WO2009016746A1 - コンタクタ及びインターフェース組立体 - Google Patents

コンタクタ及びインターフェース組立体 Download PDF

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Publication number
WO2009016746A1
WO2009016746A1 PCT/JP2007/065069 JP2007065069W WO2009016746A1 WO 2009016746 A1 WO2009016746 A1 WO 2009016746A1 JP 2007065069 W JP2007065069 W JP 2007065069W WO 2009016746 A1 WO2009016746 A1 WO 2009016746A1
Authority
WO
WIPO (PCT)
Prior art keywords
contactor
contact pins
interface assembly
holes
parallel
Prior art date
Application number
PCT/JP2007/065069
Other languages
English (en)
French (fr)
Inventor
Hideto Satoh
Kengo Eguchi
Original Assignee
Elia Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elia Co., Ltd. filed Critical Elia Co., Ltd.
Priority to PCT/JP2007/065069 priority Critical patent/WO2009016746A1/ja
Publication of WO2009016746A1 publication Critical patent/WO2009016746A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

　プローブピンの狭ピッチ化を促進すると共に信号処理を円滑に行なうことができるコンタクタ及びインターフェース組立体を提供することを目的とする。複数のコンタクトピンと、該複数のコンタクトピンが通される複数の貫通孔が形成されていると共に互いに略平行に配置された、前記コンタクトピンを支持する複数の支持板とを有する、互いに略平行に配置された回路基板間を電気的に接続するコンタクタであって、前記コンタクトピン同士は、少なくとも１つの支持板の前記複数の貫通孔それぞれにおいて、互いに略同じ方向へ弓状に曲がっていることを特徴とするコンタクタ。
PCT/JP2007/065069 2007-08-01 2007-08-01 コンタクタ及びインターフェース組立体 WO2009016746A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/065069 WO2009016746A1 (ja) 2007-08-01 2007-08-01 コンタクタ及びインターフェース組立体

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/065069 WO2009016746A1 (ja) 2007-08-01 2007-08-01 コンタクタ及びインターフェース組立体

Publications (1)

Publication Number Publication Date
WO2009016746A1 true WO2009016746A1 (ja) 2009-02-05

Family

ID=40303992

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/065069 WO2009016746A1 (ja) 2007-08-01 2007-08-01 コンタクタ及びインターフェース組立体

Country Status (1)

Country Link
WO (1) WO2009016746A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112698177A (zh) * 2020-12-30 2021-04-23 苏州朗之睿电子科技有限公司 一种半导体器件用测试针固定模组

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS614971A (ja) * 1984-06-15 1986-01-10 インタ−ナシヨナル　ビジネス　マシ−ンズ　コ−ポレ−シヨン 座屈柱プロ−ブ装置
JPS63255671A (ja) * 1987-03-27 1988-10-21 インターナシヨナル・ビジネス・マシーンズ・コーポレーシヨン 接触プローブ装置
JPH04278476A (ja) * 1991-03-05 1992-10-05 Corp Of Herumesu:Kk プリント基板テスト用アダプタ
JPH07335701A (ja) * 1994-06-10 1995-12-22 Advantest Corp プロービング装置
JPH11248745A (ja) * 1997-11-05 1999-09-17 Feinmetall Gmbh インターフェースを有するミクロ構造用の試験ヘッド
JP2004510986A (ja) * 2000-10-05 2004-04-08 プロベスト 多接点電気コネクタ
JP2007163217A (ja) * 2005-12-12 2007-06-28 Onishi Denshi Kk プリント配線板の検査治具

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS614971A (ja) * 1984-06-15 1986-01-10 インタ−ナシヨナル　ビジネス　マシ−ンズ　コ−ポレ−シヨン 座屈柱プロ−ブ装置
JPS63255671A (ja) * 1987-03-27 1988-10-21 インターナシヨナル・ビジネス・マシーンズ・コーポレーシヨン 接触プローブ装置
JPH04278476A (ja) * 1991-03-05 1992-10-05 Corp Of Herumesu:Kk プリント基板テスト用アダプタ
JPH07335701A (ja) * 1994-06-10 1995-12-22 Advantest Corp プロービング装置
JPH11248745A (ja) * 1997-11-05 1999-09-17 Feinmetall Gmbh インターフェースを有するミクロ構造用の試験ヘッド
JP2004510986A (ja) * 2000-10-05 2004-04-08 プロベスト 多接点電気コネクタ
JP2007163217A (ja) * 2005-12-12 2007-06-28 Onishi Denshi Kk プリント配線板の検査治具

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112698177A (zh) * 2020-12-30 2021-04-23 苏州朗之睿电子科技有限公司 一种半导体器件用测试针固定模组

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