TW201905996A - 晶圓加工方法 - Google Patents

晶圓加工方法

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TW201905996A
TW201905996A TW107122402A TW107122402A TW201905996A TW 201905996 A TW201905996 A TW 201905996A TW 107122402 A TW107122402 A TW 107122402A TW 107122402 A TW107122402 A TW 107122402A TW 201905996 A TW201905996 A TW 201905996A
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wafer
dicing
grinding
processing method
reinforcing portion
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鈴木克彥
荒木田久志
杉山智瑛
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日商迪思科股份有限公司
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    • HELECTRICITY
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    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
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    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
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    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
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    • H01L21/02002Preparing wafers
    • H01L21/02005Preparing bulk and homogeneous wafers
    • H01L21/02008Multistep processes
    • H01L21/0201Specific process step
    • H01L21/02013Grinding, lapping
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    • H01L21/02005Preparing bulk and homogeneous wafers
    • H01L21/02008Multistep processes
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    • H01L21/02016Backside treatment
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    • H01L21/6836Wafer tapes, e.g. grinding or dicing support tapes
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    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
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    • H01ELECTRIC ELEMENTS
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    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/02Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
    • B28D5/022Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
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    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68327Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
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    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68381Details of chemical or physical process used for separating the auxiliary support from a device or wafer
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  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Grinding Of Cylindrical And Plane Surfaces (AREA)
  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Dicing (AREA)

Abstract

[課題]使晶圓的背面可與切割膠帶密接,可適當地實施切割加工。[解決手段]一種晶圓加工方法,係於晶圓正面包含:具有元件之元件區域,以及圍繞該元件區域之外周剩餘區域;其中,該晶圓加工方法具備:背面研削步驟,係對晶圓的背面當中相當於該元件區域之區域進行研削來形成凹部,並且在該凹部之外側形成環狀補強部;切割膠帶黏貼步驟,係對該晶圓的背面側黏貼切割膠帶;分割步驟,係對該晶圓沿著分割預定線進行切割;其中,在該背面研削步驟當中,形成錐形面,該錐形面係連接該環狀補強部與該凹部的底面,並從該背面的垂直方向起傾斜;且在該分割步驟當中,使切割刀片切入到比該分割預定線之一端側的晶圓之外周緣更內側,而開始切割該晶圓,並在比該分割預定線之另一端側的晶圓之外周緣更内側,使切割刀片上升,以停止該晶圓之切割。

Description

晶圓加工方法
本發明係有關一種於背面側形成環狀補強部之晶圓加工方法。
晶圓的正面設定有呈格子狀排列之多條分割預定線,由該分割預定線所劃分的各區域中形成有IC、LSI等元件。並對該晶圓從背面側加以研削使其薄化成預定厚度,且,沿著該分割預定線加以分割,使該晶圓分割成各個元件晶片。將所形成之元件晶片搭載於行動電話、個人電腦等各種電子設備而得到廣泛利用。
晶圓背面側之研削加工,係由例如具備多個研削輪之研削裝置所實施(參照專利文獻1)。在研削裝置當中,首先,藉由第1研削輪對該晶圓的該背面以高速加工速度予以粗研削。接著,藉由第2研削輪對該背面以低速加工速度予以研削,而將晶圓精密地薄化,以使其形成預定厚度。
因藉研削加工所薄化之晶圓的剛性降低,所以在後續的步驟中變得不易作業。因此,有人開發了一種研削方法:藉由對晶圓當中形成有元件之區域(元件形成區域)之背面加以研削而形成凹部,並保留該凹部之外側當作環狀補強部來發揮功用(參照專利文獻2)。
將背面側研削之後,對該晶圓之該背面黏貼直徑大於該背面之切割膠帶,且在具有直徑大於該切割膠帶直徑之開口的環狀框架上,裝設該切割膠帶,來形成框架單元。然後,將具備切割刀片之切割裝置搬入該框架單元,並沿著分割預定線分割該晶圓。
該切割裝置具備卡盤台,其外徑小於晶圓背面側所形成之凹部的底面直徑。進行分割時,將該晶圓搭載於該卡盤台之上,來吸引保持該晶圓。此時,使該晶圓背面之該凹部的底面隔著該切割膠帶與該卡盤台上面之保持面接觸。並藉由該切割刀片對該晶圓之正面側沿著該分割預定線進行切割,來將該晶圓分割(參照專利文獻3)。 [習知技術文獻] [專利文獻]
[專利文獻1]日本特開2000-288881號公報 [專利文獻2]日本特開2007-19379號公報 [專利文獻3]日本特開2007-59829號公報
[發明所欲解決的課題] 在此,要對背面側形成有凹部之晶圓的該背面黏貼切割膠帶時,該切割膠帶不易密接於該凹部與該凹部外側之該環狀補強部的交界附近。凹部的底面與凹部的側面之間角度約為90°,凹部的側面與環狀補強部之間角度亦約為90°。因此,該切割膠帶會沿著該環狀補強部之內周緣近乎彎曲成直角,該切割膠帶不易與晶圓之背面密接。
若切割膠帶在晶圓背面之該交界附近未與晶圓密接時,因藉由切割刀片進行晶圓切割加工時所產生的力有時會造成該晶圓之該交界附近產生裂痕。另外,切割屑有時會進入晶圓與切割膠帶之間而附著在該晶圓之背面側。因此,在該晶圓之元件形成區域的外周附近所形成之元件晶片之品質等將會降低,而成為一大問題。
另外,對晶圓進行切割時,若將該晶圓保持在外徑小於該晶圓背面側凹部的底面直徑之卡盤台上,則因該環狀框架本身重量等,使得該切割膠帶呈現朝外周拉伸之狀態。因此,該晶圓承受向外周之力。
又,在晶圓由切割刀片切斷之過程中,因所分開的各個部分於不同方向承受該力,所以在切割加工中,該晶圓有可能會在與卡盤台保持面平行的面內移動。若晶圓在切割加工中移動,則因無法沿著分割預定線來進行切割,故成為一大問題。
本發明係鑑於此等問題點而研發而成,其目的在於提供一種晶圓加工方法,即使是在晶圓背面側所形成的該凹部與該環狀補強部之交界附近,亦可使該晶圓之背面與切割膠帶密接,而可適當地實施切割加工。
[解決課題的技術手段] 根據本發明之一態様,提供一種晶圓加工方法,於晶圓正面具有下述區域:在成格子狀排列的多條分割預定線所劃分的各區域中具有元件之元件區域,以及圍繞該元件區域之外周剩餘區域;其中,該晶圓加工方法具備:背面研削步驟,係對晶圓的背面當中相當於該元件區域之區域進行研削來形成凹部,並且在該凹部之外側形成環狀補強部;切割膠帶黏貼步驟,係對該晶圓的背面側黏貼切割膠帶;分割步驟,係用切割刀片對該晶圓從正面側沿著分割預定線進行切割,來將該晶圓分割成各個元件晶片;其中,在該背面研削步驟當中,係在該凹部的底面與該環狀補強部之間,形成錐形面,該錐形面係連接該環狀補強部與該凹部的底面,並從該凹部的底面的垂直方向起傾斜;而在該分割步驟當中,係使該切割刀片與該晶圓相對移動,同時使該切割刀片朝著晶圓從上方下降,使切割刀片切入到比該分割預定線之一端側的晶圓之外周緣更內側,而開始沿著該分割預定線切割該晶圓,並在比該分割預定線之另一端側的晶圓之外周緣更内側,使切割刀片上升,以停止該晶圓之切割。
再者,本發明之一態様中,該背面研削步驟所形成錐形面與該晶圓的該凹部的底面之角度,亦可為30°~75°。
[發明功效] 在本發明的晶圓加工方法中,在背面研削步驟對晶圓的背面之相當於元件區域之區域進行研削而於背面側形成凹部,並且將該凹部之外側當作環狀補強部。此時,在該凹部之底面與該環狀補強部之間,形成錐形面,該錐形面係連接該環狀補強部與該凹部的底面,並從該凹部的底面的垂直方向起傾斜。
於是,要對背面側形成有該凹部之晶圓的該背面黏貼切割膠帶時,在該環狀補強部與該錐形面之交界、或該錐形面與該凹部的底面之交界中,切割膠帶不會彎曲成直角。因此,該切割膠帶容易與該背面密接。
另外,在本發明相關晶圓加工方法中,沿著分割預定線實施切割加工時,因該晶圓之外周緣未經切割加工,所以使晶圓之外周緣以環狀保留下來。即使切割膠帶往外側拉伸,以環狀保留之該晶圓的外周緣也會支撐其內側的切割膠帶,故該力不會傳達到比該晶圓之該外周緣更內側的部分。因此,該晶圓在切割加工中不易在與該卡盤台之保持面平行的面內移動,可適當地實施切割加工。
因此,藉由本發明,提供一種晶圓加工方法,即使是在晶圓背面側所形成的該凹部與該環狀補強部之交界附近,亦可使該晶圓之背面與切割膠帶密接,可適當地實施切割加工。
就本發明相關實施形態進行說明。首先,就本實施形態相關加工方法所加工之晶圓進行說明。圖1(A)係示意性顯示晶圓正面側之立體圖,圖1(B)係示意性顯示晶圓背面側之立體圖。晶圓1,係由例如矽、藍寶石、SiC(碳化矽)、其他化合物半導體等材料所構成的大致圓板狀之晶圓。
如圖1(A)所示,晶圓1之正面1a,係由成格子狀排列的分割預定線3劃分成多個區域,各區域中有IC等元件5形成。晶圓1之正面1a具有:形成有元件5之元件形成區域7、及包圍該元件形成區域之外周剩餘區域9。
晶圓1,由背面研削步驟予以研削,直到晶圓1之背面1b側的該元件形成區域7的對應區域達到完工厚度為止。該背面1b側之研削區域的外側未經研削而保留,成為環狀補強部。由背面1b側之環狀補強部所圍繞之區域,係成為用背面研削步驟暴露出的背面當作底面之凹部。晶圓1,在分割步驟中最後沿著分割預定線3分割成多個元件晶片。
晶圓1之正面1a黏貼正面保護膠帶11(參照圖3(A)等)。正面保護膠帶11,防止晶圓1之正面1a所形成的元件5因衝撃等造成損傷。
接著,就本實施形態相關加工方法中,背面研削步驟所使用之研削裝置做說明。圖2係示意性顯示該研削裝置的構成例之立體圖。研削裝置2具有X軸移動平台6,該X軸移動平台6係設置在基台4上面的開口4a內部,而可在X軸方向移動。X軸移動平台6,藉由X軸進給機構(未圖示)在X軸方向移動。該X軸進給機構的上方,備有與該X軸移動平台6連接之防水罩8。
X軸移動平台6上,具備有用來保持晶圓1之卡盤台10。卡盤台10,係於內部具有一端與吸引源(未圖示)連接之吸引通道,該吸引通道的另一端與卡盤台10上面的保持面連接。該保持面以多孔質構件形成,而該保持面上載置晶圓1。當該吸引源作動時,會經由該吸引通道與該多孔質構件,使負壓作用於晶圓1,來吸引保持該晶圓1。
當X軸進給機構(未圖示)作動時,會使X軸移動平台6所支撐之卡盤台10定位於搬入搬出區域A與研削加工區域B。
基台4之後方側立設有支撐部14,係藉由該支撐部14支撐研削單元12。在支撐部14之前面,係設有在Z軸方向伸長之一對Z軸導軌16;各個Z軸導軌16,係裝有可滑動的Z軸移動板22。
在Z軸移動板22之背面側(後面側),係設有螺帽部(未圖示),該螺帽部係與平行Z軸導軌16之Z軸滾珠螺桿18螺合。Z軸滾珠螺桿18之一端部,係與Z軸脈衝馬達20連結。只要以Z軸脈衝馬達20來使Z軸滾珠螺桿18旋轉,Z軸移動板22就會沿著Z軸導軌16往Z軸方向(切入進給方向)移動。
Z軸移動板22之前面側下部,係固定有實施晶圓1的研削加工之研削單元12。只要使Z軸移動板22在Z軸方向移動,研削單元12就可在Z軸方向(加工進給方向)移動。
研削單元12具備:主軸26,係藉由與基端側連結之馬達進行旋轉;研削輪28,係裝設在該主軸26之前端側,且隨著該主軸26之旋轉進行旋轉;及研削磨石30,係設在該研削輪28之下面。該馬達設在主軸外殼24內。研削加工時,使該研削輪28旋轉,同時使研削輪28下降,來對定位於研削加工區域B的卡盤台10上所吸引保持之晶圓1研削加工。
就研削單元12做進一步詳述。圖3(A) 及圖3(B)係示意性顯示背面研削步驟之立體圖。如圖3(A)及圖3(B)所示,研削單元12係對晶圓1之背面1b側進行研削加工來形成凹部17,並且在該凹部17之周圍保留晶圓1而形成環狀補強部13。該研削輪28之直徑,小於研削加工所形成之凹部17的底面17a之直徑。
另外,圖4(A)所示之剖面圖,示意性顯示研削輪28與研削磨石30。如圖4(A)所示,研削輪28下面所裝設之研削磨石30係具備錐形部30a,其形狀為外側面朝下方並往研削輪28之中心方向後退。藉由具備研削磨石30之研削單元12,對晶圓1研削加工來形成凹部17時,可在該凹部17之側方形成錐形面15(參照圖4(B))。
以下,就本實施形態相關晶圓加工方法之各步驟做說明。首先,就本實施形態相關加工方法中的背面研削步驟做說明。圖3(A)係示意性顯示背面研削步驟之立體圖,圖3(B)係示意性顯示背面研削步驟之俯視圖。圖4(A)係示意性顯示背面即將進行研削前的狀態之剖面圖,圖4(B)係示意性顯示背面研削加工中的狀態之剖面圖。
以使正面1a黏貼有正面保護膠帶11之晶圓1的該正面側1a面向下方,而背面1b側上方暴露方式,將晶圓1載置於定位在研削裝置2的搬出搬入區域A(參照圖2)之卡盤台10的保持面上。又,使卡盤台10之吸引源(未圖示)作動,來將晶圓1吸引保持在卡盤台10上。接著,使X軸進給機構作動,來將卡盤台10定位於研削加工區域B。
研削裝置2,係將該區域定位於研削輪28之下方以研削晶圓1之背面1b當中對應元件形成區域7之區域。又,在使卡盤台10旋轉的同時,使主軸外殼24所具備之馬達作動,而使研削輪28旋轉。
接著,使研削輪28下降。於是,研削磨石30與晶圓1之背面1b抵接而開始研削。研削裝置2,係對晶圓1之背面1b的該區域進行研削,同時使研削輪28下降到晶圓1達到精加工厚度之高度。於是,如圖5等所示,於晶圓1之背面1b形成凹部17,且該凹部17周圍之部分殘留,係成為環狀補強部13。圖5係示意性顯示由研削加工所形成錐形面之剖面圖。
若沒有形成環狀補強部13,就對晶圓1之背面1b整面同樣進行研削,則晶圓1之剛性會降低,容易因後續的步驟或搬送等使晶圓1變形,產生損傷。但,在本實施形態相關加工方法中,由該環狀補強部13補強晶圓1,所以在後續的步驟或搬送等之中,可保有必要的強度。
該凹部17之底面17a與該環狀補強部13之間,形成連接兩者之錐形面15。如圖5所示,該錐形面15,從該凹部17的底面17a之垂直方向起傾斜。
就背面研削步驟之後實施的切割膠帶黏貼步驟做說明。該切割膠帶黏貼步驟中,對背面側1b形成有凹部17之晶圓1的該背面1b黏貼切割膠帶。圖6(A)示意性顯示背面1b側黏貼有切割膠帶19之晶圓1。如圖6(A)所示,切割膠帶19之外周部由環狀框架21保持。又,晶圓1、切割膠帶19、環狀框架21成一體而形成框架單元。
不依本實施形態相關加工方法去形成凹部17時,則連接該凹部17的底面17a與該環狀補強部13之間的凹部17的側面會沿著該凹部17的背面17a之垂直方向峭立。於是,該側面與該環狀補強部13之間角度呈近乎直角,該側面與該凹部17的底面17a之間角度亦呈近乎直角。
在此情形,在後述的切割膠帶黏貼步驟中,對晶圓1的該背面1b黏貼切割膠帶時,要配合該直角的形狀來黏貼切割膠帶19。但,要使沿著該環狀補強部13的內周緣或凹部17的底面17a的外周緣形成直角形狀之晶圓1之背面1b與切割膠帶19密接並非易事。
晶圓1之背面1b未與切割膠帶19密接時,有時會因後述的切割加工使該切割膠帶19未密接之區域產生裂痕。又,有時切割加工所產生之切割屑會跑入晶圓1與切割膠帶19之間,該切割屑會附著在該晶圓1之背面1b側。因此,有可能使該晶圓1之外周附近形成的元件晶片的品質等降低,而成為一大問題。
反之,本實施形態相關加工方法中,晶圓1之背面1b的該凹部17的底面17a與該環狀補強部13之間,形成有錐形面15。於是,錐形面15與該環狀補強部13之間角度、該錐形面15與該凹部17的底面17a之間角度非為直角。因此,將切割膠帶19黏貼在晶圓1之背面1b時,該切割膠帶19容易與該背面1b密接,元件晶片的品質不易降低。
在此利用圖5,就該錐形面15之錐形角15a做說明。所謂錐形角15a,係指:例如晶圓1之背面1b所形成之凹部17的底面17a與該錐形面15所成角度。例如,在包含晶圓1之背面1b的直徑之晶圓1的剖面中,晶圓1之背面1b的凹部17的底面17a與該錐形面15所成角度;或是環狀補強部13之暴露面與該錐形面15所成角度。
若該錐形角15a太大,則該切割膠帶19不易與背面1b密接。另一方面,若錐形角15a太小,則該晶圓1之外周剩餘區域9(參照圖1(A))相對應的背面1b中錐形面15所佔比例變得太大,環狀補強部13無法確保必要的強度。
因此,該錐形角15a,較佳為,例如該錐形角15a為30°~75°。當該錐形角15a為30°~75°時,切割膠帶19易與晶圓1之背面1b密接,且,環狀補強部13可確保必要的強度。
接著,就分割步驟做說明:沿著晶圓1之正面1a的分割預定線3(參照圖1(A)),從該正面1a側將切割刀片切入晶圓1,對該晶圓1切割加工,而將該晶圓1分割成各個元件晶片。圖6(B)係示意性顯示該分割步驟之剖面圖。再者,晶圓1之該正面1a所黏貼的正面保護膠帶11,在實施分割步驟前,先從該正面1a剝離。
具備該切割刀片32之切割裝置係具有卡盤台(未圖示),該卡盤台具有其直徑小於晶圓1之背面1b所形成凹部17的底面17a的直徑的保持面。該卡盤台與上述研削裝置2所具有之卡盤台10為同樣構成。切割刀片32,係於外周緣具有切刃,且形成為中央具有貫通孔之環狀。該切割刀片32繞著該貫通孔周圍旋轉,同時切入晶圓1,就會對晶圓1切割加工。
分割步驟中,首先在該卡盤台之保持面上載置晶圓1。此時,晶圓1,在背面1b側面向下方之狀態下,隔著該切割膠帶19載置於卡盤台之保持面上。又,具備晶圓1、切割膠帶19、環狀框架21之框架單元係保持在卡盤台上。
接著,調整該切割刀片32之位置,以使切割刀片32可從分割預定線之一端側對晶圓1切割加工。又,使該切割刀片32旋轉,且一邊使晶圓1往加工進給方向移動,一邊使該切割刀片32下降。又,使切割刀片32切入到比該分割預定線之一端側的晶圓1之外周緣更內側,並沿著該分割預定線開始切割。在切割刀片32到達該分割預定線之另一端側的外周緣之前,使切割刀片32上升以停止切割。
接著,沿著其他分割預定線同樣地逐一實施切割加工,沿著晶圓1之正面1a所設定之所有分割預定線,實施切割加工。圖7係示意性顯示分割步驟中切割加工完成後狀態的晶圓1之立體圖。如圖7所示,當分割步驟實施後,沿著所有的分割預定線3形成了切割槽23,將晶圓1分割成各個元件晶片。
再者,在該分割步驟中,晶圓1,係以框架單元之狀態保持在卡盤台上。卡盤台之保持面的直徑,小於晶圓1之背面1b的凹部17的底面17a之直徑,所以此時,該框架單元之外周部會從該保持面突出。於是,因環狀框架21本身重量等使該切割膠帶19朝外側拉伸。
未依本實施形態相關加工方法,就在分割步驟中以切割刀片32切割加工至晶圓1之外周緣時,則由該切割加工所分開之各區域承受朝向不同方向之力,所以切割加工中該晶圓1有可能會移動。若切割加工中晶圓移動,則無法沿著分割預定線3進行切割,會是一大問題。
對此,在本實施形態相關加工方法中的分割步驟,在晶圓1的外周緣以環狀保留了未被切割的區域。於是,即使切割膠帶19往外側拉伸,以環狀保留之該晶圓1的外周緣也會支撐其內側的切割膠帶19,使該力不會傳達到比該晶圓1的該外周緣更內側的部分。因此,該晶圓1在切割加工中不易在與該卡盤台19之保持面平行的面內移動,可適當地實施切割加工。
如同以上說明,依本發明之一態様相關加工方法,即使在晶圓1之背面1b側所形成之該凹部17與該環狀補強部13之交界附近,亦可使該晶圓1之背面1b與切割膠帶19密接,可適當地實施切割加工。
再者,本發明,並不限於上述實施形態之記載,可實施各種變更。例如,在上述實施形態中,為了形成以預定角度傾斜之錐形面15,如圖4(A)等所示,利用具有以預定角度傾斜的錐形部30a之研削磨石30來實施研削加工。但,本發明的一態樣相關之加工方法並不限於此。
例如,亦可以具備未設置錐形部30a的研削磨石30之研削輪28來實施研削加工,在此情形,隨著該研削輪28下降,慢慢地使研削輪28往晶圓1之背面1b的中心側移動。於是,便可形成錐形面15。
其他,上述實施形態相關構造、方法等,在不脫離本發明目的之範圍內,可予以適度變更並實施之。
1‧‧‧晶圓
1a‧‧‧正面
1b‧‧‧背面
3‧‧‧分割預定線
5‧‧‧元件
7‧‧‧元件區域
9‧‧‧外周剩餘區域
11‧‧‧正面保護膠帶
13‧‧‧環狀補強部
15‧‧‧錐形面
15a‧‧‧錐形角
17‧‧‧凹部
17a‧‧‧凹部的底面
19‧‧‧切割膠帶
21‧‧‧環狀框架
23‧‧‧切割槽
2‧‧‧研削裝置
4‧‧‧基台
4a‧‧‧開口
6‧‧‧X軸移動平台
8‧‧‧防水罩
10‧‧‧卡盤台
12‧‧‧研削單元
14‧‧‧支撐部
16‧‧‧Z軸導軌
18‧‧‧Z軸滾珠螺桿
20‧‧‧Z軸脈衝馬達
22‧‧‧Z軸移動板
24‧‧‧馬達
26‧‧‧主軸
28‧‧‧研削輪
30‧‧‧研削磨石
30a‧‧‧錐形部
32‧‧‧切割刀片
圖1(A)係示意性顯示晶圓正面側之立體圖,圖1(B)係示意性顯示晶圓背面側之立體圖。 圖2係示意性顯示研削裝置之立體圖。 圖3(A)係示意性顯示背面研削步驟之立體圖,圖3(B)係示意性顯示背面研削步驟之俯視圖。 圖4(A)係示意性顯示即將實施研削加工前的狀態之剖面圖,圖4(B)係示意性顯示研削加工之剖面圖。 圖5係示意性顯示由研削加工所形成錐形面之剖面圖。 圖6(A)係示意性顯示裝設於環狀框架的切割膠帶黏貼於背面側的晶圓之剖面圖,圖6(B)係示意性顯示切割加工之剖面圖。 圖7係示意性顯示切割加工後的狀態之晶圓正面側立體圖。

Claims (2)

  1. 一種晶圓加工方法,於該晶圓正面具有:在成格子狀排列的多條分割預定線所劃分的各區域中具有元件之元件區域;以及圍繞該元件區域之外周剩餘區域; 其中,該晶圓加工方法具備: 背面研削步驟,係對晶圓的背面當中相當於該元件區域之區域進行研削來形成凹部,並且在該凹部之外側形成環狀補強部; 切割膠帶黏貼步驟,係對該晶圓的背面側黏貼切割膠帶;以及 分割步驟,係用切割刀片對該晶圓從正面側沿著分割預定線進行切割,來將該晶圓分割成各個元件晶片; 其中,在該背面研削步驟當中,在該凹部的底面與該環狀補強部之間,形成錐形面,該錐形面係連接該環狀補強部與該凹部的底面,並從該凹部的底面的垂直方向起傾斜; 而在該分割步驟當中,係使該切割刀片與該晶圓相對移動,同時使該切割刀片朝著晶圓從上方下降,並使切割刀片切入到比該分割預定線之一端側的晶圓之外周緣更內側,且開始沿著該分割預定線切割該晶圓,並在比該分割預定線之另一端側的晶圓之外周緣更内側,使切割刀片上升,以停止該晶圓之切割。
  2. 如申請專利範圍第1項所述之晶圓加工方法,其中, 該背面研削步驟所形成錐形面與該凹部的底面之角度,為30°~75°。
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