TW202401678A - 電子封裝件及其製法 - Google Patents

電子封裝件及其製法 Download PDF

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TW202401678A
TW202401678A TW111123709A TW111123709A TW202401678A TW 202401678 A TW202401678 A TW 202401678A TW 111123709 A TW111123709 A TW 111123709A TW 111123709 A TW111123709 A TW 111123709A TW 202401678 A TW202401678 A TW 202401678A
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photonic
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高灃
王隆源
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矽品精密工業股份有限公司
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Priority to CN202210805110.XA priority patent/CN117352502A/zh
Priority to US17/944,453 priority patent/US20230420391A1/en
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Abstract

一種電子封裝件,主要於一具有複數導電穿孔及至少一外接部之光子元件上配置一電性連接該導電穿孔之電子元件與一具有鏤空區之功能件,再以包覆層包覆該電子元件與該功能件,以令該外接部外露於該鏤空區與該包覆層,供光纖伸入該鏤空區中而連接該外接部,以達到光電整合之目的。

Description

電子封裝件及其製法
本發明係有關一種半導體裝置,尤指一種具光子元件之電子封裝件及其製法。
隨著電子產業的蓬勃發展,電子產品也逐漸邁向多功能、高性能的趨勢。目前第五代(5G)通訊技術的應用已擴展到物聯網(Internet of Things,簡稱IoT)、工業物聯網(Industrial Internet of Things,簡稱IIoT)、雲端(Cloud)、人工智慧(artificial intelligence,簡稱AI)、自動駕駛汽車(Autonomous Car)與醫療(Medical)等領域,且隨著應用層面的擴展在過程中將會產生非常大量的數據需要有效率的被傳輸、被計算與被儲存。因此,近年來,大型資料中心與雲端伺服器對於數據的傳輸需求是大量的湧現,產業開始進入光通訊領域,使用「光」取代「電」作為數據傳輸的載體。
光通訊可提高傳輸的容量/效率/距離,以增加資料頻寬與降低單位能耗,故矽光子(Silicon Photonics)的元件及其應用之產品進而開始重新被重視存在的價值與研發。
因此,如何整合矽光子的元件於封裝製程中,實已成為目前業界亟待克服之難題。
鑑於上述習知技術之種種缺失,本發明係提供一種電子封裝件,係包括:光子元件,係具有相對之第一側、第二側及複數連通該第一側與第二側之導電穿孔,且該第一側係配置有電性連接該複數導電穿孔之外接部及複數未電性連接該複數導電穿孔與該外接部之虛接墊;電子元件,係設於該光子元件之第一側上並電性連接該複數導電穿孔;功能件,係藉由複數虛接凸塊結合至該複數虛接墊上以設於該光子元件之第一側上且具有貫穿該功能件之鏤空區,以令該外接部外露於該鏤空區,其中,該功能件係未電性連接該光子元件;以及包覆層,係設於該光子元件之第一側上且包覆該電子元件與該功能件,以令該包覆層外露該鏤空區,供光纖連接該鏤空區中之該外接部。
本發明復提供一種電子封裝件之製法,係包括:提供光子元件、電子元件與具有凹部之功能件,其中,該光子元件具有相對之第一側、第二側及複數連通該第一側與第二側之導電穿孔,且該第一側係配置有電性連接該複數導電穿孔之外接部與複數電性接觸墊、及複數未電性連接該複數導電穿孔與該外接部之虛接墊;將該電子元件設於該光子元件之第一側之該複數電性接觸墊上,且將該功能件以其凹部朝向該外接部而藉由複數虛接凸塊結合至該複數虛接墊上以設於該光子元件之第一側上,並使該凹部疊合於該外接部上,其中,該電子元件電性連接該複數導電穿孔,且該功能件未電性連接該光子元件;形成包覆層於該光子元件之第一側上,以令該包覆層包覆該電子元件與該功能件;以及 移除該包覆層之部分材質與該功能件之部分材質,以令該凹部形成貫穿該功能件之鏤空區,使該外接部外露於該鏤空區及該包覆層。
前述之製法中,係採用單一次研磨作業,以移除該包覆層之部分材質與該功能件之部分材質。
前述之電子封裝件及其製法,復包括佈設擋塊於該光子元件之第一側上,以令該複數虛接墊圍繞該擋塊,且使該擋塊圍繞該外接部,並於形成該鏤空區後,該擋塊對應沿該鏤空區之邊緣配置。
前述之電子封裝件及其製法,復包括於形成該鏤空區後,將一封裝基板接置於該光子元件之第二側上。
前述之電子封裝件及其製法,復包括於形成該鏤空區前,將一封裝基板接置於該光子元件之第二側上。進一步,於形成該鏤空區前,於該封裝基板上配置至少一止擋件,使該止擋件環繞該光子元件。
前述之電子封裝件及其製法中,該複數虛接凸塊係包含銲錫材料。
由上可知,本發明之電子封裝件及其製法中,主要藉由該光子元件具有導電穿孔之設計,以堆疊該電子元件而垂直整合至該封裝基板上,不僅達到光電整合之目的,且該電子元件之訊號直接傳遞至該光子元件,而該光子元件之訊號直接傳遞至該光纖,使該電子元件與該光纖之間的訊號傳輸路徑可大幅縮短,以有效加快訊號傳輸速度,因而可符合該電子封裝件對於快速運作之效能需求,進而使應用該電子封裝件之電子產品可於消費市場上具備競爭力。
1:半導體基材
2,3,4a,4b,5:電子封裝件
2a:光子元件
20:半導體結構體
20a:第一側
20b:第二側
200:導電穿孔
21:電子元件
21a:作用面
21b:非作用面
210:電極墊
211:導電凸塊
211a,221a:銲錫材料
211b,221b:銅柱
212,222,281:底膠
22:功能件
220:凹部
221:虛接凸塊
23:包覆層
23a:第一表面
23b:第二表面
24:線路結構
240:介電層
241:線路重佈層
242,252:電性接觸墊
243:外接部
244:虛接墊
25:佈線結構
250:絕緣層
251:線路層
26:導電元件
27:光纖
28:封裝基板
280:銲球
282:止擋件
29:散熱件
3a:封裝模組
42:擋塊
A:鏤空區
L,S:切割路徑
圖1係為本發明之電子封裝件之製法之第一實施例之前置步驟之剖視示意圖。
圖2A至圖2D係為本發明之電子封裝件之製法之第一實施例之剖視示意圖。
圖2E係為圖2D之後續製程之剖視示意圖。
圖2F係為圖2E之另一方式之剖視示意圖。
圖3A至圖3E係為本發明之電子封裝件之製法之第二實施例之剖視示意圖。
圖4A係為圖2A之另一方式之剖視示意圖。
圖4A-1係為圖4A之後續製程之局部上視示意圖。
圖4B係為圖4A之後續製程之剖視示意圖。
圖4C係為圖4B之另一態樣之剖視示意圖。
以下藉由特定的具體實施例說明本發明之實施方式,熟悉此技藝之人士可由本說明書所揭示之內容輕易地瞭解本發明之其他優點及功效。
須知,本說明書所附圖式所繪示之結構、比例、大小等,均僅用以配合說明書所揭示之內容,以供熟悉此技藝之人士之瞭解與閱讀,並非用以限定本發明可實施之限定條件,故不具技術上之實質意義,任何結構之修飾、比例關係之改變或大小之調整,在不影響本發明所能產生之功效及所能達成之目的下,均應仍落在本發明所揭示之技術內容得能涵蓋之範圍內。同時,本說明書中所引用之如「上」、「第一」、「第二」、「一」等之用語,亦僅為便於敘述之 明瞭,而非用以限定本發明可實施之範圍,其相對關係之改變或調整,在無實質變更技術內容下,當亦視為本發明可實施之範疇。
圖1係為本發明之電子封裝件2之製法之第一實施例之前置步驟的剖面示意圖。圖2A至圖2D係為本發明之電子封裝件2之製法之第一實施例的剖而示意圖。
如圖1所示,將一包含有複數功能件22陣列排列之半導體基材1進行切單作業,以獲取複數具有凹部220及該複數虛接凸塊(dummy bump)221之功能件22。
於本實施例中,該些虛接凸塊221係包含銲錫材料221a及/或其它金屬材料,如銅柱(Cu pillar)221b。
如圖2A所示,提供一包含有複數光子元件(Photonic die)2a陣列排列之晶圓級(wafer form)板體或整版面(panel)板體、至少一電子元件21及至少一具有凹部220之功能件22。該電子元件21與該功能件22係設於該光子元件2a上。
所述之光子元件2a係包含一半導體結構體20,如矽基板、玻璃板或其它適當板材,其具有相對之第一側20a與第二側20b,以採用導電矽穿孔(Through-silicon via,簡稱TSV)製程形成複數連通該第一側20a與第二側20b之導電穿孔200。
於本實施例中,該光子元件2a復包含至少一設於該第一側20a上並電性連接該導電穿孔200之線路結構24,其具有至少一介電層240、設於該介電層240上且電性連接該導電穿孔200之線路重佈層(redistribution layer,簡稱RDL)241及複數設於該介電層240上並外露於該介電層240之虛接墊(dummy pad)244,且最外層之線路重佈層241係具有複數外露於該介電層240之電性接觸墊242,如微墊(micro pad,俗稱μ-pad),其中,該複數電性接觸墊242之至少其中一者係作為外接部243,以令該些虛接墊244環繞該外接部243。例如,形成該線路重佈層 241之材質係為銅,且形成該介電層240之材質係為如聚對二唑苯(Polybenzoxazole,簡稱PBO)、聚醯亞胺(Polyimide,簡稱PI)、預浸材(Prepreg,簡稱PP)或其它等之介電材。
再者,該光子元件2a可於其半導體結構體20之第二側20b上形成一電性連接該導電穿孔200之佈線結構25。例如,該佈線結構25係包括至少一絕緣層250及設於該絕緣層250上且電性連接該導電穿孔200之線路層251,其中,該線路層251可具有複數電性接觸墊252,如C4型規格。例如,形成該線路層251之材質係為銅,且形成該絕緣層250之材質係為如聚對二唑苯(PBO)、聚醯亞胺(PI)、預浸材(PP)或其它等之介電材。
又,該些虛接墊244與該線路重佈層241係分開配置而未相互連接,故該些虛接墊244未電性連接該線路重佈層241,使該些虛接墊244無訊號傳輸之功能。
所述之電子元件21係為主動元件、被動元件或其組合者,其中,該主動元件係例如半導體晶片,而該被動元件係例如電阻、電容及電感。
於本實施例中,該電子元件21係為半導體晶片,其具有相對之作用面21a與非作用面21b,該作用面21a具有複數電極墊210,以藉由複數導電凸塊211採用覆晶方式銲接該線路重佈層241,並以底膠212包覆該些導電凸塊211。例如,該些導電凸塊211係包含銲錫材料211a及/或其它金屬材料,如銅柱211b。
應可理解地,有關該電子元件21電性連接該光子元件2a之方式繁多,例如,該電子元件21可藉由複數銲線(圖略)以打線方式電性連接該線路重佈層241、或直接接觸該線路重佈層241等,故不限於上述。
所述之功能件22係藉由複數虛接凸塊(dummy bump)221結合至該些虛接墊244上,使該功能件22無法電性連接該光子元件2a或該線路結構24,且 該功能件22以其凹部220對應設置於該外接部243上方,其中,該凹部220未貫穿該功能件22。
於本實施例中,所述之功能件22係為半導體結構,其無傳遞訊號功能之電極,如虛晶片(dummy die),故基於簡化製程之目的,該功能件22與該電子元件21係可採用相同製程以設於該光子元件2a上。例如,採用覆晶製程,將該功能件22藉由該複數虛接凸塊221以凹部220朝向該光子元件2a(或該線路結構24)之方式銲接至該光子元件2a之第一側20a或該線路結構24上,並以底膠222包覆該些虛接凸塊221,其中,該些虛接凸塊221係作為支撐用,並無傳遞訊號功能,故採用銲錫材料211a或其它金屬材料,以增加支撐力。
因此,該功能件22藉由該些虛接凸塊221的銲接不僅可增強接合力,且可與該電子元件21採用相同置晶(die bond)製程,以減少於生產線上進行不同置晶製程之切換時間。
再者,該底膠222未覆蓋該外接部243,且該底膠222可填入或未填入該凹部220中。
如圖2B所示,形成一包覆層23於該光子元件2a之第一側20a(或該線路結構24)上,以令該包覆層23包覆該電子元件21、該功能件22與該些底膠212,222,使該包覆層23保護該電子元件21以強化整體封裝件之結構強度,其中,該包覆層23係具有相對之第一表面23a與第二表面23b,以令該包覆層23以其第一表面23a結合至該線路結構24之介電層240(或該光子元件2a之第一側20a)上。
於本實施例中,該包覆層23係為絕緣材,如聚醯亞胺(polyimide,簡稱PI)、乾膜(dry film)、如環氧樹脂(epoxy)之封裝膠體或封裝材(molding compound)。例如,該包覆層23之製程可選擇液態封膠(liquid compound)、噴塗(injection)、壓合(lamination)或模壓(compression molding)等方式形成於該線路結構24(或該光子元件2a之第一側20a)上。
如圖2C所示,移除該包覆層23之第二表面23b之部分材質及該功能件22之部分材質,以令先前位於該功能件22中之該凹部220貫穿經薄化後之該功能件22,供作為鏤空區A,進而使該外接部243外露於該鏤空區A及該包覆層23之第二表面23b。
於本實施例中,可採用單一次研磨作業移除該包覆層23之第二表面23b之部分材質及該功能件22之部分材質。
再者,可藉由研磨方式一併進行整平製程,使該包覆層23之第二表面23b齊平該電子元件21之非作用面21b,以令該電子元件21之非作用面21b外露於該包覆層23之第二表面23b。應可理解地,該整平製程係可依需求移除該電子元件21之非作用面21b之部分材質。
如圖2D所示,於形成該鏤空區A後,先於該光子元件2a之第二側20b之電性接觸墊252上結合複數如銲錫凸塊或銲球之導電元件26,使該光子元件2a電性連接該些導電元件26,再沿如圖2C所示之切割路徑L進行切單製程,以獲取複數電子封裝件2。
於本實施例中,該鏤空區A可依需求插入至少一光纖27,以令該光纖27電性連接該外接部243。應可理解地,該功能件22係圍繞該外接部243以形成一插槽,供該光纖27對位該外接部243之用,故該功能件22不需配置線路,因而不同於習知電子連接器12需配置線路之結構。
再者,如圖2E所示之電子封裝件5之另一態樣,該光子元件2a亦可藉由該些導電元件26設於一封裝基板28上側,使該光子元件2a電性連接該封裝基板28,再於該封裝基板28上形成底膠281,以包覆該些導電元件26,且於該封裝基板28下側可進行植球製程以形成複數電性連接該封裝基板28之銲球280,供於後續製程中,該電子封裝件5可藉由該些銲球280設於一電路板(圖略)上。進一步,該封裝基板28上側係可依需求設置一散熱件29。
較佳地,如圖2F所示,於形成該底膠281前,可於該封裝基板28上配置至少一環繞該光子元件2a之如絕緣材、半導體材或導電材等製作之止擋件(dam)282,以限制該底膠281之佈設區域,故能避免該底膠281溢流至該封裝基板28上之其它區域而污染線路之問題。
因此,本發明之製法藉由該光子元件2a具有導電穿孔200之設計,以堆疊該電子元件21而垂直整合至該封裝基板28上,不僅達到光電整合之目的,且該電子元件21之訊號能直接傳遞至該光子元件2a,而該光子元件2a之訊號藉由該鏤空區A能直接傳遞至該光纖27,故本發明之電子封裝件2能大幅縮短該電子元件21與該光纖27之間的訊號傳輸路徑,以有效加快訊號傳輸速度,因而能符合該電子封裝件2對於快速運作之效能需求,進而使應用該電子封裝件2之電子產品於消費市場上具備競爭力。
再者,於另一態樣中,該電子元件21與該光纖27之間的訊號傳輸路徑亦可依序為電子元件21、光子元件2a、封裝基板28、光子元件2a及光纖27,故本發明僅需經由該封裝基板28轉傳一次,因而本發明之電子封裝件3,5於該電子元件21與該光纖27之間的訊號傳輸路徑仍符合需求。
又,藉由該功能件22形成鏤空區A之設計,使該鏤空區A之位置對應該光子元件2a的外接部243之位置(即光纖連接位置),以外露該外接部243,供該光纖27對位而便於連接該光纖27。
另外,藉由該功能件22對應遮蓋於該光子元件2a的外接部243之處,使該凹部220疊合於該外接部243上,以於形成該包覆層23時,該包覆層23不會覆蓋該外接部243(即光纖連接處),故當研磨該功能件22以形成鏤空區A時,能直接外露該外接部243(即光纖連接處),而無需進一步移除該外接部243上之包覆層23之材質或其它材質。
圖3A至圖3D係為本發明之電子封裝件3之製法之第二實施例的剖面示意圖。本實施例與第一實施例之差異在於鏤空區A之形成步驟,其它製程大致相同,故以下不再贅述相同處。
如圖3A所示,係採用如圖2A至圖2B所示之製程,將該電子元件21與該功能件22設於該光子元件2a上,再以該包覆層23包覆該電子元件21、該功能件22與該些底膠212,222。
如圖3B所示,於該光子元件2a上形成該些導電元件26,再沿如圖3A所示之切割路徑S進行切單製程,以獲取複數封裝模組3a。於本實施例中,於完成切單製程後,仍未形成該鏤空區A。
如圖3C所示,將該封裝模組3a藉由該些導電元件26設於一封裝基板28上側。
如圖3D所示,於該封裝基板28上形成該止擋件282,再以底膠281包覆該些導電元件26。接著,藉由研磨方式移除該包覆層23之第二表面23b之部分材質及該功能件22之部分材質,以令該凹部220形成該鏤空區A,使該外接部243外露於該鏤空區A。
於本實施例中,可於該封裝基板28上側設置一散熱件29,並於該封裝基板28下側進行植球製程以形成複數銲球280,如圖3E所示。
因此,第一實施例之製法與第二實施例之製法雖可製作出相同之電子封裝件3(如圖3E或圖2F所示),但第二實施例之製法主要藉由先進行切單製程以獲取該封裝模組3a,再於該封裝基板28上之封裝模組3a上形成該鏤空區A,故相較於第一實施例之製法,第二實施例之製法應用於大尺寸封裝件時可有效改善製程良率。例如,第一實施例於切單製程後,於運送如圖2D所示之電子封裝件2至該封裝基板28之過程中,異物容易掉入該鏤空區A中,導致該光纖27 無法有效電性連接該光子元件2a,故當該電子封裝件5進行電性檢測時,容易發生斷訊之問題,導致該電子封裝件2無法符合電子產品之可靠度要求。
再者,第二實施例之製法因先形成該止擋件282,再進行用以形成該鏤空區A之研磨作業,故於進行研磨作業時,如圖3D所示,該止擋件282能增加整體結構強度,以分散研磨應力,因而能提升該電子封裝件3之良率與可靠度。
又,第一實施例之製法係於晶圓級板體或整版面板體(即切單製程前之光子元件2a)上進行研磨作業,以形成該鏤空區A,故只需進行一次研磨作業,即可生產所需之電子封裝件2,5之數量。相對地,第二實施例之製法係於切單製程後所得之多個封裝模組3a上分別進行用以形成該鏤空區A之研磨作業,故需進行多次研磨作業,才能生產所需之電子封裝件3之數量。因此,第一實施例之產能會高於第二實施例之產能。
另外,如圖4A及圖4A-1所示,基於第一與第二實施例,於該功能件22設於該光子元件2a上之前(即圖2A所示之製程前),可先形成至少一擋塊(dam)42於該光子元件2a之第一側20a上,以令該複數虛接墊244圍繞該擋塊42,且使該擋塊42圍繞該外接部243,再將該功能件22以其凹部220設於該光子元件2a上,以於形成用以包覆該支撐用虛接凸塊221之底膠222時,限制該底膠222之佈設區域,而避免該底膠222溢流覆蓋至該外接部243上之問題,如圖4A-1所示。因此,於形成該鏤空區A後,該擋塊42與該外接部243將一併外露於該鏤空區A,如圖4B所示之電子封裝件4a(可採用第一實施例之製法)或圖4C所示之電子封裝件4b(可採用第二實施例之製法),且該擋塊42並對應沿該鏤空區A之邊緣配置。
應可理解地,有關該擋塊42之種類繁多,例如,以點膠方式形成如底膠之絕緣材(較佳實施例)或其它方式(如電鍍金屬、以黏固方式設置半導體預製件)等,並無特別限制。
因此,藉由該擋塊42之配置能防止該光子元件2a與該功能件22之間的底膠222溢流至該外接部243(即光纖連接處)之情況發生,因而能避免該光纖27無法順利焊接至該外接部243(即光纖連接處)之問題。
本發明亦提供一種電子封裝件2,3,4a,4b,5,係包括:一光子元件2a、一電子元件21、一功能件22以及一包覆層23。
所述之光子元件2a係具有相對之第一側20a與第二側20b、及複數連通該第一側20a與第二側20b之導電穿孔200,且該第一側20a係配置有電性連接該複數導電穿孔200之至少一外接部243及複數未電性連接該複數導電穿孔200與該外接部243之虛接墊244。
所述之電子元件21係設於該光子元件2a之第一側20a上並電性連接該複數導電穿孔200。
所述之功能件22係藉由複數虛接凸塊221結合至該複數虛接墊244上以設於該光子元件2a之第一側20a上且具有至少一貫穿該功能件22之鏤空區A,以令該外接部243外露於該鏤空區A,其中,該功能件22係未電性連接該光子元件2a。
所述之包覆層23係設於該光子元件2a之第一側20a上且包覆該電子元件21與該功能件22,以令該包覆層23外露該鏤空區A,供光纖27伸入該鏤空區A中而連接該外接部243。
於一實施例中,該光子元件2a之第一側20a上係佈設有圍繞該外接部243之擋塊42,以令該複數虛接墊244圍繞該擋塊42,且該擋塊42係對應沿該鏤空區A之邊緣配置。
於一實施例中,所述之電子封裝件3,4a,4b,5復包括一接置該光子元件2a第二側20b之封裝基板28。例如,該封裝基板28上係配置有至少一環繞該光子元件2a之止擋件282。或者,該封裝基板28上係配置有一散熱件29。
於一實施例中,該複數虛接凸塊221係包含銲錫材料。
綜上所述,本發明之電子封裝件及其製法,係藉由該光子元件具有導電穿孔之設計,以堆疊該電子元件而垂直整合兩者,不僅達到光電整合之目的,且該電子元件之訊號直接傳遞至該光子元件,而該光子元件之訊號藉由該鏤空區直接傳遞至該光纖,故本發明之電子封裝件能大幅縮短該電子元件與該光纖之間的訊號傳輸路徑,以有效加快訊號傳輸速度,因而能符合該電子封裝件對於快速運作之效能需求,進而使應用該電子封裝件之電子產品於消費市場上具備競爭力。
上述實施例係用以例示性說明本發明之原理及其功效,而非用於限制本發明。任何熟習此項技藝之人士均可在不違背本發明之精神及範疇下,對上述實施例進行修改。因此本發明之權利保護範圍,應如後述之申請專利範圍所列。
2:電子封裝件
2a:光子元件
20a:第一側
20b:第二側
200:導電穿孔
21:電子元件
22:功能件
23:包覆層
243:外接部
252:電性接觸墊
26:導電元件
27:光纖
A:鏤空區

Claims (13)

  1. 一種電子封裝件,係包括:
    光子元件,係具有相對之第一側、第二側及複數連通該第一側與第二側之導電穿孔,且該第一側係配置有電性連接該複數導電穿孔之外接部及複數未電性連接該複數導電穿孔與該外接部之虛接墊;
    電子元件,係設於該光子元件之第一側上並電性連接該複數導電穿孔;
    功能件,係藉由複數虛接凸塊結合至該複數虛接墊上以設於該光子元件之第一側上且具有貫穿該功能件之鏤空區,以令該外接部外露於該鏤空區,其中,該功能件係未電性連接該光子元件;以及
    包覆層,係設於該光子元件之第一側上並包覆該電子元件與該功能件,且令該包覆層外露該鏤空區,供光纖連接該鏤空區中之該外接部。
  2. 如請求項1所述之電子封裝件,其中,該光子元件之第一側上係佈設有圍繞該外接部之擋塊,以令該複數虛接墊圍繞該擋塊,且該擋塊係對應沿該鏤空區之邊緣配置。
  3. 如請求項1所述之電子封裝件,復包括一接置該光子元件第二側之封裝基板。
  4. 如請求項3所述之電子封裝件,其中,該封裝基板上係配置有環繞該光子元件之止擋件。
  5. 如請求項3所述之電子封裝件,其中,該封裝基板上係配置有一散熱件。
  6. 如請求項1所述之電子封裝件,其中,該複數虛接凸塊係包含銲錫材料。
  7. 一種電子封裝件之製法,係包括:
    提供光子元件、電子元件與具有凹部之功能件,其中,該光子元件具有相對之第一側、第二側及複數連通該第一側與第二側之導電穿孔,且該第一側係配置有電性連接該複數導電穿孔之外接部與複數電性接觸墊、及複數未電性連接該複數導電穿孔與該外接部之虛接墊;
    將該電子元件設於該光子元件之第一側之該複數電性接觸墊上,且將該功能件以其凹部朝向該外接部而藉由複數虛接凸塊結合至該複數虛接墊上以設於該光子元件之第一側上,並使該凹部疊合於該外接部上,其中,該電子元件電性連接該複數導電穿孔,且該功能件未電性連接該光子元件;
    形成包覆層於該光子元件之第一側上,以令該包覆層包覆該電子元件與該功能件;以及
    移除該包覆層之部分材質與該功能件之部分材質,以令該凹部形成貫穿該功能件之鏤空區,使該外接部外露於該鏤空區及該包覆層。
  8. 如請求項7所述之電子封裝件之製法,復包括佈設擋塊於該光子元件之第一側上,以令該複數虛接墊圍繞該擋塊,且使該擋塊圍繞該外接部並於形成該鏤空區後,該擋塊對應沿該鏤空區之邊緣配置。
  9. 如請求項7所述之電子封裝件之製法,復包括於形成該鏤空區後,將一封裝基板接置於該光子元件之第二側上。
  10. 如請求項7所述之電子封裝件之製法,復包括於形成該鏤空區前,將一封裝基板接置於該光子元件之第二側上。
  11. 如請求項10所述之電子封裝件之製法,復包括於形成該鏤空區前,於該封裝基板上配置至少一止擋件,使該止擋件環繞該光子元件。
  12. 如請求項7所述之電子封裝件之製法,其中,該複數虛接凸塊係包含銲錫材料。
  13. 如請求項7所述之電子封裝件之製法,其中,係採用單一次研磨作業,以移除該包覆層之部分材質與該功能件之部分材質。
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