TW293908B - - Google Patents
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- Publication number
- TW293908B TW293908B TW084112836A TW84112836A TW293908B TW 293908 B TW293908 B TW 293908B TW 084112836 A TW084112836 A TW 084112836A TW 84112836 A TW84112836 A TW 84112836A TW 293908 B TW293908 B TW 293908B
- Authority
- TW
- Taiwan
- Prior art keywords
- semiconductor memory
- capacitor
- potential
- power supply
- memory
- Prior art date
Links
- 230000015654 memory Effects 0.000 claims description 76
- 239000003990 capacitor Substances 0.000 claims description 69
- 239000004065 semiconductor Substances 0.000 claims description 48
- 230000009471 action Effects 0.000 claims description 32
- 230000004913 activation Effects 0.000 claims description 3
- 230000005669 field effect Effects 0.000 claims description 2
- 238000012856 packing Methods 0.000 claims description 2
- PCTMTFRHKVHKIS-BMFZQQSSSA-N (1s,3r,4e,6e,8e,10e,12e,14e,16e,18s,19r,20r,21s,25r,27r,30r,31r,33s,35r,37s,38r)-3-[(2r,3s,4s,5s,6r)-4-amino-3,5-dihydroxy-6-methyloxan-2-yl]oxy-19,25,27,30,31,33,35,37-octahydroxy-18,20,21-trimethyl-23-oxo-22,39-dioxabicyclo[33.3.1]nonatriaconta-4,6,8,10 Chemical compound C1C=C2C[C@@H](OS(O)(=O)=O)CC[C@]2(C)[C@@H]2[C@@H]1[C@@H]1CC[C@H]([C@H](C)CCCC(C)C)[C@@]1(C)CC2.O[C@H]1[C@@H](N)[C@H](O)[C@@H](C)O[C@H]1O[C@H]1/C=C/C=C/C=C/C=C/C=C/C=C/C=C/[C@H](C)[C@@H](O)[C@@H](C)[C@H](C)OC(=O)C[C@H](O)C[C@H](O)CC[C@@H](O)[C@H](O)C[C@H](O)C[C@](O)(C[C@H](O)[C@H]2C(O)=O)O[C@H]2C1 PCTMTFRHKVHKIS-BMFZQQSSSA-N 0.000 claims 1
- 230000032823 cell division Effects 0.000 claims 1
- 239000011159 matrix material Substances 0.000 claims 1
- 238000000034 method Methods 0.000 description 27
- 230000010287 polarization Effects 0.000 description 23
- 230000008859 change Effects 0.000 description 12
- 238000001514 detection method Methods 0.000 description 6
- 230000006870 function Effects 0.000 description 6
- 230000008901 benefit Effects 0.000 description 5
- 238000006243 chemical reaction Methods 0.000 description 5
- 238000004088 simulation Methods 0.000 description 5
- 210000004027 cell Anatomy 0.000 description 4
- 208000029152 Small face Diseases 0.000 description 3
- 230000003321 amplification Effects 0.000 description 3
- 230000006866 deterioration Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000003199 nucleic acid amplification method Methods 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 230000000875 corresponding effect Effects 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000007667 floating Methods 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 238000005192 partition Methods 0.000 description 2
- 238000007639 printing Methods 0.000 description 2
- 102100033868 Cannabinoid receptor 1 Human genes 0.000 description 1
- 101710187010 Cannabinoid receptor 1 Proteins 0.000 description 1
- 206010041349 Somnolence Diseases 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 230000033228 biological regulation Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 210000000170 cell membrane Anatomy 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000002079 cooperative effect Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000002716 delivery method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP31629594A JP3590115B2 (ja) | 1994-12-20 | 1994-12-20 | 半導体メモリ |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW293908B true TW293908B (enExample) | 1996-12-21 |
Family
ID=18075530
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW084112836A TW293908B (enExample) | 1994-12-20 | 1995-12-01 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US5615145A (enExample) |
| JP (1) | JP3590115B2 (enExample) |
| KR (1) | KR100385363B1 (enExample) |
| TW (1) | TW293908B (enExample) |
Families Citing this family (43)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5682344A (en) * | 1995-09-11 | 1997-10-28 | Micron Technology, Inc. | Destructive read protection using address blocking technique |
| JP3645338B2 (ja) * | 1995-12-11 | 2005-05-11 | 株式会社東芝 | 不揮発性半導体記憶装置 |
| KR100601928B1 (ko) * | 1996-06-10 | 2006-10-04 | 삼성전자주식회사 | 강유전체랜덤액세서메모리의비휘발성유지장치및방법 |
| US5703804A (en) * | 1996-09-26 | 1997-12-30 | Sharp Kabushiki K.K. | Semiconductor memory device |
| KR100224673B1 (ko) * | 1996-12-13 | 1999-10-15 | 윤종용 | 불휘발성 강유전체 메모리장치 및 그의 구동방법 |
| US6097624A (en) | 1997-09-17 | 2000-08-01 | Samsung Electronics Co., Ltd. | Methods of operating ferroelectric memory devices having reconfigurable bit lines |
| JP3003628B2 (ja) * | 1997-06-16 | 2000-01-31 | 日本電気株式会社 | 強誘電体メモリとその書き込み方法 |
| KR100297874B1 (ko) | 1997-09-08 | 2001-10-24 | 윤종용 | 강유전체랜덤액세스메모리장치 |
| KR100247934B1 (ko) | 1997-10-07 | 2000-03-15 | 윤종용 | 강유전체 램 장치 및 그 제조방법 |
| US5986919A (en) * | 1997-11-14 | 1999-11-16 | Ramtron International Corporation | Reference cell configuration for a 1T/1C ferroelectric memory |
| US5995406A (en) * | 1997-11-14 | 1999-11-30 | Ramtron International Corporation | Plate line segmentation in a 1T/1C ferroelectric memory |
| US5969980A (en) * | 1997-11-14 | 1999-10-19 | Ramtron International Corporation | Sense amplifier configuration for a 1T/1C ferroelectric memory |
| US5892728A (en) * | 1997-11-14 | 1999-04-06 | Ramtron International Corporation | Column decoder configuration for a 1T/1C ferroelectric memory |
| US20050122765A1 (en) * | 1997-11-14 | 2005-06-09 | Allen Judith E. | Reference cell configuration for a 1T/1C ferroelectric memory |
| US6028783A (en) | 1997-11-14 | 2000-02-22 | Ramtron International Corporation | Memory cell configuration for a 1T/1C ferroelectric memory |
| US5956266A (en) * | 1997-11-14 | 1999-09-21 | Ramtron International Corporation | Reference cell for a 1T/1C ferroelectric memory |
| US5978251A (en) * | 1997-11-14 | 1999-11-02 | Ramtron International Corporation | Plate line driver circuit for a 1T/1C ferroelectric memory |
| US5880989A (en) * | 1997-11-14 | 1999-03-09 | Ramtron International Corporation | Sensing methodology for a 1T/1C ferroelectric memory |
| US6002634A (en) * | 1997-11-14 | 1999-12-14 | Ramtron International Corporation | Sense amplifier latch driver circuit for a 1T/1C ferroelectric memory |
| KR100457346B1 (ko) * | 1997-11-27 | 2005-04-06 | 삼성전자주식회사 | 강유전체 랜덤 액세스 메모리 장치 |
| JP3717097B2 (ja) * | 1998-07-29 | 2005-11-16 | 富士通株式会社 | 強誘電体メモリ |
| US6204723B1 (en) * | 1999-04-29 | 2001-03-20 | International Business Machines Corporation | Bias circuit for series connected decoupling capacitors |
| US6147895A (en) * | 1999-06-04 | 2000-11-14 | Celis Semiconductor Corporation | Ferroelectric memory with two ferroelectric capacitors in memory cell and method of operating same |
| KR100324594B1 (ko) * | 1999-06-28 | 2002-02-16 | 박종섭 | 강유전체 메모리 장치 |
| KR100318440B1 (ko) * | 1999-06-28 | 2001-12-24 | 박종섭 | 강유전체 메모리 장치 및 그의 구동방법 |
| US6392916B1 (en) * | 1999-10-01 | 2002-05-21 | Samsung Electronics Co., Ltd. | Circuit for providing an adjustable reference voltage for long-life ferroelectric random access memory device |
| JP2001297581A (ja) * | 2000-04-11 | 2001-10-26 | Fujitsu Ltd | データ読み出し方法及び半導体記憶装置 |
| JP4481464B2 (ja) * | 2000-09-20 | 2010-06-16 | 株式会社東芝 | 半導体記憶装置及びその製造方法 |
| KR100389032B1 (ko) * | 2000-11-21 | 2003-06-25 | 삼성전자주식회사 | 강유전체 메모리 장치 및 그의 제조 방법 |
| JP4329919B2 (ja) * | 2001-03-13 | 2009-09-09 | Ｏｋｉセミコンダクタ株式会社 | 半導体メモリおよび半導体メモリの駆動方法 |
| TW548803B (en) * | 2001-06-06 | 2003-08-21 | Matsushita Electric Industrial Co Ltd | Non-volatile selector and integrated circuit |
| US20040061990A1 (en) * | 2002-09-26 | 2004-04-01 | Dougherty T. Kirk | Temperature-compensated ferroelectric capacitor device, and its fabrication |
| CN100446118C (zh) * | 2003-03-19 | 2008-12-24 | 富士通微电子株式会社 | 半导体存储装置 |
| JP3783696B2 (ja) * | 2003-04-10 | 2006-06-07 | セイコーエプソン株式会社 | 強誘電体記憶装置のデータ記憶方法 |
| JP2005064427A (ja) | 2003-08-20 | 2005-03-10 | Elpida Memory Inc | 不揮発性ランダムアクセスメモリおよびその製造方法 |
| JP4545133B2 (ja) * | 2006-11-09 | 2010-09-15 | 富士通株式会社 | 半導体記憶装置及びその製造方法 |
| US8686415B2 (en) * | 2010-12-17 | 2014-04-01 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| JP6538426B2 (ja) | 2014-05-30 | 2019-07-03 | 株式会社半導体エネルギー研究所 | 半導体装置及び電子機器 |
| US10282108B2 (en) * | 2016-08-31 | 2019-05-07 | Micron Technology, Inc. | Hybrid memory device using different types of capacitors |
| WO2018044486A1 (en) | 2016-08-31 | 2018-03-08 | Micron Technology, Inc. | Apparatuses and methods including ferroelectric memory and for operating ferroelectric memory |
| EP3507806B1 (en) | 2016-08-31 | 2022-01-19 | Micron Technology, Inc. | Apparatuses and methods including ferroelectric memory and for accessing ferroelectric memory |
| WO2018044485A1 (en) | 2016-08-31 | 2018-03-08 | Micron Technology, Inc. | Ferroelectric memory cells |
| US10867675B2 (en) * | 2017-07-13 | 2020-12-15 | Micron Technology, Inc. | Apparatuses and methods for memory including ferroelectric memory cells and dielectric memory cells |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3222243B2 (ja) * | 1993-01-25 | 2001-10-22 | 株式会社日立製作所 | 半導体記憶装置とそれを用いた情報処理システム |
-
1994
- 1994-12-20 JP JP31629594A patent/JP3590115B2/ja not_active Expired - Lifetime
-
1995
- 1995-12-01 TW TW084112836A patent/TW293908B/zh not_active IP Right Cessation
- 1995-12-18 KR KR1019950051277A patent/KR100385363B1/ko not_active Expired - Fee Related
- 1995-12-20 US US08/580,090 patent/US5615145A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| KR100385363B1 (ko) | 2004-03-02 |
| KR960025784A (ko) | 1996-07-20 |
| JP3590115B2 (ja) | 2004-11-17 |
| US5615145A (en) | 1997-03-25 |
| JPH08171793A (ja) | 1996-07-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MK4A | Expiration of patent term of an invention patent |