TW234217B - - Google Patents

Info

Publication number
TW234217B
TW234217B TW083102967A TW83102967A TW234217B TW 234217 B TW234217 B TW 234217B TW 083102967 A TW083102967 A TW 083102967A TW 83102967 A TW83102967 A TW 83102967A TW 234217 B TW234217 B TW 234217B
Authority
TW
Taiwan
Application number
TW083102967A
Original Assignee
Nat Semiconductor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nat Semiconductor Corp filed Critical Nat Semiconductor Corp
Application granted granted Critical
Publication of TW234217B publication Critical patent/TW234217B/zh

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
    • H03K19/08—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices
    • H03K19/094—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors
    • H03K19/09425—Multistate logic
    • H03K19/09429—Multistate logic one of the states being the high impedance or floating state
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003—Modifications for increasing the reliability for protection
    • H03K19/00315—Modifications for increasing the reliability for protection in field-effect transistor circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/0018—Special modifications or use of the back gate voltage of a FET
TW083102967A 1993-02-10 1994-04-06 TW234217B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US1572693A 1993-02-10 1993-02-10

Publications (1)

Publication Number Publication Date
TW234217B true TW234217B (zh) 1994-11-11

Family

ID=21773225

Family Applications (1)

Application Number Title Priority Date Filing Date
TW083102967A TW234217B (zh) 1993-02-10 1994-04-06

Country Status (5)

Country Link
US (2) US5387826A (zh)
EP (1) EP0683937A1 (zh)
KR (1) KR960701514A (zh)
TW (1) TW234217B (zh)
WO (1) WO1994018755A1 (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101750900B (zh) * 2008-12-16 2011-07-20 上海华虹Nec电子有限公司 判断哪个光刻工序造成以曝光面积为单位的低良率的方法
TWI803228B (zh) * 2022-01-04 2023-05-21 南亞科技股份有限公司 介面電路

Families Citing this family (68)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3311133B2 (ja) * 1994-02-16 2002-08-05 株式会社東芝 出力回路
JP3031195B2 (ja) * 1995-02-28 2000-04-10 株式会社日立製作所 入出力バッファ回路装置
JP3441238B2 (ja) * 1995-06-02 2003-08-25 株式会社東芝 出力回路
US5565794A (en) * 1995-06-23 1996-10-15 Advanced Micro Devices, Inc. Voltage range tolerant CMOS output buffer with reduced input capacitance
US5543733A (en) * 1995-06-26 1996-08-06 Vlsi Technology, Inc. High voltage tolerant CMOS input/output circuit
US5534789A (en) * 1995-08-07 1996-07-09 Etron Technology, Inc. Mixed mode output buffer circuit for CMOSIC
US5574389A (en) * 1995-08-09 1996-11-12 Taiwan Semiconductor Manufacturing Company Ltd. CMOS 3.3 volt output buffer with 5 volt protection
US5629634A (en) * 1995-08-21 1997-05-13 International Business Machines Corporation Low-power, tristate, off-chip driver circuit
JP3190233B2 (ja) * 1995-08-22 2001-07-23 株式会社東芝 出力バッファ回路
US5546019A (en) * 1995-08-24 1996-08-13 Taiwan Semiconductor Manufacture Company CMOS I/O circuit with 3.3 volt output and tolerance of 5 volt input
SG43411A1 (en) * 1995-09-26 1997-10-17 Texas Instruments Inc Circuitry for providing a high impedance state when powering down a single port node
KR19980701948A (ko) * 1995-12-01 1998-06-25 요트. 게. 아. 롤페즈 버스 콘덕터 및 버스 인터페이스 회로를 갖춘 회로
DE69621576T2 (de) * 1995-12-26 2002-12-19 Toshiba Kawasaki Kk Integrierte Halbleiterschaltung
US5736869A (en) * 1996-05-16 1998-04-07 Lsi Logic Corporation Output driver with level shifting and voltage protection
US6147511A (en) 1996-05-28 2000-11-14 Altera Corporation Overvoltage-tolerant interface for integrated circuits
DE19628270C2 (de) * 1996-07-12 2000-06-21 Ericsson Telefon Ab L M Störsichere Schnittstellenschaltung
US5844425A (en) * 1996-07-19 1998-12-01 Quality Semiconductor, Inc. CMOS tristate output buffer with having overvoltage protection and increased stability against bus voltage variations
US5864243A (en) * 1996-09-18 1999-01-26 Vlsi Technology, Inc. Buffer and method for transferring data therein
US5821796A (en) * 1996-09-23 1998-10-13 Texas Instruments Incorporated Circuitry for providing a high impedance state when powering down a single port node
US5880605A (en) * 1996-11-12 1999-03-09 Lsi Logic Corporation Low-power 5 volt tolerant input buffer
US5777490A (en) * 1996-11-27 1998-07-07 International Business Machines Corporation Circuitry and method for translating voltages
US5804998A (en) * 1996-12-26 1998-09-08 International Business Machines Corporation Voltage upwardly compliant CMOS off-chip driver
US5933025A (en) * 1997-01-15 1999-08-03 Xilinx, Inc. Low voltage interface circuit with a high voltage tolerance
JP3544819B2 (ja) * 1997-03-31 2004-07-21 株式会社 沖マイクロデザイン 入力回路および出力回路ならびに入出力回路
US5969541A (en) * 1997-05-19 1999-10-19 Stmicroelectronics, Inc. Current inhibiting I/O buffer having a 5 volt tolerant input and method of inhibiting current
US5990705A (en) * 1997-06-04 1999-11-23 Oak Technology, Inc. CMOS I/O circuit with high-voltage input tolerance
US5929667A (en) * 1997-06-10 1999-07-27 International Business Machines Corporation Method and apparatus for protecting circuits subjected to high voltage
US6028449A (en) * 1997-08-05 2000-02-22 Lsi Logic Corporation Integrated circuit I/O buffer having pull-up to voltages greater than transistor tolerance
US5963057A (en) * 1997-08-05 1999-10-05 Lsi Logic Corporation Chip level bias for buffers driving voltages greater than transistor tolerance
US5966030A (en) * 1997-08-05 1999-10-12 Lsi Logic Corporation Output buffer with regulated voltage biasing for driving voltages greater than transistor tolerance
US5900750A (en) * 1997-08-15 1999-05-04 Lsi Logic Corporation 5V output driver on 2.5V technology
US5917348A (en) * 1997-09-02 1999-06-29 Industrial Technology Research Institute--Computer & Communication Research Labs. CMOS bidirectional buffer for mixed voltage applications
US6005413A (en) * 1997-09-09 1999-12-21 Lsi Logic Corporation 5V tolerant PCI I/O buffer on 2.5V technology
US6255850B1 (en) 1997-10-28 2001-07-03 Altera Corporation Integrated circuit with both clamp protection and high impedance protection from input overshoot
US6208167B1 (en) * 1997-11-19 2001-03-27 S3 Incorporated Voltage tolerant buffer
JP3542476B2 (ja) * 1997-12-01 2004-07-14 三菱電機株式会社 Ｓｏｉ構造のｃｍｏｓ回路
US6150843A (en) * 1998-01-29 2000-11-21 Vlsi Technology, Inc. Five volt tolerant I/O buffer
US6043680A (en) * 1998-02-02 2000-03-28 Tritech Microelectronics, Ltd. 5V tolerant I/O buffer
US6185713B1 (en) * 1998-04-09 2001-02-06 Pmc-Sierra Ltd. Method and apparatus for improving stuck-at fault detection in large scale integrated circuit testing
US6118303A (en) * 1998-04-17 2000-09-12 Lsi Logic Corporation Integrated circuit I/O buffer having pass gate protection with RC delay
US6141200A (en) * 1998-04-20 2000-10-31 International Business Machines Corporation Stacked PFET off-chip driver with a latch bias generator for overvoltage protection
US6014039A (en) * 1998-04-28 2000-01-11 Lucent Technologies Inc. CMOS high voltage drive output buffer
US6268748B1 (en) 1998-05-06 2001-07-31 International Business Machines Corp. Module with low leakage driver circuits and method of operation
US6118301A (en) * 1998-05-26 2000-09-12 Analog Devices, Inc. High voltage tolerant and compliant driver circuit
US6265926B1 (en) 1998-05-27 2001-07-24 Altera Corporation Programmable PCI overvoltage input clamp
US6414360B1 (en) 1998-06-09 2002-07-02 Aeroflex Utmc Microelectronic Systems, Inc. Method of programmability and an architecture for cold sparing of CMOS arrays
US6130556A (en) * 1998-06-16 2000-10-10 Lsi Logic Corporation Integrated circuit I/O buffer with 5V well and passive gate voltage
JP2002533971A (ja) * 1998-12-18 2002-10-08 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 過電圧保護ｉ／ｏバッファ
KR100292408B1 (ko) 1999-03-04 2001-06-01 윤종용 고 전압 톨러런트 인터페이스 회로
JP2001022483A (ja) * 1999-07-05 2001-01-26 Mitsubishi Electric Corp ホットプラグ対応ｉ／ｏ回路
US6300800B1 (en) 1999-11-24 2001-10-09 Lsi Logic Corporation Integrated circuit I/O buffer with series P-channel and floating well
US6580291B1 (en) 2000-12-18 2003-06-17 Cypress Semiconductor Corp. High voltage output buffer using low voltage transistors
US6724594B2 (en) * 2000-12-20 2004-04-20 National Semiconductor Corporation Over voltage protection test multiplexer and methods of operating the same
US6597222B2 (en) * 2001-10-15 2003-07-22 Exar Corporation Power down circuit for high output impedance state of I/O driver
US6765433B1 (en) * 2003-03-20 2004-07-20 Atmel Corporation Low power implementation for input signals of integrated circuits
JP2004336010A (ja) * 2003-04-16 2004-11-25 Seiko Epson Corp 半導体集積回路、電子機器、及びトランジスタのバックゲート電位制御方法
EP1628399B1 (en) * 2003-05-28 2009-05-20 Fujitsu Microelectronics Limited Semiconductor device
US6774675B1 (en) 2003-06-24 2004-08-10 Fairchild Semiconductor Corporation Bus hold circuit with power-down and over-voltage tolerance
US6940305B2 (en) * 2003-11-07 2005-09-06 Texas Instruments Incorporated Low leakage Ioff and overvoltage Ioz circuit
US7098833B2 (en) * 2004-06-04 2006-08-29 Texas Instruments Incorporated Tri-value decoder circuit and method
JP4199706B2 (ja) * 2004-07-13 2008-12-17 富士通マイクロエレクトロニクス株式会社 降圧回路
US8018268B1 (en) * 2004-11-19 2011-09-13 Cypress Semiconductor Corporation Over-voltage tolerant input circuit
KR101548242B1 (ko) * 2008-07-21 2015-09-04 삼성전자주식회사 반도체 장치의 출력구동장치, 이의 동작 방법, 및 이를 포함하는 전자 처리 장치
EP2568606B1 (en) * 2011-09-06 2014-03-19 ST-Ericsson SA Electronic device with body-biasing circuit for portable equipment with USB connector for headset
CN105790753B (zh) * 2014-12-25 2018-12-21 中芯国际集成电路制造(上海)有限公司 输出缓冲器
JP6421624B2 (ja) * 2015-01-29 2018-11-14 株式会社ソシオネクスト 降圧電源回路および集積回路
JP6588344B2 (ja) * 2016-01-15 2019-10-09 株式会社ジャパンディスプレイ トランジスタ基板及び表示装置
US10476502B2 (en) * 2017-04-28 2019-11-12 Cirrus Logic, Inc. Control of switches in a variable impedance element

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50144372A (zh) * 1974-05-09 1975-11-20
JPS58128089A (ja) * 1981-12-26 1983-07-30 Fujitsu Ltd 半導体記憶装置
GB2133946B (en) * 1983-01-14 1986-02-26 Itt Ind Ltd Memory output circuit
CN1004736B (zh) * 1984-10-17 1989-07-05 株式会社日立制作所 互补半导体器件
JPS61164249A (ja) * 1985-01-16 1986-07-24 Fujitsu Ltd 半導体装置
US4670668A (en) * 1985-05-09 1987-06-02 Advanced Micro Devices, Inc. Substrate bias generator with power supply control means to sequence application of bias and power to prevent CMOS SCR latch-up
US4670861A (en) * 1985-06-21 1987-06-02 Advanced Micro Devices, Inc. CMOS N-well bias generator and gating system
JPH0770216B2 (ja) * 1985-11-22 1995-07-31 株式会社日立製作所 半導体集積回路
US4906056A (en) * 1987-04-14 1990-03-06 Mitsubishi Denki Kabushiki Kaisha High speed booster circuit
US5087579A (en) * 1987-05-28 1992-02-11 Texas Instruments Incorporated Method for fabricating an integrated bipolar-CMOS circuit isolation for providing different backgate and substrate bias
US5060044A (en) * 1987-05-28 1991-10-22 Texas Instruments Incorporated Integrated bipolar-CMOS circuit isolation for providing different backgate and substrate bias
US4825275A (en) * 1987-05-28 1989-04-25 Texas Instruments Incorporated Integrated bipolar-CMOS circuit isolation for providing different backgate and substrate bias
US4782250A (en) * 1987-08-31 1988-11-01 International Business Machines Corporation CMOS off-chip driver circuits
GB8927536D0 (en) * 1989-12-06 1990-02-07 Ecc Int Ltd Paper coating
JPH07105448B2 (ja) * 1988-03-14 1995-11-13 日本電気株式会社 Ｍｏｓ型集積回路
US4961010A (en) * 1989-05-19 1990-10-02 National Semiconductor Corporation Output buffer for reducing switching induced noise
US4963766A (en) * 1989-06-28 1990-10-16 Digital Equipment Corporation Low-voltage CMOS output buffer
US5027008A (en) * 1990-02-15 1991-06-25 Advanced Micro Devices, Inc. CMOS clamp circuits
US5036222A (en) * 1990-02-22 1991-07-30 National Semiconductor Corporation Output buffer circuit with output voltage sensing for reducing switching induced noise
US5151619A (en) * 1990-10-11 1992-09-29 International Business Machines Corporation Cmos off chip driver circuit
US5117129A (en) * 1990-10-16 1992-05-26 International Business Machines Corporation Cmos off chip driver for fault tolerant cold sparing
US5134316A (en) * 1990-12-12 1992-07-28 Vlsi Technology, Inc. Precharged buffer with reduced output voltage swing
US5160855A (en) * 1991-06-28 1992-11-03 Digital Equipment Corporation Floating-well CMOS output driver
US5172016A (en) * 1991-06-28 1992-12-15 Digital Equipment Corporation Five-volt tolerant differential receiver
US5191244A (en) * 1991-09-16 1993-03-02 Advanced Micro Devices, Inc. N-channel pull-up transistor with reduced body effect
US5266849A (en) * 1992-02-19 1993-11-30 Hal Computer Systems, Inc. Tri state buffer circuit for dual power system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101750900B (zh) * 2008-12-16 2011-07-20 上海华虹Nec电子有限公司 判断哪个光刻工序造成以曝光面积为单位的低良率的方法
TWI803228B (zh) * 2022-01-04 2023-05-21 南亞科技股份有限公司 介面電路
US11677399B1 (en) 2022-01-04 2023-06-13 Nanya Technology Corporation Interface circuit

Also Published As

Publication number Publication date
US5387826A (en) 1995-02-07
US5450025A (en) 1995-09-12
KR960701514A (ko) 1996-02-24
WO1994018755A1 (en) 1994-08-18
EP0683937A1 (en) 1995-11-29

Similar Documents

Publication Publication Date Title
TW234217B (zh)
DE9307485U1 (zh)
DE9302447U1 (zh)
DE9302870U1 (zh)
DE9303350U1 (zh)
DE9307724U1 (zh)
DE9302370U1 (zh)
DE9300202U1 (zh)
DE9307450U1 (zh)
DE9307318U1 (zh)
DE9305827U1 (zh)
DE9302015U1 (zh)
DE9302513U1 (zh)
DE9304102U1 (zh)
DE9300952U1 (zh)
DE9302983U1 (zh)
DE9300322U1 (zh)
DE9301203U1 (zh)
DE9304735U1 (zh)
DE9306488U1 (zh)
DE9308331U1 (zh)
DE9300584U1 (zh)
DE9300457U1 (zh)
DE9305939U1 (zh)
DE9300669U1 (zh)

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees