TW263607B - - Google Patents
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- Publication number
- TW263607B TW263607B TW083111386A TW83111386A TW263607B TW 263607 B TW263607 B TW 263607B TW 083111386 A TW083111386 A TW 083111386A TW 83111386 A TW83111386 A TW 83111386A TW 263607 B TW263607 B TW 263607B
- Authority
- TW
- Taiwan
- Prior art keywords
- code
- memory
- address
- register
- multiplexer
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/40—Extraction of image or video features
- G06V10/44—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
- G06V10/457—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components by analysing connectivity, e.g. edge linking, connected component analysis or slices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Multimedia (AREA)
- Bioinformatics & Cheminformatics (AREA)
- Artificial Intelligence (AREA)
- Life Sciences & Earth Sciences (AREA)
- Bioinformatics & Computational Biology (AREA)
- Data Mining & Analysis (AREA)
- Evolutionary Biology (AREA)
- Evolutionary Computation (AREA)
- General Engineering & Computer Science (AREA)
- Image Analysis (AREA)
- Image Processing (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE4415798A DE4415798C1 (de) | 1994-05-05 | 1994-05-05 | Verfahren und Schaltungsanordnung zur Auflösung von Äquivalenzen zeilenförmig erfaßter topologisch zusammenhängender Bildstrukturen |
Publications (1)
Publication Number | Publication Date |
---|---|
TW263607B true TW263607B (de) | 1995-11-21 |
Family
ID=6517321
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW083111386A TW263607B (de) | 1994-05-05 | 1994-12-07 |
Country Status (6)
Country | Link |
---|---|
JP (1) | JP2903043B2 (de) |
KR (1) | KR100187884B1 (de) |
DE (1) | DE4415798C1 (de) |
FR (1) | FR2719684A1 (de) |
IT (1) | IT1279096B1 (de) |
TW (1) | TW263607B (de) |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60200379A (ja) * | 1984-03-26 | 1985-10-09 | Hitachi Ltd | 画像処理用セグメンテ−シヨン装置 |
JPS6273382A (ja) * | 1985-09-26 | 1987-04-04 | Sumitomo Electric Ind Ltd | ラベル付け方法 |
US4624073A (en) * | 1985-11-15 | 1986-11-25 | Traco | Locking tilt window sash and lock therefor |
US4791675A (en) * | 1985-12-31 | 1988-12-13 | Schlumberger Systems And Services, Inc. | VSP Connectivity pattern recognition system |
US4821336A (en) * | 1987-02-19 | 1989-04-11 | Gtx Corporation | Method and apparatus for simplifying runlength data from scanning of images |
JP2878278B2 (ja) * | 1987-02-25 | 1999-04-05 | キヤノン株式会社 | 画像処理方法 |
JPS63284685A (ja) * | 1987-05-15 | 1988-11-21 | Fujitsu Ltd | ラベル付け方法 |
JPH0644290B2 (ja) * | 1987-12-14 | 1994-06-08 | 富士通株式会社 | 連結領域のラベル付け回路 |
JPH01245366A (ja) * | 1988-03-28 | 1989-09-29 | Toshiba Eng Co Ltd | ラベリングプロセッサ |
JPH01292478A (ja) * | 1988-05-19 | 1989-11-24 | Fujitsu Ltd | 画像データのラベリング方式 |
JPH02187874A (ja) * | 1989-01-17 | 1990-07-24 | Mitsubishi Heavy Ind Ltd | 画像処理装置 |
JPH0546760A (ja) * | 1991-08-19 | 1993-02-26 | Matsushita Electric Ind Co Ltd | ラベリングプロセツサ |
-
1994
- 1994-05-05 DE DE4415798A patent/DE4415798C1/de not_active Expired - Fee Related
- 1994-12-07 TW TW083111386A patent/TW263607B/zh active
-
1995
- 1995-01-04 FR FR9500034A patent/FR2719684A1/fr active Pending
- 1995-01-09 IT IT95TO000007A patent/IT1279096B1/it active IP Right Grant
- 1995-01-31 JP JP7014711A patent/JP2903043B2/ja not_active Expired - Fee Related
- 1995-04-18 KR KR1019950009049A patent/KR100187884B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JPH0830791A (ja) | 1996-02-02 |
KR100187884B1 (ko) | 1999-06-01 |
KR950033943A (ko) | 1995-12-26 |
JP2903043B2 (ja) | 1999-06-07 |
FR2719684A1 (fr) | 1995-11-10 |
IT1279096B1 (it) | 1997-12-04 |
ITTO950007A1 (it) | 1996-07-09 |
ITTO950007A0 (it) | 1995-01-09 |
DE4415798C1 (de) | 1995-08-03 |
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