TW546426B - Method for producing silicon single crystal - Google Patents
Method for producing silicon single crystal Download PDFInfo
- Publication number
- TW546426B TW546426B TW090104216A TW90104216A TW546426B TW 546426 B TW546426 B TW 546426B TW 090104216 A TW090104216 A TW 090104216A TW 90104216 A TW90104216 A TW 90104216A TW 546426 B TW546426 B TW 546426B
- Authority
- TW
- Taiwan
- Prior art keywords
- seed
- tip
- silicon
- crystal
- single crystal
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/36—Single-crystal growth by pulling from a melt, e.g. Czochralski method characterised by the seed, e.g. its crystallographic orientation
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/22—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000049553 | 2000-02-25 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW546426B true TW546426B (en) | 2003-08-11 |
Family
ID=18571477
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW090104216A TW546426B (en) | 2000-02-25 | 2001-02-23 | Method for producing silicon single crystal |
Country Status (7)
Country | Link |
---|---|
US (1) | US6506251B1 (fr) |
EP (1) | EP1193332B1 (fr) |
JP (1) | JP4165068B2 (fr) |
KR (1) | KR100799362B1 (fr) |
DE (1) | DE60138443D1 (fr) |
TW (1) | TW546426B (fr) |
WO (1) | WO2001063026A1 (fr) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003192488A (ja) | 2001-12-20 | 2003-07-09 | Wacker Nsce Corp | シリコン単結晶製造用種結晶及びシリコン単結晶の製造方法 |
EP1498517B1 (fr) * | 2002-04-24 | 2016-08-31 | Shin-Etsu Handotai Co., Ltd. | Procédé de production de silicium monocristallin, silicium monocristallin et plaquette de silicium |
JP2007223814A (ja) * | 2004-02-09 | 2007-09-06 | Sumco Techxiv株式会社 | 単結晶半導体の製造方法 |
US7396406B2 (en) | 2004-02-09 | 2008-07-08 | Sumco Techxiv Corporation | Single crystal semiconductor manufacturing apparatus and method |
WO2007120871A2 (fr) * | 2006-04-13 | 2007-10-25 | Cabot Corporation | Production de silicium selon un procédé en boucle fermée |
CN101148777B (zh) * | 2007-07-19 | 2011-03-23 | 任丙彦 | 直拉法生长掺镓硅单晶的方法和装置 |
JP5083001B2 (ja) * | 2008-04-08 | 2012-11-28 | 株式会社Sumco | シリコン単結晶の引上げ方法 |
JP4862884B2 (ja) * | 2008-05-21 | 2012-01-25 | 信越半導体株式会社 | シリコン単結晶の製造方法 |
JP5125983B2 (ja) * | 2008-10-20 | 2013-01-23 | 信越半導体株式会社 | シリコン単結晶の製造方法 |
KR101022918B1 (ko) | 2009-02-18 | 2011-03-16 | 주식회사 엘지실트론 | 무네킹 공정을 이용한 단결정 제조 방법 |
JP5491483B2 (ja) * | 2011-11-15 | 2014-05-14 | 株式会社タムラ製作所 | β−Ga2O3系単結晶の成長方法 |
JP5660020B2 (ja) | 2011-12-16 | 2015-01-28 | 信越半導体株式会社 | シリコン単結晶の製造方法 |
JP5805527B2 (ja) * | 2011-12-28 | 2015-11-04 | グローバルウェーハズ・ジャパン株式会社 | シリコン単結晶の製造方法 |
JP5756075B2 (ja) | 2012-11-07 | 2015-07-29 | 株式会社タムラ製作所 | β−Ga2O3系単結晶の育成方法 |
CN113073387A (zh) * | 2019-08-21 | 2021-07-06 | 眉山博雅新材料有限公司 | 无需退火的氧化物晶体生长方法及设备 |
CN115110146A (zh) * | 2022-06-30 | 2022-09-27 | 西安奕斯伟材料科技有限公司 | 籽晶及拉晶方法、装置 |
EP4428272A1 (fr) * | 2023-03-10 | 2024-09-11 | Siltronic AG | Procédé pour le tirage d'un lingot monocristallin en matériau semi-conducteur et plaquette en matériau semi-conducteur |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04104988A (ja) | 1990-08-20 | 1992-04-07 | Fujitsu Ltd | 単結晶成長方法 |
JPH04139092A (ja) | 1990-09-28 | 1992-05-13 | Fujitsu Ltd | シリコン単結晶の製造方法と種結晶 |
JP2937115B2 (ja) * | 1996-03-15 | 1999-08-23 | 住友金属工業株式会社 | 単結晶引き上げ方法 |
JP3387364B2 (ja) | 1997-05-21 | 2003-03-17 | 信越半導体株式会社 | シリコン種結晶およびその製造方法、並びにこれらの種結晶を用いてシリコン単結晶を製造する方法 |
US5885344A (en) * | 1997-08-08 | 1999-03-23 | Memc Electronic Materials, Inc. | Non-dash neck method for single crystal silicon growth |
US5932002A (en) * | 1997-08-28 | 1999-08-03 | Sumitomo Sitix Corporation | Seed crystals for pulling a single crystal and methods using the same |
JP3267225B2 (ja) * | 1997-12-26 | 2002-03-18 | 住友金属工業株式会社 | 単結晶引き上げ方法、及び単結晶引き上げ装置 |
JP3402210B2 (ja) * | 1997-12-27 | 2003-05-06 | 信越半導体株式会社 | シリコン単結晶の製造方法 |
JP3440819B2 (ja) | 1998-04-07 | 2003-08-25 | 信越半導体株式会社 | シリコン単結晶の製造方法 |
JP3065076B1 (ja) * | 1999-05-13 | 2000-07-12 | 住友金属工業株式会社 | 単結晶引き上げ方法及び単結晶引き上げ装置 |
-
2001
- 2001-02-21 US US09/959,302 patent/US6506251B1/en not_active Expired - Lifetime
- 2001-02-21 WO PCT/JP2001/001224 patent/WO2001063026A1/fr active Application Filing
- 2001-02-21 DE DE60138443T patent/DE60138443D1/de not_active Expired - Lifetime
- 2001-02-21 JP JP2001561828A patent/JP4165068B2/ja not_active Expired - Fee Related
- 2001-02-21 EP EP01906146A patent/EP1193332B1/fr not_active Expired - Lifetime
- 2001-02-21 KR KR1020017013579A patent/KR100799362B1/ko active IP Right Grant
- 2001-02-23 TW TW090104216A patent/TW546426B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
WO2001063026A1 (fr) | 2001-08-30 |
US6506251B1 (en) | 2003-01-14 |
KR20020006710A (ko) | 2002-01-24 |
KR100799362B1 (ko) | 2008-01-30 |
JP4165068B2 (ja) | 2008-10-15 |
EP1193332B1 (fr) | 2009-04-22 |
EP1193332A4 (fr) | 2007-10-31 |
EP1193332A1 (fr) | 2002-04-03 |
DE60138443D1 (de) | 2009-06-04 |
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Legal Events
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GD4A | Issue of patent certificate for granted invention patent | ||
MM4A | Annulment or lapse of patent due to non-payment of fees |