspection jig for a printed wiring board for inspecting a short circuit, an insulation state, and the like of a circuit of a printed wiring board. [Prior Art] As an inspection jig for inspecting a printed circuit board, a component as shown in Fig. 6 is known. The inspection jig is provided with a pin plate 2 (pinb〇ard) 2; a spacer board 4 disposed on the surface side of the pin plate 2, and a protection plate 6 disposed on the surface of the spacer plate 4 The probe body 8 is electrically connected to the terminal portion of the printed wiring board to be inspected. The probe body 8 is attached to the pin plate 2. The probe body 8 is configured as: an outer sleeve 1〇, mounted on the pin plate 2, and an inner sleeve 12 disposed on the inner side of the outer sleeve 1〇; a coil spring 14 received in the inner sleeve 12 And the probe pin 16 is received in the front end side of the inner sleeve 12; the front end side of the probe pin 16 protrudes outward through the guide hole 18 formed in the protective plate 6, and the projection utilizes the coil spring U The elastic restoring force is electrically connected to the terminal portion of the printed wiring board. The above-mentioned inspection jig ' is configured such that the inner sleeve can be removed from the outer sleeve j. Therefore, when the probe pin 16 is worn, the old inner sleeve 12 can be removed and the new one can be attached. The coil spring 14 and the probe pin 16 arranged in the inner sleeve 12 are replaced. However, in the inspection jig, the inner sleeve 12 is disposed on the inner side of the outer sleeve 10 in the direction of the outer sleeve 10, and the coil magazine 14 is folded inward in the radial direction of the 拙 娃 园 佐 佐 η 恻砮 恻砮 12 Further, the outer diameter of the probe pin 16 is increased, and the outer diameter of the probe body 8 318170 5 1323785 is increased, and the problem of an increase in the printed wiring board in recent years cannot be sufficiently satisfied. - (4) Solving the above problem 'The inspection clip shown in Fig. 7 has been proposed., (for example, ~, Japanese Patent Document i). The inspection jig includes: a lower pin plate 22; and an upper pin plate 24 disposed on an upper side of the lower pin plate 22; and a differential hole attachment hole in the staple plate 22 26' The attachment hole 26 is provided with a probe pin 28, and the small projection 3 of the probe insertion pin (the M system protrudes outward from the lower pin plate 22. In addition, the upper probe plate 24 is also attached. An attachment hole 32 is provided with a stepped portion, and the attachment hole accommodating the lead wire with the coil spring 34' and the coil magazine 34 integrally formed is led out from the upper probe plate 24. The above inspection jig is The probe pin ^ itself is attached to the lower pin plate 22, and its outer diameter is small, so that the mounting degree of the probe pin 28 can be increased (in other words, the interval between the probe pins 28 is reduced). [Patent Document 1] JP-A-2000-227441 A SUMMARY OF THE INVENTION (Problems to be Solved by the Invention) However, the "inspection jig described above" has the following problems. The second embodiment has a configuration in which the lower pin is formed. The plate 22 is provided with a bracket differential attachment hole 26 for receiving the probe pin 28, but the attachment of the attachment differential attachment hole 26 is not easy, and the inspection fixture is made The manufacturing cost becomes high, and in particular, in the case of a type in which a plurality of probe pins 28 are attached, the cost is greatly increased. Second, the probe pins 28 are configured to be accommodated in the lower pin plate 22 The step portion is attached to the hole 26, and therefore, when the probe pin 28 is to be replaced by wear or the like, it is necessary to "318170 6 丄JZ:)/6:) the upper pin plate 24 must be inserted from the lower side first. The plate 22 can be replaced only after it is removed, resulting in a very complicated replacement of the probe pins 28. SUMMARY OF THE INVENTION An object of the present invention is to provide an inspection jig for a printed wiring board which can hold a probe pin as desired, and which can be easily replaced, and can also be adapted to a high distribution of a printed wiring board. (Means for Solving the Problem) The heart-shaped jig of the printed wiring board according to the first aspect of the present invention is characterized in that: the pinch plate includes a receiving hole and an attaching hole; and the protective plate is disposed on a single-side of the pin plate includes a guide hole; the probe pin is inserted into the attachment hole of the pin plate, and a distal end portion thereof protrudes outward through the guide hole of the protection plate; and the spring member is housed in The receiving hole of the pin plate is in the base of the probe pin.插 中 中 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插 插At the same time, the needle plate is also guided to the guide hole of the protective plate. In the printing jig according to the second aspect of the invention, in the inspection jig of the road plate, the pin plate includes: a lower pin plate provided with the receiving hole; and an upper side of the pair of upper pin plates And the device is provided with the above-mentioned device: the lower member is formed of a rubber plate and the rubber is sandwiched between the upper pin plates. The 坂 配 于 于 于 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 318 Equally, the elastic of the rubber sheet = the attachment of the ten plates - the above-mentioned attachment and holding portion of the upper pin plate is in the forefront. In the inspection jig of the present invention, the spring member is printed by the line = description, and the lead is mechanically disposed on the coil spring. In the scope of the patent application of the present invention, the fifth member of the present invention is formed by the end portion of the aforementioned lead of the coiled two of the coils. In the inspection jig of the patented circuit board of the present invention, the printing pin of the probe pin f is the same as that of the needle body provided at the end of the pin body. The function of the elastic force of the loop between the pin body and the small-diameter protrusion is small: == the inner peripheral surface of the end of the coil spring. The support line described in the first aspect of the invention is a printed circuit as described in the first aspect of the invention. The member is elastically held by the outer peripheral surface of the probe pin, so that the axial direction of the probe can be allowed. The moving side is held as desired, and the probe pin can be held by the configuration even when the probe pins are inserted. In addition, since the base side of the probe (4) is held by the 318170 8 1323785 mounting hole, the front end side is guided to the guide hole of the protection plate, so that the probe pin can also be moved in the axial direction. Stability is reserved. Further, the probe pins can be easily and easily replaced, for example, by being formed in a straight line. Further, in the inspection jig for a printed wiring board according to the second aspect of the invention of the present invention, the pin plate is provided with a lower pin plate and a pair of upper pin plates, and Since the rubber sheet of the elastic grip member is disposed between the pair of upper pin plates, the rubber sheet can be surely supported while the structure of the elastic grip member is simplified. Further, according to the inspection jig of the printed wiring board described in claim 3 of the present invention, since the inner diameters of the attachment holes provided in the pair of upper pin plates are substantially equal, and the elasticity of the rubber sheet is obtained The holding portion protrudes inward in the radial direction from the attachment hole of the pair of upper pin plates, so that the elastic grip portion can be stably held and elastically held by the elastic pinch portion of the probe pin plate. Even when the probe pin is moved to the multi-movement, the rubber plate=elastic holding portion is hardly elastically deformed in the moving direction, so that the probe pin can be stably supported. In addition, according to the inspection clip of the patented brush circuit board according to the present invention, the seal of the 闵 蓉 蓉 姓 〆 〆 〆 〆 〆 于 于 于 于 于 于 ( ( ( ( ( ( ( 线圈 线圈 线圈 线圈 线圈 线圈 线圈 线圈 线圈 线圈 线圈 线圈 线圈 线圈 线圈The external force of the pliers ^ + will be related to the coil of the current month, and can also eliminate the poor contact of the coil spring 盥彳I 4 2 π electrical contact. In addition, between the jigsaw and the 5 丨 line, in addition to the inspection jig for brushing the circuit board according to the present invention, the printing spring member described in claim 5 is composed of a coil spring, 318170 9 and is in contact with the coil spring. *, the coil spring and the 5 turns of the wire are welded to form a flanged head shape, so that no part of the wire can be passed through the end of the flange. The electrical connection of the through/and 5 turns . • More and 'in accordance with the invention 3*·from the upper generation. Brush the inspection board of the circuit board =:! The printing range described in item 6 of the patent range, due to the pin body and small diameter of the probe pin The work of the receiving part: Part I and the shoulder is used as a spring for the coil spring. The contact state of the coil spring to the probe pin is stable, which can suppress the wear and tear of the coil spring. Further, since the probe pin projecting portion supports the coil spring end adjacent to the circumferential surface of the (10) (four) phase, when the additional force acts, the occurrence of buckling at the end of the coil spring is suppressed, and the life of the coil spring is prolonged. [Embodiment] The first embodiment to the fifth drawing of the first embodiment of the present invention illustrate the preferred embodiment of the printed circuit inspection fixture of the present invention. Fig. 1 is a cross-sectional view showing an embodiment of the inspection jig of the present invention; and Fig. 2 is a view showing the first! Fig. 3 is an enlarged cross-sectional view showing the main part of the inspection jig; Fig. 3 is a front view showing the enlarged lead wire coil spring in the inspection jig of Fig. i. - In the first and second figures, the inspection jig 102 shown in the drawings includes: a pin plate 104, a protective plate 106, and a partition plate 1〇8. The protective plate is disposed on one side of the pin plate 104 (the upper side in FIG. 2 and FIG. 2), and the partition plate 108 is sandwiched between the pin plate 1〇4 and the protective plate 1〇6. These plates 104, 106, and 108 are attached and fixed by, for example, fixing nuts and bolts. Further, the protective plate 106 and the spacer 108 are formed of an electrically insulating material. The illustrated pin plate 104' is provided with: a lower pin plate 11A; - an upper pin plate 112, 114' of 318170 10 1323785 is disposed on one side of the lower pin plate 丨丨〇 Side (the upper side in FIGS. 1 and 2); circuit board 116, which is disposed on the other side of the lower pin plate 110 (the lower-face side in FIGS. 1 and 2); These plates 112, 112, 114, 116 are also formed of an electrically insulating material.

I 於此實施方式中’於下側插針板110設有收容孔118; 於一對的上側插針板112、114則設有裝附孔122、124 ; 於間隔板108設有貫通孔126 ;另外,保護板1 〇6則設有 _引導孔128。收容孔118、裝附孔122、124、貫通孔126 以及引導孔12 8係使橫斷面形狀形成為圓形,收容孔118、 裝附孔122、124以及引導孔128的内徑係實質上相等的, 貫通孔126的内徑係形成為比收容孔等的内徑更大。 又,收容孔118的内徑,亦可以形成為比裝附孔122、124 以及引導孔128的内徑大上些許。 該檢查夾具102,復具備有:探針插針130以及線圈 鲁彈簧132。線圈彈簧132係收容於下侧插針板11 〇之收容 孔118内。另外’因探針插針13〇係細長圓筒狀的直線狀, •故其外徑於全長中皆形成為實質上相等的,其基部側(第 .1圖及第2圖中的下部側)係收容於一對的上側插針板 112、114的裝附孔122、124 ’其前端侧通過間隔板1〇8 的貫通孔126以及保護板1〇6的引導孔128向外側(第! 圖及第2圖中的上方)突出。 該檢查夹具102,還包含有作為將探針插針i3〇彈性 挾持用之彈性挾持構件的橡膠板134。橡膠板134係由天 318170 11 ^23785 .然椽踢、合成橡膝等電絕緣性的橡膠材料所形成,並夾於 .· 一對的上側插針板112、114之間。於橡膠板134,係設有 .挟持探針插針130用的挾持孔13.6,而界定挾持孔ι36的 ;-彈性挾持部138 (為橡膠板134的一部分,且位於裝附孔 ;122、124内的部位)係於一對的上侧插針板丨丨2、丨丨4之 裝附孔122、124内,向徑方向内側突出些許。 探針插針130之基部側的外週面係由橡膠板丨34的彈 性挾持部138彈性的挾持,被該彈性挾持部138所挾持的 兩側部位係被引導挾持於一對的上側插針板112、114之裝 附孔122、124,其前端側係被引導挾持於保護板1〇6的引 導孔128。於此實施方式中,探針插針13〇的兩端部係形 成為尖細的錐狀,其基部側的錐部的前端部,如第丨圖及 第3圖所示,被收容於線圈彈簧132的端部内,其錐面則 抵接於線圈彈簧132的端面。 依據上述之構成’如後所述在箭號p所示的方向㈠ 3圖中的下方)對探針插針⑶施加預定以上的力時貝| 線圈彈簧132便被壓縮且探針插針⑽往軸方向下方移、’ 另外當該力解除時,則藉由線圈彈簧丨 力探針插針UG便往轴方向上方移動回到原本的位置復』 二ΤΙ時’探針插針13°係被引導於-對的上編 孔128, p十的裝附孔122、124以及保護板106的引等 孔128 —述轴方向安定的移動。 ^ 、方式中,如第3圖所示,線圈彈簧132盥引结 係形成為—體成型。該線圈彈簧132,可以由高強度以 318170 12 1323785 •導電金屬線所形成。從該線圈彈簧132所延伸的引線14〇, ,係通過形成於線路板116的導出孔142而導出至外側,被 *如此導出的引線140之前端部在設置於線路板116的端子 邓被焊錫等電性連接固定住。藉由利用與引線刚為一體 :的線圈彈簧132,可以消除線圈彈簧132與引線14〇的電 性連接不良。 該檢查夹具102,係如後所述被使用。亦即,如第i 圖所示’使用未圖示的定位夾具於檢查夾具1〇2的上侧將 欲檢查的印職路板14定位於狀的位置關係,並安裝成 推擠從保護板106所突㈣探針料⑽之前端部。如此 一來,線圈彈簧132便被壓縮,藉由該線圈彈簧的彈性復 ,力使探針插針130被彈性的推塵至印刷線路板144之預 定的端子部,以使該端子部與探針插針13()確實的電性連 接。因此’藉由使用如上所述之構成的檢查夾具㈣,而 可如所期望的進行印刷線路板144的檢查。 • 在對已發生磨耗等的舊探針插針13〇與新的進行更換 時,將從保護板⑽突出的探針插針13〇的前端部用工且 .(未圖示)夾住,以夾住的狀態下拔出即可。因探針插^ -130為直線狀,且僅由橡膠板134之彈性挾持部ΐ38彈性 的挾持著,故藉由如上所述的拔出方式可以簡單的將探針 插針130從插針板104取下。另夕卜,在安裝新的探針插針 130時,將探針插針13〇通過保護板1〇6的引導孔I”插 入插針板104之一對的上側插針板112、U4的裝附孔 122、124即可,且藉由進行插入,其基部侧便被橡膠板⑼In this embodiment, the lower pin plate 110 is provided with a receiving hole 118; the upper pin plates 112 and 114 of the pair are provided with mounting holes 122 and 124; and the partition plate 108 is provided with a through hole 126. In addition, the protection plate 1 〇 6 is provided with a guide hole 128. The receiving hole 118, the attaching holes 122, 124, the through hole 126, and the guiding hole 12 are formed in a circular shape in cross section, and the inner diameters of the receiving hole 118, the attaching holes 122, 124, and the guiding hole 128 are substantially Equally, the inner diameter of the through hole 126 is formed to be larger than the inner diameter of the receiving hole or the like. Further, the inner diameter of the receiving hole 118 may be formed to be slightly larger than the inner diameters of the attaching holes 122 and 124 and the guide hole 128. The inspection jig 102 is provided with a probe pin 130 and a coil ridge spring 132. The coil spring 132 is housed in the housing hole 118 of the lower pin plate 11A. In addition, since the probe pins 13 are linear and elongated in a straight cylindrical shape, the outer diameters of the probe pins 13 are substantially equal to each other in the entire length, and the base side (the lower side in FIGS. 1 and 2) The attachment holes 122 and 124 of the upper pin plates 112 and 114 are accommodated in the pair, and the front end side thereof passes through the through hole 126 of the partition plate 1〇8 and the guide hole 128 of the protection plate 1〇6 to the outside (the first! The figure and the upper part in Fig. 2 are highlighted. The inspection jig 102 further includes a rubber sheet 134 as an elastic holding member for elastically holding the probe pin i3. The rubber sheet 134 is formed of an electrically insulating rubber material such as a kick, a synthetic rubber knee, and the like, and is sandwiched between a pair of upper pin plates 112 and 114. The rubber plate 134 is provided with a holding hole 13.6 for holding the probe pin 130, and defines a holding hole 136; the elastic holding portion 138 is a part of the rubber plate 134 and is located at the mounting hole; 122, 124 The inner portion is attached to the attachment holes 122 and 124 of the pair of upper pin plates 2 and 4, and protrudes slightly inward in the radial direction. The outer peripheral surface of the base portion side of the probe pin 130 is elastically held by the elastic grip portion 138 of the rubber sheet bundle 34, and the both side portions held by the elastic grip portion 138 are guided and held by the pair of upper pins. The attachment holes 122, 124 of the plates 112, 114 are guided to the guide holes 128 of the protection plate 1A6 at the front end side thereof. In this embodiment, both end portions of the probe pin 13A are formed into a tapered tapered shape, and the distal end portion of the tapered portion on the base side is housed in the coil as shown in FIG. 3 and FIG. In the end portion of the spring 132, the tapered surface abuts against the end surface of the coil spring 132. According to the above configuration, when a predetermined force or more is applied to the probe pin (3) in the direction indicated by the arrow p in the arrow (p), the coil spring 132 is compressed and the probe pin (10) is applied. Move to the lower direction of the axis, 'When the force is released, the coil spring force probe pin UG moves to the upper position in the axial direction and returns to the original position." When the probe is inserted, the probe pin 13° The upper holes 128, the p-shaped attachment holes 122, 124 of the p-type, and the guide holes 128 of the protective plate 106 are guided to a stable movement in the axial direction. ^, In the mode, as shown in Fig. 3, the coil spring 132盥 is formed into a body. The coil spring 132 can be formed of high strength with 318170 12 1323785 • conductive metal wire. The lead wire 14 extending from the coil spring 132 is led out to the outside through the lead-out hole 142 formed in the wiring board 116, and the front end of the lead wire 140 thus led out is soldered at the terminal provided on the wiring board 116. The isoelectric connection is fixed. By using the coil spring 132 which is just integrated with the lead wire, the electrical connection failure between the coil spring 132 and the lead wire 14 can be eliminated. This inspection jig 102 is used as will be described later. That is, as shown in Fig. i, 'the positional relationship of the printed road board 14 to be inspected is positioned on the upper side of the inspection jig 1〇2 using a positioning jig (not shown), and is mounted to push the protection board from the protection board. 106 protruding (four) probe material (10) before the end. In this way, the coil spring 132 is compressed, and the elastic force of the coil spring is used to force the probe pin 130 to be elastically pushed to the predetermined terminal portion of the printed circuit board 144, so that the terminal portion and the probe are The pin 13 () is indeed electrically connected. Therefore, the inspection of the printed wiring board 144 can be performed as desired by using the inspection jig (4) constructed as described above. • When the old probe pin 13 that has worn out, etc., is replaced with a new one, the tip end of the probe pin 13 that protrudes from the protective plate (10) is clamped (not shown) to Pull out in the clamped state. Since the probe insert 130 is linear and is only elastically held by the elastic grip portion 38 of the rubber sheet 134, the probe pin 130 can be easily removed from the pin plate by the pull-out method as described above. 104 removed. In addition, when the new probe pin 130 is mounted, the probe pin 13 is inserted into the upper pin plate 112, U4 of one of the pair of pin plates 104 through the guide hole I" of the protective plate 1〇6. It is sufficient to attach the holes 122, 124, and by inserting, the base side is covered by a rubber sheet (9)

318170 13 而可以簡單的操作將新的 ,的彈性挾持部138彈性的挾持, 探針插針130進行裝附。 ,、於上述的實施方式,為了使說明簡單且易於理解雖 -从適用於檢查夾具1〇2之針腳板1〇4裝附一個探針插針 :者進行說明’但於實際的檢查夾具係多數個例如係 、附有1000至5000個左右的探針插針13〇於插針板1〇4, 於如上所述的裝附有多數個探針插針130的情形中,因係 鲁構成為探針插針130本身裝附於插針板104,故可縮小探 針插針130間的間隔,使其可以很方便的適用於高配 的印刷電路板之檢查。 " ^第4圖表示線圈彈簧與引線之連接構造的另外一種實 施方式。於該實施方式,線圈彈簧132A與引線u〇A係形 成為不同個體’線圈彈簧132A’係由以導電金屬線所形成 的普通之線_簧所構成;引们偏,例如係以漆包線形 成’其-端部例如藉由施以壓製加工而成為凸緣頭狀,該 凸緣頭狀部152係如第4圖所示,電性接觸連接於線圈= 簧132A之端部。 於該實施方式中’引線140A之凸緣頭狀部152係收容 於下側插針板110之收容孔118内,從該凸緣頭狀部^ 所延伸的引線140A係通過線路板116之導出孔142而導出 至外側,凸緣頭狀部152與探針插針130之間係隔著線圈 彈簧132A。藉由採用如上所述的連接構造,可以使線圈彈 簧132A與引線140A的凸緣頭狀152確實的電性接觸連接。 第5圖係表示於探針插針中的線圈彈簧之承受構造的 318170 14 !323785 另一種實施方式。於此實施方式中,線圈彈簧132A以及引 線140A的構造與第4圖所示的構造係實質上相同,僅於探 針插針130B施有修正。於此實施方式中的探針插針13〇B, 係具有細長圓筒狀的針腳本體162,該針腳本體162的一 端部係設有向軸方向外側突出的小徑突部164。小徑突部 164的外徑比針腳本體丨62的外徑小了些許於針腳本體 162與小徑突部ι64之間設有肩部166<>另外,該小徑突部 16 4的外徑比線圈彈簧丨3 2 A的内徑小,該小徑突部丨6 4係 被插入線圈彈簧132A内並支撐其端部内週面。又,小徑突 部64的前端部,係形成為容易插入線圈彈簧丨3以之前細 的錐狀,另外針腳本體162之另一端部,係與上述同樣形 成前細的錐狀。 於該實施方式中,探針插針13的肩部16 6係作為彈 簧承受部之功能,因線圈彈簧132A的端部係由該肩部166 承受,故探針插針130B與線圈彈簧132A的端部之間抵接 _支撐係較安定’伴隨探針插針13咄之上述移動而產生的線 圈彈簧132A之磨損便被抑制。另外,探針插針13〇B的小 -徑突部164,因支撐線圈彈簧132A的端部内週面,故於線 •圈彈簧132A之端部中的區曲之發生便被抑制,藉此,可以 延長線圈彈簧132A的壽命。 以上,雖針對本發明的印刷線路板之檢查夾具的實施 方式進行說明’但本發明並非限定於該實施方式者,在不 逸脫本發明之範圍内可有種種的變形乃至修正。 例如,於前述的實施方式中,雖一對的上侧針腳板 318170 15 丄奶785 112、114之間隔有橡膠板134,但並不限於此構成,亦可 例如將一方的上側插針板114省略,以使橡膠板134夾於 上側插針板112與下側插針板11()之間,於如上所述之構 成的情形中’較佳為使上侧插針板112之裝附孔122的内 徑與下側插針板11 〇的收容孔118的内徑實質上相等。 【圖式簡單說明】 第1圖係表示本發明的檢查夾具之一實施方式的剖面 圖; 第2圖係表示第丨圖之檢查夾具的重要部分的放大剖 面圖; 第3圖係將第1圖之檢查夾具中的附引線線圈彈簧放 大表示後的正面圖; 第4圖表示線圈彈簧與引線之連接構造的另外一種實 施方式; 第5圖表示探針插針中的線圈彈簧之承受構造的另外 一種實施方式; 第6圖係表示習知的檢查夾具之代表例的剖面圖; 第7圖係表示習知的檢查夾具之另外—例的剖面圖。 【主要元件符號說明】 102 106 110 116 122 檢查夾具 保護板 下側插針板 線路板 裝附孔 104 插針板 108 間隔板 112、1U 上側插針板 124 118 收容孔 126 貫穿孔 318170 16 1323785 128 引導孔 132、132A線圈彈簧 136 挾持孔 140、140A 引線 142 導出孔 152 凸緣頭狀部 130、13GB探針插針 134 橡膠板 138 彈性挾持部 144 印刷線路板318170 13 The new elastic gripping portion 138 can be elastically held by the simple operation, and the probe pin 130 can be attached. In the above-described embodiment, in order to make the explanation simple and easy to understand, it is explained that a probe pin is attached from the stitch board 1〇4 applied to the inspection jig 1〇2, but the actual inspection jig is used. A plurality of, for example, 1000 to 5000 probe pins 13 are attached to the pin plate 1〇4, and in the case where a plurality of probe pins 130 are attached as described above, Since the probe pin 130 itself is attached to the pin plate 104, the interval between the probe pins 130 can be reduced, so that it can be conveniently applied to the inspection of a highly equipped printed circuit board. " ^ Figure 4 shows another embodiment of the connection structure of the coil spring and the lead. In this embodiment, the coil spring 132A and the lead u 〇 A are formed as different individual 'coil springs 132A' are formed by a common wire spring formed by conductive metal wires; for example, they are formed by enameled wires. The end portion is formed into a flange shape by press working, for example, and the flange head portion 152 is electrically connected to the end portion of the coil = spring 132A as shown in Fig. 4 . In this embodiment, the flange head portion 152 of the lead 140A is received in the receiving hole 118 of the lower pin plate 110, and the lead wire 140 extending from the flange head portion is led out through the wiring board 116. The hole 142 is led out to the outside, and the coil spring 132A is interposed between the flange head portion 152 and the probe pin 130. By using the above-described connection structure, the coil spring 132A can be surely electrically connected to the flange head shape 152 of the lead 140A. Figure 5 is a representation of the coil spring of the probe pin. 318170 14 !323785 Another embodiment. In this embodiment, the structure of the coil spring 132A and the lead wire 140A is substantially the same as that of the structure shown in Fig. 4, and only the probe pin 130B is corrected. In the probe pin 13B of the embodiment, the needle script body 162 having an elongated cylindrical shape is provided, and one end portion of the needle script body 162 is provided with a small-diameter protrusion 164 that protrudes outward in the axial direction. The outer diameter of the small-diameter protrusion 164 is smaller than the outer diameter of the needle script body 62. A shoulder portion 166 is provided between the needle script body 162 and the small-diameter protrusion portion ι64. Further, the small-diameter protrusion portion 16 is externally The diameter of the coil spring 丨3 2 A is small, and the small-diameter protrusion 丨 64 is inserted into the coil spring 132A and supports the inner peripheral surface of the end portion thereof. Further, the distal end portion of the small-diameter projection 64 is formed so as to be easily inserted into the coil spring 3 in a tapered shape, and the other end portion of the needle script body 162 is formed into a tapered shape as described above. In this embodiment, the shoulder portion 16 6 of the probe pin 13 functions as a spring receiving portion. Since the end portion of the coil spring 132A is received by the shoulder portion 166, the probe pin 130B and the coil spring 132A are The abutment between the ends _ the support is relatively stable. The wear of the coil spring 132A caused by the above movement of the probe pins 13 is suppressed. Further, since the small-diameter projection 164 of the probe pin 13A supports the inner peripheral surface of the end portion of the coil spring 132A, the occurrence of the curvature in the end portion of the coil spring 132A is suppressed. The life of the coil spring 132A can be extended. As described above, the embodiment of the inspection jig of the printed wiring board of the present invention will be described. However, the present invention is not limited to the embodiment, and various modifications and corrections are possible without departing from the scope of the invention. For example, in the above-described embodiment, although the pair of upper stitch plates 318170 15 have the rubber sheets 134 at intervals of the milk 785 112, 114, the present invention is not limited to this configuration, and for example, one of the upper pin plates 114 may be used. Occasionally, the rubber sheet 134 is sandwiched between the upper side pin plate 112 and the lower side pin plate 11 (). In the case of the above configuration, it is preferable to attach the upper side pin plate 112 to the hole. The inner diameter of 122 is substantially equal to the inner diameter of the receiving hole 118 of the lower pin plate 11 。. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a cross-sectional view showing an embodiment of an inspection jig of the present invention; Fig. 2 is an enlarged cross-sectional view showing an important part of the inspection jig of the second drawing; The lead wire coil spring in the inspection jig of the figure is enlarged to show a front view; FIG. 4 shows another embodiment of the connection structure of the coil spring and the lead wire; and FIG. 5 shows the structure of the coil spring in the probe pin. Another embodiment; Fig. 6 is a cross-sectional view showing a representative example of a conventional inspection jig; and Fig. 7 is a cross-sectional view showing another example of a conventional inspection jig. [Main component symbol description] 102 106 110 116 122 Inspection clamp protection plate Lower side pin plate circuit board attachment hole 104 Pin plate 108 Spacer plate 112, 1U Upper side pin plate 124 118 Reception hole 126 Through hole 318170 16 1323785 128 Guide hole 132, 132A coil spring 136 holding hole 140, 140A lead 142 lead hole 152 flange head portion 130, 13GB probe pin 134 rubber plate 138 elastic holding portion 144 printed circuit board

17 31817017 318170

Claims (1)

第95119556號專利申請 (98年12月28 '日 十、申請專利範圍: 1· 一種印刷線路板之檢查夾具,係具備有 插針板’其含有收容孔及裝附孔; 保濩板,配設於前述插針板的單面側,且含有引導 探針插針,插入前述插針板的前述裝附孔,其前端 部通過前述保護板的前述引導孔向外側突出;以及 彈簧構件,收容於前述插針板的前述收容孔,並作 用於前述探針插針之基部; 其中,前述插針板係含有於前述裝附孔内突出的彈 性挾持構件,前述彈性挾持構件係以當於前述探針插針 施加前述探針插針之軸方向之預定以上的力時容許前 述探針插針朝前述軸方向移動的方式彈性挾持前述探 針插針的外週面,前述探針插針的基部側被引導挾持於 前述插針板的前述裝附孔,同時,其前端側係被引導挾 • 持於前述保護板的前述引導孔。 2. 如申請專利範圍第丨項的印刷線路板之檢查夾具,其中, 前述插針板係具備有: 下側插針板,其設置有前述收容孔;及 一對的上侧插針板,配設於前述下側插針板的上 側’且設置有前述裝附孔;並且 七述彈)·生挾持構件係由橡膠板所構成,且前述橡膠 板係配設於前述一對的上側插針板之間。 3. 如申明專利範圍第2項的印刷線路板之檢查夹具,其 318170(修正版) 18 Λ η mmm. 中,設置於前述一對之上側插針板的裝附孔之内— 質上相等,且前述橡膠板的彈性挾持部係於前述一對之 上側插針板的前述裝附孔内向徑方向内侧突出些許。 4·如申請專利範圍第4 3項中任一項的印刷線路板之檢 查夾具,其中,前述彈簧構件係由線圈彈簧所構成,且 引線係一體地設置於前述線圈彈簧。 5. 如申請專利範圍第u 3項中任一項的印刷線路板之檢 查夾具,其中,前述彈簧構件係由線圈彈簧所構成,且 引線係電性接觸地連接於前述線圈彈簧,接觸於前述線 圈彈簧的前述引線之-端部係形成凸緣頭狀。 6. 如申請專利範圍第4項的印刷線路板之檢查夾具,其 中,前述探針插針係具備有:細長圓筒狀的插針本體與 設置於該插針本體之端部的小徑突部,且前述插針本體 與則述小徑突部之間的肩部,係作為前述線圈彈簧用的 彈簧承受部,前述小徑突部係支撐前述線圈彈簧的端部 内週面。 7. 如申咕專利範圍第5項的印刷線路板之檢查夹具,其 中,刖述探針插針係具備有:細長圓筒狀的插針本體與 设置於該插針本體之端部的小徑突部,且前述插針本體 與刖述小徑突部之間的肩部,係作為前述線圈彈簧用-的 彈簧承受部,前述小徑突部係支撐前述線圈彈簧的端部 内週面。 8. —種印刷線路板之檢查夾具,係具備有: 插針板’其含有收容孔及裝附孔; 318170(修正版) 19 ^o. 12 保護板’配設於前述插針板的單面#丨,且含有引導孔. ^插針,插人前述插針板的前述裝附孔,其前端 一通過别述保護板的前述引導孔向外側突出;以及 線圈彈簧’收容於前述插針板的前述收容孔, 用於前述探針插針之基部; 則述插針板係具備有: 下側插針板,其設置有前述收容孔; 一對的上側插針板,配設於前述下側插針板的 上侧,且設置有前述裝附孔;以及 彈性挾持構件,配設於前述一對的上側插針板 之間;並且 則述一對之上側插針板的前述裝附孔、前述下側插 針板的前述收容孔、及前述保護板的前述引導孔之内徑 係相等,且前述彈性挾持構件係由㈣板所構成,且前 ^橡膠板的彈性失持部係於前述—對之上側插針板的 前述裝附孔内向徑方向内側突出; 二此外,前述探針插針係為細長圓筒形的直桿狀,於 前述探針插針之基部係設有前端尖細的錐狀部,且前述 錐狀部係容置於前述線圈彈簧的端部; 前述橡膠板的前述彈性失持部係以使前述探針插 針可朝其軸向移動之方式彈性挾持前述探針插針的外 週面,4述探針插針的基部側被引導挾持於前述一對之 上侧插針板的前述裝附孔,並且其前端側係被引導挾持 於前述保護板的前述引導孔。 318170(修正版) 20Patent Application No. 95119556 (December 28, 1998, Japanese Patent Application Serial No.: 1) An inspection jig for a printed circuit board having a pin-shaped plate containing a receiving hole and a mounting hole; Provided on one side of the pin plate, and including a guide probe pin, the attachment hole inserted into the pin plate, the front end portion of which protrudes outward through the guide hole of the protection plate; and a spring member for housing The accommodating hole of the pin plate is applied to the base of the probe pin; wherein the pin plate includes an elastic strutting member protruding in the accommodating hole, and the elastic holding member is as described above When the probe pin applies a predetermined force or more in the axial direction of the probe pin, the probe pin is elastically held to the outer peripheral surface of the probe pin so as to move in the axial direction, and the probe pin is The base side is guided to be held by the aforementioned attachment hole of the aforementioned pin plate, and at the same time, the front end side thereof is guided to be held by the aforementioned guide hole of the protection plate. 2. Print as in the third paragraph of the patent application An inspection jig for brushing a circuit board, wherein the pin plate includes: a lower pin plate provided with the receiving hole; and a pair of upper pin plates disposed on the lower pin plate The upper side 'and the above-mentioned attachment hole are provided; and the seven-loaded bullet.) the raw gripping member is composed of a rubber sheet, and the rubber sheet is disposed between the pair of upper side pin plates. 3. The inspection jig of the printed wiring board according to item 2 of the patent scope is 318170 (corrected version) 18 Λ η mmm., which is disposed in the attachment holes of the pair of upper side pin plates - qualitatively equal The elastic gripping portion of the rubber sheet protrudes inward in the radial direction from the attachment hole of the pair of upper side pin plates. The inspection jig for a printed wiring board according to any one of claims 4 to 3, wherein the spring member is constituted by a coil spring, and the lead wire is integrally provided to the coil spring. 5. The inspection jig for a printed wiring board according to any one of the preceding claims, wherein the spring member is constituted by a coil spring, and the lead wire is electrically connected to the coil spring to be in contact with the foregoing The end portion of the aforementioned lead of the coil spring is formed into a flange shape. 6. The inspection jig for a printed wiring board according to claim 4, wherein the probe pin includes: an elongated cylindrical pin body and a small diameter protrusion provided at an end of the pin body The shoulder portion between the pin body and the small-diameter projecting portion serves as a spring receiving portion for the coil spring, and the small-diameter projecting portion supports an inner peripheral surface of the end portion of the coil spring. 7. The inspection jig for a printed wiring board according to claim 5, wherein the probe pin is provided with an elongated cylindrical pin body and a small portion provided at an end of the pin body. The diameter protrusion is a spring receiving portion for the coil spring, and the small diameter protrusion supports the inner circumferential surface of the end portion of the coil spring. 8. An inspection jig for a printed circuit board, comprising: a pin plate having a receiving hole and a mounting hole; 318170 (revision) 19 ^o. 12 a protective plate disposed on the pin plate a surface #丨, and includes a guide hole. The pin is inserted into the attachment hole of the pin plate, and the front end thereof protrudes outward through the guide hole of the protection plate; and the coil spring 'accepts the pin The receiving hole of the plate is used for the base of the probe pin; the pin plate is provided with: a lower pin plate provided with the receiving hole; and a pair of upper pin plates arranged in the foregoing The upper side of the lower pin plate is provided with the aforementioned attachment hole; and the elastic holding member is disposed between the pair of upper pin plates; and the aforementioned attachment of the pair of upper side pin plates The hole, the receiving hole of the lower pin plate, and the guide hole of the protective plate have the same inner diameter, and the elastic holding member is composed of a (four) plate, and the elastically lost portion of the front rubber plate is As described above - the aforementioned attachment to the upper side pin plate Further, the probe pin is formed in a slender cylindrical straight rod shape, and a tapered end portion is formed at a base portion of the probe pin, and the tapered portion is provided The elastic locking portion of the rubber plate is configured to elastically hold the outer circumferential surface of the probe pin in such a manner that the probe pin can move in the axial direction thereof. The base side of the needle pin is guided and held by the attachment hole of the pair of upper side pin plates, and the front end side thereof is guided to be held by the aforementioned guide hole of the protection plate. 318170 (revision) 20
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CN1982896A (en) 2007-06-20
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