CN101038321B - Probe block and probe assembly having the block - Google Patents

Probe block and probe assembly having the block Download PDF

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Publication number
CN101038321B
CN101038321B CN200710079227XA CN200710079227A CN101038321B CN 101038321 B CN101038321 B CN 101038321B CN 200710079227X A CN200710079227X A CN 200710079227XA CN 200710079227 A CN200710079227 A CN 200710079227A CN 101038321 B CN101038321 B CN 101038321B
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CN
China
Prior art keywords
orienting lug
detector
slit
detection piece
basal surface
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN200710079227XA
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Chinese (zh)
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CN101038321A (en
Inventor
申东沅
金昔中
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Soulbrain ENG Co Ltd
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Phicom Corp
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Filing date
Publication date
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Publication of CN101038321A publication Critical patent/CN101038321A/en
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Publication of CN101038321B publication Critical patent/CN101038321B/en
Expired - Fee Related legal-status Critical Current
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

Abstract

The invention provides a detection component for detecting display panel. The detection component includes fixed plate connected with detection support arm unit of detector and detection block connected with the bottom surface of the fixed plate, wherein the detection block includes first guide block with first gap and second guide pad with second gap, and the two ends of the detector are respectively inserted into the first gap and the second gap. The second guide block moves towards the first guide block to fix the detector between the first guide block and the second guide block. The detection component can be very easily assembled and can change the detector easily. In addition, electrical current leakage is restrained thereby improving detection reliability.

Description

The probe assembly of surveying piece and comprising this detection piece
The cross reference of related application
The non-temporary patent application of this U.S. is incorporated herein its full content as a reference according to the right of priority that 35U.S.C § 119 requires the korean patent application 2006-17803 of 23 submissions February in 2006.
Technical field
The present invention relates to a kind of probe assembly that is used to check display panel.
Background technology
In general, owing to the safety of manufacturing technology and because research and development (R﹠amp; D) result has developed into such as flat-panel monitors such as TFT-LCD and to have had bigger size and the resolution of Geng Gao.Therefore, flat-panel monitor has been widely used in notebook computer and the large-size monitor application.In addition, flat-panel monitor replaces the cathode ray tube (CRT) product just gradually.As a result, two-d display panel becomes more and more attractive in display industry.
In the final step of flat-panel monitor production line, need carry out trace routine.In this trace routine process, electric signal is applied on the electrode pad of flat-panel monitor, whether normal to survey flat-panel monitor.Use comprises that the probe assembly of surveying piece carries out this trace routine.Researched and developed such as various detection pieces such as pin type, blade type and film-type detection pieces.
Because the pin type is surveyed piece and is used epoxy resin locking pin type detector, so because the distortion of epoxy resin, detector may be out of shape.Especially the pin type is surveyed piece and is subjected to the restriction that its detector external diameter reduces.Therefore, the detector of requirement can not be aligned on the limited installation surface of detector carriage in the longitudinal direction basically.Therefore, impossible maintenance of pin type detection piece and the corresponding to development trend of higher pattern integrated level at present.
In order to overcome above-mentioned shortcoming, proposed blade type and surveyed piece.Yet blade type is surveyed piece and is comprised many parts that are exposed to the outside, thereby makes the fixator that the signal transmission is unstable and need fixing (blade type) detector to use.Therefore, it is difficult that assembly manipulation becomes, so that incur loss through delay installation time and cause throughput rate to reduce.Especially the detector because of blade type detection piece is fixed on the detector carriage by fixator, thus should before changing detector, remove fixator, thus cause the high maintenance cost.
Summary of the invention
Exemplary embodiment of the present relates to a kind of detection piece that is used to check flat-panel monitor.In the exemplary embodiment, described detection piece can comprise: body has basal surface and both side surface; Detector contacts with the electric signal with detecting device with circuit board and to transfer to flat-panel monitor; First orienting lug is installed on the basal surface of described body and is formed with first slit; And second orienting lug, be installed on the basal surface of described body and be formed with second slit, wherein said first orienting lug or second orienting lug are installed on the basal surface of described body movably, to fix described detector between described first orienting lug and described second orienting lug.
Exemplary embodiment of the present relates to a kind of probe assembly that is used to check flat-panel monitor.In the exemplary embodiment, described probe assembly can comprise: fixed head is connected with the detection support arm unit of detecting device; And detection piece, be connected with the basal surface of described fixed head, and comprise first orienting lug that is formed with first slit and second orienting lug that is formed with second slit, wherein said second orienting lug moves towards described first orienting lug, with fixed detector between described first orienting lug and described second orienting lug.
Description of drawings
Detector in the exemplary embodiment of the present comprises: board has a side surface and opposite side surface; The first tension arm, the side surface extension from described board is used for being inserted into the slit of described first orienting lug, and has first contact tip that exposes from the slit of described first orienting lug; And the second tension arm, extend from the opposite side of described board surface, be used for being inserted into the slit of described second orienting lug, and have second contact tip that exposes from the slit of described second orienting lug.Described first orienting lug has in lip-deep first projection towards a side surface of described detector, and described detector has first insertion groove that inserts described first projection.Described second orienting lug has in lip-deep second projection towards the opposite side surface of described detector, and described detector has second insertion groove that inserts described second projection.
Fig. 1 and Fig. 2 are respectively the stereographic map and the side views of probe assembly of the present invention.
Fig. 3 is the exploded perspective view of detection piece illustrated in figures 1 and 2.
Fig. 4 is the front view of detector shown in Figure 3.
Fig. 5 is the upward view of body shown in Figure 3.
Fig. 6 and Fig. 7 are respectively the cut-open view and the stereographic maps of detection piece illustrated in figures 1 and 2.
Fig. 8 A-Fig. 8 D has shown the step of detector being installed surveying on the piece.
Fig. 9 is the stereographic map of second orienting lug.
Figure 10 has shown the state when second orienting lug is raise by second fixture.
Embodiment
Fig. 1 and Fig. 2 are respectively the stereographic map and the side views of probe assembly 200 of the present invention.Probe assembly 200 comprises support arm 210 that is fixed on the base plate (not shown) and the head 220 that is connected with the front end of support arm 210 by set bolt.Linear guide 230 is installed between head 220 and support arm 210, moves about thereby in LCD panel checking process, produce.Fixed head 240 is connected with the basal surface of head 220 movably.Survey piece 100 be installed in fixed head 240 below.
Fig. 3 and Fig. 6 are respectively exploded perspective view and the cut-open views of surveying piece 100.Fig. 4 is the front view of detector shown in Figure 3, and Fig. 5 is the upward view of body shown in Figure 3.
As Fig. 3-shown in Figure 6, probe assembly 200 most important elements are to survey piece 100, and it comprises body 110, first orienting lug 120 and second orienting lug 130, detector 140, movable part 150, fixture 152 and 153, plate 190 and covering 180.
Detector 140 is arranged between first orienting lug 120 and second orienting lug 130 and by first orienting lug 120 and second orienting lug 130 and fixes.In the slit 122 and 132 that is inserted into first orienting lug 120 and second orienting lug 130 by opposite end, arrange after the detector 140, they are fixed by second orienting lug 130 is moved forward with detector 140.
Referring to Fig. 3 and Fig. 4, detector 140 is the blade type detectors that formed by thin conductor metal plate.Detector 140 comprises and is arranged on the corresponding board 142 of central body between first orienting lug 120 and second orienting lug 130, the first tension arm 144 and the second tension arm 146.
The first tension arm 144 extends from a side surface 142a of board 142, is used for being inserted into the slit 122 of first orienting lug 120.First the tension arm 144 end form the first contact tip 144a, and this first contact tip from first the tension arm 144 end be bent downwardly, thereby expose from the slit 122 of first orienting lug 120.The first contact tip 144a is used for contacting with pattern as the LCD panel (10 among Fig. 2) of inspected object.
The second tension arm 146 extends from the opposite side surface 142b of board 142, is used for being inserted into the slit 132 of second orienting lug 130.Second the tension arm 146 end form the second contact tip 146a, and this second contact tip from second the tension arm 146 end be bent upwards, thereby expose from the slit 132 of second orienting lug 130.The second contact tip 146a is used for contacting with the pattern of circuit board (192 among Fig. 6), to receive the electric signal on the pattern that will be applied to LCD panel 10.
Referring to Fig. 7 and Fig. 8, circuit board 192 receives the detection signal of self-detector and the signal that receives is sent to LCD panel (10 among Fig. 2).Circuit board 192 comprise be installed in LCD panel 10 on the identical drive IC 194 of drive integrated circult (drive IC).Circuit board 10 is arranged on the basal surface of plate 190, and this plate is installed on the basal surface 112 of body 110 by two set bolts.Simple in order to assemble, plate 190 be installed on the basal surface 112 of body 110 and can before and after movable.The circuit board 192 that is installed on the plate 190 receives detection signal by flexible board 196.
As shown in Figure 6, the first tension arm 144 and the second tension arm 146 are hidden in respectively in the slit 122 and slit 132 of first orienting lug 120 and second orienting lug 130.Therefore, detector 140 does not need special insulation, and can obtain stable signal transmission.In addition, detector 140 is inserted in the slit 122 of first orienting lug 120 and second orienting lug 130 and the slit 132 and with constant spacing and separates.
Referring to Fig. 3, Fig. 4 and Fig. 6, each in first orienting lug 120 and second orienting lug 130 all is the ceramic block with predetermined length.Because being formed on the basal surface separately of first orienting lug 120 and second orienting lug 130 and with constant spacing, some slits 136 separate, so detector 140 is arranged with constant spacing.
First orienting lug 120 is installed in the front end of the basal surface 112 of body 110.After the head portion with first orienting lug 120 is inserted in first groove 116 that forms on the basal surface 112 at body 110, utilize bonding agent etc. to make first orienting lug 120 fixing.First orienting lug 120 is included in lip-deep first projection 124 towards a side surface 142a of detector 140 and the first insertion groove 148a, this first insertion groove is located on the side surface 142a of board 142, and first projection 124 is inserted among the first insertion groove 148a.
Referring to Fig. 5, Fig. 6 and Fig. 9, second orienting lug 130 be installed on the basal surface 112 of body 110 and can before and after movable.Second groove 118 is set on the basal surface 112 of body 110.The head portion 131 of second orienting lug 130 is inserted in second groove 118.Although the head portion 131 of second orienting lug 130 is inserted in second groove 118, second orienting lug 130 install can before and after movable.Second orienting lug 130 is included in towards the opposite side surface 142b of detector 140 and lip-deep second projection 134 of the second insertion groove 148b, this second insertion groove is located on the opposite side surface 142b of board 142, and second projection 134 is inserted among the second insertion groove 148b.Second orienting lug 130 have with the rear surface 137 of movable part 150 contact, towards inclined-plane 136 that the opposite side towards second channel 119c tilts and with the corresponding opposite side of second channel 119b on insertion space 138.The preceding end in contact of second fixture 153 of inclined-plane 136 and insertion second channel 119c.First fixture 152 is inserted into and inserts in the space 138, is used for fixing the position (referring to Fig. 8 D) of second orienting lug 130.
As shown in figure 10, second fixture 153 is inserted among the second channel 119c, contacts with inclined-plane 136.Therefore, when second orienting lug 130 raise, the two ends of second orienting lug 130 were supported by second fixture 153.As a result, the rising of second orienting lug 130 and decline are restricted.The second channel 119c of second fixture, 153 usefulness is lower than the second channel 119b of first fixture, 152 usefulness.
Return Fig. 1, body 110 is connected with the basal surface spiral of fixed head 240.Referring to Fig. 3 and Fig. 5, on the basal surface 112 of body 110, form first groove 116 and second groove 118.On the basal surface 112 of body 110, form first passage 119a and two second channel 119b and 119c, the opposite flank 114 and second groove 118 are interconnected.Movable part 150 is installed in the first passage, and first fixture 152 and second fixture 153 are installed in respectively among second channel 119b and the 119c.Each passage 119a, 119b and 119c are formed with screw, promptly are formed with screw thread on the inner peripheral surface separately of passage 119a, 119b and 119c.First passage 119a tilts, the rear portion that can make movable part 150 promote second orienting lug 130.
Movable part 150 is set so that second orienting lug 130 moves to first orienting lug 120 (forwards to).Movable part 150 comprises the bolt that is connected with first passage 119a spiral.
First fixture 152 and second fixture 153 are set fix second orienting lug 130 that moves by movable part 150.First fixture 152 comprises the bolt that is connected with the 119c spiral with two second channel 119b with second fixture 153.Alternatively, first fixture 152 and second fixture 153 can be the pin types.For example, second fixture 153 is inserted among the second channel 119c, contacts with the inclined-plane 136 of second orienting lug 130.Like this, when upwards promoting second fixture 130, second fixture 153 supports second orienting lug 130 (referring to Figure 10).
Covering 180 has bottom 182 and opposite flank 184, is used for covering the basal surface 112 and the opposite flank 114 of body 110.This covering is connected with side surface 114 spirals of body 110.
As previously mentioned, survey piece 100 and have simple structure, wherein detector 140 is fixed between first orienting lug 120 and second orienting lug 130.Especially the shape of detector 140 is very simple, leaks thereby suppress electric current in signals transmission.Because can selective removal detector 140 on first orienting lug 120 and second orienting lug 130, so can easily carry out the replacing of detector 140.
Fig. 8 A-Fig. 8 D has shown the step of detector 140 being installed surveying on the piece 100.When second orienting lug 130 was mobile backward, detector 140 was installed in the slit 122 and slit 132 of first orienting lug 120 and second orienting lug 130, and separated with constant spacing.That is to say,, detector 140 is installed and is separated with constant spacing by the first tension arm 144 and the second tension arm 146 are inserted into respectively in the slit 122 and slit 132 of first orienting lug 120 and second orienting lug 130.
After the installation of finishing detector 140, movable part 150 is inserted among the first passage 119a, with the rear surface 137 that promotes second orienting lug 130, utilize movable part 150 to make second orienting lug 130 move (referring to Fig. 8 C) then to first orienting lug 120 (forwards to).If utilize movable part 150 that second orienting lug 130 is moved forward, first projection 124 of first orienting lug 120 and second orienting lug 130 and second projection 134 are inserted into respectively among the first insertion groove 148a and the second insertion groove 148b of detector 140 so, thus between first orienting lug 120 and second orienting lug 130 fixed detector 140 tightly.
At this moment, second fixture 153 is inserted among the second channel 119c, is used for supporting two inclined-planes 136 of second orienting lug 130.If first fixture 152 is inserted among the second channel 119b, so since first fixture 152 and second fixture, 153, the second the mobile of orienting lug 130 be restricted.
According to the present invention, detector can easily be installed, promptly detector has excellent assembling easiness.Because the effectiveness through detector increases, thus the electric current leakage in signals transmission, suppressed, thus improved the reliability that display panel is checked.In addition, can on first orienting lug and second orienting lug, optionally remove detector, and easily with it replacing.In addition, even spacing is narrow, also can easily arrange detector.
Although the embodiment of the invention has in conjunction with the accompanying drawings been described the present invention, the invention is not restricted to this.Those skilled in the art obviously can carry out various replacements, modifications and variations under situation about not departing from the scope of the present invention with spirit.

Claims (15)

1. detection piece that is used to check flat-panel monitor comprises:
Body has basal surface and both side surface;
Detector contacts with the electric signal with detecting device with circuit board and to transfer to flat-panel monitor;
First orienting lug is installed on the basal surface of described body and is formed with first slit; And
Second orienting lug is installed on the basal surface of described body and is formed with second slit,
Wherein said first orienting lug or described second orienting lug are installed on the basal surface of described body movably, between described first orienting lug and second orienting lug, fixing described detector,
Wherein said detector comprises:
Board has a side surface and opposite side surface;
The first tension arm, the side surface extension from described board is used for being inserted into the slit of described first orienting lug, and has first contact tip that exposes from the slit of described first orienting lug; And
The second tension arm extends from the opposite side surface of described board, and be used for being inserted into the slit of described second orienting lug, and have second contact tip that exposes from the slit of described second orienting lug,
Wherein said first orienting lug has in lip-deep first projection towards a side surface of described detector, and described detector has first insertion groove that inserts described first projection; And
Wherein said second orienting lug has in lip-deep second projection towards the opposite side surface of described detector, and described detector has second insertion groove that inserts described second projection.
2. detection piece as claimed in claim 1, wherein said first orienting lug is fixed on the front end of described body, described second orienting lug is installed it can be moved to described first orienting lug from the position that separates with described first orienting lug.
3. detection piece as claimed in claim 1 also comprises:
Fixture is used for fixing described second orienting lug that moves towards described first orienting lug.
4. detection piece as claimed in claim 1 also comprises:
Movable part is used for making described second orienting lug to move.
5. detection piece as claimed in claim 4 wherein forms groove on the basal surface of described body, the head portion of described second orienting lug is inserted in the described groove; And
The inside of wherein said body forms first passage, and described movable part is inserted in the described first passage, and the both side surface of described body and described groove are interconnected by described first passage.
6. detection piece as claimed in claim 5, wherein said first passage tilts.
7. detection piece as claimed in claim 5 wherein forms screw thread on the inside surface of described first passage, described movable part comprises the bolt that is connected with described first passage spiral.
8. detection piece as claimed in claim 3 wherein forms groove on the basal surface of described body, the head portion of described second orienting lug is inserted in the described groove; And
The inside of wherein said body forms second channel, and described fixture is inserted in the described second channel, and the both side surface of described body and described groove are interconnected by described second channel.
9. detection piece as claimed in claim 8 wherein forms screw thread on the inside surface of described second channel, described fixture comprises the bolt that is connected with described second channel spiral.
10. detection piece as claimed in claim 1 also comprises:
Covering is used for covering the both side surface and the basal surface of described body.
11. detection piece as claimed in claim 1, the plate that the circuit board that has integrated circuit (IC) wherein is installed is removably mounted on the basal surface of described body.
12. detection piece as claimed in claim 11, wherein said plate are installed on the basal surface of described body and can before and after movable.
13. a probe assembly that is used to check flat-panel monitor comprises:
Fixed head is connected with the detection support arm unit of detecting device; And
Survey piece, be connected, and comprise first orienting lug that is formed with first slit and second orienting lug that is formed with second slit with the basal surface of described fixed head,
Wherein said second orienting lug moves towards described first orienting lug, with fixed detector between described first orienting lug and described second orienting lug,
Wherein said detector comprises:
Board has a side surface and opposite side surface;
The first tension arm, the side surface extension from described board is used for being inserted into the slit of described first orienting lug, and has first contact tip that exposes from the slit of described first orienting lug; And
The second tension arm extends from the opposite side surface of described board, and be used for being inserted into the slit of described second orienting lug, and have second contact tip that exposes from the slit of described second orienting lug,
Wherein said first orienting lug has in lip-deep first projection towards a side surface of described detector, and described detector has first insertion groove that inserts described first projection; And
Wherein said second orienting lug has in lip-deep second projection towards the opposite side surface of described detector, and described detector has second insertion groove that inserts described second projection.
14. probe assembly as claimed in claim 13, wherein said detection piece also comprises:
Movable part is used for making described second orienting lug to move towards described first orienting lug; And
Fixture is used for fixing described second orienting lug that moves by described movable part.
15. probe assembly as claimed in claim 13, wherein said detection piece also comprises:
Body is removably mounted on the basal surface of described fixed head, and described body has the basal surface that described first orienting lug and second orienting lug are installed thereon,
Wherein on the basal surface of described body, be formed with the groove of the head portion that inserts described second orienting lug; And
Wherein form first passage at described internal body, be used to insert the movable part that described second orienting lug is moved, form second channel at described internal body, be used to insert the fixture that makes described second orienting lug fixing, the opposite flank of described body and described groove are interconnected by described first passage and second channel.
CN200710079227XA 2006-02-23 2007-02-13 Probe block and probe assembly having the block Expired - Fee Related CN101038321B (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
KR10-2006-0017803 2006-02-23
KR1020060017803 2006-02-23
KR1020060017803A KR100766296B1 (en) 2006-02-23 2006-02-23 Probe block and probe assembly having the block

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CN101038321A CN101038321A (en) 2007-09-19
CN101038321B true CN101038321B (en) 2011-09-14

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CN (1) CN101038321B (en)
TW (1) TWI319089B (en)

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KR100940505B1 (en) * 2009-06-10 2010-02-10 주식회사 디엠엔티 Probe unit for inspecting display panel
WO2012099405A2 (en) * 2011-01-21 2012-07-26 Pro-2000 Co. Ltd. Probe block
KR101249467B1 (en) 2013-01-04 2013-04-03 (주)유비프리시젼 Film-type probe block for checking lcd
KR102159672B1 (en) * 2019-04-16 2020-09-24 주식회사 케이에스디 Probe and Probe Block Using the Same
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KR102136689B1 (en) * 2020-03-03 2020-07-22 장용철 Flying probe tester
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KR102265962B1 (en) * 2020-12-29 2021-06-17 주식회사 프로이천 Pin board
KR102294168B1 (en) * 2021-06-18 2021-08-25 이시훈 Blade type probe block
KR102357377B1 (en) * 2021-09-06 2022-02-08 가온솔루션 주식회사 Probe pin and probe unit with them
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Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1580787A (en) * 2003-08-06 2005-02-16 株式会社东京阴极研究所 Probe device for flatboard display detection

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100314586B1 (en) * 1999-05-17 2001-11-15 이석행 Prober apparatus for testing of tft-lcd
KR20020080580A (en) * 2001-04-16 2002-10-26 유렉스 프리시젼 인코포레이티드 Membrane probe block
JP2003066067A (en) * 2001-08-24 2003-03-05 Seiko Epson Corp Probe unit, inspection device, inspection method of electro-optical panel board, and manufacturing method of electro-optical apparatus
KR100599989B1 (en) * 2003-12-24 2006-07-13 주식회사 파이컴 Probe apparatus using probe unit
KR20050082431A (en) * 2005-07-25 2005-08-23 백종수 Probe unit for inspected the flat panel display device
KR100600700B1 (en) * 2005-07-29 2006-07-19 프롬써어티 주식회사 Probe unit for testing plat display panel

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1580787A (en) * 2003-08-06 2005-02-16 株式会社东京阴极研究所 Probe device for flatboard display detection

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
JP特开平10-132853A 1998.05.22 *

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KR20070087420A (en) 2007-08-28
CN101038321A (en) 2007-09-19
TW200732669A (en) 2007-09-01
TWI319089B (en) 2010-01-01
KR100766296B1 (en) 2007-10-11

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