KR102121620B1 - Integrated Type Probe Array Block - Google Patents

Abstract

The present invention relates to a separated probe array block, which comprises: a case (3) for forming an outer body; a plurality of probes (5) mounted in the case (3); a pedestal (7) for accommodating the probes (5) to be aligned to be adjacent to each other; a probe cover (9) for pressing and restraining the probes (5) accommodated in the pedestal (7); and a guide bar (11) for preventing the probes (5) from being in contact with each other. The pedestal (7) includes: a main body unit (41) having the guide bar (11) to be separately assembled; and a separation unit (42) divided to be assembled with the main body unit (41). Therefore, the probes are prevented from being in contact with each other by a guide protrusion and the guide bar, thereby preventing short-circuiting of an array block or an incorrect contact between the probes and a pattern. Also, the pedestal accommodating the probes is divided into the main body unit and the separation unit to separate the guide protrusion of the separation unit from the main body unit, and the guide bar is also to be allowed to be a separate member assembled to the main body unit, thereby more conveniently and quickly performing a probe assembly operation of fitting and restraining the guide protrusion and the guide bar into the probes.

Description

Separate Type Probe Array Block

The present invention relates to a detachable probe array block, and more specifically, in an array block that transmits an inspection signal obtained by contacting an inspection object such as an LCD panel to a control device, separating a plurality of probes touching a pattern The present invention relates to a detachable probe array block that is prevented from causing mutual contact by being constrained by a guide bar of the negative portion and a guide bar of the main body of the receiver.

In general, the probe array block is a device used to perform a gross test in the process of manufacturing an LCD panel, and has been developed in various forms such as a needle type, a blade type, and a film type.

Among them, the needle-type array block is not only arranged so that a plurality of probes constituting an inspection tip are adjacent to each other, but also when the epoxy resin is deformed by using an epoxy resin or the like to attach the probe to the block case, they are deformed together. There was a problem in that the inspection performance was greatly deteriorated, such as causing a short due to contact with the liver.

To solve this problem, a probe block 101 (registration patent No. 10-1558256) shown in FIGS. 1 and 2 has been proposed. As illustrated, the probe block 101 may include a first film 332 and a second film such that a plurality of probes 100 arranged in a row with a narrow distance at the tip of the probe block 200 are not shorted to each other. The contact is blocked by (334). That is, the first insertion protrusion 140 and the second insertion protrusion 144 are respectively protruded at the exposed side edges of the vertical portion 120 and the second horizontal portion 130 of the probe 100, and the first insertion protrusion ( 140 is inserted into the insertion hole 330a of the first film 332, and the second insertion protrusion 144 is inserted into the insertion hole 330a of the second film 334, respectively, so that the first insertion protrusion 140 is provided. The adjacent first insertion protrusion 140 and the second insertion protrusion 144 are restrained from contacting each other with the adjacent second insertion protrusion 144 to prevent mutual short circuit.

However, the conventional probe block 101 as described above is a plurality of insertion holes 330a are tightly penetrated into one body of the first and second films 332 and 334, and thus the plurality of probes 100 are first formed. After attaching with the probe block 101, regardless of whether the insertion holes 330a are inserted into the insertion protrusions 140 and 144, or conversely, the insertion protrusions 140 and 144 are sequentially inserted into the plurality of insertion holes 330a, in one body. It is very difficult, cumbersome, and inconvenient to insert a plurality of insertion protrusions 140 and 144 one by one into the insertion holes 330a of the first and second films 332 and 334, so the efficiency of the assembly operation of the probe block 101 is improved. And there was a problem that productivity is greatly reduced.

In addition, since the spacing between the insertion protrusions 140 and 144 is very tight, the spacing between the insertion holes 330a of the first and second films 332 and 334 is also very narrow, so the durability of the first and second films 332 and 334 There is also a problem in that the quality and performance of the probe block 101 are significantly deteriorated, such as the strength is greatly reduced and the useful life is shortened.

KR 10-1558256

The present invention has been proposed to solve the problems of the conventional probe block as described above, and in contact with a plurality of probes that are closely arranged in correspondence with the pattern so as to contact the pattern of the closely arranged panel to inspect the LCD panel and the like. While not being restrained by the guide protrusion and the guide bar, the probe into which the probe is inserted can be divided into the main body part and the separation part, and while forming the guide protrusion in the separation part, the guide bar is inserted and fixed in the main body part, thereby allowing the probe The purpose is to make the assembly process of inserting the guide protrusion or the guide bar into the probe more convenient and quick to restrain.

In addition, since the guide projection or guide bar for constraining the probe is manufactured in the form of a rod having a rectangular cross section, and the first or second guide slits are formed on one side thereof, the strength around the guide slits can be increased. Therefore, there is another purpose to improve the quality or performance of the probe block.

In order to achieve this object, the present invention is a case forming an outer body; A plurality of probes mounted in the case to be in contact with the inspection object by a tip tip and connected to a control device by a tip tip; A holder for receiving the plurality of probes to be aligned side by side in a mutually adjacent state; It is mounted to cover the case, the probe cover to press and restrain the probe accommodated in the holder; And a guide bar assembled separately from the stand so as to constrain the probe received in the stand, preventing contact between the probes, wherein the stand comprises a body in which the guide bar is assembled separately. part; And it is divided so as to be assembled with the main body portion, through the guide projection formed on one side to constrain the probe with the guide bar to prevent contact between the probes; provides a detachable probe array block comprising a.

In addition, the probe is composed of a first piece leading to the tip and a second piece leading from the first piece to the rear tip, and the guide bar is configured to restrain either the first piece or the second piece It is preferable that the guide protrusion is integrally protruded from the separating portion so as to be restrained from the first piece or the second piece.

In addition, a plurality of first slits are formed adjacent to each other at the tip end side of the tip, and a plurality of second slits are formed adjacent to each other at the rear tip side end to accommodate the plurality of probes. ; The guide bar is restrained by inserting either the first piece or the second piece into the second guide slit formed in the second receiving end to correspond to either the first slit or the second slit, and the guide It is preferable that the protrusion is constrained by inserting the remaining one of the first piece or the second piece into the first guide slit formed in the first receiving end so as to correspond to the other one of the first slit or the second slit. .

In addition, the probe is concavely extended in the same direction along the exposed side edge of the first piece in the same direction as the first piece or in the same direction as the second piece along the exposed side edge of the second piece It is preferable that a fitting groove is provided, and the auxiliary holder for restraining the probe in the same direction as the probe cover is fitted into the fitting groove.

In addition, the probe is protruded to the edge of the first piece toward the probe cover, the first alignment protrusion protrudes to reduce the size of the surface contacting the probe cover, and to the edge of the second piece toward the probe cover, the It is preferable that the second alignment protrusion protrudes to reduce the size of the surface contacting the probe cover.

According to the detachable probe array block of the present invention, when inspecting an LCD panel or the like, the probe guides do not contact a plurality of probes that are similarly closely arranged so as to make a one-to-one correspondence with a pattern of the closely arranged panel, so that the probes are mutually It is possible to prevent a short circuit of the array block due to contact between the probes or incorrect contact between the probe and the pattern.

In addition, in order to restrain the probes from contacting each other by the probe guide as described above, the probe guide is manufactured in the form of a rod or bar so as to be a separate member that is assembled to the cradle, and before or after assembly to the cradle. Since a plurality of probes are to be fitted, it is possible to more conveniently and quickly assemble the operation of fitting the probes to the first and second slits of the probe guides to constrain the probes by the probe guides.

In addition, since the probe guide for restraining the probe is manufactured in the form of a rod or bar, the durability of the probe guide can be increased, and thus, the overall performance and quality of the array block, such as the durability and the useful life of the probe block, can be further improved. There will be.

1 is a front view showing a conventional probe block.
Figure 2 is a perspective view of Figure 1;
3 is a bottom perspective view of a detachable probe array block according to an embodiment of the present invention.
Figure 4 is an exploded perspective view of Figure 3;
5 is a bottom view of the case portion of FIG. 3;
6 is a left side view of FIG. 3.
7 is a front sectional view of a part of the case of FIG. 3;
8 is an enlarged view of part A of FIG. 7;
Fig. 9 is a bottom perspective view partially excerpted from part A of Fig. 7;
FIG. 10 is a bottom perspective view partially excerpted in FIG. 9;

Hereinafter, a separate probe array block according to an embodiment of the present invention will be described in detail with reference to the accompanying drawings.

The array block of the present invention, as shown by reference numeral 1 in FIGS. 3 and 4, largely the case (3), a plurality of probes (5), holder (7), probe cover (9), and probe guide ( 11).

Here, the case 3 is a part constituting the outer body of the array block 1, as shown in FIGS. 3, 4, and 7, in the form of a block of a rectangular parallelepiped, to secure an inner space The projections 21 and 22 protrude from the corner portions at both ends. In addition, the case (3) is the upper probe cover (9) mounted on the bottom, flexible circuit board cover (13), and the front probe (14) in the inner space formed with the front cover (14) , And the probe guide 11, as well as the tip portion of the flexible circuit board 15, the pattern film 17, and accommodates the pattern plate 19.

The probe 5 is a pin-type terminal of a thin plate that directly contacts an inspection object and transmits an inspection signal from the inspection object to the flexible circuit board 15. As shown in FIGS. 3 to 10, a plurality of cases are arranged side by side. (3) As it is mounted on the bottom surface of the inner tip, each probe 5 is made of a conductor having a W-shape as a whole. In addition, as shown in detail in FIGS. 9 and 10, the probe 5 is in contact with a test object, such as a pattern of an LCD panel, by a tip tip 23 protruding from the bottom end of the case 3, and the case (3) By the rear end tip 24 protruding to the rear side, for example, it contacts the film 17 pattern P of the flexible circuit board 15, and the rear end tip 24 is controlled through the flexible circuit board 15 It is connected to the device. To this end, the probe 5 includes a first piece 25 leading to the tip 23 and a second piece 26 leading to the trailing tip, as shown in FIGS. 8, 9, and 10. As it is made, the first piece 25 extends in the vertical direction in the figure traversing the case 3, and the second piece 26 extends in the horizontal direction in the figure terminating the case 3. At this time, since the upper end of the first piece 25 is connected to one end of the second piece 26, it has an a-shape as a whole. However, in the first piece 25, the lower end portion is bent in the right angle direction to the tip tip 23 and extends forward long, while in the second piece 26, the upper end portion is short in the right angle direction to the rear end tip 24. It is bent and extended upward.

Meanwhile, as shown in FIGS. 7 and 8, a plurality of probes 5 are mounted on the pedestal 7 side by side through a probe guide 11 to be described later, and thus being separated from the probe guide 11 To prevent it, it is pressed by the probe cover 9 described later. At this time, in order to maintain the contact with the probe cover 9 more uniformly, the probe 5 has a first alignment protrusion 27 protruding from the edge toward the probe cover 9 of the first piece 25 , The second alignment protrusion 28 protrudes from the edge toward the probe cover 9 of the second piece 26. That is, the first piece 25 and the second piece 26 minimize the area of the portion in contact with the probe cover 9 through the first alignment protrusion 27 and the second alignment protrusion 28, respectively, to make contact surfaces. Minimizes contact failure due to increase of.

Also, the probe 5 may have at least one edge of the first piece 25 or the second piece 26, for example, the second piece 26, as shown in FIGS. 8, 9, and 10. Along the exposed side edge of the, the fitting groove 29 is formed to extend concavely in the same direction as the second piece 26. That is, the probe 5 is not fitted to the first and second guide slits 43 and 44, which will be described later, and as shown in FIGS. 9 and 10 along the exposed inner edge, the fitting groove in a direction parallel to the edge ( 29) is formed. Therefore, the movement of the probe 5 in the same direction as that of the probe cover 9 is constrained by the auxiliary holder 31 in the form of a flat rod fitted in the fitting groove 29. That is, when the auxiliary holder 31 is inserted into the formed fitting groove 29 of the second piece 26 as shown, the individual probe 5 is moved to the right or downward in FIG. 10 with respect to the entire probe 5 Suppresses trying to move.

As described above, the holder 7 is a means for accommodating the plurality of probes 5 in the case 3, as shown in FIGS. 4 to 9, and mounted on the lower end of the case 3 The bar is divided into two parts, a body part 41 and a separation part 42.

Here, the main body portion 41 is the base of the base 7, as shown in FIGS. 7 to 9, the separation portion 42 and the upper and lower portions to fit the second piece 26 of the probe (5) Although it is divided into, it may be divided into the separation part 42 and the left and right sides to fit the first piece 25 of the probe 5. Therefore, the main body part 41 and the separation part 42, which are divided up and down, are fitted with the first piece 25 of the probe 5, as shown in FIGS. 7 to 9, but left and right with the main body part 41. In the case of dividing into, although not shown, the second piece 26 of the probe 5 may be fitted.

In this way, when the main body part 41 and the separating part 42 are divided up and down as shown, the main body part 41 includes a guide bar 11 which is assembled separately to constrain the plurality of probes 5. To be equipped. In addition, the body portion 41 is a plurality of second slits 34 are recessed on the rear surface to fit the upper portion extending above the second piece 26 to the rear end tip 24 of the probe 5. On the other hand, the separation portion 42 is divided up and down so as to be assembled with the main body portion 41 as above, the guide projection 12 is protruded and formed on one side toward the probe 5 to constrain the probe (5). In addition, the separation portion 42, as shown in Figure 9, a plurality of first slits 33 are concave on the bottom surface so as to fit the lower end extending in front of the first piece 25 to the tip tip 23 Is formed. Therefore, the separation part 42 prevents contact between the probes 5 through the guide protrusion 12 together with the guide bar 11.

That is, as shown in FIG. 9, the receiving stand 7 secures an a-shaped storage space along the rear lower edge portion in a state in which the main body portion 41 and the separation portion 42 are assembled, and this storage space By forming a plurality of first slits 33 on the bottom surface of the separation part 42 in contact with each other, and a plurality of second slits 34 on the rear surface of the main body part 41, each of the first slits 33 corresponding to the front ends is formed. ), and each of the probes 5 fitted to each of the rear ends of the corresponding second slits 34 is accommodated so as to be aligned side by side in a mutually adjacent state.

The probe cover (9) is a means for stably fixing a plurality of probes (5) housed in a holder (7) in the case (3), as shown in FIGS. 3 to 5, 7, and 8 As shown, the case 3 is placed and mounted in a lateral direction to cover the bottom surface, in particular, as shown in FIGS. 7 and 8, by protruding the pressing projection 35 at the bottom of the front, as described above ( 7) by pressing the plurality of probes (5) accommodated, the probe (5) serves to restrain from being separated from the guide bar (11) or the guide projection (12) up and down or left and right. To this end, the probe cover 9 is mounted between the projections 21 and 22 on the bottom surface of the case 3, as shown in FIG. 3, and the pressing projection 35 is the first piece 25 of the probe 5 ) And the second piece 26 is bent in a cross-sectional shape so as to simultaneously press.

The guide bar 11 is a means for preventing each of the probes (5) accommodated adjacent to each other to the receiving base (7) through the second slit (34) as above, 4, 7 to 7 In the case shown in Fig. 10, the second piece 26 of the probe 5 is restrained. To this end, the guide bar 11 is made of a rod-shaped insulator having a rectangular cross section that extends along the body portion 41 in the transverse direction of the case 3. In addition, as shown in FIG. 9, the guide bar 11 has a second receiving end 46, that is, a plurality of second guide slits 44 corresponding to the upper second slits 34 on the bottom of the drawing are concave. Is formed. On the other hand, the guide protrusion 12 corresponding to the guide bar 11 is also shown in FIGS. 4 and 7 to 10, the probe 5 is restrained the first piece 25, the case 3 transverse direction As it has a rectangular cross section that extends long along the body portion 41. The guide protrusion 12 is also formed with a plurality of first guide slits 43 corresponding to the first first slit 33 on the rear side of the first receiving end 45, that is, on the right side of the drawing.

Therefore, as shown in FIG. 9, the guide protrusion 12 inserts the first piece 25 of the probe 5 into the first guide slit 43, and the guide bar 11 provides the second probe 5. By fitting the piece 26 to the second guide slit 44, the probe 5 accommodated in the pedestal 7 is restrained. At this time, the guide projection 12 is integral with the separation portion 42, the guide bar 11 is inserted into and fixed to the guide groove 38 of the body portion 41, the guide projection 12 is separated Since the part 42 itself is formed separately from the body part 41, and the guide bar 11 itself is formed separately from the body part 41, each of the first or second guide slits 43, 44 ), the probe 5 can be more conveniently fitted. In addition, since the guide projection 12 is integral with the separating part 42, that is, the support 7, the working precision required when assembling the guide bar 11 into the guide groove 38 is not required, and thus As a result, the number of labors is reduced and work convenience is increased. In addition, as well as the guide projection 12, the guide bar 11 is also a plurality of second guide slits 44 are processed and manufactured side by side on one side, between the first and second guide slits (43,44) Even a sufficient thickness is maintained, and thus the durability strength of the guide protrusion 12 or the guide bar 11 is improved, and further, the usable life of the array block 1 is greatly increased.

Now, the operation of the detachable probe array block according to the preferred embodiment of the present invention will be described.

According to the array block 1 of the present invention, as shown in Fig. 9, the tip 23 of each probe 5 protruding from the bottom surface of the case 3 is, for example, an inspection object such as the pattern of the LCD panel. When the rear tip 24 of each probe 5 contacts each pattern P formed on the bottom end of the pattern film 17, the flexible circuit board 15 is connected to the signal inspected from the inspection object. Is transmitted to the control device.

In this process, each of the probes 5 is spaced apart from each other at a narrow distance from each other, but is spaced apart from the first and second slits 33 and 34, which are the primary restraints of the pedestal 7 And the second pieces 25 and 26 are constrained by the first guide slit 43 of the guide projection 12 and the second guide slit 44 of the guide bar 11, thus shortening due to mutual contact is not occurred. To prevent.

In addition, as described above, in order to insert the probe 5 into the first and second guide slits 43 and 44, for example, first, as shown in FIG. 7, adhesive means such as epoxy is attached to the bottom end of the case 3 Using the base (7), the main body (41) is attached and fixed. Then, the separation portion 42 is attached to the main body portion 41 by epoxy or the like, and it is preferable to use a separate jig for precise alignment of the main body portion 41 and the separation portion 42. Then, as illustrated in FIG. 9, after inserting the guide bars 11 into the guide grooves 38 with 4 to 5 probes 5 inserted at both ends of the guide bar 11, epoxy, etc. Fix it by attaching it using adhesive means. At this time, the probes 5 at both ends are inserted into the first and second slits 33 and 34. Or, on the contrary, first inserting and fixing the guide bar 11 into the guide groove 38, and then inserting 4 to 5 probes 5 into the first guide slits 43 at both ends of the guide protrusion 12, respectively. It is also possible to attach and fix the separating part 42 to the main body 41 while the probe 5 at both ends is inserted into the first and second slits 33 and 34.

Thereafter, the probes 5 are sequentially inserted into the remaining first and second slits 33 and 34 and the first and second guide slits 43 and 44, and then, as shown in FIG. 8, the first and second By assembling the probe cover 9 to press the alignment protrusions 27 and 28 by the pressing protrusions 35, or by inserting the auxiliary holder 31 into the fitting groove 29 before that, the probe 5 is The assembly can be conveniently completed.

1: Array block 3: Case
5: Probe 7: Stand
9: Probe cover 11: Guide bar
12: guide projection 15: flexible circuit board
17: pattern film 19: pattern plate
23: tip tip 24: tip tip
25: Part 1 26: Part 2
27: first alignment projection 28: second alignment projection
29: fitting groove 31: auxiliary holder
33: first slit 34: second slit
35: pressing projection 38: guide groove
41: body portion 42: separation portion
43: first guide slit 44: second guide slit
45: first storage stage 46: second storage stage
P: Pattern

Claims (5)

delete Case (3) constituting the outer body;
A plurality of probes (5) mounted in the case (3) to be in contact with the inspection object by the tip (23) and connected to the control device by the tip (24);
Receiving stand (7) for receiving the plurality of probes (5) to be aligned in a mutually adjacent state;
A probe cover (9) mounted to cover the case (3), and pressing and restraining the probe (5) accommodated in the holder (7); And
Included in; including; a guide bar 11 that is separately assembled to the support 7 to restrain the probe 5 accommodated in the support 7 and prevents contact between the probes 5; Lose,
The receiving stand (7),
The guide bar 11, the main body portion 41 is assembled separately; And
It is divided so as to be assembled with the main body portion 41, and prevents the probe 5 from contacting with each other with the guide bar 11 through the guide protrusion 12 formed on one side to constrain the probe 5 Separation unit 42; is made, including,
The probe 5 is composed of a first piece 25 leading to the tip 23 and a second piece 26 leading from the first piece 25 to the trailing tip 24,
The guide bar 11 is assembled to the guide groove 38 of the main body 41 to restrain either the first piece 25 or the second piece 26, and the guide protrusion 12 Is integrally protruding from the separating part 42 to restrain one of the first piece 25 or the second piece 26,
The probe 5 along the exposed side edge of the first piece 25 along the fitting groove extending concavely in the same direction as the first piece 25 or along the exposed side edge of the second piece 26 The second piece 26 has a fitting groove 29 that extends concavely in the same direction, and the fitting groove 29 is assisted to constrain the probe 5 in the same direction as the probe cover 9 Detachable probe array block, characterized in that the holder 31 is fitted and coupled. Case (3) constituting the outer body;
A plurality of probes (5) mounted in the case (3) to be in contact with the inspection object by the tip (23) and connected to the control device by the tip (24);
Receiving stand (7) for receiving the plurality of probes (5) to be aligned in a mutually adjacent state;
A probe cover (9) mounted to cover the case (3), and pressing and restraining the probe (5) accommodated in the holder (7); And
Included in; including; a guide bar 11 that is separately assembled to the support 7 to restrain the probe 5 accommodated in the support 7 and prevents contact between the probes 5; Lose,
The receiving stand (7),
The guide bar 11, the main body portion 41 is assembled separately; And
It is divided so as to be assembled with the main body portion 41, and prevents the probe 5 from contacting with each other with the guide bar 11 through the guide protrusion 12 formed on one side to constrain the probe 5 Separation unit 42; is made, including,
The probe 5 is composed of a first piece 25 leading to the tip 23 and a second piece 26 leading from the first piece 25 to the trailing tip 24,
The guide bar 11 is assembled to the guide groove 38 of the main body 41 to restrain either the first piece 25 or the second piece 26, and the guide protrusion 12 Is integrally protruding from the separating part 42 to restrain one of the first piece 25 or the second piece 26,
In the receiving stand 7, a plurality of first slits 33 are formed adjacent to each other at the end of the tip end 23 side, and a plurality of second slits 34 are mutually connected to the end of the rear tip tip 24 side. Is formed adjacent to accommodate the plurality of probes 5; The guide bar 11 is provided with the first piece (44) on the second guide slit 44 formed in the second receiving end 46 to correspond to either the first slit 33 or the second slit 34. 25) Alternatively, any one of the second pieces 26 is inserted and constrained, and the guide protrusion 12 is first stored to correspond to the remaining one of the first slit 33 or the second slit 34 The first guide slit 43 formed in the stage 45 is inserted into the rest of the first piece 25 or the second piece 26 to be restrained,
The probe 5 along the exposed side edge of the first piece 25 along the fitting groove extending concavely in the same direction as the first piece 25 or along the exposed side edge of the second piece 26 The second piece 26 is provided with a fitting groove 29 that extends concavely in the same direction, and the fitting groove 29 is assisted to restrain the probe 5 in the same direction as the probe cover 9 Detachable probe array block, characterized in that the holder 31 is fitted and coupled. delete The method according to claim 2 or claim 3,
The probe 5 has a first alignment protrusion 27 protruding from the edge of the first piece 25 toward the probe cover 9 to reduce the size of the surface contacting the probe cover 9 , Separation type, characterized in that the second alignment protrusion 28 protrudes to reduce the size of the surface in contact with the probe cover 9, at the corner of the second piece 26 toward the probe cover 9 Probe array block.

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