CN1982896B - 印刷配线板检查夹持具 - Google Patents

印刷配线板检查夹持具 Download PDF

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Publication number
CN1982896B
CN1982896B CN2006100930063A CN200610093006A CN1982896B CN 1982896 B CN1982896 B CN 1982896B CN 2006100930063 A CN2006100930063 A CN 2006100930063A CN 200610093006 A CN200610093006 A CN 200610093006A CN 1982896 B CN1982896 B CN 1982896B
Authority
CN
China
Prior art keywords
mentioned
syringe needle
needle plate
gauge head
upside
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2006100930063A
Other languages
English (en)
Chinese (zh)
Other versions
CN1982896A (zh
Inventor
中村慎七
石川胜昭
田中宏和
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ONISHI ELECTRONIC CO Ltd
Original Assignee
ONISHI ELECTRONIC CO Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ONISHI ELECTRONIC CO Ltd filed Critical ONISHI ELECTRONIC CO Ltd
Publication of CN1982896A publication Critical patent/CN1982896A/zh
Application granted granted Critical
Publication of CN1982896B publication Critical patent/CN1982896B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
CN2006100930063A 2005-12-12 2006-06-02 印刷配线板检查夹持具 Expired - Fee Related CN1982896B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2005-357718 2005-12-12
JP2005357718 2005-12-12
JP2005357718A JP4448086B2 (ja) 2005-12-12 2005-12-12 プリント配線板の検査治具

Publications (2)

Publication Number Publication Date
CN1982896A CN1982896A (zh) 2007-06-20
CN1982896B true CN1982896B (zh) 2012-01-11

Family

ID=38165570

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2006100930063A Expired - Fee Related CN1982896B (zh) 2005-12-12 2006-06-02 印刷配线板检查夹持具

Country Status (4)

Country Link
JP (1) JP4448086B2 (enrdf_load_stackoverflow)
KR (1) KR100869720B1 (enrdf_load_stackoverflow)
CN (1) CN1982896B (enrdf_load_stackoverflow)
TW (1) TWI323785B (enrdf_load_stackoverflow)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009036532A (ja) * 2007-07-31 2009-02-19 Koyo Technos:Kk 検査冶具および検査装置
WO2009016746A1 (ja) * 2007-08-01 2009-02-05 Elia Co., Ltd. コンタクタ及びインターフェース組立体
JP4901811B2 (ja) * 2008-05-27 2012-03-21 ミツイ精密株式会社 電気的コネクタ、カメラレンズ及びカメラ
JP5226429B2 (ja) * 2008-08-25 2013-07-03 大西電子株式会社 プリント配線板の検査治具
KR101522723B1 (ko) * 2013-10-28 2015-06-01 김철군 반도체 테스트 소켓의 핀장치
CN105842490A (zh) * 2016-05-25 2016-08-10 国家电网公司 继电保护端子排防损害装置
US11131691B2 (en) * 2017-03-30 2021-09-28 Nhk Spring Co., Ltd. Probe holder and probe unit
KR101911496B1 (ko) * 2018-04-13 2018-12-28 황동원 반도체 디바이스 테스트 소켓장치
KR102413287B1 (ko) * 2020-10-21 2022-06-27 주식회사 오킨스전자 테스트 소켓
CN112305394B (zh) * 2020-11-06 2021-04-27 法特迪精密科技（苏州）有限公司 探针承插件及探针组件

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1308727A (zh) * 1998-07-10 2001-08-15 日本发条株式会社 导电的接触单元
CN2502280Y (zh) * 2001-08-13 2002-07-24 吴志成 可提高测试密度的治具
CN2677944Y (zh) * 2003-12-03 2005-02-09 陈嘉隆 检测电路板的治具

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2532331B2 (ja) * 1992-11-09 1996-09-11 日本発条株式会社 導電性接触子
JPH07294552A (ja) * 1994-04-26 1995-11-10 Onishi Denshi Kk プリント配線板の導通検査治具
JP4655392B2 (ja) 2001-03-16 2011-03-23 イビデン株式会社 導通検査治具及びその製造方法
JP4251855B2 (ja) * 2002-11-19 2009-04-08 株式会社ヨコオ 高周波・高速用デバイスの検査治具の製法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1308727A (zh) * 1998-07-10 2001-08-15 日本发条株式会社 导电的接触单元
CN2502280Y (zh) * 2001-08-13 2002-07-24 吴志成 可提高测试密度的治具
CN2677944Y (zh) * 2003-12-03 2005-02-09 陈嘉隆 检测电路板的治具

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
同上.

Also Published As

Publication number Publication date
TWI323785B (en) 2010-04-21
TW200722759A (en) 2007-06-16
CN1982896A (zh) 2007-06-20
JP4448086B2 (ja) 2010-04-07
KR100869720B1 (ko) 2008-11-21
KR20070062396A (ko) 2007-06-15
JP2007163217A (ja) 2007-06-28

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