TW201631322A - A probe pin and assembly for fixing the probe pin - Google Patents

A probe pin and assembly for fixing the probe pin Download PDF

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Publication number
TW201631322A
TW201631322A TW105114517A TW105114517A TW201631322A TW 201631322 A TW201631322 A TW 201631322A TW 105114517 A TW105114517 A TW 105114517A TW 105114517 A TW105114517 A TW 105114517A TW 201631322 A TW201631322 A TW 201631322A
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TW
Taiwan
Prior art keywords
probe
horizontal
protrusion
vertical
floating
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TW105114517A
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Chinese (zh)
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TWI572864B (en
Inventor
Young-Ho Kim
Keun-Young Maeng
Hwang-Sub Koo
Hyun-Je Kim
Hee-Seok Jung
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Gigalane Co Ltd
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Priority to KR1020150068652A priority Critical patent/KR101558256B1/en
Application filed by Gigalane Co Ltd filed Critical Gigalane Co Ltd
Publication of TW201631322A publication Critical patent/TW201631322A/en
Application granted granted Critical
Publication of TWI572864B publication Critical patent/TWI572864B/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06705Apparatus for holding or moving single probes

Abstract

Introduced are a fixable probe pin and an assembly for fixing a probe pin. The assembly for fixing a probe pin of the present invention comprises: a probe block on which an insertion protruding part is formed where probe pins are to be placed; and a fixing unit having first and second fixing units. The first fixing unit prevents the probe pins from horizontally moving from the probe block. The second fixing unit prevents the probe pins from vertically moving from the probe block. The first fixing unit comprises a film with an insertion hole into which the insertion protrusion is inserted.

Description

可固定之探針及探針固定組件 Fixable probe and probe fixing assembly
本發明係關於一種在檢查顯示裝置時固定探針之探針固定組件和符合這種探針固定組件之探針。 The present invention relates to a probe fixing assembly for fixing a probe when inspecting a display device and a probe conforming to the probe fixing assembly.
一般而言,探測裝置包括接觸在顯示裝置上形成之接觸墊之多個探針,近來,由於顯示裝置之接觸墊間之間隔,即間距(pitch)形成地非常窄,因此正在進行旨在使探針準確地位於接觸墊上之多樣之研究、開發。 In general, the detecting device includes a plurality of probes that contact the contact pads formed on the display device. Recently, due to the interval between the contact pads of the display device, that is, the pitch is formed to be very narrow, it is The probe is accurately located on the contact pad for a variety of research and development.
如果多個探針之相互間隔稠密,不能保持固定之位置,則稍微移動或傾斜,相互鄰接之探針會相互接觸而短路,或超出顯示裝置之接觸位置,存在無法準確檢查之問題。 If a plurality of probes are densely spaced from each other and cannot be held in a fixed position, they are slightly moved or tilted, and the probes adjacent to each other may be short-circuited with each other or may be out of contact with the display device, and there is a problem that the inspection cannot be accurately performed.
因此,在檢查顯示裝置時,固定探針,使探針不向上下方向、左右方向移動,而能夠保持其位置,是對於準確地檢查顯示裝置非常重要之事項。 Therefore, when the display device is inspected, it is very important to accurately inspect the display device by fixing the probe so that the probe does not move in the up-down direction and the left-right direction, and the position can be maintained.
[現有技術文獻] [Prior Art Literature]
[專利文獻] [Patent Literature]
(專利文獻1)韓國公開專利第10-2012-0040484號(2012.04.27) (Patent Document 1) Korean Patent Publication No. 10-2012-0040484 (2012.04.27)
本發明之目的在於提供一種在檢查顯示裝置時防止探針向上下方向及左右方向移動之探針固定組件及可固定之探針。 An object of the present invention is to provide a probe fixing assembly and a fixable probe that prevent the probe from moving in the up-down direction and the left-right direction when inspecting the display device.
旨在達成這種目的之本發明之探針固定組件包括:探針座,其在一側面放置凸出形成有插入凸起的探針;及浮動防止部,其包括防止上述探針從上述探針座向左右方向浮動之第一浮動防止部、防止上述探針從上述探針座向上下方向浮動之第二浮動防止部,上述第一浮動防止部包括形成有供上述插入凸起插入之插入孔之薄膜。 A probe fixing assembly of the present invention for achieving the object includes: a probe holder that is placed on one side with a probe that is formed with an insertion protrusion; and a floating prevention portion that includes preventing the probe from being probed from the above a first floating preventing portion in which the needle holder floats in the left-right direction, a second floating preventing portion that prevents the probe from floating upward and downward from the probe holder, and the first floating preventing portion includes an insertion for inserting the insertion projection The film of the hole.
旨在達成這種目的之本發明之探針固定組件包括:探針座,其在一側面放置凸出形成有插入凸起之探針;及浮動防止部,其包括防止上述探針從上述探針座向左右方向浮動之第一浮動防止部,上述第一浮動防止部包括形成有供上述插入凸起插入之插入孔之薄膜。 A probe fixing assembly of the present invention for achieving the object includes: a probe holder that is placed on one side to protrude a probe formed with an insertion protrusion; and a floating prevention portion that includes preventing the probe from being probed from the above The first floating preventing portion in which the needle holder floats in the right and left direction, and the first floating preventing portion includes a film on which the insertion hole into which the insertion projection is inserted is formed.
旨在達成這種目的之本發明之探針固定組件包括:探針,其包括沿水平方向較長地形成而使得一端能夠接觸顯示裝置電路圖案之第一水平部、在上述第一水平部之另一端沿垂直方向延長形成之垂直部、在上述垂直部之另一端向與上述第一水平部相反方向延長形成之第二水平部、包括在上述垂直部凸出形成之第一插入凸起與在上述第二水平部凸出形成之第二插入凸起之插入凸起;探針座,其用於放置上述探針;及浮動防止部,其包括防止上述探針之上下方向浮動之第二浮動防止部。 A probe fixing assembly of the present invention for achieving the object includes: a probe including a first horizontal portion formed long in a horizontal direction such that one end can contact a circuit pattern of a display device, and at the first horizontal portion a second horizontal portion formed by extending the other end in the vertical direction, and a second horizontal portion extending at an opposite end of the vertical portion from the first horizontal portion, and a first insertion protrusion formed by the vertical portion An insertion protrusion of the second insertion protrusion formed at the second horizontal portion; a probe holder for placing the probe; and a floating prevention portion including a second element for preventing the probe from floating upward and downward Floating prevention unit.
本發明之特徵在於,隔著既定間隔設置多個上述探針,在上述薄膜隔著既定間隔形成有多個插入孔。 The present invention is characterized in that a plurality of the probes are provided at predetermined intervals, and a plurality of insertion holes are formed in the film at predetermined intervals.
上述探針包括沿水平方向較長地形成而使得一端能夠接觸顯示裝置電路圖案之第一水平部、在上述第一水平部之另一端沿垂直方向 延長形成之垂直部、在上述垂直部之另一端向與上述第一水平部相反方向延長形成之第二水平部,上述插入凸起包括在上述垂直部凸出形成之第一插入凸起、在第二水平部凸出形成之第二插入凸起。 The probe includes a first horizontal portion that is formed long in the horizontal direction such that one end can contact the circuit pattern of the display device, and a vertical direction at the other end of the first horizontal portion Extending the formed vertical portion, and forming a second horizontal portion extending in a direction opposite to the first horizontal portion at the other end of the vertical portion, the insertion protrusion including a first insertion protrusion formed to protrude in the vertical portion, The second horizontal portion protrudes to form a second insertion protrusion.
本發明之特徵在於,上述第一插入凸起沿垂直方向較長地形成,上述第二插入凸起沿水平方向較長地形成,上述插入孔為矩形形狀。 The present invention is characterized in that the first insertion projection is formed long in the vertical direction, the second insertion projection is formed long in the horizontal direction, and the insertion hole has a rectangular shape.
上述薄膜包括與上述垂直部對應之第一薄膜、及與上述第二水平部對應之第二薄膜。 The film includes a first film corresponding to the vertical portion and a second film corresponding to the second horizontal portion.
其特徵在於,在上述第一插入凸起上端凸出形成有能夠防止上述第一薄膜從上述第一插入凸起分離之卡定突起。 The upper insertion end of the first insertion protrusion is formed with a locking protrusion that can prevent the first film from being separated from the first insertion protrusion.
本發明之特徵在於,上述第一水平部及第二水平部能夠彈性變形。 The present invention is characterized in that the first horizontal portion and the second horizontal portion are elastically deformable.
本發明之特徵在於,在上述第二水平部形成有使上述第二水平部能夠彈性變形之開環形狀之孔。 The present invention is characterized in that an open-loop shape hole for elastically deforming the second horizontal portion is formed in the second horizontal portion.
本發明之特徵在於,上述探針包括沿水平方向較長地形成而使得一端能夠接觸顯示裝置電路圖案之第一水平部、在上述第一水平部之另一端沿垂直方向延長形成之垂直部、在上述垂直部之另一端向與上述第一水平部相反方向延長形成之第二水平部,在上述垂直部及上述第二水平部,分別凸出形成有第一插入凸起及第二插入凸起,上述第二浮動防止部同時與上述第一插入凸起及第二插入凸起之上端面接觸而固定上述探針。 The present invention is characterized in that the probe includes a first horizontal portion that is formed long in the horizontal direction so that one end can contact the circuit pattern of the display device, and a vertical portion that is extended in the vertical direction at the other end of the first horizontal portion, a second horizontal portion formed to extend in a direction opposite to the first horizontal portion at the other end of the vertical portion, and a first insertion protrusion and a second insertion protrusion are respectively formed on the vertical portion and the second horizontal portion The second floating prevention portion simultaneously contacts the end faces of the first insertion protrusion and the second insertion protrusion to fix the probe.
本發明之探針固定組件之特徵在於,還包括探針主體,上述第二浮動防止部固定結合於上述探針主體。 The probe fixing assembly of the present invention is characterized in further comprising a probe main body, and the second floating preventing portion is fixedly coupled to the probe main body.
本發明之特徵在於,上述第一插入凸起及第二插入凸起上端 平坦地形成,以便上述第二浮動防止部能夠面接觸。 The invention is characterized in that the upper ends of the first insertion protrusion and the second insertion protrusion are It is formed flat so that the above-described second floating prevention portion can be in surface contact.
本發明之特徵在於,在上述第二插入凸起上,在與上述第二浮動防止部面接觸之部位形成有彈性部。 According to still another aspect of the invention, an elastic portion is formed in a portion of the second insertion protrusion that is in surface contact with the second floating prevention portion.
旨在達成這種目的之本發明之可固定之探針之特徵在於,包括沿水平方向較長地形成而使得一端能夠接觸顯示裝置電路圖案之第一水平部、在上述第一水平部之另一端沿垂直方向延長形成之垂直部、在上述垂直部之另一端向與上述第一水平部相反方向延長形成之第二水平部,在上述垂直部及第二水平部分別凸出形成有第一插入凸起及第二插入凸起。 The fixable probe of the present invention which is intended to achieve such a purpose is characterized in that it comprises a first horizontal portion which is formed long in the horizontal direction so that one end can contact the circuit pattern of the display device, and another one of the first horizontal portions a vertical portion formed at one end extending in the vertical direction, and a second horizontal portion extending at a direction opposite to the first horizontal portion at the other end of the vertical portion, and a first portion is formed in the vertical portion and the second horizontal portion The protrusion and the second insertion protrusion are inserted.
本發明之特徵在於,上述第一插入凸起沿垂直方向較長地形成,上述第二插入凸起沿水平方向較長地形成,在上述第一插入凸起上端凸出形成有卡定突起。 The present invention is characterized in that the first insertion projection is formed to be long in the vertical direction, the second insertion projection is formed to be long in the horizontal direction, and a locking projection is formed at an upper end of the first insertion projection.
本發明之特徵在於,在上述第二插入凸起形成有彈性部。 The present invention is characterized in that an elastic portion is formed in the second insertion protrusion.
本發明之特徵在於,在上述第二水平部形成有使上述第二水平部能夠彈性變形之開環形狀之孔。 The present invention is characterized in that an open-loop shape hole for elastically deforming the second horizontal portion is formed in the second horizontal portion.
藉由依據附圖進行之以下詳細說明,本發明之特徵及優點將更加明確。 The features and advantages of the present invention will become more apparent from the detailed description of the appended claims.
在此之前,本說明書及申請專利範圍中使用之用語或單詞不得依通常的、字典的意義解釋,應立足于發明人為了以最佳方法說明其自身發明而可以適宜地定義用語概念之原則,解釋為符合本發明技術思想之意義和概念。 Prior to this, the terms or words used in this specification and the scope of the patent application shall not be interpreted in the usual, dictionary sense, and shall be based on the principle that the inventor may appropriately define the concept of the term in order to best describe his or her own invention. It is interpreted as conforming to the meaning and concept of the technical idea of the present invention.
[發明之效果] [Effects of the Invention]
根據本發明,可以體現如下多樣效果。 According to the present invention, the following various effects can be achieved.
第一,具有能夠防止探針之上下方向浮動及左右方向浮動之優點。 First, it has the advantage of being able to prevent the probe from floating in the up and down direction and floating in the left and right direction.
第二,防止探針相互接觸,防止短路,從而具有能夠準確檢查之優點。 Second, the probes are prevented from coming into contact with each other to prevent short circuits, thereby having the advantage of being able to be accurately inspected.
第三,具有能夠防止探針變形之優點。 Third, there is an advantage that the deformation of the probe can be prevented.
100‧‧‧探針 100‧‧‧ probe
110‧‧‧第一水平部 110‧‧‧First level
120‧‧‧垂直部 120‧‧‧Vertical
130‧‧‧第二水平部 130‧‧‧Second level
132‧‧‧孔 132‧‧‧ hole
140‧‧‧插入凸起 140‧‧‧Insert bulge
142‧‧‧第一插入凸起 142‧‧‧First insertion bulge
142a‧‧‧卡定突起 142a‧‧‧Kingding protrusion
144‧‧‧第二插入凸起 144‧‧‧Second insertion bulge
144a‧‧‧彈性部 144a‧‧‧Flexible Department
200‧‧‧探針座 200‧‧‧ probe holder
210‧‧‧凸台 210‧‧‧Boss
300‧‧‧浮動防止部 300‧‧‧Floating Prevention Department
310‧‧‧第一浮動防止部 310‧‧‧First Floating Prevention Department
320‧‧‧第二浮動防止部 320‧‧‧Second floating prevention department
330‧‧‧薄膜 330‧‧‧film
330a‧‧‧插入孔 330a‧‧‧ insertion hole
332‧‧‧第一薄膜 332‧‧‧First film
334‧‧‧第二薄膜 334‧‧‧Second film
400‧‧‧探針主體 400‧‧‧ probe body
圖1是顯示本發明之探針固定組件之圖,圖2是本發明之主要部分放大圖,圖3是概略地顯示本發明之探針固定組件之結合關係之圖,圖4是本發明之可固定之探針,圖5是顯示作為本發明之探針固定組件一個重要部分之薄膜與探針之結合狀態之圖,圖6是顯示作為本發明一個重要部分之第一浮動防止部之一個實施例之圖。 1 is a view showing a probe fixing assembly of the present invention, FIG. 2 is an enlarged view of a main portion of the present invention, FIG. 3 is a view schematically showing a bonding relationship of the probe fixing assembly of the present invention, and FIG. 4 is a view of the present invention. Fig. 5 is a view showing a state in which a film and a probe are an important part of the probe fixing assembly of the present invention, and Fig. 6 is a view showing a first floating preventing portion which is an important part of the present invention. A diagram of an embodiment.
藉由與附圖相關之以下詳細說明和實施例,本發明之目的、特定優點及新特徵將更加明確。需要注意的是,在本說明書中,在對各附圖之構成要素賦予參照符號方面,限於相同構成要素,即使顯示於不同附圖上,也盡可能使其具有相同符號。另外,第一、第二等用語可以用於說明多樣之構成要素,但上述構成要素並非由上述用語限定。上述用語只用於區別一個構成要素與其它構成要素之目的。另外,在說明本發明方面,當判斷認為對相關公知技術之具體說明可能不必要地混淆本發明之要旨時,省略其詳細說明。 The objects, specific advantages and novel features of the invention will become more apparent from In the present specification, the reference numerals are given to the constituent elements of the respective drawings, and are limited to the same constituent elements, and even if they are displayed on different drawings, they have the same symbols as much as possible. Further, the terms "first" and "second" may be used to describe various constituent elements, but the above constituent elements are not limited by the above terms. The above terms are only used to distinguish one component from another. In addition, the detailed description of the present invention is omitted when it is judged that the detailed description of the related art may unnecessarily obscure the gist of the present invention.
以下參照附圖,詳細說明本發明之實施例。 Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
如圖1至圖3所示,本發明之探針固定組件包括探針座200及浮動防止部300。 As shown in FIGS. 1 to 3, the probe fixing assembly of the present invention includes a probe holder 200 and a floating preventing portion 300.
在探針座200上放置探針100。探針座200形成得使探針100容易放置、固定。作為一個示例,在其一側面可以形成有凸台210,以便探針100能夠插入,這種探針座200之形狀只要是探針100可以放置、固定之結構,則可以多樣地變更設計。 The probe 100 is placed on the probe holder 200. The probe holder 200 is formed such that the probe 100 is easily placed and fixed. As an example, a boss 210 may be formed on one side thereof so that the probe 100 can be inserted. The shape of the probe holder 200 can be variously changed as long as the probe 100 can be placed and fixed.
浮動防止部300發揮防止探針100從探針座200沿上下方向及左右方向浮動之功能。因此,探針100在檢查顯示裝置時即使被施加力,由於固定於其位置而能夠準確檢查。 The floating prevention unit 300 functions to prevent the probe 100 from floating in the vertical direction and the horizontal direction from the probe holder 200. Therefore, even when the probe 100 is applied with a force when inspecting the display device, it can be accurately inspected by being fixed at its position.
浮動防止部300包括第一浮動防止部310和第二浮動防止部320。 The floating prevention portion 300 includes a first floating prevention portion 310 and a second floating prevention portion 320.
第一浮動防止部310發揮防止探針100之左右方向浮動之功能。亦即,防止相互鄰接之探針100之左右方向浮動,從而能夠防止在檢查顯示裝置時探針間之短路,而能夠準確檢查。 The first floating prevention portion 310 functions to prevent the probe 100 from floating in the left-right direction. That is, it is possible to prevent the probes 100 adjacent to each other from floating in the left-right direction, thereby preventing short-circuiting between the probes when inspecting the display device, and enabling accurate inspection.
第二浮動防止部320發揮防止探針100之上下方向浮動之功能。亦即,如果探針100一端接觸顯示裝置電路圖案,則力施加於探針100,使其向上下方向浮動,如果反復這種過程,則探針100將變形,因此第二浮動防止部320使探針100在垂直及水平方向固定,防止探針100向上下方向浮動,進一步地,防止探針100變形。 The second floating prevention unit 320 functions to prevent the probe 100 from floating in the up and down direction. That is, if one end of the probe 100 contacts the display device circuit pattern, a force is applied to the probe 100 to float in the up-down direction. If this process is repeated, the probe 100 will be deformed, so the second floating prevention portion 320 makes The probe 100 is fixed in the vertical and horizontal directions to prevent the probe 100 from floating upward and downward, and further, the probe 100 is prevented from being deformed.
本發明之探針固定組件還包括探針主體400,第二浮動防止部320固定結合於這種探針主體400。放置於探針主體400之第二浮動防止 部320可以以螺絲、螺栓等各種連結手段固定結合。 The probe fixing assembly of the present invention further includes a probe body 400 to which the second floating preventing portion 320 is fixedly coupled. Second floating prevention placed on the probe body 400 The portion 320 can be fixedly coupled by various fastening means such as screws and bolts.
另一方面,如圖3、圖5及圖6所示,在探針100之一側形成有插入凸起140,第一浮動防止部310包括形成有插入孔330a之薄膜330,以便插入凸起140能夠插入。 On the other hand, as shown in FIGS. 3, 5, and 6, an insertion protrusion 140 is formed on one side of the probe 100, and the first floating prevention portion 310 includes a film 330 formed with an insertion hole 330a for inserting a projection. 140 can be inserted.
如果探針100隔開既定間隔形成有多個,則在薄膜330上形成之插入孔330a也按與探針100對應之個數形成,插入孔330a形狀較佳為以與插入凸起140形狀對應之形狀形成。 If the probe 100 is formed with a plurality of spaced apart intervals, the insertion hole 330a formed in the film 330 is also formed in a number corresponding to the probe 100, and the insertion hole 330a preferably has a shape corresponding to the shape of the insertion protrusion 140. The shape is formed.
如圖3及圖4所示,探針100可以包括第一水平部110、垂直部120、第二水平部130。 As shown in FIGS. 3 and 4 , the probe 100 may include a first horizontal portion 110 , a vertical portion 120 , and a second horizontal portion 130 .
第一水平部110沿水平方向較長地形成而使得其一端能夠接觸顯示裝置電路圖案,垂直部120在第一水平部110之另一端沿垂直方向延長形成,第二水平部130在垂直部120之另一端向與第一水平部110相反方向延長形成。 The first horizontal portion 110 is formed long in the horizontal direction such that one end thereof can contact the display device circuit pattern, the vertical portion 120 is formed to extend in the vertical direction at the other end of the first horizontal portion 110, and the second horizontal portion 130 is at the vertical portion 120. The other end is formed to extend in the opposite direction to the first horizontal portion 110.
第一水平部110之底面放置於上述探針座200上,垂直部120之一面放置於探針座200一側面,第二水平部130底面放置於探針座200底面。概略性地,探針座200具有“L”形狀之剖面,探針100與探針座200之形狀相應,以能夠放置之結構形成。 The bottom surface of the first horizontal portion 110 is placed on the probe base 200. One surface of the vertical portion 120 is placed on one side of the probe base 200, and the bottom surface of the second horizontal portion 130 is placed on the bottom surface of the probe base 200. Roughly, the probe holder 200 has an "L"-shaped cross section, and the probe 100 is formed in a structure that can be placed in accordance with the shape of the probe holder 200.
此時,在探針座200上也可以形成狹縫,當形成狹縫時,第一水平部110及第二水平部130插入於狹縫。 At this time, a slit may be formed in the probe holder 200, and when the slit is formed, the first horizontal portion 110 and the second horizontal portion 130 are inserted into the slit.
插入凸起140包括在垂直部120凸出形成之第一插入凸起142、在第二水平部130凸出形成之第二插入凸起144,薄膜330包括形成有插入孔330a以便第一插入凸起142能夠插入之第一薄膜332、形成有插入 孔330a以便第二插入凸起144能夠插入之第二薄膜334。 The insertion protrusion 140 includes a first insertion protrusion 142 that is convexly formed at the vertical portion 120, and a second insertion protrusion 144 that is formed at the second horizontal portion 130. The film 330 includes an insertion hole 330a formed so that the first insertion protrusion is formed. 142 can be inserted into the first film 332, formed with an insertion The hole 330a is such that the second insertion protrusion 144 can be inserted into the second film 334.
為了防止第一薄膜332從第一插入凸起142分離,較佳為在第一插入凸起142上端凸出形成有卡定突起142a。另外,較佳為傾斜地形成第一插入凸起142與第二插入凸起144之兩端,從而容易進行第一薄膜332與第一插入凸起142、及第二薄膜334與第二插入凸起144間之結合。 In order to prevent the first film 332 from being separated from the first insertion protrusion 142, it is preferable that a locking protrusion 142a is formed at an upper end of the first insertion protrusion 142. In addition, it is preferable to form the both ends of the first insertion protrusion 142 and the second insertion protrusion 144 obliquely, thereby facilitating the first film 332 and the first insertion protrusion 142, and the second film 334 and the second insertion protrusion. 144 combinations.
另外,第一插入凸起142及第二插入凸起144較佳為其上端平坦地形成,以便第二浮動防止部320能夠面接觸,較佳為藉由最大限度地確保寬闊接觸面積而利用第二浮動防止部320防止探針100之上下浮動。更佳為在第二插入凸起144形成彈性部144a,以便能夠防止第二插入凸起144被第二浮動防止部320過度地加壓而受損。 In addition, the first insertion protrusion 142 and the second insertion protrusion 144 are preferably formed such that the upper end thereof is flat, so that the second floating prevention portion 320 can be in surface contact, preferably by maximally ensuring a wide contact area. The two floating preventing portions 320 prevent the probe 100 from floating up and down. More preferably, the elastic portion 144a is formed at the second insertion protrusion 144 so that the second insertion protrusion 144 can be prevented from being excessively pressurized by the second floating prevention portion 320 to be damaged.
第二浮動防止部320在垂直及水平方向上固定結合於探針主體400,以便第一插入凸起142及第二插入凸起144能夠堅固地面接觸於第二浮動防止部320。 The second floating prevention portion 320 is fixedly coupled to the probe main body 400 in the vertical and horizontal directions, so that the first insertion protrusion 142 and the second insertion protrusion 144 can firmly contact the second floating prevention portion 320.
當利用探針100檢查顯示裝置時,探針100之一端接觸顯示裝置之電路圖案,其另一端接觸與檢查控制裝置連接之電路圖案。多個探針100應無遺漏地接觸電路圖案,為了對接探針100之接觸端子,較佳為探針100之第一水平部110及第二水平部130形成為能夠彈性變形。特別是較佳為在第二水平部130形成開環形狀之孔132,使彈性力實現最大化。 When the display device is inspected by the probe 100, one end of the probe 100 contacts the circuit pattern of the display device, and the other end thereof contacts the circuit pattern connected to the inspection control device. The plurality of probes 100 should be in contact with the circuit pattern without fail. In order to abut the contact terminals of the probe 100, it is preferable that the first horizontal portion 110 and the second horizontal portion 130 of the probe 100 are formed to be elastically deformable. In particular, it is preferable to form the open-loop-shaped hole 132 in the second horizontal portion 130 to maximize the elastic force.
本發明人為了比較本發明之效果,測量了未應用浮動防止部300之以往技術與本發明之接觸位置誤差。計量了1號至100號探針之接觸位置,將其誤差值整理於下述表1中。 In order to compare the effects of the present invention, the inventors measured the contact position error between the prior art and the present invention in which the floating prevention portion 300 was not applied. The contact positions of the probes No. 1 to No. 100 were measured, and the error values were arranged in Table 1 below.
[表1] [Table 1]
如表1所示,測試結果,當未應用浮動防止部300時,平均誤差值為9.46μm,本發明之平均誤差值為4.87μm。亦即,可知根據本發明,與以往技術相比,平均誤差值減小為1/2程度。 As shown in Table 1, as a result of the test, when the floating prevention portion 300 was not applied, the average error value was 9.46 μm, and the average error value of the present invention was 4.87 μm. That is, according to the present invention, it is understood that the average error value is reduced to about 1/2 as compared with the prior art.
以上透過具體實施例詳細說明了本發明,可以理解的是,這是為了具體說明本發明,並不限定于本發明之可固定之探針及探針固定組件,而可以由本發明所屬技術領域之技術人員進行變形及改良。 The present invention has been described in detail by way of specific embodiments. It is to be understood that the present invention is not limited to the fixed probe and probe fixing assembly of the present invention, but may be made by the technical field of the present invention. The technician performs deformation and improvement.
本發明之單純變形乃至變更均屬於本發明之領域,本發明之具體保護範圍將透過申請專利範圍而更明確。 The invention is to be construed as being limited by the scope of the appended claims.
110‧‧‧第一水平部 110‧‧‧First level
120‧‧‧垂直部 120‧‧‧Vertical
130‧‧‧第二水平部 130‧‧‧Second level
132‧‧‧孔 132‧‧‧ hole
142‧‧‧第一插入凸起 142‧‧‧First insertion bulge
142a‧‧‧卡定突起 142a‧‧‧Kingding protrusion
144‧‧‧第二插入凸起 144‧‧‧Second insertion bulge
144a‧‧‧彈性部 144a‧‧‧Flexible Department
200‧‧‧探針座 200‧‧‧ probe holder
210‧‧‧凸台 210‧‧‧Boss
300‧‧‧浮動防止部 300‧‧‧Floating Prevention Department
310‧‧‧第一浮動防止部 310‧‧‧First Floating Prevention Department
320‧‧‧第二浮動防止部 320‧‧‧Second floating prevention department
330‧‧‧薄膜 330‧‧‧film
332‧‧‧第一薄膜 332‧‧‧First film
334‧‧‧第二薄膜 334‧‧‧Second film

Claims (18)

  1. 一種探針固定組件,其包括:探針座,其在一側面放置凸出形成有插入凸起之探針;及浮動防止部,其包括防止上述探針從上述探針座向左右方向浮動之第一浮動防止部、防止上述探針從上述探針座向上下方向浮動之第二浮動防止部,上述第一浮動防止部包括形成有供上述插入凸起插入之插入孔之薄膜。 A probe fixing assembly comprising: a probe holder, wherein a probe protrudingly formed with an insertion protrusion is disposed on a side surface; and a floating preventing portion comprising: preventing the probe from floating from the probe holder in a left-right direction a first floating preventing portion that prevents the probe from floating upward and downward from the probe holder, and the first floating preventing portion includes a film on which an insertion hole into which the insertion projection is inserted is formed.
  2. 一種探針固定組件,其包括:探針座,其在一側面放置凸出形成有插入凸起之探針;及浮動防止部,其包括防止上述探針從上述探針座向左右方向浮動之第一浮動防止部,上述第一浮動防止部包括形成有供上述插入凸起插入之插入孔之薄膜。 A probe fixing assembly comprising: a probe holder, wherein a probe protrudingly formed with an insertion protrusion is disposed on a side surface; and a floating preventing portion comprising: preventing the probe from floating from the probe holder in a left-right direction The first floating prevention portion includes a film formed with an insertion hole into which the insertion protrusion is inserted.
  3. 如申請專利範圍第1或2項之探針固定組件,其中,隔著既定間隔設置多個上述探針,在上述薄膜隔著既定間隔形成有多個插入孔。 The probe fixing unit according to claim 1 or 2, wherein the plurality of the probes are provided at a predetermined interval, and the plurality of insertion holes are formed in the film at a predetermined interval.
  4. 如申請專利範圍第3項之探針固定組件,其中,上述探針包括沿水平方向較長地形成而使得一端能夠接觸顯示裝置電路圖案之第一水平部、在上述第一水平部之另一端沿垂直方向延長形成之垂直部、在上述垂直部之另一端向與上述第一水平部相反方向延長形成之第二水平部, 上述插入凸起包括在上述垂直部凸出形成之第一插入凸起、在第二水平部凸出形成之第二插入凸起。 The probe fixing assembly of claim 3, wherein the probe comprises a first horizontal portion formed in a horizontal direction so that one end can contact the circuit pattern of the display device, and the other end of the first horizontal portion a vertical portion formed to extend in a vertical direction, and a second horizontal portion formed at a distal end of the vertical portion in a direction opposite to the first horizontal portion, The insertion protrusion includes a first insertion protrusion formed to protrude from the vertical portion and a second insertion protrusion formed to protrude at the second horizontal portion.
  5. 如申請專利範圍第4項之探針固定組件,其中,上述第一插入凸起沿垂直方向較長地形成,上述第二插入凸起沿水平方向較長地形成,上述插入孔為矩形形狀。 The probe fixing assembly of claim 4, wherein the first insertion projection is formed to be long in the vertical direction, the second insertion projection is formed to be long in the horizontal direction, and the insertion hole has a rectangular shape.
  6. 如申請專利範圍第4項之探針固定組件,其中,上述薄膜包括與上述垂直部對應之第一薄膜、與上述第二水平部對應之第二薄膜。 The probe fixing assembly of claim 4, wherein the film comprises a first film corresponding to the vertical portion and a second film corresponding to the second horizontal portion.
  7. 如申請專利範圍第6項之探針固定組件,其中,在上述第一插入凸起上端凸出形成有能夠防止上述第一薄膜從上述第一插入凸起分離之卡定突起。 The probe fixing assembly of claim 6, wherein a locking projection capable of preventing separation of the first film from the first insertion projection is formed at an upper end of the first insertion projection.
  8. 如申請專利範圍第4項之探針固定組件,其中,上述第一水平部及第二水平部能夠彈性變形。 The probe fixing assembly of claim 4, wherein the first horizontal portion and the second horizontal portion are elastically deformable.
  9. 如申請專利範圍第8項之探針固定組件,其中,在上述第二水平部形成有使上述第二水平部能夠彈性變形之開環形狀之孔。 The probe fixing assembly of claim 8, wherein the second horizontal portion is formed with an open-loop shaped hole that elastically deforms the second horizontal portion.
  10. 如申請專利範圍第1或2項之探針固定組件,其中,上述探針包括沿水平方向較長地形成而使得一端能夠接觸顯示裝置電路圖案之第一水平部、在上述第一水平部之另一端沿垂直方向延長形成之垂直部、在上述垂直部之另一端向與上述第一水平部相反方向延長形成之第二水平部,在上述垂直部及上述第二水平部,分別凸出形成有第一插入凸起及第 二插入凸起,上述第二浮動防止部同時與上述第一插入凸起及第二插入凸起之上端面接觸而固定上述探針。 The probe fixing assembly of claim 1 or 2, wherein the probe comprises a first horizontal portion formed in a horizontal direction so that one end can contact a circuit pattern of the display device, and the first horizontal portion is a second horizontal portion formed by extending the other end in the vertical direction and extending at a direction opposite to the first horizontal portion at the other end of the vertical portion, respectively protruding in the vertical portion and the second horizontal portion Have the first insertion bulge and the first The second insertion preventing portion simultaneously contacts the end faces of the first insertion protrusion and the second insertion protrusion to fix the probe.
  11. 如申請專利範圍第10項之探針固定組件,其中,還包括探針主體,上述第二浮動防止部固定結合於上述探針主體。 The probe fixing assembly of claim 10, further comprising a probe body, wherein the second floating preventing portion is fixedly coupled to the probe body.
  12. 如申請專利範圍第10項之探針固定組件,其中,上述第一插入凸起及第二插入凸起上端平坦地形成,以便上述第二浮動防止部能夠面接觸。 The probe fixing assembly of claim 10, wherein the upper ends of the first insertion protrusion and the second insertion protrusion are formed flat so that the second floating prevention portion can be in surface contact.
  13. 如申請專利範圍第12項之探針固定組件,其中,在上述第二插入凸起上,在與上述第二浮動防止部面接觸之部位形成有彈性部。 The probe fixing assembly according to claim 12, wherein the second insertion protrusion has an elastic portion formed at a portion in surface contact with the second floating prevention portion.
  14. 一種探針固定組件,其包括:探針,其包括沿水平方向較長地形成而使得一端能夠接觸顯示裝置電路圖案之第一水平部、在上述第一水平部之另一端沿垂直方向延長形成之垂直部、在上述垂直部之另一端向與上述第一水平部相反方向延長形成之第二水平部、包括在上述垂直部凸出形成之第一插入凸起與在上述第二水平部凸出形成之第二插入凸起之插入凸起;探針座,其用於放置上述探針;及浮動防止部,其包括防止上述探針之上下方向浮動之第二浮動防止部。 A probe fixing assembly comprising: a probe comprising a first horizontal portion formed in a horizontal direction so that one end can contact a circuit pattern of a display device, and a vertical extension at a other end of the first horizontal portion a vertical portion, a second horizontal portion formed to extend in a direction opposite to the first horizontal portion at the other end of the vertical portion, a first insertion protrusion formed to protrude from the vertical portion, and a convex portion at the second horizontal portion An insertion protrusion of the second insertion protrusion formed; a probe holder for placing the probe; and a floating prevention portion including a second floating prevention portion for preventing the probe from floating upward and downward.
  15. 一種可固定之探針,其包括沿水平方向較長地形成而使得一端能夠接觸顯示裝置電路圖案之第一水平部、在上述第一水平部之另一端沿垂 直方向延長形成之垂直部、在上述垂直部之另一端向與上述第一水平部相反方向延長形成之第二水平部,在上述垂直部及第二水平部分別凸出形成有第一插入凸起及第二插入凸起。 A fixable probe comprising a first horizontal portion formed long in a horizontal direction such that one end can contact a circuit pattern of a display device, and hangs at the other end of the first horizontal portion a vertical portion formed in a straight direction, a second horizontal portion formed to extend in a direction opposite to the first horizontal portion at the other end of the vertical portion, and a first insertion convex portion respectively formed in the vertical portion and the second horizontal portion And the second insertion protrusion.
  16. 如申請專利範圍第15項之可固定之探針,其中,上述第一插入凸起沿垂直方向較長地形成,上述第二插入凸起沿水平方向較長地形成,在上述第一插入凸起上端凸出形成有卡定突起。 The fixable probe according to claim 15, wherein the first insertion protrusion is formed long in a vertical direction, and the second insertion protrusion is formed long in a horizontal direction, in the first insertion protrusion The upper end is convexly formed with a locking protrusion.
  17. 如申請專利範圍第16項之可固定之探針,其中,在上述第二插入凸起形成有彈性部。 The fixable probe of claim 16, wherein the second insertion protrusion is formed with an elastic portion.
  18. 如申請專利範圍第17項之可固定之探針,其中,在上述第二水平部形成有使上述第二水平部能夠彈性變形之開環形狀之孔。 A probe that can be fixed according to the seventeenth aspect of the invention, wherein the second horizontal portion is formed with an open-loop shaped hole that elastically deforms the second horizontal portion.
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CN102565470B (en) * 2010-12-03 2014-06-04 日本麦可罗尼克斯股份有限公司 Probe assembly
KR101215375B1 (en) * 2011-11-25 2012-12-26 (주)기가레인 Contact film, method for generating the film, probe unit and lcd pannel tester
JP2014182976A (en) * 2013-03-21 2014-09-29 Enplas Corp Electric contact and socket for electric component

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JP6055951B2 (en) 2016-12-27
KR101558256B1 (en) 2015-10-12
CN110531124A (en) 2019-12-03
TWI572864B (en) 2017-03-01
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JP2016218056A (en) 2016-12-22
TWI600908B (en) 2017-10-01

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