KR20070087420A - Probe block and probe assembly having the block - Google Patents

Abstract

A probe block and a probe assembly having the same are provided to minimize the leakage current during a signal transmitting process by increasing efficiency of transferring a signal through probes, thereby improving reliability for a display panel. A probe block(100) for testing a flat panel display is composed of a body(110) having a bottom side and both lateral sides; probes(140) contacting with a circuit board to transmit an electric signal of a tester to the flat panel display; a first guide block(120) installed at the bottom side of the body and provided with slots to which each one end of the probes is fitted; and a second guide block(130) installed at the bottom side of the body and provided with slots to which the other ends of the probes are fitted. The first or second guide block is movably installed at the bottom side of the body to fix the probes between the first and second guide blocks.

Description

PROBE BLOCK AND PROBE ASSEMBLY HAVING THE BLOCK}

1 is a perspective view of a probe assembly according to an embodiment of the present invention.

2 is a side view of a probe assembly according to an embodiment of the present invention.

3 is an exploded perspective view of the probe block shown in FIG. 1.

4 is a front view of the probe shown in FIG. 3.

FIG. 5 is a bottom view of the body shown in FIG. 3. FIG.

6 is a cross-sectional view of the probe block.

7 is a perspective view of a probe block.

8A to 8D are diagrams for explaining stepwise mounting of a probe in a probe block.

9 is a perspective view of the second guide block.

10A and 10B are views illustrating a state in which the second guide block is lifted by the second fixing member.

Explanation of symbols on the main parts of the drawings

100: probe block

110: body

120: first guide block

130: second guide block

140: probe

150: moving member

152: fixed member

180: cover

The present invention relates to a probe assembly for display panel inspection.

In general, flat panel displays such as liquid crystal displays (TFT-LCDs) are rapidly progressing in size and resolution due to mass production technology and achievements in R & D, resulting in not only notebook computers but also large monitors. It is also developed as an application product and gradually replaces existing cathode ray tube (CRT) products, and its weight in the display industry is gradually increasing.

Such a flat panel display performs a test process that checks whether a flat panel display device is normal by applying an electrical signal to a pad electrode of the flat panel display at the final stage of a manufacturing line and inspects a defective display device. have. The test of the flat panel display is performed by using a probe assembly having a probe block, and the probe block of the probe assembly may be a variety of needle type, blade type, and film type. It is developed and used in the form.

Of these, since the needle-type probe block uses an epoxy resin to fix the needle-type probes, the probes have a problem of being distorted by deformation of the epoxy resin. In particular, the needle-type probe block has a limitation of reducing the outer diameter of the probes, and thus, there is a closed end where it is hardly possible to arrange as many probes as needed in the longitudinal direction on the limited mounting surface of the probe holder. It is not responding properly to the trend.

In order to solve this problem, a blade-type probe block has been proposed, but the blade-type probe block has a large portion exposed to the outside and thus has instability in signal transmission, and a separate fixing structure for fixing the probes (blade type). Since this was necessary, the assembly work is difficult and difficult disadvantages, which causes delays in assembly work time and productivity problems. In particular, the blade type probe block is fixed to the probe holder by the fixing structure, so that the probe can be replaced only by removing the fixing structure.

It is an object of the present invention to provide a novel type of probe block and probe assembly with a simple assembly process.

It is an object of the present invention to provide a novel type of probe block and probe assembly capable of narrow pitch alignment of the probes.

Another object of the present invention is to provide a probe block and a probe assembly for inspecting a display panel of a new type that can be easily replaced.

Probe block for inspecting a flat panel display of the present invention for achieving the above object is a body having a bottom and both sides; Probes that come in contact with the circuit board to transfer electrical signals from the tester to the flat panel display; A first guide block installed at a bottom of the body and having slots into which one end of the probes is fitted; And a second guide block installed at a bottom of the body and having slots into which the other ends of the probes are fitted.

According to an embodiment of the present invention, the first guide block or the second guide block is installed to be movable so that the probes are fixed between the first guide block and the second guide block.

According to an embodiment of the present invention, the first guide block is fixed to the front end of the body, and the second guide block is installed to be movable in the direction of the first guide block at a position spaced apart from the first guide block. .

According to an embodiment of the present invention, the probe block further includes a fixing member for fixing the second guide block moved in the direction of the first guide block, and a moving member for moving the second guide block.

According to an embodiment of the present invention, the bottom surface of the body is formed with a groove into which the upper portion of the second guide block is inserted, the inner side of the body so that both sides of the body and the groove so that the moving member is inserted into each other A second passage is formed in which both side surfaces of the body and the groove communicate with each other such that a first passage and a fixing member for fixing the second guide block are inserted therein.

According to an embodiment of the invention, the probe has a plate having one side and the other side; A first tension arm extending from one side of the plate to fit in the slit of the first guide block and having a first contact end exposed from the slit of the first guide block; And a second tension arm extending from the other side of the plate to fit in the slit of the second guide block and having a second contact end exposed from the slit of the second guide block.

According to an embodiment of the present invention, the first guide block has a first protrusion on one surface facing one side of the probe, and the probe has a first fitting groove into which the first protrusion is fitted. The two guide block has a second protrusion on one surface facing the other side of the probe, and the probe has a second fitting groove into which the second protrusion is fitted.

Probe assembly of the present invention for achieving the above object is a fixed plate coupled to the probe arm portion of the inspection equipment; A probe block coupled to a bottom surface of the fixing plate and having first and second guide blocks formed with slots into which one end and the other end of the probes are fitted, respectively; The second guide block is moved at a predetermined interval in the direction in which the first guide block is located so that the probes are fixed between the first guide block and the second guide block.

According to an embodiment of the present invention, the probe block may include a moving member for moving the second guide block at a predetermined interval in a direction in which the first guide block is located; And a fixing member for fixing the second guide block moved by the moving member.

According to an embodiment of the present invention, the probe block may be detachably installed on the bottom of the fixing plate and further include a body on which the first and second guide blocks are installed; A groove having an upper end portion of the second guide block inserted into a bottom surface of the body, and a first passage through which both side surfaces of the body and the groove communicate with each other so that the moving member is inserted into the body; A second passage is formed in which both side surfaces of the body and the groove communicate with each other such that a fixing member for fixing the guide block is inserted therein.

For example, embodiments of the present invention may be modified in various forms, and the scope of the present invention should not be construed as being limited by the embodiments described below. This embodiment is provided to more completely explain the present invention to those skilled in the art. Accordingly, the shape of the elements in the drawings and the like are exaggerated to emphasize a clearer description.

Exemplary embodiments of the present invention will be described in detail with reference to FIGS. 1 to 10B. In addition, in the drawings, the same reference numerals are denoted together for components that perform the same function.

The basic intention of the present invention is to easily fix the probes 140, to easily replace the probes 140, and to minimize the gap error between the probes 140. To achieve this, the probe assembly of the present invention ( 200 has a structure of two guide blocks 120 and 130 having slots 122 and 132 into which both ends of the probe 140 are fitted, and fixed from both sides with the probe 140 interposed therebetween.

In general, the apparatus for inspecting the display panel is a plurality of probe assembly 200 is fixedly placed on the base plate (not shown) to inspect the display panel (hereinafter LCD panel).

1 and 2 are a perspective view and a side view of a probe assembly according to an embodiment of the present invention.

1 and 2, the probe assembly 200 of the present invention includes an arm 210 fixed to a base plate (not shown) and a head fastened to each other by a fixing bolt at the tip of the arm 210. The head 220 is a linear guide 230 is installed between the head 220 and the arm 210 so that the flow up and down during the LCD panel inspection process. The fixing plate 240 is detachably coupled to the bottom of the head 220. The fixing plate 240 is provided with a probe block 100.

3 and 6 are exploded perspective and front cross-sectional views of the probe block, FIG. 4 is a front view of the probe, and FIG. 5 is a bottom view of the body.

3 to 6, the probe block 100, which is the most important component of the probe assembly 200, includes the body 110, the first and second guide blocks 120 and 130, the probes 140, and the movement. The member 150 includes the first and second fixing members 152 and 153, the substrate block 190, and the cover 180.

The probe 140 is positioned between the first and second guide blocks 120 and 130 and is fixed by the first and second guide blocks 120 and 130. Both ends of the probe 140 are aligned by being inserted into the slot 122 of the first guide block 120 and the slot 132 of the second guide block 130 and then moving forward by the second guide block 130. It is fixed.

3 and 4, the probe 140 is a blade type made of a thin conductive metal plate.

Looking at the structural features of the probe 140 in more detail, the probe 140 is a plate portion 142 corresponding to the central body positioned between the first guide block 120 and the second guide block 130, and And a first tension arm 144 and a second tension arm 146.

The first tension arm 144 extends from one side surface 142a of the plate portion 142 and is fitted into the slit 122 of the first guide block 120. A first contact end 144a is formed at an end of the first tension arm 144, and the first contact arm 144a is exposed from the slit 122 of the first guide block 120. 144 has a structure bent downward from the end. The first contact end 144a is a part in contact with the pattern of the LCD panel 10 (shown in FIG. 2) which is the object under test.

The second tension arm 146 extends from the other side surface 142b of the plate portion 142 and is fitted into the slit 132 of the second guide block 130. A second contact end 146a is formed at an end of the second tension arm 146, and the second contact end 146a is exposed from the slit 132 of the second guide block 130. Is bent upward from the end of The second contact end 146a is in contact with the pattern of the circuit board 192 (shown in FIG. 6) to receive an electrical signal to be provided in the pattern of the LCD panel 10.

6 and 7, the circuit board 192 receives a test signal from the test apparatus and sends the test signal to the LCD panel 10 (shown in FIG. 2). This circuit board 192 has the same drive IC 194 as the drive IC attached to the LCD panel 10. The circuit board 192 is located at the bottom of the substrate block 190 installed by the two fixing bolts on the bottom 112 of the body 110. The substrate block 190 is installed to move in the front-rear direction on the bottom surface 112 of the body 110 to facilitate assembly. Meanwhile, the circuit board 192 installed in the substrate block 190 receives a test signal through a separate flexible substrate 196.

As shown in FIG. 6, in the present invention, the probes 140 may conceal the first tension arm 144 and the second tension arm 146 in the slits 122 and 132 of the first and second guide blocks 120 and 130. This eliminates the need for separate isolation and has a special effect of stable signal transmission. In addition, the probes are inserted into the slots 122 and 132 of the first and second guide blocks 120 and 130 so that the gap between the probes 140 is accurately maintained. .

Referring to FIGS. 3 and 6, the first and second guide blocks 120 and 130 are blocks having a predetermined length of a ceramic material, and a plurality of slits 136 are formed at predetermined intervals on the bottom thereof so that the probes 140 may be fixed. Aligned at intervals.

The first guide block 120 is installed at the front end of the bottom surface 112 of the body 110. The first guide block 120 is inserted into the first groove 116 formed on the bottom surface 112 of the body 110 of the upper end 121 is fixedly installed by an adhesive or the like. The first guide block 120 has a first protrusion 124 on one side facing the one side 142a of the probe 140, and on one side 142a of the plate portion 142 of the probe 140. It has the 1st fitting groove 148a in which the 1st protrusion part 124 is fitted.

5, 6, and 9, the second guide block 130 is installed on the bottom surface 112 of the body 110 so as to be movable in the front-rear direction. The bottom surface 112 of the body 110 is provided with a second groove 118 into which the upper portion 131 of the second guide block 130 is inserted. The second guide block 130 is installed to move a predetermined distance in the front-rear direction while the upper portion 131 is inserted into the second groove 118. The second guide block 130 has a second protrusion 134 on one surface facing the other side 142b of the probe 140, and on the other side 142b of the plate portion 142 of the probe 140. It has the 2nd fitting groove 148b in which the 2nd protrusion part 134 is fitted. The second guide block 130 is provided on both sides corresponding to the rear surface 137 contacting the moving member 150 and the inclined surface 136 and the second passage 119b which are inclined to both sides facing the second passage 119c. It has an insertion space 138. The inclined surface 136 is in contact with the tip of the second fixing member 153 fitted through the second passage 119c. The first fixing member 152 is inserted into the insertion space 138 to fix the position of the second guide block 130 (see FIG. 8D).

As shown in FIGS. 10A and 10B, the second fixing member 153 is inserted through the second passage 119c to contact the inclined surface 136 so that the second guide block 130 is lifted upward. Both ends are supported by the two fixing members 153. Therefore, the vertical movement of the second guide block 130 is limited. The second passage 119c for the second fixing member 153 is formed lower than the second passage 119b for the first fixing member 152.

As shown in FIG. 1, the body 110 is screwed to the bottom of the fixing plate 240. 3 and 5, the bottom body 110 has a first groove 116 and a second groove 118 formed at a bottom surface 112, and both side surfaces 114 and the second groove 118 communicate with each other. The first passage 119a and two second passages 119b and 119c are formed, respectively. The moving member 150 is installed in the first passage 119a, and the first and second fixing members 152 and 153 are installed in the second passages 119b and 119c, respectively. The first passage 119a and the second passages 119b and 119c are formed of screw holes having threads formed on the inner circumferential surface thereof. The first passage 119a is preferably formed to be inclined so that the moving member 150 pushes the rear of the second guide block 130.

The moving member 150 is for moving the second guide block 130 in the direction of the first guide block 120 (forward direction), and is made of a bolt screwed to the first passage 119a.

The first and second fixing members 152 and 153 are for fixing the second guide block 130 moved by the moving member 150. The first and second fixing members 152 and 153 are made of bolts screwed to the two second passages 119b and 119c. . The first and second fixing members 152 and 153 may be of a pin type. For example, the second fixing member 153 is inserted through the second passage 119c to be in contact with the inclined surface 136 of the second guide block 130 while lifting the second guide block 130 upward. Support (see FIGS. 10A and 10B).

On the other hand, the cover 180 has a bottom surface 182 and both sides 184 to cover the bottom 112 and both sides 114 of the body 110, the screw on the side 114 of the body 110 Combined.

As described above, the probe assembly 100 of the present invention has a simple structure in which the probe 140 is fixed between the first and second guide blocks 120 and 130. In particular, since the probe 140 has a simple shape, signal transmission is performed. Leakage current in the process can be minimized. In addition, since the probe block 130 may selectively replace and replace the probe 140 in the first and second guide blocks 132, the probe 140 may be easily replaced.

8A to 8D are diagrams for explaining stepwise mounting of a probe in a probe block.

As shown in FIGS. 8A and 8B, first, the plurality of probes 140 are slits of the first guide block 120 and the second guide block 130 in a state in which the second guide block 130 is moved backward. It is mounted on the 122,132 at regular intervals. That is, the probes 140 have a first tension arm 144 inserted into the slit 122 of the first guide block 120, and the second tension arm 146 slit 132 of the second guide block 130. ) Is mounted at regular intervals.

When the mounting of the probes 140 is completed, the movable member 150 is inserted through the first passage 119a to push the rear surface 137 of the second guide block 130, and the movable member 150 is removed by the movable member 150. The two guide block 130 is moved in the direction in which the first guide block 120 is positioned (forward direction) (see FIG. 8C). When the second guide block 130 is moved forward by the moving member 150, the first protrusion 124 of the first guide block 120 is fitted into the first fitting groove 148a of the probe 140, As the second protrusion 134 of the second guide block 130 is fitted into the second fitting groove 148b of the probe 140, the probe 140 may include the first guide block 120 and the second guide block 130. It is fixed so as not to fall out.

In this state, the second fixing member 153 is inserted through the second passage 119c to support both inclined surfaces 136 of the second guide block 130, and in this state, the first fixing member 152. Is inserted through the second passage 119b, the second guide block 130 is limited in movement by the first and second fixing members 152 and 153.

On the other hand, the present invention can be variously modified and take various forms in the probe assembly consisting of the above configuration. It is to be understood, however, that the present invention is not limited to the specific forms referred to in the above description, but rather includes all modifications, equivalents and substitutions within the spirit and scope of the invention as defined by the appended claims. It should be understood to do.

As described above, the present invention is excellent in assembly of the probes.

The present invention can increase the signal transmission efficiency through the probe to minimize the leakage current in the signal transmission process can improve the reliability of the display panel inspection.

In the present invention, the replacement of the probe from the first and second guide blocks can be selectively performed, so that the replacement operation can be easily performed.

The invention is very easy to narrow pitch alignment of the probes.

Claims (19)

Probe block for flat panel display inspection: A body having a bottom and two sides; Probes that come in contact with the circuit board to transfer electrical signals from the tester to the flat panel display; A first guide block installed at a bottom of the body and having slots into which one end of the probes is fitted; And A second guide block installed at a bottom of the body and having slots into which the other ends of the probes are fitted; The probe block, characterized in that the first guide block or the second guide block is installed on the bottom surface of the body so that the probes are fixed between the first guide block and the second guide block. The method of claim 1, The first guide block is fixed to the front end of the body, And the second guide block is movably installed in a direction of the first guide block at a position spaced apart from the first guide block. The method of claim 1, The probe block The probe block further comprises a fixing member for fixing the second guide block moved in the direction of the first guide block. The method of claim 1, The probe block Probe block further comprises a moving member for moving the second guide block. The method of claim 1, The bottom of the body is formed with a groove into which the upper portion of the second guide block is inserted, And a first passage in which both side surfaces of the body and the groove communicate with each other so that a moving member for moving the second guide block is inserted in the body. The method of claim 5, The first block is characterized in that the probe block is formed obliquely. The method of claim 5, The first passage is threaded on the inner surface, The moving member is a probe block, characterized in that consisting of a bolt screwed to the first passage. The method of claim 1, The bottom of the body is formed with a groove into which the upper portion of the second guide block is inserted, And a second passage in which both side surfaces of the body and the groove communicate with each other such that a fixing member for fixing the second guide block is inserted in the body. The method of claim 8, The second passage is threaded on the inner surface, The fixing member is a probe block, characterized in that consisting of a bolt screwed to the second passage. The method of claim 1, The probe block Probe block further comprises a cover for covering both sides and the bottom of the body. The method of claim 1, The probe is A plate having one side and the other side; A first tension arm extending from one side of the plate to fit in the slit of the first guide block and having a first contact end exposed from the slit of the first guide block; And a second tension arm extending from the other side of the plate so as to fit in the slit of the second guide block and having a second contact end exposed from the slit of the second guide block. The method of claim 11, The first guide block has a first protrusion on one surface facing one side of the probe, The probe has a first fitting groove into which the first protrusion is fitted, The second guide block has a second protrusion on one surface facing the other side of the probe, And the probe has a second fitting groove into which the second protrusion is fitted. The method of claim 1, And a substrate block provided with a circuit board having a driving integrated circuit in a bottom surface of the body to be detachably installed. The method of claim 13, The substrate block is a probe block, characterized in that installed on the bottom surface of the body so as to be movable before and after a predetermined interval. In probe assembly for flat panel display inspection: A fixed plate coupled to the probe arm portion of the inspection equipment; A probe block coupled to a bottom surface of the fixing plate and having first and second guide blocks formed with slots into which one end and the other end of the probes are fitted, respectively;  And the second guide block is moved at a predetermined interval in a direction in which the second guide block is located such that the probes are fixed between the first guide block and the second guide block. The method of claim 15, The probe block A moving member for moving the second guide block at a predetermined interval in a direction in which the first guide block is located; And Probe assembly further comprises a fixing member for fixing the second guide block moved by the moving member. The method of claim 15, The probe block A body detachably installed on a bottom of the fixing plate and having a bottom surface on which the first and second guide blocks are installed; The bottom of the body is formed with a groove into which the upper portion of the second guide block is inserted, The body may include a first path through which both side surfaces of the body and the groove communicate with each other so that a moving member for moving the second guide block is inserted into the body, and a fixing member for fixing the second guide block is inserted therein. Probe assembly, characterized in that the second side surface and the groove is formed in the second passage communicating with each other. The method of claim 15, The probe is A plate having one side and the other side; A first tension arm extending from one side of the plate to fit in the slit of the first guide block and having a first contact end exposed from the slit of the first guide block; And And a second tension arm extending from the other side of the plate to fit in the slit of the second guide block, the second tension arm having a second contact end exposed from the slit of the second guide block. The method of claim 18, The first guide block has a first protrusion on one surface facing one side of the probe, The probe has a first fitting groove into which the first protrusion is fitted, The second guide block has a second protrusion on one surface facing the other side of the probe, And the probe has a second fitting groove into which the second protrusion is fitted.

Images